CN111198302B - Method, device and system for testing dielectric property of material - Google Patents
Method, device and system for testing dielectric property of material Download PDFInfo
- Publication number
- CN111198302B CN111198302B CN202010091383.3A CN202010091383A CN111198302B CN 111198302 B CN111198302 B CN 111198302B CN 202010091383 A CN202010091383 A CN 202010091383A CN 111198302 B CN111198302 B CN 111198302B
- Authority
- CN
- China
- Prior art keywords
- adjustable
- testing
- electromagnetic coil
- adjustable electromagnetic
- ring
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
- G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
- G01R27/2617—Measuring dielectric properties, e.g. constants
- G01R27/2623—Measuring-systems or electronic circuits
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
- G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
- G01R27/2617—Measuring dielectric properties, e.g. constants
- G01R27/2635—Sample holders, electrodes or excitation arrangements, e.g. sensors or measuring cells
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measurement Of Resistance Or Impedance (AREA)
Abstract
The invention discloses a method, a device and a system for testing dielectric properties of a material. The test method comprises the following steps: sending electromagnetic waves to the open type resonant cavity through the first coupling waveguide ring, and acquiring the electromagnetic waves received by the second coupling waveguide ring from the open type resonant cavity, wherein the electromagnetic waves enter the open type resonant cavity through the first coupling waveguide ring, pass through the first adjustable electromagnetic ring to reach the surface of a sample to be tested, are subjected to coherent scattering with a material to be tested, and then pass through the second adjustable electromagnetic ring which is symmetrically arranged to reach the second coupling waveguide ring which is symmetrically arranged; the aperture and/or position of the first and second adjustable electromagnetic coils is adjusted during propagation of the electromagnetic wave within the open resonator. The invention solves the technical problem that the method for testing the performance of the dielectric material under the high-frequency condition has various defects.
Description
Technical Field
The invention relates to the field of material testing, in particular to a method, a device and a system for testing dielectric property of a material.
Background
The method for testing the performance of the dielectric material mainly comprises a network parameter method and a resonant cavity method, and compared with the network parameter method, the network parameter method is suitable for testing the material with higher dielectric loss, and the material with lower dielectric loss is usually tested by adopting the resonant cavity method. The resonant cavity method generally comprises a high-Q cavity method, a resonant cavity perturbation method, a dielectric resonant cavity method, an open resonant cavity method and the like, wherein the open resonant cavity method is suitable for dielectric property test of dielectric materials in a millimeter wave frequency band and a terahertz frequency band. There are three common open resonator structures: a double flat cavity structure, a flat cavity structure, and a pair cavity structure. For the electromagnetic frequency band above 40GHz, the cavity structure (two concave mirrors are oppositely arranged) such as a confocal open resonant cavity can realize the detection of the dielectric property of the sheet material.
The dielectric behavior of a material is mainly a polarization phenomenon generated by the material under the influence of an electric field, and further influences the electric field, so that the properties of the dielectric constant and the loss factor of the material under a high-frequency condition are particularly important for the application of electronic components.
For the property testing Method of dielectric constant and loss factor of the material under the high frequency condition, the prior document "Millimeter-Wave Measurement of Complex permission by Perturbation Method Using Open reactor, 2008, IEEE" proposes a device and Method for testing the dielectric property of the material by Open Resonator Perturbation Method, but this Method is only suitable for the thickness of the sample being less than 200um, the resolution of the tested material is low and the measuring speed is very slow, which is not good for the rapid detection of the sample.
In addition, patent CN 102707155B provides a device for testing complex dielectric constant of dielectric material in quasi-optical cavity, which increases the coaxial coupling optical ring and places the coaxial waveguide on the concave mirror respectively to improve the detection resolution of the material, but such a device still suffers from the influence of the high frequency mode on the main mode peak during the use process, thereby reducing the testing precision of the material, and needs to test repeatedly to capture the best diffraction peak of electromagnetic wave in practical use.
Aiming at the technical problems of various defects existing in the method for testing the performance of the dielectric material under the high-frequency condition, no effective solution is provided at present.
Disclosure of Invention
The embodiment of the invention provides a method, a device and a system for testing the dielectric property of a material, which at least solve the technical problem that the method for testing the dielectric property of the material under the high-frequency condition has various defects.
