CN111105392B

CN111105392B - Display performance testing method and device and storage medium

Info

Publication number: CN111105392B
Application number: CN201911166577.9A
Authority: CN
Inventors: 袁峰; 付发田; 李斌; 龙辉琴
Original assignee: Purple Light Communication Huizhou Co ltd
Current assignee: Purple Light Communication Huizhou Co ltd
Priority date: 2019-11-25
Filing date: 2019-11-25
Publication date: 2022-12-06
Anticipated expiration: 2039-11-25
Also published as: CN111105392A

Abstract

The present disclosure relates to the field of display technologies, and in particular, to a method and an apparatus for testing display performance, and a storage medium. The method comprises the following steps: the method comprises the steps that a test device sends a preset instruction to a tested chip, wherein the preset instruction is used for controlling the tested chip to display target content; acquiring an original image frame of the target content from a display interface of the tested chip; and comparing the original image frame with a sample image frame, and analyzing to obtain a test result, wherein the sample image frame is a standard image frame of the target content stored in advance, and the test result is used for indicating the display performance of the tested chip. According to the embodiment of the invention, the automatic test of the display performance is realized, the test efficiency is improved, and the original image frame is directly obtained from the display interface of the tested chip by the test equipment, so that the test result obtained based on the original image frame is more accurate, and the test accuracy is improved.

Description

Display performance testing method and device and storage medium

Technical Field

The present disclosure relates to the field of display technologies, and in particular, to a display performance testing method and apparatus, and a storage medium.

Background

The display performance test method comprises a method for testing the display performance of different display interfaces of the chip.

In the related art, when testing the display performance of a chip, a tester needs to manually operate the tested chip through an input/output device to switch the displayed picture, and when the tester switches to one of the pictures, the tester needs to observe an image displayed on a display screen module connected to the tested chip by human eyes to check whether the picture is normally displayed.

However, in the method, the display performance is tested by adopting a manual testing mode, so that the testing efficiency is low, and the testing accuracy is low.

Disclosure of Invention

In view of this, the present disclosure provides a display performance testing method, device and storage medium. The technical scheme comprises the following steps:

in one aspect, a display performance testing method is provided, and is used in a testing device, and the method includes:

sending a preset instruction to a tested chip, wherein the preset instruction is used for controlling the tested chip to display target content;

acquiring an original image frame of the target content from a display interface of the tested chip;

and comparing the original image frame with a sample image frame to obtain a test result, wherein the sample image frame is a standard image frame of the target content stored in advance, and the test result is used for indicating the display performance of the tested chip.

In a possible implementation manner, the display interface is an interface between the chip to be tested and the display screen module.

In another possible implementation manner, the acquiring the original image frame of the target content from the display interface of the chip under test includes:

capturing original display data from the display interface of the tested chip, wherein the original display data are to-be-displayed data sent to the display screen module by the tested chip;

and extracting and splicing the original image frames of the target content from the original display data.

In another possible implementation manner, the comparing the original image frame with the sample image frame to obtain a test result includes:

and comparing the original image frame with the sample image frame to obtain a frame error rate, wherein the frame error rate is the proportion of the number of error frames and/or error frames to the total number of the original image frame.

In another possible implementation, the target content includes static display content, the original image frame includes a plurality of image frames, the sample image frame includes one image frame,

before comparing the original image frame with the sample image frame to obtain a frame error rate, the method further includes:

performing duplicate removal processing on the original image frames to obtain duplicate-removed original image frames, wherein the duplicate-removed original image frames comprise at least one image frame;

the comparing the original image frame with the sample image frame to obtain a frame error rate includes:

and comparing the original image frame subjected to the duplicate removal processing with the sample image frame to obtain a first frame error rate.

In another possible implementation, the target content includes dynamic display content, the original image frame and the sample image frame each include a plurality of frame images,

carrying out duplicate removal processing on the sample image frames to obtain the sample image frames subjected to duplicate removal processing, wherein the sample image frames subjected to duplicate removal processing comprise multi-frame image frames;

and comparing the original image frame with the multi-frame image frames corresponding to the sample image frames subjected to the de-duplication processing to obtain a second frame error rate.

In another possible implementation manner, the original image frames include N image frames, the sample image frames subjected to the deduplication processing include M image frames, both N and M are positive integers greater than 1, N is greater than M, and the comparing the original image frames with the multi-frame image frames corresponding to the sample image frames subjected to the deduplication processing to obtain a second frame error rate includes:

determining an image frame in the original image frame, which is the same as a first frame image frame of the sample image frames subjected to the deduplication processing, as an initial frame;

taking the initial frame as a 1 st image frame in the original image frames, and comparing an ith image frame in the original image frames with a jth image frame in the sample image frames after the de-duplication processing to obtain a first comparison result, wherein an initial value of i is a value 2, and an initial value of j is a value 1;

when the first comparison result is that the ith frame image frame in the original image frames is the same as the jth frame image frame in the sample image frames subjected to the de-duplication processing and i is smaller than N, adding 1 to the i, and continuously performing the step of comparing the ith frame image frame in the original image frames with the jth frame image frame in the sample image frames subjected to the de-duplication processing to obtain the first comparison result;

when the first comparison result is that the ith frame image frame in the original image frames is different from the jth frame image frame in the sample image frames subjected to the de-duplication processing, and j is smaller than M, comparing the ith frame image frame in the original image frames with the (j + 1) th frame image frame in the sample image frames subjected to the de-duplication processing to obtain a second comparison result;

when the second comparison result is that the ith frame image frame in the original image frames is the same as the (j + 1) th frame image frame in the sample image frames after the de-duplication processing, and i is smaller than N, adding 1 to both i and j, and continuing to perform the step of comparing the ith frame image frame in the original image frames with the jth frame image frame in the sample image frames after the de-duplication processing to obtain a first comparison result;

when the second comparison result is that the ith frame image frame in the original image frames is different from the (j + 1) th frame image frame in the sample image frames subjected to the de-duplication processing, determining that the ith to nth frame image frames in the original image frames are all error frames, and calculating the second frame error rate according to the frame number of the error frames;

when the i is equal to the N and/or the j is equal to the M, determining that the second frame error rate is zero.

In another possible implementation manner, the original image frame is an image frame corresponding to a specified local area of the target content;

before comparing the original image frame with the sample image frame to obtain a test result, the method further includes:

acquiring a pre-stored sample file, wherein the sample file is used for storing a standard image frame corresponding to the global area of the target content;

converting the coordinates of the designated local area into storage address coordinates in the sample file according to the resolution of the target content;

determining a standard image frame corresponding to the designated local area indicated by the storage address coordinates in the sample file as the sample image frame.

