CN110989218A - Device and method for detecting light leakage of metal signal line - Google Patents
Device and method for detecting light leakage of metal signal line Download PDFInfo
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- CN110989218A CN110989218A CN201911140483.4A CN201911140483A CN110989218A CN 110989218 A CN110989218 A CN 110989218A CN 201911140483 A CN201911140483 A CN 201911140483A CN 110989218 A CN110989218 A CN 110989218A
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- 239000002184 metal Substances 0.000 title claims abstract description 96
- 238000000034 method Methods 0.000 title claims abstract description 31
- 230000010287 polarization Effects 0.000 claims abstract description 24
- 230000000903 blocking effect Effects 0.000 claims abstract description 17
- 108091008695 photoreceptors Proteins 0.000 claims abstract description 15
- 238000010521 absorption reaction Methods 0.000 claims description 18
- 238000000691 measurement method Methods 0.000 claims 3
- 230000000694 effects Effects 0.000 abstract description 15
- 239000012528 membrane Substances 0.000 abstract description 2
- 239000010408 film Substances 0.000 description 10
- 238000005516 engineering process Methods 0.000 description 8
- 238000010586 diagram Methods 0.000 description 6
- 238000001514 detection method Methods 0.000 description 5
- 238000002474 experimental method Methods 0.000 description 4
- 230000028161 membrane depolarization Effects 0.000 description 4
- 238000012360 testing method Methods 0.000 description 4
- 238000012795 verification Methods 0.000 description 3
- 229920002284 Cellulose triacetate Polymers 0.000 description 2
- 239000004372 Polyvinyl alcohol Substances 0.000 description 2
- NNLVGZFZQQXQNW-ADJNRHBOSA-N [(2r,3r,4s,5r,6s)-4,5-diacetyloxy-3-[(2s,3r,4s,5r,6r)-3,4,5-triacetyloxy-6-(acetyloxymethyl)oxan-2-yl]oxy-6-[(2r,3r,4s,5r,6s)-4,5,6-triacetyloxy-2-(acetyloxymethyl)oxan-3-yl]oxyoxan-2-yl]methyl acetate Chemical compound O([C@@H]1O[C@@H]([C@H]([C@H](OC(C)=O)[C@H]1OC(C)=O)O[C@H]1[C@@H]([C@@H](OC(C)=O)[C@H](OC(C)=O)[C@@H](COC(C)=O)O1)OC(C)=O)COC(=O)C)[C@@H]1[C@@H](COC(C)=O)O[C@@H](OC(C)=O)[C@H](OC(C)=O)[C@H]1OC(C)=O NNLVGZFZQQXQNW-ADJNRHBOSA-N 0.000 description 2
- 239000004973 liquid crystal related substance Substances 0.000 description 2
- 229920002451 polyvinyl alcohol Polymers 0.000 description 2
- 238000012545 processing Methods 0.000 description 2
- 230000001681 protective effect Effects 0.000 description 2
- 239000004820 Pressure-sensitive adhesive Substances 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000002035 prolonged effect Effects 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- 239000010409 thin film Substances 0.000 description 1
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- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/1306—Details
- G02F1/1309—Repairing; Testing
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- Physics & Mathematics (AREA)
- Nonlinear Science (AREA)
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Abstract
The application discloses detect device of metal signal line light leak, the device includes: the backlight source is used for emitting light rays; the light blocking sheet is arranged on an emergent light path of the backlight source and is used for blocking part of light rays emitted by the backlight source; the polarization piece assembly is arranged on an emergent light path of the backlight source and behind the light blocking piece, is used for changing the polarization state of light rays emergent from the light blocking piece, and comprises a first polarization piece and a second polarization piece, wherein a metal membrane sample comprising a metal signal line is placed between the first polarization piece and the second polarization piece; and the photoreceptor is arranged behind the polarization component and is used for detecting the intensity of the light rays emitted from the polarization component. Through the mode, the improvement effect of the process improvement condition on the light leakage of the metal signal line can be evaluated quickly and quantitatively, and the time cost is greatly saved.
Description
Technical Field
The present disclosure relates to the field of panel detection technologies, and in particular, to a device and a method for detecting light leakage of a metal signal line.