According to an aspect of an embodiment of the present invention, there is provided a method for testing dielectric properties of a material, including: the test method comprises the following steps: sending an electromagnetic wave to an open type resonant cavity through a first coupling waveguide ring, and acquiring an electromagnetic wave received by a second coupling waveguide ring from the open type resonant cavity, wherein the electromagnetic wave enters the open type resonant cavity through the first coupling waveguide ring, passes through a first adjustable electromagnetic ring to reach the surface of a sample to be tested, generates coherent scattering with the material to be tested, and then passes through a second adjustable electromagnetic ring which is symmetrically arranged to reach the second coupling waveguide ring which is symmetrically arranged; adjusting the aperture and/or position of the first and second adjustable solenoids during propagation of the electromagnetic wave within the open resonator.
Optionally, adjusting the aperture and/or position of the first and second adjustable electromagnetic coils comprises: and adjusting the aperture and/or the position of the first adjustable electromagnetic coil and the second adjustable electromagnetic coil based on the electromagnetic wave received by the second coupling waveguide ring from the open resonant cavity.
Optionally, adjusting the aperture and/or the position of the first and second adjustable electromagnetic coils based on the electromagnetic wave received by the second coupled waveguide ring from the open resonant cavity comprises: determining a main mode load quality factor under a target resonant frequency based on the electromagnetic wave received by the second coupling waveguide ring from the open resonant cavity; adjusting the aperture and/or position of the first and second adjustable solenoids based on the primary mode load figure of merit.
Optionally, adjusting the aperture and/or the position of the first and second adjustable electromagnetic coils based on the primary mode load quality factor comprises: when the main mode load quality factor at the target resonance frequency is smaller than a critical value, increasing the aperture of the first adjustable electromagnetic coil and the second adjustable electromagnetic coil, and/or controlling the first adjustable electromagnetic coil and the second adjustable electromagnetic coil to move towards the direction of the sample to be tested; and when the main mode load quality factor at the target resonance frequency is larger than a critical value, reducing the aperture of the first adjustable electromagnetic coil and the second adjustable electromagnetic coil, and/or controlling the first adjustable electromagnetic coil and the second adjustable electromagnetic coil to move towards the direction away from the sample to be tested.
Optionally, the testing method further comprises: adjusting the aperture and/or position of the first and second adjustable solenoids based on the primary mode load quality factor until the primary mode load quality factor at the target resonant frequency is equal to a critical value.
According to another aspect of the embodiments of the present invention, there is also provided a device for testing dielectric properties of a material, the device including an open resonant cavity, a coaxial coupling waveguide ring set, and an adjustable electromagnetic coil set; the open type resonant cavity consists of a first concave mirror and a second concave mirror which are oppositely arranged, and the coaxial coupling waveguide ring group comprises a first coupling waveguide ring which penetrates through the center of the concave surface of the first concave mirror and a second coupling waveguide ring which penetrates through the center of the concave surface of the second concave mirror; the adjustable electromagnetic coil group comprises a first adjustable electromagnetic coil positioned between the first concave mirror and a sample to be tested and a second adjustable electromagnetic coil positioned between the second concave mirror and the sample to be tested; the first coupling waveguide ring, the second coupling waveguide ring, the first adjustable electromagnetic ring and the second adjustable electromagnetic ring are coaxially arranged, and the hole diameter and/or the position of the first adjustable electromagnetic ring and the hole diameter and/or the position of the second adjustable electromagnetic ring are adjustable.
Optionally, the material of the adjustable electromagnetic coil does not have electromagnetic shielding property and does not absorb electromagnetic waves.
Optionally, the aperture of the adjustable electromagnetic ring is variable and is formed by mutually overlapping a plurality of blades.
Optionally, the position of the adjustable solenoid is adjusted along the axis of the solenoid.
Optionally, the testing device further comprises a movement stabilizing shaft and a movement motor, wherein the movement stabilizing shaft is arranged parallel to the axis of the electromagnetic coil and used for installing the adjustable electromagnetic coil, and the movement motor is connected with the adjustable electromagnetic coil and used for driving the adjustable electromagnetic coil to move along the movement stabilizing shaft.
According to another aspect of the embodiments of the present invention, there is also provided a system for testing dielectric properties of a material, the system comprising a testing method and a testing device for executing the testing method, wherein the testing method is the testing method for dielectric properties of a material according to any item above, and the testing device is a testing device for dielectric properties of a material according to any item above.
According to another aspect of the embodiments of the present invention, there is also provided a storage medium, the storage medium including a stored program, wherein when the program runs, a device on which the storage medium is located is controlled to execute the method for testing the dielectric property of the material according to any item above.
According to another aspect of the embodiments of the present invention, there is also provided a processor, wherein the processor is configured to execute a program, wherein the program is executed to execute the method for testing the dielectric property of the material according to any item above.
