CN111207825B - Electronic equipment testing device capable of automatically calibrating and testing device calibration method - Google Patents
Electronic equipment testing device capable of automatically calibrating and testing device calibration method Download PDFInfo
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- CN111207825B CN111207825B CN202010026214.1A CN202010026214A CN111207825B CN 111207825 B CN111207825 B CN 111207825B CN 202010026214 A CN202010026214 A CN 202010026214A CN 111207825 B CN111207825 B CN 111207825B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
- G01J1/08—Arrangements of light sources specially adapted for photometry standard sources, also using luminescent or radioactive material
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
- G01J1/08—Arrangements of light sources specially adapted for photometry standard sources, also using luminescent or radioactive material
- G01J2001/086—Calibrating drift correction
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Abstract
The invention provides an electronic equipment testing device capable of automatic calibration and a testing device calibration method, wherein the electronic equipment testing device comprises: a device body in which an electronic apparatus is fixed; the light source is arranged in the device main body, is opposite to the electronic equipment screen and is arranged at intervals with the electronic equipment; the control mechanism is used for acquiring the measured brightness of the light source after adjusting the light source according to the preset test brightness, and adjusting the brightness of the light source according to the measured brightness of the light source to enable the measured brightness of the light source to reach the preset test brightness. Therefore, the brightness of the light source is detected through the standard electronic equipment, so that the light source can be automatically calibrated through the detection of the standard electronic equipment even if the light source is aged, and the technical problems of large error and low efficiency of manual calibration are solved.
Description
Technical Field
The present disclosure relates to the field of electronic devices, and in particular, to an electronic device testing apparatus capable of automatic calibration and a method for calibrating the testing apparatus.
Background
At present, when white board (atlas) testing is carried out on electronic equipment, light source brightness is controlled by a light source controller, and when the white board (atlas) testing is carried out, a technician is required to manually adjust the light source brightness environment to be tested according to different electronic equipment. However, if the testing device is used for a long time, the brightness of the light source is changed due to the abrasion of the components, so that the testing brightness environment under the same parameter is changed, and thus, the testing device has a large quality hidden trouble. However, when the brightness of the light source is calibrated at present, a technician needs to manually use the illuminometer to measure the brightness, so that the efficiency is low, and the accurate measurement of the production technician cannot be ensured.
Disclosure of Invention
The invention aims to solve the technical problems of large error and low efficiency of light source brightness calibration of the electronic equipment testing device in the prior art;
another object of the present invention is to provide an electronic device testing apparatus capable of automatic calibration and an electronic device testing apparatus mounting method.
In order to solve the technical problems, the invention adopts the following technical scheme:
according to one aspect of the present invention, there is provided an electronic device testing apparatus capable of automatic calibration, comprising:
a device body in which an electronic apparatus is fixed;
the light source is arranged in the device main body, is opposite to the electronic equipment screen and is arranged at intervals with the electronic equipment;
the control mechanism is used for acquiring the measured brightness of the light source after adjusting the light source according to the preset test brightness, and adjusting the brightness of the light source according to the measured brightness of the light source to enable the measured brightness of the light source to reach the preset test brightness.
According to another aspect of the present invention, the present disclosure also provides a test apparatus calibration method, the method comprising:
acquiring test parameters corresponding to the model of the electronic equipment, wherein the test parameters comprise preset test brightness of the light source;
adjusting the light source according to the predetermined test brightness;
acquiring the brightness of the light source measured by the standard electronic equipment, wherein the standard electronic equipment is electronic equipment which passes the test;
and judging whether the brightness measured by the standard electronic equipment reaches a preset test brightness, if not, adjusting the brightness of the light source to enable the brightness measured by the standard electronic equipment to reach the preset test brightness.
According to the technical scheme, the invention has at least the following advantages and positive effects:
in the invention, after the electronic equipment testing device is started, the tested brightness of the light source is obtained through the control mechanism, and then the brightness of the light source is adjusted according to the tested brightness of the light source, so that the tested brightness of the light source reaches the preset testing brightness. Therefore, the brightness of the light source is detected through the standard electronic equipment, so that the light source can be automatically calibrated through the detection of the standard electronic equipment even if the light source is aged, and the technical problems of large manual calibration error and low efficiency are solved.
Drawings
Fig. 1 is a schematic structural diagram of an electronic device testing apparatus according to the present disclosure.
Fig. 2 is a schematic structural diagram of a control mechanism of the electronic device testing apparatus of the present disclosure.
Fig. 3 is a schematic structural diagram of a light source brightness adjusting unit of the electronic device testing apparatus of the present disclosure.
Fig. 4 is a schematic view of another structure of the control mechanism of the electronic device testing apparatus of the present disclosure.
Fig. 5 is a schematic structural diagram of an apparatus distance adjusting unit of the electronic apparatus testing device according to the present disclosure.
Fig. 6 is a schematic structural diagram of a distance parameter obtaining unit of the electronic device testing apparatus according to the present disclosure.
Fig. 7 is a schematic view of another structure of the control mechanism of the electronic device testing apparatus according to the present disclosure.
Fig. 8 is a schematic view of another structure of the control mechanism of the electronic device testing apparatus of the present disclosure.
Detailed Description
Exemplary embodiments that embody features and advantages of the invention are described in detail below in the specification. It is understood that the invention is capable of other and different embodiments and its several details are capable of modification in various other respects, all without departing from the scope of the present invention, and that the description and drawings are to be taken as illustrative and not restrictive in character.
The invention provides an electronic equipment testing device capable of automatic calibration, as shown in fig. 1, the electronic equipment testing device comprises a device main body 10, a light source 20, a light source fixing mechanism 30, a driving mechanism 40, a distance measuring sensor 50, an electronic equipment fixing mechanism 60 and a control mechanism 90.
