CN111105840A - Method, device and system for testing abnormal power failure of solid state disk - Google Patents
Method, device and system for testing abnormal power failure of solid state disk Download PDFInfo
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- CN111105840A CN111105840A CN201911376530.5A CN201911376530A CN111105840A CN 111105840 A CN111105840 A CN 111105840A CN 201911376530 A CN201911376530 A CN 201911376530A CN 111105840 A CN111105840 A CN 111105840A
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- G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
Abstract
The embodiment of the invention discloses a method, a device and a system for testing abnormal power failure of a solid state disk, wherein the SSD to be tested is powered off and powered on in the process of executing an IO command by the SSD to be tested, so that the abnormal power failure of the SSD is tested.
Description
Technical Field
The embodiment of the invention relates to a test technology, in particular to a method, a device and a system for testing abnormal power failure of a Solid State Drive (SSD).
Background
The SSD is powered down in two types, one is a normal power down, and the other is an abnormal power down.
The normal power failure means that before the power failure, the host notifies the SSD, for example, an Idle identity in a Serial Advanced Technology Attachment (SATA), through a command, and after receiving the command, the SSD writes data in a Dynamic Random Access Memory (DRAM) of the SSD into a flash Memory of the SSD; the data in the DRAM may be, for example, data cached in a buffer in the DRAM, a mapping table, block information of the flash memory, other information, and the like. After the SSD writes the data in the DRAM into the flash memory of the SSD, the host and the like may actually stop supplying power to the SSD. The normal power failure can not cause the loss of data, and after the power is re-electrified, the SSD only needs to re-load the data written into the flash memory before the power failure into the DRAM, and can continue to work following the state before the power failure.
The abnormal power failure means that the SSD is powered off when the SSD does not receive the power failure notification of the host; or the flash memory of the SSD is powered off after the host receives the power-down notice and the data in the DRAM is not ready to be written into the flash memory of the SSD. According to the characteristics of the flash memory, if the power failure occurs in an Upper Page (Upper Page) of a Multi-Level Cell (MLC), data of a corresponding Lower Page (Lower Page) is damaged, which means that data written into the flash memory before is lost due to abnormal power failure.
The SSD power failure is an important link in SSD test work, whether the SSD is normal or not can be judged according to the SSD power failure test result, so that the SSD power failure test is of great importance, but no effective mode is available at present for carrying out abnormal power failure test on the SSD.
Disclosure of Invention
The embodiment of the invention provides a method, a device and a system for testing abnormal power failure of an SSD, which can test the abnormal power failure of the SSD.
One embodiment of the invention provides a method for testing abnormal power failure of a solid state disk, which comprises the following steps:
receiving a test instruction; wherein the test instructions include: the method comprises the following steps of (1) power-down type, the number of Solid State Disks (SSD) to be tested, Model number of each SSD to be tested, and slot number of a power supply for supplying power to the SSD to be tested;
when any process for issuing the input/output IO command to the SSD is not enabled, adding 1 to the current cycle number and then performing predetermined processing; respectively acquiring the Model number, the capacity information and the Smart information of each SSD to be tested and performing predetermined processing; wherein the predetermined processing comprises a combination of one or more of: printing; writing a first log file;
starting a corresponding number of processes for issuing IO commands to the SSD to be tested according to the number of the SSD to be tested, and issuing the IO commands to each SSD to be tested through the started processes;
respectively issuing a power down command to a power supply supplying power to each SSD to be tested in the process that each SSD to be tested executes the IO command, and issuing a power-on command to the power supply after a first preset time after the power down command is issued; respectively carrying out preset processing on the power-on times of each SSD to be tested, and ending all started processes for issuing IO commands to the SSD to be tested; and continuing to execute the step of performing preset processing after adding 1 to the current cycle number until the current cycle number is more than the maximum cycle number after adding 1 to the current cycle number.
In this embodiment of the present invention, the issuing the IO command to each SSD to be tested through the enabled process includes:
and respectively generating a configuration file of each SSD to be tested, and respectively issuing an IO command to each SSD to be tested through a starting process according to the configuration file of each SSD to be tested.
