CN111152126B - 基板处理装置 - Google Patents
基板处理装置 Download PDFInfo
- Publication number
- CN111152126B CN111152126B CN201811474024.5A CN201811474024A CN111152126B CN 111152126 B CN111152126 B CN 111152126B CN 201811474024 A CN201811474024 A CN 201811474024A CN 111152126 B CN111152126 B CN 111152126B
- Authority
- CN
- China
- Prior art keywords
- adjusting
- polishing pad
- processing apparatus
- substrate processing
- adjustment
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Images
Classifications
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/04—Lapping machines or devices; Accessories designed for working plane surfaces
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/005—Control means for lapping machines or devices
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B49/00—Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation
- B24B49/006—Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation taking regard of the speed
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B53/00—Devices or means for dressing or conditioning abrasive surfaces
- B24B53/017—Devices or means for dressing, cleaning or otherwise conditioning lapping tools
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
- H01L21/67028—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67092—Apparatus for mechanical treatment
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67242—Apparatus for monitoring, sorting or marking
- H01L21/67259—Position monitoring, e.g. misposition detection or presence detection
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
- Grinding-Machine Dressing And Accessory Apparatuses (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020180136476A KR102629678B1 (ko) | 2018-11-08 | 2018-11-08 | 기판 처리 장치 |
KR10-2018-0136476 | 2018-11-08 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN111152126A CN111152126A (zh) | 2020-05-15 |
CN111152126B true CN111152126B (zh) | 2023-06-20 |
Family
ID=70555601
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201811474024.5A Active CN111152126B (zh) | 2018-11-08 | 2018-12-04 | 基板处理装置 |
Country Status (2)
Country | Link |
---|---|
KR (1) | KR102629678B1 (ko) |
CN (1) | CN111152126B (ko) |
Family Cites Families (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6306008B1 (en) * | 1999-08-31 | 2001-10-23 | Micron Technology, Inc. | Apparatus and method for conditioning and monitoring media used for chemical-mechanical planarization |
JP4817687B2 (ja) * | 2005-03-18 | 2011-11-16 | 株式会社荏原製作所 | 研磨装置 |
US7163435B2 (en) * | 2005-01-31 | 2007-01-16 | Tech Semiconductor Singapore Pte. Ltd. | Real time monitoring of CMP pad conditioning process |
CN100560295C (zh) * | 2007-06-29 | 2009-11-18 | 上银科技股份有限公司 | 研磨切削颤振的抑制机构 |
CN201544116U (zh) * | 2009-12-15 | 2010-08-11 | 上海华虹Nec电子有限公司 | Cmp研磨装置 |
KR20160051219A (ko) * | 2014-11-03 | 2016-05-11 | 주식회사 케이씨텍 | 연마 패드의 높이 편차 측정이 가능한 화학 기계적 연마 장치의 컨디셔너 |
KR101916211B1 (ko) * | 2015-12-07 | 2018-11-07 | 주식회사 케이씨텍 | 화학 기계적 연마 장치 및 그 방법 |
JP6715153B2 (ja) * | 2016-09-30 | 2020-07-01 | 株式会社荏原製作所 | 基板研磨装置 |
US10930535B2 (en) * | 2016-12-02 | 2021-02-23 | Applied Materials, Inc. | RFID part authentication and tracking of processing components |
KR20180089037A (ko) * | 2017-01-31 | 2018-08-08 | 주식회사 케이씨텍 | 기판 처리 장치 및 그 제어방법 |
KR102629676B1 (ko) * | 2017-01-31 | 2024-01-29 | 주식회사 케이씨텍 | 화학 기계적 연마 장치의 컨디셔너 |
CN207290112U (zh) * | 2017-07-03 | 2018-05-01 | 株式会社安川电机 | 机器人研磨系统、机器人系统、研磨装置、吸盘装置、驱动部件及压力产生装置 |
-
2018
- 2018-11-08 KR KR1020180136476A patent/KR102629678B1/ko active IP Right Grant
- 2018-12-04 CN CN201811474024.5A patent/CN111152126B/zh active Active
Also Published As
Publication number | Publication date |
---|---|
KR20200053183A (ko) | 2020-05-18 |
KR102629678B1 (ko) | 2024-01-29 |
CN111152126A (zh) | 2020-05-15 |
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