A support column 11 is provided at one side of the apparatus body 10, and a slide rail 111 is provided on the support column 11. The electronic device fixing mechanism 60 is fixedly connected to the supporting column 11, and is used for fixing the electronic device 101. The light source fixing mechanism 30 is slidably connected to the sliding rail 111, and the light source 20 is fixedly connected to the light source fixing mechanism 30, and is opposite to the screen of the electronic device 101 and spaced therefrom. The driving mechanism 40 is drivingly connected to the light source fixing mechanism 60, and drives the light source fixing mechanism 60 to slide along the slide rail 111. The distance measuring sensor 50 is disposed on the light source fixing mechanism 60, and the measured data is used to determine the distance from the light source 20 to the electronic device 101.
The control mechanism 90 is electrically connected to the light source 20, the driving mechanism 40, the distance measuring sensor 50, and the electronic device 101. The control mechanism 90 is configured to adjust the light source 20 according to the predetermined test brightness, then obtain the measured brightness of the light source 20, and adjust the brightness of the light source 20 according to the measured brightness of the light source 20, so that the measured brightness of the light source 20 reaches the predetermined test brightness.
The electronic device fixing mechanism 60 may be a fixing plate or other fixing clamps, and in this embodiment, the fixing plate is taken as an example. The light source fixing mechanism 30 may be a slide plate, a slide rod, a slider, or the like that slides along the slide rail 111.
The driving mechanism 40 may be a screw driving mechanism, a hydraulic driving mechanism, a chain wheel mechanism, etc., and the present invention is not limited thereto, and the screw driving mechanism is taken as an example in this embodiment.
As shown in fig. 2, in one embodiment of the present disclosure, the control mechanism 90 includes:
a test information obtaining unit 910, configured to obtain a test parameter corresponding to a model of the electronic device, where the test parameter includes a predetermined test brightness of the light source;
a brightness parameter configuration unit 930 electrically connected to the test information obtaining unit 910 for adjusting the light source according to the predetermined test brightness;
a light source brightness obtaining unit 950, electrically connected to the brightness parameter configuring unit 930, for obtaining the brightness of the light source measured by the standard electronic device, where the standard electronic device is an electronic device that has passed the test, and the model of the standard electronic device is the same as the model of the electronic device that needs to be tested;
and the light source brightness adjusting unit 970 is electrically connected with the light source brightness acquiring unit and is used for judging whether the brightness measured by the standard electronic equipment reaches the preset test brightness, and if not, adjusting the brightness of the light source 20 to enable the brightness measured by the standard electronic equipment to reach the preset test brightness.
Specifically, taking the embodiment shown in fig. 1 as an example, when the electronic device testing apparatus is started, the electronic device testing apparatus is calibrated before the electronic device 101 is tested. In the calibration, the brightness of the light source 20 may be measured by the electronic device 101 that has been historically tested, or may be measured by a light sensor that has been tested to be compatible with the model of the light sensor mounted on the electronic device 101. In the present embodiment, taking the electronic device 101 that has historically passed the test as an example, the above-described electronic device 101 that has historically passed the test is referred to as a standard electronic device in the present embodiment. When calibration is performed, a relevant operator firstly fixes the standard electronic device on the electronic device fixing mechanism 60, and selects a model of an electronic device to be tested, after receiving a selection instruction of the relevant operator, the control mechanism 90 acquires a test parameter corresponding to the model of the electronic device through the test information acquiring unit 910, where the test parameter includes a predetermined test brightness of the light source 20, and then adjusts the light source 20 according to the predetermined test brightness through the brightness parameter configuring unit 930. At this time, the standard electronic device starts to detect the brightness of the light source 20, the control mechanism 90 obtains the brightness of the light source 20 measured by the standard electronic device through the light source brightness obtaining unit 950, and finally judges whether the brightness of the light source 20 measured by the standard electronic device reaches the preset test brightness through the light source brightness adjusting unit 970, if not, the brightness of the light source 20 is proved not to reach the brightness required to be reached when the test is performed, at this time, the brightness of the light source 20 is adjusted, so that the brightness measured by the standard electronic device reaches the preset test brightness, and after the brightness measured by the standard electronic device reaches the preset test brightness, the brightness of the light source 20 is proved to reach the brightness required to be reached when the test is performed, at this time, the standard electronic device can be detached from the electronic device fixing mechanism 60, and then the electronic device 101 is fixed on the electronic device fixing mechanism 60 for the test, so that the test can be performed only by performing one-time automatic calibration for the electronic devices of the same model, and the efficiency and the accuracy of calibration before the test are improved.
As shown in fig. 3, in one embodiment of the present disclosure, the light source brightness adjusting unit 970 includes:
a compensation brightness determining unit 971, configured to calculate, according to the brightness of the light source 20 measured by the standard electronic device, a difference between the brightness of the light source 20 measured by the standard electronic device and the predetermined test brightness, so as to obtain a predetermined compensation brightness;
a compensation brightness associating unit 972, electrically connected to the compensation brightness determining unit 971, for storing the predetermined compensation brightness in association with the model of the electronic device, so that when the electronic device is tested again, the electronic device testing apparatus adjusts the light source 20 according to the predetermined test brightness and the predetermined compensation brightness;
and a light source brightness compensation unit 973 electrically connected to the compensation brightness determination unit 971, and configured to adjust brightness change of the light source 20 to a predetermined compensation brightness, so that the brightness measured by the standard electronic device reaches a predetermined test brightness.
