CN111221029A - X-ray time evolution process measuring device - Google Patents
X-ray time evolution process measuring device Download PDFInfo
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- CN111221029A CN111221029A CN202010195351.8A CN202010195351A CN111221029A CN 111221029 A CN111221029 A CN 111221029A CN 202010195351 A CN202010195351 A CN 202010195351A CN 111221029 A CN111221029 A CN 111221029A
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- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/36—Measuring spectral distribution of X-rays or of nuclear radiation spectrometry
- G01T1/366—Measuring spectral distribution of X-rays or of nuclear radiation spectrometry with semi-conductor detectors
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Abstract
An X-ray time evolution process measuring device relates to the field of quantitative measurement of X-ray radiation flow, and comprises: the pulse stretching system comprises an acceleration region, a drift region and a collection region, wherein the acceleration region is used for accelerating electrons and enabling the speeds of the electrons entering the acceleration region to be different in different time periods, the drift region is used for enabling the electrons to move at a uniform speed, and the collection region is used for collecting the electrons; the signal processing system is connected with the collection region and is used for obtaining a signal measurement result through broadening pushback calculation. The device for measuring the X-ray time evolution process can widen the signal, and then obtains the measurement result of the short pulse signal through widening and back-pushing calculation, thereby realizing high-time-resolution measurement.
Description
Technical Field
The invention relates to the field of quantitative measurement of X-ray radiation flow, in particular to an X-ray time evolution process measuring device.
Background
In inertial confinement laser fusion studies, X-ray radiation flow diagnostics are currently measured using two complementary techniques.
One technique is to measure the X-ray radiation flux and radiation energy spectrum using a soft X-ray spectrometer consisting of an X-ray diode (XRD) array. Currently, time-resolved spectra resolved to the order of 100ps are available through the energy track response.
Another technique is a flat response detector formed by XRD using a flat response film with gold cathode, which is also based on XRD detector for measurement, and its time resolution is consistent with that of soft X-ray spectrometer formed by XRD array. Although the technology and the device can realize quantitative measurement in the X-ray time evolution measurement and can meet the research requirement, the following defects still exist: the time resolution is not high enough to meet the measurement of the X-ray time evolution process of faster signals.
Disclosure of Invention
The invention aims to provide an X-ray time evolution process measuring device which can widen a signal and then obtain a measuring result of a short pulse signal through broadening back-pushing calculation so as to realize high-time-resolution measurement.
The invention is realized by the following steps:
an X-ray time evolution process measurement apparatus comprising: a pulse stretching system and a signal processing system, wherein:
the pulse stretching system comprises an acceleration region, a drift region and a collection region, wherein the acceleration region is used for accelerating electrons and enabling the electrons to enter the acceleration region at different time periods at different speeds, the drift region is used for enabling the electrons to move at a uniform speed, and the collection region is used for collecting the electrons.
The signal processing system is connected with the collection region and is used for obtaining a signal measurement result through broadening pushback calculation.
In one possible embodiment, the pulse stretching system includes a magnetic focusing tube, a magnetic focusing flight region is formed in the magnetic focusing tube, and the acceleration region, the drift region, and the collection region are located in the magnetic focusing flight region.
In a possible embodiment, a cathode plate and an anode grid are arranged in the magnetic focusing tube, and the cathode plate and the anode grid generate a radio frequency excitation time-varying electric field under the action of a slope bias voltage to form the accelerating region.
In one possible embodiment, the cathode plate is a flat responsive transmissive cathode plate.
In a possible implementation, a back-end grid is disposed in the magnetic focusing tube, the anode grid and the back-end grid are both grounded, and the drift region is formed between the anode grid and the back-end grid.
In a possible embodiment, an electronic collector is arranged in the magnetic focusing tube, and the electronic collector is connected with an oscilloscope.
In one possible implementation, the electron collector is a reflective X-ray diode.
In a possible embodiment, the X-ray time evolution process measuring device further comprises a bias voltage T-type isolator, and the electronic collector and the oscilloscope are connected through the bias voltage T-type isolator.
In one possible implementation, the bias T-isolator includes an RC blocking circuit.
In a possible embodiment, the X-ray time evolution process measuring device further comprises a signal generator connected to the cathode plate and the anode grid, respectively, to apply a ramping bias to the cathode plate and the anode grid.
The beneficial effects of the invention at least comprise:
in the use process, X-rays enter the acceleration region after forming photoelectrons, the speeds of the photoelectrons entering the acceleration region in different time periods are different in the acceleration region, the photoelectrons enter the collection region after drifting for a period of time, and then the collected signal waveform is widened relative to the incident signal waveform in the time domain width, so that the time amplification of an electronic pulse is realized. The time domain stretched signal waveform is transmitted to a signal processing system, and the signal processing system obtains a signal measurement result through stretching backward pushing calculation.
