CN111207840A - Surface emissivity on-line testing device and method thereof - Google Patents
Surface emissivity on-line testing device and method thereof Download PDFInfo
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Abstract
The invention relates to a surface emissivity online test device and a method thereof, wherein the device comprises: the film with calibrated emissivity is attached to the part near the local surface to be measured on the target object to be measured during the test; the heating unit is used for increasing the surface temperature of the tested target object during testing; the sensor module synchronously measures the infrared radiation of the surface of the film and the local surface to be measured on the target object to be measured and converts the infrared radiation into temperature information, and meanwhile, the temperature information of the sensor module is obtained; and the control processing unit is connected with the heating unit and the sensor module, is used for supplying power and outputting data, and obtains the emissivity of the local surface to be measured on the measured target object according to the acquired temperature information. Compared with the prior art, the invention has the advantages of short measurement time, no need of slicing a sample, simple structure of the test device, low cost, easy field test and suitability for the online rapid measurement of the surface emissivity of various materials.
Description
Technical Field
The invention relates to a surface emissivity measurement technology, in particular to a surface emissivity on-line test device and a surface emissivity on-line test method.
Background
The surface emissivity (also called radiance, blackness coefficient and the like) is a physical quantity for representing the surface radiation capability of a substance, is an important thermophysical parameter, and has important application in many industrial and scientific research fields. For example, in applications of non-contact infrared temperature measurement or infrared temperature imaging, accurately setting the emissivity of the surface of the target object is a precondition for ensuring the temperature measurement accuracy.
Furthermore, in many applications involving emissivity measurement, it is generally desirable that emissivity testing be capable of rapid, on-line measurement, rather than taking destructive slice samples of the target object before laboratory testing. For example, prior to satellite launch, the thermal emissivity of the satellite skin requires that final certification be done locally at the launch site. For another example, the surface emissivity measurement of the surface of an automobile engine is difficult to perform slice-type laboratory measurement when the surface infrared temperature is measured under the working state of the engine.
However, the current test means for measuring the surface emissivity of an object is generally completed in a laboratory, needs a thermal steady state condition, and has long test time and more limitations. Moreover, the surface emissivity of the object is not an intrinsic parameter of the substance, and is related to not only the composition of the substance, but also the surface roughness, temperature, wavelength to be investigated and other factors, so that it is difficult to establish a complete emissivity database. The existing laboratory measurement method is not fully satisfactory in the aspects of measurement precision and repeatability, and particularly, the rapid development of the fields of national defense, military, material science and energy sources urgently needs to establish a precise and rapid emissivity field measurement device.
The traditional measuring device based on the calorimetry generally adopts steady-state measurement, has long time consumption, has high requirements on various parameters such as temperature and heat capacity precision, and cannot finish measurement on line. Chinese patent CN104865287A discloses a device for rapidly measuring surface infrared hemispherical emissivity, but the device needs two constant temperature cavities for keeping different temperatures, and also needs a rotating machine combined with a lock-in amplifier and other devices for measurement, and the measurement process and the structure of the device are complex.
Disclosure of Invention
The invention aims to overcome the defects of the prior art and provide a device and a method for testing surface emissivity on line.
The purpose of the invention can be realized by the following technical scheme:
an online testing device for surface emissivity, the device comprising:
emissivity-calibrated films: the device is attached to the vicinity of a local surface to be measured on a target object to be measured during the test;
a heating unit: the surface temperature of a tested target object is raised during testing;
a sensor module: synchronously measuring infrared radiation of the surface of the film and the local surface to be measured on the target object to be measured, converting the infrared radiation into temperature information, and acquiring the temperature information of the sensor module;
a control processing unit: and the heating unit and the sensor module are connected and used for supplying power and outputting data, and the emissivity of the local surface to be measured on the measured target object is obtained according to the acquired temperature information.
Preferably, the thickness of the film is less than 1mm, the film is closely attached to the surface of the measured target object in a back adhesive pasting or spraying mode, the transmissivity of the film in a wave band of 5-14um is less than 1%, and the emissivity of the film in the wave band of 5-14um is known.