In this embodiment, the method for adjusting the brightness of the light source 20 to make the brightness measured by the standard electronic device reach the predetermined test brightness may be that the compensation brightness determining unit 971 calculates a difference between the brightness measured by the standard electronic device of the light source 20 and the predetermined test brightness to obtain the predetermined compensation brightness, and then the light source brightness compensating unit 973 adjusts the brightness change of the light source 20 to obtain the predetermined compensation brightness, so that the brightness measured by the standard electronic device reaches the predetermined test brightness, and at the same time, the light source brightness adjusting unit 970 may associate and store the predetermined compensation brightness with the model of the electronic device through the compensation brightness associating unit 972. Thus, when the electronic device testing apparatus is started again later when the electronic device of the model needs to be tested, the light source 20 can be adjusted according to the predetermined test brightness and the predetermined compensation brightness. This makes it possible to make the brightness of the light source 20 adjusted by the brightness parameter configuration unit 930 according to the predetermined test brightness closer to the predetermined test brightness, so that the time taken for the calibration by the light source brightness adjustment unit 970 is shorter, and the efficiency of the calibration is improved.
In another embodiment of the present disclosure, as shown in fig. 4, the test parameters further include a predetermined test distance from the light source 20 to the electronic device 101, and the control mechanism 90 may further include, in addition to the test information obtaining unit 910, the brightness parameter configuring unit 930, the light source brightness obtaining unit 950, and the light source brightness adjusting unit 970, the following:
the distance parameter configuration unit 920 is in electrical signal connection with the test information acquisition unit 910, and is used for controlling the driving mechanism 40 to drive the light source 20 according to the predetermined test distance, and adjusting the distance from the light source 20 to the electronic device 101;
a distance parameter obtaining unit 940 electrically connected to the distance parameter configuring unit 920, and configured to obtain data measured by the distance measuring sensor 50, determine a distance from the light source 20 to the electronic device 101 according to the data measured by the distance measuring sensor 50, and record the determined distance from the light source 20 to the electronic device 101 as a sensor distance;
and the device distance adjusting unit 960 is in electrical signal connection with the distance parameter acquiring unit 940 and is used for judging whether the sensor distance reaches a predetermined testing distance, and if not, controlling the driving mechanism 40 to drive the light source 20 to enable the sensor distance to reach the predetermined testing distance.
Specifically, still taking the embodiment shown in fig. 1 as an example, when performing calibration, the control mechanism 90 needs to calibrate the distance from the light source 20 to the electronic device 101 in addition to calibrating the brightness of the light source 20. The specific process is that after the control mechanism 90 receives a selection instruction of a relevant operator, the test information obtaining unit 910 obtains a test parameter corresponding to the model of the electronic device, where the test parameter includes a predetermined test distance from the light source 20 to the electronic device 101 in addition to a predetermined test brightness of the light source 20. Then, the distance parameter configuration unit 920 controls the driving mechanism 40 to drive the light source 20 according to the predetermined test distance, and adjusts the distance from the light source 20 to the electronic device 101. At this time, the distance measuring sensor 50 starts to detect data, and the control mechanism 90 acquires the data measured by the distance measuring sensor 50 through the distance parameter acquiring unit 940, and determines the distance from the light source 20 to the electronic device 101 according to the data measured by the distance measuring sensor 50, and the determined distance from the light source 20 to the electronic device 101 is recorded as the sensor distance. Finally, the device distance adjusting unit 960 determines whether the sensor distance reaches a predetermined testing distance, and if not, it proves that the distance from the light source 20 to the electronic device 101 does not reach the distance required for testing, and at this time, the driving mechanism 40 is controlled to drive the light source 20 so that the sensor distance reaches the predetermined testing distance.
When the brightness measured by the standard electronic device reaches the preset test brightness and the sensor distance reaches the preset test distance, it is proved that the brightness of the light source 20 reaches the brightness required to be reached during the test, and the distance from the light source 20 to the electronic device 101 also reaches the distance required to be reached during the test. At this time, the standard electronic device can be detached from the electronic device fixing mechanism 60, and then the electronic device 101 is fixed on the electronic device fixing mechanism 60 for testing, so that the electronic device with the same model can be tested only by performing one-time automatic calibration.
As shown in fig. 5, in another embodiment proposed by the present disclosure, the device distance adjusting unit 960 further includes:
a compensation distance determination unit 961, configured to calculate a difference between the sensor distance and a predetermined test distance, so as to obtain a predetermined compensation distance;
a compensation distance associating unit 962, electrically connected to the compensation distance determining unit 961, for storing the predetermined compensation distance in association with the model of the electronic device, so that when the electronic device of the model is tested again, the electronic device testing apparatus adjusts the distance from the light source 20 to the electronic device 101 according to the predetermined testing distance and the predetermined compensation distance;
and the device distance compensation unit 963 is electrically connected with the compensation distance determination unit 961 and is used for controlling the driving mechanism 40 to drive the light source fixing mechanism 60 to slide along the sliding guide rail 111 for a predetermined compensation distance so that the sensor distance reaches a predetermined test distance.
In this embodiment, controlling the driving mechanism 40 to drive the light source 20 so that the sensor distance reaches the predetermined test distance may be calculating a difference between the sensor distance and the predetermined test distance by the compensation distance determination unit 961 to obtain the predetermined compensation distance. Then, the driving mechanism 40 is controlled to drive the light source fixing mechanism 60 to slide along the slide guide 111 by a predetermined compensation distance by the device distance compensation unit 963, so that the sensor distance reaches a predetermined test distance. Meanwhile, the device distance adjusting unit 960 may store the predetermined compensation distance in association with the model of the electronic device through the compensation distance associating unit 962. When the electronic device testing apparatus is started again later when it is needed to test the electronic device of the model again, the driving mechanism 40 can be controlled to drive the light source fixing mechanism 60 according to the predetermined testing distance and the predetermined compensation distance, and the distance from the light source 20 to the electronic device 101 can be adjusted, so that the distance from the light source 20 to the electronic device, which is adjusted by the distance parameter configuration unit 920 according to the predetermined testing distance, can be closer to the predetermined testing distance, the time taken by the device distance adjustment unit 960 for calibration is shorter, and the calibration efficiency is improved.
