CN111090009A - Adjustable test fixture and test method for chip resistor - Google Patents
Adjustable test fixture and test method for chip resistor Download PDFInfo
- Publication number
- CN111090009A CN111090009A CN202010016407.9A CN202010016407A CN111090009A CN 111090009 A CN111090009 A CN 111090009A CN 202010016407 A CN202010016407 A CN 202010016407A CN 111090009 A CN111090009 A CN 111090009A
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- chip resistor
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- 238000012360 testing method Methods 0.000 title claims abstract description 105
- 238000010998 test method Methods 0.000 title abstract description 4
- 238000000034 method Methods 0.000 claims abstract description 15
- 238000003466 welding Methods 0.000 claims description 8
- 238000004519 manufacturing process Methods 0.000 abstract description 9
- 238000004806 packaging method and process Methods 0.000 abstract description 8
- 239000000523 sample Substances 0.000 description 4
- 238000012545 processing Methods 0.000 description 3
- 238000010586 diagram Methods 0.000 description 2
- 241001391944 Commicarpus scandens Species 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000007812 deficiency Effects 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000005538 encapsulation Methods 0.000 description 1
- 238000009776 industrial production Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012544 monitoring process Methods 0.000 description 1
- 238000012797 qualification Methods 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Apparatuses And Processes For Manufacturing Resistors (AREA)
Abstract
The invention discloses an adjustable test fixture of a chip resistor and a test method thereof, wherein the adjustable test fixture comprises an insulating base station, wherein four adjustable test pointers with gauge gears are arranged on the insulating base station, and each test pointer is provided with a first end electrically connected with the chip resistor and a second end electrically connected with a test instrument; the four test pointers are used for forming a four-wire method to measure the resistance value of the chip resistor. The invention reduces the time required for replacing different test specifications; the test process of switching different packaging specifications becomes very simple and easy, the efficiency of product test connection is improved, and the production cost is reduced.
Description
Technical Field
The invention relates to the technical field of test jigs, in particular to an adjustable test jig of a chip resistor and a test method thereof.
Background
In the existing production process of the precise chip resistor, the resistance value of the tested resistor is measured by a four-wire method, wherein two wires provide voltage for the tested resistor, and the other two wires monitor the real-time change of the resistance value, so that accurate and reliable data feedback is provided for the resistance adjusting process of the precise resistor.
The precision of the chip resistor is generally required to be within 1%, even to be as high as 0.1%, in the actual production engineering, in order to ensure the product precision and improve the process qualification rate, the product resistance value needs to be monitored at any time, which is also the preferred test scheme of the current chip type precision resistor manufacturer.
In the existing precision resistor production process, the resistance value test generally adopts a fixed-point detection mode of a test fixture, so that the product precision is ensured. There are generally two types of such testing: firstly, a probe is directly connected with a test wire in a welding mode and is connected to test equipment to realize real-time monitoring of a measured resistance value, the method is simple in structure and convenient to design, but in the mode, a welding point is easy to break to influence the test; in addition, when the packaging specification of a product is switched, the test probe needs to be firstly detached and then shifted to a new test point position, welding is carried out, the operation is complicated, and accurate positioning is not easy to realize. In another type, through processing special test fixture, test different encapsulation products, avoided the test probe and the repeated dismantlement and the welding of test, but when the product specification was changed, need change test fixture, improve manufacturing cost, change equipment size even.
Disclosure of Invention
The present invention provides an adjustable testing fixture for chip resistors and a testing method thereof, aiming at the above-mentioned deficiencies of the prior art.
In order to solve the technical problems, the technical scheme adopted by the invention is as follows: an adjustable test fixture for a chip resistor comprises an insulating base station, wherein four adjustable test pointers with gauge gears are arranged on the insulating base station, and each test pointer is provided with a first end electrically connected with the chip resistor and a second end electrically connected with a test instrument; the four test pointers are used for forming a four-wire method to measure the resistance value of the chip resistor.
In the technical scheme, the test pointer is adjustably assembled on the insulating base station through the rotating component, and the rotating component is turned to adjust the position of the test pointer on the gauge gear so as to realize the chip resistors with different specifications.
In the above technical solution, the rotating part is a screw having a knob hole.
In the technical scheme, the gauge gear is arranged on the insulating base platform in a carving mode.
In the technical scheme, the gauge gear is arranged on a flat plate, and the flat plate is fixed on the insulating base.
