CN111104309A - Method for quickly realizing comprehensive test flow - Google Patents
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- CN111104309A CN111104309A CN201911121325.4A CN201911121325A CN111104309A CN 111104309 A CN111104309 A CN 111104309A CN 201911121325 A CN201911121325 A CN 201911121325A CN 111104309 A CN111104309 A CN 111104309A
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Abstract
The invention relates to a method for quickly realizing a comprehensive test flow, which comprises the following steps: classifying the test function types according to the hardware interface types of the system to be tested; designing a test function unit for each test function type; all the test function units adopt uniform interface parameters; designing a test configuration information interface, and establishing a mapping relation between configuration information and a test function unit; establishing a corresponding relation between the test flow requirements and test flow configuration information, wherein the test configuration information is stored in a configuration file, and one line in the file corresponds to one test item; and sequentially reading each piece of configuration information from the configuration file, analyzing, judging the type of the test function and the corresponding test function unit, transmitting the configuration information to the interface parameter of the test function unit, finishing the execution of the current test item by the test function unit, and outputting a test result through the interface parameter until all the test items are executed to finish the test process.
Description
Technical Field
The project belongs to the field of ground comprehensive testing, and provides a method for quickly realizing a comprehensive testing process of a measurement and control system.
Background
Various test functions of the comprehensive test system mainly send control instructions to the tested system through different hardware function board cards of simulation, digital, communication and the like, various state indication information of the system is collected and displayed at the same time, data communication is carried out according to the requirements of a communication protocol, and the validity of data is judged. The diversification and complexity of equipment are continuously improved, higher requirements are put forward for a ground comprehensive test system, the current situations that the test flow is easy to change and the test flow is greatly different in different test states exist in the current comprehensive test process, the test items, the test criteria and the like need to be redesigned and coded, and the traditional comprehensive test flow design and development mode easily causes the problems of repeated design, low development efficiency, high maintenance cost and the like.
Disclosure of Invention
The technical problem solved by the invention is as follows: the method for quickly realizing the comprehensive test flow is provided, the test flow requirement is quickly responded, the test flow is realized by using codes as few as possible, the model development period is shortened, and the development cost is reduced.
The technical scheme of the invention is as follows: a method for quickly realizing a comprehensive test flow is realized by the following steps:
classifying the test function types according to the hardware interface types of the system to be tested;
designing a test function unit for each test function type aiming at the divided test function types; all the test function units adopt uniform interface parameters;
designing a test configuration information interface according to the designed test function unit and the unified interface parameter, and establishing a mapping relation between configuration information and the test function unit;
aiming at the test flow requirements, carrying out test flow configuration according to a test configuration information interface, establishing a corresponding relation between the test flow requirements and the test flow configuration information for all test items in the same test flow in a configuration information mode, wherein the test configuration information is stored in a configuration file, and one line in the file corresponds to one test item;
and sequentially reading each piece of configuration information from the configuration file, analyzing, judging the type of the test function and the corresponding test function unit, transmitting the configuration information to the interface parameter of the test function unit, finishing the execution of the current test item by the test function unit, and outputting a test result through the interface parameter until all the test items are executed to finish the test process.
Preferably, for the measurement and control type system to be tested, the test function classification comprises AD test, DI test, DO test, 1553B test and serial port test.
Preferably, each test function type corresponds to one or more test function units, and the test function units are obtained by packaging different types of test board card drive interface functions and are currently verified stable test function units;
the AD test function at least comprises a single-channel voltage acquisition and interpretation function unit, the DI test function at least comprises a single-channel digital input and interpretation function unit, the DO test function at least comprises a single-channel switching value output function unit, the 1553B test function at least comprises a single-message instruction output and back-order interpretation function unit, and the serial test function at least comprises a single-frame instruction output and back-order interpretation function unit.
Preferably, the unified interface parameters include input parameters, output parameters and return values; the input parameters comprise test function types, test item names, test parameter names and test function unit association parameters; the output parameters comprise test item names, test parameter names, required values, measured values and conclusions; the return value identifies the normal/abnormal state of the test execution.