In another embodiment of the present disclosure, as shown in fig. 6, the test parameter further includes a thickness of the electronic device, and the distance parameter obtaining unit 940 includes:
a jig distance acquiring unit 941, configured to acquire a distance from the light source 20 to the electronic device fixing mechanism 60, which is measured by the distance measuring sensor 50;
the device distance determining unit 942 is electrically connected to the jig distance acquiring unit 941, and configured to determine a distance from the light source 20 to the electronic device 101 according to the distance from the light source 20 to the electronic device fixing mechanism 60 and the thickness of the electronic device 101 measured by the distance measuring sensor 50.
The method for acquiring the data measured by the distance measuring sensor 50 and determining the distance from the light source 20 to the electronic device 101 according to the data measured by the distance measuring sensor 50 may be directly measuring the distance from the electronic device 101 to the light source 20 by the distance measuring sensor 50, or may be, as shown in this embodiment, first measuring the distance from the light source 20 to the electronic device fixing mechanism 60 by the distance measuring sensor 50, and after the distance from the light source 20 to the electronic device fixing mechanism 60 measured by the jig distance acquiring unit 941 is acquired by the jig distance acquiring unit 941, subtracting the thickness of the electronic device 101 from the distance from the light source 20 to the electronic device fixing mechanism 60 measured by the distance measuring sensor 50 by the device distance determining unit 942, so as to obtain the distance from the light source 20 to the electronic device 101. If single electronic equipment is used for calibration, the electronic equipment needs to be fixed on the electronic equipment testing device and the rear part of the electronic equipment testing device can be used for distance calibration, and the distance calibration can be carried out after relevant operators select models needing calibration, so that the time of a calibration process can be saved.
In another embodiment of the present disclosure, as shown in fig. 7, the electronic device testing apparatus is electrically connected to a configuration file server, where a configuration file corresponding to a model of the electronic device is stored in the configuration file server, and the control mechanism 90 may further include:
a configuration file obtaining unit 901 configured to obtain a configuration file corresponding to a model of the electronic device;
the test information determining unit 902 is electrically connected to the configuration file acquiring unit, and is configured to acquire the test parameters corresponding to the model of the electronic device in the configuration file.
In this embodiment, in calibration, the test parameters corresponding to the model of the electronic device may be acquired from a profile server electrically connected to the electronic device testing apparatus. The configuration file server can be electrically connected with a plurality of electronic equipment testing devices and stores testing parameters of electronic equipment of different types. When the electronic equipment testing device needs to be tested, the model of the electronic equipment needing to be tested is sent to the configuration file server, and the configuration file server sends the configuration file corresponding to the model of the electronic equipment needing to be tested to the electronic equipment testing device. At this time, the control mechanism 90 acquires a configuration file corresponding to the model of the electronic device through the configuration file acquisition unit 901, and then acquires test parameters corresponding to the model of the electronic device in the configuration file through the test information determination unit 902.
In another embodiment, as shown in fig. 8, in the present disclosure, the configuration file further stores therein identity information of a standard electronic device, where the identity information includes at least one of an IMEI number and a PCBA number of the standard electronic device, and the control mechanism 90 may further include:
the identity information acquisition unit 903 is in electric signal connection with the configuration file acquisition unit and is used for acquiring the identity information of the standard electronic equipment;
and the identity information comparison unit 904 is in electrical signal connection with the identity information acquisition unit and is used for sending alarm information to remind a user to confirm whether the electronic equipment is standard electronic equipment or not if the acquired identity information of the standard electronic equipment is inconsistent with the stored identity information of the standard electronic equipment.
In this embodiment, if a standard machine is required to be used for calibration, the identity of the standard machine needs to be verified first, and the specific method is that after a configuration file corresponding to the model of the electronic device is obtained, the identity information of the standard electronic device is obtained through the identity information obtaining unit 903, then the obtained identity information of the standard electronic device is compared with the stored identity information of the standard electronic device through the identity information comparing unit 904, and if the obtained identity information of the standard electronic device is not consistent with the stored identity information of the standard electronic device, it is proved that the electronic device fixed in the electronic device testing apparatus is not the standard electronic device, and at this time, an alarm message may be sent to prompt a user to confirm whether the electronic device is the standard electronic device. After the user confirms and replaces the standard electronic device, the subsequent calibration steps can be continued.
The present disclosure further provides a calibration method for a testing apparatus, including:
acquiring test parameters corresponding to the model of the electronic equipment, wherein the test parameters comprise preset test brightness of the light source;
adjusting the light source according to the predetermined test brightness;
acquiring the brightness of the light source measured by standard electronic equipment, wherein the standard electronic equipment passes the test and has the same model as the electronic equipment needing to be tested;
and judging whether the brightness measured by the standard electronic equipment reaches a preset test brightness, if not, adjusting the brightness of the light source to enable the brightness measured by the standard electronic equipment to reach the preset test brightness.
Specifically, taking the embodiment shown in fig. 1 as an example, when the electronic device testing apparatus is started, the electronic device testing apparatus is calibrated before the electronic device 101 is tested. In the calibration, the brightness of the light source 20 may be measured by the electronic device 101 that has been historically tested, or may be measured by a light sensor that has been tested to be compatible with the model of the light sensor mounted on the electronic device 101.
In the present embodiment, taking the electronic device 101 that has historically passed the test as an example, the above-described electronic device 101 that has historically passed the test is referred to as a standard electronic device in the present embodiment.
