CN111208383A - Equipment point inspection method and device, equipment automatic test line and storage medium - Google Patents
Equipment point inspection method and device, equipment automatic test line and storage medium Download PDFInfo
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- CN111208383A CN111208383A CN201811386816.7A CN201811386816A CN111208383A CN 111208383 A CN111208383 A CN 111208383A CN 201811386816 A CN201811386816 A CN 201811386816A CN 111208383 A CN111208383 A CN 111208383A
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- 238000012360 testing method Methods 0.000 title claims abstract description 286
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/01—Subjecting similar articles in turn to test, e.g. "go/no-go" tests in mass production; Testing objects at points as they pass through a testing station
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- H—ELECTRICITY
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Abstract
An exemplary embodiment of the present application discloses an equipment spot inspection method, which is applied to an equipment automatic test line, and includes: inputting a device to be tested into the first point inspection device, and determining the test state of the first point inspection device; if the test state of the first point inspection equipment indicates that the first point inspection equipment completes the test on the equipment to be tested, generating a first transmission instruction; and transmitting the device to be tested to the second point inspection device according to the first transmission instruction. An exemplary embodiment of the present application also provides an automatic test line for devices and a computer storage medium.
Description
Technical Field
The application relates to a device point inspection technology, in particular to but not limited to a device point inspection method and device, a device automatic test line and a storage medium.
Background
In the related technology, the mobile phone end test safety realizes automatic test, test equipment is completely placed in a closed space of a test automation line box body, mobile phone transmission is carried out through a manipulator and a conveyor belt, equipment point inspection is carried out automatically by controlling the manipulator transmission equipment to be placed into point inspection equipment by an operator, and a plurality of point inspection equipment are operated for several times, namely each point inspection equipment operates the manipulator independently to place a mobile phone at a discharge port and a feed port once, so that a large amount of time is consumed.
Disclosure of Invention
In view of the above, an exemplary embodiment of the present application provides a device spot inspection method and apparatus, a device automatic test line, and a storage medium to solve at least one problem in the related art.
The technical scheme of an exemplary embodiment of the present application is realized as follows:
an exemplary embodiment of the present application provides an apparatus spot inspection method, where the apparatus automatic test line at least includes: a first point inspection device and a second point inspection device, the method comprising:
inputting a device to be tested into the first point inspection device, and determining the test state of the first point inspection device;
if the test state of the first point inspection equipment indicates that the first point inspection equipment completes the test on the equipment to be tested, generating a first transmission instruction;
and transmitting the device to be tested to the second point inspection device according to the first transmission instruction.
In the above method, the transferring the device to be tested to the second point inspection device according to the first transfer instruction includes:
and responding to the transmission instruction, controlling a manipulator of the equipment automatic test line to transmit the equipment to be tested to the second point inspection equipment.
In the above method, after transferring the device under test to the second pointing device according to the first transfer instruction, the method further includes:
determining the test state of the second point inspection equipment;
if the test state of the second point inspection equipment indicates that the second point inspection equipment completes the test of the equipment to be tested, and the second point inspection equipment is the last point inspection equipment in the automatic test line of the equipment, generating an output instruction;
and outputting the equipment to be tested from a discharge hole of the automatic equipment testing line according to the output instruction.
In the above method, the method further comprises:
if the test state of the second point inspection equipment indicates that the second point inspection equipment completes the test on the equipment to be tested and the second point inspection equipment is not the last point inspection equipment in the automatic equipment test line, transmitting the equipment to be tested to the next point inspection equipment corresponding to the second point inspection equipment;
if the test state of the last point inspection equipment indicates that the last point inspection equipment completes the test on the equipment to be tested, generating a second transmission instruction;
and outputting the equipment to be tested from a discharge hole of the automatic equipment testing line according to the second transmission instruction.
In the method, the part of the device to be tested corresponding to the first point inspection device is the same as or different from the part of the device to be tested corresponding to the second point inspection device.
In the above method, the inputting the device to be tested into the first point inspection device of the automatic test line includes:
inputting the equipment to be tested into a feeding hole of the automatic equipment testing line so that the equipment to be tested enters the automatic equipment testing line;
inputting the equipment to be tested into the first point inspection equipment by adopting the manipulator
In the above method, the method further comprises:
inputting M devices to be tested into the feed inlet; wherein M is an integer greater than or equal to 2;
inputting the ith to-be-tested equipment into the first point inspection equipment by adopting the manipulator, and determining the test state of the first point inspection equipment; wherein i is an integer greater than 0 and less than or equal to M;
if the test state of the first point inspection equipment indicates that the first point inspection equipment completes the test on the ith to-be-tested equipment, generating an ith transmission instruction;
according to the ith transmission instruction, transmitting the ith to-be-tested device to the second point inspection device, and inputting the mth to-be-tested device into the first point inspection device; wherein M is an integer greater than 0 and less than or equal to M, and M is not equal to i.
An exemplary embodiment of the present application provides an apparatus for spot inspection of a device, the apparatus including: the device comprises: a first determination module, a first generation module, and a first transfer module, wherein:
the first determining module is used for inputting the equipment to be tested into the first point inspection equipment and determining the test state of the first point inspection equipment;
the first generation module is used for generating a first transmission instruction if the test state of the first point inspection equipment indicates that the first point inspection equipment completes the test on the equipment to be tested;
the first transmission module is used for transmitting the device to be tested to the second point inspection device according to the first transmission instruction.