In another aspect, there is provided a display performance testing apparatus for use in a test device, the apparatus including:

the device comprises a sending module, a receiving module and a display module, wherein the sending module is used for sending a preset instruction to a tested chip, and the preset instruction is used for controlling the tested chip to display target content;

the acquisition module is used for acquiring the original image frame of the target content from the display interface of the tested chip;

and the comparison module is used for comparing the original image frame with a sample image frame to obtain a test result, wherein the sample image frame is a standard image frame of the target content which is stored in advance, and the test result is used for indicating the display performance of the chip to be tested.

In another possible implementation manner, the obtaining module is further configured to:

capturing original display data from the display interface of the tested chip, wherein the original display data are to-be-displayed data sent by the tested chip to the display screen module;

In another possible implementation manner, the comparison module is further configured to:

In another possible implementation, the target content includes static display content, the original image frames include a plurality of frame images, the sample image frames include one frame image frame,

the device, still include: a first deduplication module. The first duplicate removal module is configured to perform duplicate removal processing on the original image frames to obtain duplicate-removed original image frames, where the duplicate-removed original image frames include at least one image frame;

the comparison module is further configured to compare the original image frame after the deduplication processing with the sample image frame to obtain a first frame error rate.

In another possible implementation, the target content includes dynamic display content, the original image frame and the sample image frame each include a multi-frame image frame,

the device, still include: and a second deduplication module. The second deduplication module is configured to perform deduplication processing on the sample image frames to obtain deduplicated sample image frames, where the deduplicated sample image frames include multi-frame image frames;

the comparison module is further configured to compare the original image frame with the multi-frame image frames corresponding to the sample image frames subjected to the deduplication processing, so as to obtain a second frame error rate.

In another possible implementation manner, the original image frames include N image frames, the sample image frames after the deduplication processing include M image frames, where N and M are both positive integers greater than 1, and N is greater than M, and the comparison module is further configured to:

determining an image frame, which is the same as a first frame image frame of the sample image frames subjected to the de-duplication processing, in the original image frames as an initial frame;

when the first comparison result is that the ith frame image frame in the original image frames is the same as the jth frame image frame in the sample image frames after the de-duplication processing, and i is smaller than N, adding 1 to i, and continuing to perform the step of comparing the ith frame image frame in the original image frames with the jth frame image frame in the sample image frames after the de-duplication processing to obtain a first comparison result;

when i is equal to N and/or j is equal to M, determining that the second frame error rate is zero.

the device, still include: and determining a module. The determining module is configured to acquire a pre-stored sample file, where the sample file is used to store a standard image frame corresponding to a global area of the target content; converting the coordinates of the designated local area into storage address coordinates in the sample file according to the resolution of the target content; determining a standard image frame corresponding to the designated local area indicated by the storage address coordinate as the sample image frame in the sample file.

According to another aspect of the present disclosure, there is provided a test apparatus including: a processor; a memory for storing processor-executable instructions; wherein the processor is configured to perform the method described above.

In another aspect, a non-transitory computer readable storage medium is provided having stored thereon computer program instructions which, when executed by a processor, implement the above-described method.

The method comprises the steps that a preset instruction is sent to a tested chip through a testing device, and the preset instruction is used for controlling the tested chip to display target content; acquiring an original image frame of target content from a display interface of a chip to be tested; comparing the original image frame with the sample image frame to obtain a test result, wherein the test result is used for indicating the display performance of the tested chip; therefore, the automatic test of the display performance of the chip is realized, the test efficiency is improved, and the original image frame is directly obtained by the test equipment from the display interface of the tested chip, so that the test result obtained based on the original image frame is more accurate, and the test accuracy is improved.

Other features and aspects of the present disclosure will become apparent from the following detailed description of exemplary embodiments, which proceeds with reference to the accompanying drawings.

Drawings

The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate exemplary embodiments, features, and aspects of the disclosure and, together with the description, serve to explain the principles of the disclosure.

FIG. 1 shows a schematic diagram of a test system to which embodiments of the present disclosure relate;

fig. 2 is a schematic diagram illustrating a hardware structure of a bridge board according to an embodiment of the present disclosure;

FIG. 3 illustrates a flow chart of a display performance testing method provided by an exemplary embodiment of the present disclosure;

FIG. 4 illustrates a flow chart of a display performance testing method provided by another exemplary embodiment of the present disclosure;

FIG. 5 is a schematic diagram illustrating a method for testing display performance according to an exemplary embodiment of the present disclosure relating to image contrast;

FIG. 6 shows a flowchart of a display performance testing method provided by another exemplary embodiment of the present disclosure;

fig. 7 is a schematic structural diagram illustrating a display performance testing apparatus according to an embodiment of the present disclosure.

Detailed Description

Various exemplary embodiments, features and aspects of the present disclosure will be described in detail below with reference to the accompanying drawings. In the drawings, like reference numbers can indicate functionally identical or similar elements. While the various aspects of the embodiments are presented in drawings, the drawings are not necessarily drawn to scale unless specifically indicated.

The word "exemplary" is used exclusively herein to mean "serving as an example, embodiment, or illustration. Any embodiment described herein as "exemplary" is not necessarily to be construed as preferred or advantageous over other embodiments.

Furthermore, in the following detailed description, numerous specific details are set forth in order to provide a better understanding of the present disclosure. It will be understood by those skilled in the art that the present disclosure may be practiced without some of these specific details. In some instances, methods, means, elements and circuits that are well known to those skilled in the art have not been described in detail so as not to obscure the present disclosure.

In the correlation technique, along with terminal equipment's rising, the display screen module receives people's attention more and more as the main human-computer interaction interface of terminal equipment, and each major enterprise inputs the capital research and development pixel higher, and the color is more bright-colored, refreshes faster display screen. The focus of attention is on the update of the display screen module. However, as the main control chip of the terminal device, in order to send data to the display module, a plurality of Interface standards are developed in the industry, such as a Central Processing Unit (CPU) Interface, a red, green and blue (RGB) Interface, a Serial Peripheral Interface (SPI) Interface, a mobile industry processor Interface-Serial display Interface (MIPI-DSI) Interface, and the like. How to test the accuracy of the image data sent to the display screen module through the interfaces, that is, how to test the display function of the main control chip, a suitable and effective test method is not provided at present. At present, various universal testing methods are still manual testing, and whether the image displayed on the display screen module is displayed normally is observed through human eyes. The manual testing method has low testing efficiency and low testing accuracy. And for dynamic video display, manual testing is ineffective.