When calibration is performed, a relevant operator firstly fixes the standard electronic device on the electronic device fixing mechanism 60, selects the model of the electronic device to be tested, and after receiving a selection instruction of the relevant operator, the control mechanism 90 obtains a test parameter corresponding to the model of the electronic device, where the test parameter includes a predetermined test brightness of the light source 20, and then adjusts the light source 20 according to the predetermined test brightness. At this time, the standard electronic device starts to detect the brightness of the light source 20, the control mechanism 90 obtains the brightness of the light source 20 measured by the standard electronic device, finally, judges whether the brightness of the light source 20 measured by the standard electronic device reaches a preset test brightness, if not, proves that the brightness of the light source 20 does not reach the brightness required to be reached in the test, at this time, the brightness of the light source 20 is adjusted to make the brightness measured by the standard electronic device reach the preset test brightness, and after the brightness measured by the standard electronic device reaches the preset test brightness, the brightness of the light source 20 is proved to reach the brightness required to be reached in the test, at this time, the standard electronic device can be detached from the electronic device fixing mechanism 60, then the electronic device 101 required to be tested is fixed on the electronic device fixing mechanism 60 for testing, so that for the electronic devices of the same model, the test can be performed only by performing one-time automatic calibration, and the efficiency and the accuracy of the calibration before the test are improved.
It is understood that the calibration method described above may also be implemented by the control mechanism 90, after receiving a selection instruction from an associated operator, acquiring test parameters corresponding to the model of the electronic device, where the test parameters include a predetermined test brightness of the light source 20, and then starting to adjust the light source 20. Meanwhile, the standard electronic device starts to detect the brightness of the light source 20, the control mechanism 90 obtains the brightness of the light source 20 measured by the standard electronic device, and determines whether the brightness of the light source 20 measured by the standard electronic device reaches a predetermined test brightness, if not, it is proved that the brightness of the light source 20 does not reach the brightness required to be reached when performing the test, at this moment, the brightness of the light source 20 is continuously adjusted, and after the brightness measured by the standard electronic device reaches the predetermined test brightness, it is proved that the brightness of the light source 20 reaches the brightness required to be reached when performing the test, at this moment, the brightness of the light source 20 is stopped being adjusted. At this time, the standard electronic device may be detached from the electronic device fixing mechanism 60, and then the electronic device 101 to be tested is fixed on the electronic device fixing mechanism 60 for testing, so that the calibration method does not need to adjust the light source according to the predetermined test brightness, and the calibration efficiency is further improved on the premise of ensuring the accuracy of the calibration result.
It is understood that the test parameters further include a predetermined test distance from the light source to the electronic device, and after obtaining the test parameters corresponding to the model of the electronic device, the method further includes:
controlling the driving mechanism to drive the light source according to the preset test distance, and adjusting the distance from the light source to the electronic equipment;
acquiring data measured by the distance measuring sensor, determining the distance from the light source to the electronic equipment according to the data measured by the distance measuring sensor, and recording the determined distance from the light source to the electronic equipment as a sensor distance;
and judging whether the sensor distance reaches a preset test distance, if not, controlling the driving mechanism to drive the light source to enable the sensor distance to reach the preset test distance.
Specifically, still taking the embodiment shown in fig. 1 as an example, when performing calibration, the control mechanism 90 needs to calibrate the distance from the light source 20 to the electronic device 101 in addition to calibrating the brightness of the light source 20. The specific process is that after the control mechanism 90 receives a selection instruction of a relevant operator, a test parameter corresponding to the model of the electronic device is obtained, where the test parameter includes a predetermined test distance from the light source 20 to the electronic device 101 in addition to a predetermined test brightness of the light source 20. And then controlling the driving mechanism 40 to drive the light source 20 according to the preset test distance, and adjusting the distance from the light source 20 to the electronic device 101. At this time, the distance measuring sensor 50 starts to detect data, the control mechanism 90 acquires the data measured by the distance measuring sensor 50, and determines the distance from the light source 20 to the electronic device 101 based on the data measured by the distance measuring sensor 50, and the determined distance from the light source 20 to the electronic device 101 is recorded as the sensor distance. And finally, judging whether the sensor distance reaches a preset test distance, if not, proving that the distance from the light source 20 to the electronic equipment 101 does not reach the distance required to be reached during the test, and controlling the driving mechanism 40 to drive the light source 20 to enable the sensor distance to reach the preset test distance.
When the brightness measured by the standard electronic device reaches the preset test brightness and the sensor distance reaches the preset test distance, it is proved that the brightness of the light source 20 reaches the brightness required to be reached during the test, and the distance from the light source 20 to the electronic device 101 also reaches the distance required to be reached during the test. At this time, the standard electronic device can be detached from the electronic device fixing mechanism 60, and then the electronic device 101 is fixed on the electronic device fixing mechanism 60 for testing, so that the electronic device with the same model can be tested only by performing one-time automatic calibration.
It is understood that, the above-mentioned distance calibration method may also be implemented by obtaining the test parameter corresponding to the model of the electronic device after the control mechanism 90 receives the selection instruction of the relevant operator, and then controlling the driving mechanism 40 to drive the light source 20 to adjust the distance from the light source 20 to the electronic device 101. Meanwhile, the distance measuring sensor 50 starts to detect data, the control mechanism 90 acquires the data measured by the distance measuring sensor 50, and determines the distance from the light source 20 to the electronic device 101 according to the data measured by the distance measuring sensor 50, and the determined distance from the light source 20 to the electronic device 101 is recorded as the sensor distance. And finally, judging whether the sensor distance reaches a preset test distance, if not, proving that the distance from the light source 20 to the electronic equipment 101 does not reach the distance required to be reached during the test, and controlling the driving mechanism 40 to continue to drive the light source 20 until the sensor distance reaches the preset test distance.
It is understood that the specific step of controlling the driving mechanism to drive the light source to enable the sensor distance to reach the predetermined testing distance includes:
calculating the difference value between the sensor distance and a preset test distance to obtain a preset compensation distance;
the preset compensation distance is stored in association with the model of the electronic equipment, so that when the electronic equipment of the model is tested again, the electronic equipment testing device adjusts the distance from the light source to the electronic equipment according to the preset testing distance and the preset compensation distance;
and controlling the driving mechanism to drive the light source fixing mechanism to slide along the sliding guide rail for a preset compensation distance, so that the distance between the sensors reaches a preset test distance.
