CN111221193A - Array substrate, manufacturing method thereof and display panel - Google Patents

Array substrate, manufacturing method thereof and display panel Download PDF

Info

Publication number
CN111221193A
CN111221193A CN202010068647.3A CN202010068647A CN111221193A CN 111221193 A CN111221193 A CN 111221193A CN 202010068647 A CN202010068647 A CN 202010068647A CN 111221193 A CN111221193 A CN 111221193A
Authority
CN
China
Prior art keywords
switch tube
array substrate
wire
substrate
control signal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN202010068647.3A
Other languages
Chinese (zh)
Inventor
翁木容
叶穗丰
王明朗
罗锦钊
朱汉平
胡君文
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Truly Huizhou Smart Display Ltd
Original Assignee
Truly Huizhou Smart Display Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Truly Huizhou Smart Display Ltd filed Critical Truly Huizhou Smart Display Ltd
Priority to CN202010068647.3A priority Critical patent/CN111221193A/en
Publication of CN111221193A publication Critical patent/CN111221193A/en
Pending legal-status Critical Current

Links

Images

Classifications

    • GPHYSICS
    • G02OPTICS
    • G02FOPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/136Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
    • G02F1/1362Active matrix addressed cells
    • GPHYSICS
    • G02OPTICS
    • G02FOPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/136Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
    • G02F1/1362Active matrix addressed cells
    • G02F1/136286Wiring, e.g. gate line, drain line
    • GPHYSICS
    • G09EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09GARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
    • GPHYSICS
    • G02OPTICS
    • G02FOPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/136Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
    • G02F1/1362Active matrix addressed cells
    • G02F1/136254Checking; Testing

Abstract

The invention provides an array substrate, a manufacturing method thereof and a display panel, wherein the array substrate comprises: the switch comprises a substrate, a first lead, a second lead, a control signal line and a switch tube; the first conducting wire, the second conducting wire, the control signal wire and the switch tube are arranged on the substrate; the first end of first wire is used for connecting drive circuit, the second end of first wire is connected with the first end of switch tube, the second end of switch tube is connected with the first end of second wire, the second end of second wire extends to the line of cut department of base plate, the control end and the control signal line of switch tube are connected, when needs cut array substrate or do not use array substrate, be in the power-off state with array substrate, so that the switch tube is out of work, thereby can avoid static electricity to transmit to drive circuit through the second wire with the display function of interference panel or damage drive circuit, better protection drive circuit.

