CN102968353A - Fail address processing method and fail address processing device - Google Patents
Fail address processing method and fail address processing device Download PDFInfo
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- CN102968353A CN102968353A CN2012104170182A CN201210417018A CN102968353A CN 102968353 A CN102968353 A CN 102968353A CN 2012104170182 A CN2012104170182 A CN 2012104170182A CN 201210417018 A CN201210417018 A CN 201210417018A CN 102968353 A CN102968353 A CN 102968353A
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Abstract
The embodiment of the invention provides a fail address processing method and a fail address processing device and relates to the field of computers, and the method and the device can be used for ensuring correct memory read and write and effectively improving the utilization ratio of memory resources. The specific scheme is as follows: reading a fail address of a failed storage unit in a first storage, wherein the fail address is stored in a second storage and is stored after an OS (Operating System) detects the failed unit during the operation process, and the second storage is a nonvolatile storage; and when determining that the failure type of the failed storage unit corresponding to the fail address is hard failure and the distribution type of the fail address is dynamic allocation, shielding the fail address. The method and the device are mainly used in the fail address treating process during the starting phase of a BIOS (Basic Input/Output System).
Description
Technical field
The present invention relates to computer realm, relate in particular to a kind of fail address disposal route and device.
Background technology
Computer system generally is comprised of processor, internal memory, input equipment, output device and five parts of bus, and wherein internal memory is used for preserving the required instruction and data of processor operation.Internal memory generally is to realize with the dynamic RAM (Dynamic Random Access Memory, DRAM) of semiconductor technology, for the ease of changing the memory bar form that comprises a plurality of dram chips of usually internal memory being made.In order to make the Reliability Enhancement of memory bar, increased by 1 or 2 error detection and correction (Error Checking and Correction, ECC) calibrating chip toward contact on the memory bar.
In the prior art, when the routine access internal memory, if the mistake of a bit appears in the data in the internal memory, can detect and be corrected by the ECC check code, make computing machine can continue normal operation, and (Electrically Erasable Programmable Read-Only Memory, EEPROM) records the fail address by EEPROM (Electrically Erasable Programmable Read Only Memo).But when wrong when surpassing a bit, owing to surpassed the error correcting capability of ECC, the ECC calibrating chip can only with error-detecting out but can't correct cause system's run-time error, also the fail address will be recorded among the EEPROM after detecting mistake.The record fail address is in the system restart process, does not re-use storage unit corresponding to fail address, and the assurance program is normally moved.
State in realization in the process of information storage, the inventor finds prior art, and there are the following problems at least: owing to do not add the fail address that the shielding of differentiation has been recorded after the system restart, cause the waste of memory resource.
Summary of the invention
Embodiments of the invention provide a kind of fail address disposal route and device, can be when guaranteeing that memory read-write is correct, and the utilization factor of Effective Raise memory source.
A first aspect of the present invention provides a kind of fail address disposal route, and the unloading phase of being applied to Basic Input or Output System (BIOS) (Basic Input Output System, BIOS), described method comprises:
Read the fail address that occurs the storage unit of inefficacy in the first memory of storing in the second memory; Wherein, described fail address is to store after detecting the unit that occurs losing efficacy by operating system (Operating System, OS) in operational process, and described second memory is nonvolatile memory;
When the failure type of judging the storage unit that appearance corresponding to described fail address lost efficacy is the distribution type of hard failure and described fail address when being dynamic assignment, shield described fail address.
In conjunction with first aspect, in a kind of possible implementation, described read in the first memory of storing in the second memory fail address that the storage unit that lost efficacy occurs after, described fail address disposal route also comprises:
Judge the failure type of the storage unit that appearance corresponding to described fail address lost efficacy, described failure type comprises soft failure and hard failure;
Judge the distribution type of described fail address, described distribution type comprises dynamic assignment and static allocation.
In conjunction with first aspect and above-mentioned possible implementation, in the possible implementation of another kind, described method also comprises:
When the failure type of judging the storage unit that appearance corresponding to described fail address lost efficacy is soft failure, then from described second memory, delete described fail address.
In conjunction with first aspect and above-mentioned possible implementation, in the possible implementation of another kind, described method also comprises:
When the failure type of judging the storage unit that appearance corresponding to described fail address lost efficacy is the distribution type of hard failure and described fail address when being static allocation, starting protection mechanism then.
In conjunction with first aspect and above-mentioned possible implementation, in the possible implementation of another kind, the failure type of the storage unit that appearance corresponding to the described fail address of described judgement lost efficacy comprises:
The storage unit that appearance corresponding to described fail address lost efficacy writes and read test; Wherein, said write and read test are data writing in described storage unit, again reading out data from described storage unit;
If the data that read in the described storage unit and the data consistent that writes, then described storage unit is soft failure;
If the data that read in the described storage unit are inconsistent with the data that write, then described storage unit is hard failure.
