CN110988558A - Touch screen testing system and method - Google Patents

Touch screen testing system and method Download PDF

Info

Publication number
CN110988558A
CN110988558A CN201911329963.5A CN201911329963A CN110988558A CN 110988558 A CN110988558 A CN 110988558A CN 201911329963 A CN201911329963 A CN 201911329963A CN 110988558 A CN110988558 A CN 110988558A
Authority
CN
China
Prior art keywords
single chip
chip microcomputer
module
test box
turntable
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
CN201911329963.5A
Other languages
Chinese (zh)
Other versions
CN110988558B (en
Inventor
郭宝
张孙
曹坤
任彦夫
张成光
刘成林
王龙刚
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
BOE Technology Group Co Ltd
Hefei BOE Optoelectronics Technology Co Ltd
Original Assignee
BOE Technology Group Co Ltd
Hefei BOE Optoelectronics Technology Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by BOE Technology Group Co Ltd, Hefei BOE Optoelectronics Technology Co Ltd filed Critical BOE Technology Group Co Ltd
Priority to CN201911329963.5A priority Critical patent/CN110988558B/en
Publication of CN110988558A publication Critical patent/CN110988558A/en
Application granted granted Critical
Publication of CN110988558B publication Critical patent/CN110988558B/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)

Abstract

The invention provides a touch screen testing system and method, and relates to the technical field of testing. The system comprises: the testing equipment comprises a turntable and a controller, wherein the turntable is provided with a touch screen and a testing box module; a control terminal; the single chip device is connected with the control terminal and the controller and is wirelessly connected with the test box module; the controller is used for acquiring the rotation information of the turntable and sending the rotation information to the single chip microcomputer equipment; the single chip microcomputer equipment is used for determining the target test box module according to the rotation information when receiving the test signal of the control terminal, sending the test signal to the target test box module and returning the feedback signal of the target test box module to the control terminal. According to the invention, the control terminal is connected with the single chip microcomputer device, the single chip microcomputer device is wirelessly connected with the test box module, and the control terminal can control the test box module to test the touch screen in a wireless mode through the single chip microcomputer device, so that alignment and compression joint through a probe are not needed, the positioning precision of the turntable is reduced, and the test efficiency is improved.

