CN111060526A - Method for detecting surface defects of metal target based on picture processing - Google Patents

Method for detecting surface defects of metal target based on picture processing Download PDF

Info

Publication number
CN111060526A
CN111060526A CN201811205335.1A CN201811205335A CN111060526A CN 111060526 A CN111060526 A CN 111060526A CN 201811205335 A CN201811205335 A CN 201811205335A CN 111060526 A CN111060526 A CN 111060526A
Authority
CN
China
Prior art keywords
camera
sputtering surface
light source
knife
scratch
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN201811205335.1A
Other languages
Chinese (zh)
Inventor
王莹
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Suzhou Micro Vision Vision Technology Co Ltd
Original Assignee
Suzhou Micro Vision Vision Technology Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Suzhou Micro Vision Vision Technology Co Ltd filed Critical Suzhou Micro Vision Vision Technology Co Ltd
Priority to CN201811205335.1A priority Critical patent/CN111060526A/en
Publication of CN111060526A publication Critical patent/CN111060526A/en
Pending legal-status Critical Current

Links

Images

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

The invention discloses a method for detecting surface defects of a metal target based on picture processing, which comprises the following steps of S1: turning on a coaxial light source, and detecting knife lines by a camera; s2: and (5) closing the coaxial light source, opening the strip-shaped light source, and picking up images by a camera to detect scratches. The invention has the beneficial effects that: the detection efficiency is high, and the detection result is accurate. Whether knife lines and scratches exist on the surface of the target material can be effectively detected.