In conjunction with first aspect and above-mentioned possible implementation, in the possible implementation of another kind, described first memory comprises dynamic RAM DRAM, and described second memory comprises EEPROM (Electrically Erasable Programmable Read Only Memo) EEPROM or flash storer.
In conjunction with first aspect and above-mentioned possible implementation, in the possible implementation of another kind,
Described starting protection mechanism comprises: the prompting warning is also out of service; Or the starting system of laying equal stress on is warned in prompting;
The described fail address of described shielding comprises: the page address scope at place, described fail address is set to reserved property, so that OS does not re-use described page address scope when described first memory is carried out read-write operation.
In conjunction with first aspect and above-mentioned possible implementation, in the possible implementation of another kind,
The address of dynamic assignment comprises: the transmitting-receiving buffer zone of the address space that the address space that the OS process takies, consumer process take and I/O I/O equipment;
The address of static allocation comprises: the address space that the OS kernel takies, BIOS buffer zone and screen buffer.
A second aspect of the present invention provides a kind of fail address treating apparatus, and the unloading phase of being applied to BIOS, this device comprises:
Reading unit is used for reading the fail address that occurs the storage unit that lost efficacy in the first memory that second memory stores; Wherein, described fail address is to store after detecting the unit that occurs losing efficacy by operating system OS in operational process, and described second memory is nonvolatile memory;
Screen unit, be used for when the failure type of judging the storage unit that appearance corresponding to fail address that described reading unit reads lost efficacy be hard failure, and the distribution type of described fail address shields described fail address when being dynamic assignment.
In conjunction with second aspect, in a kind of possibility implementation, described fail address treating apparatus also comprises:
The first judging unit, be used for after described reading unit reads the fail address that occurs the storage unit that lost efficacy in the first memory that second memory stores, judge the failure type of the storage unit that appearance corresponding to fail address that described reading unit reads lost efficacy, described failure type comprises soft failure and hard failure;
The second judging unit, for the distribution type of judging described fail address, described distribution type comprises dynamic assignment and static allocation.
In conjunction with second aspect and above-mentioned possible implementation, in the possible implementation of another kind, described fail address treating apparatus also comprises:
Delete cells when the failure type that is used for the storage unit that lost efficacy when appearance corresponding to the described fail address of described the first judgment unit judges is soft failure, is deleted described fail address from described second memory.
In conjunction with second aspect and above-mentioned possible implementation, in another kind of possibility implementation, described fail address treating apparatus also comprises:
Protected location; failure type for the storage unit that lost efficacy when appearance corresponding to the described fail address of described the first judgment unit judges is hard failure; and when the distribution type of the described fail address of described the second judgment unit judges is static allocation, starting protection mechanism.
In conjunction with second aspect and above-mentioned possible implementation, in another kind of possibility implementation, described the first judging unit comprises:
Test module, storage unit corresponding to fail address that is used for described reading unit is read writes and read test; Wherein, said write and read test are data writing in described storage unit, again reading out data from described storage unit; When data that read in the described storage unit during with the data consistent that writes, determine that described storage unit is soft failure; When the data that read in the described storage unit and the data that write are inconsistent, determine that described storage unit is hard failure.
In conjunction with second aspect and above-mentioned possible implementation, in another kind of possibility implementation, described first memory comprises dynamic RAM DRAM, and described second memory comprises EEPROM (Electrically Erasable Programmable Read Only Memo) EEPROM or flash storer.
In conjunction with second aspect and above-mentioned possible implementation, in another kind of possibility implementation,
Described protected location specifically is used for: the prompting warning is also out of service; Or the starting system of laying equal stress on is warned in prompting;
Described screen unit specifically is used for: the page address scope at place, described fail address is set to reserved property, so that OS does not re-use described page address scope when described first memory is carried out read-write operation.
In conjunction with second aspect and above-mentioned possible implementation, in another kind of possibility implementation,
The address of dynamic assignment comprises: the transmitting-receiving buffer zone of the address space that the address space that the OS process takies, consumer process take and I/O I/O equipment;
The address of static allocation comprises: the address space that the OS kernel takies, BIOS buffer zone and screen buffer.
A kind of fail address disposal route provided by the invention and device, the failure type of the storage unit that lost efficacy when appearance corresponding to the fail address of record is that the distribution type of hard failure and described fail address is when being dynamic assignment, shield described fail address, with in the prior art directly storage unit that all fail addresses are corresponding all be set to reserved property and compare, distinguish soft failure address and hard failure address, only the dynamically allocate address with hard failure shields, avoided memory read-write to make mistakes, and the address space of soft failure can continue to use in the internal memory, has improved the utilization factor of memory headroom.
Description of drawings
In order to be illustrated more clearly in the embodiment of the invention or technical scheme of the prior art, the below will do to introduce simply to the accompanying drawing of required use in embodiment or the description of the Prior Art, apparently, accompanying drawing in the following describes only is some embodiments of the present invention, for those of ordinary skills, under the prerequisite of not paying creative work, can also obtain according to these accompanying drawings other accompanying drawing.