In the above apparatus, the first transfer module includes:
and the first response submodule is used for responding to the transmission instruction and controlling the manipulator of the automatic equipment testing line to transmit the equipment to be tested to the second point inspection equipment.
In the above apparatus, the apparatus further comprises:
the second determination module is used for determining the test state of the second point inspection equipment;
the second generation module is used for generating an output instruction if the test state of the second point inspection equipment indicates that the second point inspection equipment completes the test of the equipment to be tested and the second point inspection equipment is the last point inspection equipment in the automatic equipment test line;
and the first output module is used for outputting the equipment to be tested from a discharge hole of the automatic equipment testing line according to the output instruction.
In the above apparatus, the apparatus further comprises:
the second transmission module is used for transmitting the device to be tested to the next point inspection device corresponding to the second point inspection device if the test state of the second point inspection device indicates that the second point inspection device completes the test of the device to be tested and the second point inspection device is not the last point inspection device in the automatic device test line;
the third generation module is used for generating a second transmission instruction if the test state of the last point inspection device indicates that the last point inspection device completes the test of the device to be tested;
and the second output module is used for outputting the equipment to be tested from the discharge hole of the automatic equipment testing line according to the second transmission instruction.
In the above apparatus, the part of the device to be tested corresponding to the first point inspection device is the same as or different from the part of the device to be tested corresponding to the second point inspection device.
In the above apparatus, the first determining module includes:
the first input sub-module is used for inputting the equipment to be tested into a feeding hole of the automatic equipment testing line so that the equipment to be tested enters the automatic equipment testing line;
a second input submodule for inputting the device to be tested into the first point inspection device by the manipulator
In the above apparatus, the apparatus further comprises:
the first input module is used for inputting M devices to be tested into the feed inlet; wherein M is an integer greater than or equal to 2;
the second input module is used for inputting the ith device to be tested into the first point inspection device by adopting the manipulator and determining the test state of the first point inspection device; wherein i is an integer greater than 0 and less than or equal to M;
a fourth generating module, configured to generate an ith transmission instruction if the test state of the first point inspection device indicates that the test of the ith to-be-tested device by the first point inspection device is completed;
the third input module is used for transmitting the ith to-be-tested device to the second point inspection device according to the ith transmission instruction and inputting the mth to-be-tested device into the first point inspection device; wherein M is an integer greater than 0 and less than or equal to M, and M is not equal to i.
An exemplary embodiment of the present application provides an automatic test line for a device, the automatic test line for a device includes a memory, a processor, a first point inspection device, and a second point inspection device, wherein:
the memory for storing a computer program operable on the processor;
the processor is used for inputting a device to be tested into the first point inspection device and determining the test state of the first point inspection device;
if the test state of the first point inspection equipment indicates that the first point inspection equipment completes the test on the equipment to be tested, generating a first transmission instruction;
and transmitting the device to be tested to the second point inspection device according to the first transmission instruction.
An exemplary embodiment of the present application provides a computer-readable storage medium, on which a computer program is stored, which, when being executed by a processor, implements the steps in the above-mentioned device spot inspection method.
An exemplary embodiment of the present application provides a device spot inspection method and apparatus, a device automatic test line, and a storage medium, wherein, first, a device to be tested is input into the first spot inspection device, and a test state of the first spot inspection device is determined; then, if the test state of the first point inspection equipment indicates that the first point inspection equipment completes the test on the equipment to be tested, generating a first transmission instruction; finally, the device to be tested is transmitted to the second point inspection device according to the first transmission instruction; so, after the test of a point inspection equipment was accomplished, according to the instruction that generates, automatic control awaits measuring equipment and passes to next point inspection equipment, need not all take out the equipment that awaits measuring from the discharge gate at every turn and put into next point inspection equipment again to use manpower sparingly greatly, save the time that the test needs.
Drawings
Fig. 1A is a schematic flow chart illustrating an implementation of a device spot inspection method according to an exemplary embodiment of the present application;
fig. 1B is a schematic flow chart illustrating a further implementation of a device spot inspection method according to an exemplary embodiment of the present application;
fig. 1C is a schematic flow chart illustrating an implementation of a further device spot inspection method according to an exemplary embodiment of the present application;
fig. 1D is a schematic flow chart illustrating another implementation of a device spot inspection method according to an exemplary embodiment of the present application;
fig. 1E is a schematic flow chart illustrating an implementation of another device spot inspection method according to an exemplary embodiment of the present application;
fig. 2 is a schematic flow chart illustrating another implementation of a device spot inspection method according to an exemplary embodiment of the present application;
FIG. 3 is a schematic structural diagram of an automatic test line for equipment for performing a spot inspection of the equipment in the related art;
FIG. 4 is a schematic structural diagram of an automatic test line of a device for implementing device spot inspection according to an exemplary embodiment of the present application;
fig. 5A is a schematic structural diagram of a point inspection device according to an exemplary embodiment of the present application;
fig. 5B is a schematic structural diagram of another apparatus spot inspection device according to an exemplary embodiment of the present application;
fig. 5C is a schematic structural diagram of a point inspection device of another apparatus according to an exemplary embodiment of the present application;
fig. 5D is a schematic structural diagram of a point inspection device according to another exemplary embodiment of the present application;
fig. 5E is a schematic structural diagram of a component of another device spot inspection apparatus according to an exemplary embodiment of the present application;
fig. 5F is a schematic structural diagram of another apparatus spot inspection device according to an exemplary embodiment of the present application.