According to the method, a pair of adjustable electromagnetic coils is additionally arranged in a conventional open type righting cavity, the interference of an n lambda/2 high-frequency mode on a main mode is inhibited by adjusting the aperture and/or the position, and the accuracy of the material dielectric property test is improved; further, the technical problems of various defects existing in the method for testing the performance of the dielectric material under the high-frequency condition are solved, such as: the existing method can not solve the problem of influence of the high-frequency electromagnetic mode on the main mode generally, and the method for solving the influence of the high-frequency electromagnetic mode on the main mode has various condition limitations.
Drawings
The accompanying drawings, which are included to provide a further understanding of the invention and are incorporated in and constitute a part of this application, illustrate embodiment(s) of the invention and together with the description serve to explain the invention without limiting the invention. In the drawings:
FIG. 1 is a schematic illustration of a method of testing dielectric properties of a material according to an embodiment of the present invention;
FIG. 2 is a schematic view of a device for testing dielectric properties of a material according to an embodiment of the present invention;
FIG. 3 is a first schematic diagram of an adjustable electromagnetic coil in accordance with an embodiment of the present invention;
FIG. 4 is a second schematic diagram of an adjustable electromagnetic coil, in accordance with an embodiment of the present invention;
wherein the figures include the following reference numerals:
1. a first coupled waveguide ring; 2. a second coupled waveguide ring; 3. a first concave mirror; 4. a second concave mirror; 5. a sample to be tested; 6. a first adjustable electromagnetic coil; 7. a second adjustable electromagnetic coil; 8. a movement motor; 9. the stabilizing shaft is moved.
Detailed Description
In order to make the technical solutions of the present invention better understood, the technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
It should be noted that the terms "first," "second," and the like in the description and claims of the present invention and in the drawings described above are used for distinguishing between similar elements and not necessarily for describing a particular sequential or chronological order. It is to be understood that the data so used is interchangeable under appropriate circumstances such that the embodiments of the invention described herein are capable of operation in sequences other than those illustrated or described herein. Furthermore, the terms "comprises," "comprising," and "having," and any variations thereof, are intended to cover a non-exclusive inclusion, such that a process, method, system, article, or apparatus that comprises a list of steps or elements is not necessarily limited to those steps or elements expressly listed, but may include other steps or elements not expressly listed or inherent to such process, method, article, or apparatus.
In accordance with an embodiment of the present invention, there is provided an embodiment of a method for testing dielectric properties of a material, it being noted that the steps illustrated in the flowchart of the drawings may be performed in a computer system, such as a set of computer-executable instructions, and that while a logical order is illustrated in the flowchart, in some cases the steps illustrated or described may be performed in an order different than here.
FIG. 1 is a method of testing dielectric properties of a material according to an embodiment of the present invention, as shown in FIG. 1, the method comprising the steps of:
step S102, sending electromagnetic waves to the open type resonant cavity through the first coupling waveguide ring, and obtaining the electromagnetic waves received by the second coupling waveguide ring from the open type resonant cavity.
Step S104, in the process that the electromagnetic wave propagates in the open resonant cavity, the aperture and/or the position of the first adjustable electromagnetic coil and the second adjustable electromagnetic coil are/is adjusted.
It should be noted that: after entering the open resonant cavity through the first coupling waveguide ring, the electromagnetic wave passes through the first adjustable electromagnetic ring to reach the surface of a sample to be tested, generates coherent scattering with a material to be tested, and then passes through the second adjustable electromagnetic ring which is symmetrically arranged to reach the second coupling waveguide ring which is symmetrically arranged.
The position layouts of the open resonant cavity, the first coupled waveguide ring, the first adjustable electromagnetic coil, the sample to be tested, the second adjustable electromagnetic coil and the second coupled waveguide ring are shown in fig. 2.
That is, the pair of adjustable electromagnetic coils is added in the conventional open type thank exise cavity, the interference of the n lambda/2 high-frequency mode on the main mode is inhibited by adjusting the aperture and/or the position, and the accuracy of the dielectric property test of the material is improved; further, the technical problems of various defects existing in the method for testing the performance of the dielectric material under the high-frequency condition are solved, such as: the existing method can not solve the problem of influence of the high-frequency electromagnetic mode on the main mode generally, and the method for solving the influence of the high-frequency electromagnetic mode on the main mode has various condition limitations.
In an optional example, adjusting the aperture and/or position of the first and second adjustable electromagnetic coils comprises: and adjusting the aperture and/or the position of the first adjustable electromagnetic coil and the second adjustable electromagnetic coil based on the electromagnetic wave received by the second coupling waveguide ring from the open resonant cavity.
