CN111243975B - Display panel detection method and display panel detection device - Google Patents
Display panel detection method and display panel detection device Download PDFInfo
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- CN111243975B CN111243975B CN202010070574.1A CN202010070574A CN111243975B CN 111243975 B CN111243975 B CN 111243975B CN 202010070574 A CN202010070574 A CN 202010070574A CN 111243975 B CN111243975 B CN 111243975B
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
- H01L22/10—Measuring as part of the manufacturing process
- H01L22/12—Measuring as part of the manufacturing process for structural parameters, e.g. thickness, line width, refractive index, temperature, warp, bond strength, defects, optical inspection, electrical measurement of structural dimensions, metallurgic measurement of diffusions
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
- H01L22/20—Sequence of activities consisting of a plurality of measurements, corrections, marking or sorting steps
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
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Abstract
The invention discloses a display panel detection method and a display panel detection device. The display panel is provided with a display area and a non-display area, the display panel comprises a substrate, an organic packaging layer arranged on the substrate and a dam structure arranged on the substrate corresponding to the non-display area, the dam structure comprises at least one dam layer arranged around the display area, and the display panel detection method comprises the following steps: after the organic packaging layer is formed, acquiring at least one surface contour curve of the display panel pointing to the non-display area along the center of the display area; determining a plurality of test points on each surface contour curve according to each surface contour curve; acquiring a first slope value f1 of each test point; and determining whether the organic encapsulation layer overflows based on the first slope value f1 of each pre-test point and the second slope value f2 of the side surface of the at least one dam layer close to the display area. The display panel detection method disclosed by the invention can improve the detection efficiency of the packaging reliability of the thin film packaging layer.
Description
Technical Field
The invention belongs to the technical field of display, and particularly relates to a display panel detection method and a display panel detection device.
Background
Organic Light Emitting Diode (OLED) display has the advantages of low cost, wide viewing angle, low driving voltage, fast response speed, rich Light Emitting colors, simple preparation process, capability of realizing large-area flexible display and the like, and is considered to be one of the most promising display technologies.
Generally, a thin film encapsulation structure is adopted to encapsulate an OLED device so as to prevent water and oxygen from invading the OLED device and causing failure of the OLED device, the thin film encapsulation structure comprises a plurality of inorganic encapsulation layers and organic layers which are stacked alternately, the organic layers are formed between the inorganic layers and are coated by the inorganic layers so as to realize the effects of flatness and stress release, if the organic layers overflow to the outside of the inorganic layers in the formation process of the organic layers, the encapsulation reliability can be affected, and therefore, the overflow condition of the organic layers needs to be detected so as to confirm the encapsulation reliability of the thin film encapsulation structure.
Disclosure of Invention
The embodiment of the invention provides a display panel detection method and a display panel detection device, aiming at improving the detection efficiency of the packaging reliability of a thin film packaging layer.
In a first aspect, the present invention provides a method for inspecting a display panel, the display panel having a display region and a non-display region located at an outer peripheral side of the display region, the display panel including a substrate, an organic encapsulation layer disposed on the substrate, and a bank structure disposed on the substrate corresponding to the non-display region, the bank structure including at least one bank layer disposed around the display region, the method comprising: after the organic packaging layer is formed, acquiring at least one surface contour curve of the display panel pointing to the non-display area along the center of the display area; determining a plurality of test points on each surface contour curve according to each surface contour curve; acquiring a first slope value f1 of each test point; whether the organic encapsulation layer overflows is determined based on the first slope value f1 of each test point and the second slope value f2 of the side surface of the at least one dam layer near the display region.
According to an aspect of the present invention, determining whether the organic encapsulation layer overflows based on the first slope value f1 of each test point and the second slope value f2 of the side surface of the at least one dam layer near the display area includes: and if the first slope value f1 of each test point in the plurality of test points on the at least one surface contour curve is not equal to each second slope value f2, determining that the organic encapsulation layer overflows.
According to an aspect of the present invention, determining whether the organic encapsulation layer overflows based on the first slope value f1 of each test point and the second slope value f2 of the side surface of the at least one dam layer adjacent to the display area includes: and if the first slope value f1 of at least one test point on each surface contour curve is equal to the second slope value f2 of the surface of one of the dam layers in the dam structure, which is close to the side of the display area, determining that the organic encapsulation layer is not overflowed.
According to an aspect of the present invention, if the first slope value f1 of the at least one test point existing on each surface profile curve is equal to the second slope value f2 of the surface of one of the dam layers in the dam structure on the side close to the display area, determining that the organic encapsulation layer is not overflowing includes: and for each surface contour curve, pointing to the direction of the non-display area from a preset distance away from the center of the display area, removing part of the surface contour curve corresponding to one side surface of each dam layer, which is far away from the substrate, and if the first slope value f1 of at least one test point on the surface contour curve is equal to 0, determining the position of the test point with the first slope value f1 equal to 0 as the edge of the organic encapsulation layer.
