CN110955224B - Testing device and testing method for mechanism lock control component - Google Patents
Testing device and testing method for mechanism lock control component Download PDFInfo
- Publication number
- CN110955224B CN110955224B CN201911127455.9A CN201911127455A CN110955224B CN 110955224 B CN110955224 B CN 110955224B CN 201911127455 A CN201911127455 A CN 201911127455A CN 110955224 B CN110955224 B CN 110955224B
- Authority
- CN
- China
- Prior art keywords
- relay
- mechanism lock
- port
- diode
- normally closed
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Images
Classifications
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B23/00—Testing or monitoring of control systems or parts thereof
- G05B23/02—Electric testing or monitoring
- G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
- G05B23/0208—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterized by the configuration of the monitoring system
- G05B23/0213—Modular or universal configuration of the monitoring system, e.g. monitoring system having modules that may be combined to build monitoring program; monitoring system that can be applied to legacy systems; adaptable monitoring system; using different communication protocols
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B2219/00—Program-control systems
- G05B2219/20—Pc systems
- G05B2219/24—Pc safety
- G05B2219/24065—Real time diagnostics
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Automation & Control Theory (AREA)
- Emergency Protection Circuit Devices (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
Abstract
The invention relates to a testing device and a testing method for a mechanism lock control component, belongs to the technical field of online self-testing of equipment vehicle control equipment, and solves the problems that the existing mechanism lock testing process is complicated and automatic testing cannot be realized. A testing device for a mechanism lock control component comprises a mechanism lock simulation circuit, a test result acquisition module and a test result analysis module; the mechanism lock control component sends a control instruction, and the mechanism lock simulation circuit is controlled to simulate different working states of the mechanism lock by controlling the power supply of a mechanism lock simulation circuit port; the test result acquisition module is used for acquiring a feedback value of a port of the mechanism mode locking analog circuit after the mechanism lock control component sends a control instruction; and the test result analysis module is used for receiving the feedback value acquired by the test result acquisition module, and if the feedback value is consistent with the state value in the pre-stored truth table, the test is passed. Self-testing of the mechanism lock control component after disassembly of the mechanism lock is achieved.
Description
Technical Field
The invention relates to the technical field of online self-testing of control equipment of an equipment vehicle, in particular to a testing device and a testing method of a mechanism lock control component.
Background
Compared with a common passenger car, the equipment car has a plurality of movable mechanisms. These mechanisms need to be stably fixed during driving or other actions to enable safe transportation. The action of the mechanism lock generally uses electric drive and electric feedback, and a control device connects the mechanism locks distributed on the whole vehicle through a cable. The action of the mechanism lock comprises locking and unlocking, the feedback signal comprises locking in place and unlocking in place, and the feedback form is commonly a travel switch.
Routine maintenance testing of the mechanical lock can be checked directly by the action of the mechanical lock. However, the mechanism lock of the detachable component can not confirm the normality of the control circuit by directly checking the action because the butt joint device is not arranged in most of time; when the mechanism lock control circuit needs to be checked, the control circuit and the control cable are checked by externally butting a specially designed mechanism lock control circuit function detection table to simulate the electrical characteristics of the mechanism lock.
However, the method needs to specially design a function detection table, and when the method is used, personnel need to transfer the control cable to the detection table from the outside, and test and judge results from the detection table. After the test is finished, the control cable is detached from the detection table and placed back to the cable parking container. The whole using process is complicated, and the cable can not be automatically plugged and pulled out twice in the vehicle on line.
Disclosure of Invention
In view of the above analysis, the present invention aims to provide a testing apparatus and a testing method for a mechanism lock control component, so as to solve the problems that the existing mechanism lock testing process is complicated and cannot realize automated testing.
The purpose of the invention is mainly realized by the following technical scheme:
on one hand, the device for testing the mechanism lock control component comprises a mechanism lock simulation circuit, a test result acquisition module and a test result analysis module; wherein the content of the first and second substances,
the mechanism lock control component sends a control instruction, and controls the mechanism lock analog circuit to simulate different working states of the mechanism lock by controlling the power supply of the mechanism lock analog circuit port;
the test result acquisition module is used for acquiring a feedback value of a port of the mechanism mode locking simulation circuit after the mechanism lock control component sends a control instruction;
the test result analysis module is used for receiving the feedback value acquired by the test result acquisition module, and if the feedback value is consistent with a state value in a pre-stored truth table, the test is passed;
the mechanism lock simulation circuit simulates the forward rotation and the reverse rotation of a mechanism lock actuating motor by using a diode and a coil of a relay; and simulating the movement of the in-place locking travel switch and the in-place unlocking travel switch in the mechanism lock by using the contact of the relay.