Detailed Description
The technical solution in an exemplary embodiment of the present application will be clearly and completely described below with reference to the accompanying drawings in an exemplary embodiment of the present application.
An exemplary embodiment of the present application provides an apparatus spot inspection method, which is applied to an apparatus automatic test line, where the apparatus automatic test line is configured to perform a spot inspection test on an apparatus to be tested to determine whether the apparatus to be tested functions normally, and the apparatus automatic test line at least includes: the first point inspection equipment and the second point inspection equipment, in addition, the functions realized by the method can be realized by calling program codes through a processor in the automatic test line of the equipment, and the program codes can be saved in a computer storage medium.
Fig. 1A is a schematic flow chart of an implementation process of a device spot inspection method according to an exemplary embodiment of the present application, and as shown in fig. 1A, the method includes the following steps:
step S101, inputting a device to be tested into the first point inspection device, and determining the test state of the first point inspection device.
Here, the device to be tested is generally a mobile device having a front-view or rear-view dual-view function, which may be implemented in various forms. For example, the mobile devices described in an exemplary embodiment of the present application may include a mobile phone, a tablet computer, a palm top computer, a Personal Digital Assistant (PDA), and the like; the first point inspection equipment is equipment for performing point inspection on the equipment to be tested; the test state of the first checkpointing device may include: the method comprises the following steps that a first point inspection device completes the test of a device to be tested, the first point inspection device interrupts the test of the device to be tested, and the first point inspection device fails to test the device to be tested; the determining the test state of the first point detection device may be determining a received test signal which is sent by the first point detection device and contains the test state of the first point detection device, where the test signal is used to indicate the test state of the first point detection device, for example, the test of the first point detection device is completed, that is, a signal indicating that the test is completed is fed back; if the first point detection equipment has a test fault, feeding back a signal of the test fault; that is to say, when the test of the first point inspection equipment is completed, a test signal is generated and fed back to the processor of the automatic test line of the equipment, so that the processor of the automatic test line of the equipment controls the manipulator to transfer the equipment to be tested to the second point inspection equipment, thereby realizing the automatic transfer of the equipment to be tested, and a tester is not required to always keep beside the automatic test line to control the transfer of the equipment to be tested.
Step S102, if the test state of the first point inspection equipment indicates that the first point inspection equipment completes the test of the equipment to be tested, a first transmission instruction is generated.
Here, the step S102 may be understood as generating a first transfer instruction when the processor of the device automatic test line receives a signal indicating that the test is completed, where the signal is returned by the first point detection device, and the first transfer instruction is used for controlling the manipulator in the device automatic test line to transfer the device to be tested.
Step S103, the device to be tested is transmitted to the second point inspection device according to the first transmission instruction.
Here, the part of the device to be tested corresponding to the first point inspection device is the same as or different from the part of the device to be tested corresponding to the second point inspection device. Firstly, responding to the transmission instruction, and then controlling a manipulator of the automatic equipment test line to transmit the equipment to be tested to the second point inspection equipment so that the second point inspection equipment tests the equipment to be tested.
In the device spot inspection method provided by an exemplary embodiment of the application, after one spot inspection device is tested, the device to be tested is automatically controlled to be transmitted to the next spot inspection device according to the generated instruction, and the device to be tested does not need to be taken out from the discharge hole and then put into the next spot inspection device every time, so that labor is greatly saved, and time required by testing is saved.
An exemplary embodiment of the present application provides an apparatus spot inspection method, and fig. 1B is a schematic flowchart illustrating an implementation process of another apparatus spot inspection method according to an exemplary embodiment of the present application, as shown in fig. 1B, the method includes the following steps:
and S111, inputting the equipment to be tested into a feed inlet of the automatic equipment testing line so that the equipment to be tested enters the automatic equipment testing line.
And step S112, inputting the equipment to be tested into the first point inspection equipment by adopting the manipulator.
Step S113, if the test state of the first point inspection device indicates that the first point inspection device completes the test on the device to be tested, a first transmission instruction is generated.
And step S114, responding to the first transmission instruction, controlling the manipulator of the equipment automatic test line to transmit the equipment to be tested to the second point inspection equipment.
Here, the automatic test line for devices may further include a manipulator for transferring the devices to be tested, a feed inlet for inputting the devices to be tested, and a discharge outlet for outputting the devices to be tested.
In this embodiment, only when the first point inspection device tests the device to be tested, the device to be tested is placed into the feed inlet, and then the manipulator is used to input the device to be tested into the first point inspection device, so that the first point inspection device tests the device to be tested; the manipulator is automatically controlled to transfer the devices to be tested by adopting the transfer finger, so that the next point inspection device tests the devices to be tested, and thus, after each point inspection device is tested, the devices to be tested are discharged from the discharge hole, and the test time is greatly saved.
An exemplary embodiment of the present application provides an apparatus spot inspection method, and fig. 1C is a schematic flow chart of an implementation process of another apparatus spot inspection method according to an exemplary embodiment of the present application, as shown in fig. 1C, the method includes the following steps:
step S131, inputting a device to be tested into the first point inspection device, and determining a test state of the first point inspection device.