Preferably, the configuration information includes a test function type, a test item name, a test parameter name, a test function unit identifier, and a test function unit association parameter according to the input parameter of the test function unit, and each piece of configuration information establishes a unique corresponding relationship with the test function unit through the test function unit identifier.
Preferably, the test function unit association parameter includes one or more parameter items uniquely determined by a specific test function unit;
the AD test function type single-channel voltage acquisition and interpretation function unit correlation parameters comprise an AD board card identifier, a channel number and an AD criterion; the DI test function type single-channel digital input and interpretation function unit correlation parameters comprise DI board card identification, channel number and DI criterion; the associated parameters of the DO test function type single-channel switching value output function unit comprise DO board card identification, channel number and output value; 1553B test function type single message instruction output and back order interpretation function unit correlation parameters comprise BC write RT message address, BC write RT data, time delay, BC read RT message address and criterion; the serial port test type single-frame instruction output and back instruction interpretation functional unit correlation parameters comprise serial port ID sending, serial port data sending, time delay, serial port ID receiving and criterion.
Preferably, the configuration information is stored in a CSV format file, and each row of configuration information in the file corresponds to one test item;
the configuration information format expresses different parameters in a regular character string mode, the expression rules of the same parameter are kept consistent, the character strings are separated by commas, and the commas are not contained in the character strings; the configuration parameters represent the test function category, the test item name, the test parameter name, the functional unit identifier and the functional unit association parameters in the column sequence.
Preferably, during test flow configuration, the CSV format file is opened in an Excel table mode for configuration, first, the test function type and the test function unit are compared, the test item required by the test flow is mapped to the corresponding test function unit as an independent test item, and flow configuration is performed according to the test flow configuration information format to form a test flow configuration file consistent with the test flow requirement.
Preferably, the test flow analysis is completed by:
firstly, reading a piece of configuration information of a configuration file in sequence in a character string mode, performing parameter segmentation by using comma separators, completing one-time analysis and extraction of functional unit identifiers, and entering corresponding functional units according to the functional unit identifiers;
and then, establishing a regular expression corresponding to each function unit in the test function unit according to the associated parameter expression rule of each function unit in the configuration information, performing secondary analysis by adopting a regular matching method, and extracting the associated parameters of the function units.
Preferably, after the configuration information is analyzed, the parameters are transmitted to the corresponding functional units for processing, and after the processing is completed, output parameters including test item names, test parameter names, required values, measured values and conclusions are formed.
Compared with the prior art, the invention has the beneficial effects that:
in order to quickly realize the comprehensive test process of the system, the test process is separated from the program by combining the test characteristics of the measurement and control system, the test process is quickly realized by a configuration file mode, and the realization efficiency of the test process is improved.
Compared with the prior art that the test flow is realized by one code for each test item in the test flow for specific test application, the method and the device have the advantages that modular multiplexing of the test function units divided based on hardware interface types and efficient processing of table information of configuration files are fully utilized, the test flow is realized by adopting a formatted table configuration mode, only basic test function unit module programs are needed to be compiled, the test flow is edited by the table information to maximally reduce the test flow realization time, and particularly, the method and the device have obvious effect on test application scenes with long test flow sequence and changeable test items, test parameters and criterions. The method for quickly realizing the test flow based on the configuration file can be well applied to the comprehensive test flow of the multi-state system under different models, reduces the workload of design and test, and is convenient to transplant and popularize.
Drawings
FIG. 1 is a schematic view of a test flow configuration file according to the present invention;
FIG. 2 is a schematic diagram illustrating the test flow of the present invention;
FIG. 3 is a flowchart illustrating the execution of a profile-based test according to the present invention.
Detailed Description
The invention is further illustrated by the following examples.
The invention combines the test characteristics of the measurement and control system, writes the variable part information of the test flow into the configuration file, reserves a relatively stable test function unit module in the software program, and designs an independent test flow configuration file for each test flow. And decomposing the test items according to the test flow requirements, dividing the test function types, configuring the flow by adopting a unified flow test item configuration interface, and quickly realizing the comprehensive test flow by configuring the test flow.
a) Test flow requirements
According to the system task input, the system test requirement analysis is carried out, the detailed information including interface types, test items and the like forms the specific requirements of the test process, and part of the test process is shown in the table 1.
