CN111090032A - Automatic multi-channel test system for current/frequency conversion circuit - Google Patents
Automatic multi-channel test system for current/frequency conversion circuit Download PDFInfo
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Abstract
The invention relates to an automatic multi-channel test system of a current/frequency conversion circuit, which comprises a control center, a power supply subsystem and a test environment equipment subsystem, wherein the control center receives test items, test parameters and data acquisition information input from the outside, determines a power supply control instruction of a tested product and a test environment equipment control instruction according to the test items and the test parameters, and determines a frequency measurement control instruction according to the data acquisition information; the power supply subsystem receives a power supply instruction of the product to be tested sent by the control center and independently supplies power to the N products to be tested according to the control instruction; then, returning the power supply state parameters of the products to be tested to the control center; and the test environment equipment subsystem receives a test equipment control instruction sent by the control center and provides a temperature environment, a time reference and a constant current source signal specified by the test item for a product to be tested. The invention effectively improves the accuracy, reliability, traceability and safety of the whole I/F circuit test process.
Description
Technical Field
The invention belongs to a current/frequency (I/F) conversion circuit testing technology, and relates to an automatic multi-channel testing system for a current/frequency conversion circuit, which is used for automatically testing a plurality of I/F conversion circuits at the same time.
Background
A current/frequency (I/F) conversion circuit test system is a necessary tool for carrying out I/F conversion circuit tuning test. The test of the I/F conversion circuit generally uses devices such as a temperature box, a signal generator, a constant current source, a counter, a power supply and the like to carry out zero position test and scale factor test on the I/F conversion circuit under the condition of full temperature, and in the test process, the test device needs to be controlled to meet the requirement of the test process. Because the number of devices involved in the test process is large, manual operation on the devices is not only low in efficiency, but also easy to cause errors and influence product quality.
The existing I/F conversion circuit test system generally has the problems that the test system is developed aiming at a certain type of I/F conversion circuit, and the universality is not strong or an extra development period is needed when the development is carried out. In addition, the constant current source is not monitored sufficiently, the constant current source provides stable current signals for the I/F conversion circuit and participates in calculation of each index, a certain difference exists between an actual output value and a nominal value of the constant current source in the test process, the output precision of the constant current source directly influences the test result of the circuit board, and the test accuracy cannot be mastered in real time.
Disclosure of Invention
The technical problem solved by the invention is as follows: the automatic multi-channel test system for the current/frequency conversion circuit overcomes the defects of the prior art, limits the types and control parameters of test equipment and control parameters of product power supply according to various test requirements, controls the working flows of the test equipment and the time sequence of the product power supply according to the control parameters, automatically completes the test flow, effectively improves the consistency and reliability of the whole flow of product test, and improves the working efficiency.
The technical scheme of the invention is as follows:
an automatic multi-channel test system of a current/frequency conversion circuit is used for testing N products to be tested, wherein N is a positive integer, the system comprises a control center, a power supply subsystem and a test environment equipment subsystem,
the control center: receiving externally input test items, test parameters and data acquisition information, determining a power supply control instruction of a tested product and a control instruction of test environment equipment according to the test items and the test parameters, and determining a frequency measurement control instruction according to the data acquisition information;
then sending each control instruction to the power supply subsystem and the test environment equipment subsystem, and sending a data acquisition control instruction to the test environment equipment subsystem when the environment to be tested meets the requirements of test items and test parameters; receiving test data and power supply sent by a test environment equipment subsystem and working state parameters returned by the test equipment in the test process;
a power subsystem: receiving a power supply instruction of the products to be tested sent by a control center, and independently supplying power to the N products to be tested according to the control instruction; then, returning the power supply state parameters of the products to be tested to the control center;
test environment equipment subsystem: receiving a control instruction of the test equipment sent by the control center, providing a temperature environment, a time reference and a constant current source signal specified by the test item for the product to be tested, and measuring the output frequency of the product to be tested according to the specification of the test item; and then the executed equipment state and frequency measurement data are sent to a receiving control center.
Furthermore, the test environment equipment subsystem comprises an incubator control device, a time reference device, a constant current source output device and a frequency measurement device;
the incubator control device, the time reference device and the constant current source output device are test equipment, and the frequency measurement device is a data acquisition device;
incubator controlling means: the control center sends the external input of the test configuration module as a control instruction to the incubator control device, the incubator control device starts or does not start the incubator according to the instruction requirement of the control center, and when the incubator is started, the real-time temperature point of the incubator is used as the working state of the incubator and returns to the control center;
a time reference device: the control center sends the external input of the test configuration module as a control instruction to the time reference device, and the time reference device outputs a corresponding signal according to the instruction requirement of the control center and provides the corresponding signal for a product to be tested, wherein the corresponding signal comprises a non-time reference, a typical time reference and an arbitrary time reference; meanwhile, the working state parameters of the time reference device are transmitted back to the control center;
constant current source output device: the constant current source output device is internally composed of I groups of authority currents with different magnitudes, wherein I is a positive integer and is a combination of 1, 2 and 5 or 1, 2, 3 and 4 according to the authority ratio to obtain a required current value; the control center sends the external input of the test configuration module as a control instruction to the constant current source output device, the constant current source output device connects J groups of authority currents with different magnitudes in parallel according to the instruction requirement of the control center to obtain a current value required by the test configuration module, J is a positive integer and is less than or equal to N; then the working state parameters output by the constant current source are transmitted back to the control center;
frequency measurement device: and after the control center judges that the output of the constant current source is stable, the control center sends a control instruction to the frequency measuring device, measures the output data of the measured product and returns the frequency measuring result to the control center.