In the embodiment of the present invention, the configuration file includes the LBA used for executing the IO command, the read-write ratio, and the IO block size in the logical block address LBA in the range corresponding to the capacity information of the SSD to be tested.
In an embodiment of the present invention, the method further includes:
and respectively judging whether each SSD to be tested has IO abnormity according to a second log file generated when each SSD to be tested executes the IO command, and when judging that all SSDs to be tested do not have the IO abnormity, continuously executing the step of respectively issuing the power-down command to the power supply for supplying power to each SSD to be tested.
In an embodiment of the present invention, the method further includes:
and respectively detecting whether the Model number, the capacity information and the Smart information of each SSD to be tested are normal, and when the Model number, the capacity information and the Smart information of all SSDs to be tested are normal, continuing to execute the step of ending all started processes for issuing the IO command to the SSDs to be tested.
Another embodiment of the present invention provides a device for testing abnormal power failure of a solid state disk, including a processor and a computer-readable storage medium, where instructions are stored in the computer-readable storage medium, and when the instructions are executed by the processor, the method for testing abnormal power failure of any solid state disk is implemented.
Another embodiment of the present invention provides a computer-readable storage medium, on which a computer program is stored, where the computer program, when executed by a processor, implements the steps of any one of the above methods for testing abnormal power failure of a solid state disk.
Another embodiment of the present invention provides a system for testing abnormal power failure of a solid state disk, including:
the test device for the abnormal power failure of the solid state disk comprises a processor and a computer readable storage medium, wherein instructions are stored in the computer readable storage medium, and when the instructions are executed by the processor, any one of the test methods for the abnormal power failure of the solid state disk is realized;
the power supply is connected with the one or more Solid State Disks (SSD) to be tested and is used for supplying power to the one or more SSD to be tested and carrying out power-down and power-up operations under the control of the test device for abnormal power-down of the solid state disks;
and the SSD to be tested is connected with the power supply and a processor in the testing device for abnormal power failure of the solid state disk, and is used for receiving and executing the IO command sent by the processor.
The embodiment of the invention comprises the following steps: receiving a test instruction; wherein the test instructions include: the method comprises the following steps of (1) power-down type, the number of Solid State Disks (SSD) to be tested, Model number of each SSD to be tested, and slot number of a power supply for supplying power to the SSD to be tested; when any process for issuing the input/output IO command to the SSD is not enabled, adding 1 to the current cycle number and then performing predetermined processing; respectively acquiring the Model number, the capacity information and the Smart information of each SSD to be tested and performing predetermined processing; wherein the predetermined processing comprises a combination of one or more of: printing; writing a first log file; starting a corresponding number of processes for issuing IO commands to the SSD to be tested according to the number of the SSD to be tested, and issuing the IO commands to each SSD to be tested through the started processes; respectively issuing a power down command to a power supply supplying power to each SSD to be tested in the process that each SSD to be tested executes the IO command, and issuing a power-on command to the power supply after a first preset time after the power down command is issued; respectively carrying out preset processing on the power-on times of each SSD to be tested, and ending all started processes for issuing IO commands to the SSD to be tested; and continuing to execute the step of performing preset processing after adding 1 to the current cycle number until the current cycle number is more than the maximum cycle number after adding 1 to the current cycle number. According to the embodiment of the invention, the SSD to be tested is powered off and powered on in the process of executing the IO command by the SSD to be tested, so that the SSD is tested for abnormal power failure.
Additional features and advantages of embodiments of the invention will be set forth in the description which follows, and in part will be obvious from the description, or may be learned by practice of embodiments of the invention. The objectives and other advantages of the embodiments of the invention will be realized and attained by the structure particularly pointed out in the written description and claims hereof as well as the appended drawings.
Drawings
The accompanying drawings are included to provide a further understanding of the embodiments of the invention and are incorporated in and constitute a part of this specification, illustrate embodiments of the invention and together with the examples of the invention serve to explain the principles of the embodiments of the invention and not to limit the embodiments of the invention.
Fig. 1 is a flowchart of a method for testing abnormal power failure of an SSD according to an embodiment of the present invention;
fig. 2 is a schematic structural composition diagram of a system for testing abnormal power failure of an SSD according to another embodiment of the present invention;
fig. 3 is a schematic structural composition diagram of a device for testing abnormal power failure of an SSD according to another embodiment of the present invention.
