CN111121624A - System for measuring dispersed target point of special-shaped spring based on single camera - Google Patents
System for measuring dispersed target point of special-shaped spring based on single camera Download PDFInfo
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- CN111121624A CN111121624A CN201911378628.4A CN201911378628A CN111121624A CN 111121624 A CN111121624 A CN 111121624A CN 201911378628 A CN201911378628 A CN 201911378628A CN 111121624 A CN111121624 A CN 111121624A
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- reflector
- target point
- spring
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- light source
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
Abstract
The invention provides a measuring system for a profiled spring dispersed target point based on a single camera, which comprises a measured profiled spring, a light source, a reflector, a microscope lens and an industrial camera; the measuring light transmission path of the system is that a light source emits measuring light, a measured special-shaped spring reflects the measuring light, and the measuring light passes through a micro lens after passing through a reflector and then enters an industrial camera. The invention can economically and effectively carry out accurate visual measurement on the geometric dimension of the dispersed target point of the special-shaped spring, on one hand, the invention not only overcomes the defect that the pixels of the image in the measurement scheme of a single telecentric lens camera are not fully utilized, but also solves the problem of mechanical interference of the measurement scheme of a plurality of microscopic lens cameras; on the other hand, compared with a single microscope lens and a precise motion platform, the invention can obviously reduce the cost on the premise of ensuring the measurement precision.
Description
Technical Field
The invention relates to the technical field of machine vision, in particular to a single-camera-based measuring system for a profile spring dispersed target point.
Background
The machine vision system includes a light source, a lens, a camera, an image processing unit, image processing software, a monitor, a communication/input/output unit, and the like. In the image acquisition stage, the image acquisition scheme formed by the types of the camera and the light source, the installation position of the camera and the light source and the like has important influence on the difficulty of implementing the subsequent image acquisition stage and the precision of the measurement result of the measured object.
For the geometric measurement of the dispersed target points of the special-shaped spring, one scheme is that a single high-resolution camera provided with a telecentric lens is used for shooting and imaging at one time to complete the measurement, but the proportion of the area of the target region of interest in the image to the total area of the image is too small, and the pixel resources of the image are not fully utilized to enable the measurement result to achieve higher precision; the other scheme is that a plurality of micro-lens cameras are only used for respectively aligning to a plurality of target dispersed points of the special-shaped spring to respectively measure, however, when the size between target points on the spring is smaller than the size that the cameras can be placed side by side, mechanical interference exists in the hardware part of the camera, and the camera cannot be placed normally, so that the measurement task cannot be completed; in another scheme, a single microscope camera can be matched with a precise motion platform to gradually acquire images of spring target points, and geometric measurement of the target points can be completed by combining the motion parameters of the camera.
At present, a single telecentric lens camera measurement method is mostly adopted for precise geometric measurement of the dispersed target points of the special-shaped springs. Because the size of the special-shaped spring is small, and the area where the target point is located (for example, the target point is the center of a section of circular arc) is small relative to the size of the spring, the area of the area where the target point is located in the image occupies a small proportion of the whole image area by adopting a single camera for measurement, and meanwhile, along with the improvement of the measurement precision requirement, the resolution of the camera needs to be improved so as to improve the measurement precision, so that the cost of the camera is improved, and more image pixels in the image of the camera are not fully utilized.
Disclosure of Invention
In order to solve the defects in the prior art, the invention provides a single-camera-based measuring system for the dispersed target points of the special-shaped spring.
In order to solve the technical problems, the technical scheme of the invention is as follows:
a measuring system for a profile spring dispersed target point based on a single camera comprises a measured profile spring, a light source, a reflector, a microscope lens and an industrial camera;
the measuring light transmission path of the system is that a light source emits measuring light, a measured special-shaped spring reflects the measuring light, and the measuring light passes through a micro lens after passing through a reflector and then enters an industrial camera.