Description

Touch screen testing system and method
Technical Field
The invention relates to the technical field of testing, in particular to a touch screen testing system and method.
Background
Currently, many electronic devices are configured with a touch screen, so as to provide a touch function for a user, and the performance of the touch screen is an important index for evaluating the quality of the electronic devices.
Referring to fig. 1, in a typical touch screen testing process, a control terminal 01 of a test is connected with a test box 02, the test box 02 is arranged on a fixed machine 03, the test box 02 is connected with a crimping head 05 through a connecting wire 04, and a probe 06 is arranged on the crimping head 05. A plurality of touch screens 07 to be tested are placed on the turntable 08, and each touch screen 07 is connected to the crimping plate 010 through a flexible circuit board 09. The probe 06 can only press contact plate 010 corresponding to one touch screen 07 at a time, when a certain touch screen 07 rotates to a specific position below the probe 06 along with the turntable 08, the press contact cylinder 011 can control the probe 06 to press contact plate 010 corresponding to the touch screen 07, so that the test box 02 can be connected with the touch screen 07 through the probe 06 and the press contact plate 010, and then the test box 02 can perform performance test on the touch screen 07.
However, the above test method requires the probes to be aligned and pressed, and the requirement for the positioning accuracy of the turntable is high, so the test efficiency is low.
Disclosure of Invention
The invention provides a touch screen testing system and method, which aim to solve the problem of low testing efficiency of the existing touch screen.
In order to solve the above problems, the present invention discloses a touch screen testing system, comprising:
the test equipment comprises a turntable and a controller which are connected, wherein a plurality of touch screens and test box modules which are connected with the touch screens in a one-to-one correspondence mode are arranged on the turntable;
a control terminal;
the single chip microcomputer device is respectively connected with the control terminal and the controller, and is wirelessly connected with the test box module;
the controller is configured to acquire rotation information of the turntable and send the rotation information to the single chip microcomputer device; the single chip microcomputer device is configured to determine a target test box module according to the rotation information when receiving a test signal sent by the control terminal, send the test signal to the target test box module, receive a feedback signal returned by the target test box module, and return the feedback signal to the control terminal through the single chip microcomputer device.
Optionally, the number of the target test box modules is a preset number; the single chip microcomputer device comprises the single chip microcomputer modules with the preset number, the single chip microcomputer modules comprise single chip microcomputers, first wireless modules and first serial port interface assemblies, the single chip microcomputers are respectively connected with the first wireless modules and the first serial port interface assemblies, and the first wireless modules are wirelessly connected with the test box modules.
Optionally, the single chip microcomputer module further comprises a second serial port interface assembly, and the second serial port interface assembly is connected with the single chip microcomputer.
Optionally, the single-chip microcomputers are connected in series, and any one of the second serial port interface components is connected with the controller.
Optionally, each of the second serial port interface components is connected to the controller.
Optionally, the turntable is divided into at least two turntable areas, and the preset number of touch screens and the preset number of test box modules are placed on each turntable area;
the rotation information comprises a region number corresponding to a target turntable region rotated to a preset position; the second serial port interface component connected with the controller is configured to receive the area number and send the area number to each single chip microcomputer.
Optionally, the test box module comprises a test box, a third serial port interface assembly, a second wireless module and a voltage conversion module, the second wireless module is connected with the third serial port interface assembly, the third serial port interface assembly is connected with the test box, and the voltage conversion module is respectively connected with the second wireless module and the third serial port interface assembly;
the test box and the voltage conversion module are respectively connected with a first power supply voltage, and the voltage conversion module is configured to convert the first power supply voltage into a second power supply voltage and supply power to the second wireless module and the third serial port interface component through the second power supply voltage;
the second wireless module is in wireless connection with the single-chip microcomputer device.
Optionally, the system further includes a wireless router, the wireless router is configured to establish a local area network, and the single chip microcomputer device and the test box module are wirelessly connected through the local area network.
In order to solve the above problems, the present invention also discloses a touch screen testing method, which is applied to the touch screen testing system, and comprises:
the controller acquires rotation information of the turntable and sends the rotation information to the single-chip microcomputer equipment;
when the single chip microcomputer equipment receives a test signal sent by a control terminal, a target test box module is determined according to the rotation information, and the test signal is sent to the target test box module;
and the single chip microcomputer equipment receives a feedback signal returned by the target test box module and returns the feedback signal to the control terminal through the single chip microcomputer equipment.
Optionally, the turntable is divided into at least two turntable areas, and the rotation information includes an area number corresponding to a target turntable area rotated to a preset position;
according to the rotation information, the target test box module is determined, and the method comprises the following steps:
and determining the test box module positioned in the target turntable area corresponding to the area number as a target test box module.
Compared with the prior art, the invention has the following advantages:
in the embodiment of the invention, the test equipment comprises a turntable and a controller which are connected, wherein a plurality of touch screens and test box modules which are connected with the touch screens in a one-to-one correspondence mode are placed on the turntable. The single chip microcomputer equipment is respectively connected with the control terminal and the controller and is in wireless connection with the test box module. The controller is configured to acquire rotation information of the turntable and send the rotation information to the single chip microcomputer device. The single chip microcomputer device is configured to determine the target test box module according to the rotation information when receiving the test signal sent by the control terminal, send the test signal to the target test box module, receive the feedback signal returned by the target test box module, and return the feedback signal to the control terminal through the single chip microcomputer device. In the embodiment of the invention, the tested control terminal can be connected with the single chip microcomputer device, and the single chip microcomputer device can be wirelessly connected with each test box module, so that the control terminal can wirelessly control the target test box module in each test box module to perform performance test on the connected touch screen through the single chip microcomputer device, and thus, the alignment compression joint through a probe is not needed, the position limitation of a compression joint mechanism is avoided, the positioning precision of a turntable is reduced, and the test efficiency is improved.