Step S132, if the test state of the first point inspection device indicates that the first point inspection device completes the test on the device to be tested, generating a first transmission instruction.
Step S133, according to the first transmission instruction, transmitting the device to be tested to the second point inspection device.
Step S134, determining a test state of the second point inspection device.
Here, a test signal, which is fed back by the second point inspection device and is used for indicating the test apparatus of the second point inspection device, is received, so as to obtain the test state of the second point inspection device.
Step S135, if the test state of the second point inspection device indicates that the second point inspection device completes the test of the device to be tested, and the second point inspection device is the last point inspection device in the automatic test line of the device, generating a first output instruction.
And S136, outputting the equipment to be tested from a discharge hole of the automatic equipment testing line according to the first output instruction.
In this embodiment, if the test signal fed back by the second point inspection device indicates that the second point inspection device completes the test, and the second point inspection device is the last point inspection device to test the device to be tested in the device automatic test line, that is, after the second point inspection device completes the test of the device to be tested, the whole device automatic test line completes the test of the device to be tested, and generates an output instruction, where the output instruction is used to control the manipulator to place the device to be tested into the discharge hole for output.
An exemplary embodiment of the present application provides an apparatus spot inspection method, and fig. 1D is a schematic flow chart of an implementation of another apparatus spot inspection method according to an exemplary embodiment of the present application, as shown in fig. 1D, the method includes the following steps:
step S141, inputting a device to be tested into the first point inspection device, and determining a test state of the first point inspection device.
Step S142, if the test state of the first point inspection device indicates that the first point inspection device completes the test on the device to be tested, a first transmission instruction is generated.
Step S143, according to the first transmission instruction, transmitting the device to be tested to the second point inspection device.
Here, in response to the output instruction, the robot is automatically controlled to place the device to be tested into the discharge port of the automatic test line of the device to output the device to be tested.
Step S144, determining a test state of the second point inspection device.
Step S145, if the test state of the second point inspection equipment indicates that the second point inspection equipment completes the test of the equipment to be tested and the second point inspection equipment is not the last point inspection equipment in the automatic test line of the equipment, a second transmission instruction is generated.
Here, the step S145 may be understood as generating a second delivery instruction after the second point inspection device completes the test of the device to be tested if the second point inspection device is not the last point inspection device in the automatic test line of the device.
Step S146, according to the second transmission instruction, transmitting the device to be tested to a next point inspection device corresponding to the second point inspection device.
And automatically controlling the manipulator according to the second transmission instruction, and transmitting the device to be tested to the next point inspection device so that the next point inspection device tests the device to be tested until the last point inspection device finishes testing the device to be tested.
And step S147, if the test state of the last point inspection device indicates that the last point inspection device completes the test of the device to be tested, generating a second output instruction.
Here, when the last point inspection device finishes testing the device to be tested, a second transmission instruction is generated, for example, there are four point inspection devices in the device automatic test line, then first, the first point inspection device tests the device to be tested, when the test is finished, the first transmission instruction is fed back, and based on the first transmission instruction, the manipulator is automatically controlled to transmit the device to be tested to the second point inspection device; the second point inspection equipment tests the equipment to be tested, when the test is finished, a second transmission instruction is fed back, and the manipulator is automatically controlled to transmit the equipment to be tested to the third point inspection equipment based on the second transmission instruction; the third point inspection equipment tests the equipment to be tested, when the test is finished, a third transmission instruction is fed back, and based on the third transmission instruction, the manipulator is automatically controlled to transmit the equipment to be tested to the fourth point inspection equipment; and the fourth point inspection equipment tests the equipment to be tested, generates an output instruction when the test is finished, automatically controls the manipulator according to the output instruction, and transmits the equipment to be tested to the discharge port so as to output the equipment to be tested. In the whole process, after the test of each point inspection device is finished, a response instruction is generated, the manipulator is automatically controlled to transmit the devices to be tested, and the devices to be tested are not required to be placed at the discharge port and the feed port for entering the next point inspection device after the test is finished each time; thereby greatly saving the detection time.
And S148, outputting the equipment to be tested from a discharge hole of the automatic equipment testing line according to the second output instruction.
Here, when the last point inspection equipment is tested, a second output instruction is generated to automatically control the manipulator to output the equipment to be tested from the discharge hole.
In this embodiment, after the point inspection equipment tests, generate the transmission instruction, the automatic control manipulator transmits the equipment to be tested to next point inspection equipment, and need not the manual work with the equipment to be tested from the discharge gate output, put into the feed inlet in order to get into next point inspection equipment again, so, transmit the equipment to be tested to next point inspection equipment automatically, practiced thrift test time greatly.
An exemplary embodiment of the present application provides an equipment point inspection method, and fig. 1E is a schematic flow chart of an implementation of another equipment point inspection method according to an exemplary embodiment of the present application, and as shown in fig. 1E, when a plurality of devices to be tested are input from a feed inlet at the same time, a process of testing the plurality of devices to be tested is as follows:
and S151, inputting M devices to be tested into the feed inlet.
Here, M is an integer of 2 or more.
And S152, inputting the ith to-be-tested equipment into the first point inspection equipment by adopting the manipulator, and determining the test state of the first point inspection equipment.
Here, i is an integer greater than 0 and equal to or less than M.
