CN110995340B - Multi-frequency signal measuring equipment based on double parallel Mach-Zehnder modulators - Google Patents

Multi-frequency signal measuring equipment based on double parallel Mach-Zehnder modulators Download PDF

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CN110995340B
CN110995340B CN201911239871.8A CN201911239871A CN110995340B CN 110995340 B CN110995340 B CN 110995340B CN 201911239871 A CN201911239871 A CN 201911239871A CN 110995340 B CN110995340 B CN 110995340B
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CN110995340A (en
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林涛
张志珂
刘建国
赵尚弘
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    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04BTRANSMISSION
    • H04B10/00Transmission systems employing electromagnetic waves other than radio-waves, e.g. infrared, visible or ultraviolet light, or employing corpuscular radiation, e.g. quantum communication
    • H04B10/07Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems
    • H04B10/075Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems using an in-service signal
    • H04B10/079Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems using an in-service signal using measurements of the data signal
    • H04B10/0795Performance monitoring; Measurement of transmission parameters
    • H04B10/07955Monitoring or measuring power
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04BTRANSMISSION
    • H04B10/00Transmission systems employing electromagnetic waves other than radio-waves, e.g. infrared, visible or ultraviolet light, or employing corpuscular radiation, e.g. quantum communication
    • H04B10/50Transmitters
    • H04B10/501Structural aspects
    • H04B10/503Laser transmitters
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04BTRANSMISSION
    • H04B10/00Transmission systems employing electromagnetic waves other than radio-waves, e.g. infrared, visible or ultraviolet light, or employing corpuscular radiation, e.g. quantum communication
    • H04B10/50Transmitters
    • H04B10/516Details of coding or modulation
    • H04B10/54Intensity modulation
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04BTRANSMISSION
    • H04B10/00Transmission systems employing electromagnetic waves other than radio-waves, e.g. infrared, visible or ultraviolet light, or employing corpuscular radiation, e.g. quantum communication
    • H04B10/60Receivers
    • H04B10/66Non-coherent receivers, e.g. using direct detection
    • H04B10/69Electrical arrangements in the receiver

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Abstract

本公开提供一种基于双平行马赫曾德尔调制器的多频信号测量设备,包括:激光器,用于提供光信号;待测信号接收端,接收待测信号并放大;参考微波信号源,用于提供参考微波信号;直流源,用于提供直流偏置电压,包括相互独立的第一直流源、第二直流源、以及第三直流源;双平行马赫曾德尔调制器,分别与激光器、待测信号接收端、直流源、以及参考微波信号源相连,用于实现对光信号进行调制生成调制光信号;双平行马赫曾德尔调制器包括主调制器、第一子调制器、以及第二子调制器;光功率放大器,与所述双平行马赫曾德尔调制器相连,用于对调制光信号功率进行放大;以及光电探测器,与所述光功率放大器相连,用于实现光电转换,输出可测功率电信号。

Figure 201911239871

The present disclosure provides a multi-frequency signal measurement device based on double-parallel Mach-Zehnder modulators, comprising: a laser for providing an optical signal; a receiving end for a signal to be measured, for receiving and amplifying the signal to be measured; a reference microwave signal source for Provide a reference microwave signal; a DC source for providing a DC bias voltage, including a first DC source, a second DC source, and a third DC source that are independent of each other; dual parallel Mach-Zehnder modulators, respectively connected with the laser, the standby The measurement signal receiving end, the DC source, and the reference microwave signal source are connected to realize the modulation of the optical signal to generate the modulated optical signal; the dual-parallel Mach-Zehnder modulator includes a main modulator, a first sub-modulator, and a second sub-modulator a modulator; an optical power amplifier, connected with the double-parallel Mach-Zehnder modulator, for amplifying the power of the modulated optical signal; and a photodetector, connected with the optical power amplifier, for realizing photoelectric conversion, and the output can be Measuring power electrical signal.