Further, adjusting the aperture and/or position of the first and second adjustable electromagnetic coils based on the electromagnetic wave received by the second coupled waveguide ring from the open resonant cavity includes: determining a main mode load quality factor under a target resonant frequency based on the electromagnetic wave received by the second coupling waveguide ring from the open resonant cavity; adjusting the aperture and/or position of the first and second adjustable solenoids based on the primary mode load figure of merit.
It should be noted that: the target resonant frequency is the resonant frequency of the electromagnetic wave received by the open resonant cavity; the main mode has a quality factor of the material received by the open resonator when the material resonates at a target resonant frequency, which can indicate the magnitude of the resonant frequency of the electromagnetic wave with respect to the bandwidth.
Preferably, adjusting the aperture and/or the position of the first adjustable electromagnetic coil and the second adjustable electromagnetic coil based on the principal mode load quality factor may be implemented by any one of the following manners: increasing the apertures of the first and second adjustable solenoids when the principal mode load quality factor at the target resonant frequency is less than a critical value; when the main mode load quality factor under the target resonant frequency is smaller than a critical value, controlling the first adjustable electromagnetic coil and the second adjustable electromagnetic coil to move towards the direction of the sample to be tested; and when the main mode load quality factor under the target resonant frequency is smaller than a critical value, increasing the apertures of the first adjustable electromagnetic coil and the second adjustable electromagnetic coil, and controlling the first adjustable electromagnetic coil and the second adjustable electromagnetic coil to move towards the sample to be tested.
Preferably, adjusting the aperture and/or the position of the first adjustable electromagnetic coil and the second adjustable electromagnetic coil based on the principal mode load quality factor may be implemented by any one of the following manners: when the main mode load quality factor under the target resonant frequency is larger than a critical value, reducing the aperture of the first adjustable electromagnetic coil and the second adjustable electromagnetic coil; when the main mode load quality factor under the target resonant frequency is larger than a critical value, controlling the first adjustable electromagnetic coil and the second adjustable electromagnetic coil to move towards the direction departing from the sample to be tested; when the main mode load quality factor under the target resonance frequency is larger than a critical value, the aperture of the first adjustable electromagnetic ring and the second adjustable electromagnetic ring is reduced, and the first adjustable electromagnetic ring and the second adjustable electromagnetic ring are controlled to move towards the direction away from the sample to be tested.
It should be noted that: the position of the first adjustable electromagnetic coil and the position of the second adjustable electromagnetic coil are symmetrically arranged relative to a sample to be tested, namely, the position of the electromagnetic coil of the first adjustable electromagnetic coil and the position of the electromagnetic coil of the second adjustable electromagnetic coil are synchronously and symmetrically adjusted; the aperture of the first adjustable electromagnetic ring is the same as that of the second adjustable electromagnetic ring, namely, the apertures of the first adjustable electromagnetic ring and the second adjustable electromagnetic ring are synchronously adjusted.
Further, the test method further comprises: adjusting the apertures and/or positions of the first and second adjustable solenoids based on the primary mode load quality factor until the primary mode load quality factor at the target resonant frequency is equal to a critical value. That is, during the testing of the dielectric properties of the material, the aperture and/or the solenoid position may be continuously adjusted based on the principal mode load figure of merit until the optimum principal mode load figure of merit is reached.
That is, this application realizes the automatic control to the electromagnetic wave energy in the open resonant cavity through adjustable electromagnetic ring and the fundamental mode that feeds back in the test procedure has the quality factor, reaches efficient accurate test.
The embodiment of the present application further provides a device for testing dielectric properties of a material, and it should be noted that the device for testing dielectric properties of a material of the embodiment of the present application can be used for executing the method for testing dielectric properties of a material provided by the embodiment of the present application. The following describes a device for testing dielectric properties of a material provided in an embodiment of the present application.
FIG. 2 is a schematic view of a device for testing dielectric properties of a material according to an embodiment of the present application. As shown in fig. 2, the testing apparatus includes an open resonant cavity, a coaxial coupling waveguide ring set and an adjustable electromagnetic coil set, wherein the open resonant cavity is composed of a first concave mirror and a second concave mirror which are oppositely disposed, and the coaxial coupling waveguide ring set includes a first coupling waveguide ring which is arranged through the center of the concave surface of the first concave mirror and a second coupling waveguide ring which is arranged through the center of the concave surface of the second concave mirror; the adjustable electromagnetic coil group comprises a first adjustable electromagnetic coil positioned between the first concave mirror and a sample to be tested and a second adjustable electromagnetic coil positioned between the second concave mirror and the sample to be tested.