Drawings
FIG. 1 is a schematic diagram of a conventional touch screen testing system;
fig. 2 is a schematic structural diagram of a touch screen testing system according to a first embodiment of the present invention;
fig. 3 shows a schematic structural diagram of a single chip microcomputer device according to a first embodiment of the present invention;
fig. 4 is a schematic structural diagram of a test cassette module according to a first embodiment of the present invention;
FIG. 5 is a schematic structural diagram of another touch screen test system according to a first embodiment of the present invention;
fig. 6 shows a flowchart of a touch screen testing method according to a second embodiment of the present invention.
Detailed Description
In order to make the aforementioned objects, features and advantages of the present invention comprehensible, embodiments accompanied with figures are described in further detail below.
Example one
Referring to fig. 2, a schematic structural diagram of a touch screen testing system according to a first embodiment of the present invention is shown, where the system includes a testing device 10, a control terminal 20, and a single chip microcomputer device 30.
The testing device 10 comprises a connected turntable 11 and a controller 12, and referring to fig. 2, a plurality of touch screens 13 are placed on the turntable 11, and the testing box modules 14 are connected with the touch screens 13 in a one-to-one correspondence manner. In practical applications, the testing device 10 may specifically be an Automatic Optical Inspection (AOI) device, and correspondingly, the Controller 12 may specifically be a Programmable Logic Controller (PLC) module of the AOI device.
And the single chip microcomputer device 30 is respectively connected with the control terminal 20 and the controller 12, and the single chip microcomputer device 30 is wirelessly connected with the test box module 14. Optionally, the Wireless connection mode may be a Wireless network connection mode such as WIFI (Wireless Fidelity), or may also be an infrared Wireless connection mode, which is not specifically limited in this embodiment of the present invention.
Among them, the controller 12 may be configured to acquire rotation information of the dial 11 and transmit the rotation information to the one-chip microcomputer device 30. The single chip device 30 may be configured to determine a target test box module according to the rotation information when receiving a test signal sent by the control terminal 20, send the test signal to the target test box module, receive a feedback signal returned by the target test box module, and return the feedback signal to the control terminal 20 through the single chip device 30.
Specifically, in the rotating process of the turntable 11, if a certain turntable region rotates to a specific preset position, it indicates that the test cartridge module 14 located in the turntable region can start to perform a performance test on the corresponding touch screen 13. The test device 10 can monitor which turntable area of the turntable 11 rotates to a preset position, and then can send information of the turntable area to the single chip microcomputer device 30. The control terminal 20 may be configured to send a test signal to the single chip microcomputer device 30, and when the single chip microcomputer device 30 receives the test signal, the target test box module in each test box module 14, that is, the test box module located in the turntable area rotated to the preset position, may be determined according to the information of the turntable area rotated to the preset position. The single chip microcomputer device 30 can transmit the test signal to the target test box module in a wireless manner, so that the target test box module inputs the test signal to the corresponding touch screen 13, and the test is performed. The touch screen 13 responds to the test signal, can generate a feedback signal, and then can return the feedback signal to the single chip microcomputer device 30 through the target test box module, the single chip microcomputer device 30 can receive the feedback signal that the target test box module returns through wireless mode, and send the feedback signal to the single chip microcomputer device 30, and then the single chip microcomputer device 30 can send the feedback information to the control terminal 20, thereby the tester can monitor the test process through the control terminal 20, and check the test result.
In the embodiment of the invention, the tested control terminal 20 can be connected with the single chip microcomputer device 30, and the single chip microcomputer device 30 can be wirelessly connected with each test box module 14, so that the control terminal 20 can wirelessly control the target test box module in each test box module 14 to perform performance test on the connected touch screen 13 through the single chip microcomputer device 30, and thus, alignment compression connection through a probe is not needed, the position limitation of a compression connection mechanism is avoided, the positioning precision of a rotary table is reduced, and the test efficiency is improved. Due to the fact that the Time for aligning and crimping is saved, the equipment utilization rate of the touch screen testing system is improved, and Takt Time (T/T) of touch products is also improved. In addition, when the target test box module comprises more than two test box modules 14, multi-station simultaneous testing can be realized, and the testing efficiency can be further improved.
Optionally, the number of the target test box modules is a preset number, that is, the single chip microcomputer device 30 can determine the preset number of test box modules 14 to be tested at one time, accordingly, referring to fig. 3, the single chip microcomputer device 30 includes the preset number of single chip microcomputer modules 31, the single chip microcomputer module 31 may include a single chip microcomputer 311, a first wireless module 312 and a first serial port interface component 313, the single chip microcomputer 311 is connected with the first wireless module 312 and the first serial port interface component 313 respectively, and the first wireless module 312 is wirelessly connected with the test box modules 14. In specific application, the preset number can be an integer greater than or equal to 2, so that multi-station simultaneous testing can be realized, and the testing efficiency can be further improved. The single chip microcomputer is adopted for transfer communication, so that communication parameters and protocols can be changed unilaterally, and the universality of the system is improved.
The first wireless module 312 may be configured to be wirelessly connected to the test box module 14, the first serial port interface component 313 may be configured to be serially connected to the control terminal 20 and perform data interaction with the control terminal 20, and the single chip microcomputer 311 may be configured to implement an operation execution function of determining a target test box module according to rotation information of the turntable 11. The first serial port interface component 313 may specifically be an RS232 serial port interface, the first wireless module 312 may specifically be a WIFI module, and the WIFI module may have an ESP8266 chip built therein as a WIFI chip.