Background
Thin-Film Transistor Liquid Crystal displays (TFT-LCDs) have the characteristics of small size, low power consumption, relatively low manufacturing cost, no radiation and the like, occupy a leading position in the current flat panel Display market, and are widely applied to various electronic devices, such as mobile phones, televisions, personal digital assistants, digital cameras, notebook computers, desktop computers and the like. In the LCD panel, the backlight becomes linearly polarized light through the lower polarizer, when the backlight passes the edge of the metal wire (gate wire), the linearly polarized light becomes elliptically polarized light due to the depolarization function of the metal, and at the moment, light can pass through the upper polarizer, so that dark state light leakage can be caused, and the contrast of the product is seriously influenced.
There are many methods for improving metal light leakage in the prior art, such as changing the material of the metal line (Ag/Al/Cu), reducing the thickness of the metal line, reducing the taper angle of the edge of the metal line, etc. In the actual process condition verification process, the brightness of the panel can be measured by a CS2000 instrument only after the product is made according to the process improvement effect, the total time consumption is about 45 days, and the process improvement experiment verification period is greatly prolonged.
Disclosure of Invention
The application provides one kind, can solve the time cycle length scheduling problem that detects metal light leak experiment verification technology among the prior art LCD liquid crystal display panel.
In order to solve the technical problem, the application adopts a technical scheme that: provided is a device for detecting metal signal line light leakage, the device including: a backlight for emitting light; the light blocking sheet is arranged on an emergent light path of the backlight source and is used for blocking part of light rays emitted by the backlight source; the polarizer assembly is arranged on an emergent light path of the backlight source and behind the light blocking sheet, is used for changing the polarization state of the light rays, and comprises a first polarizer and a second polarizer, wherein a metal diaphragm sample comprising the metal signal line is placed between the first polarizer and the second polarizer; and the photoreceptor is arranged behind the polarization component and is used for detecting the intensity of the light rays emitted from the polarization component.
The intensity of the light detected by the light sensor is related to the taper angle of the side edge of the metal signal wire.
The greater the angle of the taper at the side of the metal signal line, the stronger the light intensity detected by the light sensor.
Wherein absorption axes of the first and second polarizing plates are perpendicular to each other.
Wherein absorption axes of the metal signal line and the first and second polarizing plates are perpendicular or parallel to each other.
In order to solve the technical problem, the application adopts a technical scheme that: the method for measuring the metal signal line light leakage based on the device comprises the following steps: preheating the backlight source to enable the intensity of light emitted by the backlight source to be stable; opening the photoreceptor; placing a metal film sample including the metal signal line between the first polarizer and the second polarizer; and recording the light intensity value of the photoreceptor, and judging the light leakage degree of the metal signal wire according to the light intensity value. The intensity of the light detected by the light sensor is related to the taper angle of the side edge of the metal signal wire.
The greater the angle of the taper at the side of the metal signal line, the stronger the light intensity detected by the light sensor.
Wherein absorption axes of polarization of the first polarizing plate and the second polarizing plate are perpendicular to each other.
Wherein absorption axes of polarization of the metal signal line and the first and second polarizing plates are perpendicular or parallel to each other.
The beneficial effect of this application is: by adopting the measuring device, namely, a metal diaphragm sample comprising the metal signal line is placed between the first polaroid and the second polaroid, and the intensity of light rays emitted from the second polaroid is measured, the improvement effect of process improvement conditions on the metal signal line light leakage can be evaluated rapidly and quantitatively, so that the time cost is greatly saved.
Drawings
In order to illustrate the solution of the present application more clearly, the drawings that are needed in the description of the embodiments will be briefly described below, and it is obvious that the drawings in the following description are some embodiments of the present application, and that other drawings can be obtained by those skilled in the art without inventive effort.
FIG. 1 is a schematic diagram illustrating an embodiment of a device for detecting metal signal line leakage according to the present invention;
FIG. 2 is a schematic structural diagram of an embodiment of a metal diaphragm sample under a microscope according to the present application;
FIG. 3 is a schematic flow chart of an embodiment of a method for measuring metal signal line light leakage according to the present disclosure;
FIG. 4 is a schematic diagram illustrating the effect of dark state light leakage of the metal signal line according to the present application.