It should be noted that: the first coupling waveguide ring, the second coupling waveguide ring, the first adjustable electromagnetic ring and the second adjustable electromagnetic ring are coaxially arranged, the aperture and/or the position of the first adjustable electromagnetic ring and the second adjustable electromagnetic ring are adjustable, and the first adjustable electromagnetic ring and the second adjustable electromagnetic ring are shown in fig. 3.
In an alternative example, the material of the adjustable electromagnetic coil does not have electromagnetic shielding property and does not absorb electromagnetic waves, for example: metallic materials, electromagnetic absorbing structural materials, and the like.
In an alternative example, the adjustable electromagnetic ring has a variable aperture and is formed by overlapping a plurality of blades, wherein the aperture of the adjustable electromagnetic ring is adjusted in the same manner as the variable aperture of the diaphragm.
It should be noted that: the adjustable electromagnetic ring can be a multi-pole variable-speed adjusting electromagnetic ring, and the blade superposition mode of the multi-pole variable-speed adjusting electromagnetic ring is specifically shown in fig. 4.
In an alternative example, the position of the adjustable solenoid is adjusted in the direction of the solenoid axis. For example: through setting up the movement stabilization axle and moving the motor, wherein, the movement stabilization axle is on a parallel with the setting of electromagnetic coil axis for the installation adjustable electromagnetic coil, moving the motor and connecting adjustable electromagnetic coil is used for the drive adjustable electromagnetic coil is followed the movement stabilization axle removes.
It should be noted that: the precision of the moving motor is extremely high.
In addition, the testing device also comprises a testing sample rack for placing the sample to be tested.
In addition, the concave mirror is formed by polishing a metal material; that is, the first concave mirror and the second concave mirror are made of metal, and the mirror surfaces of the first concave mirror and the second concave mirror are manufactured by polishing the metal surfaces.
Finally, in order to make the technical solutions of the present application more clearly understood by those skilled in the art, the following description will be given with reference to specific embodiments.
As shown in fig. 2, when the open resonant cavity works, the network analyzer emits an electromagnetic wave, and the electromagnetic wave enters the open resonant cavity through the first coaxial transmission line and the first coupling waveguide ring, wherein the electromagnetic wave presents gaussian beam distribution after entering the open resonant cavity, that is, the light fluxes intercepted by any plane inside the cavity are equal; then, the electromagnetic wave passes through a first adjustable electromagnetic coil inside the open type resonant cavity to reach the surface of a sample to be tested; then, after coherent scattering occurs between the electromagnetic wave and the material to be tested, the electromagnetic wave passes through a second adjustable electromagnetic coil which is symmetrically arranged and reaches a second coupling waveguide ring; the electromagnetic wave is then transmitted back to the network analyzer via another segment of the coaxial line. At this time, the tested sample is tested by using the network analyzer and the automatic detection control software.
The aperture and position of the electromagnetic coil can be adjusted in the process that the electromagnetic wave passes through the first adjustable electromagnetic coil and the second adjustable electromagnetic coil. For example, the first adjustable electromagnetic coil and the second adjustable electromagnetic coil can be powered by a moving motor to move back and forth along a moving stabilizing shaft; and the first and second adjustable solenoids may be adjustable in aperture as shown in figure 4.
The specific adjustment principle is as follows: the quality factor of the main mode load at the resonance frequency is changed according to the strength of the main mode load quality factor received by the network analyzer. For example: when the main mode load quality factor under the resonance frequency is smaller than a critical value, the adjustable electromagnetic coil automatically increases the electromagnetic wave hole and moves towards the sample direction so as to adjust the main mode load quality factor Qs; when the primary mode load quality factor at the resonant frequency is greater than a critical value, the adjustable electromagnet is adjusted slightly away from the sample to find the optimal primary mode load quality factor Qs.
To sum up, the application provides an automatic testing arrangement of high accuracy dielectric material performance based on open resonant cavity, and the key feature lies in that increases a pair of adjustable electromagnetic coil in conventional open resonant cavity inside, and the aperture and the position of electromagnetic coil can be according to the automatic regulation of the on-load quality factor Qs that network analyzer detected. At the moment, the interference of the n lambda/2 high-frequency mode on the main mode can be inhibited by adjusting the aperture and the position of the electromagnetic coil, and the precision of the dielectric property test of the material is improved; meanwhile, the aperture position of the electromagnetic ring is adjusted by adopting a mobile motor with extremely high precision and the electromagnetic ring with multi-pole variable speed adjustment, so that the detection speed and the resolution of a test material can be greatly improved.