Preferably, the sensor module comprises two thermopile sensors which are arranged adjacently, during testing, one thermopile sensor is aligned to the surface of the thin film, the other thermopile sensor is aligned to the local surface to be measured on the target object to be tested, the central points of the two thermopile sensors are located on the same horizontal line, and the thermopile sensors are further integrated with a thermal resistance temperature measuring sensor for acquiring own thermodynamic temperature.
Preferably, the thermopile sensor be equipped with an optics shield respectively, optics shield be cylindric, the thermopile sensor set up in the optics shield, optics shield tip be equipped with the band pass filter on 5-14um wave bands.
Preferably, the sensor module further includes two collimation diode lasers for position calibration, the emission waveband of which is visible light, the two collimation diode lasers are symmetrically arranged on two sides of a connecting line of central points of the two thermopile sensors, the connecting line of the central points of the two collimation diode lasers coincides with a perpendicular bisector of the connecting line of the central points of the two thermopile sensors, and when the position calibration is performed, light spots of the two collimation diode lasers fall on a boundary line of the film and a local surface to be measured on the target object to be measured.
Preferably, the heating mode of the heating unit includes: the film heating device comprises a film, a film heating unit, a convection mode and a radiation heat transfer mode, wherein the film is in contact with a measured target object, the convection mode is used for heating ambient air and blowing hot air to the surface of the measured target object, or the radiation heat transfer mode is used for locally heating the measured target object, a heating area during heating is positioned below the film and the local surface to be measured on the measured target object, the width of the heating area of the heating unit is larger than twice of the width of the film, and heating heat flow in the heating area is uniform so as to ensure that the temperature rise degree of the film and the local surface to be measured on the measured target object tends to.
Preferably, the control processing unit controls the heating power of the heating unit to enable the heating unit to reach the preset heating temperature quickly and accurately.
Preferably, the control processing unit obtains the emissivity of the local surface to be measured on the measured target object by the following formula:
wherein epsilon is the emissivity of the local surface to be measured on the measured target object, T1Is the thermodynamic temperature, T, of the film surface2For the thermodynamic temperature, T, of the local surface to be measured on the object to be measuredaIs the thermodynamic temperature of the sensor module itself.
An online test method for surface emissivity is based on the online test device for surface emissivity to complete online test for surface emissivity of a tested target object, and comprises the following steps:
s1: a test preparation stage: tightly attaching the film with the calibrated emissivity to the surface of a target object to be measured;
s2: and (3) a position alignment stage: aligning the sensor module to a measured target object for synchronously measuring the infrared radiation of the surface of the film and the local surface to be measured on the measured target object nearby the surface of the film and converting the infrared radiation into temperature information;
s3: a heating stage: the control processing unit controls the heating unit to heat the measured target object, so that the temperature of the film aligned with the sensor module and the temperature of the local surface to be measured on the measured target object nearby the film reaches a preset heating temperature;
s4: and (3) a test calculation stage: the control processing unit reads the thermodynamic temperature T of the surface of the film1Thermodynamic temperature T of the local surface to be measured on the target object to be measured2And the thermodynamic temperature T of the sensor module itselfaAnd further calculating the emissivity epsilon of the local surface to be measured on the target object to be measured.
Compared with the prior art, the invention has the following advantages:
(1) compared with a contact temperature measurement method adopted in the prior art of measuring emissivity by a calorimetric method, the invention adopts the thermopile sensor to quickly acquire the radiation signal of the surface of the target, can realize quick measurement without the need of making the target reach thermal balance, can meet the requirement of real-time measurement, and is easy to carry out field test.
(2) The invention utilizes the film material with known emissivity to calibrate the radiation signal and the temperature of the target surface, does not need to destroy and cut a test object, does not need to use an artificial black body to calibrate a radiation source, and ensures that the test device has simple structure and lower cost and is easy to carry out field test.
(3) In the test process of the invention, only the local part of the test target needs to be heated, the measurement time is shorter, and the energy consumption is less.
(4) The invention can be suitable for targets with uneven surface emissivity, and can measure the emissivity of local surface on the target, therefore, the invention has wider application range than the technology of testing emissivity by general calorimetry.