Detailed Description
The technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application, and it is obvious that the described embodiments are only a part of the embodiments of the present application, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.
Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs; the terminology used in the description of the application herein is for the purpose of describing particular embodiments only and is not intended to be limiting of the application; the terms "including" and "having," and any variations thereof, in the description and claims of this application and the description of the above figures are intended to cover non-exclusive inclusions. The terms "first," "second," and the like in the description and claims of this application or in the above-described drawings are used for distinguishing between different objects and not for describing a particular order.
Reference herein to "an embodiment" means that a particular feature, structure, or characteristic described in connection with the embodiment can be included in at least one embodiment of the application. The appearances of the phrase in various places in the specification are not necessarily all referring to the same embodiment, nor are separate or alternative embodiments mutually exclusive of other embodiments. It is explicitly and implicitly understood by one skilled in the art that the embodiments described herein can be combined with other embodiments.
Referring to fig. 1, fig. 1 is a schematic structural diagram of an embodiment of a device for detecting metal signal line light leakage according to the present application, as shown in fig. 1, the device for detecting metal signal line light leakage according to the present application includes a backlight source 110, a light blocking sheet 120, a polarization component 130, and a photoreceptor 140.
The backlight 110 is used to emit light, and the backlight 110 may be an LED with a luminance of 4000 nits.
Optionally, the light blocking sheet 120 is disposed on an exit light path of the backlight 110, and is configured to block a part of light emitted by the backlight 110. Referring to fig. 1, in the present application, a light-exiting hole 121 is formed in the light-blocking sheet 120, and light rays that are not blocked by the light-blocking sheet 120 exit through the light-exiting hole 121.
The polarizer assembly 130 is disposed in the exit light path of the backlight 110 and behind the light blocking sheet 120, and is used for changing the polarization state of the light emitted from the light blocking sheet 120. Alternatively, the polarization assembly 130 in the present application may include a first polarizer 131 and a second polarizer 132.
Alternatively, the structure of the first and second polarizers 131 and 132 in this application may include polyvinyl alcohol (PVA) at the center, two layers of triacetyl cellulose (TAC), pressure sensitive adhesive (PSA film), Release film (Release film), and Protective film (Protective film). The first polarizer 131 and the second polarizer 132 can control the polarization direction of a specific light beam, and light emitted from the backlight source is natural light, and when the light passes through the first polarizer 131, light with a vibration direction perpendicular to the absorption axis of the first polarizer 131 is absorbed, and only the transmitted light is polarized light with a vibration direction parallel to the absorption axis of the first polarizer 131.
In the embodiment of the present application, the absorption axes of the first polarizer 131 and the second polarizer 132 are perpendicular to each other, and the light emitted from the backlight 110 passes through the first polarizer 131 and then becomes linearly polarized light, and the polarization direction of the light is parallel to the absorption axis of the first polarizer 131. Since the absorption axis of the second polarizing plate 132 is perpendicular to the absorption axis of the first polarizing plate 131, linearly polarized light does not transmit through the second polarizing plate 132 without adding another medium between the first polarizing plate 131 and the second polarizing plate 132.
Optionally, the metal film sample 200 including the metal signal line in the present application is placed between the first polarizer 131 and the second polarizer 132. Referring to fig. 2 together, fig. 2 is a schematic structural diagram of an embodiment of a metal film sample under a microscope of the present application, and as shown in fig. 2, 210 is a metal signal line, and absorption axes of the metal signal line 210 and the first polarizer 131 and the second polarizer 132 are perpendicular or parallel to each other.
When light passes through the first polarizer 131 and becomes linearly polarized light, and the linearly polarized light passes through the corner of the metal signal line 210, the linearly polarized light becomes elliptically polarized light due to the depolarization effect of the metal, and at this time, the light can pass through the second polarizer 132 to cause dark-state light leakage. Therefore, the light intensity of the light emitted from the second polarizer 132 can be directly measured to determine whether the metal signal line 210 leaks light, and the improvement effect of the process improvement condition of the metal signal line 210 on the metal signal line light leakage can be rapidly and quantitatively evaluated.