The short pulse signal measuring device widens the short pulse signal, and the short pulse signal measuring result can be obtained through widening and pushback calculation, so that high-time-resolution measurement is realized.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings needed to be used in the embodiments will be briefly described below, it should be understood that the following drawings only illustrate some embodiments of the present invention and therefore should not be considered as limiting the scope, and for those skilled in the art, other related drawings can be obtained according to the drawings without inventive efforts.
Fig. 1 is a first schematic structural diagram of a pulse stretching system in an X-ray time evolution process measurement apparatus according to an embodiment of the present invention;
fig. 2 is a schematic structural diagram ii of a pulse stretching system in the X-ray time evolution process measuring apparatus according to the embodiment of the present invention;
fig. 3 is a schematic structural diagram of an apparatus for measuring X-ray time evolution process according to an embodiment of the present invention;
fig. 4 is a waveform diagram of a ramp bias voltage applied to an acceleration region in an X-ray time evolution process measuring apparatus according to an embodiment of the present invention.
In the figure:
110-an acceleration zone;
120-a drift region;
130-a collection region;
140-magnetic focusing flight zone;
150-magnetic focusing tube;
151-cathode plate;
152-an anode grid;
153-back end grid;
154-an electron collector;
160-bias T-type isolator;
170-oscilloscope;
200-signal generator.
Detailed Description
In order to make the objects, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are some, but not all, embodiments of the present invention. The components of embodiments of the present invention generally described and illustrated in the figures herein may be arranged and designed in a wide variety of different configurations.
Thus, the following detailed description of the embodiments of the present invention, presented in the figures, is not intended to limit the scope of the invention, as claimed, but is merely representative of selected embodiments of the invention. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
It should be noted that: like reference numbers and letters refer to like items in the following figures, and thus, once an item is defined in one figure, it need not be further defined and explained in subsequent figures.
In the description of the present invention, it should be noted that the terms "center", "upper", "lower", "left", "right", "vertical", "horizontal", "inner", "outer", etc. indicate the orientation or positional relationship based on the orientation or positional relationship shown in the drawings, or the orientation or positional relationship which the product of the present invention is usually placed in use, and are only for convenience of describing the present invention and simplifying the description, but do not indicate or imply that the X-ray time evolution process measuring device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and thus, should not be construed as limiting the present invention. Furthermore, the terms "first," "second," "third," and the like are used solely to distinguish one from another and are not to be construed as indicating or implying relative importance.
Furthermore, the terms "horizontal", "vertical", "overhang" and the like do not imply that the components are required to be absolutely horizontal or overhang, but may be slightly inclined. For example, "horizontal" merely means that the direction is more horizontal than "vertical" and does not mean that the structure must be perfectly horizontal, but may be slightly inclined.
In the description of the present invention, it should also be noted that, unless otherwise explicitly specified or limited, the terms "disposed," "mounted," "connected," and "connected" are to be construed broadly and may, for example, be fixedly connected, detachably connected, or integrally connected; can be mechanically or electrically connected; they may be connected directly or indirectly through intervening media, or they may be interconnected between two elements. The specific meanings of the above terms in the present invention can be understood in specific cases to those skilled in the art.
Some embodiments of the invention are described in detail below with reference to the accompanying drawings. The embodiments described below and the features of the embodiments can be combined with each other without conflict.
First embodiment
Referring to fig. 1 to fig. 3, the present embodiment provides an apparatus for measuring X-ray time evolution process, including: a pulse stretching system and a signal processing system, wherein:
the pulse stretching system comprises an acceleration region 110, a drift region 120 and a collection region 130, wherein the acceleration region 110 is used for accelerating electrons, the speeds of the electrons entering the acceleration region 110 in different time periods are different, the drift region 120 is used for enabling the electrons to move at a uniform speed, and the collection region 130 is used for collecting the electrons.
A signal processing system is coupled to the collection region 130 for obtaining signal measurements by a stretch pushback calculation.
The device utilizes the pulse stretching technology to stretch the short pulse signals, and combines the existing XRD diagnostic technology to obtain the short pulse signal measurement result through stretch back calculation, thereby realizing the measurement with high time resolution.
Assuming that the measured signal has a pulse width of 20ps, a 10-fold pulse broadening, and a broadened signal pulse width of 200ps, the broadened signal has sufficient capability to be measured using existing 100ps time-resolved diagnostic equipment.