Therefore, the present disclosure provides a display performance testing method, apparatus, terminal and storage medium to solve the above-mentioned problems in the related art. According to the technical scheme, a preset instruction is sent to the tested chip through the testing equipment, and the preset instruction is used for controlling the tested chip to display target content; acquiring an original image frame of target content from a display interface of a chip to be tested; comparing the original image frame with the sample image frame to obtain a test result, wherein the test result is used for indicating the display performance of the tested chip; therefore, the automatic test of the display performance is realized, the test efficiency is improved, and the original image frame is directly obtained by the test equipment from the display interface of the tested chip, so that the test result obtained based on the original image frame is more accurate, and the test accuracy is improved.

Before explaining the embodiments of the present disclosure, an application scenario of the embodiments of the present disclosure is explained. Referring to fig. 1, a schematic diagram of a test system according to an embodiment of the disclosure is shown. The test system includes a test platform 100, test equipment 130, and computer equipment 140. The testing platform 100 includes a chip testing board 110 and a bridge board 120.

The chip testing single board 110 is connected to the bridge board 120 through a display interface. In this embodiment, the display interface is only an MIPI interface for example.

The computer device 140 is connected to the chip testing board 110 and the testing device 130 through a Universal Serial Bus (USB) data line. For example, the computer device 140 is connected to the chip testing board 110 through a USB2.0 data line, and the computer device 140 is connected to the testing device 130 through a USB3.0 data line.

The testing device 130 is configured to send a preset instruction to the chip under test on the chip testing board 110 through the computer device 140, where the preset instruction is used to control the chip under test to display target content. Optionally, the testing device 130 is configured to send a preset instruction to the chip to be tested on the chip testing board 110 through the computer device 140, where the chip to be tested outputs a signal on the MIPI interface and then inputs the signal to the bridge board 120, and the preset instruction is used to control the chip to be tested on the chip testing board 110 to display the target content.

The bridge board 120 includes a display module 121 and a bridge chip 122.

Optionally, the bridge board 120 is configured to distribute the MIPI signal input by the chip testing board 110 into two paths of signals through a signal distribution network, where one path of signal is output to the display screen module 121, so that the display screen module 121 can normally display in operation; one signal is output to the bridge chip 122; and ensures the signal integrity of the two signals.

And a bridge board 120 for converting the MIPI signal into an LVDS signal and a CMOS signal and outputting the LVDS signal and the CMOS signal to the test device 130.

Schematically, a hardware structure diagram of the bridge board 120 is shown in fig. 2. The bridge board 120 is configured to send the MIPI signal to the signal distribution network 124 through the high-speed signal connector 123 after receiving the MIPI signal input by the chip testing board 110, distribute the MIPI signal into two paths of signals through the signal distribution network, where one path of signal is output to the display screen module 121, and the other path of signal is output to the bridge chip 122. The bridge board 120 is further configured to convert the MIPI signal into an LVDS signal and a CMOS signal through the bridge chip 122 and output the LVDS signal and the CMOS signal to the high-speed signal connector 125, and output the LVDS signal and the CMOS signal to the test device 130 through the high-speed signal connector 125.

Optionally, the testing device 130 is further configured to receive the LVDS signal and the CMOS signal output by the bridge board 120, and process the received LVDS signal and the received CMOS signal to obtain an original image frame of the target content.

Optionally, the testing device 130 is further configured to compare the original image frame with the sample image frame to obtain a testing result, where the testing result is used to indicate the display performance of the chip under test on the chip testing board 110.

It should be noted that, the above-mentioned hardware may have different names in other test systems, but has the same or similar functions, and the embodiment of the present disclosure does not limit this.

Referring to fig. 3, a flowchart of a display performance testing method according to an exemplary embodiment of the present disclosure is shown. The embodiment of the present disclosure is illustrated in a case where the display performance test method is applied to the test apparatus shown in fig. 1. The display performance test method comprises the following steps:

step 301, sending a preset instruction to the tested chip, where the preset instruction is used to control the tested chip to display target content.

And the test equipment sends a preset instruction to the tested chip. Optionally, the testing device sends a preset instruction to the chip to be tested through the computer device. The chip to be tested is a device to be tested with a display function.

Optionally, the preset instruction is used to control the tested chip to display the target content in a preset scene, where the preset scene includes one of power on, power off, making a call, displaying an image, or playing a video.

The target content is preset display content. Optionally, the target content includes static display content or dynamic display content. Illustratively, the target content is a target video.

Step 302, obtaining an original image frame of the target content from a display interface of the tested chip.

The test equipment acquires an original image frame of target content from a display interface of the tested chip. Optionally, the display interface is an interface between the chip to be tested and the display screen module. The display interface is an interface for the tested chip to send data to be displayed to the display screen module.

Optionally, the type of the display interface includes one of a CPU interface, an RGB interface, an SPI interface, and an MIPI interface.

The original image frames of the target content include at least one original image frame of the target content. Optionally, the original image frame of the target content includes a plurality of original image frames, and in this case, the original image frames are also referred to as original video streams.

Step 303, comparing the original image frame with a sample image frame to obtain a test result, where the sample image frame is a standard image frame of a pre-stored target content, and the test result is used to indicate the display performance of the chip under test.

The testing equipment acquires a sample image frame of the pre-stored target content and compares an original image frame of the target content with the sample image frame to obtain a testing result.

The sample image frames of the target content include at least one sample image frame of the target content. Optionally, the sample image frames of the target content include a plurality of frames of sample image frames, in which case the sample image frames are also referred to as sample video streams.

Optionally, the sample image frames are stored in memory on board the test equipment. For example, the memory is a small outline dual in-line memory module (SO-DIMM).

The test equipment stores a preset corresponding relation between the sample image frame and the storage address. Optionally, the preset corresponding relationship includes a one-to-one corresponding relationship between a plurality of frame sample image frames of the target content and a plurality of storage addresses. And the storage address corresponding to each frame of the sample image frame is the storage starting address and/or the storage ending address of the sample image frame.

Optionally, the firmware program of the testing device maintains the storage addresses of each frame of the sample image frames as a list, and stores each frame of the sample image frames at the corresponding storage addresses of the list. And when the sample image frame of the target content needs to be acquired, reading the sample image frame on the corresponding storage address from the memory.