On the basis of the scheme, the invention is further improved as follows:
further, the mechanism lock simulation circuit is connected with the driving port, and the mechanism lock control component controls the power supply of the driving port to realize the power supply control of the mechanism lock simulation circuit port.
Further, a resistor and a light emitting diode are connected in series between the port of the collected feedback value and the driving port; the test result acquisition module acquires the light emitting state of the light emitting diode and converts the light emitting state into a feedback value of a port of the mechanism mode locking analog circuit; wherein the non-light emitting of the light emitting diode indicates that the feedback value is at a low level, and the light emitting of the light emitting diode indicates that the feedback value is at a high level.
Further, the mechanism lock simulation circuit comprises diodes D1-D4 and relays J1-J2, and is used for simulating the positive rotation and the reverse rotation of the mechanism lock action motor; wherein the content of the first and second substances,
the positive electrode of the diode D1 and the negative electrode of the diode D2 are used for simulating the positive port and the negative port of a forward power supply and a reverse power supply of the motion motor, and the negative electrode of the diode D3 and the positive electrode of the diode D4 are respectively used for simulating the negative port and the positive port of the forward power supply and the reverse power supply of the motion motor;
the negative electrode of the diode D1 is connected with the positive electrode of the coil of the relay J1, the negative electrode of the coil of the relay J1 is connected with the positive electrode of the diode D3, and the diode D1 is used for simulating the forward rotation of the mechanism lock acting motor;
the anode of the diode D2 is connected with the cathode of the coil of the relay J2, and the anode of the coil of the relay J2 is connected with the cathode of the diode D4, so that the reverse rotation of the mechanism lock action motor is simulated.
Further, a first movable contact and a first normally closed contact of the relay J1 are used for respectively simulating a movable contact port and a normally open contact port of the in-position locking travel switch;
and respectively simulating a movable contact port and a normally open contact port of the unlocking in-place travel switch by using a first movable contact and a first normally closed contact of the relay J2.
Further, when the mechanism lock simulation circuit is used for simulating two mechanism locks which are adjacently arranged, the mechanism lock simulation circuit further comprises diodes D5-D8, and the relays J1 and J2 further comprise a second movable contact, a second normally closed contact and a second normally open contact;
the forward and reverse rotation of a second mechanism lock action motor is simulated by using the diodes D5-D8 and the coils of the relays J1-J2;
a second movable contact and a second normally closed contact of the relay J1 are used for respectively simulating a movable contact port and a normally open contact port of the in-position locking travel switch in a second mechanism lock;
and a second movable contact and a first normally closed contact of the relay J2 are used for respectively simulating a movable contact port and a normally open contact port of the unlocking in-place travel switch in the second mechanism lock.
Further, the states of the first normally closed contact of the relay J1 and the first normally closed contact of the relay J2 in the mechanism mode locking analog circuit are used as feedback values of the mechanism mode locking analog circuit.
Further, when the mechanism lock control component sends a motor non-action instruction, a high level is provided for a first movable contact of the relay J1 and a first movable contact of the relay J2 of the mechanism lock analog circuit, and low levels are provided for the other ports; the state values of a first normally closed contact of the relay J1 and a first normally closed contact of the relay J2 in the prestored truth table are high levels;
when the mechanism lock control part sends a motor locking instruction, a high level is provided for the anode of a diode D1, the cathode of a diode D2, a first movable contact of a relay J1 and a first movable contact of a relay J2 in a mechanism mode locking analog circuit, and low levels are provided for other ports, and the state values of a first normally closed contact of the relay J1 and the state values of a first normally closed contact of a relay J2 in a prestored truth table are respectively as follows: low level, high level;
when the mechanism lock control component sends a motor unlocking instruction, high levels are provided for the cathode of the diode D3, the anode of the diode D4, the first movable contact of the relay J1 and the first movable contact of the relay J2, and low levels are provided for other ports, and the state values of the first normally closed contact of the relay J1 and the first normally closed contact of the relay J2 in the prestored truth table are respectively as follows: high level, low level.
Further, the mechanism lock control part can also test a circuit simulating a second mechanism lock in the mechanism lock simulation circuit independently, or test two mechanism locks which are arranged adjacently in the mechanism lock simulation circuit simultaneously.