The embodiment of the invention provides a system for testing the dielectric property of a material, which comprises a testing method and a testing device for executing the testing method, wherein the testing method is the testing method for the dielectric property of any medium material described above, and the testing device is the testing device for the dielectric property of any medium material described above.
Embodiments of the present invention provide a storage medium having stored thereon a program that, when executed by a processor, implements a method of testing dielectric properties of a material.
The embodiment of the invention provides a processor, which is used for running a program, wherein the program is run to execute a method for testing the dielectric property of the material.
In the above embodiments of the present invention, the description of each embodiment has its own emphasis, and reference may be made to the related description of other embodiments for parts that are not described in detail in a certain embodiment.
In the embodiments provided in the present application, it should be understood that the disclosed technology can be implemented in other ways. The above-described embodiments of the apparatus are merely illustrative, and for example, the division of the units may be a logical division, and in actual implementation, there may be another division, for example, multiple units or components may be combined or integrated into another system, or some features may be omitted, or not executed. In addition, the shown or discussed mutual coupling or direct coupling or communication connection may be an indirect coupling or communication connection through some interfaces, units or modules, and may be in an electrical or other form.
The units described as separate parts may or may not be physically separate, and parts displayed as units may or may not be physical units, may be located in one place, or may be distributed on a plurality of units. Some or all of the units can be selected according to actual needs to achieve the purpose of the solution of the embodiment.
In addition, functional units in the embodiments of the present invention may be integrated into one processing unit, or each unit may exist alone physically, or two or more units are integrated into one unit. The integrated unit can be realized in a form of hardware, and can also be realized in a form of a software functional unit.
The integrated unit, if implemented in the form of a software functional unit and sold or used as a stand-alone product, may be stored in a computer readable storage medium. Based on such understanding, the technical solution of the present invention may be embodied in the form of a software product, which is stored in a storage medium and includes instructions for causing a computer device (which may be a personal computer, a server, or a network device) to execute all or part of the steps of the method according to the embodiments of the present invention. And the aforementioned storage medium includes: a U-disk, a Read-Only Memory (ROM), a Random Access Memory (RAM), a removable hard disk, a magnetic or optical disk, and other various media capable of storing program codes.
The foregoing is only a preferred embodiment of the present invention, and it should be noted that, for those skilled in the art, various modifications and decorations can be made without departing from the principle of the present invention, and these modifications and decorations should also be regarded as the protection scope of the present invention.
Claims (9)
1. A method for testing dielectric properties of a material, the method comprising:
sending electromagnetic waves to an open resonant cavity through a first coupling waveguide ring (1), and acquiring electromagnetic waves received by a second coupling waveguide ring (2) from the open resonant cavity, wherein the electromagnetic waves enter the open resonant cavity through the first coupling waveguide ring (1), pass through a first adjustable electromagnetic ring (6) to reach the surface of a sample to be tested (5), are subjected to coherent scattering with a material to be tested, and then pass through a second adjustable electromagnetic ring (7) which is symmetrically arranged to reach the second coupling waveguide ring (2);
adjusting the aperture and/or position of the first and second adjustable electromagnetic coils (6, 7) during propagation of the electromagnetic wave within the open resonator;
adjusting the aperture and/or position of the first and second adjustable electromagnetic coils (6, 7) based on the electromagnetic wave received by the second coupled waveguide ring (2) from the open resonator cavity, comprising: determining a main mode load quality factor under a target resonant frequency based on the electromagnetic wave received by the second coupling waveguide ring (2) from the open resonant cavity; adjusting the aperture and/or position of the first and second adjustable electromagnetic coils (6, 7) based on the primary mode load figure of merit;
adjusting the aperture and/or position of the first and second adjustable electromagnetic coils (6, 7) based on the primary mode load figure of merit, comprising: when the main mode load quality factor at the target resonance frequency is smaller than a critical value, increasing the aperture of the first adjustable electromagnetic coil (6) and the second adjustable electromagnetic coil (7), and/or controlling the first adjustable electromagnetic coil (6) and the second adjustable electromagnetic coil (7) to move towards the sample (5) to be tested; when the main mode load quality factor at the target resonance frequency is larger than a critical value, the aperture of the first adjustable electromagnetic coil (6) and the second adjustable electromagnetic coil (7) is reduced, and/or the first adjustable electromagnetic coil (6) and the second adjustable electromagnetic coil (7) are controlled to move in the direction away from the sample (5) to be tested.