Description

Array substrate, manufacturing method thereof and display panel
Technical Field
The invention relates to the technical field of display, in particular to an array substrate, a manufacturing method thereof and a display panel.
Background
With the development of display industry technology, users have higher and higher requirements on appearance design such as thinning, abnormity, narrow edge and the like of a display panel. The display panel is generally connected to the driver IC by a COG (Chip on Glass) or COF (Chip on Film) connection method. The COF connection mode can greatly reduce the connection space between the panel and the driving chip, and achieves an obvious edge narrowing effect; secondly, under the condition that a COG mode is adopted, a driving chip for saving the space of a connection area is developed by adjusting the arrangement positions of input pins and output pins so as to achieve narrow edge.
In the existing liquid crystal display panel manufacturing, some bad problems of the panel can be detected by simply electrically testing by electrifying Test pads (Test pads) of scanning lines and data lines in the manufacturing process of an array substrate or after finishing a large substrate. However, due to the narrowing of the edge, the display resolution is higher and higher, the wiring is dense, and it is inevitable to consider placing the quick detection pad outside the panel, and after the electrical measurement is completed, a cutting process is added to cut off the auxiliary circuits such as the quick detection pad in the array substrate, which may cause the wire ends of the metal wiring to remain and be exposed at the cut edge section of the panel, so that external static electricity is easily introduced through the wire ends of the exposed wiring at the side edge, which interferes the display function of the panel, and even damages or destroys the internal circuit of the panel or the driving chip connected with the panel.
Disclosure of Invention
Accordingly, it is desirable to provide an array substrate, a method of manufacturing the same, and a display panel.
Provided is an array substrate including: the switch comprises a substrate, a first lead, a second lead, a control signal line and a switch tube; the first conducting wire, the second conducting wire, the control signal wire and the switch tube are arranged on the substrate; the first end of the first wire is used for being connected with a driving circuit, the second end of the first wire is connected with the first end of the switch tube, the second end of the switch tube is connected with the first end of the second wire, the second end of the second wire extends to the cutting line of the substrate, and the control end of the switch tube is connected with the control signal line.
The array substrate extends to the cutting line of the array substrate through the second conducting wire, namely the testing pad of the array substrate is arranged outside the array substrate, so that the area of the array substrate is reduced, the display panel is narrowed, and the switch tube is arranged between the first conducting wire and the second conducting wire. When the array substrate needs to be tested, a first control signal is output to the control end of the switch tube through the control signal line so as to conduct the first end and the second end of the switch tube, namely, the first lead and the second lead are connected, so that the array substrate can be normally tested; when the array substrate needs to be cut, or when the array substrate is not used, the array substrate is powered off, so that the switch tube does not work, or a second control signal is sent to the control end of the switch tube through the control signal line, so that the switch tube is cut off, static electricity can be prevented from being transmitted to the driving circuit through the second lead wire to interfere the display function of the panel, and the driving circuit is better protected.
In one embodiment, the number of the first conducting wires is multiple, the number of the second conducting wires is multiple, the number of the switching tubes is multiple, the first end of each first conducting wire is used for being connected with the driving circuit, the second end of each first conducting wire is connected with the first end of one switching tube, the second end of each switching tube is connected with the first end of one second conducting wire, the second end of each second conducting wire extends to the cutting line of the substrate, and the control end of each switching tube is connected with the control signal line.
In one embodiment, the switching tube is a thin film transistor, the second end of the first conducting wire is connected with the first end of the thin film transistor, the first end of the second conducting wire is connected with the second end of the thin film transistor, and the control signal line is connected with the gate of the thin film transistor.
In one embodiment, the first conductor is used for transmitting data signals; or the first wire is used for transmitting scanning signals.
In one embodiment, a method for manufacturing an array substrate includes:
a first lead, a second lead, a control signal line and a switch tube are arranged on a substrate, wherein a first end of the first lead is used for connecting a driving circuit, a second end of the first lead is connected with a first end of the switch tube, a second end of the switch tube is connected with a first end of the second lead, a second end of the second lead extends to a cutting line of the substrate, and a control end of the switch tube is connected with the control signal line; the second end of the second lead is used for being connected with a test device, and a first control signal is sent to the control end of the switch tube through the control signal line so as to conduct the switch tube and test the substrate; after the test is finished, the array substrate is in a power-off state, so that the switch tube does not work; and cutting the substrate along the cutting line.
In one embodiment, the number of the first conducting wires is multiple, the number of the second conducting wires is multiple, the number of the switching tubes is multiple, the first end of each first conducting wire is used for being connected with the driving circuit, the second end of each first conducting wire is connected with the first end of one switching tube, the second end of each switching tube is connected with the first end of one second conducting wire, the second end of each second conducting wire extends to the cutting line of the substrate, and the control end of each switching tube is connected with the control signal line.
In one embodiment, the switching tube is a thin film transistor, the second end of the first conducting wire is connected with the first end of the thin film transistor, the first end of the second conducting wire is connected with the second end of the thin film transistor, and the control signal line is connected with the gate of the thin film transistor.
In one embodiment, a display panel includes the array substrate described in any of the above embodiments.
In one embodiment, the display panel further includes a driving circuit connected to the first end of the first conductive line, and the driving circuit is bonded to the substrate.
In one embodiment, the display panel further includes a driving circuit and a flexible substrate, the driving circuit is bonded on the flexible substrate, and the driving circuit is connected to the first end of the first conductive wire.
Drawings
Fig. 1 is a schematic structural diagram of an array substrate according to an embodiment of the invention;
FIG. 2 is a schematic flow chart illustrating a method for fabricating an array substrate according to an embodiment of the present invention;
FIG. 3 is a schematic structural diagram of a display panel according to an embodiment of the present invention;
FIG. 4 is a schematic structural diagram of the display panel of FIG. 3 after being cut along a cutting line;
FIG. 5 is a schematic structural diagram of a display panel according to another embodiment of the present invention;
fig. 6 is a schematic structural diagram of the display panel cut along the cutting line in fig. 5.
Detailed Description
To facilitate an understanding of the invention, the invention will now be described more fully with reference to the accompanying drawings. Preferred embodiments of the present invention are shown in the drawings. This invention may, however, be embodied in many different forms and should not be construed as limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete.
It will be understood that when an element is referred to as being "disposed on" another element, it can be directly on the other element or intervening elements may also be present. When an element is referred to as being "connected" to another element, it can be directly connected to the other element or intervening elements may also be present. The terms "vertical," "horizontal," "left," "right," and the like as used herein are for illustrative purposes only and do not represent the only embodiments.
Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this invention belongs. The terminology used herein in the description of the invention is for the purpose of describing particular embodiments only and is not intended to be limiting of the invention. As used herein, the term "and/or" includes any and all combinations of one or more of the associated listed items.
For example, an array substrate is provided, including: the switch comprises a substrate, a first lead, a second lead, a control signal line and a switch tube; the first conducting wire, the second conducting wire, the control signal wire and the switch tube are arranged on the substrate; the first end of the first wire is used for being connected with a driving circuit, the second end of the first wire is connected with the first end of the switch tube, the second end of the switch tube is connected with the first end of the second wire, the second end of the second wire extends to the cutting line of the substrate, and the control end of the switch tube is connected with the control signal line.
The array substrate extends to the cutting line of the array substrate through the second lead, namely, the testing pad of the array substrate is arranged outside the array substrate to reduce the area of the array substrate and narrow the edge of the display panel, and the switch tube is arranged between the first lead and the second lead, when the array substrate needs to be tested, the first control signal is output to the control end of the switch tube through the control signal line so as to lead the first end and the second end of the switch tube to be conducted, namely, the first lead is connected with the second lead so as to lead the array substrate to be capable of being normally tested, when the array substrate needs to be cut or is not used, the switch tube does not work through the power loss of the array substrate, or the second control signal is sent to the control end of the switch tube through the control signal line so as to lead the switch tube to be cut off, thereby avoiding the static electricity from being transmitted to the driving circuit through the second lead to disturb the display function of the panel, the drive circuit is better protected.
In one embodiment, referring to fig. 1, an array substrate 10 includes: the circuit board comprises a substrate 100, a first conducting wire 310, a second conducting wire 320, a control signal wire 500 and a switch tube 200; the first conductive line 310, the second conductive line 320, the control signal line 500 and the switch tube 200 are disposed on the substrate 100; the first end of the first conducting wire 310 is used for connecting the driving circuit 400, the second end of the first conducting wire 310 is connected with the first end of the switching tube 200, the second end of the switching tube 200 is connected with the first end of the second conducting wire 320, the second end of the second conducting wire 320 extends to the cutting line 110 of the substrate 100, and the control end of the switching tube 200 is connected with the control signal line 500.
Specifically, in order to narrow the edge of the display panel, the fast detection pad in the array substrate is usually placed outside the panel, and the array substrate cuts off the connection line between the driving circuit and the fast detection pad during the cutting process, which results in the connection line being exposed on the substrate, i.e. corresponding to the second wire of the present application, the connection line may be a data signal line or a scanning signal line of the array substrate, or may be other metal wiring. Because the connecting wires are exposed on the substrate, static electricity is easily introduced through the wire ends of the exposed wires on the side edge of the array substrate, the display function of the panel is interfered, and even the internal circuit of the panel is damaged. Therefore, by disposing the switch tube between the wires, that is, disposing the switch tube between the first wire and the second wire, that is, equivalent to the first wire is connected to the second wire through the switch tube, further, dividing the original signal transmission wire 300 into the first wire 310 and the second wire 320, the first wire 310 is connected to the second wire 320 through the switch tube 200 to form the signal transmission wire 300, the second end of the second wire extends to the cutting line of the substrate, that is, the second end of the second wire is the wire head with the exposed wire, when the array substrate needs to be cut or when the array substrate is not used, the switch tube does not work by de-energizing the array substrate, that is, the signal wire is controlled not to output an electrical signal, even if the switch tube is in a suspended state, the voltage generated by external static electricity or external electric field interference is not transmitted to the driving circuit through the first wire, so as to prevent the external interference voltage from interfering the panel display and damaging the panel internal circuit. Of course, the second control signal can be output through the control signal line to make the switching tube in the cut-off state, that is, the first conducting wire and the second conducting wire are in the disconnected state, so as to achieve the same effect. When the array substrate needs to be tested, the first control signal is output through the control signal line so as to enable the switch tube to be conducted, namely the first lead is connected with the second lead, and the second end of the second lead is connected with the testing equipment so as to enable the array substrate to be tested normally.
Specifically, the cutting line needs to cut the substrate along the cutting line. The second end of the second conducting wire extends to the cutting line of the substrate, namely the second end of the second conducting wire extends to the surface of the cutting surface of the substrate.
It should be understood that the array substrate is usually cut by a cutter wheel or laser cutting process, and the following problems occur when the cutter wheel or laser cutting process is performed:
1. high temperature can be generated in the cutting process, the metal wire is easy to melt to generate left and right wiring short circuit, namely adjacent wires are short circuit, and if the driving circuit is not isolated from the metal wire at the moment, the driving circuit can have short circuit fault, so that the driving circuit is influenced or damaged.
2. Even if the metal wire is not short-circuited in the melting process, the metal wire is subjected to electrochemical reaction when being electrified in a high-temperature and high-humidity environment, so that the metal wire is corroded, and the problem of abnormal display is caused.
Therefore, when the array substrate is in the cutting process or when the array substrate is not used, the control switch tube is in a non-working or cut-off state, so that the second lead is powered off, the problems of damaging the driving circuit and reducing the corrosion of the lead can be avoided, and the second lead and the driving circuit are better protected.
It is worth mentioning that traditional array substrate usually can be with conductive pad, test the pad setting promptly on array substrate, to electrostatic protection, perhaps pad corrosion protection adopt insulating protection glue cover can, but this kind of mode of setting, can increase the space of panel, can't realize the narrow limit, therefore, need set up conductive pad outside array substrate, must cut the wire so, thereby can lead to the end of a thread of wire to expose on the side of the face of cutting of base plate, this end of a thread can't use insulating protection glue cover in order to carry out electrostatic protection, consequently, this application is through setting up the switch tube between array substrate's first wire and second wire, whether be connected with first wire with the exposed end of a thread of control, thereby reach electrostatic protection, the effect of corrosion protection.
The array substrate extends to the cutting line of the array substrate through the second lead, namely, the testing pad of the array substrate is arranged outside the array substrate to reduce the area of the array substrate and narrow the edge of the display panel, and the switch tube is arranged between the first lead and the second lead, when the array substrate needs to be tested, the first control signal is output to the control end of the switch tube through the control signal line so as to lead the first end and the second end of the switch tube to be conducted, namely, the first lead is connected with the second lead so as to lead the array substrate to be capable of being normally tested, when the array substrate needs to be cut or is not used, the switch tube does not work through the power loss of the array substrate, or the second control signal is sent to the control end of the switch tube through the control signal line so as to lead the switch tube to be cut off, thereby avoiding the static electricity from being transmitted to the driving circuit through the second lead to disturb the display function of the panel, the drive circuit is better protected.