Optionally, the testing device compares the original image frame of the target content with the sample image frame by frame and pixel point by pixel point to obtain a testing parameter, and the testing parameter is used for indicating the display performance of the chip to be tested. For example, the test parameter includes a bit error rate or a frame error rate of a single frame image frame. The present embodiment does not limit the setting manner of the test parameters.

To sum up, the embodiment of the present disclosure sends a preset instruction to the chip under test through the test device, where the preset instruction is used to control the chip under test to display target content; acquiring an original image frame of target content from a display interface of a chip to be tested; comparing the original image frame with the sample image frame to obtain a test result, wherein the test result is used for indicating the display performance of the tested chip; therefore, the automatic test of the display performance is realized, the test efficiency is improved, and the original image frame is directly obtained by the test equipment from the display interface of the tested chip, so that the test result obtained based on the original image frame is more accurate, and the test accuracy is improved.

Referring to fig. 4, a flowchart of a display performance testing method according to another exemplary embodiment of the disclosure is shown. The embodiment of the present disclosure is illustrated in a case where the display performance test method is applied to the test apparatus shown in fig. 1. The display performance test method comprises the following steps:

step 401, sending a preset instruction to the chip to be tested, wherein the preset instruction is used for controlling the chip to be tested to display target content.

The process of sending the preset instruction to the chip to be tested by the testing device may refer to the relevant details in the above embodiments, and details are not described herein again.

And 402, capturing original display data from a display interface of the tested chip, wherein the original display data is data to be displayed sent to the display screen module by the main control chip.

The test equipment realizes the analysis of an interface protocol in a Field Programmable Gate Array (FPGA), and captures original display data from a display interface of a chip to be tested.

Optionally, the display interface is an interface between a main control chip of the chip to be tested and the display screen module. The type of the display interface includes one of a CPU interface, an RGB interface, an SPI interface, and an MIPI interface.

Taking the example that the display interface between the main control chip of the chip to be tested and the display screen module is an MIPI-DSI interface, the main steps of the MIPI-DSI protocol analysis include but are not limited to: after receiving the CMOS signal and the LVDS signal output from the bridge board of the chip under test, the test device performs state recognition switching according to the CMOS signal, for example, switching a Low Power (LP) mode to a High Speed (HS) mode; and resolving the LVDS signals in the HS mode, deserializing, acquiring frame start according to a preset synchronous sequence, and restoring original display data through channel alignment processing. For example, the predetermined synchronization sequence is "01101".

Step 403, extracting and splicing the original image frame of the target content from the original display data.

Optionally, the test device extracts and splices the original image frame of the target content from the original display data.

Taking a display interface between a main control chip of a chip to be tested and a display screen module as an example, the original display data includes display data of four channels, the test equipment identifies a horizontal synchronization signal (HSYNC) _ START, HSYNC _ END, a vertical synchronization signal (VSYNC) _ START, VSYNC _ END, a FRAME (FRAME) _ START, and FRAME _ END according to a display type of the MIPI-DSI interface, extracts at least one image FRAME from the display data of the four channels, and splices the at least one image FRAME into the original image FRAME of target content.

Step 404, comparing the original image frame with the sample image frame to obtain a frame error rate, where the frame error rate is a ratio of the number of error frames and/or error frames to the total number of original image frames.

Optionally, the error frame includes a frame in which image data in the original image frame is in error, and the misplaced frame includes a frame in which an error occurs in a position of the original image frame relative to other frames. In order to detect not only data errors in an original image frame, but also defects such as frame dislocation and the like before and after the frame, the two defects are used for measuring the display function of a chip by uniformly testing a parameter 'frame error rate'. And the testing equipment compares the original image frame with the sample image frame to obtain a frame error rate. The frame error rate is the proportion of the number of error frames and/or error frames in the total number of original image frames.

Optionally, the testing device calculates a quotient of the number of correctly displayed image frames and the original image frames, and determines a difference between 1 and the quotient as the frame error rate.

The frame error rate is used for indicating the display performance of the tested chip. The frame error rate is in negative correlation with the display performance of the tested chip. That is, the larger the value of the frame error rate is, the worse the display performance of the tested chip is; the smaller the frame error rate value is, the better the display performance of the tested chip is.

Optionally, the target content includes static display content or dynamic display content, and the testing device compares the original image frame with the sample image frame to obtain a frame error rate, which includes but is not limited to the following several possible implementation manners.

In one possible implementation, the target content includes static display content, the original image frame includes a plurality of frame images, and the sample image frame includes one frame image frame. Before the testing device compares the original image frame with the sample image frame to obtain the frame error rate, the method further comprises the following steps: the test equipment performs duplicate removal processing on the original image frame to obtain a duplicate-removed original image frame, wherein the duplicate-removed original image frame comprises at least one image frame. After the deduplication processing, the test equipment compares the original image frame after the deduplication processing with the sample image frame to obtain a first frame error rate.

When the target content comprises static display content, although the human eyes see the static display content, a continuous video stream with a preset frame rate is actually output from the display interface of the tested chip. If the detected chip is not defective, each original image frame in the output video stream should be the same, that is, the previous and subsequent frames in the video stream are repeated image frames. However, if the detected chip has defects, the image frames of the previous and subsequent frames in the output video stream will be inconsistent, and the efficiency of the later detection can be improved by removing the same image frame in the video stream.

Optionally, the original image frame includes a multi-frame image frame, and the performing, by the testing device, a deduplication process on the original image frame to obtain a deduplicated original image frame includes: first, the total frame rate of the original image frames is determined, and is marked as N. The testing equipment takes the 1 st frame image as a sample, compares each pixel point data corresponding to the 1 st frame image frame and the 2 nd frame image frame in the original image frames, if the comparison result shows that the 1 st frame image frame is consistent with the 2 nd frame image frame, removes the 2 nd frame image frame, only keeps the 1 st frame image frame, and records the image frame number with the 1 st frame image feature as 2. The number of image frames having the 1 st frame image feature is recorded in preparation for the subsequent calculation of the frame error rate. Continuously comparing the 3 rd frame image frame with the subsequent 1 st frame image frame, if the 1 st frame image frame is inconsistent with the 3 rd frame image frame, adding the 3 rd frame into the sample library, and simultaneously recording the image frame number with the 3 rd frame image feature as 1; at this time, there are two image frames in the sample library, which are the 1 st frame image frame and the 3 rd frame image frame. And continuously comparing the 4 th frame image frame with the 1 st frame image frame and the 3 rd frame image frame respectively, if the 4 th frame image frame is the same as the 1 st frame image frame, removing the 4 th frame image frame, and increasing the number of the image frames with the 1 st frame image characteristics by 1. If the 4 th image frame is the same as the 3 rd image frame, the 4 th image frame is removed and the number of image frames having the 3 rd image feature is increased by 1. If the 4 th frame image frame is not the same as the 1 st frame and the 3 rd frame, adding the 4 th frame image frame into the sample library, and recording the image frame number with the 4 th frame image characteristic as 1. And repeating the comparison process until the comparison of the last frame, namely the image frame of the Nth frame is finished, and ending the process. After the comparison is completed, two-dimensional data is obtained, and the image frames in the sample library and the image frame number corresponding to the image frames are respectively recorded.