2. The method of testing the dielectric properties of a material of claim 1, further comprising: adjusting the aperture and/or position of the first and second adjustable solenoids (6, 7) based on the primary mode load quality factor until the primary mode load quality factor at the target resonant frequency equals a critical value.
3. The device for testing the dielectric property of the material is characterized by comprising an open resonant cavity, a coaxial coupling waveguide ring set and an adjustable electromagnetic ring set; the open type resonant cavity consists of a first concave mirror (3) and a second concave mirror (4) which are arranged oppositely, and the coaxial coupling waveguide ring set comprises a first coupling waveguide ring (1) which penetrates through the center of the concave surface of the first concave mirror (3) and a second coupling waveguide ring (2) which penetrates through the center of the concave surface of the second concave mirror (4); the adjustable electromagnetic coil group comprises a first adjustable electromagnetic coil (6) positioned between the first concave mirror (3) and a sample (5) to be tested and a second adjustable electromagnetic coil (7) positioned between the second concave mirror (4) and the sample (5) to be tested;
the first coupling waveguide ring (1), the second coupling waveguide ring (2), the first adjustable electromagnetic coil (6) and the second adjustable electromagnetic coil (7) are coaxially arranged, and the hole diameters and/or positions of the first adjustable electromagnetic coil (6) and the second adjustable electromagnetic coil (7) are/is adjustable;
the aperture of the adjustable electromagnetic ring is variable and is formed by mutually overlapping a plurality of blades.
4. The device for testing the dielectric property of a material according to claim 3, wherein the material of the adjustable electromagnetic coil has no electromagnetic shielding property and does not absorb electromagnetic waves.
5. A device for testing the dielectric properties of a material according to claim 3 wherein the position of the adjustable solenoid is adjusted along the axis of the solenoid.
6. The testing device of the dielectric properties of materials according to claim 5, characterized in that the testing device further comprises a movement stabilizing shaft (9) and a movement motor (8), wherein the movement stabilizing shaft (9) is arranged parallel to the solenoid axis for mounting the adjustable solenoid, and the movement motor (8) is connected to the adjustable solenoid for driving the adjustable solenoid to move along the movement stabilizing shaft (9).
7. A system for testing the dielectric properties of a material, the system comprising a testing method and a testing device for performing the testing method, wherein the testing method is a testing method for the dielectric properties of a material according to any one of claims 1 to 2, and the testing device is a testing device for the dielectric properties of a material according to any one of claims 3 to 6.
8. A storage medium comprising a stored program, wherein the program, when executed, controls a device on which the storage medium is located to perform a method of testing a dielectric property of a material according to any one of claims 1 to 2.
9. A processor configured to run a program, wherein the program when executed performs a method of testing the dielectric properties of a material according to any one of claims 1 to 2.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202010091383.3A CN111198302B (en) | 2020-02-13 | 2020-02-13 | Method, device and system for testing dielectric property of material |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202010091383.3A CN111198302B (en) | 2020-02-13 | 2020-02-13 | Method, device and system for testing dielectric property of material |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN111198302A CN111198302A (en) | 2020-05-26 |
| CN111198302B true CN111198302B (en) | 2022-06-07 |
Family
ID=70744906
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202010091383.3A Active CN111198302B (en) | 2020-02-13 | 2020-02-13 | Method, device and system for testing dielectric property of material |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN111198302B (en) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111697303B (en) * | 2020-06-05 | 2022-02-08 | 山东国瓷功能材料股份有限公司 | Adjusting method and adjusting device for coupling waveguide ring of resonant cavity and resonant cavity |
| CN113092872B (en) * | 2021-03-29 | 2022-03-08 | 北京航空航天大学 | Tunable coaxial resonant cavity for measuring dielectric constant |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4533249A (en) * | 1982-09-30 | 1985-08-06 | Honeywell Inc. | Passive ring resonator angular rate sensor |
| WO2002082140A1 (en) * | 2001-04-04 | 2002-10-17 | Galayor Inc. | Optical microring resonator, optical multiplexer and optical switching apparatus using deformable waveguide segments |