Figure 201911239871

Description

Multi-frequency signal measuring equipment based on double parallel Mach-Zehnder modulators
Technical Field
The disclosure relates to the technical field of microwave photon, in particular to multi-frequency signal measuring equipment based on double parallel Mach-Zehnder modulators.
Background
In recent years, the development of microwave photonics has attracted extensive attention, and compared with the traditional electrical technology, microwave photonics has the advantages of larger bandwidth, better isolation, electromagnetic interference resistance, light weight, small size and the like. With the continuous development of communication and radar technologies, electromagnetic environments are increasingly complex, a common instantaneous frequency measurement method can only measure one frequency, and if a plurality of different frequencies are received at the same time, the frequencies are difficult to measure simultaneously or respectively. Some very intuitive multi-frequency signal measurement methods are realized by frequency-time mapping, frequency-space mapping or brillouin scattering. However, these methods face the problems of complex system and expensive device. In order to effectively solve the problems faced by the existing methods and fully meet the requirement of multi-frequency signal measurement in a complex electromagnetic environment, a new device capable of realizing accurate measurement of signals with large bandwidth and multiple frequency bands is urgently needed.
BRIEF SUMMARY OF THE PRESENT DISCLOSURE
Technical problem to be solved
Based on the above problems, the present disclosure provides a multi-frequency signal measurement device based on dual parallel mach-zehnder modulators, so as to alleviate technical problems in the prior art, such as complex device system and expensive device price, during multi-frequency signal measurement.
(II) technical scheme
The present disclosure provides a multi-frequency signal measurement device based on a dual parallel mach-zehnder modulator, including: a laser for providing an optical signal; the signal receiving end to be detected receives and amplifies the signal to be detected; the reference microwave signal source is used for providing a reference microwave signal; the direct current source is used for providing direct current bias voltage and comprises a first direct current source, a second direct current source and a third direct current source which are mutually independent; the double parallel Mach-Zehnder modulator is respectively connected with the laser, the receiving end of the signal to be measured, the direct current source and the reference microwave signal source and is used for modulating the optical signal to generate a modulated optical signal; the dual parallel Mach-Zehnder modulator comprises a main modulator, a first sub-modulator and a second sub-modulator; the optical power amplifier is connected with the double parallel Mach-Zehnder modulator and is used for amplifying the power of the modulated optical signal; and the photoelectric detector is connected with the optical power amplifier and used for realizing photoelectric conversion and outputting an electric signal with measurable power.
In this disclosure, the signal receiving end to be tested includes: the ultra-wideband antenna faces a wireless channel and is used for receiving a signal to be detected; and the electric power amplifier is connected with the ultra-wideband antenna and used for amplifying the signal to be detected received by the ultra-wideband antenna.
In the embodiment of the present disclosure, the first dc source is connected to the first sub-modulator, and is configured to dc bias the first sub-modulator.
In an embodiment of the present disclosure, the second dc source is connected to the second sub-modulator, and is configured to dc bias the second sub-modulator.
In an embodiment of the present disclosure, the third dc source is connected to the primary modulator, and is configured to perform dc bias on the primary modulator.
In the disclosed embodiment, the optical signal wavelength is 1550 ± 100 nm.
In the embodiment of the present disclosure, the signal to be measured is a multi-band microwave signal.
In the disclosed embodiment, the types of the laser include: narrow linewidth lasers.
In the embodiment of the disclosure, the preparation materials of the dual parallel mach-zehnder modulator include: and (3) lithium niobate crystals.
In the embodiment of the disclosure, frequency points with changed power of the output measurable power electrical signal are searched by adjusting the frequency of the reference microwave signal, and the frequency points are frequency information of various signals in the multi-frequency signal to be measured.
(III) advantageous effects
According to the technical scheme, the multi-frequency signal measuring equipment based on the double parallel Mach-Zehnder modulators has at least one or part of the following beneficial effects:
(1) the system structure is simple and compact, and the operation method is simple;
(2) the problem that the measurement system cost is high in frequency-time mapping and frequency-space mapping is solved;
(3) the system is small in size, and the development of a future integrated receiving system is more fit for.
(4) Can realize the accurate measurement of signals with large bandwidth (the measurement range is more than 40GHz) and multiple frequency bands (the frequency bands with L, S, C, X, Ku, K, Ka and higher frequency can be covered at the same time)
Drawings
FIG. 1 is a schematic diagram of the structure of a multi-frequency signal measuring device based on dual parallel Mach-Zehnder modulators according to the present disclosure;
fig. 2 is a schematic diagram of the internal composition of the dual parallel mach-zehnder modulator of fig. 1.