In a preferred scheme, the light source is an annular light source, and the annular light source is placed right above the tested special-shaped spring.
In a preferred embodiment, the diameter of the opening of the annular light source is larger than the largest dimension of the profiled spring to be measured.
In a preferred scheme, the reflector comprises N surfaces, and comprises a first reflector, a second reflector and a third reflector which are fixed at a certain angle, the first reflector is parallel to the second reflector and the third reflector, the first reflector is placed above the tested special-shaped spring and the annular light source, and all light irradiated on the tested special-shaped spring is reflected; the reflector is arranged on one side of the first reflector, and the light reflected by the first reflector is partially reflected to the microscope lens and then enters the industrial camera for imaging; the third reflector is positioned at one side of the first reflector, and reflects part of light reflected by the first reflector to the microscope lens and then enters the industrial camera for imaging. The reflector is a plane reflector.
In a preferred scheme, the angle between the mirror surface of the reflecting mirror and the horizontal plane is 45 degrees.
In a preferred scheme, the optical axis of the microscope lens forms an angle of 45 degrees with the reflector and forms an angle of 90 degrees with the plane where the tested special-shaped spring is placed, the tested special-shaped spring is horizontally placed on the plane, and the placed plane is parallel to the horizontal plane.
In a preferable scheme, the relative position and size of the second reflector and the third reflector are within the visual field range and the depth of field range of the microscope lens, so that objects reflected by the second reflector and the third reflector can be completely and clearly imaged in the camera.
In a preferred embodiment, the measured object is not limited to a wire spring, and the number of the measured discrete target points is not limited to two.
Compared with the prior art, the technical scheme of the invention has the beneficial effects that:
the invention can economically and effectively carry out accurate visual measurement on the geometric dimension of the dispersed target point of the special-shaped spring, on one hand, the invention not only overcomes the defect that the pixels of the image in the measurement scheme of a single telecentric lens camera are not fully utilized, but also solves the problem of mechanical interference of the measurement scheme of a plurality of microscopic lens cameras; on the other hand, compared with a single microscope lens and a precise motion platform, the invention can obviously reduce the cost on the premise of ensuring the measurement precision, in particular the cost of an expensive motion platform. The method can improve the precision of geometric measurement of the dispersed target points of the special-shaped springs, can make full use of image pixels, and can properly reduce the resolution of the camera so as to reduce the cost of the camera and achieve better economic benefit.
Drawings
FIG. 1 is a schematic diagram of a single-camera based shaped spring dispersed target point measurement system provided by the present invention;
FIG. 2 is a schematic front view of the profiled spring to be tested in example 2;
FIG. 3 is a schematic side view of the tested contour spring in example 2;
wherein: 1. the device comprises a tested spring, a 1a circular end face and a 2b inner circular ring; 2. an annular light source; reference numeral 3 denotes a mirror (denoted in the figure) including: 3a, a first reflector, 3b, a second reflector, 3c, a third reflector; 4. a micro-lens; an industrial camera.
Detailed Description
The drawings are for illustrative purposes only and are not to be construed as limiting the patent;
for the purpose of better illustrating the embodiments, certain features of the drawings may be omitted, enlarged or reduced, and do not represent the size of an actual product;
it will be understood by those skilled in the art that certain well-known structures in the drawings and descriptions thereof may be omitted.
The technical solution of the present invention is further described below with reference to the accompanying drawings and examples.
Example 1
A measuring system for a profile spring dispersed target point based on a single camera is shown in figure 1 and comprises a measured profile spring 1, a light source 2, a reflector 3, a microscope 4 and an industrial camera 5;
the measurement light transmission path of the system is that a light source emits measurement light, the measured special-shaped spring 1 reflects the measurement light, and the measurement light passes through a reflecting mirror 3, then passes through a microscope lens 4 and then enters an industrial camera 5.
In a preferred scheme, the light source 2 is an annular light source, and the annular light source 2 is placed right above the tested special-shaped spring 1.