Step S153, if the test state of the first point inspection equipment indicates that the first point inspection equipment completes the test of the ith to-be-tested equipment, generating an ith transmission instruction.
Step S154, according to the ith transmission instruction, transmitting the ith device to be tested to the second point inspection device, and inputting the mth device to be tested into the first point inspection device.
Here, M is an integer greater than 0 and equal to or less than M, and M is not equal to i. When the first point inspection equipment finishes testing the ith to-be-tested equipment, generating a corresponding transmission instruction, controlling the ith to-be-tested equipment to be transmitted to the second point inspection equipment, and controlling the mth to-be-tested equipment to be input into the first point inspection equipment for testing; that is, when a plurality of devices to be tested are tested simultaneously, the former device to be tested enters the second point inspection device and the latter device to be tested is put into the first point inspection device, so that the time consumed by two devices to be tested is measured simultaneously, and the time for testing one device to be tested by one point inspection device is only longer than that for measuring one device to be tested. In the process, after all the point inspection equipment completes the test of one to-be-tested equipment, the other to-be-tested equipment is tested, so that the test time is greatly saved.
An embodiment of the present application provides an apparatus spot inspection method, and fig. 2 is a schematic flow chart illustrating an implementation of another apparatus spot inspection method according to an exemplary embodiment of the present application, and as shown in fig. 2, the method includes the following steps:
step S201, inputting the equipment to be tested into a feed inlet of the automatic equipment testing line so that the equipment to be tested enters the automatic equipment testing line.
Here, the device to be tested is first placed into the feed inlet to enter the automatic test line for the device.
Step S202, inputting the equipment to be tested into the first point inspection equipment by adopting the manipulator, and determining the test state of the first point inspection equipment.
Step S203, if the test state of the first point inspection device indicates that the first point inspection device completes the test on the device to be tested, a first transmission instruction is generated.
Here, the first point inspection device completes the test of the device to be tested, that is, generates a first transfer instruction, and feeds the first transfer instruction back to the processor of the automatic device testing line, so that the processor of the automatic device testing line controls the manipulator to transfer the device to be tested to the second point inspection device.
And step S204, responding to the first transmission instruction, controlling the manipulator of the automatic equipment testing line to transmit the equipment to be tested to the second point inspection equipment.
Step S205, determining a test state of the second point inspection device.
Step S206, if the test state of the second point inspection device indicates that the second point inspection device completes the test of the device to be tested, and the second point inspection device is not the last point inspection device in the automatic test line of the device, a second transmission instruction is generated.
Here, if the test state of the second point inspection device indicates that the second point inspection device completes the test of the device to be tested, and the second point inspection device is the last point inspection device in the automatic device test line, a first output instruction is generated to control the manipulator to place the device to be tested into the discharge hole and output the device to be tested.
Step S207, according to the second transmission instruction, transmitting the device to be tested to a next point inspection device corresponding to the second point inspection device.
Here, responding to the second transmission instruction, the automatic control manipulator transmits the device to be tested to the next point inspection device corresponding to the second point inspection device; for example, the device to be tested is passed to a third inspection device.
And step S208, if the test state of the last point inspection equipment indicates that the last point inspection equipment completes the test of the equipment to be tested, generating a second output instruction.
And S209, outputting the equipment to be tested from a discharge hole of the automatic equipment testing line according to the second output instruction.
In the embodiment, in the whole point inspection process, after the test of each point inspection device is completed, a corresponding transmission instruction is generated, the manipulator is automatically controlled to transmit the device to be tested to the next point inspection device until the test of the last point inspection device on the device to be tested is completed, and the device to be tested is output from the discharge hole without placing the device to be tested on the discharge hole and the feed hole so as to enter the next point inspection device after the test is completed each time; thereby greatly saving the detection time.
In the related technology, when the device to be tested is checked through the automatic test line of the device, the device to be tested is firstly put into the device to be tested from the feeding hole; then, the equipment to be tested is taken into the first point inspection equipment through the manipulator, and after the detection is finished, the equipment to be tested is taken out and placed into a discharge hole; and then, the test device is placed into the feeding hole, the manipulator places the test device into the second point inspection device, that is, each point inspection device needs to be placed into the discharging hole for outputting after the test is completed, and then the test device is placed into the feeding hole and enters the next point inspection device for testing. Fig. 3 is a schematic structural diagram of an automatic testing line of a device for implementing device point inspection in the related art, and as shown in fig. 3, the automatic testing line 300 of the device includes a first point inspection device 301, a second point inspection device 302, a third point inspection device 303, a fourth point inspection device 304, a manipulator 305, and a material inlet/outlet 306, and a process of implementing the device point inspection method in the related art is as follows:
in the first step, a tester places a device to be tested into the feed inlet of the automatic test line 300.
Here, the first step generally requires 3 seconds(s).
In the second step, the tester controls the manipulator 305 to place the device to be tested into the first point inspection device 301, so that the first point inspection device 301 tests the device to be tested.
Here, the second step generally requires 2 s.
Thirdly, when the first point inspection device 301 finishes testing the device to be tested, the tester controls the manipulator 305 to place the device to be tested into the discharge hole, and then places the device to be tested into the feed hole to enter the second point inspection device 302.
Here, the third step generally requires 7 s.