In an alternative implementation manner, as shown in fig. 2, a total of 20 touch screens 13 may be placed on the turntable 11, the turntable 11 may be equally divided into 5 turntable areas, the preset number may be 4, and 4 touch screens 13 are placed on each turntable area. Correspondingly, in the single chip microcomputer device 30 shown in fig. 3, 4 single chip microcomputer modules 31 may be included, and each single chip microcomputer module 31 may include 1 single chip microcomputer, 1 RS232 serial port interface and 1 WIFI module, that is, the single chip microcomputer device 30 includes 4 single chip microcomputers, 4 RS232 serial port interfaces and 4 WIFI modules. Wherein, 1 singlechip module 31 can test 1 touch-sensitive screen 13 that target test box module corresponds.
Optionally, the single chip microcomputer module 31 may further include a second serial interface component 314, and the second serial interface component 314 is connected to the single chip microcomputer 311. The second serial port interface component 314 can be used as a debugging interface of the single chip microcomputer module 31 and used for debugging the single chip microcomputer module 31 through external debugging equipment, and each single chip microcomputer module 31 is provided with the independent second serial port interface component 314 as the debugging interface, so that debugging can be independently carried out, and debugging efficiency is improved. The second serial interface component 314 may specifically be an RS232 serial interface.
Specifically, in an alternative implementation manner, as shown in fig. 3, the single-chip microcomputers 311 may be connected in series, and accordingly, any one of the second serial port interface components 314 may be connected to the controller 12. That is, the single chip microcomputer device 30 can adopt a one-host three-slave mode, and the second serial port interface component 314 of the single chip microcomputer module 31 serving as the host can be connected with the controller 12, so that the single chip microcomputer device 30 can externally receive data only through one second serial port interface component 314. After the second serial interface component 314 of the master receives the data, the single-chip microcomputers 311 of the master are connected in series, so that the single-chip microcomputers 311 of the master can send the data to the single-chip microcomputers 311 of the slaves. The single-chip microcomputers 311 can be connected in series through serial interfaces.
In an alternative implementation, each of the second serial port interface components 314 may be coupled to the controller 12. That is, each one-chip microcomputer module 31 can receive data from the controller 12, and further process the data individually.
Alternatively, the turntable 11 may be divided into at least two turntable areas, and referring to fig. 2, a preset number of touch screens 13 and a preset number of test cartridge modules 14 may be placed on each turntable area.
Accordingly, the rotation information may include a zone number corresponding to the target jog dial zone rotated to the preset position. Referring to fig. 2, each turntable area corresponds to a preset area number, and when the test device 10 monitors that a certain turntable area rotates to a preset position, the controller 12 may obtain the current area number and send the area number to the single chip microcomputer device 30. Accordingly, the second serial port interface component 314 connected to the controller 12 may be configured to receive the area number and send the area number to each of the single-chip microcomputers 311.
For example, referring to fig. 2, when the testing device 10 monitors that the turntable area corresponding to the area number JIG02 rotates to the preset position, the controller 12 may obtain the area number JIG02, and send the area number JIG02 to the single chip microcomputer device 30, and then the single chip microcomputer device 30 may determine, through the single chip microcomputer 311, 4 test cartridge modules located in the target turntable area corresponding to the area number JIG02 as target test cartridge modules when receiving the test signal sent by the control terminal 20 through the first serial port interface component 313, and send the test signal to the 4 target test cartridge modules through the first wireless module 312, so that the 4 target test cartridge modules respectively test the corresponding touch screens 13. Further, the single chip microcomputer device 30 may receive feedback signals returned by the 4 target test box modules through the first wireless module 312, and return each feedback signal to the control terminal 20 through the single chip microcomputer device 30.
If the single-chip microcomputers 311 are connected in series and the second serial port interface component 314 of the host is connected to the controller 12, the single-chip microcomputers 311 of the host can send the area number to other single-chip microcomputers 311 connected in series after receiving the area number. If each second serial interface component 314 is connected to the controller 12, the second serial interface component 314 of each single chip module 31 may receive the area number, and then send the area number to each single chip 311.
Optionally, referring to fig. 4, the test cartridge module 14 may include a test cartridge 141, a third serial interface component 142, a second wireless module 143, and a voltage conversion module 144, where the second wireless module 143 is connected to the third serial interface component 142, the third serial interface component 142 is connected to the test cartridge 141, and the voltage conversion module 144 is connected to the second wireless module 143 and the third serial interface component 142, respectively. The third serial port interface component 142 may specifically be an RS232 serial port interface, the second Wireless module 143 may specifically be a WIFI (Wireless Fidelity ) module, the WIFI module may have a built-in ESP8266 chip as a WIFI chip, and the test box 141 may specifically be a consolidity test box.
Referring to fig. 4, the test box 141 and the voltage conversion module 144 are respectively connected to a first power voltage U1, and the voltage conversion module 144 may be configured to convert the first power voltage U1 into a second power voltage U2 and supply power to the second wireless module 143 and the third serial interface module 142 through the second power voltage U2. Generally, the test box 141 requires a 5V power voltage, and therefore, the test box 141 can directly access a 5V first power voltage, and the second wireless module 143 and the third serial port interface component 142 generally only require a 3.3V power voltage, and therefore, the voltage conversion module 144 can step down the 5V first power voltage to a 3.3V second power voltage, so as to provide a 3.3V power voltage for the second wireless module 143 and the third serial port interface component 142.
The second wireless module 143 can be wirelessly connected with the single chip device 30. Specifically, the second wireless module 143 may be wirelessly connected to the first wireless module 312 of the single chip microcomputer device 30, and the second wireless module 143 may wirelessly communicate with the first wireless module 312 in a transparent transmission mode. The TTL (Transistor-Transistor Logic) type signal output by the second wireless module 143 can be converted into a serial signal through the third serial interface module 142 to communicate with the test box 141.
Optionally, referring to fig. 5, the system may further include a wireless router 40, and the wireless router 40 may be configured to establish a local area network through which the single chip microcomputer device 30 and the test box module 14 may be wirelessly connected. Also can establish wireless local area network by wireless router 40, test box module 14 and single chip microcomputer device 30 all can be WIFI access, and control terminal 20 passes through single chip microcomputer device 30 control test box module 14 and carries out the touch-sensitive screen test.
