CN111090010A - Multi-channel capacitance testing system and method - Google Patents
Multi-channel capacitance testing system and method Download PDFInfo
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- CN111090010A CN111090010A CN201911366983.XA CN201911366983A CN111090010A CN 111090010 A CN111090010 A CN 111090010A CN 201911366983 A CN201911366983 A CN 201911366983A CN 111090010 A CN111090010 A CN 111090010A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
- G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
- G01R27/2605—Measuring capacitance
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/281—Specific types of tests or tests for a specific type of fault, e.g. thermal mapping, shorts testing
Abstract
The invention discloses a multipath capacitor testing system which comprises a power supply, an adjustable constant current source, a relay unit, two electronic switch units, a capacitor discharging unit, an IO (input/output) extension unit, an ADC (analog-to-digital converter) unit and a singlechip, wherein the power supply is respectively connected with the adjustable constant current source and the singlechip and supplies power; the voltage tested by the constant current source testing capacitor is wide and is easy to test; when the multi-path impedance capacitor is tested, the single-path connection method can be realized through the quick switching of the electronic switch for testing; the charging time of the constant current source is much shorter than that of the constant voltage source, the testing time is reduced, and the testing efficiency is high. The invention also discloses a multi-channel capacitance testing system and method.
Description
Technical Field
The invention relates to the field of capacitance testing, in particular to a multi-channel capacitance testing system and method.
Background
At present, a capacitance test technology is based on the charge-discharge characteristics of a capacitor, and is realized by utilizing the charge-discharge characteristics of the capacitor no matter through a constant voltage method charge test or through conversion of RC oscillation into a corresponding frequency test. When the capacitor is tested by constant voltage charging, the voltage at two ends of the capacitor and the charging time are in exponential characteristics when the capacitor is charged, and the capacitance value of the capacitor can be calculated as long as the charging time and the voltage difference before and after charging are recorded; when the RC vibrates to test the capacitor, the capacitor to be tested and the constant value resistor are jointly put into an RC vibration network to generate vibration frequency, and the capacitance value of the capacitor can be calculated by testing the vibration frequency. Therefore, a plurality of instruments for testing the capacitance are available in the market and can be used for testing various components.
In the test industry for PCBAs, most of the capacitors are tested by adopting a constant voltage scheme, the constant voltage charging is adopted, the charging time and the voltage difference before and after charging are tested, and the measured capacitors are calculated by utilizing an inverse index. With the rapid development of electronic technology, the modularization, integration, high efficiency, intellectualization and automation of the system are the pursuit direction of the testing industry. High speed and high efficiency tests are required in testing electronic performance, and a high efficiency capacitive test system is needed to effectively reduce time cost.
However, the existing test system has the following defects:
1. the design has larger volume, is not easy to integrate and has not wide application occasions;
2. the constant voltage scheme is used for testing the capacitor, the voltage before and after charging and the charging time need to be tested, the error is large through inverse exponential calculation, and the testing precision is low;
3. during single-capacitor testing, the mode of a relay is adopted for switching testing, and the testing time is relatively long;
4. when the multi-channel capacitor is tested, the efficiency is low, and the switching period is long.
Disclosure of Invention
In order to overcome the defects of the prior art, an objective of the present invention is to provide a multi-path capacitance testing system and method, which can solve the problems of large error, low testing precision and low efficiency.
One of the purposes of the invention is realized by adopting the following technical scheme:
a multipath capacitance testing system comprises a power supply, an adjustable constant current source, a relay unit, two electronic switch units, a capacitance discharging unit, an IO expansion unit, an ADC unit and a single chip microcomputer, wherein the power supply is respectively connected with the adjustable constant current source, the relay unit, the capacitance discharging unit, the IO expansion unit, the ADC unit and the single chip microcomputer and supplies power, the adjustable constant current source is connected with the relay unit and outputs a corresponding constant current source, a circuit board provided with multipath capacitances is respectively connected with the two electronic switch units, a plurality of capacitors to be tested are arranged on the circuit board provided with the multipath capacitances, the input end of the IO expansion unit is connected with the single chip microcomputer, the output end of the IO expansion unit is respectively connected with the control ends of the two electronic switch units, and the input end of the ADC unit is connected with the front end of the multipath capacitance, the ADC unit is connected with the single chip microcomputer, and the single chip microcomputer performs data collection, processing and switch control through the IO extension unit and the ADC unit.
Furthermore, one end of the capacitor discharge unit is connected with the front end of the capacitor to be tested, and the other end of the capacitor discharge unit is grounded through a resistor.
Furthermore, a power chip is arranged in the power supply, and the power supply supplies power through the power chip.
Furthermore, the two electronic switch units are respectively an electronic switch unit I and an electronic switch unit II, the electronic switch unit I is connected with the front end of the capacitor to be tested, and the electronic switch unit II is connected with the rear end of the capacitor to be tested.