(5) The thermopile sensor provided by the invention is provided with the optical shielding cover and the band-pass filter, so that the thermopile sensor has a smaller visual angle and is prevented from being interfered by radiation of other wave bands, the thermopile sensor can be ensured to accurately obtain the infrared radiation numerical value of a local target within a preset test distance without being influenced by other interference radiation, and the measurement result is more accurate.
(6) The device provided by the invention can realize rapid and accurate positioning by arranging the diode laser for collimation, so that the field angle of one thermopile sensor is totally fallen on the film, and the field angle of the other thermopile sensor is totally fallen on the local surface of the target object to be detected, and the device is more convenient to use.
Drawings
FIG. 1 is a schematic structural diagram of an online testing device for surface emissivity of the invention;
FIG. 2 is a schematic view of the overall structure of a sensor module in the online testing device for surface emissivity of the invention;
FIG. 3 is a front view of a sensor module in the surface emissivity on-line testing apparatus of the invention;
in the figure, 1 is a target object to be measured, 2 is a film, 3 is a local surface to be measured, 4 is an optical shield cover, 5 is a sensor module, 6 is a control processing unit, 7 is a heating unit, and 8 is a diode laser for collimation.
Detailed Description
The invention is described in detail below with reference to the figures and specific embodiments. Note that the following description of the embodiments is merely a substantial example, and the present invention is not intended to be limited to the application or the use thereof, and is not limited to the following embodiments.
Examples
As shown in fig. 1 to 3, an online testing apparatus for surface emissivity comprises:
emissivity-calibrated film 2: the device is attached to the vicinity of a local surface 3 to be measured on a target object 1 to be measured during the test;
the heating unit 7: the surface temperature of the tested target object 1 is raised during testing;
the sensor module 5: synchronously measuring the infrared radiation of the surface of the film 2 and the local surface 3 to be measured on the target object 1 to be measured, converting the infrared radiation into temperature information, and acquiring the temperature information of the sensor module 5;
the control processing unit 6: and the heating unit 7 and the sensor module 5 are connected and used for supplying power and outputting data, and the emissivity of the local surface 3 to be measured on the measured target object 1 is obtained according to the acquired temperature information.
The thickness of the film 2 is less than 1mm, the film 2 is closely attached to the surface of the measured target object 1 in a back adhesive pasting or spraying mode, the transmissivity of the film 2 in a wave band of 5-14um is less than 1%, and the emissivity of the film 2 in the wave band of 5-14um is known.
The sensor module 5 comprises two thermopile sensors which are arranged close to each other, during testing, one thermopile sensor is aligned to the surface of the thin film 2, the other thermopile sensor is aligned to the local surface 3 to be measured on the target object 1 to be tested, the central points of the two thermopile sensors are positioned on the same horizontal line, and the thermopile sensors are also integrated with a thermal resistance temperature measuring sensor for acquiring own thermodynamic temperature. The thermopile sensors are respectively provided with an optical shielding cover 4, the optical shielding cover 4 is cylindrical, the thermopile sensors are arranged in the optical shielding cover 4, and the end parts of the optical shielding cover 4 are provided with band-pass filters on the wave bands of 5-14 um. The optical shielding cover 4 and the band-pass filter enable the thermopile sensor to have a smaller visual angle and avoid interference of radiation of other wave bands, and guarantee that the thermopile sensor can accurately obtain the infrared radiation value of a local target within a preset testing distance without being influenced by other interference radiation. The two thermopile sensors on the sensor module 5 are calibrated in advance through an artificial black body, the surface temperature of a target object with known emissivity can be accurately measured through the obtained infrared radiation heat flow, and the temperature test result can be read through the control processing unit 6.
The sensor module 5 further comprises two collimation diode lasers 8 for position calibration, wherein the emission waveband of each collimation diode laser 8 is visible light, the two collimation diode lasers 8 are symmetrically arranged on two sides of a connecting line of central points of the two thermopile sensors, the connecting line of the central points of the two collimation diode lasers 8 is overlapped with a perpendicular bisector of the connecting line of the central points of the two thermopile sensors, and light spots of the two collimation diode lasers 8 fall on a boundary line of the film 2 and the local surface 3 to be measured on the target object 1 to be measured during position calibration. The diode laser 8 for collimation is arranged, so that rapid and accurate positioning can be realized, the field angle of one thermopile sensor is respectively arranged on the thin film 2, the field angle of the other thermopile is completely arranged on the local surface of the measured target object 1, and the device is more convenient to use.