Further, the power subsystem includes power supply unit, clock control device and power output collection system, wherein:
the power supply control instruction sent by the control center to the power supply device comprises a current value and a voltage value, and the power supply device independently supplies power to each product to be tested according to the current and the voltage;
the control center sends a power supply control command to the clock control device as a power supply time sequence for controlling the power supply time sequence of the power supply device to each product to be tested;
the power output acquisition device tests the actual current and voltage output by each product to be tested and returns the actual current and voltage as the working state parameters of the power subsystem to the control center.
The product monitoring and processing subsystem comprises a test configuration module, a data display module, a data storage module, a data processing module and a data query module;
a test configuration module: decomposing the test items and test actions to form test configuration parameters, inputting the test configuration parameters to a control center as external input, and using the test configuration parameters as power supply, a temperature box, a time reference, a constant current source and a frequency measurement control instruction; inputting the index items and the specified values of the products to be tested into a control center;
a data display module: the control center sends the product power supply state parameters sent by the power supply subsystem to the product monitoring processing subsystem, and simultaneously sends the incubator, the constant current source state parameters and the frequency measurement data sent by the test basic equipment subsystem to the product monitoring processing subsystem, and the data display module displays the information;
a data storage module: the received tested product information, power supply state parameters, test equipment working state parameters and frequency measurement data are implemented, sorted and stored;
a data processing module: receiving an externally input processing instruction, reading product test data stored in a data storage module, processing the test data according to a set data processing method, comparing a processing result with an index configuration parameter, judging whether a result measurement result is qualified or not, giving a test conclusion, and finally storing the data processing result and the test conclusion again;
a data query module: and searching the relevant information of the tested product according to an externally input query instruction, and displaying all query results.
The system further comprises an equipment state monitoring and processing subsystem, wherein the equipment state monitoring and processing subsystem comprises a power supply abnormity diagnosis module, a temperature box state abnormity diagnosis module, a time reference abnormity diagnosis module, a constant current source state abnormity diagnosis module and an alarm power-off device;
a power supply abnormality diagnosis module: the control center sends the received power supply working state parameters to the power supply abnormity diagnosis module, compares the real-time current and voltage values with threshold values, and sends acousto-optic alarm and power-off instructions to the equipment state monitoring processing subsystem when the actual current and voltage exceed the threshold values required by test items, and the alarm power-off device cuts off the power supply;
an incubator state anomaly diagnosis module: the control center sends the received working state parameters of the incubator to the incubator state abnormity diagnosis module, in order to ensure the reasonability of alarm setting of the incubator at a plurality of temperatures, the temperature set by the test configuration parameters is Ki, i is a positive integer, the real-time monitoring temperature is Ki ', when the Ki' -Ki is larger than or equal to the alarm range, the control center sends acousto-optic alarm and power-off instructions to the equipment state monitoring processing subsystem, and the alarm power-off device cuts off the power supply;
a time-reference anomaly diagnostic module: the control center sends the received time reference working state parameters to the time reference state abnormity diagnosis module, and in order to ensure the reasonability of alarm setting of time reference output under a plurality of frequency values, the frequency set by the test configuration parameters is Fi, i is a positive integer, the actual output frequency of the time reference is Fi ', when the Fi' -Fi | > 10%, the control center sends an audible and visual alarm and power-off instruction to the equipment state monitoring and processing subsystem, and the alarm power-off device cuts off the power supply;
the constant current source state abnormity diagnosis module: the control center sends the received constant current source working state parameters to the constant current source state abnormity diagnosis module, in order to ensure that the constant current source output alarms and sets rationality under a plurality of current values, the current set by the test configuration parameters is set to be Ii, i is a positive integer, the actual output current of the constant current source is Ii ', when the Ii' -Ii is more than or equal to Ii 10%, the control center sends an acousto-optic alarm and a power-off instruction to the equipment state monitoring and processing subsystem, and meanwhile, the alarm power-off device cuts off the power supply.