Fourthly, when the second point inspection device 302 finishes testing the device to be tested, the tester controls the manipulator 305 to place the device to be tested into the discharge hole 306, and then places the device to be tested into the feed hole 306 to enter the third point inspection device 303.
Here, the fourth step generally requires 7 s.
Fifthly, when the third point inspection device 303 finishes testing the device to be tested, the tester controls the manipulator 305 to place the device to be tested into the discharge hole, and then places the device to be tested into the feed hole to enter the fourth point inspection device 304.
Here, the fifth step generally requires 7 s.
Sixthly, when the fourth point inspection device 304 finishes the test of the device to be tested, the tester controls the manipulator 305 to put the device to be tested into the discharge hole and output the device to be tested.
Here, in the above six steps, the tester cannot leave the automatic test line of the apparatus. That is, the four point inspection devices in the automatic device test line all complete the test of the device to be tested, 42 × 4 is consumed 168s, and in the whole test process, the tester cannot leave the automatic device test line; then 168 x 2-336 s of time would be consumed if two devices to be tested were to be measured.
Fig. 4 is a schematic structural diagram of an automatic testing line of an apparatus for implementing an apparatus spot inspection in an exemplary embodiment of the present application, and as shown in fig. 4, the automatic testing line 400 of the apparatus includes a first spot inspection apparatus 401, a second spot inspection apparatus 402, a third spot inspection apparatus 403, a fourth spot inspection apparatus 404, a manipulator 405, and a material inlet/outlet port 406, where the method implements the apparatus spot inspection method as follows:
in the first step, the tester places the device under test into the feed port 406 of the automatic test line 400.
Here, the first step generally requires 3 seconds(s).
In the second step, the tester controls the manipulator 405 to place the device to be tested into the first point inspection device 401, so that the first point inspection device 401 tests the device to be tested.
Here, the second step generally requires 2 s.
Thirdly, when the first point inspection device 401 completes the test of the device to be tested, a first transmission instruction is generated and fed back to the processor of the automatic device testing line, and the processor of the automatic device testing line controls the manipulator to transmit the device to be tested to the second point inspection device 402.
Here, the third step generally requires 30 s.
Fourthly, when the second point inspection equipment 402 finishes the test of the equipment to be tested, a second transmission instruction is generated and fed back to the processor of the automatic equipment test line, and the processor of the automatic equipment test line controls the manipulator to transmit the equipment to be tested to the third point inspection equipment 403.
Here, the fourth step generally requires 30 s.
Fifthly, when the third point inspection device 403 finishes testing the device to be tested, a third transmission instruction is generated and fed back to the processor of the automatic device testing line, and the processor of the automatic device testing line controls the manipulator to transmit the device to be tested to the fourth point inspection device 404.
Here, the fifth step generally requires 30 s.
Sixthly, when the fourth point inspection device 404 finishes testing the device to be tested, the tester controls the manipulator 405 to place the device to be tested into the discharge hole 406 and outputs the device to be tested.
Here, the sixth step generally requires 34 s. Of the above six steps, only the first step requires the operation of the tester. That is, the four point inspection devices in the automatic device test line all complete the test on the device to be tested, 3+8+124 is consumed to 135s, and in the whole test process, the tester is not required to operate all the time; if two devices to be tested need to be measured, the time of 135+3 ═ 138s needs to be consumed, and thus, in the embodiment of the application, after one point inspection device completes the test on the devices to be tested, the manipulator is automatically controlled to place the devices to be tested into the next point inspection device, and the test time is greatly saved.
An exemplary embodiment of the present application provides an apparatus for spot inspection of devices, where the apparatus includes modules and units included in the modules, and the modules may be implemented by a processor in a computer device; of course, the implementation can also be realized through a specific logic circuit; in implementation, the processor may be a Central Processing Unit (CPU), a Microprocessor (MPU), a Digital Signal Processor (DSP), a Field Programmable Gate Array (FPGA), or the like.
Fig. 5A is a schematic structural diagram of a point inspection apparatus according to an exemplary embodiment of the present application, and as shown in fig. 5A, the apparatus 500 includes: a first determination module 501, a first generation module 502, and a first delivery module 503, wherein:
the first determining module 501 is configured to input a device to be tested into the first point inspection device, and determine a test state of the first point inspection device;
the first generating module 502 is configured to generate a first transmission instruction if the test state of the first peer detection device indicates that the first peer detection device completes the test on the device to be tested;
the first transmitting module 503 is configured to transmit the device to be tested to the second point inspection device according to the first transmitting instruction.
In the above apparatus, as shown in fig. 5B, the first transferring module 503 includes:
and the first response submodule 531 is configured to respond to the transmission instruction, and control the manipulator of the device automatic test line to transmit the device to be tested to the second point inspection device.
In the above apparatus, as shown in fig. 5C, the apparatus 500 further includes:
a second determining module 504, configured to determine a test state of the second spot inspection device;
a second generating module 505, configured to generate an output instruction if the test state of the second point inspection device indicates that the second point inspection device completes the test on the device to be tested, and the second point inspection device is a last point inspection device in the automatic test line of the device;
and the first output module 506 is used for outputting the equipment to be tested from a discharge hole of the automatic equipment testing line according to the output instruction.