The heating means of the heating unit 7 includes: the heating device comprises a heat conduction mode which is in contact with a measured target object 1, or a convection mode which heats surrounding air and blows hot air to the surface of the measured target object 1, or a mode which carries out local heating on the measured target object 1 through radiation heat transfer, wherein a heating area during heating is positioned below a film 2 and a local surface 3 to be measured on the measured target object 1, the width of the heating area of a heating unit 7 is larger than twice of the width of the film 2, and heating heat flow in the heating area is uniform so as to ensure that the temperature rising degree of the film 2 and the local surface 3 to be measured on the measured target object 1 tends to be consistent in the heating process. The control processing unit 6 controls the heating power of the heating unit 7 so that the heating unit 7 reaches the predetermined heating temperature quickly and accurately. In the embodiment, the heating unit 7 adopts a heat conduction mode of contacting with the measured target object 1, and the heating area is positioned below the film 2 and the local surface 3 to be measured on the measured target object 1.
The control processing unit 6 obtains the emissivity of the local surface 3 to be measured on the target object 1 by the following formula:
wherein epsilon is the emissivity of the local surface 3 to be measured on the measured target object 1, T1Is the thermodynamic temperature, T, of the surface of the film 22Is the thermodynamic temperature, T, of the local surface 3 to be measured on the target object 1 to be measuredaIs the thermodynamic temperature of the sensor module 5 itself.
An online test method for surface emissivity is based on the online test device for surface emissivity to complete the online test of the surface emissivity of a tested target object 1, and comprises the following steps:
s1: a test preparation stage: the film 2 with calibrated emissivity is closely attached to the surface of the target object 1 to be measured;
s2: and (3) a position alignment stage: aligning the sensor module 5 to the target object 1 to be measured, namely adjusting the light spot of the diode laser 8 for collimation to fall on the boundary line between the film 2 and the local surface 3 to be measured on the target object 1 to be measured, so that the field angle of one thermopile sensor falls on the film 2 respectively, and the field angle of the other thermopile falls on the local surface of the target object 1 to be measured completely, thereby synchronously measuring the infrared radiation of the local surface 3 to be measured on the surface of the film 2 and the target object 1 to be measured nearby and converting the infrared radiation into temperature information;
s3: a heating stage: the control processing unit 6 controls the heating unit 7 to heat the target object 1 to be tested, so that the temperature of the film 2 aligned with the sensor module 5 and the temperature of the local surface 3 to be measured on the target object 1 to be tested nearby reach a preset heating temperature, and when testing is carried out, the control processing unit 6 controls the heating unit 7 to heat the target object 1 to be tested through a lead, so that the temperature of the film 2 is at least 30 ℃ higher than the ambient temperature;
s4: and (3) a test calculation stage: the control processing unit 6 reads the thermodynamic temperature T of the surface of the film 21Thermodynamic temperature T of a local surface 3 to be measured on an object 1 to be measured2And the thermodynamic temperature T of the sensor module 5 itselfaAnd then calculating the emissivity epsilon of the local surface 3 to be measured on the measured target object 1.
The device and the method for the online test of the surface emissivity rapidly acquire the emission radiation signals of the target surface at high temperature through the sensor module 5, calibrate the radiation of the target surface by combining the film 2 material with known emissivity, have the advantages of simple structure, real-time measurement, no need of sample slicing, capability of on-site measurement and the like, and are suitable for the online rapid measurement of the surface emissivity of various materials. As the sensor module 5 is arranged on the band-pass filter on the 5-14um wave band, correspondingly, the transmissivity of the film 2 on the 5-14um wave band is less than 1%, the device can be used for measuring the average spectral emissivity of the object surface on the infrared wave band of 5-14um on line.