In this embodiment, the driving mechanism 40 is controlled to drive the light source 20 such that the sensor distance reaches the predetermined test distance, which may be a difference between the sensor distance and the predetermined test distance is calculated to obtain the predetermined compensation distance. The driving mechanism 40 is then controlled to drive the light source fixing mechanism 60 to slide along the slide rail 111 by a predetermined compensation distance, such that the sensor distance reaches a predetermined test distance. Meanwhile, the device distance adjusting unit 960 stores the predetermined compensation distance in association with the model of the electronic device. When the electronic device testing device needs to be tested again and started again later, the driving mechanism 40 can be controlled to drive the light source fixing mechanism 60 according to the preset testing distance and the preset compensation distance, and the distance from the light source 20 to the electronic device 101 is adjusted, so that the distance from the light source 20 to the electronic device, which is adjusted according to the preset testing distance, can be closer to the preset testing distance, the time spent in subsequent calibration is shorter, and the calibration efficiency is improved.
It is to be understood that the test parameters further include a thickness of the electronic device, and the specific step of acquiring the distance from the light source to the electronic device determined by the ranging sensor includes:
acquiring the distance from the light source to the electronic equipment fixing mechanism measured by the distance measuring sensor;
and determining the distance from the light source to the electronic equipment according to the distance from the light source to the electronic equipment fixing mechanism and the thickness of the electronic equipment measured by the ranging sensor.
The method for obtaining the data measured by the ranging sensor 50 and determining the distance from the light source 20 to the electronic device 101 according to the data measured by the ranging sensor 50 may be directly measuring the distance from the electronic device 101 to the light source 20 by the ranging sensor 50, or as shown in this embodiment, first measuring the distance from the light source 20 to the electronic device fixing mechanism 60 by the ranging sensor 50, and then subtracting the thickness of the electronic device 101 from the distance from the light source 20 to the electronic device fixing mechanism 60 measured by the ranging sensor 50 to obtain the distance from the light source 20 to the electronic device 101. If single electronic equipment is used for calibration, the electronic equipment needs to be fixed on the electronic equipment testing device and the rear part of the electronic equipment testing device can be used for distance calibration, and the distance calibration can be carried out after relevant operators select models needing calibration, so that the time of a calibration process can be saved.
It can be understood that the specific step of adjusting the brightness of the light source to make the brightness measured by the standard electronic device reach the predetermined test brightness includes:
calculating the difference value between the brightness of the light source measured by the standard electronic equipment and the preset test brightness according to the brightness of the light source measured by the standard electronic equipment to obtain preset compensation brightness;
the preset compensation brightness is stored in association with the model of the electronic equipment, so that when the electronic equipment of the model is tested again, the electronic equipment testing device adjusts the light source according to the preset testing brightness and the preset compensation brightness;
and adjusting the brightness change of the light source to preset compensation brightness so that the brightness measured by the standard electronic equipment reaches preset test brightness.
In this embodiment, the method for adjusting the brightness of the light source 20 to make the brightness measured by the standard electronic device reach the predetermined test brightness may be to calculate a difference between the brightness of the light source 20 measured by the standard electronic device and the predetermined test brightness to obtain a predetermined compensation brightness, and then adjust the brightness of the light source 20 to change the predetermined compensation brightness, so that the brightness measured by the standard electronic device reaches the predetermined test brightness, and at the same time, the predetermined compensation brightness may be stored in association with the model of the electronic device by the compensation brightness association unit 972. Thus, when the electronic device testing apparatus is started again later when the electronic device of the model needs to be tested, the light source 20 can be adjusted according to the predetermined test brightness and the predetermined compensation brightness. This makes it possible to make the brightness of the light source 20 adjusted by the brightness parameter configuration unit 930 according to the predetermined test brightness closer to the predetermined test brightness, so that the time taken for the calibration by the light source brightness adjustment unit 970 is shorter, and the calibration efficiency is improved.
It can be understood that, the electronic device testing apparatus is electrically connected to a configuration file server, a configuration file corresponding to a model of the electronic device is stored in the configuration file server, a test parameter corresponding to the model of the electronic device is stored in the configuration file, and the specific step of acquiring the test parameter corresponding to the model of the electronic device includes:
acquiring a configuration file corresponding to the model of the electronic equipment;
and acquiring test parameters corresponding to the model of the electronic equipment in the configuration file.
In this embodiment, in calibration, the test parameters corresponding to the model of the electronic device may be acquired from a configuration file server electrically connected to the electronic device testing apparatus. The configuration file server can be electrically connected with a plurality of electronic equipment testing devices and stores testing parameters of electronic equipment of different types. When the electronic equipment testing device needs to be tested, the model of the electronic equipment needing to be tested is sent to the configuration file server, and the configuration file server sends the configuration file corresponding to the model of the electronic equipment needing to be tested to the electronic equipment testing device. At this time, the control mechanism 90 acquires a configuration file corresponding to the model of the electronic device, and then acquires test parameters corresponding to the model of the electronic device through the configuration file.
It is to be understood that the configuration file further stores therein identity information of a standard electronic device, the identity information including at least one of an IMEI number and a PCBA number of the standard electronic device, and after acquiring the configuration file corresponding to the model of the electronic device, the method further includes:
acquiring identity information of the standard electronic equipment;
and if the acquired identity information of the standard electronic equipment is inconsistent with the stored identity information of the standard electronic equipment, sending alarm information to remind a user to confirm whether the electronic equipment is the standard electronic equipment.
In this embodiment, if a standard machine is required to be used for calibration, the identity of the standard machine needs to be verified first, and the specific method includes acquiring the identity information of the standard electronic device after acquiring the configuration file corresponding to the model of the electronic device, comparing the acquired identity information of the standard electronic device with the stored identity information of the standard electronic device, and if the acquired identity information of the standard electronic device is not consistent with the stored identity information of the standard electronic device, proving that the electronic device fixed in the electronic device testing apparatus is not the standard electronic device, and sending alarm information to remind a user to confirm whether the electronic device is the standard electronic device. After the user confirms and replaces the standard electronic device, the subsequent calibration steps can be continued.