In the technical scheme, the test pointer is welded on the support, the support is arranged on the insulating base platform in a manner of adjusting the rotation angle, the support is provided with the second end, and the second end is electrically connected with the test instrument in a manner of welding or inserting a terminal.
A testing method of a chip resistor adopts the adjustable testing jig of the chip resistor, and comprises the following steps: constructing corresponding data according to the size specification or resistance parameter specification of the chip resistor and the rotation angle of the test pointer on the adjustable test fixture, and then forming a gauge gear; and adjusting the test pointer to rotate to a corresponding gauge gear according to the size specification or resistance parameter specification of the current to-be-tested chip resistor, and fixing the current position of the test pointer so as to start testing.
The invention has the beneficial effects that:
1. the time required for replacing different test specifications is reduced;
2. the test process of switching different packaging specifications becomes very simple, the efficiency of product test connection is improved, and the production cost is reduced;
3. after the invention is used, the whole switching test process can finish the debugging of the resistance tests of different specifications only by shifting the test gear, thereby ensuring the stability of the process, saving the manual operation time and improving the production efficiency.
Drawings
Fig. 1 is a schematic overall structure diagram of an embodiment of the present invention.
Fig. 2 is a schematic view of the overall structure of another embodiment of the present invention.
Fig. 3 and 4 are comparison schematic diagrams of patch resistances which are unqualified in different gears of the invention.
In the figure, 1, an insulating base; 2. testing the pointer; 3. a first end; 4. a second end; 5. a rotating member; 6. a gauge gear; 7. a support; 8. and (4) a chip resistor.
Detailed Description
The present invention will be described in further detail with reference to the accompanying drawings.
As shown in fig. 1-4, an adjustable testing fixture for chip resistors comprises an insulating base 1, four adjustable testing pointers 2 having gauge positions 6 are mounted on the insulating base 1, and each testing pointer 2 has a first end 3 electrically connected with a chip resistor 8 and a second end 4 electrically connected with a testing instrument; the four test fingers 2 are used to form a four-wire method for measuring the resistance of the chip resistor 8.
Specifically, the test pointer 2 is adjustably mounted on the insulating base 1 through a rotating member 5, and the rotating member 5 is rotated to adjust the position of the test pointer 2 on the gauge position 6 so as to realize chip resistors 8 with different specifications. As shown in the figure, the gauge gear 6 is an arc gauge and is divided into a plurality of gears along an arc line, and the gears are set by converting the positions of the rotation pivots of the four test pointers 2, the distance between the first end 3 of the test pointer 2 and the rotation pivots and the specification of the chip resistor 8 to be tested. The rotation fulcrums of the four test pointers 2 are arranged symmetrically. The gears are roughly set to be the first gear corresponding to testing a chip resistor 8 with a specific specification, the second gear corresponding to testing a chip resistor 8 with another specific specification and the like.
Specifically, the rotating member 5 is a screw, and a nut of the screw has a knob hole. The rotary member 5 can be twisted by rotating the knob hole with a tool. For example: the screw is a hexagonal screw, the knob hole is a hexagonal counter bore, and the screw is rotationally adjusted by a screwdriver with a hexagonal head.
Specifically, the gauge gear 6 can be arranged on the insulating base 1 in a carving manner, and the assembly is omitted by directly processing on the insulating base 1. Or, the gauge gear 6 is arranged on a flat plate which is fixed on the insulating base 1 and is directly arranged in a post-assembly mode, so that the processing of the insulating base 1 is omitted.
Specifically, the test pointer 2 is welded on a support 7, the support 7 is rotatably mounted on the insulating base 1, the support 7 is provided with the second end 4, and the second end 4 is electrically connected with the test instrument by means of welding or plugging a terminal. In order to ensure the connectivity, a welding mode can be used, and the connection mode of the plug terminal can be frequently disassembled if necessary and adjusted according to specific conditions. A part of the holder 7 also serves as a handle for manual adjustment, although an insulating sleeve may be applied if the handle is part of the holder 7.
A testing method of a chip resistor adopts the adjustable testing jig of the chip resistor, and comprises the following steps: constructing corresponding data according to the size specification or resistance parameter specification of the chip resistor and the rotation angle of the test pointer on the adjustable test fixture, and then forming a gauge gear; according to the size specification or the resistance parameter specification of the chip resistor to be tested at present, the testing pointer is adjusted to rotate to the corresponding gauge gear, the current position of the testing pointer is fixed, and the testing device can be fixed through the locking screw, so that the testing is started. For the standard specification of the chip resistor, the same size specification means the same resistance specification, and corresponding relation data can be constructed as long as one of the size specification or the resistance specification corresponds to the rotation angle of the test pointer, so that a gauge gear is formed.