According to an aspect of the present invention, if the first slope value f1 of the at least one test point existing on each surface profile curve is equal to the second slope value f2 of the surface of one of the dam layers in the dam structure on the side close to the display area, determining that the organic encapsulation layer is not overflowing includes: and for each surface profile curve, pointing to the direction of the non-display area from a preset distance away from the center of the display area, removing part of the surface profile curve corresponding to one side surface of each dam layer, which is far away from the substrate, and if the first slope value f1 of each test point in the plurality of test points on the surface profile curve is not equal to 0, determining the position of the test point, where the first slope value f1 is equal to the second slope value f2 of the surface, which is close to one side of the display area, of one of the dam layers in the dam structure as the edge of the organic encapsulation layer.
According to one aspect of the present invention, determining a plurality of test points on each surface contour curve from each surface contour curve comprises: and for each surface profile curve, pointing to the direction of the non-display area from a preset distance away from the center of the display area, and acquiring a test point on the surface profile curve at a preset length interval.
According to an aspect of the present invention, the dam structure includes two dam layers disposed at an interval from each other, surfaces of the two dam layers on a side close to the display area have an equal second slope value f 2; the display panel detection method further comprises the following steps: for each surface contour curve, if at least two test points with the first slope value f1 equal to the second slope value f2 exist on the surface contour curve, a part of the surface contour curve corresponding to the side surface of each dam layer opposite to the substrate is removed in the direction pointing to the non-display area along the display area, and a test point with the first slope value f1 equal to 0 exists between the two test points with the first slope value f1 equal to the second slope value f2, the edge of the organic encapsulation layer is determined to be positioned on the side, close to the display area, of the dam structure.
According to an aspect of the present invention, the dam structure includes two dam layers disposed at an interval from each other, surfaces of the two dam layers on a side close to the display area have an equal second slope value f2, and surfaces of the two dam layers on a side away from the display area have an equal third slope value f3, wherein a product of the second slope value f2 and the third slope value f3 is less than 0; the display panel detection method further comprises the following steps: for each surface contour curve, if at least one test point with a first slope value f1 equal to the third slope value f3 and at least one test point with a first slope value f1 equal to the second slope value f2 exist on the surface contour curve, and the test points with the first slope value f1 equal to the third slope value f3 are positioned behind the test points with the first slope value f1 equal to the second slope value f2 in the direction pointing to the non-display area along the display area, determining that the edge of the organic encapsulation layer is positioned between the two dam layers.
According to an aspect of the present invention, the display panel inspection method further includes: before forming the organic encapsulation layer on the substrate, a second slope value f2 of a surface on a side close to the display region and a third slope value f3 of a surface on a side far from the display region of each bank layer of the bank structure are obtained.
In a second aspect, the present invention provides a display panel inspection apparatus, the display panel having a display region and a non-display region located at an outer peripheral side of the display region, the display panel including a substrate, an organic encapsulation layer disposed on the substrate, and a bank structure disposed on the substrate corresponding to the non-display region, the bank structure including at least one bank layer disposed around the display region, the display panel inspection apparatus comprising: the first acquisition module is used for acquiring at least one surface contour curve of the display panel pointing to the non-display area along the center of the display area after the organic packaging layer is formed; the first determining module is used for determining a plurality of test points on each surface contour curve according to each surface contour curve; the second obtaining module is used for obtaining a first slope value f1 of each test point; and a second determination module for determining whether the organic encapsulation layer overflows based on the first slope value f1 of each test point and a second slope value f2 of a side surface of the at least one dam layer near the display area.
In the embodiment of the invention, after the organic packaging layer is formed in the preparation process of the display panel, at least one surface contour curve of the display panel pointing to the non-display area along the center of the display area is obtained, a plurality of test points are determined on the surface contour curves according to the surface contour curves, then a first slope value of each test point is obtained, and finally, whether the organic packaging layer of the display panel overflows or not can be determined based on the comparison between the first slope value of each test point and a second slope value of one side surface of at least one dam layer in the dam structure, which is close to the display area.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings needed to be used in the embodiments of the present invention will be briefly described below, and it is obvious that the drawings described below are only some embodiments of the present invention, and it is obvious for those skilled in the art to obtain other drawings based on these drawings without creative efforts.
Fig. 1 is a schematic top view of a display panel according to an embodiment of the invention;
FIG. 2 is a schematic illustration of a first cross-sectional A-A view of FIG. 1 and a corresponding surface profile curve;
FIG. 3 is a flowchart illustrating a method for inspecting a display panel according to an embodiment of the present invention;
FIG. 4 is a schematic illustration of a second cross-sectional A-A view of FIG. 1 and the corresponding surface profile curve;
FIG. 5 is a schematic illustration of a third cross-sectional A-A view of FIG. 1 and the corresponding surface profile curve;
FIG. 6 is a schematic illustration of a fourth cross-sectional A-A view of FIG. 1 and the corresponding surface profile curve;
FIG. 7 is a schematic illustration of a fifth cross-sectional A-A view of FIG. 1 and the corresponding surface profile curve;
fig. 8 is a block diagram of a display panel detection apparatus according to an embodiment of the present invention.