A kind of fail address process flow figure that Fig. 1 provides for the embodiment of the invention 1;
A kind of fail address process flow figure that Fig. 2 provides for the embodiment of the invention 2;
Fig. 3 forms synoptic diagram for a kind of fail address treating apparatus that the embodiment of the invention 3 provides;
Fig. 4 forms synoptic diagram for the another kind of fail address treating apparatus that the embodiment of the invention 3 provides;
A kind of fail address treating apparatus figure that Fig. 5 provides for the embodiment of the invention 4.
Embodiment
Below in conjunction with the accompanying drawing in the embodiment of the invention, the technical scheme in the embodiment of the invention is clearly and completely described, obviously, described embodiment only is the present invention's part embodiment, rather than whole embodiment.Based on the embodiment among the present invention, those of ordinary skills belong to the scope of protection of the invention not making the every other embodiment that obtains under the creative work prerequisite.
Embodiment 1
The embodiment of the invention provides a kind of fail address disposal route, and the unloading phase of being applied to Basic Input or Output System (BIOS) (Basic Input Output System, BIOS), as shown in Figure 1, the method can comprise:
101, read the fail address that occurs the storage unit of inefficacy in the first memory of storing in the second memory.
Wherein, after computer system resetted, BIOS brought into operation first.BIOS reads the fail address that occurs the storage unit that lost efficacy in the first memory of storage from second memory, and it is carried out readwrite tests and matching addresses.Described fail address is to store after detecting the unit that occurs losing efficacy by operating system (Operating System, OS) in operational process.
102, when the failure type of judging the storage unit that appearance corresponding to described fail address lost efficacy be the distribution type of hard failure and described fail address when being dynamic assignment, shield described fail address.
Wherein, BIOS reads the fail address that occurs the storage unit that lost efficacy in the first memory of storage from second memory after, it is carried out readwrite tests, judge that the failure type of the storage unit that appearance corresponding to described fail address lost efficacy is soft failure or hard failure.If hard failure then can be carried out matching addresses to the fail address, mate the memory headroom scope whether described fail address belongs to the OS dynamic assignment, if this address belongs to the memory headroom scope of OS dynamic assignment, then shield this fail address; If this address belongs to the memory headroom scope of OS static allocation, then starting protection is machine-processed.
Concrete, OS refers to a software runtime environment, can be transmitting-receiving buffer zone (being used for sending or the buffer memory of receive data such as network interface card) the storage allocation space of consumer process (process of the application program that starts such as the user) and peripherals based on this environment.The described fail address of described shielding comprises: the page address scope at place, described fail address is set to reserved property, divides timing no longer to use described page address scope so that OS carries out dynamic memory to described first memory.That is to say that OS just can not use these addresses in the storage allocation space.
Need to prove; BIOS reads the fail address that occurs the storage unit that lost efficacy in the first memory of storage from second memory after; also can carry out matching addresses to the fail address first; again readwrite tests is carried out in this fail address; according to matching result and test result; not belong to the memory headroom scope of supporting dynamic assignment be that the distribution type of described fail address is that the storage unit that appearance corresponding to static allocation and described fail address lost efficacy is hard failure if judge storage unit that appearance corresponding to this fail address lost efficacy, and then starting protection is machine-processed.
Fail address provided by the invention disposal route, the failure type of the storage unit that lost efficacy when appearance corresponding to the fail address of record is that the distribution type of hard failure and described fail address is when being dynamic assignment, shield described fail address, with in the prior art directly storage unit that all fail addresses are corresponding all be set to reserved property and compare, distinguish soft failure address and hard failure address, only the dynamically allocate address with hard failure shields, avoided memory read-write to make mistakes, and the address space of soft failure can continue to use in the internal memory, has improved the utilization factor of memory headroom.
Embodiment 2
The embodiment of the invention provides a kind of fail address disposal route, and as shown in Figure 2, the method can comprise:
201, when the access first memory lost efficacy, the fail address that occurs to lose efficacy is stored in the second memory; Wherein, described inefficacy comprises soft failure and hard failure.
Wherein, first memory comprises DRAM, and described second memory comprises EEPROM or flash.Internal memory is one of ingredient of computer system, is mainly used to preserve the required instruction and data of processor operation.For the ease of changing the form of often making the memory bar that comprises a plurality of dram chips, on the memory bar except dram chip is arranged, also have the eeprom chip of a low capacity, eeprom chip can visit by the I2C bus.The information such as the address wire figure place of the in store dram chip in eeprom chip the inside, data line width, time sequence parameter, concrete form has industrywide standard, the present invention does not give unnecessary details in detail at this, and processor can come the allocate memory controller according to these information, guarantees the normal access to memory bar.The capacity of eeprom chip generally is 256 bytes, and the relevant information of preserving the above dram chip only needs 128 bytes, so remaining space can be used for recording the fail address of dram chip on the memory bar.
