CN111223517A - Plc通信模块中从设备的eeprom恢复方法 - Google Patents

Plc通信模块中从设备的eeprom恢复方法 Download PDF

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Publication number
CN111223517A
CN111223517A CN201910893367.3A CN201910893367A CN111223517A CN 111223517 A CN111223517 A CN 111223517A CN 201910893367 A CN201910893367 A CN 201910893367A CN 111223517 A CN111223517 A CN 111223517A
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data
memory
erasable programmable
programmable read
information area
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CN201910893367.3A
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Chinese (zh)
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CN111223517B (zh
Inventor
金亨来
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LS Electric Co Ltd
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LSIS Co Ltd
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    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B19/00—Programme-control systems
    • G05B19/02—Programme-control systems electric
    • G05B19/04—Programme control other than numerical control, i.e. in sequence controllers or logic controllers
    • G05B19/05—Programmable logic controllers, e.g. simulating logic interconnections of signals according to ladder diagrams or function charts
    • G05B19/054—Input/output
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F21/00—Security arrangements for protecting computers, components thereof, programs or data against unauthorised activity
    • G06F21/60—Protecting data
    • G06F21/62—Protecting access to data via a platform, e.g. using keys or access control rules
    • G06F21/6218—Protecting access to data via a platform, e.g. using keys or access control rules to a system of files or objects, e.g. local or distributed file system or database
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/44—Indication or identification of errors, e.g. for repair
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B19/00—Programme-control systems
    • G05B19/02—Programme-control systems electric
    • G05B19/04—Programme control other than numerical control, i.e. in sequence controllers or logic controllers
    • G05B19/05—Programmable logic controllers, e.g. simulating logic interconnections of signals according to ladder diagrams or function charts
    • G05B19/056—Programming the PLC
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B19/00—Programme-control systems
    • G05B19/02—Programme-control systems electric
    • G05B19/04—Programme control other than numerical control, i.e. in sequence controllers or logic controllers
    • G05B19/10—Programme control other than numerical control, i.e. in sequence controllers or logic controllers using selector switches
    • G05B19/106—Programme control other than numerical control, i.e. in sequence controllers or logic controllers using selector switches for selecting a programme, variable or parameter
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B19/00—Programme-control systems
    • G05B19/02—Programme-control systems electric
    • G05B19/04—Programme control other than numerical control, i.e. in sequence controllers or logic controllers
    • G05B19/12—Programme control other than numerical control, i.e. in sequence controllers or logic controllers using record carriers
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/08—Error detection or correction by redundancy in data representation, e.g. by using checking codes
    • G06F11/10—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's
    • G06F11/1004—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's to protect a block of data words, e.g. CRC or checksum
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/08—Error detection or correction by redundancy in data representation, e.g. by using checking codes
    • G06F11/10—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's
    • G06F11/1008—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices
    • G06F11/1068—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices in sector programmable memories, e.g. flash disk
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/14—Error detection or correction of the data by redundancy in operation
    • G06F11/1402—Saving, restoring, recovering or retrying
    • G06F11/1415—Saving, restoring, recovering or retrying at system level
    • G06F11/1441—Resetting or repowering
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/10—Programming or data input circuits
    • G11C16/102—External programming circuits, e.g. EPROM programmers; In-circuit programming or reprogramming; EPROM emulators
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/34—Determination of programming status, e.g. threshold voltage, overprogramming or underprogramming, retention
    • G11C16/3404—Convergence or correction of memory cell threshold voltages; Repair or recovery of overerased or overprogrammed cells
    • G11C16/3409—Circuits or methods to recover overerased nonvolatile memory cells detected during erase verification, usually by means of a "soft" programming step
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/34—Determination of programming status, e.g. threshold voltage, overprogramming or underprogramming, retention
    • G11C16/3436—Arrangements for verifying correct programming or erasure
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/38—Response verification devices
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/10—Programming or data input circuits
    • G11C16/14—Circuits for erasing electrically, e.g. erase voltage switching circuits

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  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Automation & Control Theory (AREA)
  • Computer Security & Cryptography (AREA)
  • Computer Hardware Design (AREA)
  • Software Systems (AREA)
  • General Health & Medical Sciences (AREA)
  • Bioethics (AREA)
  • Health & Medical Sciences (AREA)
  • Databases & Information Systems (AREA)
  • Programmable Controllers (AREA)
  • Maintenance And Management Of Digital Transmission (AREA)
  • Detection And Correction Of Errors (AREA)
  • Small-Scale Networks (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
  • Stored Programmes (AREA)
CN201910893367.3A 2018-11-27 2019-09-20 Plc通信模块中从设备的eeprom恢复方法 Active CN111223517B (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
KR10-2018-0148134 2018-11-27
KR1020180148134A KR102110340B1 (ko) 2018-11-27 2018-11-27 Plc 통신모듈에서 슬레이브 장치의 eeprom 복구 방법