Detailed Description
Hereinafter, embodiments of the present invention will be described in detail with reference to the accompanying drawings. It should be noted that the embodiments and features of the embodiments of the present invention may be arbitrarily combined with each other without conflict.
The steps illustrated in the flow charts of the figures may be performed in a computer system such as a set of computer-executable instructions. Also, while a logical order is shown in the flow diagrams, in some cases, the steps shown or described may be performed in an order different than here.
Referring to fig. 1, an embodiment of the present invention provides a method for testing an SSD against abnormal power failure, including:
In an exemplary embodiment, the power down type may be ac power down or dc power down.
In an exemplary example, the power supply for supplying power to the SSD to be tested may be a program-controlled power supply, that is, a power supply that can control power-on and power-off operations by a program; the power supply for supplying power to the SSD to be tested can also be an external SATA back plate.
In an exemplary example, one power source may supply power to one or more SSDs to be tested, and when one power source supplies power to two or more SSDs to be tested, one SSD to be tested corresponds to one slot of the power source.
In an exemplary example, the initial value of the current cycle number may be set to 0, and of course, may also be set to other values, which is not limited in this embodiment of the present invention.
In an exemplary example, the capacity information of each SSD to be tested may be obtained by using the fdisk-1 command according to the Model number of each SSD to be tested.
In an exemplary example, smartinformation of each SSD to be tested can be acquired by adopting a smartcll-a command according to the Model number of each SSD to be tested.
In one illustrative example, the process for issuing the IO command to the SSD may be a Vdbench process.
In an exemplary embodiment, when each iteration starts, the Model number, the capacity information and the Smart information of each SSD to be tested are obtained in advance and preprocessed, so as to detect whether the Model number, the capacity information and the Smart information of the SSD to be tested are abnormal or not in time.
And 102, starting a corresponding number of processes for issuing IO commands to the SSD to be tested according to the number of the SSD to be tested, and issuing the IO commands to each SSD to be tested through the started processes.
In an exemplary embodiment, respectively issuing the IO command to each SSD to be tested by the enabled process includes:
and respectively generating a configuration file of each SSD to be tested, and respectively issuing an IO command to each SSD to be tested through a starting process according to the configuration file of each SSD to be tested.
In an exemplary example, the configuration file includes an LBA used for executing an IO command in a Logical Block Address (LBA) within a range corresponding to the capacity information of the SSD to be tested, a read-write ratio, an IO Block size, and the like.
In an exemplary embodiment, the read-write ratio refers to a ratio of read commands and a ratio of write commands in issued IO commands.
In one illustrative example, the IO block size refers to the smallest unit of reading or writing.
In an exemplary example, when an IO command is issued to each SSD to be tested, the read command and the write command are written according to a read-write ratio in a configuration file of the SSD to be tested.
In an exemplary example, the configuration files of different SSDs to be tested may be the same or different configuration files, which is not limited in this embodiment of the present invention, and is not used to limit the protection scope of the embodiment of the present invention.
In an exemplary example, the LBA and the read-write ratio of the SSD to be tested in the configuration file generated in each iteration are random, and other information is fixed and unchanged.
103, respectively issuing a power-down command to a power supply supplying power to each SSD to be tested in the process that each SSD to be tested executes the IO command, and issuing a power-up command to the power supply after a first preset time after the power-down command is issued; and respectively carrying out preset processing on the power-on times of each SSD to be tested, ending all started processes for issuing the IO commands to the SSD to be tested, and continuously executing the step 101 until the current cycle time in the step 101 is more than the maximum cycle time after adding 1.
In an exemplary embodiment, there may be many different issuing occasions, and the specific issuing occasion is not used to limit the protection scope of the embodiment of the present invention, for example, a randomly generated waiting time may be adopted, and the issuing of the power-down command is executed when the randomly generated waiting time is exceeded.
In one illustrative example, the randomly generated latency is in the range of 10 seconds(s) to 60 s.
In an exemplary example, when a power down command and a power up command are issued to a power supply for supplying power to each SSD to be tested, and when the power down type in the test instruction is AC power down, the power down command and the power up command are issued to a program control power supply for supplying power to each SSD to be tested; and when the power failure type in the test instruction is direct current power failure, issuing a power failure command and a power on command to an external SATA back plate for supplying power to each SSD to be tested.