TABLE 1 test procedure requirements
| Serial number | Test item | Test parameters | Required |
|
| 1 | | IN0 | 28± |
|
| 2 | | I1 | 1 | |
| 3 | | CH1 | 5± |
|
| 4 | DI measurement | I34 | 1 | |
| 5 | DI measurement | I35 | 1 | |
| 6 | | COM1 | ||
| 7 | | IN1 | 28± |
|
| 8 | | I2 | 1 | |
| 9 | | CH2 | 5± |
|
| 10 | | COM2 | ||
| 11 | | IN2 | 28± |
|
| 12 | | I3 | 1 |
b) Test flow configuration and deployment
The test flow requirements are analyzed, the test requirements are mapped to a configuration file interface, and test items, test types, test channels/addresses, test criteria and the like are configured to form a test flow configuration file as shown in fig. 1.
c) Test flow execution
The test flow configuration is completed, and then the test execution can be started, and the software test flow execution process is shown in fig. 2. The test information list displays the current test item information, wherein the test item identifies the name of the current test item, the test parameters are data to be tested, and the software displays the required value and the measured value and automatically judges and provides a test conclusion whether the test item is qualified or not.
The rapid implementation method of the comprehensive test flow based on the configuration file can be well applied to multi-state system tests under different models, and can be compatible with equivalent inspection, unit tests, bulk tests, matching tests and final assembly test flows under multiple states.
Examples
The invention relates to a method for quickly realizing a comprehensive test flow, which mainly comprises the steps of test function classification, test function unit design, configuration information format design, test flow configuration, configuration information analysis and test execution in the specific implementation process.
a) Test function class classification
The comprehensive test generally comprises the steps of sending a control command through a switch quantity board card simulation, carrying out voltage acquisition on an AD board card, carrying out digital DI state monitoring and carrying out communication command test on 1553B or a serial port, and because a hardware interface is relatively stable and the test flow has large change, each test item of the test flow can be divided into function types according to the type of the test hardware interface according to the test flow requirement, and the test types are divided into AD test, DI test, DO test, 1553B test and serial port test.
b) Test functional unit design
And respectively designing a test function unit for each board card function type according to the test type and a specific test item, and packaging the drive interface functions of the test board cards of different types to finish the basic functions of the test function unit, wherein each function adopts uniform interface parameters, and a parameter interface comprises input parameters, output parameters and return values. The input parameters comprise a test function type, a test project name, a test parameter name and a functional unit association parameter, the output parameters comprise a test project name, a test parameter name, a required value, an actual measurement value and a conclusion, and the return value identifies a normal/abnormal state of test execution. The design contents of the functional units of the AD test, the DI test, the DO test, the 1553B test and the serial port test are specifically shown in the following table 2.
TABLE 2 test function cell design
c) Configuration information format design
Different test items of the same test type in the test flow are distinguished in the form of configuration information, and according to interface parameters of the test function unit, parameter configuration formats of an AD single-channel voltage acquisition and interpretation unit, a DI single-channel digital input and interpretation unit, a DO single-channel switching value output unit, a 1553B single-message instruction and back-order interpretation unit and a serial single-frame instruction sending and back-order interpretation unit are respectively designed. The configuration information is stored in a CSV file mode, and the configuration content includes a test function type, a test item name, a test parameter name, a function unit identifier, a function unit association parameter and a specific design and description of different function unit configuration information formats according to the input parameters of the test function unit, which are shown in Table 3.
The test function unit correlation parameter comprises one or more parameter items which are uniquely determined by a specific test function unit; the AD test function type single-channel voltage acquisition and interpretation function unit correlation parameters comprise an AD board card identifier, a channel number and an AD criterion; the DI test function type single-channel digital input and interpretation function unit correlation parameters comprise DI board card identification, channel number and DI criterion; the associated parameters of the DO test function type single-channel switching value output function unit comprise DO board card identification, channel number and output value; 1553B test function type single message instruction output and back order interpretation function unit correlation parameters comprise BC write RT message address, BC write RT data, time delay, BC read RT message address and criterion; the related parameters of the serial port test type single-frame instruction output and back instruction interpretation functional unit comprise serial port ID sending, serial port data sending, time delay, serial port ID receiving and criterion
Table 3 configuration information interface format
For other test types and functional units, the test types and the functional units can be re-identified according to the a) strips and the b) strips and independently realized, and meanwhile, parameter configuration interface identifications corresponding to the test types and the functional units are provided.