Further, the stability of the constant current source output device is judged: setting a basic time T0 and a step time Tp, wherein the preliminary accurate time of each current point is T0+ n Tp, T0 is the shortest current conversion time value, Tp is the time interval for feeding back the real-time current of the constant current source, n is an integer, namely after a current value command T0 is sent for time, the control center inquires whether the constant current source is stable and meets the requirement at the time interval of Tp; when the absolute actual current value-set value/set value is less than or equal to the error range, the current value output by the constant current source is stable in the time T.
Further, the data processing accuracy is guaranteed:
the control center controls the constant current source to output 0mA current, measures the actual output I0 'of the constant current source every unit time, when the error range (I0' -0mA) is less than or equal to the error range, the 0mA current is judged to be stable, and the output signal frequency F0 of the tested circuit board is measured and returns to the control center;
the constant current source output Ii is sequentially controlled according to the external input requirement of the test configuration module, the actual output of the constant current source is calculated at intervals of unit time, the current value I0 ' corresponding to the actual 0mA is deducted, namely Ii ═ Ii ' -I0 ', when the error range of the Ii ″ -Ii |/Ii ≦ is smaller than or equal to the error range, the current is judged to be stable, the output signal frequency Fi of the tested product is measured and sent to data display and processing through a control center, and the conversion equivalent of the data processing is K ═ Fi/Ii ″, and the result is accurate.
Furthermore, the method comprises input index information of the tested circuit board test and detection index information of the test result.
Compared with the prior art, the invention has the beneficial effects that:
(1) the invention can configure control parameters according to the content of a test item, realizes that each test device in the whole test process automatically operates according to the requirement, and flexibly controls the power supply current, voltage and time sequence of the product according to the test requirement, thereby realizing the automatic control of the whole test process;
(2) in the automatic testing process, the power supply device, each testing device and the tested product respectively return the power supply state of the product, the working state of the device and the testing data of the product to the control center in real time, so that the control center can conveniently monitor and control the testing process by using the data;
(3) the control center automatically controls the actions of equipment such as a temperature box, a time reference, a constant current source and the like according to a process flow, supplies power to a product, cuts off the power supply and collects product data according to the actual starting of the test, the supply voltage and the current of the product are flexible and controllable, the collected product data can be sorted, stored, analyzed and reported, and finally the test automation of the current/frequency conversion circuit in the full temperature range is realized;
(4) the testing system opens up a plurality of channels, and carries out parallel testing on N products with consistent testing flows by using one set of equipment, so that the testing accuracy and reliability are improved;
(5) the test system realizes real-time monitoring, recording and diagnosis of the running state of the equipment: the test system collects the output state information of the power supply, the incubator, the time reference and the constant current source in real time, displays, updates and stores the information in real time for analyzing and tracing the influence of the output state of the equipment on the performance index of the product, and controls the equipment in a closed loop manner; meanwhile, the test system compares the equipment state information with the abnormal mode, realizes the identification, alarm and processing of the equipment operation fault in the test process, and realizes the protection of products and equipment.
Drawings
FIG. 1 is a block diagram of the components of an automated multi-channel test system for current/frequency conversion circuits according to the present invention;
FIG. 2 is a flow chart of the monitoring and recording implemented by the product monitoring and processing subsystem according to the present invention;
FIG. 3 is a flow chart of the abnormal state monitoring process performed by the equipment state monitoring alarm subsystem according to the present invention;
FIG. 4 is a flow chart of a product test using the current/frequency conversion circuit automated multi-channel test system of the present invention.
Detailed Description
The invention is further illustrated by the following examples.
In order to realize the automatic test of a plurality of current/frequency conversion circuits, the invention provides an automatic multi-channel test system of the current/frequency conversion circuits, which comprises a control center 1, a power supply subsystem 2, a test environment equipment subsystem 3, a product monitoring processing subsystem 4 and an equipment state alarm subsystem 5, as shown in figure 1.
Control center
In engineering implementation, the functions of the control center 1 are realized by embedding automatic test software in a test industrial control computer. The control center 1 receives test items and data acquisition information inputted from the outside through an interpersonal interface before the test is started. Different test equipment is designed according to different test items, and control instructions of the equipment are different, so that the test flow of each test item can be combed according to the test items, and the flow control parameters and the power on-off time sequence of the required test equipment are determined.
The control center 1 determines control instructions of test equipment such as a power supply device, a temperature box, a time reference device, a constant current source and the like according to externally input test items, determines a frequency measurement control instruction according to data acquisition information, and determines index items and specified values according to test requirements;
and then sends a power supply control command to the power supply subsystem 2 and sends a device control command to the test base device subsystem 3. In the testing process, receiving product testing data sent by a frequency measuring device, product power supply state parameters sent by a power supply subsystem 2 and working state parameters of a temperature box and a constant current source sent by a testing basic equipment subsystem 3; and then forwarded to the product monitoring processing subsystem 4 and the equipment status alarm subsystem 5.