In a preferred embodiment, the diameter of the opening of the ring-shaped light source 2 is larger than the largest dimension of the profiled spring 1 to be measured.
In a preferred scheme, the reflector 3 comprises N surfaces, a first reflector 3a, a second reflector 3b and a third reflector 3c are fixed at a certain angle, the first reflector 3a is parallel to the second reflector 3b and the third reflector 3c, the first reflector 3a is placed above the tested special-shaped spring 1 and the annular light source 2, and all light irradiated on the tested special-shaped spring 1 is reflected; the second reflector 3b is arranged at one side of the first reflector 3a, and reflects part of light reflected by the first reflector 3a to the microscope lens 4 and then enters the industrial camera 5 for imaging; the third reflector 3c is located at one side of the first reflector 3a, and reflects part of the light reflected by the first reflector 3a to the micro-lens 4 and then enters the industrial camera 5 for imaging.
In a preferred embodiment, the angle between the reflector 3 and the horizontal plane is 45 degrees.
In a preferable scheme, the optical axis of the microscope lens 4 forms an angle of 45 degrees with the reflector 3, and forms an angle of 90 degrees with the plane on which the tested special-shaped spring is placed.
In a preferred scheme, the relative positions and sizes of the second reflector 3b and the third reflector 3c are within the visual field range and the depth of field range of the microscope lens 4, so that objects reflected by the second reflector and the third reflector can be completely and clearly imaged in the camera.
In a preferred embodiment, the measured object is not limited to a wire spring, and the number of the measured discrete target points is not limited to two.
Example 2
The system provided by the embodiment is consistent with the embodiment, and the system for measuring the dispersed target point of the special-shaped spring based on the single camera comprises a measured special-shaped spring 1, an annular light source 2, a reflector 3, a micro-lens 4 and an industrial camera 5; the structure of the tested special-shaped spring is shown in figures 2 and 3;
the measuring light transmission path of each dispersed target point to be measured is that the annular light source 2 emits measuring light, the measured special-shaped spring 1 reflects the measuring light, and the measuring light passes through the micro-lens 4 after passing through the reflector 3 and then enters the industrial camera 5.
The reflector 3 comprises three surfaces, every two of the three surfaces are parallel to each other and fixed at an angle of 45 degrees with the horizontal plane, the first reflector 3a is placed above the tested special-shaped spring 1 and the annular light source 2, reflects all light irradiated on the tested special-shaped spring 1, and the size of the first reflector is slightly larger than the maximum size of the tested special-shaped spring 1; the second reflector 3b is arranged at one side of the first reflector 3a, and reflects part of the light reflected by the first reflector 3a to the microscope lens 4 and then enters the industrial camera 5 for imaging, wherein the light reflected by the second reflector 3b only comprises the light of the circular end face 1a part of the measured position of the profiled spring 1 to be measured reflected in the first reflector 3a and does not comprise the light of the circular ring 1b part in the other measured position, and the imaging area of the circular end face 1a in the industrial camera 5 is formed in a certain part of the image plane in the industrial camera 5, such as the left half part of the image plane; the third reflector 3c is located on the same side of the first reflector 3a, and reflects part of the light reflected by the first reflector 3a to the industrial camera 5a for imaging, wherein the light reflected by the third reflector 3c only includes the light reflected by the first reflector 3a and reflected by the inner ring 1b of the measured part of the shaped spring 1 and does not include the light reflected by the other measuring part of the end face 1a, and the imaging area of the inner ring 1b in the industrial camera 5 is imaged on a certain part of the image plane of the industrial camera 5, such as the right part of the image plane. The diameter of the opening of the annular light source 2 is larger than the maximum size of the tested special-shaped spring and is positioned above the tested special-shaped spring 1. The optical axis direction of the microscope lens 4 and the direction of the vertical mirror surface of the reflector 3 form an angle of 45 degrees.