Detailed Description
Features and exemplary embodiments of various aspects of the present invention will be described in detail below, and in order to make objects, technical solutions and advantages of the present invention more apparent, the present invention will be further described in detail below with reference to the accompanying drawings and specific embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the invention and are not intended to limit the invention. It will be apparent to one skilled in the art that the present invention may be practiced without some of these specific details. The following description of the embodiments is merely intended to provide a better understanding of the present invention by illustrating examples of the present invention.
It is noted that, herein, relational terms such as first and second, and the like may be used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Also, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising … …" does not exclude the presence of additional identical elements in the process, method, article, or apparatus that comprises the element.
It will be understood that when a layer or region is referred to as being "on" or "over" another layer or region in describing the structure of the element, it can be directly on the other layer or region or intervening layers or regions may also be present. Also, if the component is turned over, one layer or region may be "under" or "beneath" another layer or region.
It should be noted that the embodiments and features of the embodiments in the present application may be combined with each other without conflict.
The following describes the display panel detection method and the display panel detection apparatus according to the embodiment of the invention in detail with reference to fig. 1 to 8. Some well-known structures are shown hidden or transparently in the figure for the sake of clarity in illustrating the structures associated with the present invention.
The display panel detection method of the embodiment of the invention is used for detecting the overflow condition of the organic encapsulation layer 12 of the display panel 10. Referring to fig. 1 and fig. 2, fig. 1 is a schematic top view of a display panel according to an embodiment of the present invention; fig. 2 is a schematic illustration of a first cross-sectional view a-a of fig. 1 and the corresponding surface profile curve. The display panel 10 has a display area AA and a non-display area NA located at an outer peripheral side of the display area AA, and the display panel 10 includes a substrate 11, an organic encapsulation layer 12 disposed on the substrate 11, and a bank structure 13 disposed on the substrate 11 corresponding to the non-display area NA. The dam structure 13 may include at least one dam layer 131 disposed around the display area AA. The detection of whether the organic encapsulation layer 12 overflows may be performed after the organic encapsulation layer 12 is formed during the manufacturing process of the display panel 10.
Referring to fig. 3, fig. 3 is a flowchart illustrating a display panel detection method according to an embodiment of the invention. The display panel detection method of the present embodiment includes steps 100 to 400.
Step 100, after the organic encapsulation layer is formed, at least one surface contour curve of the display panel pointing to the non-display area along the center of the display area is obtained.
The surface profile L extending from the center of the display area AA of the display panel 10 to the outer peripheral side in the present embodiment is a profile of the upper surface of the display panel formed perpendicular to the display panel and perpendicular to the extending direction of the bank structure after the organic encapsulation layer is formed. For example, it may be a contour curve corresponding to the upper surface of a cross section in the direction of the arrow shown in fig. 1. In some embodiments, at least one surface contour curve L of the display panel 10 may be acquired, for example, a plurality of surface contour curves L of each direction of the display panel 10 may be acquired to better reflect the surface contour shape of each direction of the display panel 10. In some embodiments, the surface profile L of the display panel may be acquired by a white light interferometric three-dimensional gauge. In other embodiments, the surface profile curve L of the display panel may be obtained by a probe type surface profile testing apparatus.
Step 300, a first slope value f1 of each test point is obtained.
Please continue to refer to fig. 2, which is a top surface profile curve L in fig. 2. A plurality of test points are determined on the surface contour curve L, the test points are the intersection points of the vertical dotted lines in the graph and the surface contour curve L, and the slope value of the tangent line corresponding to each test point can be calculated by a processor such as a computer, and the slope value is the first slope value f1 of the test point. It is understood that a plurality of test points can be selected on each surface profile curve L according to actual requirements.
And step 400, determining whether the organic encapsulation layer overflows or not based on the first slope value f1 of each test point and the second slope value f2 of the surface of one side, close to the display area, of at least one dam layer.
The second slope value f2 is a slope value of a surface of at least one bank layer 131 in the bank structure 13 on a side close to the display area AA. In this embodiment, whether the organic encapsulation layer 12 exceeds the outermost dam layer 131 is determined by the first slope value f1 of each test point on each surface profile curve L of the display panel 10 and the second slope value f2 of at least one dam layer 131 of the dam structure 13, thereby determining whether the organic encapsulation layer 12 overflows. It is understood that, in the present embodiment, the dam layers 131 may be a plurality of, for example, two, spaced apart from each other along the display region toward the non-display region, and whether the organic encapsulation layer 12 exceeds the outermost dam layer 131 may be determined according to the first slope value f1 of each test point and the second slope value f2 of one side surface of the dam layer 131 close to the display region; or according to the first slope value f1 of each test point and the second slope value f2 of the side surface of the dam layer 131 far away from the display area and close to the display area ， To determine whether the organic encapsulation layer 12 exceeds the outermost dam layer 131, wherein f2 and f2 ， May or may not be equal.