In another embodiment of the present invention, the method further comprises:
and respectively judging whether each SSD to be tested has IO abnormity according to a second log file generated when each SSD to be tested executes the IO command, and when judging that all SSDs to be tested do not have the IO abnormity, continuously executing the step of respectively issuing the power-down command to the power supply for supplying power to each SSD to be tested.
In another embodiment of the present invention, when it is determined that at least one SSD to be tested has an IO exception, or fails to issue a power down command to a power supply, or fails to issue a power up command to the power supply, an exception exit is performed.
In an exemplary example, when an error (error) or a failure (fail) exists in a certain SSD to be tested in the second log file, it is determined that the SSD to be tested has an IO exception.
In an exemplary example, the second log files of different SSDs to be tested may be the same, or may be different second log files, which is not limited in this embodiment of the present invention, and is not used to limit the protection scope of the embodiment of the present invention.
In another embodiment of the present invention, the method further comprises:
and respectively detecting whether the Model number, the capacity information and the Smart information of each SSD to be tested are normal, and when the Model number, the capacity information and the Smart information of all SSDs to be tested are normal, continuing to execute the step of ending all started processes for issuing the IO command to the SSDs to be tested.
In another embodiment of the invention, when at least one of the Model number, the capacity information and the Smart information of at least one SSD to be tested is abnormal, abnormal exit is performed.
According to the embodiment of the invention, the SSD to be tested is powered off and powered on in the process of executing the IO command by the SSD to be tested, so that the SSD is tested for abnormal power failure.
Another embodiment of the present invention provides a device for testing abnormal power failure of a solid state disk, including a processor and a computer-readable storage medium, where instructions are stored in the computer-readable storage medium, and when the instructions are executed by the processor, the method for testing abnormal power failure of any solid state disk is implemented.
Another embodiment of the present invention provides a computer-readable storage medium, on which a computer program is stored, where the computer program, when executed by a processor, implements the steps of any one of the above methods for testing abnormal power failure of a solid state disk.
For example, when the SSD with the model number of DSS200-a480G is to be tested, a CentOS or RedHat Linux operating system may be installed in the test apparatus for abnormal power failure of the solid state disk, Root authority is obtained, the vddbench, Python and related libraries are downloaded and installed, and a test script for implementing the test method for abnormal power failure of the solid state disk of the present application is executed.
The user inputs a command: the python script name-h, can look at the command help of the script.
-t represents the power down type, 1 represents the ac power down (programmed power supply), 2 represents the dc power down (host SATA backplane); n represents the number of disks to be tested, for example, testing 5 disks is n 5; m represents the Model number of the disc to be tested, which can be viewed by lsscsi command and has the function of fuzzy matching; -s represents the programmed power to power up or down or slot number of the SATA backplane, all representing all slots.
Taking testing 5 disks for dc power failure as an example, a user inputs a command:
python script name-t 2-n 5-m DSS 200-s all;
after the command is executed, the process of steps 100 and 108 is performed.
Referring to fig. 2, another embodiment of the present invention provides a system for testing abnormal power failure of a solid state disk, including:
the test device 201 for the abnormal power failure of the solid state disk comprises a processor and a computer-readable storage medium, wherein instructions are stored in the computer-readable storage medium, and when the instructions are executed by the processor, any one of the test methods for the abnormal power failure of the solid state disk is realized;
the power supply 202 is connected with the one or more SSDs to be tested and is used for supplying power to the one or more SSDs to be tested and carrying out power-down and power-up operations under the control of the abnormal power-down test device of the solid state disk;
and the SSD203 to be tested is connected with a power supply and a processor in the testing device for abnormal power failure of the solid state disk, and is used for receiving and executing an IO command sent by the processor.