The photoreceptor 140 is disposed behind the polarization component 130 and is used for detecting the intensity of the light emitted from the polarization component 130. The intensity of the light detected by the light sensor 140 is related to the taper angle of the side of the metal signal line 210. In practical applications, the signal lines under different process conditions, such as different taper angles on the side of the metal signal line 210, may have different light leakage intensities. And it can be found by experiment that the larger the taper angle of the side of the metal signal line 210, the stronger the light intensity detected by the photoreceptor 140.
In a specific application scenario of the present application, the light leakage intensity of the sample with the taper angle of 41 ° detected by the light sensor 140 is reduced by 8.5% compared with the light intensity with the taper angle of 55 ° detected by the light sensor 140. Therefore, adopt this application detection device 100 can be fast quantitative aassessment technology to improve the improvement effect of condition to the metal light leak, and adopt the detection device that this application provided to use at array's processing procedure anterior segment, and in the process test that reduces metal signal line taper angle, can evaluate the improvement effect of technology improvement condition to the metal signal line light leak three days, for the process test of prior art 45 days, great save time cost.
Above-mentioned embodiment, through adopting the measuring device of this application, be about to place the metal diaphragm sample including the metal signal line between first polaroid and second polaroid, through measuring the intensity from the emergent light of second polaroid, can quick quantitative aassessment technology improve the improvement effect of condition to the metal signal line light leak, great save time cost.
Referring to fig. 3, fig. 3 is a schematic flow chart of an embodiment of the method for measuring light leakage of a metal signal line according to the present application, as shown in fig. 3, the method for measuring light leakage of a metal signal line according to the present application includes the following steps:
s100, preheating a backlight source to enable light emitted by the backlight source to be stable.
Optionally, the brightness of the optional LED of the backlight 110 in this application is 4000nits, and the backlight needs to be turned on and preheated for 25-35 minutes in the preparation stage, and the backlight is preheated for 30 minutes in this application embodiment, so that the light intensity of the backlight 110 tends to be stable, and interference to the subsequent process is reduced.
S200, turning on the photoreceptor.
And S300, placing the metal membrane sample comprising the metal signal line between the first polarizer and the second polarizer.
Referring to fig. 1, the light blocking sheet 120 is provided with a light exit hole 121, and light rays not blocked by the light blocking sheet 120 exit through the light exit hole 121. In the embodiment of the present application, the absorption axes of the first polarizer 131 and the second polarizer 132 are perpendicular to each other, and the light emitted from the backlight 110 passes through the first polarizer 131 and then becomes linearly polarized light, and the polarization direction of the light is parallel to the absorption axis of the first polarizer 131. Optionally, the metal film sample 200 including the metal signal line in the present application is placed between the first polarizer 131 and the second polarizer 132. Referring to fig. 2, the absorption axes of the metal signal line 210 and the first and second polarizers 131 and 132 are perpendicular or parallel to each other. When light passes through the first polarizer 131 and becomes linearly polarized light, and the linearly polarized light passes through the corner of the metal signal line 210, the linearly polarized light becomes elliptically polarized light due to the depolarization of the metal, and at this time, light may pass through the second polarizer 132 to cause dark-state light leakage. Referring to fig. 4, fig. 4 is a schematic diagram illustrating the effect of dark-state light leakage of the metal signal line according to the present application.
And S400, recording the light intensity value of the photoreceptor, and judging the light leakage degree of the metal signal wire according to the light intensity value.
Alternatively, in step S300, due to the depolarization of the metal, the linearly polarized light may become elliptically polarized light, and at this time, light may pass through the second polarizer 132 to cause dark-state light leakage. Thus, the light intensity of the light emitted from the second polarizer 132 can be directly measured by the light sensor 140 to determine whether the metal signal line 210 leaks light, and the improvement effect of the process improvement condition of the metal signal line 210 on the metal signal line light leakage can be rapidly and quantitatively evaluated.
The intensity of the light detected by the light sensor 140 is related to the taper angle of the side of the metal signal line 210. In practical applications, the signal lines under different process conditions, such as different taper angles on the side of the metal signal line 210, may have different light leakage intensities. And it can be found by experiment that the larger the taper angle of the side of the metal signal line 210, the stronger the light intensity detected by the photoreceptor 140.