(II) Power supply subsystem
The power subsystem 2 receives a power supply control instruction of the product to be tested sent by the control center 1, and independently supplies power to the N products to be tested according to the control instruction; and then returns the power supply state parameters of each product to be tested to the control center 1.
In the invention, the power supply subsystem 2 comprises a power supply device, a clock control device and a power output acquisition device, wherein: the power supply control instruction sent to the power supply device by the control center 1 comprises a current value and a voltage value, and the power supply device independently supplies power to each product to be tested according to the current and the voltage; the power supply control instruction sent by the control center 1 to the clock control device is a power supply time sequence and is used for controlling the power supply time of the power supply device to each product to be tested, ensuring that each product to be tested has independent automatic power supply and power off functions, and avoiding crosstalk in the independent power supply and power off processes. The power output acquisition device acquires actual current and voltage output by each product to be detected and returns the actual current and voltage as working state parameters of the power subsystem 2 to the control center 1 through the serial port.
(III) test Environment Equipment subsystem 3
The test environment equipment subsystem 3 comprises an incubator control device, a time reference device, a constant current source output device and a frequency measurement device, wherein the incubator control device, the time reference device and the constant current source output device are test equipment, and the frequency measurement device is a data acquisition device.
The incubator provides the temperature environment required by the experiment for the product to be tested, the control center 1 sends the external input of the experimental configuration module as a control instruction to the incubator control device, and the incubator control device starts or does not start the incubator according to the instruction requirement of the control center 1. When the incubator is started, the real-time temperature point of the incubator is used as the working state of the incubator and returns to the control center 1.
A time reference device: the test system comprises a control center 1, a time reference device and a test configuration module, wherein the control center 1 is used for providing time reference signals for a tested product, the external input of the test configuration module is used as a control instruction to be sent to the time reference device, and the time reference device outputs corresponding signals including no time reference, typical time reference and any time reference according to the instruction requirement of the control center 1 and provides the corresponding signals for the tested product; and simultaneously, the working state parameters of the time reference device are returned to the control center 1.
Constant current source output device: the constant current source output device is internally composed of I groups of authority currents with different magnitudes, wherein I is a positive integer, and the authority ratio is 1, 2, 5 or 1, 2, 3, 4; the control center 1 sends the external input of the test configuration module as a control instruction to the constant current source output device, the constant current source output device connects J groups of authority currents with different magnitudes in parallel according to the instruction requirement of the control center 1 to obtain a current value required by the test configuration module, J is a positive integer and is less than or equal to N; and then the working state parameters output by the constant current source are returned to the control center 1.
Frequency measurement device: after the control center 1 judges that the output of the constant current source is stable, a control instruction is sent to the frequency measurement module, the output data of the tested product is measured, and the frequency measurement result is returned to the control center 1.
(IV) product monitoring processing subsystem
The product monitoring and processing subsystem 4 comprises a test configuration module, a data display module, a data storage module, a data processing module and a data query module, and realizes the functions of test equipment, power supply, data acquisition control instruction and index, and specified parameter configuration, equipment and power supply working state display, and test data display, storage, processing and query.
A test configuration module: decomposing the test items and test actions to form test configuration parameters, inputting the test configuration parameters to the control center 1 as external input, and using the test configuration parameters as power supply, a temperature box, a time reference, a constant current source and a frequency measurement control instruction; meanwhile, the system also comprises a product index item to be detected and a specified value input control center 1.
A data display module: the control center 1 forwards the product power supply state parameters sent by the power supply subsystem 2, the incubator, the constant current source state parameters and the frequency measurement data sent by the test basic equipment subsystem 3 to the product monitoring processing subsystem 4, and the data display module displays the information.
A data storage module: and carrying out implementation, arrangement and storage on the received measured product information, the power supply state parameters, the working state parameters of the testing equipment and the frequency measurement data.
A data processing module: receiving an externally input processing instruction, reading product test data stored in the data storage module, processing the test data according to a set data processing method, comparing a processing result with an index configuration parameter, judging whether a result measurement result is qualified or not, giving a test conclusion, and finally storing the data processing result and the test conclusion again.
A data query module: and searching the relevant information of the tested product according to an externally input query instruction, and displaying all query results.
In the present invention, the flow of implementing data storage, monitoring, processing and query by the product monitoring processing subsystem 4 is shown in fig. 2, and the specific implementation process is as follows:
and (4.1) displaying the equipment state parameters and the frequency measurement data. When the power supply device, the incubator, the time reference device, the constant current source device and the frequency measuring device start to operate, the product data display module receives various state parameters and frequency measuring data returned by the testing device, and displays the power supply voltage current value, the incubator temperature value, the time reference frequency value and the constant current source current value in real time after analysis, and the values are refreshed once per second.
And (4.2) saving the state parameters, and saving the device state parameters and the frequency measurement data recorded in the step (4.1) in a decimal form in a database, wherein the decimal form is refreshed once per second.