After the deduplication processing, the test equipment compares the original image frame subjected to the deduplication processing with the sample image frame to obtain a comparison result, where the comparison result is one of a third comparison result and a fourth comparison result. The third comparison result is that one image frame in the original image frames subjected to the de-duplication processing is the same as the sample image frame, and the fourth comparison result is that each image frame in the original image frames subjected to the de-duplication processing is different from the sample image frame.

In an illustrative example, the original image frames include 10 image frames, 1 image frame in the middle is an error frame, the test device performs deduplication processing on the original image frames to obtain the deduplicated original image frames, and the deduplicated original image frames are 2 image frames. After the deduplication processing, the test equipment compares the original image frames subjected to the deduplication processing with the sample image frames respectively to obtain a first frame error rate of 1-9/10=0.1.

In another possible implementation manner, the target content includes dynamic display content, the original image frame and the sample image frame both include multi-frame image frames, and before comparing the original image frame with the sample image frame to obtain a frame error rate, the method further includes: the test equipment performs duplicate removal processing on the sample image frames to obtain the sample image frames subjected to duplicate removal processing, wherein the sample image frames subjected to duplicate removal processing comprise multi-frame image frames and the sequence between the image frames. And the test equipment compares the original image frame with the multi-frame image frames corresponding to the sample image frames subjected to the de-duplication processing respectively to obtain a second frame error rate.

When the target content comprises the dynamic display content, the sample image frame of the dynamic display content comprises a plurality of frame images, and a plurality of same frames are included between adjacent frames in the plurality of frame images, so as to facilitate subsequent comparison, the sample image frame can be subjected to deduplication processing firstly to obtain a sample image frame subjected to deduplication processing, and the sample image frame subjected to deduplication processing is stored in the test equipment as a sample file.

Optionally, the comparing, by the testing device, the original image frame with the multiple image frames corresponding to the sample image frame after the deduplication processing to obtain a second frame error rate includes: and comparing the front frame and the rear frame of the original image frame with the current frame of the sample file respectively from the initial frame to obtain two results, and performing front and rear frame position detection circulation according to the two comparison results. If the original image frame pair ratio can be cycled to take out all sample files, the original image frame correctly covers the sequence relation of the initial frame and the front and back frames of the sample file.

Optionally, the original image frame includes N image frames, the sample image frame after the deduplication processing includes M image frames, N and M are both positive integers greater than 1, and N is greater than M. The method for obtaining the second frame error rate by comparing the original image frame with the multiframe image frames corresponding to the sample image frames after the de-duplication processing by the testing equipment comprises the following steps: determining an image frame, which is the same as a first frame image frame of the sample image frames subjected to the deduplication processing, in the original image frames as an initial frame; taking the initial frame as a 1 st frame image frame in the original image frames, and comparing an ith frame image frame in the original image frames with a jth frame image frame in the sample image frames subjected to the de-duplication processing to obtain a first comparison result, wherein the initial value of i is a numerical value 2, and the initial value of j is a numerical value 1; when the first comparison result is that the ith frame image frame in the original image frame is the same as the jth frame image frame in the sample image frame after the duplication removal processing, and i is smaller than N, adding 1 to i, and continuously performing the step of comparing the ith frame image frame in the original image frame with the jth frame image frame in the sample image frame after the duplication removal processing to obtain the first comparison result; when the first comparison result is that the ith frame image frame in the original image frames is different from the jth frame image frame in the sample image frames subjected to the de-duplication processing, and j is smaller than M, comparing the ith frame image frame in the original image frames with the (j + 1) th frame image frame in the sample image frames subjected to the de-duplication processing to obtain a second comparison result; when the second comparison result is that the ith frame image frame in the original image frame is the same as the (j + 1) th frame image frame in the sample image frame after the de-duplication processing, and i is less than N, adding 1 to both i and j, and continuously performing the step of comparing the ith frame image frame in the original image frame with the jth frame image frame in the sample image frame after the de-duplication processing to obtain a first comparison result; when the second comparison result is that the ith frame image frame in the original image frame is different from the (j + 1) th frame image frame in the sample image frame after the duplicate removal processing, determining that the ith to nth frame image frames in the original image frame are error frames, and calculating a second frame error rate according to the frame number of the error frames; and when i is equal to N and/or j is equal to M, determining that the second frame error rate is zero.