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CN111223517A true CN111223517A (zh) 2020-06-02
CN111223517B CN111223517B (zh) 2023-10-17

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US (1) US10877837B2 (ko)
EP (1) EP3660722B1 (ko)
JP (1) JP6812516B2 (ko)
KR (1) KR102110340B1 (ko)
CN (1) CN111223517B (ko)
ES (1) ES2900258T3 (ko)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN114691178B (zh) * 2022-05-31 2022-09-06 深圳市杰美康机电有限公司 一种基于EtherCAT通讯驱动器的固件升级方法及装置
CN115378761B (zh) * 2022-09-27 2023-01-20 傲拓科技股份有限公司 一种基于PLC的EtherCAT主站系统快速实现方法

Citations (5)

* Cited by examiner, † Cited by third party
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CN102405464A (zh) * 2008-12-31 2012-04-04 施耐德电气美国股份有限公司 用于重新启动的部件配置机制
US20130145085A1 (en) * 2008-06-18 2013-06-06 Super Talent Technology Corp. Virtual Memory Device (VMD) Application/Driver with Dual-Level Interception for Data-Type Splitting, Meta-Page Grouping, and Diversion of Temp Files to Ramdisks for Enhanced Flash Endurance
CN104950784A (zh) * 2014-03-25 2015-09-30 株式会社捷太格特 可编程逻辑控制器的ram的检查方法以及可编程逻辑控制器
CN107766008A (zh) * 2017-12-05 2018-03-06 珠海格力电器股份有限公司 防止存储介质异常写入的方法、装置以及电子设备
CN108398915A (zh) * 2017-02-08 2018-08-14 欧姆龙株式会社 控制装置以及其控制方法

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US6216251B1 (en) * 1999-04-30 2001-04-10 Motorola Inc On-chip error detection and correction system for an embedded non-volatile memory array and method of operation
JP2002334024A (ja) * 2001-05-11 2002-11-22 Denso Corp 電子制御装置
US7392404B2 (en) * 2002-12-20 2008-06-24 Gemalto, Inc. Enhancing data integrity and security in a processor-based system
JP4484074B2 (ja) * 2002-12-27 2010-06-16 オムロン株式会社 プログラマブルコントローラ用ユニット及びメモリ自動復旧方法
TW591393B (en) * 2003-01-22 2004-06-11 Fujitsu Ltd Memory controller
KR101401616B1 (ko) * 2008-05-15 2014-06-02 주식회사 서보산전 이더캣통신 기반의 슬레이브 제어 시스템
US9674803B2 (en) * 2013-09-23 2017-06-06 Qualcomm Incorporated Out-of synchronization detection and correction during compression

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20130145085A1 (en) * 2008-06-18 2013-06-06 Super Talent Technology Corp. Virtual Memory Device (VMD) Application/Driver with Dual-Level Interception for Data-Type Splitting, Meta-Page Grouping, and Diversion of Temp Files to Ramdisks for Enhanced Flash Endurance
CN102405464A (zh) * 2008-12-31 2012-04-04 施耐德电气美国股份有限公司 用于重新启动的部件配置机制
CN104950784A (zh) * 2014-03-25 2015-09-30 株式会社捷太格特 可编程逻辑控制器的ram的检查方法以及可编程逻辑控制器
CN108398915A (zh) * 2017-02-08 2018-08-14 欧姆龙株式会社 控制装置以及其控制方法
CN107766008A (zh) * 2017-12-05 2018-03-06 珠海格力电器股份有限公司 防止存储介质异常写入的方法、装置以及电子设备

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Publication number Publication date
CN111223517B (zh) 2023-10-17
US10877837B2 (en) 2020-12-29
EP3660722B1 (en) 2021-09-29
JP2020088845A (ja) 2020-06-04
US20200167228A1 (en) 2020-05-28
ES2900258T3 (es) 2022-03-16
JP6812516B2 (ja) 2021-01-13
EP3660722A1 (en) 2020-06-03
KR102110340B1 (ko) 2020-05-13

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