d) Test flow configuration
Opening a CSV configuration file for configuration in an Excel table mode during test process configuration, wherein each row of configuration information in the table corresponds to one test item, the configuration parameters represent different parameter types according to the column sequence and respectively comprise a test function type, a test item name, a test parameter name, a function unit identifier and a function unit association parameter, and each piece of test item configuration information is configured according to the rule (as shown in figure 1);
first, referring to the test function type and the test function unit (as shown in table 2), according to the test flow requirement (as shown in table 1), mapping the test item of the test flow requirement to the corresponding test function unit as an independent test item, and performing flow configuration according to the test flow configuration information format (as shown in table 3), so as to form a test flow configuration file (as shown in fig. 1) consistent with the test flow requirement.
e) Configuration information parsing and test execution
The execution of the test process is driven by the process configuration file, when a plurality of test processes are carried out, an independent process configuration file is set for each test process, each line of configuration information in the configuration file corresponds to one test item, one piece of configuration information of the test items in the configuration file is sequentially read in a character string mode when the test is carried out, parameter segmentation is carried out by adopting comma separators, and the function unit identification is extracted by one-time analysis.
And judging to enter a corresponding functional unit processing branch through the functional unit identification parameters to establish a regular expression corresponding to the correlation parameters of different functional units, performing secondary analysis by adopting a regular matching method, and extracting the correlation parameters of the functional units. And the transmission test unit associated parameters respectively execute AD voltage acquisition and interpretation, DI digital input and interpretation, DO switching value output, 1553B instruction test and serial port instruction test operation, and output parameters including test item names, test parameter names, required values, measured values and conclusions are formed after the processing is finished. And entering the next test after the execution is finished, and exiting the automatic test flow after all the test items are executed, wherein the test execution flow is shown in fig. 3.
Specifically, for the AD test function type single-channel voltage acquisition and interpretation function unit, the specified channel voltage (measured value) of the corresponding board card is acquired according to the board card identifier and the channel number, and then the voltage value is compared with the voltage criterion (required value) to determine a conclusion (pass/fail);
for a DI test function type single-channel digital input and interpretation function unit, acquiring a DI value (measured value) of a corresponding board appointed channel according to a board identifier and a channel number, and then comparing the DI value with a DI criterion (required value) to judge to obtain a conclusion (pass/fail);
for a DO test function type single-channel switching value output function unit, carrying out DO output on a corresponding board appointed channel according to a board identification, a channel number and an output value;
for a 1553B test function type single message instruction output and back order interpretation functional unit, designated data are sent according to a BC write RT message address, data (measured value) are read from the BC read RT message address back after waiting for delay time, and the data are compared with a criterion (required value) to judge to obtain a conclusion (qualified/unqualified);
for the serial port test type single-frame instruction output and command return interpretation functional unit, data are sent through a sending serial port, after time delay, data (measured values) are read back from the receiving serial port and compared with criteria (required values) to judge and obtain a conclusion (qualified/unqualified).
Through five steps of a) -e), the test flow configuration is completed, the configuration deployment, the automatic execution and the interpretation and processing of the test result of the test flow are rapidly realized, the test flow requirements of the measurement and control system are met, and the test execution effect is shown in fig. 2.
The invention has not been described in detail in part in the common general knowledge of a person skilled in the art.
Claims (10)
1. A method for quickly realizing a comprehensive test flow is characterized by being realized by the following modes:
classifying the test function types according to the hardware interface types of the system to be tested;
designing a test function unit for each test function type aiming at the divided test function types; all the test function units adopt uniform interface parameters;
designing a test configuration information interface according to the designed test function unit and the unified interface parameter, and establishing a mapping relation between configuration information and the test function unit;
aiming at the test flow requirements, carrying out test flow configuration according to a test configuration information interface, establishing a corresponding relation between the test flow requirements and the test flow configuration information for all test items in the same test flow in a configuration information mode, wherein the test configuration information is stored in a configuration file, and one line in the file corresponds to one test item;
and sequentially reading each piece of configuration information from the configuration file, analyzing, judging the type of the test function and the corresponding test function unit, transmitting the configuration information to the interface parameter of the test function unit, finishing the execution of the current test item by the test function unit, and outputting a test result through the interface parameter until all the test items are executed to finish the test process.