The utility model provides a multichannel electric capacity test method, is applied to multichannel electric capacity test system, and multichannel electric capacity test system includes power supply, adjustable constant current source, relay unit, two electronic switch units, electric capacity discharge unit, IO extension unit, ADC unit and singlechip, adjustable constant current source with relay unit connects and exports corresponding constant current source, and the circuit board that is provided with multichannel electric capacity is respectively with two the electronic switch unit is connected, is provided with a plurality of electric capacities that await measuring on the circuit board that is provided with multichannel electric capacity, IO extension unit's input with the singlechip is connected, IO extension unit's output respectively with two the control end of electronic switch unit is connected, the input of ADC unit is connected with the front end of multichannel electric capacity, the ADC unit with the singlechip is connected, includes following step:
a discharging step: switching to a capacitor discharge unit through an electronic switch unit and performing discharge processing on the capacitor to be detected;
a power supply step: the power supply runs and adjusts the constant current to the corresponding test through the adjustable constant current source and the relay unit;
a capacitance selection step: the single chip microcomputer sends a test signal, and the two electronic switch units are controlled to be switched to corresponding capacitors to be tested through the IO extension unit;
and a capacitance testing step: constant current charges a capacitor to be tested through the electronic switch unit, and the ADC unit samples instantaneous voltage and reads a voltage value and charging time;
and (3) data processing: and the single chip microcomputer processes the charging time and the voltage data read by the ADC unit.
Further, the multipath capacitance testing method further comprises the operation checking step of: and (4) checking whether the operation is wrong or not, if not, returning to the discharging step, and if so, generating an alarm signal by the singlechip.
Further, in the power supply step, the adjustable constant current source provides current charging of different gears for capacitors with different capacitance values.
Compared with the prior art, the invention has the beneficial effects that:
1. the input end of the ADC unit is connected with the front end of the multi-path capacitor, the ADC unit is connected with the single chip microcomputer, and the single chip microcomputer performs data collection, processing and switch control through the IO extension unit and the ADC unit. The designed whole system has small volume, low cost, easy operation and realization and wide application occasions;
2. the precision of the capacitance test by the constant current source method is high, and the test method is simple and easy to implement; the voltage tested by the constant current source testing capacitor is wide and is easy to test;
3. when the multi-path impedance capacitor is tested, the single-path connection method can be realized through the quick switching of the electronic switch for testing;
4. when the same capacitor is charged, the charging time of the constant current source is much shorter than that of the constant voltage source, so that the testing time is reduced, and the testing efficiency is high.
The foregoing description is only an overview of the technical solutions of the present invention, and in order to make the technical means of the present invention more clearly understood, the present invention may be implemented in accordance with the content of the description, and in order to make the above and other objects, features, and advantages of the present invention more clearly understood, the following preferred embodiments are described in detail with reference to the accompanying drawings.
Drawings
FIG. 1 is a block diagram of a multi-channel capacitance testing system according to a preferred embodiment of the present invention;
FIG. 2 is a flow chart of a multi-path capacitance testing method.
Detailed Description
The present invention will be further described with reference to the accompanying drawings and the detailed description, and it should be noted that any combination of the embodiments or technical features described below can be used to form a new embodiment without conflict.
It will be understood that when an element is referred to as being "secured to" another element, it can be directly on the other element or intervening elements may also be present. When a component is referred to as being "connected" to another component, it can be directly connected to the other component or intervening components may also be present. When a component is referred to as being "disposed on" another component, it can be directly on the other component or intervening components may also be present. The terms "vertical," "horizontal," "left," "right," and the like as used herein are for illustrative purposes only.
Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this invention belongs. The terminology used in the description of the invention herein is for the purpose of describing particular embodiments only and is not intended to be limiting of the invention. As used herein, the term "and/or" includes any and all combinations of one or more of the associated listed items.
Referring to fig. 1, a multi-path capacitor testing system includes a power supply, an adjustable constant current source, a relay unit, two electronic switch units, a capacitor discharge unit, an IO expansion unit, an ADC unit, and a single chip, wherein the power supply is respectively connected to the adjustable constant current source, the relay unit, the capacitor discharge unit, the IO expansion unit, the ADC unit, and the single chip for supplying power, the adjustable constant current source is connected to the relay unit for outputting a corresponding constant current source, a circuit board provided with multi-path capacitors is respectively connected to the two electronic switch units, a plurality of capacitors to be tested are disposed on the circuit board provided with the multi-path capacitors, an input end of the IO expansion unit is connected to the single chip, an output end of the IO expansion unit is respectively connected to control ends of the two electronic switch units, and an input end of the ADC unit is connected to a front end of the, the ADC unit is connected with the single chip microcomputer, and the single chip microcomputer performs data collection, processing and switch control through the IO extension unit and the ADC unit. The designed whole system has small volume, low cost, easy operation and realization and wide application occasions; the precision of the capacitance test by the constant current source method is high, and the test method is simple and easy to implement; the voltage tested by the constant current source testing capacitor is wide and is easy to test; when the multi-path impedance capacitor is tested, the single-path connection method can be realized through the quick switching of the electronic switch for testing; when the same capacitor is charged, the charging time of the constant current source is much shorter than that of the constant voltage source, so that the testing time is reduced, and the testing efficiency is high.