Detailed Description
The utility model provides a multifrequency signal measuring equipment based on two parallel mach zehnder modulators, this equipment only need a modulator and a reference microwave source can realize the accurate measurement of big bandwidth, multifrequency section signal. The compact measurement system is used, so that the operation is simpler, the problems that the system cost is high and the Brillouin scattering is large in size, which are faced by frequency-time mapping and frequency-space mapping, are solved, and the development of a future integrated receiving system is more conformed.
For the purpose of promoting a better understanding of the objects, aspects and advantages of the present disclosure, reference is made to the following detailed description taken in conjunction with the accompanying drawings.
In an embodiment of the present disclosure, there is provided a multi-frequency signal measurement device based on dual parallel mach-zehnder modulators, as shown in fig. 1, the multi-frequency signal measurement device based on dual parallel mach-zehnder modulators including:
a laser for providing an optical signal;
the signal receiving end to be detected receives and amplifies the signal to be detected;
the reference microwave signal source is used for providing a reference microwave signal;
the direct current source is used for providing direct current bias voltage and comprises a first direct current source, a second direct current source and a third direct current source which are mutually independent;
the double parallel Mach-Zehnder modulator is respectively connected with the laser, the receiving end of the signal to be measured, the direct current source and the reference microwave signal source and is used for modulating the optical signal to generate a modulated optical signal; the system comprises a main modulator, a first sub-modulator and a second sub-modulator;
the optical power amplifier is connected with the double parallel Mach-Zehnder modulator and is used for amplifying the power of the modulated optical signal;
the photoelectric detector is connected with the optical power amplifier and used for realizing photoelectric conversion and outputting an electric signal with measurable power;
the types of the laser include: a narrow linewidth laser;
the optical signal is a high-quality and low-phase-noise optical signal, and the wavelength of the optical signal is 1550 +/-100 nm;
the signal to be detected is a multi-band microwave signal;
the signal receiving terminal that awaits measuring includes:
the ultra-wideband antenna faces a wireless channel and is used for receiving a signal to be detected;
the electric power amplifier is connected with the ultra-wideband antenna and used for amplifying the signal to be detected received by the ultra-wideband antenna;
the reference microwave signal source is used for introducing the local oscillator signal and reducing the power of the local oscillator signal so as to meet the condition of small signal modulation
The preparation materials of the double parallel Mach-Zehnder modulator comprise: a lithium niobate crystal;
the first direct current source is connected with the first sub-modulator and used for carrying out direct current bias on the first sub-modulator, so that the first sub-modulator works at a minimum transmission point to obtain a carrier suppression double-sideband signal;
the second direct current source is connected with the second sub-modulator and used for carrying out direct current bias on the second sub-modulator to obtain a carrier suppression double-sideband signal;
the third direct current source is connected with the main modulator and used for performing direct current bias on the main modulator so that the main modulator also works at a minimum transmission point, thereby meeting the condition of phase cancellation;
the power of the measurable power electric signal can be measured by a power meter;
during the actual measurement, the power change of the power meter is observed by scanning the frequency of the reference microwave signal. Theoretically, if the frequency of the reference signal is not aligned with the frequency of the signal to be measured, the power will not change, and if aligned, it will change. Therefore, according to the characteristics, the frequency of the reference microwave signal can be adjusted to find the frequency points of the output measurable power electric signal with changed power, and the frequency points are the frequency information of various signals in the multi-frequency signal to be measured.
So far, the embodiments of the present disclosure have been described in detail with reference to the accompanying drawings. It is to be noted that, in the attached drawings or in the description, the implementation modes not shown or described are all the modes known by the ordinary skilled person in the field of technology, and are not described in detail. Further, the above definitions of the various elements and methods are not limited to the various specific structures, shapes or arrangements of parts mentioned in the examples, which may be easily modified or substituted by those of ordinary skill in the art.
From the above description, those skilled in the art should clearly recognize that the present disclosure is based on a multi-frequency signal measurement device of dual parallel mach-zehnder modulators.