In one illustrative example, as shown in fig. 5, the original image frames include 100 image frames, and the sample image frames after the deduplication process include 20 image frames. The test equipment determines an image frame, which is the same as the 1 st frame image frame of the sample image frame after the deduplication processing, in the original image frames as an initial frame, namely the initial frame is the 1 st frame image frame in the original image frames; comparing a 2 nd image frame in the original image frames with a 1 st image frame in the sample image frames after the de-duplication processing from the initial frame, and determining that the 2 nd image frame in the original image frames is a correctly displayed image frame when the comparison result is that the 2 nd image frame in the original image frames is the same as the 1 st image frame in the sample image frames after the de-duplication processing; comparing the 3 rd image frame in the original image frame with the 1 st image frame in the sample image frame after the duplicate removal processing, and determining that the 3 rd image frame in the original image frame is the correctly displayed image frame when the comparison result is that the 3 rd image frame in the original image frame is the same as the 1 st image frame in the sample image frame after the duplicate removal processing; comparing a 4 th image frame in the original image frames with a 1 st image frame in the sample image frames after the duplicate removal processing, comparing the 4 th image frame in the original image frames with a 2 nd image frame in the sample image frames after the duplicate removal processing when the comparison result is that the 4 th image frame in the original image frames is different from the 1 st image frame in the sample image frames after the duplicate removal processing, and determining that the 4 th image frame in the original image frames is an image frame which is correctly displayed when the comparison result is that the 4 th image frame in the original image frames is the same as the 2 nd image frame in the sample image frames after the duplicate removal processing; comparing a 5 th image frame in the original image frames with a 2 nd image frame in the sample image frames after the duplicate removal processing, and determining that the 5 th image frame in the original image frames is a correctly displayed image frame when the comparison result is that the 5 th image frame in the original image frames is the same as the 2 nd image frame in the sample image frames after the duplicate removal processing; comparing a 6 th image frame in the original image frames with a 2 nd image frame in the sample image frames after the duplicate removal processing, comparing the 6 th image frame in the original image frames with a 3 rd image frame in the sample image frames after the duplicate removal processing when the comparison result is that the 6 th image frame in the original image frames is different from the 2 nd image frame in the sample image frames after the duplicate removal processing, and determining that the 6 th image frame in the original image frames is a correctly displayed image frame when the comparison result is that the 6 th image frame in the original image frames is the same as the 3 rd image frame in the sample image frames after the duplicate removal processing; comparing a 7 th image frame in the original image frames with a 3 rd image frame in the sample image frames after the duplicate removal processing, and determining that the 7 th image frame in the original image frames is a correctly displayed image frame when the comparison result is that the 7 th image frame in the original image frames is the same as the 3 rd image frame in the sample image frames after the duplicate removal processing; and repeating the steps until the 100 th image frame in the original image frame is compared with the 20 th image frame in the sample image frame after the duplicate removal processing, and when the comparison result is that the 100 th image frame in the original image frame is the same as the 20 th image frame in the sample image frame after the duplicate removal processing, determining that the 100 th image frame in the original image frame is the correctly displayed image frame, the number of the correctly displayed image frames in the original image frame is 100, and determining that the second frame error rate is 0.

Since only some specific image areas of the target content are focused under some test conditions, area extraction is required to be performed on the global area of the target content. Optionally, the firmware program of the testing device converts the area coordinates of the designated local area into storage address coordinates according to the resolution of the target content, sets a mask value according to the storage address coordinates, and performs an and operation on the mask values of the original image frame and the sample image frame when performing a comparison operation between the original image frame and the sample image frame, thereby completing the area capture.

Optionally, the original image frame in the above embodiment is an image frame corresponding to a specified local area of the target content. Before the testing device compares the original image frame with the sample image frame to obtain the testing result, the method further comprises the following steps: the method comprises the steps that a testing device obtains a pre-stored sample file, wherein the sample file is used for storing standard image frames corresponding to a global area of target content; converting the coordinates of the designated local area into storage address coordinates in the sample file according to the resolution of the target content; and determining the standard image frame corresponding to the specified local area indicated by the storage address coordinate as a sample image frame in the sample file. For example, the resolution of the target content is 1920 × 1080.

Wherein, the designated local area is a local area pre-designated in the global area. The local regions are designated as a subset of the global regions.

Alternatively, the Sample file is also called a golden Frame file (English). The sample file stores the storage address coordinates of each position of the global area of the target content. The testing equipment converts the coordinates of the appointed local area into the storage address coordinates in the sample file according to the resolution of the target content, then determines the corresponding appointed local area in the global area according to the converted storage address coordinates, and determines the standard image frame corresponding to the appointed local area as the sample image frame.

It should be noted that, when the test device compares the original image frame with the sample image frame, the original image frame and the sample image frame are two image frames corresponding to the same area of the target content. Namely, the original image frame is the image frame of the global area of the target content, and the sample image frame compared with the original image frame is the standard image frame of the global area of the target content stored in advance; the original image frame is an image frame of a designated local area of the target content, and the compared sample image frame is a standard image frame of the designated local area of the target content stored in advance.

In one illustrative example, a flow chart showing a performance testing method is shown in FIG. 6. 601, initializing test equipment after the test starts; step 602, the testing device initializes an image contrast parameter, wherein the image contrast parameter includes at least one of a contrast screen area, a frame number and a storage address coordinate of a sample image frame; step 603, the test equipment starts an image comparison process and performs real-time comparison in the FPGA. Step 604, the testing device starts to operate the chip testing board, and executes the steps executed by the testing device in the above method embodiment. In step 605, the test equipment queries the progress of image contrast. Step 606, the test equipment determines whether the comparison of the test images is complete. In step 607, if the image comparison is completed, the testing device terminates the image comparison and performs step 609. Step 608, if the image comparison is not completed, the testing device determines whether the duration of the image comparison exceeds the duration threshold, if so, step 607 is executed, and if not, step 605 is continuously executed. Step 609, after the test equipment terminates the image contrast, the chip is stopped from operating to test the single board.

In summary, the embodiment of the present disclosure further compares the original image frame with the sample image frame by frame through the testing device to obtain the frame error rate, and measures the display performance of the chip to be tested by using the measurement parameter "frame error rate", so that not only the data error in the original image frame can be detected, but also the defects such as frame dislocation before and after the detection can be detected.

The embodiment of the disclosure further improves the efficiency and accuracy of image comparison by implementing at least one operation of 'initial frame detection', 'adjacent frame comparison duplication removal', 'front and rear frame position detection', and 'intra-frame region interception' in the FPGA of the test device, thereby ensuring the reliability of the test result obtained based on the image comparison.

The following are embodiments of the apparatus of the present application that may be used to perform embodiments of the method of the present application. For details which are not disclosed in the embodiments of the apparatus of the present application, reference is made to the embodiments of the method of the present application.

Referring to fig. 7, a schematic structural diagram of a display performance testing apparatus according to an embodiment of the disclosure is shown. The display performance testing apparatus may be implemented as all or a part of the testing device 130 in fig. 1 by a dedicated hardware circuit, or a combination of hardware and software, and includes: a sending module 710, an obtaining module 720 and a comparing module 730.

A sending module 710, configured to send a preset instruction to a chip to be tested, where the preset instruction is used to control the chip to be tested to display target content;

an obtaining module 720, configured to obtain an original image frame of a target content from a display interface of a chip under test;

the comparison module 730 is configured to compare the original image frame with a sample image frame to obtain a test result, where the sample image frame is a standard image frame of a pre-stored target content, and the test result is used to indicate the display performance of the chip under test.

In one possible implementation, the display interface is an interface between the chip to be tested and the display screen module.

In another possible implementation manner, the obtaining module 720 is further configured to:

capturing original display data from a display interface of a tested chip, wherein the original display data are data to be displayed, which are sent to a display screen module by the tested chip;

and extracting and splicing the original image frame of the target content from the original display data.

