CN111089648B - 光纤耦合单光子源的滤光和二阶关联度测试装置 - Google Patents
光纤耦合单光子源的滤光和二阶关联度测试装置 Download PDFInfo
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- CN111089648B CN111089648B CN202010034295.XA CN202010034295A CN111089648B CN 111089648 B CN111089648 B CN 111089648B CN 202010034295 A CN202010034295 A CN 202010034295A CN 111089648 B CN111089648 B CN 111089648B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
- G01J3/0218—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using optical fibers
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/12—Generating the spectrum; Monochromators
- G01J3/26—Generating the spectrum; Monochromators using multiple reflection, e.g. Fabry-Perot interferometer, variable interference filters
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CN202010034295.XA CN111089648B (zh) | 2020-01-13 | 2020-01-13 | 光纤耦合单光子源的滤光和二阶关联度测试装置 |
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CN112485734B (zh) * | 2020-09-27 | 2022-12-13 | 中国电子科技集团公司第十三研究所 | 一种提高金刚石nv色心荧光收集效率的方法 |
CN112539849B (zh) * | 2020-11-19 | 2022-06-28 | 中国科学院上海微系统与信息技术研究所 | 一种量子干涉探测芯片及其测试系统 |
CN114486833B (zh) * | 2022-01-26 | 2024-03-15 | 合肥工业大学 | 一种基于半导体量子点的单光子源系统 |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2012129404A1 (en) * | 2011-03-22 | 2012-09-27 | Brigham And Women's Hospital, Inc. | Determination of a material characteristics with the use of second-order photon correlations |
CN106940474A (zh) * | 2017-03-31 | 2017-07-11 | 西安交通大学 | 一种线性超聚束赝热光源装置 |
CN107063481A (zh) * | 2017-05-10 | 2017-08-18 | 中国工程物理研究院电子工程研究所 | 一种宽禁带半导体量子点荧光的二阶相关性测量系统 |
CN209387141U (zh) * | 2019-03-25 | 2019-09-13 | 成都诺为光科科技有限公司 | 一种荧光二阶关联性测试装置 |
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Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2012129404A1 (en) * | 2011-03-22 | 2012-09-27 | Brigham And Women's Hospital, Inc. | Determination of a material characteristics with the use of second-order photon correlations |
CN106940474A (zh) * | 2017-03-31 | 2017-07-11 | 西安交通大学 | 一种线性超聚束赝热光源装置 |
CN107063481A (zh) * | 2017-05-10 | 2017-08-18 | 中国工程物理研究院电子工程研究所 | 一种宽禁带半导体量子点荧光的二阶相关性测量系统 |
CN209387141U (zh) * | 2019-03-25 | 2019-09-13 | 成都诺为光科科技有限公司 | 一种荧光二阶关联性测试装置 |
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Inventor after: Shang Xiangjun Inventor after: Niu Zhichuan Inventor after: Ma Ben Inventor after: Ni Haiqiao Inventor after: Li Shulun Inventor after: Chen Yao Inventor after: He Xiaowu Inventor before: Shang Xiangjun Inventor before: Niu Zhichuan Inventor before: Ma Ben Inventor before: Ni Haiqiao Inventor before: Li Shulun Inventor before: Chen Yao Inventor before: He Xiaowu |
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