In the above apparatus, as shown in fig. 5D, the apparatus 500 further includes:
a second transmitting module 507, configured to transmit the to-be-tested device to a next point inspection device corresponding to the second point inspection device if the test state of the second point inspection device indicates that the second point inspection device completes the test on the to-be-tested device and the second point inspection device is not the last point inspection device in the automatic device testing line;
a third generating module 508, configured to generate a second transmission instruction if the test status of the last point inspection device indicates that the test of the last point inspection device on the device to be tested is completed;
and a second output module 509, configured to output the device to be tested from the discharge port of the automatic device testing line according to the second transmission instruction.
In the above apparatus, the part of the device to be tested corresponding to the first point inspection device is the same as or different from the part of the device to be tested corresponding to the second point inspection device.
In the above apparatus, as shown in fig. 5E, the first determining module 501 includes:
the first input submodule 5011 is used for inputting the device to be tested into a feeding hole of the automatic device testing line so that the device to be tested enters the automatic device testing line;
a second input submodule 5012 for inputting the device to be tested to the first point inspection device by using the manipulator
In the above apparatus, as shown in fig. 5F, the apparatus 500 further includes:
a first input module 510, configured to input M devices to be tested into the feed inlet; wherein M is an integer greater than or equal to 2;
the second input module 511 is configured to input the ith device to be tested into the first point inspection device by using the manipulator, and determine a test state of the first point inspection device; wherein i is an integer greater than 0 and less than or equal to M;
a fourth generating module 512, configured to generate an ith transmission instruction if the test state of the first point inspection device indicates that the test of the ith to-be-tested device by the first point inspection device is completed;
a third input module 513, configured to transmit an ith device to be tested to the second point inspection device according to the ith transmission instruction, and input an mth device to be tested into the first point inspection device; wherein M is an integer greater than 0 and less than or equal to M, and M is not equal to i.
The above description of the apparatus embodiments, similar to the above description of the method embodiments, has similar beneficial effects as the method embodiments. For technical details not disclosed in the embodiments of the apparatus of the present application, reference is made to the description of the embodiments of the method of the present application for understanding.
It should be noted that, in an exemplary embodiment of the present application, if the above-mentioned device checking method is implemented in the form of a software functional module and is sold or used as a standalone product, it may also be stored in a computer readable storage medium. Based on such understanding, the technical solution of an exemplary embodiment of the present application may be embodied in the form of a software product, which is stored in a storage medium and includes instructions for causing an automatic test line of a device including the storage medium to perform all or part of the method according to the embodiments of the present application. And the aforementioned storage medium includes: various media capable of storing program codes, such as a usb disk, a removable hard disk, a Read Only Memory (ROM), a magnetic disk, or an optical disk.
Correspondingly, an exemplary embodiment of the present application provides a computer-readable storage medium, on which a computer program is stored, which, when being executed by a processor, implements the steps in the device spot inspection method provided in the above-mentioned embodiment.
Here, it should be noted that: the above description of the storage medium and device embodiments is similar to the description of the method embodiments above, with similar advantageous effects as the method embodiments. For technical details not disclosed in the embodiments of the storage medium and apparatus of the present application, reference is made to the description of the embodiments of the method of the present application for understanding.
It should be appreciated that reference throughout this specification to "one embodiment" or "an embodiment" means that a particular feature, structure or characteristic described in connection with the embodiment is included in at least one embodiment of the present application. Thus, the appearances of the phrases "in one embodiment" or "in an embodiment" in various places throughout this specification are not necessarily all referring to the same embodiment. Furthermore, the particular features, structures, or characteristics may be combined in any suitable manner in one or more embodiments. It should be understood that, in the various embodiments of the present application, the sequence numbers of the above-mentioned processes do not mean the execution sequence, and the execution sequence of the processes should be determined by the functions and the inherent logic thereof, and should not constitute any limitation to the implementation process of an exemplary embodiment of the present application. The above-mentioned serial numbers of an exemplary embodiment of the present application are for description only and do not represent the merits of the embodiment.
It should be noted that, in this document, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising an … …" does not exclude the presence of other like elements in a process, method, article, or apparatus that comprises the element.
In the several embodiments provided in the present application, it should be understood that the disclosed apparatus and method may be implemented in other ways. The above-described device embodiments are merely illustrative, for example, the division of the unit is only a logical functional division, and there may be other division ways in actual implementation, such as: multiple units or components may be combined, or may be integrated into another system, or some features may be omitted, or not implemented. In addition, the coupling, direct coupling or communication connection between the components shown or discussed may be through some interfaces, and the indirect coupling or communication connection between the devices or units may be electrical, mechanical or other forms.
The units described as separate parts may or may not be physically separate, and parts displayed as units may or may not be physical units; can be located in one place or distributed on a plurality of network units; some or all of the units can be selected according to actual needs to achieve the purpose of the solution of an exemplary embodiment of the present application.
In addition, all functional units in the embodiments of the present application may be integrated into one processing unit, or each unit may be separately regarded as one unit, or two or more units may be integrated into one unit; the integrated unit can be realized in a form of hardware, or in a form of hardware plus a software functional unit.
Those of ordinary skill in the art will understand that: all or part of the steps for realizing the method embodiments can be completed by hardware related to program instructions, the program can be stored in a computer readable storage medium, and the program executes the steps comprising the method embodiments when executed; and the aforementioned storage medium includes: various media that can store program codes, such as a removable Memory device, a Read Only Memory (ROM), a magnetic disk, or an optical disk.