In one embodiment, when the array substrate needs to be tested, i.e., before the array substrate is cut, a simple electrical test is usually performed on the array substrate to detect whether the lines on the array substrate are normal.
In one embodiment, when the array substrate works, a second control signal is sent to the control end of the switching tube through the control signal line so as to cut off the switching tube, or the control signal line does not output an electric signal so as to enable the switching tube not to work; therefore, when the array substrate works normally, because the first conducting wire and the second conducting wire are in a disconnected state, an external electric field or static electricity cannot be transmitted to the driving circuit through the second conducting wire, the display function of the panel is interfered, the driving circuit can be better protected, and the second conducting wire cannot receive the voltage of the driving circuit, so that the corrosion phenomenon of exposed wire ends in the second conducting wire is reduced.
In one embodiment, the cutting line is required to cut the substrate along the cutting line so that the array substrate has a cutting surface, and the second end of the second conductive line protrudes from the cutting surface.
In one embodiment, referring to fig. 1, the number of the first conductive lines 310 is plural, the number of the second conductive lines 320 is plural, the number of the switching tubes 200 is plural, the first end of each first conductive line 310 is used for being connected to the driving circuit 400, the second end of each first conductive line 310 is connected to the first end of one switching tube 200, the second end of each switching tube 200 is connected to the first end of one second conductive line 320, the second end of each second conductive line 320 extends to the cutting line 110 of the substrate 100, and the control end of each switching tube 200 is connected to the control signal line 500. Specifically, the array substrate has a plurality of data signal lines and scanning signal lines which need to be connected to the outer panel fast inspection pad, i.e. a plurality of data signal lines or scanning signal lines need to be cut, therefore, the number of the first wires and the second wires is multiple, a switch tube needs to be arranged between the connecting lines of each first wire and each second wire, i.e. the second end of each first wire needs to be connected with the first end of a second wire through a switch tube, the control end of each switch tube is connected with the control signal line, when the array substrate needs to be cut or when the array substrate is not used, the switch tubes do not work by de-energizing the array substrate, or the control signal line sends a second control signal to the control end of the switch tubes to cut off the switch tubes, thereby preventing static electricity from being transmitted to the driving circuit through the second wires to interfere with the display function of the panel, the drive circuit is better protected. Further, in one embodiment, the first end of each first conductive line is used for connecting with a pin of the driving circuit. Further, in one embodiment, one end of the control signal line is used for being connected with the driving circuit, and the other end of the control signal line is connected with the control ends of the plurality of switching tubes. That is, one control pin in the driving circuit is used to output a corresponding control signal to turn on or off (disconnect) the plurality of switching tubes. It can be understood that when the array substrate needs to protect the driving circuit, all the switching tubes are in a cut-off state, and further, when the array substrate needs to be used normally, all the switching tubes are in a cut-off state; the on-state or off-state of the switch tubes is kept consistent, so that only one control signal source needs to be set, namely only one control pin of the driving circuit needs to be occupied, occupation of pin resources of the driving circuit is reduced, the control circuit does not need to be additionally arranged, and the array substrate is convenient to set.
In one embodiment, the first conductive lines are disposed in parallel, and the second conductive lines are disposed in parallel. Further, in one embodiment, the second wires located on the same cutting surface are arranged in parallel, specifically, the first wires are arranged in parallel, and the second wires are arranged in parallel, that is, the wires led out from the output ends of the pins in the driving circuit are usually arranged in parallel at intervals, so that the wiring area of the first wires and the second wires can be reduced, and the wires are prevented from being arranged in a crossed manner. It can be understood that the straight distance between the two points is the shortest, and the first wire and the second wire are arranged on the same straight line, so that the wiring length of the first wire and the second wire is the shortest, and the space occupied by the wires is further reduced.
In one embodiment, the switching tube is a transistor. In one embodiment, the transistor is a thin film transistor, the second end of the first conducting wire is connected with the first end of the thin film transistor, the first end of the second conducting wire is connected with the second end of the thin film transistor, and the control signal line is connected with the gate of the thin film transistor. Specifically, the thin film transistor comprises a grid electrode, a semiconductor layer, an insulating layer, a source electrode and a drain electrode, the transistor and the thin film transistor for controlling the pixel switch in the display area are made of the same material, process and flow, namely, a switch tube is not required to be arranged by adopting a special manufacturing process, namely, the manufacturing process of the array substrate is convenient, and in addition, the occupied area of the thin film transistor is smaller, namely, more area is not required to be occupied, so that the narrow-edge design of the panel is met.
In one embodiment, the first conductor is used for transmitting data signals; or the first wire is used for transmitting scanning signals. The first end of the scanning signal line is used for being connected with the scanning signal output end of the driving circuit, and the first end of the data signal line is used for being connected with the data signal output end of the driving circuit. Specifically, the first wire may be connected to a data signal transmission pin of the driving circuit, that is, the first wire and the second wire are used as data signal lines or scanning signal lines, and since these signal lines are connected to the driving circuit, an exposed stub of the wire after the array substrate is cut, that is, the second end of the second wire is likely to introduce an external interference voltage, for example: therefore, the switching tube is arranged between the first lead and the second lead, and when the array substrate is cut or does not need to be used, the switching tube is in a cut-off state, so that external interference voltage is prevented from being introduced into the driving circuit from the second lead, and interference is generated on the driving circuit or the driving circuit is damaged.
In one embodiment, the length of the first conductive line is greater than that of the second conductive line, and in particular, the length of the first conductive line is greater than that of the second conductive line, and the length of the second conductive line is relatively short, it is understood that the second conductive line functions to connect to a switch tube, and the switch tube is disposed at an edge position of the substrate cutting line by setting the length of the second conductive line to be relatively short, that is, there is more space for other circuits to be disposed on the array substrate, so as to reduce the area of the array substrate and better achieve a narrow-edge design, further, in one embodiment, the length of the second conductive line is greater than a preset threshold, it is understood that the substrate is usually cut by a laser cutting process, which generates higher temperature or vibration when cut, if the position of the substrate cutting line in the switch tube is too close, the switch tube can be damaged during cutting, and therefore the safety position is reserved between the switch tube and the cutting line to ensure that the switch tube is not damaged during cutting.
In one embodiment, when the switch tube is turned on at a high level and turned off at a low level, the first control signal is a high level signal, and the second control signal is a low level signal. In one embodiment, when the switch tube is turned on at a low level and turned off at a high level, the first control signal is a low level signal, and the second control signal is a high level signal.