In another aspect, a testing method of a mechanical lock control component testing device is provided, which includes the following steps:
when the mechanism lock control component sends a motor non-action instruction, a high level is provided for a first movable contact of a relay J1 and a first movable contact of a relay J2 of the mechanism lock analog circuit, and low levels are provided for the other ports; acquiring feedback values of a first normally closed contact of a relay J1 and a first normally closed contact of a relay J2 of the mechanism mode locking analog circuit at the moment, and if the feedback values are consistent with a state value of a prestored truth table when the motor does not act, sending a test pass when the motor does not act instruction;
when the mechanism lock control component sends a motor locking instruction, high levels are provided for the anode of a diode D1, the cathode of a diode D2, a first movable contact of a relay J1 and a first movable contact of a relay J2 in a mechanism mode locking analog circuit, and low levels are provided for the other ports; collecting feedback values of a first normally closed contact of a relay J1 and a first normally closed contact of a relay J2 of the mechanism mode locking analog circuit at the moment, and if the feedback values are consistent with a state value when a motor in a pre-stored truth table is locked, the test when a locking instruction is sent is passed;
when the mechanism lock control component sends a motor unlocking command, a high level is provided for the cathode of the diode D3, the anode of the diode D4, the first movable contact of the relay J1 and the first movable contact of the relay J2, and the other ports provide a low level; and acquiring feedback values of the first normally closed contact of the relay J1 and the first normally closed contact of the relay J2 of the mechanism mode locking analog circuit at the moment, and if the feedback values are consistent with the state values of the unlocking instruction in a prestored truth table, the test when the unlocking instruction is sent is passed.
The invention has the following beneficial effects:
the testing device for the mechanism lock control component comprises a mechanism lock simulation circuit, and self-testing of the mechanism lock control component is realized after the mechanism lock is disassembled. The realization mode is simple and easy, and the contents of the port, the truth table and the like detected by the mechanism lock can be correspondingly adjusted according to the structures of the mechanism lock and the mechanism lock analog circuit. The adaptability is strong, and the self-test requirement of the mechanism lock control component can be met. The testing method obtained by the device has the same technical effect. Meanwhile, the mechanism lock simulation circuit provided by the invention can realize the simulation of the mechanism lock by using the combination of conventional devices, and can solve the miniaturization problem of the mechanism lock simulation circuit; the simulation of two or more mechanism locks can be realized according to actual conditions. Meanwhile, the mechanism lock analog circuit can be used as a controlled circuit of the mechanism lock control component to realize self test of the mechanism lock control component after the mechanism lock is disassembled.
In addition, because the mechanism mode locking analog circuit has a simple structure, the miniaturization of devices can be realized, in practical application, a cable parking container when a device lock cable is vacant can be utilized, the mechanism mode locking analog circuit is integrated in the mechanism mode locking analog circuit, the mechanism mode locking analog circuit is excited by utilizing a control signal to the mechanism lock, and whether the feedback values of ports are consistent or not is judged according to a truth table of a test result corresponding to the mechanism lock analog circuit, so that the online self-test function of the mechanism lock control component is realized, the switching of an external cable and the operation of other personnel are not needed, the device is convenient and time-saving, and the practicability is high.
The testing method of the testing device of the mechanism lock control component is realized based on the same principle as the testing device, can be used for reference, and has the same technical effect.
In the invention, the technical schemes can be combined with each other to realize more preferable combination schemes. Additional features and advantages of the invention will be set forth in the description which follows, and in part will be obvious from the description, or may be learned by practice of the invention. The objectives and other advantages of the invention will be realized and attained by the structure particularly pointed out in the written description and claims hereof as well as the appended drawings.
Drawings
The drawings are only for purposes of illustrating particular embodiments and are not to be construed as limiting the invention, wherein like reference numerals are used to designate like parts throughout.
FIG. 1 is a circuit schematic and interface circuit of a mechanical lock;
FIG. 2 is a schematic structural view of a testing device for a mechanism lock control unit when only one mechanism lock is included;
fig. 3 is a schematic structural diagram of a mechanism lock control component testing device when a mechanism lock simulation circuit simulating two mechanism locks is included.
Detailed Description
The accompanying drawings, which are incorporated in and constitute a part of this application, illustrate preferred embodiments of the invention and together with the description, serve to explain the principles of the invention and not to limit the scope of the invention.