In the embodiment of the invention, the test equipment comprises a turntable and a controller which are connected, wherein a plurality of touch screens and test box modules which are connected with the touch screens in a one-to-one correspondence mode are placed on the turntable. The single chip microcomputer equipment is respectively connected with the control terminal and the controller and is in wireless connection with the test box module. The controller is configured to acquire rotation information of the turntable and send the rotation information to the single chip microcomputer device. The single chip microcomputer device is configured to determine the target test box module according to the rotation information when receiving the test signal sent by the control terminal, send the test signal to the target test box module, receive the feedback signal returned by the target test box module, and return the feedback signal to the control terminal through the single chip microcomputer device. In the embodiment of the invention, the tested control terminal can be connected with the single chip microcomputer device, and the single chip microcomputer device can be wirelessly connected with each test box module, so that the control terminal can wirelessly control the target test box module in each test box module to perform performance test on the connected touch screen through the single chip microcomputer device, and thus, the alignment compression joint through a probe is not needed, the position limitation of a compression joint mechanism is avoided, the positioning precision of a turntable is reduced, and the test efficiency is improved.
Example two
Referring to fig. 6, a flowchart of a touch screen testing method according to a second embodiment of the present invention is shown, where the method can be applied to the touch screen testing system, and the method includes the following steps:
step 601, the controller acquires rotation information of the turntable and sends the rotation information to the single chip microcomputer device.
In the embodiment of the invention, in the rotating process of the rotating disc of the test equipment, if a certain rotating disc area rotates to a specific preset position, the rotating disc area indicates that the test box module positioned in the rotating disc area can start to perform performance test on the corresponding touch screen. The testing equipment can monitor which turntable area of the turntable rotates to a preset position, and then can send information of the turntable area to the single chip microcomputer equipment.
Optionally, the turntable may be divided into at least two turntable areas, and the rotation information may include an area number corresponding to a target turntable area that is rotated to a preset position.
Step 602, when receiving the test signal sent by the control terminal, the single chip microcomputer device determines the target test box module according to the rotation information, and sends the test signal to the target test box module.
In the embodiment of the invention, the control terminal can send the test signal to the single chip microcomputer device, and when the single chip microcomputer device receives the test signal, the target test box module in each test box module can be determined according to the information of the turntable area rotating to the preset position, namely the test box module positioned in the turntable area rotating to the preset position. And then single chip microcomputer equipment can be through wireless modes such as WIFI, with test signal transmission to target test box module to make target test box module to the touch-sensitive screen input test signal who corresponds to it, thereby test.
Wherein, the rotation information may include an area number corresponding to an area of the target turntable rotated to a preset position, and accordingly, the step of determining the target test box module may be specifically implemented in the following manner according to the rotation information, including: and determining the test box module in the target turntable area corresponding to the area number as the target test box module.
And 603, receiving the feedback signal returned by the target test box module by the single chip microcomputer device, and returning the feedback signal to the control terminal through the single chip microcomputer device.
In the embodiment of the invention, the tested touch screen responds to the test signal and can generate the feedback signal, so that the feedback signal can be returned to the single chip microcomputer device through the target test box module, the single chip microcomputer device can receive the feedback signal returned by the target test box module in a wireless mode such as WIFI (wireless fidelity) and the like and send the feedback signal to the single chip microcomputer device, and the single chip microcomputer device can send the feedback information to the control terminal, so that a tester can monitor the test process through the control terminal and check the test result.
In the embodiment of the invention, the controller of the test equipment can acquire the rotation information of the turntable and send the rotation information to the single chip microcomputer equipment. When the single chip microcomputer equipment receives the test signal sent by the control terminal, the target test box module can be determined according to the rotation information, and the test signal is sent to the target test box module. After the target test box module completes the test of the touch screen, the single chip microcomputer device can receive a feedback signal returned by the target test box module and return the feedback signal to the control terminal through the single chip microcomputer device. In the embodiment of the invention, the control terminal can control the target test box module in each test box module to perform performance test on the connected touch screen in a wireless mode through the single-chip microcomputer equipment, so that alignment compression is not required to be performed through a probe, the position limitation of a compression mechanism is avoided, the positioning precision of the turntable is reduced, and the test efficiency is improved.
While, for purposes of simplicity of explanation, the foregoing method embodiments have been described as a series of acts or combination of acts, it will be appreciated by those skilled in the art that the present invention is not limited by the illustrated ordering of acts, as some steps may occur in other orders or concurrently with other steps in accordance with the invention. Further, those skilled in the art should also appreciate that the embodiments described in the specification are preferred embodiments and that the acts and modules referred to are not necessarily required by the invention.
The embodiments in the present specification are described in a progressive manner, each embodiment focuses on differences from other embodiments, and the same and similar parts among the embodiments are referred to each other.
Finally, it should also be noted that, herein, relational terms such as first and second, and the like may be used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Also, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising an … …" does not exclude the presence of other like elements in a process, method, article, or apparatus that comprises the element.
The touch screen testing system and method provided by the invention are introduced in detail, and the principle and the implementation mode of the invention are explained by applying specific examples, and the description of the examples is only used for helping to understand the method and the core idea of the invention; meanwhile, for a person skilled in the art, according to the idea of the present invention, there may be variations in the specific embodiments and the application scope, and in summary, the content of the present specification should not be construed as a limitation to the present invention.