As shown in fig. 1, the pulse stretching system includes a magnetic focusing tube 150, a magnetic focusing flying region 140 is formed in the magnetic focusing tube 150, and the acceleration region 110, the drift region 120 and the collection region 130 are located in the magnetic focusing flying region 140.
As shown in fig. 2, a cathode plate 151 and an anode grid 152 are disposed in the magnetic focusing tube 150, and the cathode plate 151 and the anode grid 152 generate a radio frequency excitation time-varying electric field under the action of a slope bias voltage to form the acceleration region 110.
The radiation liu signal of the X-ray interacts with the cathode plate 151 to emit photoelectrons, the photoelectrons enter the acceleration region 110 between the cathode plate 151 and the anode grid 152, and the intensity of the electric field decreases with time due to the radio-frequency excitation time-varying electric field generated by the cathode plate 151 and the anode grid 152 under the action of the slope bias, so that the photoelectrons generated at different moments obtain different speeds, and the earlier generated photoelectrons have higher speeds and the later generated photoelectrons have lower speeds.
For short pulse input signals, the time-varying voltage of the acceleration region 110 is optimized, the relative time relation between the light pulse and the cathode plate 151 excitation electric pulse is controlled, the broadening multiplying power difference caused by the difference of the entering time can be reduced, and quasi-linear broadening is realized. Specifically, the X-ray is synchronized at the rising edge of the ramp bias pulse signal, so that the photoelectrons emitted first obtain more energy than the later photoelectrons, and the speed of the former photoelectrons is faster.
Further, a back-end grid 153 is arranged in the magnetic focusing tube 150, in order to avoid the collection region 130 from generating an induced current, the anode grid 152 and the back-end grid 153 are both grounded, i.e. the anode grid 152 and the back-end grid 153 have the same potential, and the drift region 120 is formed between the anode grid 152 and the back-end grid 153. Photoelectrons accelerated by the acceleration region 110 enter the drift region 120 with different initial axial velocities, and the photoelectrons drift at the drift region 120 at a constant velocity, and the drift times of the photoelectrons are different due to the different initial axial velocities of the photoelectrons.
In one possible embodiment, the back-end grid 153 is an XRD grid.
In one possible embodiment, an electron collector 154 is disposed within the magnetic focusing tube 150, and the electron collector 154 is connected to an oscilloscope 170. The electron collector 154 collects electrons and outputs the collected electrons to the oscilloscope 170, so as to output a signal waveform through the oscilloscope 170.
In particular embodiments, the cathode plate 151 is preferably a flat responsive transmissive cathode plate. Since the cathode plate 151 is a flat corresponding projection cathode plate, the corresponding relationship between the signal intensity recorded by the oscilloscope 170 and the total amount of the reagent of the X-ray radiation flow can be easily obtained by calibration, so that the size of the X-ray radiation flow at the position can be reversely deduced by the signal recorded by the oscilloscope 170.
In the present embodiment, the electron collector 154 employs an electron collecting electrode.
Preferably, the electron collector 154 employs reflective XRD.
Further, as shown in FIG. 3, the X-ray time evolution process measuring device further comprises a bias T-shaped isolator 160, and the electron collector 154 is connected with the oscilloscope 170 through the bias T-shaped isolator 160. The biased T-isolator 160 applies a bias to the reflective XRD.
Preferably, the bias T-isolator 160 includes an RC blocking circuit to ensure that a positive bias voltage is applied to the output stud while not affecting the output of the pulsed signal.
In a possible embodiment, the X-ray time evolution process measuring device further comprises a signal generator 200, the signal generator 200 being connected to the cathode plate 151 and the anode grid 152, respectively, to apply a ramping bias to the cathode plate 151 and the anode grid 152.
As shown in fig. 3 and 4, this embodiment provides a set of experiments, which were conducted on a short pulse laser device using pulsed light of 266nm wavelength as a detection signal. In this experiment, a short pulse laser is generated by signal generator 200, and signal generator 200 is used to provide a ramp bias pulse to cathode plate 151 and anode grid 152. The anode grid 152 and the back-end grid 153 are both grounded, an electron collector 154 is arranged on one side of the back-end grid 153 away from the anode grid 152, the electron collector 154 adopts reflective XRD, and 1500V bias voltage needs to be applied in order to ensure time resolution of the reflective XRD. The bias for the reflective XRD is applied by biasing the T-isolator 160. The bias T-isolator 160 is an RC blocking circuit to ensure that a positive bias is applied to the output head without affecting the output of the pulse signal. The signal of the reflective XRD is output to the oscilloscope 170.