Description

Method for detecting surface defects of metal target based on picture processing
Technical Field
The invention relates to the technical field of targets, in particular to a method for detecting surface defects of a metal target based on picture processing.
Background
With the society entering the information age, the demand of human production and life on various products such as semiconductor chips, liquid crystal panels and the like is rapidly increased, and the sputtering target is one of the indispensable key materials for processing and manufacturing the products. Depending on the application, the sputtering target can be made of pure metals, alloys, ceramics or borides by fine machining. Compared with the traditional material industry, the sputtering target has extremely high technical requirements, which include target size, purity, impurity content, density, resistance value, magnetic permeability, flatness, surface roughness, grain size and uniformity, component and structure uniformity, foreign matter content and size, processing defect control and the like. For example, the purity of metal sputtering targets is often required to reach 99.9% -99.999%, and qualified smooth surfaces have ultrahigh fineness, flatness, uniformity and mirror-like light reflecting characteristics. Only a few enterprises worldwide are able to process and manufacture such products. At present, a very high-precision numerical control lathe and a tool are needed when the surface of the sputtering target is processed, and the skilled machine tool operation skill and rich quality detection experience of workers are matched. In order to improve the production efficiency and ensure the product quality, the sputtering target material production and processing process needs to be automatically and intelligently designed and modified, and the interconnection with an MES system is realized. The industrial robot can replace manual work to realize automatic feeding and discharging, and the PLC can be connected with a numerical control machine tool as a communication and control center to realize automatic target cutting operation. However, the above modification measures cannot avoid surface defects, such as knife lines and scratches with different depths, which affect the use function of the product, occurring in the sputtering target production and processing process. Detecting these surface defects is an engineering challenge. Firstly, the lathe needs to be paused for one time or a plurality of times in the processing process, then the surface quality of the target material is judged manually, and if the target material is unqualified, further processing is needed. Sometimes, the defects are not obvious, and workers cannot directly judge the defects on the lathe by naked eyes after the machining is finished, so that the target material is taken down from the lathe and sent to a professional quality inspection department for detection in a special environment. The method increases the transfer time and labor cost, greatly restricts the production efficiency, prevents the realization of full-automatic production, and is easy to cause missing detection and false detection because the judgment is not uniform by only naked eye observation and scale.
Disclosure of Invention
The invention aims to provide a method for detecting the surface defects of a metal target based on image processing, which has high detection efficiency and accurate detection result.
In order to achieve the purpose, the invention adopts the technical scheme that
A method for detecting surface defects of a metal target based on picture processing comprises the following steps,
s1: turning on a coaxial light source, and detecting knife lines by a camera: the light is reflected to enter the camera through the sputtering surface of the target, and when the sputtering surface is qualified and has no knife mark, the camera obtains an image with uniformly changed gray scale; when the sputtering surface has the knife pattern, because the height difference exists between the knife pattern and the surface of the sputtering surface, light rays are subjected to diffuse reflection on the knife pattern, and the knife pattern is represented as a bright strip in an image;
s2: closing the coaxial light source, opening the strip light source, and detecting scratches by a camera in an image acquisition mode:
the visual field range of the camera is positioned in a part with small illumination intensity scattered by the strip-shaped light source, and as the sputtering surface of the target is smooth and light is reflected by a mirror surface on the surface, when the sputtering surface is qualified and has no scratch, the camera can obtain a darker image; when the scratch exists on the sputtering surface, due to the height difference between the scratch and the surface of the sputtering surface, the light rays are diffusely reflected at the scratch, so that the scratch appears as a bright mark in the image.
Preferably, the metal target is mounted on a rotary lathe, and is driven to rotate by a main shaft of the rotary lathe, so that the metal target is subjected to regional detection.
The working principle of the invention is as follows:
the target surface detection vision hardware comprises:
the industrial camera, the large target surface CMOS chip network port industrial camera, is matched with a CCTV lens with high precision and low distortion, and is used for collecting high-definition images of the sputtering surface of the target material.
The strip-shaped light source is blue, the length of the strip-shaped light source meets the radius of a sputtering surface of the target, multiple rows of LED lamp beads are adopted, stray light is filtered through a polarizing film, and the light source emits parallel light. The light source is parallel to a camera for lighting, and is used for detecting scratches of the sputtering surface of the target through dark field illumination.
The coaxial light source is blue, and the LED lamp beads reflect uniform parallel light through the 45-degree reflector, so that the problem of lamp images does not exist when the LED lamp beads are applied to a strong mirror surface reflection object. The light source is perpendicular to a camera for polishing, and is used for detecting the knife lines on the sputtering surface of the target through bright field illumination.
And (4) detecting the knife lines of the sputtering surface of the target material, and polishing by using coaxial light. The coaxial light is parallel to the sputtering surface and forms a certain angle, and bright field is used for polishing.
The light is reflected by the sputtering surface of the target material and enters the camera, and when the sputtering surface is qualified and has no knife mark, the camera can obtain an image with uniformly changed gray scale; when the sputtering surface has knife grains, because the height difference exists between the knife grains and the surface of the sputtering surface, light rays are diffusely reflected on the knife grains, so that the knife grains are represented as bright stripes in the image, and the image becomes not fine and smooth.
And (4) detecting scratches on the sputtering surface of the target material, and polishing by using a strip-shaped light. The strip light is parallel to the sputtering surface and forms a certain angle, and a dark field is used for polishing;
the visual field range of the camera is positioned in a part with small illumination intensity scattered by the strip-shaped light source, and as the sputtering surface of the target is smooth and light is reflected by a mirror surface on the surface, when the sputtering surface is qualified and has no scratch, the camera can obtain a darker image; when the sputtering surface has scratches, because the height difference exists between the scratches and the surface of the sputtering surface, light rays are diffusely reflected at the scratches, so that the scratches are expressed as 'bright marks' in an image;
alternately opening coaxial light and strip light, and respectively detecting knife lines and scratches of the sputtering surface; and after one block is detected, rotating the target to detect the next block until the whole sputtering surface of the target is detected.
The invention has the beneficial effects that: the detection efficiency is high, and the detection result is accurate. Whether knife lines and scratches exist on the surface of the target material can be effectively detected.
Drawings
FIG. 1 is a schematic flow diagram of the present invention.
Detailed Description
The following description of the embodiments of the present invention will be made with reference to the accompanying drawings. The following examples are only for illustrating the technical solutions of the present invention more clearly, and the protection scope of the present invention is not limited thereby.
The technical scheme of the specific implementation of the invention is as follows:
a method for detecting surface defects of a metal target based on picture processing comprises the following steps,
s1: turning on a coaxial light source, and detecting knife lines by a camera: the light is reflected to enter the camera through the sputtering surface of the target, and when the sputtering surface is qualified and has no knife mark, the camera obtains an image with uniformly changed gray scale; when the sputtering surface has the knife pattern, because the height difference exists between the knife pattern and the surface of the sputtering surface, light rays are subjected to diffuse reflection on the knife pattern, and the knife pattern is represented as a bright strip in an image;
s2: closing the coaxial light source, opening the strip light source, and detecting scratches by a camera in an image acquisition mode:
the visual field range of the camera is positioned in a part with small illumination intensity scattered by the strip-shaped light source, and as the sputtering surface of the target is smooth and light is reflected by a mirror surface on the surface, when the sputtering surface is qualified and has no scratch, the camera can obtain a darker image; when the scratch exists on the sputtering surface, due to the height difference between the scratch and the surface of the sputtering surface, the light rays are diffusely reflected at the scratch, so that the scratch appears as a bright mark in the image.
The metal target is arranged on a rotary lathe and is driven to rotate by a main shaft of the rotary lathe, and then the metal target is subjected to regional detection.
The foregoing is only a preferred embodiment of the present invention, and it should be noted that, for those skilled in the art, various modifications and decorations can be made without departing from the technical principle of the present invention, and these modifications and decorations should also be regarded as the protection scope of the present invention.

