BRIEF SUMMARY OF THE PRESENT DISCLOSURE
Technical problem to be solved
Based on the above problems, the present disclosure provides a multi-frequency signal measurement device based on dual parallel mach-zehnder modulators, so as to alleviate technical problems in the prior art, such as complex device system and expensive device price, during multi-frequency signal measurement.
(II) technical scheme
The present disclosure provides a multi-frequency signal measurement device based on a dual parallel mach-zehnder modulator, including: a laser for providing an optical signal; the signal receiving end to be detected receives and amplifies the signal to be detected; the reference microwave signal source is used for providing a reference microwave signal; the direct current source is used for providing direct current bias voltage and comprises a first direct current source, a second direct current source and a third direct current source which are mutually independent; the double parallel Mach-Zehnder modulator is respectively connected with the laser, the receiving end of the signal to be measured, the direct current source and the reference microwave signal source and is used for modulating the optical signal to generate a modulated optical signal; the dual parallel Mach-Zehnder modulator comprises a main modulator, a first sub-modulator and a second sub-modulator; the optical power amplifier is connected with the double parallel Mach-Zehnder modulator and is used for amplifying the power of the modulated optical signal; and the photoelectric detector is connected with the optical power amplifier and used for realizing photoelectric conversion and outputting an electric signal with measurable power.
In this disclosure, the signal receiving end to be tested includes: the ultra-wideband antenna faces a wireless channel and is used for receiving a signal to be detected; and the electric power amplifier is connected with the ultra-wideband antenna and used for amplifying the signal to be detected received by the ultra-wideband antenna.
In the embodiment of the present disclosure, the first dc source is connected to the first sub-modulator, and is configured to dc bias the first sub-modulator.
In an embodiment of the present disclosure, the second dc source is connected to the second sub-modulator, and is configured to dc bias the second sub-modulator.
In an embodiment of the present disclosure, the third dc source is connected to the primary modulator, and is configured to perform dc bias on the primary modulator.
In the disclosed embodiment, the optical signal wavelength is 1550 ± 100 nm.
In the embodiment of the present disclosure, the signal to be measured is a multi-band microwave signal.
In the disclosed embodiment, the types of the laser include: narrow linewidth lasers.
In the embodiment of the disclosure, the preparation materials of the dual parallel mach-zehnder modulator include: and (3) lithium niobate crystals.
In the embodiment of the disclosure, frequency points with changed power of the output measurable power electrical signal are searched by adjusting the frequency of the reference microwave signal, and the frequency points are frequency information of various signals in the multi-frequency signal to be measured.
(III) advantageous effects
According to the technical scheme, the multi-frequency signal measuring equipment based on the double parallel Mach-Zehnder modulators has at least one or part of the following beneficial effects:
(1) the system structure is simple and compact, and the operation method is simple;
(2) the problem that the measurement system cost is high in frequency-time mapping and frequency-space mapping is solved;
(3) the system is small in size, and the development of a future integrated receiving system is more fit for.
(4) Can realize the accurate measurement of signals with large bandwidth (the measurement range is more than 40GHz) and multiple frequency bands (the frequency bands with L, S, C, X, Ku, K, Ka and higher frequency can be covered at the same time)
Detailed Description
The utility model provides a multifrequency signal measuring equipment based on two parallel mach zehnder modulators, this equipment only need a modulator and a reference microwave source can realize the accurate measurement of big bandwidth, multifrequency section signal. The compact measurement system is used, so that the operation is simpler, the problems that the system cost is high and the Brillouin scattering is large in size, which are faced by frequency-time mapping and frequency-space mapping, are solved, and the development of a future integrated receiving system is more conformed.
For the purpose of promoting a better understanding of the objects, aspects and advantages of the present disclosure, reference is made to the following detailed description taken in conjunction with the accompanying drawings.