And (4.3) judging whether the display of the equipment state and the frequency measurement data is finished or not according to the command sent by the test software.
If the data analysis, display and storage are required to be continued, the step (4.1) is carried out;
if the data analysis, display and storage are stopped after the test is finished, the step (4.4) is carried out;
and (4.4) data processing, namely calling data processing software to calculate the frequency measurement data and give a conclusion whether the indexes are qualified according to the index requirements set in the test configuration module, and storing the result in a report.
And (4.5) data query, namely calling query software to query the test result according to the information of the tested product and simultaneously reflecting the state parameters of each device during testing.
(V) equipment state monitoring processing subsystem
The equipment state monitoring and processing subsystem 5 comprises a power supply abnormity diagnosis module, an incubator state abnormity diagnosis module, a time reference abnormity diagnosis module, a constant current source state abnormity diagnosis module and an alarm power-off device.
The control center 1 sends the power supply state parameters of the product and the working state parameters of the test equipment, and each anomaly diagnosis module compares the received working state parameters of the test equipment with the working state parameter threshold of the equipment.
And when the working state parameter exceeds the threshold value, judging that the test equipment is abnormal, sending an alarm instruction to an alarm device, wherein the alarm device is an audible and visual alarm device, and displaying the current equipment fault information on a display. And simultaneously sending a power-off command to a power-off device, and powering off the abnormal equipment and the tested product. Fig. 3 shows a process flow of monitoring and processing an abnormal state by the device state monitoring and alarming subsystem, and the specific determination processes of power supply abnormality, incubator state abnormality, time reference abnormality, and constant current source state abnormality are as follows:
(5.1) Power supply abnormality diagnosis
The control center 1 sends the received power supply working state parameters to a power supply abnormity diagnosis module, compares the real-time current I and voltage value U with threshold values (Imax and Umax), and when the actual current I and voltage U exceed the threshold values (Imax and Umax) required by test items, namely I is greater than Imax or U is greater than Umax, the control center 1 is greater than Imax and sends audible and visual alarm and power-off instructions to the equipment state monitoring processing subsystem 5, and meanwhile, the power-off device cuts off the power supply.
(5.2) diagnosis of abnormal incubator State
The control center 1 sends the received incubator working state parameters to an incubator state abnormity diagnosis module, the temperature set by the test configuration parameters is Ki, i is a positive integer, the real-time monitored temperature is Ki ', when the absolute value of Ki' -Ki is larger than or equal to an alarm range, the control center 1 sends an audible and visual alarm and power-off instructions to the equipment state monitoring processing subsystem 5, and meanwhile, the power-off device cuts off a power supply;
(5.3) time-based abnormality diagnosis
The control center 1 sends the received time reference working state parameters to the time reference state abnormity diagnosis module, the frequency set by the test configuration parameters is Fi, i is a positive integer, the time reference actual output frequency is Fi ', when the Fi' -Fi | > is more than or equal to Fi 10%, the control center 1 sends an audible and visual alarm and a power-off instruction to the equipment state monitoring processing subsystem (5), and meanwhile, the power-off device cuts off the power supply.
(5.4) diagnosis of abnormality in the State of constant-current Source
The control center 1 sends the received working state parameters of the constant current source to the constant current source state abnormity diagnosis module, the current set by the test configuration parameters is Ii, i is a positive integer, the actual output current of the constant current source is Ii ', when the Ii' -Ii is more than or equal to Ii x 10%, the control center (1) sends an audible and visual alarm and a power-off instruction to the equipment state monitoring processing subsystem 5, and meanwhile, the power-off device cuts off the power supply.
Examples
The flow of the method for testing the product by adopting the automatic multi-channel test system of the current/frequency conversion circuit is shown in figure 4. The present real-time example is described by taking an all-temperature test as an example.
The automatic multi-channel test system for the current/frequency conversion circuit provided by the invention is used for carrying out a full-temperature test and comprises the following steps:
(1) and selecting a full-temperature test project, and setting test parameters according to test requirements. The control center reads the test configuration parameters, checks serial port information of each test device and the tested product, initializes according to the serial port, judges whether the test device can communicate with the test industrial personal computer, and displays initialization failure if any one of the test device and the tested product cannot communicate with the test industrial personal computer; and if the communication is normal, controlling each device and product to execute the test flow.
The specific test parameters comprise; power supply parameters: voltage value, power supply preheating time, maximum voltage output value and maximum current output value required by a tested product; oven parameters: temperature point and heat preservation time; time reference parameters: the required frequency value and the frequency error range of the product to be measured; constant current source parameters: the direction and the current value of input current, the running time of each current and the threshold value of the input current required by a tested product are obtained; frequency test parameters: and testing the axial direction, the normal direction, the corresponding measurement time of each current value, the technical index and the specified value thereof.