Alternatively, the integrated units described above in the present application may be stored in a computer-readable storage medium if they are implemented in the form of software functional modules and sold or used as independent products. Based on such understanding, the technical solutions of the exemplary embodiments of the present application may be embodied in the form of a software product, which is stored in a storage medium and includes several instructions for causing an automatic test line of a device to perform all or part of the methods described in the embodiments of the present application. And the aforementioned storage medium includes: a removable storage device, a ROM, a magnetic or optical disk, or other various media that can store program code.
The above description is only for the embodiments of the present application, but the scope of the present application is not limited thereto, and any person skilled in the art can easily conceive of changes or substitutions within the technical scope of the present application, and shall be covered by the scope of the present application. Therefore, the protection scope of the present application shall be subject to the protection scope of the claims.
Claims (10)
1. A device point inspection method is applied to an automatic device test line, and the automatic device test line at least comprises the following steps: first point inspection equipment and second point inspection equipment, characterized in that, the method includes:
inputting a device to be tested into the first point inspection device, and determining the test state of the first point inspection device;
if the test state of the first point inspection equipment indicates that the first point inspection equipment completes the test on the equipment to be tested, generating a first transmission instruction;
and transmitting the device to be tested to the second point inspection device according to the first transmission instruction.
2. The method of claim 1, wherein said transferring the device under test to the second point inspection device according to the first transfer instruction comprises:
and responding to the first transmission instruction, controlling a manipulator of the equipment automatic test line to transmit the equipment to be tested to the second point inspection equipment.
3. The method according to claim 1 or 2, characterized in that after transferring the device under test to the second point inspection device according to the first transfer instruction, the method further comprises:
determining the test state of the second point inspection equipment;
if the test state of the second point inspection equipment indicates that the second point inspection equipment completes the test of the equipment to be tested, and the second point inspection equipment is the last point inspection equipment in the automatic test line of the equipment, generating a first output instruction;
and outputting the equipment to be tested from a discharge hole of the automatic equipment testing line according to the first output instruction.
4. The method of claim 3, further comprising:
if the test state of the second point inspection equipment indicates that the second point inspection equipment completes the test of the equipment to be tested and the second point inspection equipment is not the last point inspection equipment in the automatic test line of the equipment, generating a second transmission instruction;
according to the second transmission instruction, transmitting the device to be tested to the next point inspection device corresponding to the second point inspection device;
if the test state of the last point inspection equipment indicates that the last point inspection equipment completes the test on the equipment to be tested, generating a second output instruction;
and outputting the equipment to be tested from a discharge hole of the automatic equipment testing line according to the second output instruction.
5. The method of any one of claims 1 to 4, wherein the portion of the device under test corresponding to the first point inspection device is the same as or different from the portion of the device under test corresponding to the second point inspection device.
6. The method of claim 1, wherein said inputting a device under test into said first pointing device comprises:
inputting the equipment to be tested into a feeding hole of the automatic equipment testing line so that the equipment to be tested enters the automatic equipment testing line;
and inputting the equipment to be tested into the first point inspection equipment by adopting the manipulator.
7. The method of claim 6, further comprising:
inputting M devices to be tested into the feed inlet; wherein M is an integer greater than or equal to 2;
inputting the ith to-be-tested equipment into the first point inspection equipment by adopting the manipulator, and determining the test state of the first point inspection equipment; wherein i is an integer greater than 0 and less than or equal to M;
if the test state of the first point inspection equipment indicates that the first point inspection equipment completes the test on the ith to-be-tested equipment, generating an ith transmission instruction;
according to the ith transmission instruction, transmitting the ith to-be-tested device to the second point inspection device, and inputting the mth to-be-tested device into the first point inspection device; wherein M is an integer greater than 0 and less than or equal to M, and M is not equal to i.
8. An apparatus for spot inspection of a device, the apparatus comprising: a first determination module, a first generation module, and a first transfer module, wherein:
the first determining module is used for inputting the equipment to be tested into the first point inspection equipment and determining the test state of the first point inspection equipment;
the first generation module is used for generating a first transmission instruction if the test state of the first point inspection equipment indicates that the first point inspection equipment completes the test on the equipment to be tested;
the first transmission module is used for transmitting the device to be tested to the second point inspection device according to the first transmission instruction.
9. The utility model provides an equipment automatic test line which characterized in that, equipment automatic test line includes memory, treater, first point and examines equipment and second point and examine equipment, wherein:
the memory for storing a computer program operable on the processor;
the processor is used for inputting a device to be tested into the first point inspection device and determining the test state of the first point inspection device;
if the test state of the first point inspection equipment indicates that the first point inspection equipment completes the test on the equipment to be tested, generating a first transmission instruction;
and transmitting the device to be tested to the second point inspection device according to the first transmission instruction.
10. A computer-readable storage medium, on which a computer program is stored, which, when being executed by a processor, carries out the steps of the method for spot inspection by a device according to any one of claims 1 to 7.
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| CN201811386816.7A CN111208383A (en) | 2018-11-20 | 2018-11-20 | Equipment point inspection method and device, equipment automatic test line and storage medium |
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| Application Number | Priority Date | Filing Date | Title |
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| CN201811386816.7A CN111208383A (en) | 2018-11-20 | 2018-11-20 | Equipment point inspection method and device, equipment automatic test line and storage medium |
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