Referring to fig. 3, another embodiment of the present invention provides a device for testing abnormal power failure of a solid state disk, including:
a test instruction receiving module 301, configured to receive a test instruction; wherein the test instructions include: the method comprises the following steps of (1) power-down type, the number of Solid State Disks (SSD) to be tested, Model number of each SSD to be tested, and slot number of a power supply for supplying power to the SSD to be tested;
the SSD information recording module 302 is configured to, when none of the processes for issuing the IO command to the SSD is enabled, perform predetermined processing after adding 1 to the current cycle number; respectively acquiring the Model number, the capacity information and the Smart information of each SSD to be tested and performing predetermined processing; wherein the predetermined processing comprises a combination of one or more of: printing; writing a first log file;
the IO command issuing module 303 is configured to activate, according to the number of SSDs to be tested, a corresponding number of processes for issuing IO commands to the SSDs to be tested, and issue the IO commands to each SSD to be tested through the activated processes;
a power-down and power-up command issuing module 304, configured to issue a power-down command to a power supply that supplies power to each SSD to be tested during an IO command execution process of each SSD to be tested, and issue a power-up command to the power supply after a first preset time after the power-down command is issued; respectively carrying out preset processing on the power-on times of each SSD to be tested, and ending all started processes for issuing IO commands to the SSD to be tested; and continuing to execute the step of performing preset processing after adding 1 to the current cycle number until the current cycle number is more than the maximum cycle number after adding 1 to the current cycle number.
In an exemplary embodiment, the power down type may be ac power down or dc power down.
In an exemplary example, the power supply for supplying power to the SSD to be tested may be a program-controlled power supply, that is, a power supply that can control power-on and power-off operations by a program; the power supply for supplying power to the SSD to be tested can also be an external SATA back plate.
In an exemplary example, one power source may supply power to one or more SSDs to be tested, and when one power source supplies power to two or more SSDs to be tested, one SSD to be tested corresponds to one slot of the power source.
In an exemplary example, the initial value of the current cycle number may be set to 0, and of course, may also be set to other values, which is not limited in this embodiment of the present invention.
In an exemplary example, the capacity information of each SSD to be tested may be obtained by using the fdisk-1 command according to the Model number of each SSD to be tested.
In an exemplary example, smartinformation of each SSD to be tested can be acquired by adopting a smartcll-a command according to the Model number of each SSD to be tested.
In one illustrative example, the process for issuing the IO command to the SSD may be a Vdbench process.
In an exemplary embodiment, when each iteration starts, the Model number, the capacity information and the Smart information of each SSD to be tested are obtained in advance and preprocessed, so as to detect whether the Model number, the capacity information and the Smart information of the SSD to be tested are abnormal or not in time.
In an exemplary embodiment, the IO command issuing module 303 is specifically configured to implement the following method to respectively issue the IO command to each SSD to be tested through an enabled process:
and respectively generating a configuration file of each SSD to be tested, and respectively issuing an IO command to each SSD to be tested through a starting process according to the configuration file of each SSD to be tested.
In an exemplary example, the configuration file includes an LBA used for executing an IO command in a Logical Block Address (LBA) within a range corresponding to the capacity information of the SSD to be tested, a read-write ratio, an IO Block size, and the like.
In an exemplary embodiment, the read-write ratio refers to a ratio of read commands and a ratio of write commands in issued IO commands.
In one illustrative example, the IO block size refers to the smallest unit of reading or writing.
In an exemplary example, when an IO command is issued to each SSD to be tested, the read command and the write command are written according to a read-write ratio in a configuration file of the SSD to be tested.
In an exemplary example, the configuration files of different SSDs to be tested may be the same or different configuration files, which is not limited in this embodiment of the present invention, and is not used to limit the protection scope of the embodiment of the present invention.
In an exemplary example, the LBA and the read-write ratio of the SSD to be tested in the configuration file generated in each iteration are random, and other information is fixed and unchanged.
In an exemplary embodiment, there may be many different issuing occasions, and the specific issuing occasion is not used to limit the protection scope of the embodiment of the present invention, for example, a randomly generated waiting time may be adopted, and the issuing of the power-down command is executed when the randomly generated waiting time is exceeded.
In one illustrative example, the randomly generated latency is in the range of 10 seconds(s) to 60 s.
In an exemplary example, when the power-down and power-up command issuing module 304 issues the power-down command and the power-up command to the power supply supplying power to each SSD to be tested, and when the power-down type in the test instruction is ac power-down, the power-down and power-up command is issued to the program control power supply supplying power to each SSD to be tested; and when the power failure type in the test instruction is direct current power failure, issuing a power failure command and a power on command to an external SATA back plate for supplying power to each SSD to be tested.