In the process of computer run, when the processor access first memory lost efficacy, processor can be stored to the fail address that occurs to lose efficacy in the second memory.Concrete can be: when the routine access internal memory, processor all can read the check bit of data and correspondence together and carry out verification according to the ECC algorithm, if exist wrong in the data and can correct, for example only have a bit to make mistakes, so first error correcting is obtained correct data and then the fail address is recorded in the second memory, this computer-chronograph just can continue normal operation.It might be that soft failure also might be hard failure that but data are made mistakes; and some memory headroom is protected in the process of operating system; therefore can not after makeing mistakes, data test immediately detecting; but test in the BIOS stage after will waiting system to restart, distinguishing this inefficacy is hard failure or soft failure.If the wrong more error correcting capability that exceeds the ECC algorithm, the bit mistake that two or more have for example occurred simultaneously, can only detect the fail address so and can't recover correct data, also need to record the fail address this moment, because this moment, system can't continue operation, so must restart system.
Being understandable that the record fail address is in order can to test when normally restarting, is unavailable with place, the address page setup of hard failure, avoids restarting rear continuation and uses, in case accumulation exceeds the ECC error correcting capability and will cause fault otherwise data are made mistakes.If same address was repeatedly accessed before restarting, same address can occur and be recorded repeatedly situation, therefore before recording address, need to be confirmed whether first to record, thereby reduce taking of EEPROM space.
202, after the BIOS system restarts, read the fail address that occurs the storage unit of inefficacy in the described first memory of storing in the described second memory.
Wherein, after system reset finished, BIOS brought into operation first, and various chips in the computing machine are carried out test and initialization, for example processor, bridge sheet and various input-output apparatus.And then BIOS can read capacity, the time sequence parameter of memory bar and configure Memory Controller Hub from second memory, so that memory bar is carried out read-write operation.Then BIOS judges whether preserved the access unit address information that lost efficacy in the second memory, if preservation is arranged, read the fail address of the first memory of storing in the second memory.And after reading the fail address, can directly carry out next step processing, namely read a fail address and process one, until the storage unit of the inefficacy of the first memory that records in the second memory is finished dealing with.
When bringing into operation, BIOS also can prepare especially a form, for example E820 shows, the E820 table can arrange based on the fail address of the first memory of storing in the second memory attribute of address realm corresponding to each fail address, wherein can list address realm and the attribute of each section memory headroom in the E820 table, for example keep (reserved) or available (usable), so that behind os starting, use memory headroom according to the access rights of mark in the E820 table, so that system can move normally.
Wherein, what can know is, in the prior art, the list item number of E820 table is limited, is determined for example 32,64 by program design, the remaining storage space of EEPROM also is limited simultaneously, therefore can set two threshold values, first threshold is the list item number of record page address, place, hard failure unit scope in the E820 table, and Second Threshold is the fail address number (comprising hard failure and soft failure) of preserving among the EEPROM.If there is the storage unit of inefficacy too much, internal storage data has for example occured between operating system runtime repeatedly makes mistakes, so that the project sum that is recorded among the EEPROM has exceeded Second Threshold, page sum corresponding to the hard failure that perhaps identifies by readwrite tests unloading phase of BIOS exceeded first threshold, then can the reporting fault alarm.
Because the base unit that memory headroom keeps is the 4KB page size, therefore during BIOS carries out readwrite tests, if a plurality of fail addresses are positioned at the same page, and to have the storage unit of an inefficacy at least be hard failure, then can only keep a record in EEPROM.
203, storage unit corresponding to described fail address write and read test, determine the failure type of the storage unit that appearance corresponding to described fail address lost efficacy; If the failure type of the storage unit that described appearance was lost efficacy is soft failure, then execution in step 204; If the failure type of the storage unit that described appearance was lost efficacy is hard failure, then execution in step 205.
Wherein, when in reading second memory, having preserved the access unit address information that lost efficacy, can be according to the fail address of the first memory of storing in the second memory that reads, storage unit corresponding to described fail address write and read test, determine the failure type of the storage unit that described fail address is corresponding, wherein, the following several possibilities of the general existence of the error in data in the internal memory:
(1) production defective.Dram chip produces a small amount of failed storage unit owing to defective workmanship in process of production, and these unit can't correctly be read and write, and are called hard failure.
(2) device damage.Owing to electric stress produces a small amount of failed storage unit, also can't correctly read and write by these unit in operational process for dram chip, is hard failure equally.
(3) bit saltus step.Because the cosmic rays that exists in the working environment, power-supply fluctuation, signal cross-talk etc., these extraneous factors all can make a small amount of location information generation saltus step, for example become 0 from 1, this inefficacy only affects the information that storage unit is preserved, storage unit itself still can normally be read and write, and this situation is called soft failure.