| WO2002101421A2 (en) * | 2001-06-01 | 2002-12-19 | Galayor Inc. | Optomechanical tunable ring resonator |
| CN104237648A (en) * | 2013-06-24 | 2014-12-24 | 电子科技大学 | Novel method for testing microwave complex permittivity of high-loss liquid and powder materials |
| CN109613632A (en) * | 2018-12-03 | 2019-04-12 | 东南大学 | Tunable cavity and preparation method thereof based on flexible surface phasmon coupler |
Family Cites Families (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN202661552U (en) * | 2012-06-04 | 2013-01-09 | 电子科技大学 | Dielectric materials complex permittivity testing device based on quasi-optics resonant cavity |
| KR101724333B1 (en) * | 2016-02-15 | 2017-04-07 | 국방과학연구소 | System and method for measuring dielectric properties of materials by using fabry-perot resonance |
| CN107091847B (en) * | 2017-06-01 | 2023-11-07 | 厦门大学 | Device and method for measuring electromagnetic parameters of dielectric material |
| CN110416681B (en) * | 2019-08-01 | 2021-02-26 | 电子科技大学 | Broadband adaptive adjusting device and method for resonant cavity coupling quantity |
-
2020
- 2020-02-13 CN CN202010091383.3A patent/CN111198302B/en active Active
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4533249A (en) * | 1982-09-30 | 1985-08-06 | Honeywell Inc. | Passive ring resonator angular rate sensor |
| WO2002082140A1 (en) * | 2001-04-04 | 2002-10-17 | Galayor Inc. | Optical microring resonator, optical multiplexer and optical switching apparatus using deformable waveguide segments |
| WO2002101421A2 (en) * | 2001-06-01 | 2002-12-19 | Galayor Inc. | Optomechanical tunable ring resonator |
| CN104237648A (en) * | 2013-06-24 | 2014-12-24 | 电子科技大学 | Novel method for testing microwave complex permittivity of high-loss liquid and powder materials |
| CN109613632A (en) * | 2018-12-03 | 2019-04-12 | 东南大学 | Tunable cavity and preparation method thereof based on flexible surface phasmon coupler |
Non-Patent Citations (2)
| Title |
|---|
| One-Way Rotating Photonic Crystal Ring Resonator With High Quality Factor;Qiuyue Zhang; Xun Li;《IEEE Photonics Journal》;20180518;第10卷(第3期);1-11 * |
| 光学微环谐振腔的研究与应用;李晓慧;《中国优秀博硕士学位论文全文数据库(硕士)信息科技辑》;20101015(第10期);I136-328 * |
Also Published As
| Publication number | Publication date |
|---|---|
| CN111198302A (en) | 2020-05-26 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN111198302B (en) | Method, device and system for testing dielectric property of material | |
| Amano et al. | A method of effective use of ferrite for microwave absorber | |
| CN111239498B (en) | Device and method for testing dielectric property of material | |
| CN111487470B (en) | Device and method for testing dielectric property of material | |
| US10151783B2 (en) | Antenna measuring station | |
| KR20070101093A (en) | System and method for measurement of antenna radiation pattern in fresnel region | |
| CN110416681B (en) | Broadband adaptive adjusting device and method for resonant cavity coupling quantity | |
| Sharma et al. | Compact dual‐band ring dielectric resonator antenna with moon‐shaped defected ground structure for W i MAX/WLAN applications | |
| Zhao et al. | Resistance‐loaded miniaturized dual‐layer Vivaldi antenna for plasma reflection diagnosis | |
| Qi et al. | Wideband high gain differential Vivaldi antenna design based on exponential spoof surface plasmon polaritons metamaterial | |
| Gangwar et al. | Reduction of mutual coupling in metamaterial based microstrip antennas: The progress in last decade | |
| JP6684323B2 (en) | Planar antenna device, wireless terminal measuring device including the same, and wireless terminal measuring method | |
| Kasar et al. | Realization of reconfigurable filtering horn antennas using active frequency selective surfaces for GSM and LTE signal filtering | |
| Vohra et al. | Free-space characterization of radar absorbing non-magnetic materials in the W-band | |
| Joseph et al. | An improved method to determine the antenna factor | |
| CN113567750A (en) | System and method for automatically testing broadband of quasi-optical cavity | |
| Kato et al. | Comparison of free‐space VNA and TDS measurements using transmission‐type frequency selective surfaces | |
| Chung et al. | A non-invasive metamaterial characterization system using synthetic Gaussian aperture | |
| Xu et al. | Low RCS Antenna Loaded by Artificial Magnetic Conductor based on Characteristic Mode Analysis | |
| Yang et al. | A simple filtering patch antenna based on stub‐loaded resonator | |
| Wong et al. | A THz near-field scanning system for antenna measurement | |
| Chernobrovkin et al. | A novel V‐band antenna for nondestructive testing techniques | |
| US20240168071A1 (en) | Dielectric characteristic measurement method and dielectric characteristic measurement system using open resonator | |
| Ma et al. | High-Efficiency Diagnosis of Antenna Radiation Characteristics Based on Scanning Optic-Induced Plasma Scattering Technology | |
| CN116073101A (en) | Microwave antenna |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |