CN111130681B - Method and device for determining noise transfer characteristics - Google Patents
Method and device for determining noise transfer characteristics Download PDFInfo
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- CN111130681B CN111130681B CN201911259401.8A CN201911259401A CN111130681B CN 111130681 B CN111130681 B CN 111130681B CN 201911259401 A CN201911259401 A CN 201911259401A CN 111130681 B CN111130681 B CN 111130681B
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
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- H04J3/14—Monitoring arrangements
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- H04J3/025—Filter arrangements
Abstract
The application provides a method and a device for determining noise transfer characteristics, wherein the method comprises the following steps: acquiring first time deviation TDEV coordinate data of input drift of the tested equipment; and second TDEV coordinate data of the output drift noise of the tested equipment; acquiring the cut-off frequency of the tested device; determining the maximum ratio in the ratios of the ordinate corresponding to the same abscissa in the first TDEV coordinate data and the second TDEV coordinate data; determining the maximum in-band gain of the tested equipment according to the maximum ratio; and determining whether the noise transfer characteristic of the tested equipment meets a preset standard or not according to the maximum in-band gain and the cut-off frequency. The method can comprehensively and efficiently test the noise transfer characteristics of the tested equipment.
Description
Technical Field
The present invention relates to the field of communications technologies, and in particular, to a method and an apparatus for determining noise transfer characteristics.
Background
The noise transfer characteristic is one of the key characteristics of the clock synchronization of the carrying network elements of the transport network. There are two proposed options in ITU-T g.813, g.8262, of which option 1 is applicable to two types of bearer network element clocks, sec (sdh Equipment clock) and eec (synchronous Ethernet Equipment clock) of the domestic transport network. The noise transfer characteristics of these two types of network element clocks are required to be identical, namely: for the signal at the input, the network element clock behaves like a low-pass filter with a cut-off frequency between 1Hz and 10Hz, and the phase gain in the pass-band should not be greater than 0.2dB (2.3%). To meet the high-precision clock requirement of the 5G network, ITU-T G.8262.1 further limits the cut-off frequency of eEEC (enhanced synchronous Ethernet Equipment clock) to be between 1Hz and 3 Hz.
How to accurately and conveniently evaluate the noise transfer characteristics is always a difficult problem in testing.
A commonly used test method is a frequency selective test method. The method is based on the principle that a series of frequency points are selected, and the amplitude ratio of the TIE (time interval error) curve of the clock output end and the noise (time interval error) curve of the input end of the tested device at the frequency points is compared, so that the noise transfer characteristic of the tested device is evaluated. The amplitude of the input noise TIE at different frequency points is determined by the noise margin described by Table 10 and Figure 7 in ITU-T g.813 at the clock input port of the device under test.
The frequency selection test method is essentially a serial test of a series of frequency points. The testing and calculation are required to be carried out twice on each frequency point, the testing and calculation are required to be repeated for a plurality of frequency points, and the manual operation is very complicated.
The selected frequency point is limited, and can only reflect the transmission characteristic of the network element clock noise on the limited frequency point and the maximum gain. If the frequency point is increased, the testing efficiency is also influenced.
For a certain single frequency, the number of test cycles is limited, a measurement error is introduced, and if the number of test cycles of each frequency point is increased, the test time and the calculation amount are increased, so that the test efficiency is influenced.
Disclosure of Invention
In view of this, the present application provides a method and an apparatus for determining noise transfer characteristics, which can comprehensively and efficiently test the noise transfer characteristics of a device under test.
In order to solve the technical problem, the technical scheme of the application is realized as follows:
in one embodiment, there is provided a noise transfer characteristic determination method, the method including:
acquiring first time deviation TDEV coordinate data of input drift of the tested equipment;
acquiring second TDEV coordinate data of output drift noise of the tested equipment; wherein, the abscissa of the TDEV coordinate represents the integration time, and the ordinate represents the TDEV;
acquiring the cut-off frequency of the tested device;
determining the maximum ratio in the ratios of the ordinate corresponding to the same abscissa in the first TDEV coordinate data and the second TDEV coordinate data; determining the maximum in-band gain of the tested equipment according to the maximum ratio;
and determining whether the noise transfer characteristic of the tested equipment meets a preset standard or not according to the maximum in-band gain and the cut-off frequency.
In another embodiment, there is provided a noise transfer characteristic determination apparatus including: the device comprises a first acquisition unit, a second acquisition unit, a first determination unit and a second determination unit;
the first acquisition unit is used for acquiring first TDEV coordinate data of input drift of the tested equipment; acquiring second TDEV coordinate data of output drift noise of the tested equipment; wherein, the abscissa of the TDEV coordinate represents the integration time, and the ordinate represents the TDEV;
the second acquiring unit is used for acquiring the cut-off frequency of the tested device;
the first determining unit is configured to determine a maximum ratio of ratios of ordinate corresponding to the same abscissa in the first TDEV coordinate data and the second TDEV coordinate data acquired by the first acquiring unit; determining the maximum in-band gain of the tested equipment according to the maximum ratio;
the second determining unit is configured to determine whether the noise transfer characteristic of the device under test meets a preset standard according to the maximum in-band gain determined by the first determining unit and the cutoff frequency acquired by the second acquiring unit.
In another embodiment, an electronic device is provided, comprising a memory, a processor and a computer program stored on the memory and executable on the processor, the processor implementing the steps of the noise transfer characteristic determination method as described when executing the program.
In another embodiment, a computer-readable storage medium is provided, on which a computer program is stored which, when being executed by a processor, carries out the steps of the noise transfer characteristic determination method.
According to the technical scheme, in the embodiment, the maximum in-band gain value and the cut-off frequency of the device to be tested are determined through the TDEV coordinate data input and output by the noise of the device to be tested, and whether the noise transfer characteristic of the device to be tested meets the preset standard or not is determined according to the maximum in-band gain value and the cut-off frequency. The scheme can comprehensively and efficiently test the noise transfer characteristics of the tested equipment.
Drawings
In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings needed to be used in the description of the embodiments are briefly introduced below, and it is obvious that the drawings in the following description are only some embodiments of the present application, and it is obvious for those skilled in the art to obtain other drawings based on these drawings without inventive labor.
FIG. 1 is a schematic diagram illustrating a noise transfer characteristic determination process in an embodiment of the present application;
FIG. 2 is a schematic diagram of a noise transfer characteristic test calibration connection;
FIG. 3 is a TDEV curve of input noise in the embodiment of the present application;
FIG. 4 is a schematic diagram of an actual connection for a noise transfer characteristic test;
FIG. 5 is a TDEV curve diagram of the output noise in the embodiment of the present application;
fig. 6 is a schematic diagram of noise transfer characteristic analysis. (ii) a
FIG. 7 is a schematic diagram of an apparatus for implementing the above technique in an embodiment of the present application;
fig. 8 is a schematic physical structure diagram of an electronic device according to an embodiment of the present invention.
Detailed Description
The technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application, and it is obvious that the described embodiments are only a part of the embodiments of the present application, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.
The terms "first," "second," "third," "fourth," and the like in the description and in the claims, as well as in the drawings, if any, are used for distinguishing between similar elements and not necessarily for describing a particular sequential or chronological order. It is to be understood that the data so used is interchangeable under appropriate circumstances such that the embodiments of the invention described herein are, for example, capable of operation in sequences other than those illustrated or otherwise described herein. Furthermore, the terms "comprising" and "having," as well as any variations thereof, are intended to cover non-exclusive inclusions. For example, a process, method, system, article, or apparatus that comprises a list of steps or elements is not necessarily limited to those steps or elements explicitly listed, but may include other steps or elements not explicitly listed or inherent to such process, method, article, or apparatus.
The technical solution of the present invention will be described in detail with specific examples. Several of the following embodiments may be combined with each other and some details of the same or similar concepts or processes may not be repeated in some embodiments.
The embodiment of the application provides a noise transfer characteristic determination method, which determines a maximum in-band gain value and a cut-off frequency of a device under test through Time Deviation (TDEV) coordinate data of noise input and output of the device under test, and determines whether the noise transfer characteristic of the device under test meets a preset standard according to the maximum in-band gain value and the cut-off frequency. The scheme can comprehensively and efficiently test the noise transfer characteristics of the tested equipment.
The following describes in detail a process of determining noise transfer characteristics implemented in the embodiments of the present application with reference to the drawings.
The device for implementing the noise transfer characteristic determination in the embodiment of the present application may be a device with computing processing capability, such as a PC, and hereinafter may be simply referred to as a test device for convenience of description.
Referring to fig. 1, fig. 1 is a schematic diagram of a noise transfer characteristic determination process in an embodiment of the present application. The method comprises the following specific steps:
The manner of acquiring the first TDEV coordinate data of the input drift of the device under test in this step may be:
acquiring locally stored first TDEV coordinate data of input drift corresponding to the tested equipment;
or, acquiring the first TDEV coordinate data of the input drift of the device under test through a field test, where the specific test process is as follows, but is not limited to the following manner:
test calibration, the test connection is shown in fig. 2, and fig. 2 is a schematic diagram of the test calibration connection for noise transfer characteristics.
The drift analyzer in fig. 2 uses the clock output of the fundamental frequency source as an external reference and superimposes a certain noise in the direction of its clock output, which should conform to the TDEV template of g.813 input noise margin option 1,
correspondingly, the drift tester tests the drift generation of the clock signal actually received by the external timing or synchronous Ethernet interface, the test time is at least 12000 seconds, the sampling frequency is not less than 50 Hz, the drift of the clock signal actually received by the drift tester is read to generate a TDEV curve, the TDEV curve is recorded as the TDEV coordinate data (TDEV curve) of the input drift of the tested equipment, and then the TDEV coordinate data is obtained.
Referring to fig. 3, fig. 3 is a schematic diagram of TDEV curves of input noise in the embodiment of the present application. The TDEV curve in fig. 3 is formed by TDEV data including a plurality of TDEV coordinates. The abscissa represents the integration time and the ordinate represents TDEV.
And 102, acquiring second TDEV coordinate data of the output drift noise of the tested equipment.
The manner of acquiring the second TDEV coordinate data of the output drift of the device under test in this step may be:
acquiring second TDEV coordinate data of output drift corresponding to the locally stored tested equipment;
or, acquiring second TDEV coordinate data of the output drift of the device under test through a field test, where the specific test process is as follows, but is not limited to the following manner:
the test connection is shown in fig. 4, and fig. 4 is a schematic diagram of an actual connection for a noise transfer characteristic test. The tested equipment tracks the clock output of the drift analyzer at external timing or synchronous noise Ethernet interface, and simultaneously outputs the clock output to the drift analyzer, the operation is the same as the operation during calibration test, the test result is recorded as the TDEV coordinate data (TDEV curve) of the output drift of the tested equipment, and then the TDEV coordinate data is obtained.
Referring to fig. 5, fig. 5 is a TDEV curve diagram of the output noise in the embodiment of the present application. The TDEV curve in fig. 5 is formed by TDEV data including a plurality of TDEV coordinates. The abscissa represents the integration time and the ordinate represents TDEV.
And 103, acquiring the cut-off frequency of the test equipment.
The specific implementation of obtaining the cut-off frequency of the test device in this step may be, but is not limited to, the following implementation:
multiplying a vertical coordinate in the first TDEV coordinate data by a first preset value to obtain third TDEV coordinate data;
the first preset value may be set to 0.707, and the ordinate of the first TDEV coordinate data is multiplied by 0.707 to obtain third TDEV coordinate data, where the third TDEV coordinate data is equivalent to TDEV coordinate data corresponding to a TDEV curve with a power attenuation of 3 dB.
Determining a value tau corresponding to an abscissa of an intersection point of a curve corresponding to the second TDEV coordinate data and a curve corresponding to the third TDEV coordinate datac；
Calculating a second preset value and taucThe ratio of (A) to (B);
determining the ratio as the cut-off frequency of the device under test.
The second predetermined value here may be 0.3, the cut-off frequency fc＝0.3/τc。
In a specific implementation process, the first TDEV coordinate data, the second TDEV coordinate data and the third TDEV coordinate data may be displayed in the same coordinate system in a curved form, that is, coordinates of each point obtained through the test are connected to form a smooth curve, and a more intuitive test result is given.
Referring to fig. 6, fig. 6 is a schematic diagram illustrating analysis of noise transfer characteristics. A curve (OUTPUT) corresponding to the second TDEV coordinate data of the OUTPUT drift noise is shown in fig. 6 using a solid line; use the line
A curve (INPUT) corresponding to the first TDEV coordinate data representing the INPUT drift noise; use ofLine strip
And a curve (-3dB-INPUT) corresponding to the third TDEV coordinate data representing the INPUT drift noise.
In FIG. 6, the abscissa value of the intersection point of the curve (OUTPUT) corresponding to the second TDEV coordinate data and the curve (-3dB-INPUT) corresponding to the third TDEV coordinate data is τc。
104, determining the maximum ratio in the ratios of the ordinate corresponding to the same abscissa in the first TDEV coordinate data and the second TDEV coordinate data; and determining the maximum in-band gain of the tested device according to the maximum ratio.
In this step, the specific implementation of determining the maximum ratio in the ratios of the ordinate to the ordinate corresponding to the same abscissa in the first TDEV coordinate data and the second TDEV coordinate data may be:
determining that the value of the abscissa in the first TDEV coordinate data and the second TDEV coordinate data is greater than τcThe maximum ratio among the ratios of the ordinate to the same abscissa in all the coordinate data.
Determining the maximum in-band gain of the tested device according to the maximum ratio in this step, including:
calculate 20log (K)max) Is determined as the maximum in-band gain of the device under test;
wherein, KmaxIs the maximum ratio.
The calculation formula of the maximum gain can be expressed as follows:
where τ is greater than τcAll abscissas correspond to values.
And 105, determining whether the noise transfer characteristic of the tested device meets a preset standard or not according to the maximum in-band gain and the cut-off frequency.
The specific implementation of this step is as follows: if the maximum in-band gain is not larger than a third preset value and the cut-off frequency belongs to a preset range, determining that the noise transfer characteristic of the tested equipment meets a preset standard; otherwise, determining that the noise transfer characteristics of the tested device do not meet the preset standard.
The third preset value may be 0.2, the preset range may be 1-10HZ or 1-3HZ, and the third preset value and the preset range may also be set according to the characteristics of the device under test or the requirements of the technological progress on the device under test.
In summary, the power spectrum relationship of the tested device is observed by comparing the amplitude relationship of the noise input and output TDEV functions of the tested device, and then the noise transfer characteristic of the tested device is estimated. The overall noise transfer characteristic of the network element clock can be visually observed only by two times of testing and calculation. Therefore, the beneficial effects are as follows:
the complexity of serially testing the single frequency point one by one for two times is simplified.
And 12000 seconds are tested for each frequency point while the testing efficiency is considered. In the single frequency test, the sampling period number of the single frequency point test is almost limited. This reduces errors due to insufficient number of sampling cycles.
And completely observing the noise gain condition of the frequency point corresponding to each tau value within the 10Hz range of the tested equipment, and simultaneously obtaining the in-band gain condition, the maximum gain and the cut-off frequency of the tested equipment on the input noise.
Based on the same inventive concept, the embodiment of the present application further provides a noise transfer characteristic determination apparatus. Referring to fig. 7, fig. 7 is a schematic structural diagram of an apparatus applied to the above technology in the embodiment of the present application. The device comprises: a first acquisition unit 701, a second acquisition unit 702, a first determination unit 703, and a second determination unit 704;
a first obtaining unit 701, configured to obtain first TDEV coordinate data of input drift of the device under test; acquiring second TDEV coordinate data of output drift noise of the tested equipment; wherein, the abscissa of the TDEV coordinate represents the integration time, and the ordinate represents the TDEV;
a second obtaining unit 702, configured to obtain a cut-off frequency of the device under test;
a first determining unit 703, configured to determine a maximum ratio of ratios of ordinate corresponding to the same abscissa in the first TDEV coordinate data and the second TDEV coordinate data acquired by the first acquiring unit 701; determining the maximum in-band gain of the tested equipment according to the maximum ratio;
a second determining unit 704, configured to determine whether the noise transfer characteristic of the device under test meets a preset criterion according to the maximum in-band gain determined by the first determining unit 703 and the cutoff frequency obtained by the second obtaining unit 702.
Preferably, the first and second electrodes are formed of a metal,
a first determination unit 703, in particular for calculating 20log (K)max) Is determined as the maximum in-band gain of the device under test; wherein, KmaxIs the maximum ratio.