The working principle of the invention is as follows: the testing of a plurality of packaging specification products is realized on the same set of testing jig; meanwhile, the repeated disassembly of the test probe is avoided; the test point can be quickly and accurately positioned when the test of products with different packaging specifications is converted. And combining the test fixture with the gauge gear to test the chip resistors corresponding to different packaging specifications. In the process of industrial production, if different packaging specifications of chip resistors need to be tested, the chip resistors of different packaging specifications can be tested only by pulling the handle to corresponding gears. Not only reduces the debugging time, improves the production efficiency, reduces the production cost, but also ensures the precision of the resistance value test.
The above examples are intended to illustrate rather than to limit the invention, and all equivalent changes and modifications made by the methods described in the claims of the present invention are intended to be included within the scope of the present invention.
Claims (7)
1. The utility model provides a test fixture with adjustable chip resistor which characterized in that: the testing device comprises an insulating base station, wherein four adjustable testing pointers with gauge gears are arranged on the insulating base station, and each testing pointer is provided with a first end electrically connected with a chip resistor and a second end electrically connected with a testing instrument; the four test pointers are used for forming a four-wire method to measure the resistance value of the chip resistor.
2. The adjustable testing fixture of chip resistor of claim 1, wherein: the testing pointer is adjustably assembled on the insulating base station through a rotating component, and the rotating component adjusts the position of the testing pointer on the gauge gear through a knob so as to realize the chip resistors with different specifications.
3. The adjustable testing fixture of chip resistor of claim 2, wherein: the rotating part is a screw, and the screw is provided with a knob hole.
4. The adjustable testing fixture of chip resistor of claim 1, wherein: the gauge gear is arranged on the insulating base station in a carving mode.
5. The adjustable testing fixture of chip resistor of claim 1, wherein: the gauge gear is arranged on a flat plate, and the flat plate is fixed on the insulating base.
6. The adjustable testing fixture of chip resistor of claim 1, wherein: the test pointer is welded on the support, the support is mounted on the insulating base platform in a manner of adjusting the rotation angle, the support is provided with the second end, and the second end is electrically connected with the test instrument in a manner of welding or inserting a terminal.
7. A method for testing a chip resistor is characterized in that: the adjustable testing fixture for the chip resistor as claimed in any one of claims 1-6, comprising: constructing corresponding data according to the size specification or resistance parameter specification of the chip resistor and the rotation angle of the test pointer on the adjustable test fixture, and then forming a gauge gear; and adjusting the test pointer to rotate to a corresponding gauge gear according to the size specification or resistance parameter specification of the current to-be-tested chip resistor, and fixing the current position of the test pointer so as to start testing.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202010016407.9A CN111090009A (en) | 2020-01-08 | 2020-01-08 | Adjustable test fixture and test method for chip resistor |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202010016407.9A CN111090009A (en) | 2020-01-08 | 2020-01-08 | Adjustable test fixture and test method for chip resistor |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN111090009A true CN111090009A (en) | 2020-05-01 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202010016407.9A Withdrawn CN111090009A (en) | 2020-01-08 | 2020-01-08 | Adjustable test fixture and test method for chip resistor |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN111090009A (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113109626A (en) * | 2021-05-14 | 2021-07-13 | 深圳市业展电子有限公司 | Resistance test fixture with position adjusting function |
| CN113777536A (en) * | 2021-11-10 | 2021-12-10 | 杭州维纳安可医疗科技有限责任公司 | Testing jig, testing device and testing method for electrode patches |
-
2020
- 2020-01-08 CN CN202010016407.9A patent/CN111090009A/en not_active Withdrawn
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113109626A (en) * | 2021-05-14 | 2021-07-13 | 深圳市业展电子有限公司 | Resistance test fixture with position adjusting function |
| CN113777536A (en) * | 2021-11-10 | 2021-12-10 | 杭州维纳安可医疗科技有限责任公司 | Testing jig, testing device and testing method for electrode patches |
| CN113777536B (en) * | 2021-11-10 | 2022-01-21 | 杭州维纳安可医疗科技有限责任公司 | Testing jig, testing device and testing method for electrode patches |
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| WW01 | Invention patent application withdrawn after publication |
Application publication date: 20200501 |