In an embodiment of the present disclosure, there is provided a multi-frequency signal measurement device based on dual parallel mach-zehnder modulators, as shown in fig. 1, the multi-frequency signal measurement device based on dual parallel mach-zehnder modulators including:
a laser for providing an optical signal;
the signal receiving end to be detected receives and amplifies the signal to be detected;
the reference microwave signal source is used for providing a reference microwave signal;
the direct current source is used for providing direct current bias voltage and comprises a first direct current source, a second direct current source and a third direct current source which are mutually independent;
the double parallel Mach-Zehnder modulator is respectively connected with the laser, the receiving end of the signal to be measured, the direct current source and the reference microwave signal source and is used for modulating the optical signal to generate a modulated optical signal; the system comprises a main modulator, a first sub-modulator and a second sub-modulator;
the optical power amplifier is connected with the double parallel Mach-Zehnder modulator and is used for amplifying the power of the modulated optical signal;
the photoelectric detector is connected with the optical power amplifier and used for realizing photoelectric conversion and outputting an electric signal with measurable power;
the types of the laser include: a narrow linewidth laser;
the optical signal is a high-quality and low-phase-noise optical signal, and the wavelength of the optical signal is 1550 +/-100 nm;
the signal to be detected is a multi-band microwave signal;
the signal receiving terminal that awaits measuring includes:
the ultra-wideband antenna faces a wireless channel and is used for receiving a signal to be detected;
the electric power amplifier is connected with the ultra-wideband antenna and used for amplifying the signal to be detected received by the ultra-wideband antenna;
the reference microwave signal source is used for introducing the local oscillator signal and reducing the power of the local oscillator signal so as to meet the condition of small signal modulation
The preparation materials of the double parallel Mach-Zehnder modulator comprise: a lithium niobate crystal;
the first direct current source is connected with the first sub-modulator and used for carrying out direct current bias on the first sub-modulator, so that the first sub-modulator works at a minimum transmission point to obtain a carrier suppression double-sideband signal;
the second direct current source is connected with the second sub-modulator and used for carrying out direct current bias on the second sub-modulator to obtain a carrier suppression double-sideband signal;
the third direct current source is connected with the main modulator and used for performing direct current bias on the main modulator so that the main modulator also works at a minimum transmission point, thereby meeting the condition of phase cancellation;
the power of the measurable power electric signal can be measured by a power meter;
during the actual measurement, the power change of the power meter is observed by scanning the frequency of the reference microwave signal. Theoretically, if the frequency of the reference signal is not aligned with the frequency of the signal to be measured, the power will not change, and if aligned, it will change. Therefore, according to the characteristics, the frequency of the reference microwave signal can be adjusted to find the frequency points of the output measurable power electric signal with changed power, and the frequency points are the frequency information of various signals in the multi-frequency signal to be measured.
So far, the embodiments of the present disclosure have been described in detail with reference to the accompanying drawings. It is to be noted that, in the attached drawings or in the description, the implementation modes not shown or described are all the modes known by the ordinary skilled person in the field of technology, and are not described in detail. Further, the above definitions of the various elements and methods are not limited to the various specific structures, shapes or arrangements of parts mentioned in the examples, which may be easily modified or substituted by those of ordinary skill in the art.
From the above description, those skilled in the art should clearly recognize that the present disclosure is based on a multi-frequency signal measurement device of dual parallel mach-zehnder modulators.
In summary, the present disclosure provides a multi-frequency signal measurement device based on dual parallel mach-zehnder modulators, which provides high-quality, low-phase-noise optical signals through a narrow-linewidth laser. The signal to be measured with unknown frequency and power is received by the ultra-wideband antenna and enters the electric power amplifier, so that the signal power is in a detectable range and the requirement of small signal modulation is met. And after entering the double parallel Mach-Zehnder modulator, the optical signal is modulated by a signal to be detected received by the ultra-wideband antenna, and the modulated optical signal is subjected to power amplification through the optical power amplifier and then directly enters the photoelectric detector. The corresponding frequency value can be obtained by recording the signal power obtained by photoelectric conversion, thereby achieving the purpose of frequency measurement. In the method, the measurement of the multi-frequency signal to be measured can be realized only by scanning the frequency of the reference microwave signal and finding out the point where the total power of the proper output signal changes, and the requirement of frequency measurement of large bandwidth is met.