Claims (10)

1. A touch screen testing system, the system comprising:
the test equipment comprises a turntable and a controller which are connected, wherein a plurality of touch screens and test box modules which are connected with the touch screens in a one-to-one correspondence mode are arranged on the turntable;
a control terminal;
the single chip microcomputer device is respectively connected with the control terminal and the controller, and is wirelessly connected with the test box module;
the controller is configured to acquire rotation information of the turntable and send the rotation information to the single chip microcomputer device; the single chip microcomputer device is configured to determine a target test box module according to the rotation information when receiving a test signal sent by the control terminal, send the test signal to the target test box module, receive a feedback signal returned by the target test box module, and return the feedback signal to the control terminal through the single chip microcomputer device.
2. The system of claim 1, wherein the number of target test cartridge modules is a preset number; the single chip microcomputer device comprises the single chip microcomputer modules with the preset number, the single chip microcomputer modules comprise single chip microcomputers, first wireless modules and first serial port interface assemblies, the single chip microcomputers are respectively connected with the first wireless modules and the first serial port interface assemblies, and the first wireless modules are wirelessly connected with the test box modules.
3. The system of claim 2, wherein the single chip module further comprises a second serial port interface component, and the second serial port interface component is connected with the single chip.
4. The system of claim 3, wherein the single-chip microcomputers are connected in series, and any one of the second serial port interface components is connected with the controller.
5. The system of claim 3, wherein each of the second serial port interface components is connected to the controller.
6. The system according to claim 4 or 5, wherein the turntable is divided into at least two turntable areas, and the preset number of touch screens and the preset number of test box modules are placed on each turntable area;
the rotation information comprises a region number corresponding to a target turntable region rotated to a preset position; the second serial port interface component connected with the controller is configured to receive the area number and send the area number to each single chip microcomputer.
7. The system of claim 1, wherein the test cartridge module comprises a test cartridge, a third serial port interface assembly, a second wireless module, and a voltage conversion module, the second wireless module is connected to the third serial port interface assembly, the third serial port interface assembly is connected to the test cartridge, and the voltage conversion module is respectively connected to the second wireless module and the third serial port interface assembly;
the test box and the voltage conversion module are respectively connected with a first power supply voltage, and the voltage conversion module is configured to convert the first power supply voltage into a second power supply voltage and supply power to the second wireless module and the third serial port interface component through the second power supply voltage;
the second wireless module is in wireless connection with the single-chip microcomputer device.
8. The system of claim 1, further comprising a wireless router configured to establish a local area network through which the single-chip microcomputer device and the test cartridge module are wirelessly connected.
9. A touch screen testing method applied to the touch screen testing system according to any one of claims 1 to 8, the method comprising:
the controller acquires rotation information of the turntable and sends the rotation information to the single-chip microcomputer equipment;
when the single chip microcomputer equipment receives a test signal sent by a control terminal, a target test box module is determined according to the rotation information, and the test signal is sent to the target test box module;
and the single chip microcomputer equipment receives a feedback signal returned by the target test box module and returns the feedback signal to the control terminal through the single chip microcomputer equipment.
10. The method according to claim 9, wherein the turntable is divided into at least two turntable areas, and the rotation information includes an area number corresponding to a target turntable area rotated to a preset position;
according to the rotation information, the target test box module is determined, and the method comprises the following steps:
and determining the test box module positioned in the target turntable area corresponding to the area number as a target test box module.
CN201911329963.5A 2019-12-20 2019-12-20 Touch screen testing system and method Active CN110988558B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201911329963.5A CN110988558B (en) 2019-12-20 2019-12-20 Touch screen testing system and method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201911329963.5A CN110988558B (en) 2019-12-20 2019-12-20 Touch screen testing system and method

