CN111182240A - Temperature drift self-compensation method for image sensor - Google Patents
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- CN111182240A CN111182240A CN201911338962.7A CN201911338962A CN111182240A CN 111182240 A CN111182240 A CN 111182240A CN 201911338962 A CN201911338962 A CN 201911338962A CN 111182240 A CN111182240 A CN 111182240A
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Abstract
The invention discloses a temperature drift self-compensation method of an image sensor, which solves the problem of distortion of an output pixel value of the image sensor caused by higher ambient temperature by the linearization processing of an acquired image and real-time temperature pixel drift compensation, enables the image sensor to normally work in a high-temperature narrow space for a long time and improves the environmental applicability of the image sensor. The invention has scientific principle, automatic operation and higher efficiency, has universal applicability to any image sensor influenced by temperature and increases the application environment of the image sensor.
Description
Technical Field
The invention relates to the field of acquisition and processing of industrial cameras and image sensors, in particular to a temperature drift self-compensation method for an image sensor.
Background
The development of science and technology promotes the wide application of image sensors in daily life and industrial production, and compared with daily life, the industrial environment has severer use conditions. The industrial environment has a serious influence on the quality of images acquired by an image sensor due to limited space and high temperature and humidity. Image sensor temperature impact compensation becomes a key technology for ensuring image quality.
The traditional technology has the following technical problems:
the traditional physical temperature compensation method is to increase the heat dissipation surface of the operating equipment or increase physical measures such as ventilation and the like to cool so that the equipment normally operates at the working temperature. However, for an industrial environment with limited space and high ambient temperature, the traditional physical cooling method not only loses the original function, but also is possible to add extra heat to the running equipment.
Disclosure of Invention
The invention aims to provide a temperature drift self-compensation method for an image sensor. The method can compensate the influence of temperature on the pixels through algorithm processing, and further enhance the image quality on the premise of ensuring that the image does not lose the original information. The method automatically acquires the temperature drift self-compensation coefficient of the image sensor and compensates the pixel by matching the temperature drift self-compensation coefficient with the working temperature of the image sensor, and the pixel is compensated and then subjected to histogram enhancement to complete the temperature drift self-compensation of the image sensor, thereby ensuring that the quality of the acquired image is not influenced by the temperature.
In order to solve the above technical problem, the present invention provides a temperature drift self-compensation method for an image sensor, comprising:
in the case of no temperature influence, the output pixel of the image sensor is equal to the original pixel, in the case of temperature influence, the output pixel of the image sensor is formed by superposing the pixel value of the corresponding position of the image and the temperature drift value thereof, and if the pixel affected by the temperature is to be corrected, the pixel value of the output image of the image sensor is subtracted by the temperature drift value of the corresponding position, that is:
I(x，y)+T(x，y)＝P(x，y)(formula 1)
P(x，y)-T(x，y)＝O(x，y)(formula 2)
Wherein: i (x, y) is an original pixel under the condition that the (x, y) pixel point is not influenced by temperature, T (x, y) is a pixel temperature drift value of the (x, y) point which rises along with the rise of the temperature, P (x, y) is a CMOS output pixel value of the (x, y) point after the influence of the temperature, and O (x, y) is a processed pixel value of the (x, y) point;
the temperature drift self-compensation coefficient is the pixel rising average value of the original image under the influence of temperature, namely:
P(x，y)-Tc＝O(x，y)(formula 3)
Wherein: tc represents the pixel rising average value of the original image under the influence of temperature, namely a temperature drift self-compensation coefficient;
reading the calibrated temperature drift self-compensation coefficient, determining a corresponding temperature drift compensation coefficient value according to the working temperature of the current image sensor, and carrying out the operation of the formula 3 on the effective pixel value in the current frame; selecting the maximum value and the minimum value of the pixel dynamic range to carry out the formula 4 enhancement;
wherein g (x, y) represents the pixel value after mapping; MIN and MAX represent the minimum and maximum values of the pixel dynamic range.
In one embodiment, the image sensor is a CMOS.
In one embodiment, the image sensor is a CCD.
In one embodiment, the method for obtaining the operating temperature of the current image sensor and the corresponding temperature drift compensation coefficient value is as follows:
the image sensor is now placed in a dark environment; reading a temperature register value of an image sensor, simultaneously calculating a pixel rising average value of a current frame image as a temperature drift self-compensation coefficient of the current temperature, continuously rising the temperature of an industrial environment where the image sensor is located, and repeating the steps to obtain the pixel rising average value of the current frame image at different temperatures as the temperature drift self-compensation coefficient of the current temperature; and when the temperature is kept for the preset time, the temperature is considered to reach the upper limit, namely the temperature of the industrial environment where the image sensor is located is considered not to change, and the temperature drift compensation coefficients corresponding to different temperature values are stored.