In one embodiment, a method for manufacturing an array substrate is provided, including: a first lead, a second lead, a control signal line and a switch tube are arranged on a substrate, wherein a first end of the first lead is used for connecting a driving circuit, a second end of the first lead is connected with a first end of the switch tube, a second end of the switch tube is connected with a first end of the second lead, a second end of the second lead extends to a cutting line of the substrate, and a control end of the switch tube is connected with the control signal line; connecting a second end of the second lead with test equipment, and sending a first control signal to a control end of the switch tube through the control signal line so as to conduct the switch tube and test the substrate; after the test is finished, the array substrate is in a power-off state, so that the switch tube does not work; and cutting the substrate along the cutting line.
According to the manufacturing method, the second lead extends to the cutting line of the array substrate, namely the testing pad of the array substrate is arranged outside the array substrate, so that the area of the array substrate is reduced, the display panel is narrowed, the switch tube is arranged between the first lead and the second lead, when the array substrate needs to be tested, the first control signal is output to the control end of the switch tube through the control signal line, so that the first end and the second end of the switch tube are conducted, namely the first lead is connected with the second lead, so that the array substrate can be normally tested, after the test is finished, the array substrate is cut, the switch tube does not work through the power loss of the array substrate, namely the switch tube is in a suspended state, and the problem of abnormal display caused by corrosion of metal leads can be reduced.
In one embodiment, a method for manufacturing an array substrate includes:
s710, a first conducting wire, a second conducting wire, a control signal line and a switching tube are disposed on the substrate, wherein a first end of the first conducting wire 310 is used for connecting the driving circuit 400, a second end of the first conducting wire 310 is connected to a first end of the switching tube 200, a second end of the switching tube 200 is connected to a first end of the second conducting wire 320, a second end of the second conducting wire 320 extends to the cutting line 110 of the substrate 100, and a control end of the switching tube 200 is connected to the control signal line 500.
Specifically, a first lead, a second lead, a control signal line and a switch tube are arranged on a substrate, that is, the first lead, the second lead, the control signal line and the switch tube are prepared on the substrate. In this step, the components required for the array substrate are prepared on the substrate. It should be understood that only some of the required features of the array substrate are prepared in this step, and the substrate is not diced.
And S720, connecting the second end of the second lead with test equipment, and sending a first control signal to the control end of the switch tube through the control signal line so as to conduct the switch tube and test the substrate.
Specifically, before the substrate is cut, simple electrical measurement is usually performed on the circuit in the substrate to detect some bad problems of the panel, so that before the signal line test pad area of the panel is not cut, a first control signal is output through a control signal line to enable the switch tube to be in a conducting state, namely the first conducting wire is connected with the second conducting wire, the signal line on the panel can be connected with the test pad, and the electrical measurement of the display panel is completed by connecting with an external test fixture and test equipment. For example, it is detected whether a short-circuit fault occurs between adjacent two second conductive lines, or whether a short-circuit fault occurs between adjacent two first conductive lines.
And S730, after the test is finished, the switch tube does not work by powering off the array substrate.
Specifically, after the array substrate is tested, the array substrate needs to be cut to separate the array substrate from the bulk substrate, before the array substrate is cut, the switch tube does not work even if the switch tube is in a suspended state by powering off the array substrate, so that voltage generated by external static electricity or external electric field interference is not transmitted to the driving circuit through the first lead, and the display of the panel and the damage of the internal circuit of the panel are prevented from being interfered by the external interference voltage. It can be understood that the metal wire is easy to corrode when being electrified under the high-temperature and high-humidity conditions, so that before cutting, the second wire cannot obtain the voltage of the driving circuit from the first wire, the second wire is better protected, and the voltage generated by the second wire part due to the interference of an external electric field cannot be transmitted to the first wire part, so that a mutual isolation state is achieved, and the problem of abnormal display caused by corrosion of the metal wire is reduced.
And S740, cutting the substrate along the cutting line.
Specifically, when the switching tube is in an off state, the substrate is cut along the cutting line to complete the cutting of the array substrate.
The manufacturing method extends to the cutting line of the array substrate through the second conducting wire, namely, the testing pad of the array substrate is arranged outside the array substrate to reduce the area of the array substrate and narrow the edge of the display panel, and a switch tube is arranged between the first conducting wire and the second conducting wire, when the array substrate needs to be tested, a first control signal is output to the control end of the switch tube through the control signal line so as to conduct the first end and the second end of the switch tube, the first conducting wire is connected with the second conducting wire, so that the array substrate can be tested normally, when the array substrate is cut, the switch tube does not work by losing power of the array substrate, even if the switch tube is in a suspended state, the voltage generated by external static electricity or external electric field interference is not transmitted to the driving circuit through the first wire, so that the problem of abnormal display caused by corrosion of the metal wire is reduced.
In one embodiment, the step of turning off the array substrate to disable the switching tube may be replaced by the following steps:
and sending a second control signal to the control end of the switching tube through a control signal line so as to cut off the switching tube.
Specifically, the switch tube is in a cut-off state, namely, the first end and the second end of the switch tube are cut off, static electricity can be prevented from being transmitted to the driving circuit through the second lead wire to interfere with the display function of the panel, and abnormal display caused by corrosion of the metal lead wire is avoided.
In one embodiment, after the array substrate is cut, when the array substrate needs to be normally used, the array substrate is electrified, so that the control signal line sends a second control signal to the control end of the switch tube to cut off the switch tube, or the control signal line does not output an electric signal to enable the switch tube not to work, and thus, when the array substrate normally works, an external electric field or static electricity cannot be transmitted to the driving circuit through the second wire due to the fact that the first wire and the second wire are in a disconnected state, so that the display function of the panel is interfered, and the driving circuit can be better protected; in addition, the second conducting wire can not receive the voltage of the driving circuit, so as to reduce the corrosion phenomenon of the exposed wire head in the second conducting wire.
In one embodiment, after the array substrate is cut, when the array substrate is not needed, the array substrate is in a power-off state, the control signal line does not work, namely, no signal is output, so that the switch tube does not work, namely, the switch tube is in a suspended state, static electricity is prevented from being transmitted to the driving circuit through the second conducting wire to interfere with the display function of the panel, and the driving circuit is better protected.