Publications (2)

Publication Number Publication Date
CN110988558A true CN110988558A (en) 2020-04-10
CN110988558B CN110988558B (en) 2022-06-07

Family

ID=70073795

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201911329963.5A Active CN110988558B (en) 2019-12-20 2019-12-20 Touch screen testing system and method

Country Status (1)

Country Link
CN (1) CN110988558B (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111856235A (en) * 2020-07-24 2020-10-30 北方夜视技术股份有限公司 Vacuum ultraviolet photomultiplier testing arrangement
CN113917265A (en) * 2021-10-11 2022-01-11 深圳大趋智能科技有限公司 POS machine test method and test system

Citations (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH08201228A (en) * 1995-01-24 1996-08-09 Advantest Corp Apparatus for inspecting image quality of lcd panel with ccd defect correction function
CN1773301A (en) * 2004-11-11 2006-05-17 三星电子株式会社 Inspection apparatus for display panel and method for testing the same apparatus for the same display panel assembly
CN1873744A (en) * 2005-06-02 2006-12-06 飞而康公司 Rotation-type display panel testing device and display panel testing method using the same
CN101038233A (en) * 2007-04-24 2007-09-19 友达光电股份有限公司 Method for detecting display panel
CN101299315A (en) * 2008-07-04 2008-11-05 友达光电(苏州)有限公司 Test system for display panel
CN101762759A (en) * 2010-01-07 2010-06-30 苏州佳世达电通有限公司 Flat-panel display tester
JP2010286446A (en) * 2009-06-15 2010-12-24 Sony Corp Inspection device of display panel, and inspection method of the same
CN203561975U (en) * 2013-07-04 2014-04-23 深圳市泛思成科技有限公司 Capacitive touch screen burning test system
CN203786216U (en) * 2013-08-30 2014-08-20 北京沃华慧通测控技术有限公司 System for detecting performance of capacitive touch screen
CN105334021A (en) * 2014-07-03 2016-02-17 苏州三星显示有限公司 System and method for checking display screen
US20170023637A1 (en) * 2015-07-22 2017-01-26 Boe Technology Group Co., Ltd. Apparatus and system for testing touch screen and apparatus for controlling test of touch screen
CN206132886U (en) * 2016-10-21 2017-04-26 重庆市翌辰光电有限公司 Many unit test of touch -sensitive screen device
CN107300791A (en) * 2017-06-29 2017-10-27 武汉精测电子技术股份有限公司 A kind of Flicker values and TP value joint test device and methods
CN108280001A (en) * 2017-12-29 2018-07-13 深圳市艾特智能科技有限公司 Parameter testing method, system, control terminal, test terminal and terminal device
CN108507759A (en) * 2018-04-16 2018-09-07 昆山精讯电子技术有限公司 A kind of display panel testing and detection method
CN109061454A (en) * 2018-08-03 2018-12-21 德丰电创科技股份有限公司 Touch type electric tool switch debugging apparatus and system
CN109612691A (en) * 2019-01-14 2019-04-12 武汉精立电子技术有限公司 A kind of rotary display panel testing
CN109753050A (en) * 2019-01-28 2019-05-14 西安爱生技术集团公司 A kind of Portable unmanned machine handling controller test macro and test method