In the embodiment of the present invention, after the organic encapsulation layer 12 is formed in the preparation process of the display panel 10, at least one surface contour curve L pointing to the non-display area NA along the center of the display area AA of the display panel 10 is obtained first, and then according to each surface contour curve L, determining a plurality of test points on each surface profile curve L, then obtaining a first slope value f1 of each test point, finally comparing the first slope value f1 of each test point with a second slope value f2 of a side surface of at least one dam layer 131 close to the display area AA in the dam structure 13, thereby, it can be determined whether the organic encapsulation layer 12 of the display panel 10 overflows, the display panel inspection method of the present embodiment can accurately detect whether the organic encapsulation layer 12 overflows, therefore, the packaging process can be adjusted correspondingly, the packaging reliability of the thin film packaging structure is ensured, and the product yield is improved.
In some embodiments, the display panel 10 may further include a light emitting device 14 disposed on the display region of the substrate 11 and an inorganic encapsulation layer 15 covering the light emitting device 14 and the bank structure 13.
In some embodiments, step 200 may specifically include: for each surface contour curve L, a test point on the surface contour curve L is obtained at a preset length interval from a preset distance from the center of the display area AA to the direction of the non-display area NA. In this embodiment, the specific size of the preset length is not limited, and it can be understood that the smaller the value of the preset length is, the more accurate the measurement result of the display panel test method of this embodiment is. The starting position at the predetermined distance from the center of the display area AA may be a position relatively close to the side of the dam structure 13 close to the display area AA.
In some embodiments, step 400 may specifically include: if the first slope value f1 of each of the plurality of test points on the at least one surface profile curve L is not equal to the second slope values f2, it is determined that the organic encapsulation layer 12 overflows.
In this embodiment, referring to fig. 4, fig. 4 is a schematic diagram of a second cross-sectional view a-a and a corresponding surface profile curve in fig. 1. By comparing the first slope value f1 of each of the plurality of test points on each surface contour curve L with each of the second slope values f2, if the first slope value f1 of each of the plurality of test points on at least one surface contour curve L is not equal to each of the second slope values f2, it can be determined that the organic encapsulation layer 12 corresponding to the at least one surface contour curve L covers the surface of the outermost bank layer 131 close to the display area AA, and it can be determined that the organic encapsulation layer 12 corresponding to the at least one surface contour curve L overflows. It is understood that, as long as the overflow occurs at any position of the organic encapsulation layer 12, the overflow of the organic encapsulation layer 12 of the display panel 10 can be determined. Therefore, when it is determined that the first slope value f1 of each test point on one of the surface profile curves L is not equal to the second slope value f2 of the surface of the dam layer 131 on the side close to the display area AA, it can be determined that the organic encapsulation layer 12 of the display panel 10 overflows, and at this time, the detection can be stopped, so as to improve the detection efficiency.
Further, in other embodiments, step 400 may specifically include: if the first slope value f1 of at least one test point existing on each surface profile curve L is equal to the second slope value f2 of the surface of one of the dam layers 131 in the dam structure 13 on the side close to the display area AA, it is determined that the organic encapsulation layer 12 is not overflowing.
This embodiment can continue with reference to fig. 2. For each surface contour curve L, the first slope value f1 of at least one test point existing on each surface contour curve L is equal to the second slope value f2 of the surface of one of the dam layers 131 in the dam structure 13 close to the display area AA, and the organic encapsulation layer 12 corresponding to each surface contour curve L does not cover the surface of the at least one dam layer 131 close to the display area AA, so that the second slope value f2 of the surface of the at least one dam layer 131 close to the display area AA can be detected. To ensure that no overflow occurs in all directions of the display panel, it is necessary to detect that the first slope value f1 of at least one test point exists on all the surface profile curves L and is equal to the second slope value f2 of the surface of one of the dam layers 131 in the dam structure 13, which is close to the display area AA, so as to ensure that no overflow occurs at the position of the organic encapsulation layer 12 corresponding to each surface profile curve L, and thus it can be determined that no overflow occurs in the organic encapsulation layer 12 of the display panel 10.
In some embodiments, referring to fig. 2, for each surface profile curve L, the surface profile curve L points to the non-display area NA direction from a predetermined distance away from the center of the display area AA, and a portion of the surface profile curve L corresponding to a side surface of each dam layer 131 away from the substrate 11 is removed, if a first slope value f1 of at least one test point on the surface profile curve L is equal to 0, a position of the test point with the first slope value f1 equal to 0 is determined as an edge of the organic encapsulation layer 12. In this embodiment, if at least one test point with a first slope value f1 being 0 exists on the surface profile curve L of the display panel 10 from the predetermined distance from the center of the display area AA toward the non-display area NA, and the test point with the first slope value f1 being 0 is located on the plane between the edge of the organic encapsulation layer 12 and the bank structure 13, because the interference of the top plane of each bank layer 131 with the test result is eliminated if at least one test point with the first slope value f1 being 0 exists on the surface profile curve L of the display panel 10. The test point with the first slope value f1 equal to 0 is located at the edge of the organic encapsulation layer 12 from the predetermined distance from the display area AA to the non-display area NA. In this embodiment, the predetermined distance from the center of the display area AA is defined as a position where the first slope value f1 and the second slope value f2 of the test points on the surface profile curve L have opposite signs, so as to prevent the test points with the first slope value f1 being 0 from being present in the portion of the surface profile curve L relatively close to the display area AA, and causing interference to the test structure. It is understood that the position of each dam layer 131 of the dam structure 13 is a fixed position, and the position and contour information of each dam layer 131 can be acquired in advance.