(2) The incubator control device receives the sent starting command, the target temperature value and the heat preservation time which are required to be obtained by the incubator, controls the incubator to be started after the command is analyzed, changes the temperature of the incubator according to the default temperature change rate, and controls the incubator to keep the running state under the temperature value until the set heat preservation time is reached according to the received heat preservation time after the incubator reaches the target temperature value. Meanwhile, the temperature value output by the incubator is fed back to the test industrial personal computer, and the industrial personal computer reads the temperature value after identification by the test software.
(3) After the incubator runs and meets the conditions, the incubator sends opening, voltage and current commands to the power supply device, sends channel numbers and opening commands to the constant control device, and supplies power to products with N channels under the set power supply voltage and current limiting. And simultaneously, sending a frequency command required for starting and outputting to the time reference device to provide a time reference signal for the tested product. And after the detected product is electrified for reaching the preheating time, sending commands of starting, current direction, current value, running time of each current and the like to the constant current source output device, and controlling the constant current source to start running.
Firstly, controlling a constant current source to output 0mA, sending a starting measurement instruction to a frequency measurement device after the current is stable, measuring the output frequency of a product when 0mA is input, automatically storing the analyzed data according to a preset format, and stopping receiving the product data after the data acquisition time.
And then, the constant current source output device outputs according to a set current method, a set current value and the current point operation time, after the output of each current point is stable, the data acquisition module is started, product data are analyzed according to a set sampling interval, the analyzed data are automatically stored, and the product data are stopped from being received after the frequency measurement time is up.
And after the constant current source finishes all current output and collects all test data, sending a channel number and a closing command to the constant current source control device, and controlling the mth channel of the power supply device to stop supplying power. And after all the products finish the stage of testing and are powered off, sending a stop command to the time reference and constant current source output devices, and stopping the time reference and constant current source output devices.
(4) And (3) the incubator control device receives the next target temperature point and the heat preservation time instruction again, and the incubator enters the step (2) to operate.
(5) And (4) continuing to perform power supply, time reference, constant current source control and frequency measurement in the temperature environment provided in the step (4) according to the mode in the step (3).
(6) And (5) continuously operating according to the test configuration requirements of the test software in the modes of the steps (2) to (5), and finishing the whole test flow by paper.
(7) When the test equipment starts to operate, the data timing module and the storage module receive data analysis, display and storage instructions, analyze the power supply voltage current value, the incubator temperature value, the time reference frequency value, the constant current source output current value and the frequency measurement result received by the test industrial personal computer, convert the power supply voltage current value, the incubator temperature value, the time reference frequency value, the constant current source output current value and the frequency measurement result into decimal data, display the decimal data on a test interface, and synchronously update and store the decimal data in real time.
(8) After the test process is started, the equipment state alarm subsystem starts to work, the electrical anomaly diagnosis module, the incubator state anomaly diagnosis module, the time reference anomaly diagnosis module and the constant current source state anomaly diagnosis module continuously receive equipment state parameters sent by the power supply subsystem and the test environment equipment subsystem, compare the received information with various anomaly diagnosis standards, if the comparison is successful, judge that the equipment state is abnormal, send fault information to the sound and light alarm device, display the fault information on a screen and send an alarm. And simultaneously, sending an instruction to the equipment and the product to power off.
(9) When the test is finished, the power supply, the incubator, the time reference, the output state data of the constant current source and the product data stop collecting, storing and displaying, and the fault abnormality diagnosis module stops other fault information. And calculating the test data according to the index requirements in the test configuration module, comparing the test data with a specified value, giving a test conclusion, and putting the result into a word document. And sending a stop command to a power supply device, an incubator, a time reference device, a constant current source device, a frequency measurement device, an equipment working state sending device, an abnormal state diagnosis device and a fault alarm device, stopping working of the devices, clearing serial port information of equipment and products, and ending a test flow. The test user can inquire the test data according to the use requirement.
The automatic multi-channel test system of the current/frequency conversion circuit has the following advantages:
(1) after the test equipment is started, the control center automatically controls the actions of equipment such as a temperature box, a time reference and a constant current source according to the process flow, supplies power to a product, cuts off the power supply and collects product data according to the actual start of the test, the power supply voltage and the current of the product are flexible and controllable, the collected product data can be sorted, stored, analyzed and reported, and finally the test automation of the current/frequency conversion circuit in the full temperature range is realized.
(2) The test system opens up a plurality of channels, and N products with consistent test flows are tested in parallel by using one set of equipment, so that the test accuracy and reliability are improved.
(3) The test system realizes real-time monitoring, recording and diagnosis of the running state of the equipment: the test system collects the output state information of the power supply, the incubator, the time reference and the constant current source in real time, displays, updates and stores the information in real time for analyzing and tracing the influence of the output state of the equipment on the performance index of the product, and controls the equipment in a closed loop mode. Meanwhile, the test system compares the equipment state information with the abnormal mode, realizes the identification, alarm and processing of the equipment operation fault in the test process, and realizes the protection of products and equipment through the coordination and coordination of software and hardware.