Patent Citations (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH08201228A (en) * 1995-01-24 1996-08-09 Advantest Corp Apparatus for inspecting image quality of lcd panel with ccd defect correction function
CN1773301A (en) * 2004-11-11 2006-05-17 三星电子株式会社 Inspection apparatus for display panel and method for testing the same apparatus for the same display panel assembly
CN1873744A (en) * 2005-06-02 2006-12-06 飞而康公司 Rotation-type display panel testing device and display panel testing method using the same
CN101038233A (en) * 2007-04-24 2007-09-19 友达光电股份有限公司 Method for detecting display panel
CN101299315A (en) * 2008-07-04 2008-11-05 友达光电(苏州)有限公司 Test system for display panel
JP2010286446A (en) * 2009-06-15 2010-12-24 Sony Corp Inspection device of display panel, and inspection method of the same
CN101762759A (en) * 2010-01-07 2010-06-30 苏州佳世达电通有限公司 Flat-panel display tester
CN203561975U (en) * 2013-07-04 2014-04-23 深圳市泛思成科技有限公司 Capacitive touch screen burning test system
CN203786216U (en) * 2013-08-30 2014-08-20 北京沃华慧通测控技术有限公司 System for detecting performance of capacitive touch screen
CN105334021A (en) * 2014-07-03 2016-02-17 苏州三星显示有限公司 System and method for checking display screen
US20170023637A1 (en) * 2015-07-22 2017-01-26 Boe Technology Group Co., Ltd. Apparatus and system for testing touch screen and apparatus for controlling test of touch screen
CN206132886U (en) * 2016-10-21 2017-04-26 重庆市翌辰光电有限公司 Many unit test of touch -sensitive screen device
CN107300791A (en) * 2017-06-29 2017-10-27 武汉精测电子技术股份有限公司 A kind of Flicker values and TP value joint test device and methods
CN108280001A (en) * 2017-12-29 2018-07-13 深圳市艾特智能科技有限公司 Parameter testing method, system, control terminal, test terminal and terminal device
CN108507759A (en) * 2018-04-16 2018-09-07 昆山精讯电子技术有限公司 A kind of display panel testing and detection method
CN109061454A (en) * 2018-08-03 2018-12-21 德丰电创科技股份有限公司 Touch type electric tool switch debugging apparatus and system
CN109612691A (en) * 2019-01-14 2019-04-12 武汉精立电子技术有限公司 A kind of rotary display panel testing
CN109753050A (en) * 2019-01-28 2019-05-14 西安爱生技术集团公司 A kind of Portable unmanned machine handling controller test macro and test method

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111856235A (en) * 2020-07-24 2020-10-30 北方夜视技术股份有限公司 Vacuum ultraviolet photomultiplier testing arrangement
CN111856235B (en) * 2020-07-24 2024-01-23 北方夜视技术股份有限公司 Vacuum ultraviolet photomultiplier testing device
CN113917265A (en) * 2021-10-11 2022-01-11 深圳大趋智能科技有限公司 POS machine test method and test system
CN113917265B (en) * 2021-10-11 2024-03-29 深圳大趋智能科技有限公司 POS machine testing method and testing system

Also Published As

Publication number Publication date
CN110988558B (en) 2022-06-07

Similar Documents

Publication Publication Date Title
CN115210589B (en) Chip testing device and testing method
CN110988558B (en) Touch screen testing system and method
CN110268277A (en) Functional test device and relevant system and method for printed circuit board
CN104460652B (en) The application method of board aging equipment and board aging equipment
JP2021071460A (en) Automatic circuit board testing system and testing method thereof
CN108346404B (en) Parameter debugging method for time schedule controller and screen driving circuit
CN111767177B (en) Test method, device and equipment of LED display screen control card and storage medium
CN103048610B (en) The PCB Auto-Test System of no-carry stand-by period
CN211062033U (en) Test adapter and test equipment
CN106291321B (en) L abWindows/CVI-based plasma power supply circuit automatic test platform and method
CN101149697A (en) Key test system and method
CN116257037B (en) Method, system, electronic device and storage medium for generating controller test program
CN105589026A (en) Large switch matrix testing device
CN109992551B (en) USB C-type interface information reading method and information reading circuit
CN116237276A (en) Chip testing method, system, device and electronic equipment
CN110988528A (en) Method, device and system for testing product signal integrity
CN115904849A (en) PCIE link signal test method, system, computer equipment and medium
CN103365735A (en) Transmission interface and method for determining transmission signal
CN211478501U (en) Multifunctional device for wireless charging test and development
CN213181887U (en) Voltage detection circuit and interactive intelligent panel
CN111352780B (en) Method and device for determining state of path and readable storage medium
CN110687363A (en) SFP port test fixture
CN103324571B (en) A kind of method and system thereof of testing GPS module on embedded PCB A
CN113110962A (en) Fan heat dissipation performance test method and test equipment
KR101800277B1 (en) Fm radio auto test set

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
GR01 Patent grant
GR01 Patent grant