In summary, the present disclosure provides a multi-frequency signal measurement device based on dual parallel mach-zehnder modulators, which provides high-quality, low-phase-noise optical signals through a narrow-linewidth laser. The signal to be measured with unknown frequency and power is received by the ultra-wideband antenna and enters the electric power amplifier, so that the signal power is in a detectable range and the requirement of small signal modulation is met. And after entering the double parallel Mach-Zehnder modulator, the optical signal is modulated by a signal to be detected received by the ultra-wideband antenna, and the modulated optical signal is subjected to power amplification through the optical power amplifier and then directly enters the photoelectric detector. The corresponding frequency value can be obtained by recording the signal power obtained by photoelectric conversion, thereby achieving the purpose of frequency measurement. In the method, the measurement of the multi-frequency signal to be measured can be realized only by scanning the frequency of the reference microwave signal and finding out the point where the total power of the proper output signal changes, and the requirement of frequency measurement of large bandwidth is met.
It should also be noted that directional terms, such as "upper", "lower", "front", "rear", "left", "right", and the like, used in the embodiments are only directions referring to the drawings, and are not intended to limit the scope of the present disclosure. Throughout the drawings, like elements are represented by like or similar reference numerals. Conventional structures or constructions will be omitted when they may obscure the understanding of the present disclosure.
And the shapes and sizes of the respective components in the drawings do not reflect actual sizes and proportions, but merely illustrate the contents of the embodiments of the present disclosure. Furthermore, in the claims, any reference signs placed between parentheses shall not be construed as limiting the claim.
Unless otherwise indicated, the numerical parameters set forth in the specification and attached claims are approximations that can vary depending upon the desired properties sought to be obtained by the present disclosure. In particular, all numbers expressing quantities of ingredients, reaction conditions, and so forth used in the specification and claims are to be understood as being modified in all instances by the term "about". Generally, the expression is meant to encompass variations of ± 10% in some embodiments, 5% in some embodiments, 1% in some embodiments, 0.5% in some embodiments by the specified amount.
Furthermore, the word "comprising" does not exclude the presence of elements or steps not listed in a claim. The word "a" or "an" preceding an element does not exclude the presence of a plurality of such elements.
The use of ordinal numbers such as "first," "second," "third," etc., in the specification and claims to modify a corresponding element does not by itself connote any ordinal number of the element or any ordering of one element from another or the order of manufacture, and the use of the ordinal numbers is only used to distinguish one element having a certain name from another element having a same name.
In addition, unless steps are specifically described or must occur in sequence, the order of the steps is not limited to that listed above and may be changed or rearranged as desired by the desired design. The embodiments described above may be mixed and matched with each other or with other embodiments based on design and reliability considerations, i.e., technical features in different embodiments may be freely combined to form further embodiments.
Those skilled in the art will appreciate that the modules in the device in an embodiment may be adaptively changed and disposed in one or more devices different from the embodiment. The modules or units or components of the embodiments may be combined into one module or unit or component, and furthermore they may be divided into a plurality of sub-modules or sub-units or sub-components. All of the features disclosed in this specification (including any accompanying claims, abstract and drawings), and all of the processes or elements of any method or apparatus so disclosed, may be combined in any combination, except combinations where at least some of such features and/or processes or elements are mutually exclusive. Each feature disclosed in this specification (including any accompanying claims, abstract and drawings) may be replaced by alternative features serving the same, equivalent or similar purpose, unless expressly stated otherwise. Also in the unit claims enumerating several means, several of these means may be embodied by one and the same item of hardware.
Similarly, it should be appreciated that in the foregoing description of exemplary embodiments of the disclosure, various features of the disclosure are sometimes grouped together in a single embodiment, figure, or description thereof for the purpose of streamlining the disclosure and aiding in the understanding of one or more of the various disclosed aspects. However, the disclosed method should not be interpreted as reflecting an intention that: that is, the claimed disclosure requires more features than are expressly recited in each claim. Rather, as the following claims reflect, disclosed aspects lie in less than all features of a single foregoing disclosed embodiment. Thus, the claims following the detailed description are hereby expressly incorporated into this detailed description, with each claim standing on its own as a separate embodiment of this disclosure.
The above-mentioned embodiments are intended to illustrate the objects, aspects and advantages of the present disclosure in further detail, and it should be understood that the above-mentioned embodiments are only illustrative of the present disclosure and are not intended to limit the present disclosure, and any modifications, equivalents, improvements and the like made within the spirit and principle of the present disclosure should be included in the scope of the present disclosure.