Can find out whether can read and write normally the storage unit that just can distinguish this inefficacy according to the storage unit of described inefficacy is hard failure or soft failure.Said write and read test are data writing in described storage unit, again reading out data from described storage unit.When data that read in storage unit corresponding to described fail address during with the data consistent that writes, determine that described storage unit is soft failure; When the data that read in storage unit corresponding to described fail address and the data that write are inconsistent, determine that described storage unit is hard failure.
204, the described fail address of deletion from described second memory.
Wherein, as the result of BIOS according to readwrite tests, the failure type of judging the storage unit of appearance inefficacy corresponding to this fail address is soft failure, and BIOS will delete this fail address from second memory so.This is because for soft failure, it be because the impact of extraneous factor causes, have randomness, storage unit itself did not lose efficacy, so the storage unit that appearance corresponding to this class fail address lost efficacy still can continue use.So the present invention judges the type of fail address, to cause owing to the impact of extraneous factor the fail address deletion of the soft failure of error in data, can continue to use so that read and write normal storage unit, compared with prior art, improve the storage space utilization factor of internal memory.
Further, because memory address loses efficacy gross error occured for fear of equipment, method of the present invention can also may further comprise the steps:
205, judge the distribution type of the storage unit that appearance corresponding to described fail address lost efficacy; If the distribution type of described fail address is static allocation, then execution in step 206; If the distribution type of described fail address is dynamic assignment, then execution in step 207.
Wherein, as the result of BIOS according to readwrite tests, when the failure type of judging the storage unit that appearance corresponding to this fail address lost efficacy is hard failure, can further judge the distribution type of the storage unit that appearance corresponding to this fail address lost efficacy, this is because for hard failure, if there is physical fault in storage unit, the page at its place can not continue to use, and need to be set to reserved property.But concerning processor, the purposes of whole memory headroom has certain planning, and some memory headroom is that operating system can dynamic assignment, address space that takies such as the transmitting-receiving buffer zone of I/O equipment, address space that the OS process takies and consumer process etc.If support the internal storage location of dynamic assignment that inefficacy has occured, can be set to reserved property by BIOS, just obtain behind the os starting less than the address space that has shielded like this, just can not use these address spaces, do not affect normal operation.But if the internal storage location of static allocation occurs to lose efficacy, OS can make mistakes because accessing the address space of these static allocation, affects the normal operation of equipment.
206, starting protection mechanism.
Wherein, the failure type of judging the storage unit that appearance corresponding to this fail address lost efficacy in the fail address that BIOS preserves in according to second memory is hard failure; and when the distribution type of the storage unit that appearance corresponding to described fail address lost efficacy was static allocation, BIOS can starting protection mechanism.Described protection mechanism can be prompting warning and out of service, also can be prompting warning and restarting systems, perhaps also this fail address can be written in the storer such as flash memory, so that follow-up misarrangement and maintenance.For example, the OS kernel is loaded into fixed address in the internal memory by BIOS unloading phase of BIOS, can not support the address of dynamic assignment, if having storage unit mistake to occur in this sector address scope, will affect the normal operation of equipment, can only report and alarm and stop the continuation operation of BIOS.
207, the page address scope at appearance corresponding to the described fail address storage unit place of losing efficacy is set to reserved property, so that OS does not use memory page corresponding to described page address scope when carrying out address assignment.
Wherein, when the distribution type of judging the storage unit that appearance corresponding to this fail address lost efficacy at the Page Range of the fail address that BIOS preserves in according to second memory is dynamic assignment, BIOS can described fail address is corresponding page address, the storage unit place scope that lost efficacy of appearance add BIOS and shift to an earlier date in the ready E820 table and be set to reserved property, start back operation system in system like this and just can not continue to use this section memory headroom, guaranteed the normal operation of system after restarting.
Be that the failure type of dynamic assignment and described fail address is hard failure in the distribution type that detects this fail address, and with after being set to reserved property in its adding E820 table, BIOS can continue to detect whether also have the fail address in the second memory, then continue execution in step 202-207 if exist, until all finish dealing with in the fail address of recording in the second memory.
Need to prove, the order of the distribution type of the storage unit that appearance corresponding to the failure type of the storage unit that appearance corresponding to the definite fail address of step 203 lost efficacy in the embodiment of the invention and step 205 judgement fail address lost efficacy can be changed, namely also can judge first the distribution type of the storage unit that appearance corresponding to fail address lost efficacy, determine again the failure type of the storage unit that appearance corresponding to fail address lost efficacy.The embodiment of the invention is not done restriction at this.
A kind of fail address provided by the invention disposal route, the failure type of the storage unit that lost efficacy when appearance corresponding to the fail address of record is that the distribution type of hard failure and described fail address is when being dynamic assignment, shield described fail address, with in the prior art directly storage unit that all fail addresses are corresponding all be set to reserved property and compare, distinguish soft failure address and hard failure address, only the dynamically allocate address with hard failure shields, avoided memory read-write to make mistakes, and the address space of soft failure can continue to use in the internal memory, has improved the utilization factor of memory headroom.