The above description is only one embodiment of the present invention, but the scope of the present invention is not limited thereto, and any changes or substitutions that can be easily conceived by those skilled in the art within the technical scope of the present invention are included in the scope of the present invention.
Although the present invention has been described with reference to the preferred embodiments, it is not intended to limit the present invention, and those skilled in the art can make variations and modifications of the present invention without departing from the spirit and scope of the present invention by using the methods and technical contents disclosed above.
Claims (8)
1. An automatic multi-channel test system of a current/frequency conversion circuit is used for testing N products to be tested, N is a positive integer, and is characterized by comprising a control center (1), a power supply subsystem (2) and a test environment equipment subsystem (3),
control center (1): receiving externally input test items, test parameters and data acquisition information, determining a power supply control instruction of a tested product and a control instruction of test environment equipment according to the test items and the test parameters, and determining a frequency measurement control instruction according to the data acquisition information;
then, each control instruction is sent to the power supply subsystem (2) and the test environment equipment subsystem (3), and when the environment to be tested meets the requirements of test items and test parameters, a data acquisition control instruction is sent to the test environment equipment subsystem (3); receiving test data and power supply sent by the test environment equipment subsystem (3) and working state parameters returned by the test equipment in the test process;
power subsystem (2): receiving a power supply instruction of a product to be tested sent by a control center (1), and independently supplying power to N products to be tested according to the control instruction; then, returning the power supply state parameters of the products to be tested to the control center (1);
test environment equipment subsystem (3): receiving a control instruction of the test equipment sent by the control center (1), providing a temperature environment, a time reference and a constant current source signal specified by the test item for the product to be tested, and measuring the output frequency of the product to be tested according to the specification of the test item; the executed device status and frequency measurement data are then transmitted to the receiving control center (1).
2. The automated multi-channel test system for current/frequency conversion circuits of claim 1, wherein: the test environment equipment subsystem (3) comprises an incubator control device, a time reference device, a constant current source output device and a frequency measurement device;
the incubator control device, the time reference device and the constant current source output device are test equipment, and the frequency measurement device is a data acquisition device;
incubator controlling means: the control center (1) sends the external input of the test configuration module as a control instruction to the incubator control device, the incubator control device starts or does not start the incubator according to the instruction requirement of the control center (1), and when the incubator is started, the real-time temperature point of the incubator is used as the working state of the incubator and returns to the control center (1);
a time reference device: the control center (1) sends the external input of the test configuration module as a control instruction to the time reference device, and the time reference device outputs a corresponding signal according to the instruction requirement of the control center (1) and provides the corresponding signal for a product to be tested, wherein the signal comprises a non-time reference, a typical time reference and an arbitrary time reference; meanwhile, the working state parameters of the time reference device are transmitted back to the control center (1);
constant current source output device: the constant current source output device is internally composed of I groups of authority currents with different magnitudes, wherein I is a positive integer and is a combination of 1, 2 and 5 or 1, 2, 3 and 4 according to the authority ratio to obtain a required current value; the control center (1) sends the external input of the test configuration module as a control instruction to the constant current source output device, the constant current source output device connects J groups of authority currents with different magnitudes in parallel according to the instruction requirement of the control center (1) to obtain a current value required by the test configuration module, J is a positive integer and J is not more than N; then the working state parameters output by the constant current source are transmitted back to the control center (1);
frequency measurement device: after the control center (1) judges that the output of the constant current source is stable, a control instruction is sent to the frequency measuring device, the output data of the measured product is measured, and the frequency measuring result is sent back to the control center (1).
3. The automated multi-channel test system for current/frequency conversion circuits of claim 1, wherein: the power subsystem (2) comprises a power supply device, a clock control device and a power output acquisition device, wherein:
the power supply control instruction sent to the power supply device by the control center (1) comprises a current value and a voltage value, and the power supply device independently supplies power to each product to be tested according to the current and the voltage;
the control center (1) sends a power supply control command to the clock control device as a power supply time sequence for controlling the power supply time sequence of the power supply device to each product to be tested;
the power output acquisition device tests the actual current and voltage output by each product to be tested and returns the actual current and voltage as the working state parameters of the power subsystem (2) to the control center (1).