Preferably, the first and second electrodes are formed of a metal,
a second obtaining unit 702, configured to specifically multiply a vertical coordinate in the first TDEV coordinate data by a first preset value to obtain third TDEV coordinate data; determining a value tau corresponding to an abscissa of an intersection point of a curve corresponding to the second TDEV coordinate data and a curve corresponding to the third TDEV coordinate datac(ii) a Calculating a second preset value and taucThe ratio of (A) to (B); determining the ratio as the cut-off frequency of the device under test.
Preferably, the first and second electrodes are formed of a metal,
a first determining unit 703, specifically configured to determine that a value of an abscissa in the first TDEV coordinate data and the second TDEV coordinate data is greater than τcThe maximum ratio among the ratios of the ordinate to the same abscissa in all the coordinate data.
Preferably, the first and second electrodes are formed of a metal,
a second determining unit 704, configured to determine that the noise transfer characteristic of the device under test meets a preset standard if the maximum in-band gain is not greater than a third preset value and the cutoff frequency belongs to a preset range; otherwise, determining that the noise transfer characteristics of the tested device do not meet the preset standard.
The units of the above embodiments may be integrated into one body, or may be separately deployed; may be combined into one unit or further divided into a plurality of sub-units.
In another embodiment, an electronic device is also provided, comprising a memory, a processor and a computer program stored on the memory and executable on the processor, the processor implementing the steps of the noise transfer characteristic determination method when executing the program.
In another embodiment, a computer readable storage medium is also provided, having stored thereon computer instructions, which when executed by a processor, may implement the steps in the noise transfer characteristic determination method.
Fig. 8 is a schematic physical structure diagram of an electronic device according to an embodiment of the present invention. As shown in fig. 8, the electronic device may include: a processor (processor)810, a communication Interface 820, a memory 830 and a communication bus 840, wherein the processor 810, the communication Interface 820 and the memory 830 communicate with each other via the communication bus 840. The processor 810 may call logic instructions in the memory 830 to perform the following method:
acquiring first time deviation TDEV coordinate data of input drift of the tested equipment;
acquiring second TDEV coordinate data of output drift noise of the tested equipment; wherein, the abscissa of the TDEV coordinate represents the integration time, and the ordinate represents the TDEV;
acquiring the cut-off frequency of the tested device;
determining the maximum ratio in the ratios of the ordinate corresponding to the same abscissa in the first TDEV coordinate data and the second TDEV coordinate data; determining the maximum in-band gain of the tested equipment according to the maximum ratio;
and determining whether the noise transfer characteristic of the tested equipment meets a preset standard or not according to the maximum in-band gain and the cut-off frequency.
In addition, the logic instructions in the memory 830 may be implemented in software functional units and stored in a computer readable storage medium when the logic instructions are sold or used as independent products. Based on such understanding, the technical solution of the present invention may be embodied in the form of a software product, which is stored in a storage medium and includes instructions for causing a computer device (which may be a personal computer, a server, or a network device) to execute all or part of the steps of the method according to the embodiments of the present invention. And the aforementioned storage medium includes: a U-disk, a removable hard disk, a Read-Only Memory (ROM), a Random Access Memory (RAM), a magnetic disk or an optical disk, and other various media capable of storing program codes.
The above-described embodiments of the apparatus are merely illustrative, and the units described as separate parts may or may not be physically separate, and parts displayed as units may or may not be physical units, may be located in one place, or may be distributed on a plurality of network units. Some or all of the modules may be selected according to actual needs to achieve the purpose of the solution of the present embodiment. One of ordinary skill in the art can understand and implement it without inventive effort.
Through the above description of the embodiments, those skilled in the art will clearly understand that each embodiment can be implemented by software plus a necessary general hardware platform, and certainly can also be implemented by hardware. With this understanding in mind, the above-described technical solutions may be embodied in the form of a software product, which can be stored in a computer-readable storage medium such as ROM/RAM, magnetic disk, optical disk, etc., and includes instructions for causing a computer device (which may be a personal computer, a server, or a network device, etc.) to execute the methods described in the embodiments or some parts of the embodiments.