The principle of the surface emissivity on-line testing device and the method thereof is as follows:
has red color under the action of no other interference radiationThe voltage V detected by a thermopile sensor of an external band pass filter is a function of the radiant heat flux q obtained on its sensor, i.e.: where K is the response function of the thermopile sensor, generally obtained experimentally. According to Boltzmann's law of radiation, the radiation heat flux density q obtained at the thermopile sensor is the thermodynamic temperature T of the target objectoAnd the thermodynamic temperature T of the thermopile sensor itselfaI.e.:
where B is the Boltzmann constant and ε is the surface emissivity of the target object. Thus, if the temperature T of the thermopile sensor itself is knownaThe emissivity epsilon of the target object and the response function K of the thermopile can reflect the temperature T of the target object through the voltage signal output by the thermopile0This is the basic principle of infrared non-contact temperature measurement.
If the target object is assumed to be a black body, its emissivity is 1.0, and the heat flow density obtained on the thermopile sensor can be expressed as:
in the formula TsIs the virtual temperature obtained by the thermopile sensor assuming that the target object is a black body. At the same time, if the real emissivity ε and the real temperature T of the target object are known0The heat flux density obtained on the thermopile sensor can then also be expressed as:
in experimental measurements, the heat flux density obtained on the thermopile sensor does not change due to the assumed target emissivity. Therefore, the right-end terms of equations 2 and 3 above are equal. At this time, when the emissivity epsilon of the target is unknown, it can be found by the following equation:
true temperature T of target object in the above equation0Although the emissivity can be obtained by a contact measurement method, the requirement of real-time and transient measurement of emissivity is generally difficult to meet due to the inherent delay effect of contact temperature measurement. In order to quickly and accurately obtain the real temperature of a measurement target, the invention adopts a thermopile sensor to measure the temperature of the target, and simultaneously arranges a film 2 with known emissivity at a position close to a local surface 3 to be measured on a measured target object 1 to obtain the real temperature of the target surface. Since the thickness of the film 2 material is very small, the heat conduction and resistance thereof can be ignored, so that the temperature of the surface of the film 2 material can be approximately considered to be consistent with the temperature of the target surface to which the film is attached. The temperature of the target surface can thus be obtained by the infrared thermopile sensor. In addition, since the film 2 is located in a position spatially close to the local surface 3 to be measured on the target object 1 to be measured, if the heat flow generated by the heating region is uniformly transmitted to the position of the film 2 and the position of the local surface 3 to be measured on the target object 1 to be measured, the temperature at the position of the film 2 can be approximately considered to be consistent with the temperature at the position of the local surface 3 to be measured on the target object 1 to be measured.
Therefore, two thermopile sensors are used in the present invention, wherein one thermopile sensor is used to acquire the temperature of the surface of the thin film 2 as the real temperature of the target object, namely:
T1＝To(5)
and the other sensor is used for simultaneously acquiring the temperature on the local surface 3 to be measured on the target object 1 to be measured, and the virtual temperature when the temperature is assumed to be a black body is as follows:
T2＝Ts(6)
then, the emissivity on the local surface 3 to be measured on the target object 1 to be measured can be obtained by equations (4) to (6):
the above embodiments are merely examples and do not limit the scope of the present invention. These embodiments may be implemented in other various manners, and various omissions, substitutions, and changes may be made without departing from the technical spirit of the present invention.
Claims (9)
1. An online testing device for surface emissivity, the device comprising:
emissivity calibrated film (2): during testing, the device is attached to a part of the object (1) to be tested near the local surface (3) to be measured;
heating unit (7): the surface temperature of a tested target object (1) is raised during testing;
sensor module (5): synchronously measuring the infrared radiation of the surface of the film (2) and the local surface (3) to be measured on the target object (1) to be measured, converting the infrared radiation into temperature information, and acquiring the temperature information of the sensor module (5);
control processing unit (6): and the heating unit (7) and the sensor module (5) are connected and used for supplying power and outputting data, and the emissivity of the local surface (3) to be measured on the target object (1) to be measured is obtained according to the acquired temperature information.
2. The on-line surface emissivity testing device according to claim 1, wherein the thickness of the thin film (2) is less than 1mm, the thin film (2) is closely attached to the surface of the tested target object (1) by means of back adhesive or spraying, the transmittance of the thin film (2) in the wavelength band of 5-14um is less than 1%, and the emissivity of the thin film in the wavelength band of 5-14um is known.