When the test system is applied specifically, the power supply supplies power to the whole test system, and supplies power to each unit through the power supply chip, wherein the power supply chip internally comprises a reference power supply. The adjustable constant current source provides current charging at different gears aiming at the capacitors with different capacitance values, so that the aim of quick charging test is fulfilled conveniently. The relay unit controls the switching of different current gears. The electronic switch unit I: the output end of the constant current source and the front end of the capacitor to be tested are controlled and connected to play a role in switching test; and a second electronic switch unit: the rear end of the capacitor to be tested is connected with the negative end of the constant current source in a control mode, and the switching test effect is achieved. In order to make the precision of the test value higher, the capacitor discharge unit needs to discharge the capacitor before the test to prevent the test deviation caused by static electricity or other electrification. The capacitor needs to be discharged after the test to avoid affecting the circuit. IO extension unit in this application, the control that more IO mouths of extension of singlechip carry out multichannel electric capacity etc. and switch. During testing, the analog signal for reading the charging voltage at two ends of the capacitance is converted into a digital signal, and the data is transmitted into the singlechip for processing,
preferably, one end of the capacitor discharge unit is connected with the front end of the capacitor to be tested, and the other end of the capacitor discharge unit is grounded through a resistor. The problem of the electric capacity quick discharge is solved, the precision of test has been improved.
Preferably, a power chip is arranged in the power supply, and the power supply supplies power through the power chip. The power supply of different units can be reasonably adjusted.
Preferably, the two electronic switch units are respectively an electronic switch unit I and an electronic switch unit II, the electronic switch unit I is connected with the front end of the capacitor to be tested, and the electronic switch unit II is connected with the rear end of the capacitor to be tested. Specifically, the back terminals of each of the electronic switches are connected in common, and then the ground terminals of all the electronic switches are connected in common.
In particular, in the present application, the ADC unit is an analog-to-digital converter, which is a type of device for converting a continuous signal in an analog form into a discrete signal in a digital form. An analog to digital converter may provide the signal for measurement. The voltage at the two ends of the capacitor cannot change suddenly, and when the constant voltage is charged, the voltage at the two ends of the capacitor and the time are in an exponential relation; when the constant current is charged, the voltage at two ends of the constant current is in a linear relation with time.
Referring to fig. 2, a multi-path capacitance testing method is applied to a multi-path capacitance testing system, which includes a power supply, an adjustable constant current source, a relay unit, two electronic switch units, a capacitance discharging unit, an IO extension unit, an ADC unit and a single chip microcomputer, the adjustable constant current source is connected with the relay unit and outputs a corresponding constant current source, the circuit board provided with the multipath capacitors is respectively connected with the two electronic switch units, the circuit board provided with the multipath capacitors is provided with a plurality of capacitors to be tested, the input end of the IO expansion unit is connected with the single chip microcomputer, the output end of the IO expansion unit is respectively connected with the control ends of the two electronic switch units, the input end of the ADC unit is connected with the front end of the multi-path capacitor, the ADC unit is connected with the single chip microcomputer, and the method comprises the following steps:
a discharging step: switching to a capacitor discharge unit through an electronic switch unit and performing discharge processing on the capacitor to be detected;
a power supply step: the power supply runs and adjusts the constant current to the corresponding test through the adjustable constant current source and the relay unit;
a capacitance selection step: the single chip microcomputer sends a test signal, and the two electronic switch units are controlled to be switched to corresponding capacitors to be tested through the IO extension unit;
and a capacitance testing step: constant current charges a capacitor to be tested through the electronic switch unit, and the ADC unit samples instantaneous voltage and reads a voltage value and charging time;
and (3) data processing: and the single chip microcomputer processes the charging time and the voltage data read by the ADC unit. In practical application, the electronic switch module can be switched to the capacitor to be tested in a very short time, and the testing time of a single capacitor is about 100 milliseconds at most. The functions of control, data acquisition, data processing and the like are realized through a micro processor of the single chip microcomputer. In the implementation process, the capacitor discharge unit is connected with the front end of the capacitor unit to be tested and then grounded through the resistor; the input end of the IO extension unit is connected with the single chip microcomputer, and the output end of the IO extension unit is connected with the corresponding control ends of the first electronic switch unit and the second electronic switch unit of the electronic switch unit and used for controlling the switching of each path of electronic switches and the switching of the constant current source; the input end of the ADC unit is connected with the front end of the capacitor to be tested and is connected with the singlechip; the single chip microcomputer is connected with the ADC unit and the IO extension unit, and is mainly used for collecting and processing data, controlling a switch and the like.