And; the failure type of the storage unit that lost efficacy when appearance corresponding to fail address is that the distribution type of hard failure and described fail address is when being static allocation; starting protection mechanism; with in the prior art directly storage unit that all fail addresses are corresponding all be set to reserved property and compare; with the Address Recognition of static allocation out; the pre-cooling protection mechanism is avoided processor to continue operation gross error is occured.
Embodiment 3
The embodiment of the invention provides a kind of fail address treating apparatus, the unloading phase of being applied to BIOS, as shown in Figure 3, comprising: reading unit 31 and screen unit 32.
Reading unit 31 is used for reading the fail address that occurs the storage unit that lost efficacy in the first memory that second memory stores; Wherein, described fail address is to store after detecting the unit that occurs losing efficacy by operating system OS in operational process, and described second memory is nonvolatile memory.
Screen unit 32, be used for when the failure type of judging the storage unit that appearance corresponding to fail address that described reading unit 31 reads lost efficacy be hard failure, and the distribution type of described fail address shields described fail address when being dynamic assignment.
Further, as shown in Figure 4, this fail address treating apparatus can also comprise: the first judging unit 33, the second judging unit 34.
The first judging unit 33, be used for after described reading unit 31 reads the fail address that occurs the storage unit that lost efficacy in the first memory that second memory stores, judge the failure type of the storage unit that appearance corresponding to fail address that described reading unit 31 reads lost efficacy, described failure type comprises soft failure and hard failure.
The second judging unit 34, for the distribution type of judging described fail address, described distribution type comprises dynamic assignment and static allocation
Further, described fail address treating apparatus can also comprise: delete cells 35.
Delete cells 35, when the failure type that is used for the storage unit that lost efficacy in appearance corresponding to described fail address that described the first judging unit 33 is judged is soft failure, the described fail address of deletion from described second memory.
Further, this fail address treating apparatus can also comprise: protected location 36.
Protected location 36; be used for judging that when described the first judging unit 33 failure type of the storage unit that appearance corresponding to described fail address lost efficacy is hard failure; and when the distribution type of the described fail address that described the second judging unit 34 is judged is static allocation, starting protection mechanism.
Further, this first judging unit 33 comprises: test module 331.
Test module 331, storage unit corresponding to fail address that is used for described reading unit 31 is read writes and read test; Wherein, said write and read test are data writing in described storage unit, again reading out data from described storage unit; When data that read in the described storage unit during with the data consistent that writes, determine that described storage unit is soft failure; When the data that read in the described storage unit and the data that write are inconsistent, determine that described storage unit is hard failure.
Further, described first memory comprises dynamic RAM DRAM, and described second memory comprises EEPROM (Electrically Erasable Programmable Read Only Memo) EEPROM or flash storer.
Further, described protected location 36 specifically is used for: the prompting warning is also out of service, or the starting system of laying equal stress on is warned in prompting.
Described screen unit 32 specifically is used for: the page address scope at place, described fail address is set to reserved property, so that OS does not re-use described page address scope when described first memory is carried out read-write operation.
Further, the address of dynamic assignment comprises: the transmitting-receiving buffer zone of the address space that the address space that the OS process takies, consumer process take and I/O I/O equipment;
The address of static allocation comprises: the address space that the OS kernel takies, BIOS buffer zone and screen buffer.
A kind of fail address provided by the invention treating apparatus, the failure type of the storage unit that lost efficacy when appearance corresponding to the fail address of record is that the distribution type of hard failure and described fail address is when being dynamic assignment, shield described fail address, with in the prior art directly storage unit that all fail addresses are corresponding all be set to reserved property and compare, distinguish soft failure address and hard failure address, only the dynamically allocate address with hard failure shields, avoided memory read-write to make mistakes, and the address space of soft failure can continue to use in the internal memory, has improved the utilization factor of memory headroom.
And; the failure type of the storage unit that lost efficacy when appearance corresponding to described fail address is that the distribution type of hard failure and described fail address is when being static allocation; starting protection mechanism; with in the prior art directly storage unit that all fail addresses are corresponding all be set to reserved property and compare; with the Address Recognition of static allocation out; the pre-cooling protection mechanism is avoided processor to continue operation gross error is occured.
Embodiment 4
The embodiment of the invention also provides a kind of fail address treating apparatus, as shown in Figure 5, comprising: processor 51, first memory 52, second memory 53 and BIOS storer 54, this device can be PC or server, perhaps other equipment.
In the present embodiment, described BIOS storer 54 stores bios program code, reads these bios program codes after processor 51 powers on from described BIOS storer 54, and processor 51 is carried out being implemented as follows of these program codes:
Processor 51 is for the fail address of the storage unit that occurs in the first memory 52 that reads second memory 53 storages losing efficacy.Wherein, described fail address is to store after detecting the unit that occurs losing efficacy by operating system OS in operational process, and described second memory is nonvolatile memory.