In other embodiments, referring to fig. 5, fig. 5 is a schematic view of a third cross-sectional view a-a of fig. 1 and a corresponding surface profile curve. For each surface contour curve L, the surface contour curve L points to the non-display area NA direction from a preset distance from the center of the display area AA, and a portion of the surface contour curve L corresponding to a side surface of each dam layer 131 away from the substrate 11 is removed, if the first slope value f1 of each test point of the plurality of test points on the surface contour curve L is not equal to 0, the position of the test point where the first slope value f1 is equal to the second slope value f2 of the surface of one dam layer 131 close to the display area AA in the dam structure 13 is determined as the edge of the organic encapsulation layer 12. In this embodiment, if there is no test point with the first slope value f1 being 0 on the surface profile curve L excluding the portion corresponding to the side surface of each bank layer 131 away from the substrate 11, there is no planar structure between the organic encapsulation layer 12 and the bank structure 13, that is, the edge of the organic encapsulation layer 12 directly contacts with the bank structure 13, and the position of the test point with the first slope value f1 being equal to the second slope value f2 is determined as the edge of the organic encapsulation layer from the preset distance from the display area AA to the direction of the non-display area NA. The edge of the organic encapsulation layer 12 is positioned on the surface of the outermost dam layer 131 on the side close to the display area AA.
In some alternative embodiments, as shown in fig. 1 and fig. 2, the dam structure 13 may include two dam layers 131 spaced apart from each other, surfaces of the two dam layers 131 close to the display area AA each have a second slope value f2, and surfaces of the two dam layers 131 far from the display area AA each have a third slope value f3, wherein a product of the second slope value f2 and the third slope value f3 is less than 0, that is, signs of the second slope value f2 and the third slope value f3 are opposite. In some embodiments, the display panel 10 inspection method further includes the steps of: for each surface contour curve L, if there are at least two test points on the surface contour curve L where the first slope value f1 is equal to the second slope value f2, and there is a preset point where the first slope value f1 is equal to 0 between the two test points where the first slope value f1 is equal to the second slope value f2 in the direction pointing to the non-display area NA along the display area AA, it is determined that the edge of the organic encapsulation layer 12 is located on the side of the dam structure 13 close to the display area. In this embodiment, if a test point with the first slope value f1 equal to 0 exists between two test points with the first slope value f1 and the second slope value f2 equal to each other in the direction pointing to the non-display area NA along the display area AA, it can be determined that the organic encapsulation layer 12 is not covered between the two dam layers 131, and it can be determined that the edge of the organic encapsulation layer 12 is located on the side of the dam structure 13 close to the display area AA.
In other alternative embodiments, referring to fig. 6, fig. 6 is a fourth cross-sectional view a-a of fig. 1 along with a corresponding surface profile curve. For each surface contour curve L, if there are at least two test points on the surface contour curve L where the first slope value f1 is equal to the third slope value f3 and at least one test point where the first slope value f1 is equal to the second slope value f2, and the test point where the first slope value f1 is equal to the second slope value f2 in the direction pointing to the non-display area NA along the display area AA is located between two test points where the first slope value f1 is equal to the third slope value f3, and there is no dam test point where the first slope value f1 is equal to 0 on the surface contour curve L except the portion corresponding to the side surface of each dam layer 131 facing away from the substrate 11, it is determined that the edge of the organic encapsulation layer 12 is located on the surface of the inner side of the layer 131 close to the display area AA. The inner bank 131 as referred to herein means the bank 131 closer to the display area AA of the two banks 131, and the outer bank 131 means the bank 131 farther from the display area AA of the two banks 131.