In one embodiment, the number of the first conducting wires is multiple, the number of the second conducting wires is multiple, the number of the switching tubes is multiple, the first end of each first conducting wire is used for being connected with the driving circuit, the second end of each first conducting wire is connected with the first end of one switching tube, the second end of each switching tube is connected with the first end of one second conducting wire, the second end of each second conducting wire extends to the cutting line of the substrate, and the control end of each switching tube is connected with the control signal line. Specifically, the array substrate has a plurality of data signal lines and scan signal lines to be connected to the outer panel rapid test pad, that is, a plurality of data signal lines or scanning signal lines need to be cut, and therefore, if there are a plurality of first conductive lines and a plurality of second conductive lines, a switch tube needs to be disposed between the connection lines of each first conductive line and each second conductive line, that is, the second end of each first conducting wire is connected to the first end of a second conducting wire through a switch tube, the control end of each switch tube is connected to the control signal line, when the substrate needs to be cut or the array substrate does not need to be used, the switch tube does not work by powering off the array substrate, the switch tube is in a suspended state, so that static electricity can be prevented from being transmitted to the driving circuit through the second conducting wire to interfere with the display function of the panel, and abnormal display caused by corrosion of the metal conducting wire is avoided.
In one embodiment, the first conductive lines are disposed in parallel, and the second conductive lines are disposed in parallel. Further, in one embodiment, the second conducting wires located on the same cutting surface are arranged in parallel, and further, in one embodiment, the first conducting wires and the second conducting wires are located on the same straight line.
In one embodiment, the switching tube is a transistor. In one embodiment, the transistor is a thin film transistor, the second end of the first conducting wire is connected with the first end of the thin film transistor, the first end of the second conducting wire is connected with the second end of the thin film transistor, and the control signal line is connected with the gate of the thin film transistor. Specifically, the thin film transistor comprises a grid electrode, a semiconductor layer, an insulating layer, a source electrode and a drain electrode, the transistor and the thin film transistor for controlling the pixel switch in the display area are made of the same material, process and flow, namely, a switch tube is not required to be arranged by adopting a special manufacturing process, namely, the manufacturing process of the array substrate is convenient, and in addition, the occupied area of the thin film transistor is smaller, namely, more area is not required to be occupied, so that the narrow-edge design of the panel is met.
In one embodiment, the first conductor is used for transmitting data signals; or the first wire is used for transmitting scanning signals. The first end of the scanning signal line is used for being connected with the scanning signal output end of the driving circuit, and the first end of the data signal line is used for being connected with the data signal output end of the driving circuit.
In one embodiment, referring to fig. 3 and 4, a display panel is provided, which includes the array substrate 10 described in any of the above embodiments. In one embodiment, the display panel further includes an opposite substrate 20 and liquid crystal molecules (not shown) directly disposed between the array substrate 10 and the opposite substrate.
Specifically, the driving circuit 400 has a plurality of pins, for example: the output pins 410 and the inputs 420 of the output panel of the driver chip include data signal output pins and scan signal output pins. The signal pins of the output panel are data signal output pins or scan signal output pins to output data signals or scan signals correspondingly. More specifically, as shown in fig. 3, in the manufacturing process of the array substrate, the signal line test pad 120, that is, the signal line test pad region, is disposed outside the display panel, before the array substrate is cut, the signal line test pad is connected to the second conductive line, and by connecting the test device to the signal line test pad, the signal line is controlled to output the first control signal, so that the first conductive line is connected to the second conductive line, thereby electrically testing the display panel.
After the test is completed, the array substrate is in a power-off state, so that the switch tube does not work, that is, the switch tube is in a suspended state, so as to cut the display panel along the cutting line, and the cut display panel is as shown in fig. 4.
The display panel extends to the cutting line of the array substrate through the second lead, namely, the testing pad of the array substrate is arranged outside the array substrate to reduce the area of the array substrate and narrow the edge of the display panel, and the switch tube is arranged between the first lead and the second lead, when the array substrate needs to be tested, the first control signal is output to the control end of the switch tube through the control signal line so as to lead the first end and the second end of the switch tube to be conducted, namely, the first lead is connected with the second lead so as to lead the array substrate to be capable of being normally tested, when the array substrate needs to be cut or is not used, the switch tube does not work through the power loss of the array substrate, or the second control signal is sent to the control end of the switch tube through the control signal line so as to lead the switch tube to be cut off, thereby avoiding the static electricity from being transmitted to the driving circuit through the second lead to disturb the display function of the panel, the drive circuit is better protected.
In one embodiment, referring to fig. 3, the display panel further includes a driving circuit 400, the driving circuit 400 is connected to the first end of the first conductive line 310, and the driving circuit 400 is bonded to the substrate 100. Specifically, in the connection manner of COG, the driving circuit is bound on the array substrate to transmit a corresponding control signal, and before the array substrate is not cut, as shown in fig. 3, the second conductive line extends to the substrate cutting line, at this time, the second conductive line 320 is connected to the signal line test pad 120, and a test device (not shown) is connected to the signal line test pad to test the display panel; after the test is finished, the array substrate is powered off to enable the switch tube not to work, the display panel is cut along the cutting line, and the driving circuit is bound on the array substrate after the cutting is finished to obtain the display panel; or after the test is finished, the driving circuit is bound on the array substrate, the array substrate is powered off, so that the switch tube does not work, and the display panel is cut along the cutting line to obtain the display panel. Specifically, the resulting display panel is shown in fig. 4. That is, the array substrate or the display panel may be applied to a connection method of COG.
In one embodiment, referring to fig. 6, the display panel further includes a driving circuit 400 and a flexible substrate 450, the driving circuit 400 is bonded on the flexible substrate 450, and the driving circuit 400 is connected to the first end of the first conductive line 310. Specifically, in the connection manner of the COF, the driving circuit is usually bound on the flexible substrate, and the PAD (PAD) 440 is introduced on the substrate and correspondingly connected with the driving circuit on the flexible substrate 450 (the specific connection manner is not shown), so as to achieve the effect of connecting the first end of the first conducting wire with the driving circuit; after the test is finished, the array substrate is powered off to enable the switch tube to not work, the display panel is cut along the cutting line, and after the cutting, the driving circuit is bound on the flexible substrate and is connected with the first end of the first lead through the PAD on the substrate, so that the display panel is obtained; specifically, the resulting display panel is shown in fig. 6. That is, the array substrate or the display panel may be applied to a COF connection method.
The technical features of the embodiments described above may be arbitrarily combined, and for the sake of brevity, all possible combinations of the technical features in the embodiments described above are not described, but should be considered as being within the scope of the present specification as long as there is no contradiction between the combinations of the technical features.
The above-mentioned embodiments only express several embodiments of the present invention, and the description thereof is more specific and detailed, but not construed as limiting the scope of the invention. It should be noted that, for a person skilled in the art, several variations and modifications can be made without departing from the inventive concept, which falls within the scope of the present invention. Therefore, the protection scope of the present patent shall be subject to the appended claims.