In another embodiment of the present invention, the power down and power up command issuing module 304 is further configured to:
and respectively judging whether each SSD to be tested has IO abnormity according to a second log file generated when each SSD to be tested executes the IO command, and when judging that all SSDs to be tested do not have the IO abnormity, continuously executing the step of respectively issuing the power-down command to the power supply for supplying power to each SSD to be tested.
In another embodiment of the present invention, the power down and power up command issuing module 304 is further configured to:
and when the condition that the IO abnormality exists in at least one SSD to be tested is judged, or the power down command fails to be issued to the power supply, or the power up command fails to be issued to the power supply, performing abnormal exit.
In an exemplary example, when an error (error) or a failure (fail) exists in a certain SSD to be tested in the second log file, it is determined that the SSD to be tested has an IO exception.
In an exemplary example, the second log files of different SSDs to be tested may be the same, or may be different second log files, which is not limited in this embodiment of the present invention, and is not used to limit the protection scope of the embodiment of the present invention.
In another embodiment of the present invention, the IO command issuing module 303 is further configured to:
and respectively detecting whether the Model number, the capacity information and the Smart information of each SSD to be tested are normal, and when the Model number, the capacity information and the Smart information of all SSDs to be tested are normal, continuing to execute the step of ending all started processes for issuing the IO command to the SSDs to be tested.
In another embodiment of the present invention, the IO command issuing module 303 is further configured to:
and when at least one item of information among the Model number, the capacity information and the Smart information of at least one SSD to be tested is abnormal, performing abnormal exit.
According to the embodiment of the invention, the SSD to be tested is powered off and powered on in the process of executing the IO command by the SSD to be tested, so that the SSD is tested for abnormal power failure.
It will be understood by those of ordinary skill in the art that all or some of the steps of the methods, systems, functional modules/units in the devices disclosed above may be implemented as software, firmware, hardware, and suitable combinations thereof. In a hardware implementation, the division between functional modules/units mentioned in the above description does not necessarily correspond to the division of physical components; for example, one physical component may have multiple functions, or one function or step may be performed by several physical components in cooperation. Some or all of the components may be implemented as software executed by a processor, such as a digital signal processor or microprocessor, or as hardware, or as an integrated circuit, such as an application specific integrated circuit. Such software may be distributed on computer readable media, which may include computer storage media (or non-transitory media) and communication media (or transitory media). The term computer storage media includes volatile and nonvolatile, removable and non-removable media implemented in any method or technology for storage of information such as computer readable instructions, data structures, program modules or other data, as is well known to those of ordinary skill in the art. Computer storage media includes, but is not limited to, RAM, ROM, EEPROM, flash memory or other memory technology, CD-ROM, Digital Versatile Disks (DVD) or other optical disk storage, magnetic cassettes, magnetic tape, magnetic disk storage or other magnetic storage devices, or any other medium which can be used to store the desired information and which can accessed by a computer. In addition, communication media typically embodies computer readable instructions, data structures, program modules or other data in a modulated data signal such as a carrier wave or other transport mechanism and includes any information delivery media as known to those skilled in the art.
Although the embodiments of the present invention have been described above, the descriptions are only used for understanding the embodiments of the present invention, and are not intended to limit the embodiments of the present invention. It will be understood by those skilled in the art that various changes in form and details may be made therein without departing from the spirit and scope of the embodiments of the invention as defined by the appended claims.
Claims (8)
1. A method for testing abnormal power failure of a solid state disk comprises the following steps:
receiving a test instruction; wherein the test instructions include: the method comprises the following steps of (1) power-down type, the number of Solid State Disks (SSD) to be tested, Model number of each SSD to be tested, and slot number of a power supply for supplying power to the SSD to be tested;
when any process for issuing the input/output IO command to the SSD is not enabled, adding 1 to the current cycle number and then performing predetermined processing; respectively acquiring the Model number, the capacity information and the Smart information of each SSD to be tested and performing predetermined processing; wherein the predetermined processing comprises a combination of one or more of: printing; writing a first log file;
starting a corresponding number of processes for issuing IO commands to the SSD to be tested according to the number of the SSD to be tested, and issuing the IO commands to each SSD to be tested through the started processes;
respectively issuing a power down command to a power supply supplying power to each SSD to be tested in the process that each SSD to be tested executes the IO command, and issuing a power-on command to the power supply after a first preset time after the power down command is issued; respectively carrying out preset processing on the power-on times of each SSD to be tested, and ending all started processes for issuing IO commands to the SSD to be tested; and continuing to execute the step of performing preset processing after adding 1 to the current cycle number until the current cycle number is more than the maximum cycle number after adding 1 to the current cycle number.