2. The method of claim 1, wherein: aiming at a measurement and control type system to be tested, the test function classification comprises AD test, DI test, DO test, 1553B test and serial port test.
3. The method of claim 1, wherein: each test function type corresponds to one or more test function units, and the test function units are obtained by packaging different types of test board card driving interface functions and are currently verified stable test function units;
the AD test function at least comprises a single-channel voltage acquisition and interpretation function unit, the DI test function at least comprises a single-channel digital input and interpretation function unit, the DO test function at least comprises a single-channel switching value output function unit, the 1553B test function at least comprises a single-message instruction output and back-order interpretation function unit, and the serial test function at least comprises a single-frame instruction output and back-order interpretation function unit.
4. A method according to claim 1 or 3, characterized in that: the unified interface parameters comprise input parameters, output parameters and return values; the input parameters comprise test function types, test item names, test parameter names and test function unit association parameters; the output parameters comprise test item names, test parameter names, required values, measured values and conclusions; the return value identifies the normal/abnormal state of the test execution.
5. A method according to claim 1 or 3, characterized in that: the configuration information comprises a test function type, a test item name, a test parameter name, a test function unit identifier and a test function unit association parameter according to the input parameters of the test function unit, and each piece of configuration information establishes a unique corresponding relation with the test function unit through the test function unit identifier.
6. The method of claim 5, wherein: the related parameters of the test function unit comprise one or more parameter items which are uniquely determined by the specific test function unit;
the AD test function type single-channel voltage acquisition and interpretation function unit correlation parameters comprise an AD board card identifier, a channel number and an AD criterion; the DI test function type single-channel digital input and interpretation function unit correlation parameters comprise DI board card identification, channel number and DI criterion; the associated parameters of the DO test function type single-channel switching value output function unit comprise DO board card identification, channel number and output value; 1553B test function type single message instruction output and back order interpretation function unit correlation parameters comprise BC write RT message address, BC write RT data, time delay, BC read RT message address and criterion; the serial port test type single-frame instruction output and back instruction interpretation functional unit correlation parameters comprise serial port ID sending, serial port data sending, time delay, serial port ID receiving and criterion.
7. The method of claim 1, wherein: the configuration information is stored by adopting a CSV format file, and each row of configuration information in the file corresponds to one test item;
the configuration information format expresses different parameters in a regular character string mode, the expression rules of the same parameter are kept consistent, the character strings are separated by commas, and the commas are not contained in the character strings; the configuration parameters represent the test function category, the test item name, the test parameter name, the functional unit identifier and the functional unit association parameters in the column sequence.
8. The method of claim 7, wherein: when the test process is configured, the CSV format file is opened in an Excel table mode for configuration, firstly, the test function type and the test function unit are contrasted, the test item of the test process requirement is mapped to the corresponding test function unit to be used as an independent test item, the process configuration is carried out according to the test process configuration information format, and the test process configuration file which is consistent with the test process requirement is formed.
9. The method of claim 8, wherein: the test flow analysis is completed by the following method:
firstly, reading a piece of configuration information of a configuration file in sequence in a character string mode, performing parameter segmentation by using comma separators, completing one-time analysis and extraction of functional unit identifiers, and entering corresponding functional units according to the functional unit identifiers;
and then, establishing a regular expression corresponding to each function unit in the test function unit according to the associated parameter expression rule of each function unit in the configuration information, performing secondary analysis by adopting a regular matching method, and extracting the associated parameters of the function units.
10. The method of claim 1, wherein: and after the configuration information is analyzed, the parameters are transmitted to the corresponding functional units for processing, and output parameters including test item names, test parameter names, required values, measured values and conclusions are formed after the processing is finished.
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