The mechanical lock is a common lock form, wherein, fig. 1 shows a circuit principle and an interface circuit of a common mechanical lock; the mechanism lock includes: the mechanism lock acts the electrical machinery, locks the travel switch in place, unlocks the travel switch in place. Where M1 is a mechanical lock actuation motor, reliability is typically improved with dual wire redundancy while sharing the current carrying capability of a single wire. In the embodiment, positive 1, positive 2, negative 3 and negative 4 are positive, corresponding to locking action; 1. 2 minus 3, 4 plus are reverse, corresponding to the unlocking action. K1 'and K2' respectively represent a lock-in-position travel switch and an unlock-in-position travel switch, both of which are travel switches. In the embodiment, a normally open switch is used as an example, and the in-place locking travel switch is opened when not in place and closed when in place, and the in-place unlocking travel switch is opened when not in place and closed when in place. The mechanical lock of the embodiment can be an electric push rod type latch lock or other mechanical lock forms comprising the structure.
For this common mechanism lock, the embodiment designs a mechanism lock simulation circuit to realize the simulation of the mechanism lock, and the specific implementation manner is described as follows:
example 1
The invention discloses a testing device of a mechanism lock control component, which comprises a mechanism lock simulation circuit, a test result acquisition module and a test result analysis module; the mechanism lock control component sends a control instruction, and controls the mechanism lock simulation circuit to simulate different working states of the mechanism lock by controlling the power supply of a port of the mechanism lock simulation circuit; the test result acquisition module is used for acquiring a feedback value of a port of the mechanism mode locking simulation circuit after the mechanism lock control component sends a control instruction; the test result analysis module is used for receiving the feedback value acquired by the test result acquisition module, and if the feedback value is consistent with a state value in a pre-stored truth table, the test is passed; the mechanism lock simulation circuit simulates the forward rotation and the reverse rotation of a mechanism lock actuating motor by using a diode and a coil of a relay; and simulating the movement of the in-place locking travel switch and the in-place unlocking travel switch in the mechanism lock by using the contact of the relay.
Compared with the prior art, the testing device for the mechanism lock control component provided by the embodiment is provided with the mechanism lock simulation circuit for simulating the mechanism lock to work, and the mechanism lock simulation circuit is used as the controlled equipment of the mechanism lock control component, so that the self-test of the mechanism lock control component after the mechanism lock is detached is realized. And through the cooperation of test result collection module, test result analysis module, realized whole testing process's automation, convenient save time, the practicality is strong.
Preferably, the mechanism lock analog circuit is connected with the driving port, and the mechanism lock control component controls the power supply of the driving port to realize the power supply control of the mechanism lock analog circuit port. A resistor and a light emitting diode are connected in series between the port of the collected feedback value and the driving port; the test result acquisition module acquires the light emitting state of the light emitting diode and converts the light emitting state into a feedback value of a port of the mechanism mode locking analog circuit; wherein the non-light emitting of the light emitting diode indicates that the feedback value is at a low level, and the light emitting of the light emitting diode indicates that the feedback value is at a high level. In addition, the voltage of each port can be directly acquired to obtain the feedback value of each port.
The embodiment further gives a concrete form of the mechanism mode analog circuit. Preferably, the mechanism lock analog circuit comprises diodes D1-D4 and relays J1-J2, and is used for simulating the positive rotation and the reverse rotation of the mechanism lock action motor; the positive electrode of the diode D1 and the negative electrode of the diode D2 are used for simulating the positive port and the negative port of a forward power supply and a reverse power supply of the motion motor, and the negative electrode of the diode D3 and the positive electrode of the diode D4 are respectively used for simulating the negative port and the positive port of the forward power supply and the reverse power supply of the motion motor; the negative electrode of the diode D1 is connected with the positive electrode of the coil of the relay J1, the negative electrode of the coil of the relay J1 is connected with the positive electrode of the diode D3, and the diode D1 is used for simulating the forward rotation of the mechanism lock acting motor; the anode of the diode D2 is connected with the cathode of the coil of the relay J2, and the anode of the coil of the relay J2 is connected with the cathode of the diode D4, so that the reverse rotation of the mechanism lock action motor is simulated. The relay J1 comprises a first group of contacts K1, and K1 comprises a first movable contact 1 and a first normally closed contact 3; the relay J2 comprises a first group of contacts K2, and K2 comprises a first movable contact 1 and a first normally closed contact 3; specifically, at the same time, a first movable contact 1 and a first normally closed contact 3 of the relay J1 are used for respectively simulating a movable contact port and a normally open contact port of the locked-in-place travel switch; and respectively simulating a movable contact port and a normally open contact port of the unlocking in-place travel switch by using a first movable contact and a first normally closed contact of the relay J2. FIG. 2 is a schematic diagram of the mechanism lock control unit testing device when only one mechanism lock is included; in order to facilitate actual connection and control, the serial numbers of the ports of the mechanism lock simulation circuit are consistent with the serial numbers of the ports in the mechanism lock simulated by the mechanism lock simulation circuit;
the mechanism lock analog circuit is analyzed as follows:
when high level is provided for the ports 1 and 2 of the mechanism lock and mechanism mode locking analog circuits, and low level is provided for the ports 3 and 4 of the mechanism lock and mechanism mode locking analog circuits, the mechanism lock acts the motor to rotate positively; correspondingly, at the moment, diodes D1 and D3 in the mechanism mode locking analog circuit are conducted, and the relay J1 is attracted, so that the forward rotation of the motor can be locked by the matching analog mechanism of the diodes D1 and D3 and the relay J1; when the low level is provided for the ports 1 and 2 of the mechanism lock and the mechanism mode locking analog circuit, and the high level is provided for the ports 3 and 4 of the mechanism lock and the mechanism mode locking analog circuit, the actuating motor of the mechanism lock rotates reversely; correspondingly, at the moment, the diodes D2 and D4 in the mechanism locking analog circuit are conducted, the relay J2 is attracted, and therefore the reverse rotation of the mechanism locking action motor can be simulated through the matching of the diodes D2 and D4 and the relay J2.