3. The device for on-line measurement of surface emissivity as claimed in claim 1, wherein the sensor module (5) comprises two thermopile sensors, one of the thermopile sensors is aligned to the surface of the thin film (2) and the other thermopile sensor is aligned to the local surface (3) to be measured on the target object (1) during the measurement, the two thermopile sensors are located on the same horizontal line at the center point, and the thermopile sensor is further integrated with a thermal resistance temperature measurement sensor for obtaining the thermodynamic temperature thereof.
4. The device for on-line testing of surface emissivity of claim 3, wherein the thermopile sensors are respectively provided with an optical shielding cover (4), the optical shielding cover (4) is cylindrical, the thermopile sensors are arranged in the optical shielding cover (4), and the end of the optical shielding cover (4) is provided with a band-pass filter on a wave band of 5-14 um.
5. The device for on-line testing of surface emissivity as claimed in claim 3, wherein the sensor module (5) further comprises two collimation diode lasers (8) for position calibration, the emission band of which is visible light, the two collimation diode lasers (8) are symmetrically arranged on both sides of the connecting line of the center points of the two thermopile sensors, the connecting line of the center points of the two collimation diode lasers (8) coincides with the perpendicular bisector of the connecting line of the center points of the two thermopile sensors, and the light spots of the two collimation diode lasers (8) fall on the boundary line of the film (2) and the local surface (3) to be measured on the target object (1) to be measured during position calibration.
6. A surface emissivity on-line testing device according to claim 1, wherein the heating unit (7) is heated in a manner comprising: the heating device comprises a heat conduction mode which is in contact with a measured target object (1), or a convection mode which heats surrounding air and blows hot air to the surface of the measured target object (1), or a mode which carries out local heating on the measured target object (1) through radiation heat transfer, wherein when the heating device is used for heating, a heating area is positioned below a local surface (3) to be measured on a film (2) and the measured target object (1), the width of the heating area of a heating unit (7) is larger than twice of the width of the film (2), and heating heat flow in the heating area is uniform so as to ensure that the temperature rise degree at the positions of the local surface (3) to be measured on the film (2) and the measured target object (1) tends to be consistent in the heating process.
7. A surface emissivity on-line testing device according to claim 1, wherein the control processing unit (6) controls the heating power of the heating unit (7) to make the heating unit (7) reach the predetermined heating temperature quickly and accurately.
8. A surface emissivity on-line measuring device according to claim 1, wherein the control processing unit (6) obtains the emissivity of the local surface (3) to be measured on the target object (1) by the following formula:
wherein epsilon is the emissivity of the local surface (3) to be measured on the target object (1) to be measured, T1Is the thermodynamic temperature, T, of the surface of the film (2)2Is the thermodynamic temperature T of the local surface (3) to be measured on the measured object (1)aIs the thermodynamic temperature of the sensor module (5) itself.
9. An online test method for surface emissivity, which is characterized in that the online test of the surface emissivity of a tested target object (1) is completed based on the online test device for surface emissivity of claims 1-8, and the method comprises the following steps:
s1: a test preparation stage: the thin film (2) with calibrated emissivity is closely attached to the surface of a target object (1) to be measured;
s2: and (3) a position alignment stage: aligning the sensor module (5) to a measured target object (1) for synchronously measuring the infrared radiation of the surface of the film (2) and the local surface (3) to be measured on the measured target object (1) nearby and converting the infrared radiation into temperature information;
s3: a heating stage: the control processing unit (6) controls the heating unit (7) to heat the measured target object (1) so that the temperature of the film (2) aligned with the sensor module (5) and the local surface (3) to be measured on the measured target object (1) nearby reaches a preset heating temperature;
s4: and (3) a test calculation stage: control processing unit(6) Reading the thermodynamic temperature T of the surface of the film (2)1The thermodynamic temperature T of the local surface (3) to be measured on the target object (1) to be measured2And the thermodynamic temperature T of the sensor module (5) itselfaAnd then calculating the emissivity epsilon of the local surface (3) to be measured on the target object (1).
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