In the working process, firstly, the annular light source 2 uniformly illuminates the tested special-shaped spring 1, and the second reflector 3b and the third reflector 3c respectively reflect the light part reflected by the first reflector 3a to the microscope lens 4 and then enter the two parts of the imaging plane in the industrial camera 5 for imaging respectively; then, two parts of the image formed by the industrial camera 5, such as the left part and the right part, are respectively calibrated by the camera, and the actual center distance of two measurement targets in the real world in the image of the industrial camera 5, such as the center distance of the round end face 1a and the inner circular ring 1b of the measured special-shaped spring 1, is obtained through calculation.
The terms describing positional relationships in the drawings are for illustrative purposes only and are not to be construed as limiting the patent;
it should be understood that the above-described embodiments of the present invention are merely examples for clearly illustrating the present invention, and are not intended to limit the embodiments of the present invention. Other variations and modifications will be apparent to persons skilled in the art in light of the above description. And are neither required nor exhaustive of all embodiments. Any modification, equivalent replacement, and improvement made within the spirit and principle of the present invention should be included in the protection scope of the claims of the present invention.
Claims (7)
1. A measuring system of a special-shaped spring dispersed target point based on a single camera is characterized by comprising a light source (2), a reflector (3), a microscope (4) and an industrial camera (5);
the measuring light transmission path of the system is that a light source emits measuring light, a measured special-shaped spring (1) reflects the measuring light, and the measuring light passes through a micro lens (4) after passing through a reflector (3) and then enters an industrial camera (5).
2. The single camera based wire spring dispersed target point measurement system of claim 1, wherein the light source (2) is a ring light source, and the ring light source (2) is placed right above the wire spring (1) to be measured.
3. A single camera based wire spring deflection target point measurement system as claimed in claim 2, characterized in that the opening diameter of the ring light source (2) is larger than the largest dimension of the wire spring (1) to be measured.
4. The single-camera based profiled spring dispersion target point measuring system according to claim 1, wherein the reflector (3) comprises three surfaces, including a first reflector (3a), a second reflector (3b), and a third reflector (3c) fixed at a certain angle to the horizontal plane, the first reflector (3a) is parallel to the second reflector (3b) and the third reflector (3c), the first reflector (3a) is placed above the measured profiled spring (1) and the ring-shaped light source (2), and reflects the light irradiated on the measured profiled spring (1); the second reflector (3b) is arranged on one side of the first reflector (3a) and reflects part of light reflected by the first reflector (3a) to the microscope lens (4) and then enters the industrial camera (5) for imaging; the third reflector (3c) is positioned on one side of the first reflector (3a) and reflects part of light reflected by the first reflector (3a) to the microscope lens (4) and then enters the industrial camera (5) for imaging.
5. A single camera based wire spring dispersed target point measurement system as claimed in claim 1 wherein the mirror (3) is at a 45 degree angle to the horizontal.
6. The single-camera based wire spring dispersed target point measurement system of claim 1, wherein the optical axis of the microscope lens (4) is at 45 degrees to the mirror surface of the reflector (3) and at 90 degrees to the plane where the measured wire spring is placed.
7. The single-camera based profiled spring dispersed target point measuring system according to claim 4, wherein the relative position and size of the second mirror (3b) and the third mirror (3c) are within the visual field range and the depth of field range of the microscope lens (4).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201911378628.4A CN111121624A (en) | 2019-12-27 | 2019-12-27 | System for measuring dispersed target point of special-shaped spring based on single camera |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201911378628.4A CN111121624A (en) | 2019-12-27 | 2019-12-27 | System for measuring dispersed target point of special-shaped spring based on single camera |
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| Publication Number | Publication Date |
|---|---|
| CN111121624A true CN111121624A (en) | 2020-05-08 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201911378628.4A Pending CN111121624A (en) | 2019-12-27 | 2019-12-27 | System for measuring dispersed target point of special-shaped spring based on single camera |
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| CN (1) | CN111121624A (en) |
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