When the motor does not act, high levels are provided for the ports 6 and 7 of the mechanism lock and the mechanism mode locking analog circuit, and when low levels are provided for the ports 5 and 8 of the mechanism lock and the mechanism mode locking analog circuit, the in-place locking travel switch and the in-place unlocking travel switch are both closed, and the levels of the ports 5 and 8 of the mechanism lock are changed into high levels; accordingly, in the mechanism lock analog circuit, none of the relays J1-J2 is powered, so that the first movable contact 1 of the relay J1 is connected to the first normally closed contact 3, the level of the port 5 of the mechanism lock analog circuit also becomes high, and similarly, the level of the port 8 of the mechanism lock analog circuit also becomes high; meanwhile, when the motor rotates forwards and reversely, the actions of the mechanism lock and mechanism mode locking analog circuit are analyzed according to the mode, and the actions of the mechanism lock ports 5, 6, 7 and 8 are consistent with the actions of the corresponding ports of the mechanism mode locking analog circuit. Therefore, according to the technical scheme obtained in the mode, the action simulation of locking and unlocking the in-place travel switch in the mechanism lock can be realized.
The mechanism lock simulation circuit form provided by the embodiment can be used for simulating one mechanism lock and can also realize the simulation of two or more mechanism locks. When the mechanism lock simulation circuit is used for simulating two mechanism locks which are adjacently arranged, the mechanism lock simulation circuit further comprises diodes D5-D8, the relay J1 at the moment further comprises a second group of contacts K3, and the K3 comprises a second movable contact 5 and a second normally closed contact 7; the relay J2 also comprises a second group of contacts K4, and K4 comprises a second movable contact 5 and a second normally closed contact 7; the forward and reverse rotation of a second mechanism lock action motor is simulated by using the diodes D5-D8 and the coils of the relays J1-J2 (the connection relation refers to the diodes D1-D4); a second movable contact and a second normally closed contact of the relay J1 are used for respectively simulating a movable contact port and a normally open contact port of the in-position locking travel switch in a second mechanism lock; and a second movable contact and a first normally closed contact of the relay J2 are used for respectively simulating a movable contact port and a normally open contact port of the unlocking in-place travel switch in the second mechanism lock. Fig. 3 is a schematic structural diagram of a mechanism lock control component testing device when a mechanism lock simulation circuit simulating two mechanism locks is included. According to actual need, more mechanism locks can also be simulated to mechanism lock analog circuit, can adjust it according to actual conditions. More relays can be selected according to actual conditions, or a plurality of relays can be driven in parallel at the same time, so that the logic function of the invention can be realized.
Preferably, the state of the first normally closed contact of the relay J1 and the first normally closed contact of the relay J2 in the mechanism lock analog circuit is used as the feedback value of the mechanism lock analog circuit according to the operation condition of the switch when the mechanism lock is actually operated.
Taking fig. 2 as an example, the operation state of the mechanism lock simulation circuit when the mechanism lock control component sends out different control commands will be described:
when the mechanism lock control component sends a motor non-action instruction, high level is provided for the ports 6 and 7 of the mechanism lock analog circuit, and low level is provided for the other ports; the relays J1 and J2 are not attracted and keep a normally open state. Taking J1 as an example, the first movable contact 1 does not act, so that the feedback value of port 5 collected by the test result collection module should be high level under normal conditions; similarly, the feedback value of the port 8 is high.