Specifically, the signal generating device of FIG. 3 provides a short pulse of 266nm wavelength laser light that impinges on the flat responsive projection cathode plate, producing photoelectrons at the cathode plate 151 that travel within the acceleration region 110 (i.e., the ramped bias electric field) such that photoelectrons entering the acceleration region 110 at different times produce different initial velocities. The photoelectrons with different initial speeds are received by the electron collector 154 after moving for a certain distance at a constant speed in the drift region 120 of the magnetic focusing flight region 140, and are output to the oscilloscope 170. The electron collector 154 employs reflective XRD to ensure time resolution.
The time resolution of the X-ray time evolution process measuring device reaches 100 ps. For a signal with a pulse width of 8ps, the preset stretching magnification M is 10. According to the pulse stretching formula:
wherein, t1Time of the first electron entering the acceleration region, t2Is the time, t ', of the last electron entering the acceleration zone'1The time at which the first electron is emitted from the acceleration region, t2' is the time of the last electron from the accelerating region, e is the electron quantity, m is the electron mass, k is the slope of the pulse bias voltage source, U0Is the initial voltage, s is the electron drift distance.
As shown in fig. 4, the conventional k is 40V/ps, U0-4000V. Let t125ps, then s 42mm can satisfy the broadening requirement. In order to ensure the measurement effect, the preset widening multiplying power is increased to 100, other conditions are unchanged, and the electronic drift distance is increased to 420 mm.
For the short pulse input signal, the time-varying voltage of the acceleration region 110 can be optimized to control the relative time relationship between the light pulse and the excitation electric pulse applied to the cathode plate 151, so as to reduce the difference of widening magnification caused by the difference of the entering time and realize quasi-linear widening.
Specifically, the X-ray is synchronized at the rising edge of the ramp bias pulse signal, for example, the electron entry time in fig. 4 can be controlled to be in a plurality of rising intervals, such as 0-100 ps, 100-200 ps, or 200-300 ps, during which the first emitted photoelectrons obtain more energy than the later photoelectrons, so that the first emitted photoelectrons have faster speed.
The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention, and various modifications and changes may be made by those skilled in the art. Any modification, equivalent replacement, or improvement made within the spirit and principle of the present invention should be included in the protection scope of the present invention.
Claims (10)
1. An X-ray time evolution process measurement device, comprising: a pulse stretching system and a signal processing system,
the pulse stretching system comprises an acceleration region, a drift region and a collection region, wherein the acceleration region is used for accelerating electrons, the speeds of the electrons entering the acceleration region in different time periods are different, the drift region is used for enabling the electrons to move at a uniform speed, and the collection region is used for collecting the electrons;
the signal processing system is connected with the collection region and is used for obtaining a signal measurement result through broadening pushback calculation.
2. The X-ray time evolution process measurement device of claim 1, wherein the pulse stretching system comprises a magnetic focusing tube, a magnetic focusing flight zone is formed in the magnetic focusing tube, and the acceleration zone, the drift zone and the collection zone are located in the magnetic focusing flight zone.
3. The X-ray time evolution process measuring device as claimed in claim 2, wherein a cathode plate and an anode grid are arranged in the magnetic focusing tube, and the cathode plate and the anode grid generate a radio frequency excitation time-varying electric field under the action of a slope bias voltage to form the accelerating region.
4. The X-ray time evolution process measuring device according to claim 3, characterized in that the cathode plate is a flat-response transmissive cathode plate.
5. The apparatus according to claim 3, wherein a back-end grid is disposed in the magnetic focusing tube, the anode grid and the back-end grid are both grounded, and the drift region is formed between the anode grid and the back-end grid.
6. The X-ray time evolution process measuring device of claim 5, wherein an electronic collector is arranged in the magnetic focusing tube, and the electronic collector is connected with an oscilloscope.
7. The X-ray time evolution process measuring device of claim 6, wherein the electron collector is a reflective X-ray diode.
8. The X-ray time evolution process measuring device of claim 6, further comprising a bias voltage T-type isolator, wherein the electronic collector and the oscilloscope are connected through the bias voltage T-type isolator.
9. The X-ray time evolution process measurement device of claim 8, wherein the biased T-isolator comprises an RC blocking circuit.
10. The X-ray time evolution process measuring device of claim 3, further comprising a signal generator connected to the cathode plate and the anode grid, respectively, to apply a ramping bias to the cathode plate and the anode grid.
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| CN202010195351.8A CN111221029A (en) | 2020-03-18 | 2020-03-18 | X-ray time evolution process measuring device |
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| CN202010195351.8A CN111221029A (en) | 2020-03-18 | 2020-03-18 | X-ray time evolution process measuring device |
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