The above description is only for the purpose of illustrating the preferred embodiments of the present invention and is not to be construed as limiting the invention, and any modifications, equivalents, improvements and the like made within the spirit and principle of the present invention should be included in the scope of the present invention.
Claims (10)
1. A method for determining noise transfer characteristics, the method comprising:
acquiring first time deviation TDEV coordinate data of input drift of the tested equipment;
acquiring second TDEV coordinate data of output drift noise of the tested equipment; wherein, the abscissa of the TDEV coordinate represents the integration time, and the ordinate represents the TDEV;
acquiring the cut-off frequency of the tested device;
determining the maximum ratio in the ratios of the ordinate corresponding to the same abscissa in the first TDEV coordinate data and the second TDEV coordinate data; determining the maximum in-band gain of the tested equipment according to the maximum ratio;
and determining whether the noise transfer characteristic of the tested equipment meets a preset standard or not according to the maximum in-band gain and the cut-off frequency.
2. The method of claim 1, wherein said obtaining a cut-off frequency of the device under test comprises:
multiplying a vertical coordinate in the first TDEV coordinate data by a first preset value to obtain third TDEV coordinate data;
determining a value tau corresponding to an abscissa of an intersection point of a curve corresponding to the second TDEV coordinate data and a curve corresponding to the third TDEV coordinate datac；
Calculating a second preset value and taucThe ratio of (A) to (B);
determining the ratio as the cut-off frequency of the device under test.
3. The method of claim 2, wherein the determining a maximum ratio of ratios of ordinates corresponding to the same abscissa in the first TDEV coordinate data and the second TDEV coordinate data comprises:
determining that the value of the abscissa in the first TDEV coordinate data and the second TDEV coordinate data is greater than τcThe maximum ratio among the ratios of the ordinate to the same abscissa in all the coordinate data.
4. The method of claim 1, wherein said determining a maximum in-band gain of said device under test from said maximum ratio comprises:
calculate 20log (K)max) Is determined as the maximum in-band gain of the device under test;
wherein, KmaxIs the maximum ratio.
5. The method of claim 1, wherein said determining whether noise transfer characteristics of the device under test meet a predetermined criterion based on the maximum in-band gain and the cutoff frequency comprises:
if the maximum in-band gain is not larger than a third preset value and the cut-off frequency belongs to a preset range, determining that the noise transfer characteristic of the tested equipment meets a preset standard; otherwise, determining that the noise transfer characteristics of the tested device do not meet the preset standard.
6. The method of claim 2 or 3, further comprising:
displaying the first TDEV coordinate data, the second TDEV coordinate data and the third TDEV coordinate data in the same coordinate system in a curve form.
7. An apparatus for determining a noise transfer characteristic, the apparatus comprising: the device comprises a first acquisition unit, a second acquisition unit, a first determination unit and a second determination unit;
the first acquisition unit is used for acquiring first TDEV coordinate data of input drift of the tested equipment; acquiring second TDEV coordinate data of output drift noise of the tested equipment; wherein, the abscissa of the TDEV coordinate represents the integration time, and the ordinate represents the TDEV;
the second acquiring unit is used for acquiring the cut-off frequency of the tested device;
the first determining unit is configured to determine a maximum ratio of ratios of ordinate corresponding to the same abscissa in the first TDEV coordinate data and the second TDEV coordinate data acquired by the first acquiring unit; determining the maximum in-band gain of the tested equipment according to the maximum ratio;
the second determining unit is configured to determine whether the noise transfer characteristic of the device under test meets a preset standard according to the maximum in-band gain determined by the first determining unit and the cutoff frequency acquired by the second acquiring unit.
8. The apparatus of claim 7,
the first determination unit is specifically configured to calculate 20log (K)max) Is determined as the maximum in-band gain of the device under test; wherein, KmaxIs the maximum ratio.
9. An electronic device comprising a memory, a processor and a computer program stored on the memory and executable on the processor, characterized in that the processor implements the method according to any of claims 1-6 when executing the program.
10. A computer-readable storage medium, on which a computer program is stored, which program, when being executed by a processor, is adapted to carry out the method of any one of claims 1 to 6.
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| WO2013077148A1 (en) * | 2011-11-24 | 2013-05-30 | 株式会社メガチップス | Communication system, and communication device |
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