When the mechanism lock control part sends a motor M1 locking instruction, high levels are provided for the ports 1, 2, 6 and 7, low levels are provided for the other ports, corresponding to the forward rotation action of the motor, at the moment, correspondingly, the diodes D1 and D3 in the mechanism lock analog circuit are conducted, the diodes D2 and D4 are cut off, the relay J1 is driven to be attracted, and the relay J2 is not attracted. A first movable contact 1 of the relay J1 is disconnected with a first normally closed contact 3 and connected with a first normally open contact 2; at this time, the feedback value of the port 5 acquired by the test result acquisition module is a low level; at this time, since relay J2 is not pulling, the feedback value of port 8 is still high.
When the mechanism lock control component sends out an unlocking instruction of the motor M1, high level is provided for the ports 3, 4, 6 and 7, and low level is provided for the other ports, and at the moment, the corresponding motor of the mechanism lock reversely rotates. At this time, correspondingly, the diodes D2 and D4 in the mechanism lock analog circuit are turned on, the diodes D1 and D3 are turned off, the relay J2 is driven to attract, and the relay J1 does not attract. The feedback values for ports 5, 8 are: high level, low level.
And taking the feedback values of the ports 5 and 8 obtained in the normal working process as the state values in the prestored truth table, and comparing the feedback values of the ports in the actual testing process to judge whether the mechanism lock control component works normally. Thus, a truth table of test results for a single channel lock analog circuit is obtained as shown in Table 1 (a single channel herein refers to a lock analog circuit including only one lock).
TABLE 1 truth table of test results corresponding to single-channel mechanism lock analog circuit
The mechanism lock control part can also test a circuit simulating a second mechanism lock in the mechanism lock simulation circuit independently or simultaneously test two mechanism locks which are arranged adjacently in the mechanism lock simulation circuit.
When the testing device for the mechanism lock control component in fig. 3, which includes the mechanism lock simulation circuit for simulating two mechanism locks, is controlled, the above process can be referred to for the simulation of the locked state of the motor M2 and the unlocked state of the motor M2, and details are not repeated here. A truth table of test results corresponding to the dual channel analog to analog circuit can be obtained as shown in table 2 (the dual channel here refers to an analog to analog circuit to a mechanical lock that includes only two mechanical locks).
TABLE 2 truth table of test results corresponding to two-channel mechanism mode-locked analog circuit
Preferably, the mechanism mode locking analog circuit is simple in structure and capable of achieving miniaturization of devices, in practical application, a cable parking container when a device lock cable is empty can be used, the mechanism mode locking analog circuit is integrated in the mechanism mode locking analog circuit, the mechanism mode locking analog circuit is excited by a control signal of the mechanism lock, whether feedback values of ports are consistent or not is judged according to a truth table of a test result corresponding to the mechanism lock analog circuit, an online self-test function of a mechanism lock control component is achieved, switching of an external cable and operation of other personnel are not needed, and the mechanism mode locking analog circuit is convenient, time-saving and high in practicability.
Example 2
In embodiment 2 of the present invention, there is also disclosed a method for testing a mechanism lock control component testing apparatus, including the steps of:
when the mechanism lock control component sends a motor non-action instruction, a high level is provided for a first movable contact of a relay J1 and a first movable contact of a relay J2 of the mechanism lock analog circuit, and low levels are provided for the other ports; acquiring feedback values of a first normally closed contact of a relay J1 and a first normally closed contact of a relay J2 of the mechanism mode locking analog circuit at the moment, and if the feedback values are consistent with a state value of a prestored truth table when the motor does not act, sending a test pass when the motor does not act instruction;
when the mechanism lock control component sends a motor locking instruction, high levels are provided for the anode of a diode D1, the cathode of a diode D2, a first movable contact of a relay J1 and a first movable contact of a relay J2 in a mechanism mode locking analog circuit, and low levels are provided for the other ports; collecting feedback values of a first normally closed contact of a relay J1 and a first normally closed contact of a relay J2 of the mechanism mode locking analog circuit at the moment, and if the feedback values are consistent with a state value when a motor in a pre-stored truth table is locked, the test when a locking instruction is sent is passed;
when the mechanism lock control component sends a motor unlocking command, a high level is provided for the cathode of the diode D3, the anode of the diode D4, the first movable contact of the relay J1 and the first movable contact of the relay J2, and the other ports provide a low level; and acquiring feedback values of the first normally closed contact of the relay J1 and the first normally closed contact of the relay J2 of the mechanism mode locking analog circuit at the moment, and if the feedback values are consistent with the state values of the unlocking instruction in a prestored truth table, the test when the unlocking instruction is sent is passed.