Claims (2)

1. A method for detecting surface defects of a metal target based on picture processing is characterized by comprising the following steps,
s1: turning on a coaxial light source, and detecting knife lines by a camera: the light is reflected to enter the camera through the sputtering surface of the target, and when the sputtering surface is qualified and has no knife mark, the camera obtains an image with uniformly changed gray scale; when the sputtering surface has the knife pattern, because the height difference exists between the knife pattern and the surface of the sputtering surface, light rays are subjected to diffuse reflection on the knife pattern, and the knife pattern is represented as a bright strip in an image;
s2: closing the coaxial light source, opening the strip light source, and detecting scratches by a camera in an image acquisition mode:
the visual field range of the camera is positioned in a part with small illumination intensity scattered by the strip-shaped light source, and as the sputtering surface of the target is smooth and light is reflected by a mirror surface on the surface, when the sputtering surface is qualified and has no scratch, the camera can obtain a darker image; when the scratch exists on the sputtering surface, due to the height difference between the scratch and the surface of the sputtering surface, the light rays are diffusely reflected at the scratch, so that the scratch appears as a bright mark in the image.
2. The method according to claim 1, wherein the metal target is mounted on a rotary lathe, and the spindle of the rotary lathe drives the metal target to rotate, so as to perform the detection in different regions.
CN201811205335.1A 2018-10-16 2018-10-16 Method for detecting surface defects of metal target based on picture processing Pending CN111060526A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201811205335.1A CN111060526A (en) 2018-10-16 2018-10-16 Method for detecting surface defects of metal target based on picture processing

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201811205335.1A CN111060526A (en) 2018-10-16 2018-10-16 Method for detecting surface defects of metal target based on picture processing

Publications (1)

Publication Number Publication Date
CN111060526A true CN111060526A (en) 2020-04-24

Family

ID=70296741

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201811205335.1A Pending CN111060526A (en) 2018-10-16 2018-10-16 Method for detecting surface defects of metal target based on picture processing

Country Status (1)

Country Link
CN (1) CN111060526A (en)