Claims (10)

1. An array substrate, comprising: the switch comprises a substrate, a first lead, a second lead, a control signal line and a switch tube;
the first conducting wire, the second conducting wire, the control signal wire and the switch tube are arranged on the substrate;
the first end of the first wire is used for being connected with a driving circuit, the second end of the first wire is connected with the first end of the switch tube, the second end of the switch tube is connected with the first end of the second wire, the second end of the second wire extends to the cutting line of the substrate, and the control end of the switch tube is connected with the control signal line.
2. The array substrate of claim 1, wherein the number of the first conductive lines is plural, the number of the second conductive lines is plural, the number of the switching tubes is plural, the first end of each of the first conductive lines is used for connecting with the driving circuit, the second end of each of the first conductive lines is connected with the first end of one of the switching tubes, the second end of each of the switching tubes is connected with the first end of one of the second conductive lines, the second end of each of the second conductive lines extends to the cutting line of the substrate, and the control end of each of the switching tubes is connected with the control signal line.
3. The array substrate of claim 1, wherein the switch tube is a thin film transistor, the second end of the first conductive line is connected to the first end of the thin film transistor, the first end of the second conductive line is connected to the second end of the thin film transistor, and the control signal line is connected to the gate of the thin film transistor.
4. The array substrate of claim 1, wherein the first conductive line is used for transmitting data signals; or the first wire is used for transmitting scanning signals.
5. A manufacturing method of an array substrate is characterized by comprising the following steps:
a first lead, a second lead, a control signal line and a switch tube are arranged on a substrate, wherein a first end of the first lead is used for connecting a driving circuit, a second end of the first lead is connected with a first end of the switch tube, a second end of the switch tube is connected with a first end of the second lead, a second end of the second lead extends to a cutting line of the substrate, and a control end of the switch tube is connected with the control signal line;
the second end of the second lead is used for being connected with a test device, and a first control signal is sent to the control end of the switch tube through the control signal line so as to conduct the switch tube and test the substrate;
after the test is finished, the array substrate is in a power-off state, so that the switch tube does not work;
and cutting the substrate along the cutting line.
6. The method of claim 5, wherein the first conductive lines are plural in number, the second conductive lines are plural in number, the switching tubes are plural in number, the first end of each first conductive line is used for being connected to the driving circuit, the second end of each first conductive line is connected to the first end of one switching tube, the second end of each switching tube is connected to the first end of one second conductive line, the second end of each second conductive line extends to the cutting line of the substrate, and the control end of each switching tube is connected to the control signal line.
7. The method of claim 5, wherein the switch tube is a thin film transistor, the second end of the first conductive line is connected to the first end of the thin film transistor, the first end of the second conductive line is connected to the second end of the thin film transistor, and the control signal line is connected to the gate of the thin film transistor.
8. A display panel comprising the array substrate according to any one of claims 1 to 4.
9. The display panel according to claim 8, further comprising a driving circuit connected to the first end of the first wire, the driving circuit being bonded to the substrate.
10. The display panel according to claim 8, further comprising a driving circuit and a flexible substrate, wherein the driving circuit is bonded on the flexible substrate, and the driving circuit is connected to the first end of the first conductive line.
CN202010068647.3A 2020-01-21 2020-01-21 Array substrate, manufacturing method thereof and display panel Pending CN111221193A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202010068647.3A CN111221193A (en) 2020-01-21 2020-01-21 Array substrate, manufacturing method thereof and display panel