The method corresponds to the device in embodiment 1, and can also realize the test of the test device for the mechanism lock control component including the mechanism lock simulation circuit simulating two mechanism locks, and the test process can be realized by referring to embodiment 1, and is not described herein again.
Those skilled in the art will appreciate that all or part of the flow of the method implementing the above embodiments may be implemented by a computer program, which is stored in a computer readable storage medium, to instruct related hardware. The computer readable storage medium is a magnetic disk, an optical disk, a read-only memory or a random access memory.
The above description is only for the preferred embodiment of the present invention, but the scope of the present invention is not limited thereto, and any changes or substitutions that can be easily conceived by those skilled in the art within the technical scope of the present invention are included in the scope of the present invention.
Claims (10)
1. The device for testing the mechanism lock control component is characterized by comprising a mechanism lock simulation circuit, a test result acquisition module and a test result analysis module; wherein the content of the first and second substances,
the mechanism lock control component sends a control instruction, and controls the mechanism lock analog circuit to simulate different working states of the mechanism lock by controlling the power supply of the mechanism lock analog circuit port;
the test result acquisition module is used for acquiring a feedback value of a port of the mechanism mode locking simulation circuit after the mechanism lock control component sends a control instruction;
the test result analysis module is used for receiving the feedback value acquired by the test result acquisition module, and if the feedback value is consistent with a state value in a pre-stored truth table, the test is passed;
the mechanism lock simulation circuit simulates the forward rotation and the reverse rotation of a mechanism lock actuating motor by using a diode and a coil of a relay; and simulating the actions of locking and unlocking the in-place travel switch in the mechanism lock by using the contact of the relay.
2. The device for testing the mechanism lock control component according to claim 1, wherein the mechanism lock analog circuit is connected to the driving port, and the mechanism lock control component controls the power supply of the mechanism lock analog circuit port by controlling the power supply of the driving port.
3. The device for testing a mechanical lock control member according to claim 2, wherein a resistor and a light emitting diode are connected in series between the port of the collected feedback value and the driving port; the test result acquisition module acquires the light emitting state of the light emitting diode and converts the light emitting state into a feedback value of a port of the mechanism mode locking analog circuit; wherein the non-light emitting of the light emitting diode indicates that the feedback value is at a low level, and the light emitting of the light emitting diode indicates that the feedback value is at a high level.
4. The testing device for mechanism lock control members according to any one of claims 1 to 3, wherein the mechanism lock simulation circuit comprises diodes D1-D4 and relays J1-J2 for simulating the forward and reverse rotation of the mechanism lock action motor; wherein the content of the first and second substances,
the positive electrode of the diode D1 and the negative electrode of the diode D2 are used for simulating the positive port and the negative port of a forward power supply and a reverse power supply of the motion motor, and the negative electrode of the diode D3 and the positive electrode of the diode D4 are respectively used for simulating the negative port and the positive port of the forward power supply and the reverse power supply of the motion motor;
the negative electrode of the diode D1 is connected with the positive electrode of the coil of the relay J1, the negative electrode of the coil of the relay J1 is connected with the positive electrode of the diode D3, and the diode D1 is used for simulating the forward rotation of the mechanism lock acting motor;
the anode of the diode D2 is connected with the cathode of the coil of the relay J2, and the anode of the coil of the relay J2 is connected with the cathode of the diode D4, so that the reverse rotation of the mechanism lock action motor is simulated.
5. The mechanical lock control member testing device according to claim 4,
respectively simulating a movable contact port and a normally open contact port of the in-position locking travel switch by using a first movable contact and a first normally closed contact of a relay J1;
and respectively simulating a movable contact port and a normally open contact port of the unlocking in-place travel switch by using a first movable contact and a first normally closed contact of the relay J2.
6. The device for testing mechanical lock control members according to claim 5, wherein when said mechanical lock simulation circuit is used for simulating two mechanical locks adjacently arranged, said mechanical lock simulation circuit further comprises diodes D5-D8, said relays J1, J2 further comprise a second movable contact, a second normally closed contact, a second normally open contact;
the forward and reverse rotation of a second mechanism lock action motor is simulated by using the diodes D5-D8 and the coils of the relays J1-J2;
a second movable contact and a second normally closed contact of the relay J1 are used for respectively simulating a movable contact port and a normally open contact port of the in-position locking travel switch in a second mechanism lock;
and a second movable contact and a second normally closed contact of the relay J2 are used for respectively simulating a movable contact port and a normally open contact port of the unlocking in-place travel switch in the second mechanism lock.