In one embodiment, the predetermined time is 20 minutes.
In one embodiment, the method is automated.
In one embodiment, the method has general applicability to image sensors that are subject to temperature.
Based on the same inventive concept, the present application also provides a computer device comprising a memory, a processor and a computer program stored on the memory and executable on the processor, the processor implementing the steps of any of the methods when executing the program.
Based on the same inventive concept, the present application also provides a computer-readable storage medium, on which a computer program is stored, which, when being executed by a processor, carries out the steps of any of the methods.
Based on the same inventive concept, the present application further provides a processor for executing a program, wherein the program executes to perform any one of the methods.
The invention has the beneficial effects that:
the invention provides a temperature drift self-compensation method for an image sensor. Compared with physical cooling, the method enables the camera to be more suitable for industrial environments with limited space and higher temperature. The temperature drift self-compensation coefficient of the image sensor is automatically acquired and matched with the working temperature of the image sensor to compensate the pixel, and the pixel is subjected to histogram enhancement after compensation to complete the temperature drift self-compensation of the image sensor, so that the quality of the acquired image is not influenced by temperature.
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FIG. 1 is a flow chart of the temperature drift self-compensation method of the image sensor of the present invention.
Detailed Description
The present invention is further described below in conjunction with the following figures and specific examples so that those skilled in the art may better understand the present invention and practice it, but the examples are not intended to limit the present invention.
As shown in the flowchart of fig. 1, a method for self-compensating for temperature drift of an image sensor. The method automatically acquires the temperature drift self-compensation coefficient of the image sensor and compensates the pixel by matching the temperature drift self-compensation coefficient with the working temperature of the image sensor, and the pixel is compensated and then subjected to histogram stretching to complete the temperature drift self-compensation of the image sensor, thereby ensuring that the quality of the acquired image is not influenced by temperature.
An image sensor temperature drift self-compensation method comprises the following steps:
under the condition of no temperature influence, the CMOS output pixel is equal to the original pixel, under the condition of temperature influence, the CMOS output pixel is formed by superposing the pixel value of the corresponding position of the image and the temperature drift value of the image, and if the pixel affected by the temperature is corrected, the temperature drift value of the corresponding position is subtracted from the pixel value of the CMOS output image, namely:
I(x，y)+T(x，y)＝P(x，y)(formula 1)
P(x，y)-T(x，y)＝O(x，y)(formula 2)
Wherein: i (x, y) is an original pixel under the condition that the (x, y) pixel point is not influenced by temperature, T (x, y) is a pixel temperature drift value of the (x, y) point which rises along with the rise of the temperature, P (x, y) is a CMOS output pixel value of the (x, y) point which is influenced by the temperature, and O (x, y) is a processed pixel value of the (x, y) point.
The influence of the temperature on the sensing unit in each CMOS image sensor is different, but the influence can be considered to be the same because the manufacturing process is consistent, and the temperature drift self-compensation coefficient can be approximated to the pixel rising average value of the original image under the influence of the temperature, namely:
P(x，y)-Tc＝O(x，y)(formula 3)
Wherein: tc represents the pixel rise average value of the original image under the influence of temperature, namely the temperature drift self-compensation coefficient.
The system is divided into two states of self-compensation and temperature drift coefficient acquisition.
And when the system is powered on every time, the system defaults to enter a self-compensation state, the main control processor reads the calibrated temperature drift self-compensation coefficient from the external memory, determines the corresponding temperature drift compensation coefficient value according to the working temperature of the current image sensor, and performs the operation of the formula 3 on the effective pixel value in the current frame. The pixel dynamic range maximum and minimum are selected for enhancement of equation 4.
Wherein g (x, y) represents the pixel value after mapping; MIN and MAX represent the minimum and maximum values of the pixel dynamic range and are adjustable with the number of bits, since the pixel consists of an 8-bit binary, where the initial MAX is 255 dynamic maximum values and MIN is 0 dynamic minimum values.
And when the system receives the temperature drift coefficient acquisition command, the system enters a temperature drift coefficient acquisition state. The image sensor is now placed in a dark environment. The main control processor reads the temperature register value of the image sensor as a basis value of the temperature drift self-compensation method, simultaneously calculates the pixel rising average value of the current frame image as the temperature drift self-compensation coefficient of the current temperature, the temperature of the industrial environment where the image sensor is located continuously rises, and repeats the steps, namely the pixel rising average value of the current frame image at different temperatures is obtained as the temperature drift self-compensation coefficient of the current temperature. And when the temperature is kept for a preset time, for example, 20 minutes, the temperature is considered to reach the upper limit, namely the temperature of the industrial environment where the image sensor is located is considered not to change, and the temperature drift compensation coefficients corresponding to different temperature values are stored in the external memory to quit the temperature drift self-compensation coefficient acquisition state.