Claims (4)

1.一种基于双平行马赫曾德尔调制器的多频信号测量设备,包括:1. A multi-frequency signal measurement device based on dual parallel Mach-Zehnder modulators, comprising: 激光器,用于提供光信号;Lasers for providing optical signals; 待测信号接收端,接收待测信号并放大;所述待测信号为频率与功率未知的多频段微波信号;The receiving end of the signal to be tested receives and amplifies the signal to be tested; the signal to be tested is a multi-band microwave signal with unknown frequency and power; 参考微波信号源,用于提供参考微波信号来引入本振信号,并将本振信号的功率降低,从而满足小信号调制的条件;The reference microwave signal source is used to provide a reference microwave signal to introduce the local oscillator signal, and reduce the power of the local oscillator signal, so as to meet the conditions of small signal modulation; 直流源,用于提供直流偏置电压,包括相互独立的第一直流源、第二直流源、以及第三直流源;a DC source for providing a DC bias voltage, including a first DC source, a second DC source, and a third DC source that are independent of each other; 双平行马赫曾德尔调制器,分别与所述激光器、待测信号接收端、直流源、以及参考微波信号源相连,用于实现对光信号进行调制生成调制光信号;所述双平行马赫曾德尔调制器包括主调制器、第一子调制器、以及第二子调制器;The dual-parallel Mach-Zehnder modulators are respectively connected to the laser, the receiving end of the signal to be measured, the DC source, and the reference microwave signal source, and are used to modulate the optical signal to generate a modulated optical signal; the dual-parallel Mach-Zehnder modulator the modulator includes a main modulator, a first sub-modulator, and a second sub-modulator; 光功率放大器,与所述双平行马赫曾德尔调制器相连,用于对调制光信号功率进行放大;以及an optical power amplifier, connected to the dual parallel Mach-Zehnder modulators, for amplifying the power of the modulated optical signal; and 光电探测器,与所述光功率放大器相连,用于实现光电转换,输出可测功率电信号;a photodetector, connected to the optical power amplifier, for realizing photoelectric conversion and outputting a measurable power electrical signal; 所述待测信号接收端,包括:The receiving end of the signal to be tested includes: 超宽带天线,其面向无线信道,用于接收待测信号;An ultra-wideband antenna, which faces the wireless channel and is used to receive the signal to be measured; 电功率放大器,与所述超宽带天线相连,用于将超宽带天线所接收的待测信号进行放大;an electric power amplifier, connected to the ultra-wideband antenna, for amplifying the signal to be measured received by the ultra-wideband antenna; 所述第一直流源,与所述第一子调制器相连,用于对第一子调制器进行直流偏置,使得第一子调制器工作在最小传输点,得到载波抑制双边带信号;所述第二直流源,与所述第二子调制器相连,用于对第二子调制器进行直流偏置,得到载波抑制双边带信号;所述第三直流源,与所述主调制器相连,用于主调制器进行直流偏置,使主调制器也工作在最小传输点,从而满足相位相消的条件;The first DC source is connected to the first sub-modulator, and is used for performing DC bias on the first sub-modulator, so that the first sub-modulator works at the minimum transmission point to obtain a carrier-suppressed double-sideband signal; The second DC source is connected to the second sub-modulator, and is used for performing DC bias on the second sub-modulator to obtain a carrier-suppressed double-sideband signal; the third DC source is connected to the main modulator It is connected to the main modulator for DC bias, so that the main modulator also works at the minimum transmission point, so as to meet the condition of phase cancellation; 所述可测功率电信号的功率能够通过功率计进行测量;通过调节参考微波信号的频率,寻找输出的可测功率电信号功率发生变化的频点,这些频点就是待测多频信号中各种信号频率信息。The power of the measurable power electrical signal can be measured by a power meter; by adjusting the frequency of the reference microwave signal, find the frequency points where the power of the output measurable power electrical signal changes, and these frequency points are the frequency points in the multi-frequency signal to be measured. signal frequency information. 2.根据权利要求1所述的基于双平行马赫曾德尔调制器的多频信号测量设备,所述光信号波长在1550±100nm。2 . The multi-frequency signal measurement device based on dual parallel Mach-Zehnder modulators according to claim 1 , wherein the wavelength of the optical signal is 1550±100 nm. 3 . 3.根据权利要求1所述的基于双平行马赫曾德尔调制器的多频信号测量设备,所述激光器的种类包括:窄线宽激光器。3 . The multi-frequency signal measurement device based on dual parallel Mach-Zehnder modulators according to claim 1 , wherein the types of the lasers include: narrow linewidth lasers. 4 . 4.据权利要求1所述的基于双平行马赫曾德尔调制器的多频信号测量设备,所述双平行马赫曾德尔调制器的制备材料包括:铌酸锂晶体。4 . The multi-frequency signal measurement device based on the dual parallel Mach Zehnder modulators according to claim 1 , wherein the preparation material of the dual parallel Mach Zehnder modulators comprises: lithium niobate crystal. 5 .
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