Further, referring to fig. 7, fig. 7 is a schematic diagram of a fifth cross-sectional view a-a in fig. 1 and a corresponding surface profile curve. In other embodiments, for each surface profile curve L, if there exists at least one test point on the surface profile curve L with the first slope value f1 equal to the third slope value f3 and at least one test point with the first slope value f1 equal to the second slope value f2, and the test points with the first slope value f1 equal to the third slope value f3 are located behind the test points with the first slope value f1 equal to the second slope value f2 in the direction pointing along the display area AA toward the non-display area NA, it is determined that the edge of the organic encapsulation layer 12 is located between the two dam layers 131. In this embodiment, in the direction pointing to the non-display area NA along the display area AA, the test points with the first slope value f1 equal to the third slope value f3 are located behind the test points with the first slope value f1 equal to the second slope value f2, then the organic encapsulation layer 12 covers the inner bank layer 131, and the test points with the detected first slope value f1 equal to the third slope value f3 are the third slope value f3 of the points on the surface of the outer bank layer 131 far from the display area AA, then it can be determined that the edge of the organic encapsulation layer 12 is located between the two bank layers 131. It can be understood that, in this embodiment, since the surface contour line L points to the non-display area along the display area, the test points with the first slope value f1 equal to the third slope value f3 are located behind the test points with the first slope value f1 equal to the second slope value f2, which means that the test points with the first slope value f1 equal to the third slope value f3 correspond to the positions, and are further away from the display area AA relative to the positions corresponding to the test points with the first slope value f1 equal to the second slope value f 2.
In some optional embodiments, the display panel detection method further comprises: before the organic encapsulation layer 12 is formed on the substrate 11, the second slope value f2 of the surface of each bank layer 131 of the bank structure 13 on the side close to the display area AA and the third slope value f3 of the surface on the side away from the display area AA are obtained. In some embodiments, the second slope value f2 of the surface of each dam layer 131 of the dam structure 13 on the side close to the display area AA and the third slope value f3 of the surface on the side far from the display area AA may be obtained by a white light interferometric three-dimensional measuring instrument. In other embodiments, the second slope value f2 of the surface of each dam layer 131 of the dam structure 13 on the side close to the display area AA and the third slope value f3 of the surface on the side far from the display area AA can also be obtained by a probe-type surface profile testing apparatus.
The invention also provides a display panel detection device 500, which is used for detecting the overflow condition of the organic encapsulation layer 12 of the display panel 10, the display panel 10 is provided with a display area AA and a non-display area NA positioned at the outer periphery side of the display area AA, and the display panel 10 comprises a substrate 11, the organic encapsulation layer 12 arranged on the substrate 11 and a dam structure 13 arranged on the substrate 11 corresponding to the non-display area NA. The dam structure 13 may include at least one dam layer 131 disposed around the display area AA. The display panel inspection apparatus 500 of the embodiment may perform the inspection of whether the organic encapsulation layer 12 overflows after the organic encapsulation layer 12 is formed in the manufacturing process of the display panel 10. Referring to fig. 8, fig. 8 is a block diagram of a display panel detection apparatus according to an embodiment of the invention. The display panel detection apparatus 500 includes an acquisition module 501, a first determination module 502, a second acquisition module 503, and a second determination module 504.
A first obtaining module 501, configured to obtain at least one surface contour curve of the display panel pointing to the non-display area along the center of the display area after the organic encapsulation layer is formed;
a first determining module 502 is configured to determine a plurality of test points on each surface contour curve according to each surface contour curve.
A second obtaining module 503, configured to obtain a first slope value f1 of each test point;
a second determining module 504, configured to determine whether the organic encapsulation layer overflows based on the first slope value f1 of each test point and a second slope value f2 of a side surface of the at least one dam layer near the display area.
After the organic encapsulation layer 12 is formed in the preparation process of the display panel 10, at least one surface profile curve L of the display panel 10 pointing to the non-display area NA along the center of the display area AA is obtained by the first obtaining module 501, a plurality of test points are determined on each surface profile curve L according to each surface profile curve L by the first determining module 502, then a first slope value f1 of each test point is obtained by the second obtaining module 503, and finally, whether the organic encapsulation layer 12 of the display panel 10 overflows or not can be determined by comparing the first slope value f1 of each test point with a second slope value f2 of one side surface of at least one dam layer 131 of the dam structure 13 close to the display area AA by the second determining module 504, so that the display panel detection apparatus of the present embodiment can accurately detect whether the organic encapsulation layer 12 overflows or not, and further can correspondingly adjust the encapsulation process, the packaging reliability of the thin film packaging structure is ensured, and the product yield is improved.
In some embodiments, the second determination module 504 is further configured to determine that the organic encapsulation layer overflows if the first slope value f1 of each of the plurality of test points on the at least one surface profile curve is not equal to the respective second slope value f 2.
In some embodiments, the second determination module 504 is further configured to determine that the organic encapsulation layer is not overflowing if the first slope value f1 of the at least one test point on each surface profile curve is equal to the second slope value f2 of the surface of one of the dam layers in the dam structure on the side close to the display area.
In some embodiments, the second determining module 504 is further configured to, for each surface profile curve, point to the non-display area direction from a predetermined distance away from the center of the display area, and remove a portion of the surface profile curve corresponding to a side surface of each dam layer facing away from the substrate, and if a first slope value f1 of at least one test point existing on the surface profile curve is equal to 0, determine a position of the test point where the first slope value f1 is equal to 0 as an edge of the organic encapsulation layer.