2. The method according to claim 1, wherein the issuing the IO command to each SSD to be tested by the enabled process respectively comprises:
and respectively generating a configuration file of each SSD to be tested, and respectively issuing an IO command to each SSD to be tested through a starting process according to the configuration file of each SSD to be tested.
3. The test method according to claim 2, wherein the configuration file includes the LBA used for executing the IO command, the read-write ratio, and the IO block size in the logical block address LBA in the range corresponding to the capacity information of the SSD to be tested.
4. The method of testing of claim 1, further comprising:
and respectively judging whether each SSD to be tested has IO abnormity according to a second log file generated when each SSD to be tested executes the IO command, and when judging that all SSDs to be tested do not have the IO abnormity, continuously executing the step of respectively issuing the power-down command to the power supply for supplying power to each SSD to be tested.
5. The method of testing of claim 1, further comprising:
and respectively detecting whether the Model number, the capacity information and the Smart information of each SSD to be tested are normal, and when the Model number, the capacity information and the Smart information of all SSDs to be tested are normal, continuing to execute the step of ending all started processes for issuing the IO command to the SSDs to be tested.
6. A test device for abnormal power failure of a solid state disk comprises a processor and a computer readable storage medium, wherein instructions are stored in the computer readable storage medium, and when the instructions are executed by the processor, the test method for abnormal power failure of a solid state disk is realized according to any one of claims 1 to 5.
7. A computer-readable storage medium, on which a computer program is stored, wherein the computer program, when executed by a processor, implements the steps of the method for testing abnormal power failure of a solid state disk according to any one of claims 1 to 5.
8. A test system for abnormal power failure of a solid state disk comprises:
the test device for the abnormal power failure of the solid state disk comprises a processor and a computer readable storage medium, wherein instructions are stored in the computer readable storage medium, and when the instructions are executed by the processor, the test method for the abnormal power failure of the solid state disk as claimed in any one of claims 1 to 5 is realized;
the power supply is connected with the one or more Solid State Disks (SSD) to be tested and is used for supplying power to the one or more SSD to be tested and carrying out power-down and power-up operations under the control of the test device for abnormal power-down of the solid state disks;
and the SSD to be tested is connected with the power supply and a processor in the testing device for abnormal power failure of the solid state disk, and is used for receiving and executing the IO command sent by the processor.
