CN111024676B - 一种非线性z扫描测量方法及装置 - Google Patents
一种非线性z扫描测量方法及装置 Download PDFInfo
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- CN111024676B CN111024676B CN202010026860.8A CN202010026860A CN111024676B CN 111024676 B CN111024676 B CN 111024676B CN 202010026860 A CN202010026860 A CN 202010026860A CN 111024676 B CN111024676 B CN 111024676B
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- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/65—Raman scattering
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- G—PHYSICS
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- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/1702—Systems in which incident light is modified in accordance with the properties of the material investigated with opto-acoustic detection, e.g. for gases or analysing solids
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/59—Transmissivity
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
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CN112903632B (zh) * | 2021-01-22 | 2021-10-08 | 中国科学院上海光学精密机械研究所 | 一种提高薄膜态材料非线性光学系数测量精度的方法 |
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US6538739B1 (en) * | 1997-09-30 | 2003-03-25 | The Regents Of The University Of California | Bubble diagnostics |
US7042556B1 (en) * | 2003-12-05 | 2006-05-09 | The United States Of America As Represented By The United States Department Of Energy | Device and nondestructive method to determine subsurface micro-structure in dense materials |
EP1792187A1 (en) * | 2004-09-10 | 2007-06-06 | Philips Intellectual Property & Standards GmbH | Compounds and methods for combined optical-ultrasound imaging |
GB2484753B (en) * | 2010-08-20 | 2013-01-02 | Surf Technology As | Method for imaging of nonlinear interaction scattering |
CN102937573B (zh) * | 2012-11-26 | 2015-05-13 | 中国科学院上海光学精密机械研究所 | Z扫描光学非线性测量装置和测量方法 |
CN103033488B (zh) * | 2012-12-13 | 2015-02-18 | 中国科学院上海光学精密机械研究所 | 可实时观察监测z扫描光学非线性测量装置和方法 |
US20140268105A1 (en) * | 2013-03-15 | 2014-09-18 | Zygo Corporation | Optical defect inspection system |
CN103698342A (zh) * | 2014-01-09 | 2014-04-02 | 浙江师范大学 | 基于激光散射的光纤预制棒瑕疵检测方法 |
GB201421936D0 (en) * | 2014-12-10 | 2015-01-21 | Surf Technology As | Method for imaging of nonlinear interaction scattering |
CN104931424A (zh) * | 2015-05-06 | 2015-09-23 | 山东师范大学 | 一种改进的z扫描非线性测量的实验装置及方法 |
JP6523871B2 (ja) * | 2015-08-26 | 2019-06-05 | 株式会社日立エルジーデータストレージ | 光計測装置 |
US10866189B2 (en) * | 2015-11-24 | 2020-12-15 | Hitachi, Ltd. | Optical measurement apparatus and optical measurement method |
RU2626060C1 (ru) * | 2016-10-06 | 2017-07-21 | Федеральное государственное бюджетное учреждение науки Институт механики Уральского отделения Российской академии наук | Способ измерения нелинейно-оптических свойств веществ и материалов методом z-сканирования при монохроматической лазерной накачке |
CN109406453B (zh) * | 2018-09-11 | 2021-04-20 | 江苏大学 | 一种自动确定最优入射光强的z扫描测量方法 |
CN110132892B (zh) * | 2019-04-26 | 2021-08-31 | 南京师范大学 | 一种热晕效应测量非线性折射率的方法 |
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