It should also be noted that directional terms, such as "upper", "lower", "front", "rear", "left", "right", and the like, used in the embodiments are only directions referring to the drawings, and are not intended to limit the scope of the present disclosure. Throughout the drawings, like elements are represented by like or similar reference numerals. Conventional structures or constructions will be omitted when they may obscure the understanding of the present disclosure.
And the shapes and sizes of the respective components in the drawings do not reflect actual sizes and proportions, but merely illustrate the contents of the embodiments of the present disclosure. Furthermore, in the claims, any reference signs placed between parentheses shall not be construed as limiting the claim.
Unless otherwise indicated, the numerical parameters set forth in the specification and attached claims are approximations that can vary depending upon the desired properties sought to be obtained by the present disclosure. In particular, all numbers expressing quantities of ingredients, reaction conditions, and so forth used in the specification and claims are to be understood as being modified in all instances by the term "about". Generally, the expression is meant to encompass variations of ± 10% in some embodiments, 5% in some embodiments, 1% in some embodiments, 0.5% in some embodiments by the specified amount.
Furthermore, the word "comprising" does not exclude the presence of elements or steps not listed in a claim. The word "a" or "an" preceding an element does not exclude the presence of a plurality of such elements.
The use of ordinal numbers such as "first," "second," "third," etc., in the specification and claims to modify a corresponding element does not by itself connote any ordinal number of the element or any ordering of one element from another or the order of manufacture, and the use of the ordinal numbers is only used to distinguish one element having a certain name from another element having a same name.
In addition, unless steps are specifically described or must occur in sequence, the order of the steps is not limited to that listed above and may be changed or rearranged as desired by the desired design. The embodiments described above may be mixed and matched with each other or with other embodiments based on design and reliability considerations, i.e., technical features in different embodiments may be freely combined to form further embodiments.
Those skilled in the art will appreciate that the modules in the device in an embodiment may be adaptively changed and disposed in one or more devices different from the embodiment. The modules or units or components of the embodiments may be combined into one module or unit or component, and furthermore they may be divided into a plurality of sub-modules or sub-units or sub-components. All of the features disclosed in this specification (including any accompanying claims, abstract and drawings), and all of the processes or elements of any method or apparatus so disclosed, may be combined in any combination, except combinations where at least some of such features and/or processes or elements are mutually exclusive. Each feature disclosed in this specification (including any accompanying claims, abstract and drawings) may be replaced by alternative features serving the same, equivalent or similar purpose, unless expressly stated otherwise. Also in the unit claims enumerating several means, several of these means may be embodied by one and the same item of hardware.
Similarly, it should be appreciated that in the foregoing description of exemplary embodiments of the disclosure, various features of the disclosure are sometimes grouped together in a single embodiment, figure, or description thereof for the purpose of streamlining the disclosure and aiding in the understanding of one or more of the various disclosed aspects. However, the disclosed method should not be interpreted as reflecting an intention that: that is, the claimed disclosure requires more features than are expressly recited in each claim. Rather, as the following claims reflect, disclosed aspects lie in less than all features of a single foregoing disclosed embodiment. Thus, the claims following the detailed description are hereby expressly incorporated into this detailed description, with each claim standing on its own as a separate embodiment of this disclosure.
The above-mentioned embodiments are intended to illustrate the objects, aspects and advantages of the present disclosure in further detail, and it should be understood that the above-mentioned embodiments are only illustrative of the present disclosure and are not intended to limit the present disclosure, and any modifications, equivalents, improvements and the like made within the spirit and principle of the present disclosure should be included in the scope of the present disclosure.