In a specific application scenario of the present application, the light leakage intensity of the sample with the taper angle of 41 ° detected by the light sensor 140 is reduced by 8.5% compared with the light intensity with the taper angle of 55 ° detected by the light sensor 140. Therefore, adopt this application detection device 100 can be fast quantitative aassessment technology to improve the improvement effect of condition to the metal light leak, and adopt the detection device that this application provided to use at array's processing procedure anterior segment, and in the process test that reduces metal signal line taper angle, can evaluate the improvement effect of technology improvement condition to the metal signal line light leak three days, for the process test of prior art 45 days, great save time cost.
Above-mentioned embodiment, through adopting the measuring device of this application, be about to place the metal diaphragm sample including the metal signal line between first polaroid and second polaroid, through measuring the intensity from the emergent light of second polaroid, can quick quantitative aassessment technology improve the improvement effect of condition to the metal signal line light leak, great save time cost.
In summary, it is easily understood by those skilled in the art that the present application provides a device and a method for detecting light leakage of a metal signal line, by using the measuring device of the present application, that is, placing a metal film sample including the metal signal line between a first polarizer and a second polarizer, and by measuring the intensity of light emitted from the second polarizer, the improvement effect of the process improvement condition on the light leakage of the metal signal line can be quickly and quantitatively evaluated, thereby greatly saving time and cost.
The above description is only for the purpose of illustrating embodiments of the present application and is not intended to limit the scope of the present application, and all modifications of equivalent structures and equivalent processes, which are made by the contents of the specification and the drawings of the present application or are directly or indirectly applied to other related technical fields, are also included in the scope of the present application.
Claims (10)
1. An apparatus for detecting metal signal line light leakage, the apparatus comprising:
a backlight for emitting light;
the light blocking sheet is arranged on an emergent light path of the backlight source and is used for blocking part of light rays emitted by the backlight source;
the polarizer assembly is arranged on an emergent light path of the backlight source and behind the light blocking sheet, is used for changing the polarization state of the light rays emergent from the light blocking sheet, and comprises a first polarizer and a second polarizer, wherein a metal diaphragm sample comprising the metal signal line is placed between the first polarizer and the second polarizer;
and the photoreceptor is arranged behind the polarization component and is used for detecting the intensity of the light rays emitted from the polarization component.
2. The apparatus of claim 1, wherein the intensity of the light detected by the light sensor is related to the taper angle of the side of the metal signal line.
3. The apparatus of claim 2, wherein the greater the taper angle of the side of the metal signal line, the greater the intensity of the light detected by the photoreceptor.
4. A device as recited in claim 1, wherein the absorption axes of the first and second polarizers are perpendicular to each other.
5. The device according to claim 4, wherein the absorption axes of the metal signal line and the first and second polarizers are perpendicular or parallel to each other.
6. A method for measuring metal signal line light leakage based on the device of claim 1, wherein the method comprises:
preheating the backlight source to enable the intensity of light emitted by the backlight source to be stable;
opening the photoreceptor;
placing a metal film sample including the metal signal line between the first polarizer and the second polarizer;
and recording the light intensity value of the photoreceptor, and judging the light leakage degree of the metal signal wire according to the light intensity value.
7. The method of claim 6, wherein the light detected by the light sensor is related to the angle of the taper at the side of the metal signal line.
8. The measurement method according to claim 7, wherein the greater the taper angle of the side of the metal signal line, the greater the intensity of the light detected by the photoreceptor.
9. The measurement method according to claim 6, wherein absorption axes of the first polarizing plate and the second polarizing plate are perpendicular to each other.
10. The measurement method according to claim 9, wherein absorption axes of the metal signal line and the first and second polarizing plates are perpendicular or parallel to each other.
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| Application Number | Priority Date | Filing Date | Title |
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| CN201911140483.4A CN110989218A (en) | 2019-11-20 | 2019-11-20 | Device and method for detecting light leakage of metal signal line |
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| CN201911140483.4A CN110989218A (en) | 2019-11-20 | 2019-11-20 | Device and method for detecting light leakage of metal signal line |
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