4. The automated multi-channel test system for current/frequency conversion circuits according to any one of claims 1-3, wherein:
the product monitoring and processing subsystem (4) comprises a test configuration module, a data display module, a data storage module, a data processing module and a data query module;
a test configuration module: decomposing the test items and test actions to form test configuration parameters, inputting the test configuration parameters to a control center (1) as external input, and using the test configuration parameters as power supply, a temperature box, a time reference, a constant current source and a frequency measurement control instruction; inputting the index items and the specified values of the products to be tested into a control center (1);
a data display module: the control center (1) sends the product power supply state parameters sent by the power subsystem (2) to the product monitoring processing subsystem (4), and simultaneously sends the incubator, the constant current source state parameters and the frequency measurement data sent by the test basic equipment subsystem (3) to the product monitoring processing subsystem (4), and the data display module displays the information;
a data storage module: the received tested product information, power supply state parameters, test equipment working state parameters and frequency measurement data are implemented, sorted and stored;
a data processing module: receiving an externally input processing instruction, reading product test data stored in a data storage module, processing the test data according to a set data processing method, comparing a processing result with an index configuration parameter, judging whether a result measurement result is qualified or not, giving a test conclusion, and finally storing the data processing result and the test conclusion again;
a data query module: and searching the relevant information of the tested product according to an externally input query instruction, and displaying all query results.
5. An automated multi-channel test system for current/frequency conversion circuits according to claim 1 or 2, wherein: the device state monitoring and processing subsystem (5) comprises a power supply abnormity diagnosis module, an incubator state abnormity diagnosis module, a time reference abnormity diagnosis module, a constant current source state abnormity diagnosis module and an alarm power-off device;
a power supply abnormality diagnosis module: the control center (1) sends the received power supply working state parameters to the power supply abnormity diagnosis module, compares the real-time current and voltage values with threshold values, and when the actual current and voltage exceed the threshold values required by test items, the control center (1) sends acousto-optic alarm and power-off instructions to the equipment state monitoring processing subsystem (5), and meanwhile, the alarm power-off device cuts off the power supply;
an incubator state anomaly diagnosis module: the control center (1) sends the received working state parameters of the incubator to the incubator state abnormity diagnosis module, in order to ensure that the incubator alarms and sets rationality at a plurality of temperatures, the temperature set by the test configuration parameters is Ki, i is a positive integer, the real-time monitoring temperature is Ki ', when the absolute value of Ki' -Ki is larger than or equal to the alarm range, the control center (1) sends acousto-optic alarm and power-off instructions to the equipment state monitoring processing subsystem (5), and the alarm power-off device cuts off the power supply;
a time-reference anomaly diagnostic module: the control center (1) sends the received time reference working state parameters to the time reference state abnormity diagnosis module, in order to ensure the reasonability of alarm setting of time reference output under a plurality of frequency values, the frequency set by the test configuration parameters is Fi, i is a positive integer, the actual output frequency of the time reference is Fi ', when the Fi' -Fi | > 10%, the control center (1) sends acousto-optic alarm and power-off instructions to the equipment state monitoring processing subsystem (5), and the alarm power-off device cuts off the power supply;
the constant current source state abnormity diagnosis module: the control center (1) sends the received constant current source working state parameters to the constant current source state abnormity diagnosis module, in order to ensure the reasonability of alarm setting of the constant current source output under a plurality of current values, the current set by the test configuration parameters is Ii, i is a positive integer, the actual output current of the constant current source is Ii ', when | Ii' -Ii | > is more than or equal to Ii 10%, the control center (1) sends an acousto-optic alarm and a power-off instruction to the equipment state monitoring processing subsystem (5), and meanwhile, the alarm power-off device cuts off the power supply.
6. The automated multi-channel test system for current/frequency conversion circuits of claim 2, wherein: and (3) judging the stability of the constant current source output device: setting a basic time T0 and a step time Tp, wherein the preliminary accurate time of each current point is T0+ n Tp, T0 is the shortest current conversion time value, Tp is the time interval for feeding back the real-time current of the constant current source, n is an integer, namely after a current value command T0 is sent for time, the control center (1) inquires whether the constant current source is stable and meets the requirement at the time interval of Tp; when the absolute actual current value-set value/set value is less than or equal to the error range, the current value output by the constant current source is stable in the time T.
7. The automated multi-channel test system of claim 4, wherein: the data processing accuracy is guaranteed:
the control center (1) controls the constant current source to output 0mA current, measures the actual output I0 'of the constant current source at intervals of unit time, judges that the 0mA current is stable when the error range (I0' -0mA) is less than or equal to the error range, measures the output signal frequency F0 of the tested circuit board at the moment and returns to the control center (1);
the constant current source output Ii is sequentially controlled according to the external input requirement of the test configuration module, the actual output of the constant current source is calculated at intervals of unit time, the current value I0 ' corresponding to the actual 0mA is deducted, namely Ii ″ -Ii ' -I0 ', when the error range of the Ii ″ -Ii |/Ii ≦ is smaller than or equal to the error range, the current is judged to be stable, the output signal frequency Fi of the tested product is measured and sent to data display and processing through a control center (1), and the conversion equivalent of the data processing is K ═ Fi/Ii ″, and the result is accurate.
8. The automated multi-channel test system for current/frequency conversion circuits of claim 2, wherein: the method comprises input index information of a tested circuit board test and detection index information of a test result.
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