Described processor 51, the failure type that also is used for the storage unit that lost efficacy when appearance corresponding to the fail address that described processor 51 reads are the distribution type of hard failure and described fail address when being static allocation, and starting protection is machine-processed.
Described processor 51 when also being dynamic assignment for the distribution type that when storage unit corresponding to described fail address is hard failure and described fail address, shields described fail address.After subsequent treatment device 51 starts OS, the fail address can be stored in the second memory 53 if in the OS operational process, detect the storage unit that occurs losing efficacy.
Further, described processor 51, also be used in reading the first memory that second memory stores, occurring after the fail address of the storage unit that lost efficacy, the failure type of the storage unit that appearance corresponding to the fail address that judgement is read lost efficacy, described failure type comprises soft failure and hard failure, and judge the distribution type of described fail address, described distribution type comprises dynamic assignment and static allocation.
Further, described processor 51, when the failure type that also is used for the storage unit that the appearance corresponding in the described fail address of judging lost efficacy is soft failure, the described fail address of deletion from described second memory 53.
Further, described processor 51, the failure type that also is used for the storage unit that lost efficacy when appearance corresponding to the described fail address of judging are the distribution type of hard failure and described fail address when being static allocation, and starting protection is machine-processed.
Further, described processor 51 also is used for: storage unit corresponding to the fail address of reading write and read test; Wherein, said write and read test are data writing in described storage unit, again reading out data from described storage unit; When data that read in the described storage unit during with the data consistent that writes, determine that described storage unit is soft failure; When the data that read in the described storage unit and the data that write are inconsistent, determine that described storage unit is hard failure.
Further, described first memory 52 comprises dynamic RAM DRAM, and described second memory 53 comprises EEPROM (Electrically Erasable Programmable Read Only Memo) EEPROM or flash storer.
Further, described start unit 36 specifically is used for: the prompting warning is also out of service, or the starting system of laying equal stress on is warned in prompting.Described screen unit 32 specifically is used for: the page address scope at place, described fail address is set to reserved property, so that OS does not re-use described page address scope when described first memory is carried out read-write operation.
Further, the address of dynamic assignment comprises: the transmitting-receiving buffer zone of the address space that the address space that the OS process takies, consumer process take and I/O I/O equipment;
The address of static allocation comprises: the address space that the OS kernel takies, BIOS buffer zone and screen buffer.
A kind of fail address provided by the invention treating apparatus, the failure type of the storage unit that lost efficacy when appearance corresponding to the fail address of record is that the distribution type of hard failure and described fail address is when being dynamic assignment, shield described fail address, with in the prior art directly storage unit that all fail addresses are corresponding all be set to reserved property and compare, distinguish soft failure address and hard failure address, only the dynamically allocate address with hard failure shields, avoided memory read-write to make mistakes, and the address space of soft failure can continue to use in the internal memory, has improved the utilization factor of memory headroom.
And; the failure type of the storage unit that lost efficacy when appearance corresponding to described fail address is that the distribution type of hard failure and described fail address is when being static allocation; starting protection mechanism; with in the prior art directly storage unit that all fail addresses are corresponding all be set to reserved property and compare; with the Address Recognition of static allocation out; the pre-cooling protection mechanism is avoided processor to continue operation gross error is occured.
Through the above description of the embodiments, the those skilled in the art can be well understood to the present invention and can realize by the mode that software adds essential common hardware, can certainly pass through hardware, but the former is better embodiment in a lot of situation.Based on such understanding, the part that technical scheme of the present invention contributes to prior art in essence in other words can embody with the form of software product, this computer software product is stored in the storage medium that can read, floppy disk such as computing machine, hard disk or CD etc., comprise some instructions with so that computer equipment (can be personal computer, server, the perhaps network equipment etc.) carry out the described method of each embodiment of the present invention.
The above; be the specific embodiment of the present invention only, but protection scope of the present invention is not limited to this, anyly is familiar with those skilled in the art in the technical scope that the present invention discloses; the variation that can expect easily or replacement all should be encompassed within protection scope of the present invention.Therefore, protection scope of the present invention should be as the criterion with the protection domain of described claim.
Claims (16)
1. a fail address disposal route is characterized in that, the unloading phase of being applied to basic input-output system BIOS, described method comprises:
Read the fail address that occurs the storage unit of inefficacy in the first memory of storing in the second memory; Wherein, store after detecting the unit that occurs losing efficacy by operating system OS in operational process described fail address, and described second memory is nonvolatile memory;
When the failure type of judging the storage unit that appearance corresponding to described fail address lost efficacy is hard failure, and the distribution type of described fail address shields described fail address when being dynamic assignment.
2. fail address according to claim 1 disposal route is characterized in that, described read the fail address that occurs the storage unit that lost efficacy in the first memory of storing in the second memory after, described method also comprises:
Judge the failure type of the storage unit that appearance corresponding to described fail address lost efficacy, described failure type comprises soft failure and hard failure;
Judge the distribution type of described fail address, described distribution type comprises dynamic assignment and static allocation.