In another possible implementation manner, the comparison module 730 is further configured to:

the device also comprises: a first deduplication module. The first duplicate removal module is used for carrying out duplicate removal processing on the original image frames to obtain the original image frames subjected to the duplicate removal processing, and the original image frames subjected to the duplicate removal processing comprise at least one image frame;

the comparison module 730 is further configured to compare the original image frame after the deduplication processing with the sample image frame to obtain a first frame error rate.

the device, still include: and a second deduplication module. The second duplicate removal module is used for carrying out duplicate removal processing on the sample image frames to obtain the sample image frames subjected to the duplicate removal processing, and the sample image frames subjected to the duplicate removal processing comprise multi-frame image frames;

the comparison module 730 is further configured to compare the original image frame with the multiple image frames corresponding to the sample image frames after the deduplication processing to obtain a second frame error rate.

In another possible implementation manner, the original image frame includes N image frames, the sample image frame after the deduplication processing includes M image frames, N and M are both positive integers greater than 1, N is greater than M, and the comparison module 730 is further configured to:

determining an image frame, which is the same as a first frame image frame of the sample image frames subjected to the deduplication processing, in the original image frames as an initial frame;

taking the initial frame as a 1 st frame image frame in the original image frames, comparing an ith frame image frame in the original image frames with a jth frame image frame in the sample image frames after the duplication removal processing to obtain a first comparison result, wherein the initial value of i is a numerical value 2, and the initial value of j is a numerical value 1;

when the first comparison result is that the ith frame image frame in the original image frame is the same as the jth frame image frame in the sample image frame after the duplication removal processing, and i is smaller than N, adding 1 to i, and continuously performing the step of comparing the ith frame image frame in the original image frame with the jth frame image frame in the sample image frame after the duplication removal processing to obtain the first comparison result;

when the first comparison result is that the ith frame image frame in the original image frame is different from the jth frame image frame in the sample image frame after the duplicate removal processing, and j is smaller than M, comparing the ith frame image frame in the original image frame with the (j + 1) th frame image frame in the sample image frame after the duplicate removal processing to obtain a second comparison result;

when the second comparison result is that the ith frame image frame in the original image frame is the same as the (j + 1) th frame image frame in the sample image frame after the de-duplication processing, and i is less than N, adding 1 to both i and j, and continuously performing the step of comparing the ith frame image frame in the original image frame with the jth frame image frame in the sample image frame after the de-duplication processing to obtain a first comparison result;

when the second comparison result is that the ith frame image frame in the original image frame is different from the (j + 1) th frame image frame in the sample image frame after the duplicate removal processing, determining that the ith to nth frame image frames in the original image frame are error frames, and calculating a second frame error rate according to the frame number of the error frames;

and when i is equal to N and/or j is equal to M, determining that the second frame error rate is zero.

In another possible implementation manner, the original image frame is an image frame corresponding to a specified local area of the target content; the device also comprises: and determining a module. The device comprises a determining module, a processing module and a processing module, wherein the determining module is used for acquiring a pre-stored sample file, and the sample file is used for storing a standard image frame corresponding to a global area of target content; converting the coordinates of the designated local area into storage address coordinates in the sample file according to the resolution of the target content; and determining the standard image frame corresponding to the specified local area indicated by the storage address coordinate as a sample image frame in the sample file.

It should be noted that, when the apparatus provided in the foregoing embodiment implements the functions thereof, the division of each functional module is merely used as an example, and in practical applications, the above function distribution may be completed by different functional modules according to needs, that is, the internal structure of the device is divided into different functional modules, so as to complete all or part of the functions described above. In addition, the apparatus and method embodiments provided by the above embodiments belong to the same concept, and specific implementation processes thereof are described in the method embodiments for details, which are not described herein again.

The embodiment of the present disclosure further provides a testing apparatus, which includes: a processor; a memory for storing processor-executable instructions; wherein the processor is configured to perform the method performed by the test device in the above-described respective method embodiments.

The disclosed embodiments also provide a non-volatile computer-readable storage medium on which computer program instructions are stored, and the computer program instructions, when executed by a processor, implement the method performed by the test device in the above-mentioned method embodiments.

The present disclosure may be systems, methods, and/or computer program products. The computer program product may include a computer-readable storage medium having computer-readable program instructions embodied thereon for causing a processor to implement various aspects of the present disclosure.

The computer-readable storage medium may be a tangible device that can hold and store the instructions for use by the instruction execution device. The computer readable storage medium may be, for example, but not limited to, an electronic, magnetic, optical, electromagnetic, semiconductor memory device, or any suitable combination of the foregoing. More specific examples (a non-exhaustive list) of the computer readable storage medium would include the following: a portable computer diskette, a hard disk, a Random Access Memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or flash memory), a Static Random Access Memory (SRAM), a portable compact disc read-only memory (CD-ROM), a Digital Versatile Disc (DVD), a memory stick, a floppy disk, a mechanical coding device, such as punch cards or in-groove projection structures having instructions stored thereon, and any suitable combination of the foregoing. Computer-readable storage media as used herein is not to be construed as transitory signals per se, such as radio waves or other freely propagating electromagnetic waves, electromagnetic waves propagating through a waveguide or other transmission medium (e.g., optical pulses through a fiber optic cable), or electrical signals transmitted through electrical wires.

The computer-readable program instructions described herein may be downloaded from a computer-readable storage medium to a respective computing/processing device, or to an external computer or external storage device via a network, such as the internet, a local area network, a wide area network, and/or a wireless network. The network may include copper transmission cables, fiber optic transmission, wireless transmission, routers, firewalls, switches, gateway computers and/or edge servers. The network adapter card or network interface in each computing/processing device receives computer-readable program instructions from the network and forwards the computer-readable program instructions for storage in a computer-readable storage medium in the respective computing/processing device.

Computer program instructions for carrying out operations of the present disclosure may be assembler instructions, instruction Set Architecture (ISA) instructions, machine-related instructions, microcode, firmware instructions, state setting data, or source or object code written in any combination of one or more programming languages, including an object oriented programming language such as Smalltalk, C + + or the like and conventional procedural programming languages, such as the "C" programming language or similar programming languages. The computer-readable program instructions may execute entirely on the user's computer, partly on the user's computer, as a stand-alone software package, partly on the user's computer and partly on a remote computer or entirely on the remote computer or server. In the case of a remote computer, the remote computer may be connected to the user's computer through any type of network, including a Local Area Network (LAN) or a Wide Area Network (WAN), or the connection may be made to an external computer (for example, through the Internet using an Internet service provider). In some embodiments, aspects of the disclosure are implemented by personalizing an electronic circuit, such as a programmable logic circuit, a Field Programmable Gate Array (FPGA), or a Programmable Logic Array (PLA), with state information of computer-readable program instructions, which can execute the computer-readable program instructions.