In some embodiments, the second determining module 504 is further configured to, for each surface profile curve, point to the non-display area direction from a preset distance from the center of the display area, and remove a portion of the surface profile curve corresponding to a side surface of each dam layer away from the substrate, and if the first slope value f1 of each test point of the plurality of test points on the surface profile curve is not equal to 0, determine a position of the test point where the first slope value f1 is equal to the second slope value f2 of the surface of one of the dam layers close to the display area as the edge of the organic encapsulation layer.
In some embodiments, the first determining module 502 is further configured to, for each surface contour curve, obtain a test point on the surface contour curve at a preset length interval from a preset distance from the center of the display area to the non-display area.
In some embodiments, the dam structure includes two dam layers disposed at intervals, and surfaces of the two dam layers on a side close to the display area have an equal second slope value f 2; the second determining module 504 is further configured to determine, for each surface profile curve, that the edge of the organic encapsulation layer is located on the side of the dam structure close to the display area if at least two test points with a first slope value f1 equal to the second slope value f2 exist on the surface profile curve, and a test point with a first slope value f1 equal to 0 exists between the two test points with a first slope value f1 equal to the second slope value f2 and the surface profile curve of the dam layer facing away from the substrate and the test points with a first slope value f 3878 equal to the second slope value f2 exist on the surface profile curve.
In some embodiments, the dam structure includes two dam layers spaced apart from each other, surfaces of the two dam layers on a side close to the display area have an equal second slope value f2, and surfaces of the two dam layers on a side away from the display area have an equal third slope value f3, wherein a product of the second slope value f2 and the third slope value f3 is less than 0; the second determining module 504 is further configured to determine, for each surface profile curve, that an edge of the organic encapsulation layer is located between two dam layers if at least one test point having a first slope value f1 equal to a third slope value f3, at least one test point having a first slope value f1 equal to a second slope value f2, and the test points having the first slope value f1 equal to the third slope value f3 are located behind the test points having the first slope value f1 equal to the second slope value f2 in a direction pointing along the display area toward the non-display area.
In some embodiments, the display panel inspection apparatus further includes a third obtaining module for obtaining a second slope value f2 of a surface of each bank layer of the bank structure on a side close to the display area and a third slope value f3 of a surface on a side far from the display area before forming the organic encapsulation layer on the substrate.
It should also be noted that the exemplary embodiments mentioned in this specification describe some methods or systems based on a series of steps or devices. However, the present specification is not limited to the order of the above-described steps, that is, the steps may be performed in the order mentioned in the embodiments, may be performed in an order different from the order in the embodiments, or may be performed simultaneously.
Above, only the specific implementation manner of the present specification is provided, and it is clearly understood by those skilled in the art that, for convenience and brevity of description, the specific working processes of the system, the module and the unit described above may refer to the corresponding processes in the foregoing method embodiments, and are not described herein again. It should be understood that the scope of the present disclosure is not limited thereto, and any person skilled in the art can easily conceive various equivalent modifications or substitutions within the technical scope of the present disclosure, and these modifications or substitutions should be covered within the scope of the present disclosure.
Claims (10)
1. A display panel inspection method, wherein the display panel has a display region and a non-display region located on an outer peripheral side of the display region, the display panel includes a substrate, an organic encapsulation layer disposed on the substrate, and a bank structure disposed on the substrate corresponding to the non-display region, the bank structure including at least one bank layer disposed around the display region, the display panel inspection method comprising:
after the organic packaging layer is formed, acquiring at least one surface contour curve of the display panel, which points to the non-display area along the center of the display area;
determining a plurality of test points on each surface contour curve according to each surface contour curve;
acquiring a slope value of a tangent of each test point on the surface profile curve, wherein the slope value is a first slope value f 1;
determining whether the organic encapsulation layer overflows or not based on the first slope value f1 of each test point and the second slope value f2 of the side surface, close to the display area, of at least one dam layer, wherein the slope value of the side surface, close to the display area, of the dam layer is the second slope value f2, and if the first slope value f1 of each test point of a plurality of test points on at least one surface profile curve is not equal to each second slope value f2, determining that the organic encapsulation layer overflows, and/or,
and if the first slope value f1 of at least one test point on each surface contour curve is equal to the second slope value f2 of the surface of one of the dam layers in the dam structure, which is close to the side of the display area, determining that the organic encapsulation layer is not overflowed.
2. The method according to claim 1, wherein the surface profile is obtained by a white light interferometry three-dimensional measuring instrument and/or a probe-type surface profiler;
acquiring the second slope value f2 of the surface of each dam layer of the dam structure, which is close to one side of the display area, by a white light interference three-dimensional measuring instrument and/or a probe-type surface profiler.