Preferably, the multi-path capacitance test method further comprises an operation checking step of: and (4) checking whether the operation is wrong or not, if not, returning to the discharging step, and if so, generating an alarm signal by the singlechip. In the power supply step, the adjustable constant current source provides current charging of different gears aiming at the capacitors with different capacitance values. The test can be coordinated, the test of a plurality of electric capacity is carried out in succession, and the precision is high, and is efficient.
In summary, the present application has the following advantages:
1) the volume is effectively reduced due to the integrated design;
2) the single capacitor test time is short, and the realization is easy;
3) the multi-capacitor test is automatically switched, and the operation is simple;
4) the function is unitized, convenient maintenance.
The above embodiments are only preferred embodiments of the present invention, and the protection scope of the present invention is not limited thereby, and any insubstantial changes and substitutions made by those skilled in the art based on the present invention are within the protection scope of the present invention.
Claims (7)
1. The utility model provides a multichannel capacitance test system, includes power supply, adjustable constant current source, relay unit, two electronic switch units, electric capacity discharge unit, IO extension unit, ADC unit and singlechip, its characterized in that: the utility model discloses a multi-channel capacitor, including power supply, adjustable constant current source, relay unit, electric capacity discharge unit, IO expansion unit ADC unit and singlechip are connected and the power supply, adjustable constant current source with relay unit connects and exports corresponding constant current source, the circuit board that is provided with the multichannel electric capacity respectively with two the electronic switch unit connects, is provided with a plurality of electric capacities that await measuring on the circuit board that is provided with the multichannel electric capacity, IO expansion unit's input with the singlechip is connected, IO expansion unit's output respectively with two the control end of electronic switch unit is connected, the input of ADC unit is connected with the front end of multichannel electric capacity, the ADC unit with the singlechip is connected, the singlechip passes through IO expansion unit with the ADC unit carries out data collection, processing and control switch.
2. The multi-way capacitance test system of claim 1, wherein: one end of the capacitor discharge unit is connected with the front end of the capacitor to be tested, and the other end of the capacitor discharge unit is grounded through a resistor.
3. The multi-way capacitance test system of claim 1, wherein: and a power chip is arranged in the power supply, and the power supply supplies power through the power chip.
4. The multi-way capacitance test system of claim 1, wherein: the two electronic switch units are respectively an electronic switch unit I and an electronic switch unit II, the electronic switch unit I is connected with the front end of the capacitor to be tested, and the electronic switch unit II is connected with the rear end of the capacitor to be tested.
5. A multi-channel capacitance testing method is applied to a multi-channel capacitance testing system, the multi-channel capacitance testing system comprises a power supply, an adjustable constant current source, a relay unit, two electronic switch units, a capacitance discharging unit, an IO expanding unit, an ADC unit and a single chip microcomputer, the adjustable constant current source is connected with the relay unit and outputs a corresponding constant current source, the circuit board provided with the multipath capacitors is respectively connected with the two electronic switch units, the circuit board provided with the multipath capacitors is provided with a plurality of capacitors to be tested, the input end of the IO expansion unit is connected with the single chip microcomputer, the output end of the IO expansion unit is respectively connected with the control ends of the two electronic switch units, the input end of the ADC unit is connected with the front end of the multi-path capacitor, the ADC unit is connected with the single chip microcomputer, and the method is characterized by comprising the following steps:
a discharging step: switching to a capacitor discharge unit through an electronic switch unit and performing discharge processing on the capacitor to be detected;
a power supply step: the power supply runs and adjusts the constant current to the corresponding test through the adjustable constant current source and the relay unit;
a capacitance selection step: the single chip microcomputer sends a test signal, and the two electronic switch units are controlled to be switched to corresponding capacitors to be tested through the IO extension unit;
and a capacitance testing step: constant current charges a capacitor to be tested through the electronic switch unit, and the ADC unit samples instantaneous voltage and reads a voltage value and charging time;
and (3) data processing: and the single chip microcomputer processes the charging time and the voltage data read by the ADC unit.
6. The multi-path capacitance test method of claim 5, wherein: the multipath capacitance testing method further comprises the operation checking step of: and (4) checking whether the operation is wrong or not, if not, returning to the discharging step, and if so, generating an alarm signal by the singlechip.
7. The multi-path capacitance test method of claim 5, wherein: in the power supply step, the adjustable constant current source provides current charging of different gears aiming at the capacitors with different capacitance values.
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| CN201911366983.XA CN111090010A (en) | 2019-12-26 | 2019-12-26 | Multi-channel capacitance testing system and method |
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