While the present invention has been described with reference to several exemplary embodiments, it is understood that the terminology used is intended to be in the nature of words of description and illustration, rather than of limitation. As the present invention may be embodied in several forms without departing from the spirit or essential characteristics thereof, it should also be understood that the above-described embodiments are not limited by any of the details of the foregoing description, but rather should be construed broadly within its spirit and scope as defined in the appended claims, and therefore all changes and modifications that fall within the meets and bounds of the claims, or equivalences of such meets and bounds are therefore intended to be embraced by the appended claims.
Claims (11)
1. An electronic device testing apparatus capable of automatic calibration, comprising:
a device body in which an electronic apparatus is fixed;
the light source is arranged in the device main body, is opposite to the electronic equipment screen and is arranged at intervals with the electronic equipment;
the control mechanism is used for acquiring the measured brightness of the light source after adjusting the light source according to the preset test brightness, and adjusting the brightness of the light source according to the measured brightness of the light source to enable the measured brightness of the light source to reach the preset test brightness;
one side of device main part is equipped with the support column, be provided with sliding guide on the support column, electronic equipment testing arrangement still includes:
the light source fixing mechanism is fixedly connected with the light source and is connected with the sliding guide rail in a sliding manner;
the driving mechanism is in driving connection with the light source fixing mechanism and drives the light source fixing mechanism to slide along the sliding guide rail;
the distance measuring sensor is arranged on the light source fixing mechanism, and data measured by the distance measuring sensor is used for determining the distance from the light source to the electronic equipment;
the control mechanism is also respectively in electric signal connection with the driving mechanism and the ranging sensor;
the control mechanism includes: a test information obtaining unit, configured to obtain a test parameter corresponding to a model of the electronic device, where the test parameter includes a predetermined test brightness of the light source; the test information acquisition unit includes: a configuration file acquisition unit for acquiring a configuration file corresponding to the model of the electronic device; the test information determining unit is in electric signal connection with the configuration file acquiring unit and is used for acquiring test parameters corresponding to the model of the electronic equipment in the configuration file;
the electronic equipment testing device is electrically connected with a configuration file server, a configuration file corresponding to the type of the electronic equipment is stored in the configuration file server, and testing parameters corresponding to the type of the electronic equipment are stored in the configuration file;
the configuration file further stores identity information of a standard electronic device, the identity information includes at least one of an IMEI number and a PCBA number of the standard electronic device, and the control mechanism further includes: the identity information acquisition unit is in electric signal connection with the configuration file acquisition unit and is used for acquiring the identity information of the standard electronic equipment; and the identity information comparison unit is in electric signal connection with the identity information acquisition unit and is used for sending alarm information to remind a user to confirm whether the electronic equipment is standard electronic equipment or not if the acquired identity information of the standard electronic equipment is inconsistent with the stored identity information of the standard electronic equipment.
2. The electronic device testing apparatus of claim 1, wherein the control mechanism comprises:
the brightness parameter configuration unit is electrically connected with the test information acquisition unit and is used for adjusting the light source according to the preset test brightness;
the light source brightness acquisition unit is in electrical signal connection with the brightness parameter configuration unit and is used for acquiring the brightness of the light source measured by standard electronic equipment, the standard electronic equipment is electronic equipment which passes the test, and the model of the standard electronic equipment is the same as that of the electronic equipment which needs to be tested;
and the light source brightness adjusting unit is electrically connected with the light source brightness acquiring unit and used for judging whether the brightness measured by the standard electronic equipment reaches the preset test brightness, and if not, adjusting the brightness of the light source to enable the brightness measured by the standard electronic equipment to reach the preset test brightness.
3. The electronic device testing apparatus of claim 2, wherein the light source brightness adjusting unit comprises:
the compensation brightness determining unit is used for calculating the difference value between the brightness of the light source measured by the standard electronic equipment and the preset test brightness according to the brightness of the light source measured by the standard electronic equipment to obtain preset compensation brightness;
the compensation brightness association unit is electrically connected with the compensation brightness determination unit and is used for associating and storing the preset compensation brightness and the model of the electronic equipment so that when the electronic equipment of the model is tested again, the electronic equipment testing device adjusts the light source according to the preset testing brightness and the preset compensation brightness;
and the light source brightness compensation unit is electrically connected with the compensation brightness determination unit and is used for adjusting the light source brightness change to preset compensation brightness so that the brightness measured by the standard electronic equipment reaches preset test brightness.
4. The electronic device testing apparatus of claim 1, wherein the control mechanism comprises:
the test information acquisition unit is also used for acquiring a preset test distance from the light source to the electronic equipment;
the distance parameter configuration unit is in electric signal connection with the test information acquisition unit and is used for controlling the driving mechanism to drive the light source according to the preset test distance and adjusting the distance from the light source to the electronic equipment;
the distance parameter acquisition unit is in electric signal connection with the distance parameter configuration unit and is used for acquiring data measured by the distance measuring sensor, determining the distance from the light source to the electronic equipment according to the data measured by the distance measuring sensor and recording the determined distance from the light source to the electronic equipment as a sensor distance;
and the equipment distance adjusting unit is in electric signal connection with the distance parameter acquiring unit and is used for judging whether the sensor distance reaches a preset test distance or not, and if not, the driving mechanism is controlled to drive the light source to enable the sensor distance to reach the preset test distance.