Various aspects of the present disclosure are described herein with reference to flowchart illustrations and/or block diagrams of methods, apparatus (systems) and computer program products according to embodiments of the disclosure. It will be understood that each block of the flowchart illustrations and/or block diagrams, and combinations of blocks in the flowchart illustrations and/or block diagrams, can be implemented by computer-readable program instructions.

These computer-readable program instructions may be provided to a processor of a general purpose computer, special purpose computer, or other programmable data processing apparatus to produce a machine, such that the instructions, which execute via the processor of the computer or other programmable data processing apparatus, create means for implementing the functions/acts specified in the flowchart and/or block diagram block or blocks. These computer readable program instructions may also be stored in a computer readable storage medium that can direct a computer, programmable data processing apparatus, and/or other devices to function in a particular manner, such that the computer readable medium storing the instructions comprises an article of manufacture including instructions which implement the function/act specified in the flowchart and/or block diagram block or blocks.

The computer readable program instructions may also be loaded onto a computer, other programmable data processing apparatus, or other devices to cause a series of operational steps to be performed on the computer, other programmable apparatus or other devices to produce a computer implemented process such that the instructions which execute on the computer, other programmable apparatus or other devices implement the functions/acts specified in the flowchart and/or block diagram block or blocks.

The flowchart and block diagrams in the figures illustrate the architecture, functionality, and operation of possible implementations of systems, methods and computer program products according to various embodiments of the present disclosure. In this regard, each block in the flowchart or block diagrams may represent a module, segment, or portion of instructions, which comprises one or more executable instructions for implementing the specified logical function(s). In some alternative implementations, the functions noted in the block may occur out of the order noted in the figures. For example, two blocks shown in succession may, in fact, be executed substantially concurrently, or the blocks may sometimes be executed in the reverse order, depending upon the functionality involved. It will also be noted that each block of the block diagrams and/or flowchart illustration, and combinations of blocks in the block diagrams and/or flowchart illustration, can be implemented by special purpose hardware-based systems which perform the specified functions or acts, or combinations of special purpose hardware and computer instructions.

Having described embodiments of the present disclosure, the foregoing description is intended to be exemplary, not exhaustive, and not limited to the disclosed embodiments. Many modifications and variations will be apparent to those of ordinary skill in the art without departing from the scope and spirit of the described embodiments. The terms used herein were chosen in order to best explain the principles of the embodiments, the practical application, or technical improvements to the techniques in the marketplace, or to enable others of ordinary skill in the art to understand the embodiments disclosed herein.

Claims

1. A display performance testing method, used in a test apparatus, the method comprising:

sending a preset instruction to a chip to be tested, wherein the preset instruction is used for controlling the chip to be tested to display target content, and the target content comprises static display content or dynamic display content;

comparing the original image frame with a sample image frame to obtain a test result, wherein the sample image frame is a standard image frame of the target content stored in advance, and the test result is used for indicating the display performance of the tested chip;

the comparing the original image frame with the sample image frame to obtain a test result includes:

comparing the original image frame with the sample image frame to obtain a frame error rate, wherein the frame error rate is the proportion of the number of error frames and/or error frames to the total number of the original image frame;

when the target content includes the static display content, the original image frame includes a plurality of image frames, the sample image frame includes a frame image frame, and before comparing the original image frame with the sample image frame to obtain a frame error rate, the method further includes: performing duplicate removal processing on the original image frames to obtain duplicate-removed original image frames, wherein the duplicate-removed original image frames comprise at least one image frame;

2. The method of claim 1, wherein the display interface is an interface between the chip under test and a display screen module.

3. The method of claim 2, wherein the obtaining the raw image frame of the target content from the display interface of the chip under test comprises:

4. The method of claim 1, wherein when the target content comprises the dynamic display content, the original image frame and the sample image frame each comprise a multi-frame image frame,

before the comparing the original image frame with the sample image frame to obtain the frame error rate, the method further includes:

carrying out duplicate removal processing on the sample image frames to obtain sample image frames subjected to duplicate removal processing, wherein the sample image frames subjected to duplicate removal processing comprise multi-frame image frames;

5. The method according to claim 4, wherein the original image frames comprise N image frames, the deduplicated sample image frames comprise M image frames, both N and M are positive integers greater than 1, N is greater than M, and comparing the original image frames with the multiframe image frames corresponding to the deduplicated sample image frames to obtain a second frame error rate comprises:

taking the initial frame as a 1 st frame image frame in the original image frames, and comparing an ith frame image frame in the original image frames with a jth frame image frame in the sample image frames subjected to the de-duplication processing to obtain a first comparison result, wherein the initial value of i is a numerical value 2, and the initial value of j is a numerical value 1;

when the second comparison result is that the ith frame image frame in the original image frames is different from the (j + 1) th frame image frame in the sample image frames subjected to the deduplication processing, determining that the ith to nth frame image frames in the original image frames are all the error frames, and calculating the second frame error rate according to the frame number of the error frames;

6. The method according to claim 1, wherein the original image frame is an image frame corresponding to a specified local area of the target content;

7. A display performance testing apparatus, for use in a test device, the apparatus comprising:

the device comprises a sending module, a receiving module and a display module, wherein the sending module is used for sending a preset instruction to a tested chip, the preset instruction is used for controlling the tested chip to display target content, and the target content comprises static display content or dynamic display content;

the acquisition module is used for acquiring an original image frame of the target content from a display interface of the tested chip;

the comparison module is used for comparing the original image frame with a sample image frame to obtain a test result, wherein the sample image frame is a standard image frame of the pre-stored target content, and the test result is used for indicating the display performance of the tested chip;

the comparison module is further configured to compare the original image frame with the sample image frame to obtain a frame error rate, where the frame error rate is a ratio of a number of error frames and/or error frames to a total number of the original image frame;

when the target content includes the static display content, the original image frame includes a plurality of image frames, the sample image frame includes one image frame, the apparatus further includes: a first deduplication module; the first duplicate removal module is configured to perform duplicate removal processing on the original image frames to obtain duplicate-removed original image frames, where the duplicate-removed original image frames include at least one image frame;

8. A non-transitory computer readable storage medium having stored thereon computer program instructions, wherein the computer program instructions, when executed by a processor, implement the method of any one of claims 1 to 6.