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202010068647.3A CN111221193A (en) 2020-01-21 2020-01-21 Array substrate, manufacturing method thereof and display panel

Publications (1)

Publication Number Publication Date
CN111221193A true CN111221193A (en) 2020-06-02

Family

ID=70831205

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202010068647.3A Pending CN111221193A (en) 2020-01-21 2020-01-21 Array substrate, manufacturing method thereof and display panel

Country Status (1)

Country Link
CN (1) CN111221193A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112331118A (en) * 2020-11-30 2021-02-05 上海天马有机发光显示技术有限公司 Display panel and display device

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20160240120A1 (en) * 2014-03-19 2016-08-18 Shenzhen China Star Optoelectronics Technology Co. ,LTD. Test Circuit and Display Panel
WO2016201824A1 (en) * 2015-06-15 2016-12-22 京东方科技集团股份有限公司 Array substrate and display device
CN108565278A (en) * 2018-02-28 2018-09-21 京东方科技集团股份有限公司 Array substrate motherboard, array substrate, display device and preparation method thereof
CN109491122A (en) * 2018-12-27 2019-03-19 武汉华星光电技术有限公司 The display panel and preparation method of antistatic
CN110221491A (en) * 2019-05-06 2019-09-10 惠科股份有限公司 Array substrate and preparation method thereof, liquid crystal display panel

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20160240120A1 (en) * 2014-03-19 2016-08-18 Shenzhen China Star Optoelectronics Technology Co. ,LTD. Test Circuit and Display Panel
WO2016201824A1 (en) * 2015-06-15 2016-12-22 京东方科技集团股份有限公司 Array substrate and display device
CN108565278A (en) * 2018-02-28 2018-09-21 京东方科技集团股份有限公司 Array substrate motherboard, array substrate, display device and preparation method thereof
CN109491122A (en) * 2018-12-27 2019-03-19 武汉华星光电技术有限公司 The display panel and preparation method of antistatic
CN110221491A (en) * 2019-05-06 2019-09-10 惠科股份有限公司 Array substrate and preparation method thereof, liquid crystal display panel

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112331118A (en) * 2020-11-30 2021-02-05 上海天马有机发光显示技术有限公司 Display panel and display device
CN112331118B (en) * 2020-11-30 2023-09-26 武汉天马微电子有限公司 Display panel and display device

Similar Documents

Publication Publication Date Title
TWI409558B (en) Display panel and method of repairing signal lines thereof
US8624243B2 (en) Display panel
KR100695556B1 (en) A combining detecting circuit for a display panel
US7724019B2 (en) Active device array substrate
US7474516B2 (en) Electrostatic discharge guide and liquid crystal display utilizing same
US20100127258A1 (en) Lcd panel having shared shorting bars for array inspection and panel inspection
CN110992861B (en) Display panel and display device
JPH1187442A (en) Inspection method for semiconductor integrated circuit, probe card and burn-in board
US10672675B2 (en) Circuit and method for testing gate lines of array substrate
KR20120056507A (en) A liquid crystal display apparatus and an array substrate thereof
CN101527305A (en) Active element array substrate
CN111221193A (en) Array substrate, manufacturing method thereof and display panel
JP2001100229A (en) Liquid crystal display device and method for repairing disconnection thereof
CN106782243B (en) Display substrate, display panel and display device
CN110827688A (en) Display panel, display panel mother board and display device
US20070200968A1 (en) Display panel structure for improving electrostatic discharge immunity
CN114664210A (en) Test substrate, test circuit, display panel and test assembly
CN102116817B (en) Electrical connection defect detection device
KR20000007892A (en) Panel for lcd
KR20050006521A (en) Liquid crystal display and test method thereof
JP2008218614A (en) Semiconductor device
WO2015003491A1 (en) Liquid crystal panel and manufacturing method therefor
US20220319937A1 (en) Method of fabricating array substrate, array substrate, display apparatus, and probe unit
US20160291085A1 (en) Active device array substrate
JP4546723B2 (en) Display device substrate and liquid crystal display device using the same

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
RJ01 Rejection of invention patent application after publication

Application publication date: 20200602

RJ01 Rejection of invention patent application after publication