5. The electronic device testing apparatus according to claim 4, wherein the device distance adjusting unit includes:
the compensation distance determining unit is used for calculating the difference value between the sensor distance and a preset testing distance to obtain a preset compensation distance;
the compensation distance association unit is electrically connected with the compensation distance determination unit and is used for associating and storing the preset compensation distance with the model of the electronic equipment so that when the electronic equipment of the model is tested again, the electronic equipment testing device adjusts the distance from the light source to the electronic equipment according to the preset testing distance and the preset compensation distance;
and the equipment distance compensation unit is in electrical signal connection with the compensation distance determination unit and is used for controlling the driving mechanism to drive the light source fixing mechanism to slide along the sliding guide rail for a preset compensation distance so as to enable the sensor distance to reach a preset test distance.
6. The electronic device testing apparatus according to claim 4, wherein the test parameter further includes a thickness of the electronic device, and the distance parameter acquiring unit includes:
the jig distance acquisition unit is used for acquiring the distance from the light source to the electronic equipment fixing mechanism, which is measured by the distance measuring sensor;
and the equipment distance determining unit is in electrical signal connection with the jig distance acquiring unit and is used for determining the distance from the light source to the electronic equipment according to the distance from the light source to the electronic equipment fixing mechanism and the thickness of the electronic equipment, which are measured by the ranging sensor.
7. A method of calibrating a test device, the method comprising:
acquiring test parameters corresponding to the model of the electronic equipment, wherein the test parameters comprise preset test brightness of the light source;
adjusting the light source according to the predetermined test brightness;
acquiring the brightness of the light source measured by standard electronic equipment, wherein the standard electronic equipment is electronic equipment which passes a test, and the model of the standard electronic equipment is the same as that of the electronic equipment which needs to be tested;
judging whether the brightness measured by the standard electronic equipment reaches a preset test brightness, if not, adjusting the brightness of the light source to enable the brightness measured by the standard electronic equipment to reach the preset test brightness;
the electronic equipment testing device is electrically connected with a configuration file server, a configuration file corresponding to the type of the electronic equipment is stored in the configuration file server, testing parameters corresponding to the type of the electronic equipment are stored in the configuration file, and the specific step of acquiring the testing parameters corresponding to the type of the electronic equipment comprises the following steps: acquiring a configuration file corresponding to the model of the electronic equipment; acquiring test parameters corresponding to the model of the electronic equipment in the configuration file;
the configuration file further stores identity information of a standard electronic device, the identity information includes at least one of an IMEI number and a PCBA number of the standard electronic device, and after acquiring the configuration file corresponding to the model of the electronic device, the method further includes: acquiring identity information of the standard electronic equipment; and if the acquired identity information of the standard electronic equipment is inconsistent with the stored identity information of the standard electronic equipment, sending alarm information to remind a user to confirm whether the electronic equipment is the standard electronic equipment.
8. The method of claim 7, wherein the test parameters further include a predetermined test distance from the light source to the electronic device, and after obtaining the test parameters corresponding to the model of the electronic device, the method further comprises:
controlling the driving mechanism to drive the light source according to the preset test distance, and adjusting the distance from the light source to the electronic equipment;
acquiring data measured by the distance measuring sensor, determining the distance from the light source to the electronic equipment according to the data measured by the distance measuring sensor, and recording the determined distance from the light source to the electronic equipment as a sensor distance;
and judging whether the sensor distance reaches a preset test distance, if not, controlling the driving mechanism to drive the light source to enable the sensor distance to reach the preset test distance.
9. The method of claim 8, wherein controlling the driving mechanism to drive the light source such that the sensor distance reaches a predetermined test distance comprises:
calculating the difference value between the sensor distance and a preset test distance to obtain a preset compensation distance;
the preset compensation distance is stored in association with the model of the electronic equipment, so that when the electronic equipment of the model is tested again, the electronic equipment testing device adjusts the distance from the light source to the electronic equipment according to the preset testing distance and the preset compensation distance;
and controlling the driving mechanism to drive the light source fixing mechanism to slide along the sliding guide rail by a preset compensation distance, so that the distance between the sensors reaches a preset test distance.
10. The method of claim 8, wherein the test parameters further include a thickness of the electronic device, and wherein the step of obtaining the distance from the light source to the electronic device determined by the ranging sensor comprises:
acquiring the distance from the light source to the electronic equipment fixing mechanism measured by the distance measuring sensor;
and determining the distance from the light source to the electronic equipment according to the distance from the light source to the electronic equipment fixing mechanism and the thickness of the electronic equipment, which are measured by the ranging sensor.
11. The method of claim 7, wherein the step of adjusting the brightness of the light source to achieve the predetermined test brightness measured by the standard electronic device comprises:
calculating the difference value between the brightness of the light source measured by the standard electronic equipment and the preset test brightness according to the brightness of the light source measured by the standard electronic equipment to obtain preset compensation brightness;
the preset compensation brightness is stored in association with the model of the electronic equipment, so that when the electronic equipment of the model is tested again, the electronic equipment testing device adjusts the light source according to the preset testing brightness and the preset compensation brightness;
and adjusting the brightness change of the light source to preset compensation brightness so that the brightness measured by the standard electronic equipment reaches preset test brightness.
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| CN107818753A (en) * | 2017-11-22 | 2018-03-20 | 广东欧珀移动通信有限公司 | Screen brightness regulation method, device, storage medium and electronic equipment |
| CN108775958B (en) * | 2018-05-29 | 2020-12-29 | Oppo（重庆）智能科技有限公司 | Brightness measuring and calibrating method and device based on light sensor and electronic equipment |
| CN109059987A (en) * | 2018-07-02 | 2018-12-21 | Oppo（重庆）智能科技有限公司 | A kind of method, device and mobile terminal for calibrating optical sensor |
| CN109297587B (en) * | 2018-09-11 | 2020-12-04 | Oppo广东移动通信有限公司 | Calibration method and device for optical sensor |
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| CN101295084A (en) * | 2007-04-25 | 2008-10-29 | 北京京东方光电科技有限公司 | Back light source brightness automatic regulating system and method |
| TW200938972A (en) * | 2008-03-14 | 2009-09-16 | Ind Tech Res Inst | Device and method for providing dynamic light standard |
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