3. The method as claimed in claim 1, wherein the determining that the organic encapsulation layer is not overflowing if the first slope value f1 of the at least one test point on each surface profile curve is equal to the second slope value f2 of the surface of one of the dam layers in the dam structure near the display area comprises:
and for each surface contour curve, pointing to the non-display area direction from a preset distance away from the center of the display area, removing a part of the surface contour curve corresponding to one side surface of each dam layer, which is far away from the substrate, and if the first slope value f1 of at least one test point on the surface contour curve is equal to 0, determining the position of the test point with the first slope value f1 equal to 0 as the edge of the organic encapsulation layer.
4. The method as claimed in claim 1, wherein the determining that the organic encapsulation layer is not overflowing if the first slope value f1 of the at least one test point on each surface profile curve is equal to the second slope value f2 of the surface of one of the dam layers in the dam structure, the surface being closer to the display area, comprises:
for each surface contour curve, pointing to the non-display area direction from a preset distance away from the center of the display area, and removing a part of the surface contour curve corresponding to one side surface of each dam layer, which is far away from the substrate, if the first slope value f1 of each test point in a plurality of test points on the surface contour curve is not equal to 0, determining the position of the test point where the first slope value f1 is equal to the second slope value f2 of the surface of one dam layer in the dam structure, which is close to one side of the display area, as the edge of the organic encapsulation layer.
5. The method for inspecting a display panel according to claim 1, wherein the determining a plurality of test points on each of the surface profile curves according to each of the surface profile curves comprises:
and for each surface contour curve, pointing to the direction of the non-display area from a preset distance away from the center of the display area, and acquiring a test point on the surface contour curve at preset intervals.
6. The method according to claim 1, wherein the dam structure comprises two dam layers spaced apart from each other, surfaces of the two dam layers on a side close to the display area having an equal second slope value f 2; the display panel detection method further comprises the following steps:
for each surface contour curve, if at least two test points with the first slope value f1 equal to the second slope value f2 exist on the surface contour curve, and a test point with the first slope value f1 equal to 0 exists between the two test points with the first slope value f1 equal to the second slope value f2 except for the part of the surface contour curve corresponding to the side surface of each dam layer away from the substrate and pointing to the non-display area direction along the display area, the edge of the organic encapsulation layer is determined to be positioned on the side of the dam structure close to the display area.
7. The method as claimed in claim 1, wherein the dam structure comprises two dam layers spaced apart from each other, a slope value of a surface of one side of the dam layer away from the display area is a third slope value f3, surfaces of the two dam layers close to the display area have an equal second slope value f2, and surfaces of the two dam layers away from the display area have an equal third slope value f3, wherein a product of the second slope value f2 and the third slope value f3 is less than 0; the display panel detection method further comprises the following steps:
for each surface contour curve, if at least one test point with a first slope value f1 equal to the third slope value f3 and at least one test point with a first slope value f1 equal to the second slope value f2 exist on the surface contour curve, and in the direction pointing to the non-display area along the display area, the test points with the first slope value f1 equal to the third slope value f3 are all located behind the test points with the first slope value f1 equal to the second slope value f2, and then the edge of the organic encapsulation layer is determined to be located between the two dam layers.
8. The method according to claim 7, wherein the third slope value f3 of the surface of the side of each dam layer of the dam structure away from the display area is obtained by a white light interferometric three-dimensional measuring instrument and/or a probe-type surface profiler.
9. The display panel detection method according to claim 1, further comprising:
before the organic encapsulation layer is formed on the substrate, a second slope value f2 of a surface of each bank layer of the bank structure on a side close to the display area and a third slope value f3 of a surface on a side far from the display area are obtained.
10. A display panel inspection apparatus, wherein the display panel has a display region and a non-display region located at an outer peripheral side of the display region, the display panel includes a substrate, an organic encapsulation layer disposed on the substrate, and a bank structure disposed on the substrate corresponding to the non-display region, the bank structure including at least one bank layer disposed around the display region, the display panel inspection apparatus comprising:
the first acquisition module is used for acquiring at least one surface contour curve of the display panel, which points to the non-display area along the center of the display area, after the organic packaging layer is formed;
the first determining module is used for determining a plurality of test points on each surface contour curve according to each surface contour curve;
the second obtaining module is used for obtaining a slope value of a tangent of each test point on the surface contour curve, wherein the slope value is a first slope value f 1; a second determining module, configured to determine whether the organic encapsulation layer overflows or not based on the first slope value f1 of each test point and the second slope value f2 of the side surface of at least one dam layer close to the display area, where the slope value of the side surface of the dam layer close to the display area is the second slope value f2, and if the first slope value f1 of each test point of the plurality of test points on at least one surface contour curve is not equal to each of the second slope values f2, determine that the organic encapsulation layer overflows, and/or,
and if the first slope value f1 of at least one test point on each surface contour curve is equal to the second slope value f2 of the surface of one of the dam structures, which is close to the side of the display area, determining that the organic encapsulation layer is not overflowed.
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| CN107808930A (en) * | 2016-08-31 | 2018-03-16 | 乐金显示有限公司 | Display device and its method of testing |
| CN107919293A (en) * | 2016-10-10 | 2018-04-17 | 三星显示有限公司 | Display device and organic material detection method |
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