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104280406A (en) * 2014-09-16 2015-01-14 中国科学院广州能源研究所 Machine vision system for detecting surface defects of copper part
CN105372248A (en) * 2015-11-12 2016-03-02 深圳市傲视检测技术有限公司 Image acquisition device for small-sized glass panel surface defect detection
CN106157303A (en) * 2016-06-24 2016-11-23 浙江工商大学 A kind of method based on machine vision to Surface testing
CN107084993A (en) * 2017-06-21 2017-08-22 无锡九霄科技有限公司 Double camera single-station positive and negative vision inspection apparatus
CN107831211A (en) * 2017-12-05 2018-03-23 广东工业大学 A kind of method and device of metal weldment defects detection
CN107909573A (en) * 2017-12-04 2018-04-13 广东嘉铭智能科技有限公司 Metal works annular surface knife mark detection method and device
CN107945180A (en) * 2017-12-26 2018-04-20 浙江大学台州研究院 Come from the visible detection method of the shallow cut in quartz wafer surface of polishing
CN109142375A (en) * 2018-08-20 2019-01-04 宁波市智能制造产业研究院 A kind of high accuracy vision detection system and method for target

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104280406A (en) * 2014-09-16 2015-01-14 中国科学院广州能源研究所 Machine vision system for detecting surface defects of copper part
CN105372248A (en) * 2015-11-12 2016-03-02 深圳市傲视检测技术有限公司 Image acquisition device for small-sized glass panel surface defect detection
CN106157303A (en) * 2016-06-24 2016-11-23 浙江工商大学 A kind of method based on machine vision to Surface testing
CN107084993A (en) * 2017-06-21 2017-08-22 无锡九霄科技有限公司 Double camera single-station positive and negative vision inspection apparatus
CN107909573A (en) * 2017-12-04 2018-04-13 广东嘉铭智能科技有限公司 Metal works annular surface knife mark detection method and device
CN107831211A (en) * 2017-12-05 2018-03-23 广东工业大学 A kind of method and device of metal weldment defects detection
CN107945180A (en) * 2017-12-26 2018-04-20 浙江大学台州研究院 Come from the visible detection method of the shallow cut in quartz wafer surface of polishing
CN109142375A (en) * 2018-08-20 2019-01-04 宁波市智能制造产业研究院 A kind of high accuracy vision detection system and method for target

Similar Documents

Publication Publication Date Title
CN108465648A (en) A kind of magnetic core Automated Sorting System based on machine vision
US7340087B2 (en) Edge inspection
CN102095733B (en) Machine vision-based intelligent detection method for surface defect of bottle cap
KR20170069178A (en) Multiple optics vision inspection system
WO2014139231A1 (en) System and method for testing and regulating uniformity of light intensity of light source
CN105424717A (en) Optical detection device for detecting multiple defects
CN104034637B (en) Based on the online quality inspection device of diamond wire particle of machine vision
CN102621156A (en) Image-processing-based automatic micro part sorting system
CN113000413B (en) System, method and terminal for detecting surface defects of synchronizer gear sleeve based on machine vision
Pedersen Wear measurement of cutting tools by computer vision
CN112474411A (en) Product detection automatic processing control system based on flexible production line
TW202002097A (en) Die bonder and manufacturing method of semiconductor devices for improving detection rate of coating pattern using paste-like adhesive applied to substrate
CN104458758A (en) Detection device for synthetic sapphire wafer
US6256091B1 (en) Transparent substrate mounting platform, transparent substrate scratch inspection device, transparent substrate bevelling inspection method and device, and transparent substrate inspection method
WO2001084126A2 (en) Directional lighting and method to distinguish three dimensional information
CN113640310A (en) Tile surface defect detection visual system and detection method
CN201368855Y (en) High precision ceramic pipe visual detector
CN104483319A (en) A sandwich biscuit defect detecting device and a method
CN111693535A (en) Touch screen defect detection equipment and method based on machine vision analysis
CN101532965B (en) High-precision revolving part vision testing machine
KR102000907B1 (en) Appearance vision inspection method for ferrite part
CN111060526A (en) Method for detecting surface defects of metal target based on picture processing
CN203965287U (en) The online quality inspection device of diamond wire particle based on machine vision
CN109775055B (en) Vision-based method for detecting label missing on end face of bundled bar materials and measuring error
CN208555086U (en) A kind of magnetic core Automated Sorting System based on machine vision

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
RJ01 Rejection of invention patent application after publication
RJ01 Rejection of invention patent application after publication

Application publication date: 20200424