The above-mentioned embodiments are merely preferred embodiments for fully illustrating the present invention, and the scope of the present invention is not limited thereto. The equivalent substitution or change made by the technical personnel in the technical field on the basis of the invention is all within the protection scope of the invention. The protection scope of the invention is subject to the claims.
Claims (10)
1. An image sensor temperature drift self-compensation method is characterized by comprising the following steps:
under the condition of no temperature influence, the output pixel of the image sensor is equal to the original pixel, under the condition of temperature influence, the output pixel of the image sensor is formed by superposing the pixel value of the corresponding position of the image and the temperature drift value of the pixel value, and if the pixel affected by the temperature is corrected, the pixel value of the output image of the image sensor is subtracted by the temperature drift value of the corresponding position, namely.
I(x，y)+T(x，y)＝P(x，y)(formula 1)
P(x，y)-T(x，y)＝O(x，y)(formula 2)
Wherein: i (x, y) is an original pixel under the condition that the (x, y) pixel point is not influenced by temperature, T (x, y) is a pixel temperature drift value of the (x, y) point which rises along with the rise of the temperature, P (x, y) is a CMOS output pixel value of the (x, y) point after the influence of the temperature, and O (x, y) is a processed pixel value of the (x, y) point;
the temperature drift self-compensation coefficient is the pixel rising average value of the original image under the influence of temperature, namely:
P(x，y)-Tc＝O(x，y)(formula 3)
Wherein: tc represents the pixel rising average value of the original image under the influence of temperature, namely a temperature drift self-compensation coefficient;
reading the calibrated temperature drift self-compensation coefficient, determining a corresponding temperature drift compensation coefficient value according to the working temperature of the current image sensor, and carrying out the operation of the formula 3 on the effective pixel value in the current frame; selecting the maximum value and the minimum value of the pixel dynamic range to carry out the formula 4 enhancement;
wherein g (x, y) represents the pixel value after mapping; MIN and MAX represent the minimum and maximum values of the pixel dynamic range.
2. The image sensor temperature drift self-compensation method of claim 1, wherein the image sensor is a CMOS.
3. The image sensor temperature drift self-compensation method of claim 1, wherein the image sensor is a CCD.
4. The method for self-compensating the temperature drift of the image sensor according to claim 1, wherein the method for obtaining the current operating temperature of the image sensor and the corresponding temperature drift compensation coefficient value is as follows:
the image sensor is now placed in a dark environment; reading a temperature register value of an image sensor, simultaneously calculating a pixel rising average value of a current frame image as a temperature drift self-compensation coefficient of the current temperature, continuously rising the temperature of an industrial environment where the image sensor is located, and repeating the steps to obtain the pixel rising average value of the current frame image at different temperatures as the temperature drift self-compensation coefficient of the current temperature; and when the temperature is kept for the preset time, the temperature is considered to reach the upper limit, namely the temperature of the industrial environment where the image sensor is located is considered not to change, and the temperature drift compensation coefficients corresponding to different temperature values are stored.
5. The image sensor temperature drift self-compensation method of claim 4, wherein the preset time is 20 minutes.
6. The image sensor temperature drift self-compensation method of claim 1, wherein the method has automation performance.
7. The method of claim 1, wherein the method is universally applicable to image sensors affected by temperature.
8. A computer device comprising a memory, a processor and a computer program stored on the memory and executable on the processor, characterized in that the steps of the method of any of claims 1 to 7 are implemented when the program is executed by the processor.
9. A computer-readable storage medium, on which a computer program is stored which, when being executed by a processor, carries out the steps of the method according to any one of claims 1 to 7.
10. A processor, characterized in that the processor is configured to run a program, wherein the program when running performs the method of any of claims 1 to 7.
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| CN117714905A (en) * | 2024-02-06 | 2024-03-15 | 长光卫星技术股份有限公司 | Precise correction method for radiation response characteristic of CMOS image sensor |
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| CN117714905A (en) * | 2024-02-06 | 2024-03-15 | 长光卫星技术股份有限公司 | Precise correction method for radiation response characteristic of CMOS image sensor |
| CN117714905B (en) * | 2024-02-06 | 2024-04-16 | 长光卫星技术股份有限公司 | Method for correcting radiation response characteristic of CMOS image sensor |
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