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| Application Number | Priority Date | Filing Date | Title |
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| CN201911376530.5A CN111105840B (en) | 2019-12-27 | 2019-12-27 | Method, device and system for testing abnormal power failure of solid state disk |
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Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111897685A (en) * | 2020-07-29 | 2020-11-06 | 深圳佰维存储科技股份有限公司 | Method and device for checking data in power failure, storage medium and electronic equipment |
| CN112559266A (en) * | 2020-12-09 | 2021-03-26 | 成都佰维存储科技有限公司 | Solid state disk testing method and device, readable storage medium and electronic equipment |
| CN113205852A (en) * | 2021-06-17 | 2021-08-03 | 长江存储科技有限责任公司 | Power-down test control circuit, test system and method of memory system |
| CN113960391A (en) * | 2021-09-13 | 2022-01-21 | 珠海亿智电子科技有限公司 | Abnormal power failure testing device and method for storage medium |
| CN115035946A (en) * | 2022-08-12 | 2022-09-09 | 武汉麓谷科技有限公司 | Extensible NVMe solid state disk test system |
| CN115083510A (en) * | 2022-07-22 | 2022-09-20 | 深圳佰维存储科技股份有限公司 | Solid state disk testing method and device, storage medium, power supply and electronic equipment |
| WO2023028836A1 (en) * | 2021-08-31 | 2023-03-09 | 长江存储科技有限责任公司 | Power-down test of firmware of memory system |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20160293274A1 (en) * | 2011-11-14 | 2016-10-06 | Seagate Technology Llc | Storage Device Firmware and Manufacturing Software |
| CN108766487A (en) * | 2018-05-31 | 2018-11-06 | 郑州云海信息技术有限公司 | A kind of hard disk descends method for electrically, system, equipment and computer storage media extremely |
| CN109524049A (en) * | 2018-11-26 | 2019-03-26 | 深圳忆联信息系统有限公司 | SSD powered-off fault test method, device, computer equipment and storage medium |
| CN110085278A (en) * | 2019-04-04 | 2019-08-02 | 烽火通信科技股份有限公司 | A kind of test method and system of eMMC power down protection |
| CN110489282A (en) * | 2019-07-03 | 2019-11-22 | 苏州浪潮智能科技有限公司 | A kind of stability test method and device of server power-on and power-off repeatedly |
| CN110569158A (en) * | 2019-08-30 | 2019-12-13 | 东莞记忆存储科技有限公司 | method and device for testing abnormal power failure in SSD random scene and computer equipment |
-
2019
- 2019-12-27 CN CN201911376530.5A patent/CN111105840B/en active Active
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20160293274A1 (en) * | 2011-11-14 | 2016-10-06 | Seagate Technology Llc | Storage Device Firmware and Manufacturing Software |
| CN108766487A (en) * | 2018-05-31 | 2018-11-06 | 郑州云海信息技术有限公司 | A kind of hard disk descends method for electrically, system, equipment and computer storage media extremely |
| CN109524049A (en) * | 2018-11-26 | 2019-03-26 | 深圳忆联信息系统有限公司 | SSD powered-off fault test method, device, computer equipment and storage medium |
| CN110085278A (en) * | 2019-04-04 | 2019-08-02 | 烽火通信科技股份有限公司 | A kind of test method and system of eMMC power down protection |
| CN110489282A (en) * | 2019-07-03 | 2019-11-22 | 苏州浪潮智能科技有限公司 | A kind of stability test method and device of server power-on and power-off repeatedly |
| CN110569158A (en) * | 2019-08-30 | 2019-12-13 | 东莞记忆存储科技有限公司 | method and device for testing abnormal power failure in SSD random scene and computer equipment |
Cited By (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111897685A (en) * | 2020-07-29 | 2020-11-06 | 深圳佰维存储科技股份有限公司 | Method and device for checking data in power failure, storage medium and electronic equipment |
| CN112559266A (en) * | 2020-12-09 | 2021-03-26 | 成都佰维存储科技有限公司 | Solid state disk testing method and device, readable storage medium and electronic equipment |
| CN112559266B (en) * | 2020-12-09 | 2023-06-06 | 成都佰维存储科技有限公司 | Solid state disk testing method and device, readable storage medium and electronic equipment |
| CN113205852A (en) * | 2021-06-17 | 2021-08-03 | 长江存储科技有限责任公司 | Power-down test control circuit, test system and method of memory system |
| CN113205852B (en) * | 2021-06-17 | 2022-05-24 | 长江存储科技有限责任公司 | Power-down test control circuit, test system and method of memory system |
| WO2023028836A1 (en) * | 2021-08-31 | 2023-03-09 | 长江存储科技有限责任公司 | Power-down test of firmware of memory system |
| CN113960391A (en) * | 2021-09-13 | 2022-01-21 | 珠海亿智电子科技有限公司 | Abnormal power failure testing device and method for storage medium |
| CN115083510A (en) * | 2022-07-22 | 2022-09-20 | 深圳佰维存储科技股份有限公司 | Solid state disk testing method and device, storage medium, power supply and electronic equipment |
| CN115083510B (en) * | 2022-07-22 | 2023-01-10 | 深圳佰维存储科技股份有限公司 | Solid state disk testing method and device, storage medium, power supply and electronic equipment |
| CN115035946A (en) * | 2022-08-12 | 2022-09-09 | 武汉麓谷科技有限公司 | Extensible NVMe solid state disk test system |
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