3. fail address according to claim 2 disposal route is characterized in that described method also comprises:
When the failure type of judging the storage unit that appearance corresponding to described fail address lost efficacy is soft failure, then from described second memory, delete described fail address.
4. fail address according to claim 1 disposal route is characterized in that, also comprises:
When the failure type of judging the storage unit that appearance corresponding to described fail address lost efficacy is hard failure, and the distribution type of described fail address is when being static allocation, then starting protection mechanism.
5. fail address according to claim 2 disposal route is characterized in that, the failure type of the storage unit that appearance corresponding to the described fail address of described judgement lost efficacy comprises:
The storage unit that appearance corresponding to described fail address lost efficacy writes and read test; Wherein, said write and read test are data writing in described storage unit, again reading out data from described storage unit;
If the data that read in the described storage unit and the data consistent that writes, then described storage unit is soft failure;
If the data that read in the described storage unit are inconsistent with the data that write, then described storage unit is hard failure.
6. each described fail address disposal route is characterized in that described first memory comprises dynamic RAM DRAM according to claim 1-5, and described second memory comprises EEPROM (Electrically Erasable Programmable Read Only Memo) EEPROM or flash storer.
7. fail address according to claim 4 disposal route is characterized in that,
Described starting protection mechanism comprises: the prompting warning is also out of service; Or the starting system of laying equal stress on is warned in prompting;
The described fail address of described shielding comprises: the page address scope at place, described fail address is set to reserved property, so that OS does not re-use described page address scope when described first memory is carried out read-write operation.
8. fail address according to claim 2 disposal route is characterized in that,
The address of dynamic assignment comprises: the transmitting-receiving buffer zone of the address space that the address space that the OS process takies, consumer process take and I/O I/O equipment;
The address of static allocation comprises: the address space that the OS kernel takies, BIOS buffer zone and screen buffer.
9. a fail address treating apparatus is characterized in that, the unloading phase of being applied to basic input-output system BIOS, described device comprises:
Reading unit is used for reading the fail address that occurs the storage unit that lost efficacy in the first memory that second memory stores; Wherein, store after detecting the unit that occurs losing efficacy by operating system OS in operational process described fail address, and described second memory is nonvolatile memory;
Screen unit, be used for when the failure type of judging the storage unit that appearance corresponding to fail address that described reading unit reads lost efficacy be hard failure, and the distribution type of described fail address shields described fail address when being dynamic assignment.
10. fail address according to claim 9 treating apparatus is characterized in that, also comprises:
The first judging unit, be used for after described reading unit reads the fail address that occurs the storage unit that lost efficacy in the first memory that second memory stores, judge the failure type of the storage unit that appearance corresponding to fail address that described reading unit reads lost efficacy, described failure type comprises soft failure and hard failure;
The second judging unit, for the distribution type of judging described fail address, described distribution type comprises dynamic assignment and static allocation.
11. fail address according to claim 10 treating apparatus is characterized in that, also comprises:
Delete cells when the failure type that is used for the storage unit that lost efficacy when appearance corresponding to the described fail address of described the first judgment unit judges is soft failure, is deleted described fail address from described second memory.
12. fail address according to claim 9 treating apparatus is characterized in that, also comprises:
Protected location; failure type for the storage unit that lost efficacy when appearance corresponding to the described fail address of described the first judgment unit judges is hard failure; and when the distribution type of the described fail address of described the second judgment unit judges is static allocation, starting protection mechanism.
13. fail address according to claim 10 treating apparatus is characterized in that, described the first judging unit comprises:
Test module, storage unit corresponding to fail address that is used for described reading unit is read writes and read test; Wherein, said write and read test are data writing in described storage unit, again reading out data from described storage unit; When data that read in the described storage unit during with the data consistent that writes, determine that described storage unit is soft failure; When the data that read in the described storage unit and the data that write are inconsistent, determine that described storage unit is hard failure.
14. each described fail address treating apparatus according to claim 9-13, it is characterized in that, described first memory comprises dynamic RAM DRAM, and described second memory comprises EEPROM (Electrically Erasable Programmable Read Only Memo) EEPROM or flash storer.
15. fail address according to claim 12 treating apparatus is characterized in that,
Described protected location specifically is used for: the prompting warning is also out of service; Or the starting system of laying equal stress on is warned in prompting;
Described screen unit specifically is used for: the page address scope at place, described fail address is set to reserved property, so that OS does not re-use described page address scope when described first memory is carried out read-write operation.
16. the treating apparatus of fail address according to claim 10 is characterized in that,
The address of dynamic assignment comprises: the transmitting-receiving buffer zone of the address space that the address space that the OS process takies, consumer process take and I/O I/O equipment;
The address of static allocation comprises: the address space that the OS kernel takies, BIOS buffer zone and screen buffer.
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