7. The testing device of the mechanism lock control member according to claim 6, wherein the states of the first normally closed contact of the relay J1 and the first normally closed contact of the relay J2 in the mechanism mode analog circuit are used as the feedback values of the mechanism mode analog circuit.
8. The mechanical lock control member testing device according to claim 7,
when the mechanism lock control component sends a motor non-action instruction, a high level is provided for a first movable contact of a relay J1 and a first movable contact of a relay J2 of the mechanism lock analog circuit, and low levels are provided for the other ports; the state values of a first normally closed contact of the relay J1 and a first normally closed contact of the relay J2 in the prestored truth table are high levels;
when the mechanism lock control part sends a motor locking instruction, a high level is provided for the anode of a diode D1, the cathode of a diode D2, a first movable contact of a relay J1 and a first movable contact of a relay J2 in a mechanism mode locking analog circuit, and low levels are provided for other ports, and the state values of a first normally closed contact of the relay J1 and the state values of a first normally closed contact of a relay J2 in a prestored truth table are respectively as follows: low level, high level;
when the mechanism lock control component sends a motor unlocking instruction, high levels are provided for the cathode of the diode D3, the anode of the diode D4, the first movable contact of the relay J1 and the first movable contact of the relay J2, and low levels are provided for other ports, and the state values of the first normally closed contact of the relay J1 and the first normally closed contact of the relay J2 in the prestored truth table are respectively as follows: high level, low level.
9. The device for testing mechanical lock control members according to claim 8, wherein the mechanical lock control member individually tests a circuit simulating a second mechanical lock in the mechanical lock simulation circuit, or simultaneously tests two mechanical locks simulating adjacent arrangement in the mechanical lock simulation circuit.
10. A testing method of a mechanism lock control component testing device is characterized by comprising the following steps:
when the mechanism lock control component sends a motor non-action instruction, a high level is provided for a first movable contact of a relay J1 and a first movable contact of a relay J2 of the mechanism lock analog circuit, and low levels are provided for the other ports; acquiring feedback values of a first normally closed contact of a relay J1 and a first normally closed contact of a relay J2 of the mechanism mode locking analog circuit at the moment, and if the feedback values are consistent with a state value of a prestored truth table when the motor does not act, sending a test pass when the motor does not act instruction;
when the mechanism lock control component sends a motor locking instruction, high levels are provided for the anode of a diode D1, the cathode of a diode D2, a first movable contact of a relay J1 and a first movable contact of a relay J2 in a mechanism mode locking analog circuit, and low levels are provided for the other ports; collecting feedback values of a first normally closed contact of a relay J1 and a first normally closed contact of a relay J2 of the mechanism mode locking analog circuit at the moment, and if the feedback values are consistent with a state value when a motor in a pre-stored truth table is locked, the test when a locking instruction is sent is passed;
when the mechanism lock control component sends a motor unlocking command, a high level is provided for the cathode of the diode D3, the anode of the diode D4, the first movable contact of the relay J1 and the first movable contact of the relay J2, and the other ports provide a low level; and acquiring feedback values of the first normally closed contact of the relay J1 and the first normally closed contact of the relay J2 of the mechanism mode locking analog circuit at the moment, and if the feedback values are consistent with the state values of the unlocking instruction in a prestored truth table, the test when the unlocking instruction is sent is passed.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201911127455.9A CN110955224B (en) | 2019-11-18 | 2019-11-18 | Testing device and testing method for mechanism lock control component |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201911127455.9A CN110955224B (en) | 2019-11-18 | 2019-11-18 | Testing device and testing method for mechanism lock control component |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN110955224A CN110955224A (en) | 2020-04-03 |
| CN110955224B true CN110955224B (en) | 2020-11-27 |
Family
ID=69977779
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201911127455.9A Active CN110955224B (en) | 2019-11-18 | 2019-11-18 | Testing device and testing method for mechanism lock control component |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN110955224B (en) |
Family Cites Families (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN2081012U (en) * | 1990-08-30 | 1991-07-17 | 张锦权 | Electric push rod |
| CN202394112U (en) * | 2011-12-16 | 2012-08-22 | 柳州五菱汽车有限责任公司 | Controller simulation test system |
| CN104535866B (en) * | 2014-12-31 | 2017-11-17 | 广州新科佳都科技有限公司 | The test device of shield door electronic lock |
| CN104793087B (en) * | 2015-04-29 | 2017-10-13 | 扬州电力设备修造厂有限公司 | A kind of method of testing of direct current drive executing agency test system |
| JP6540562B2 (en) * | 2016-03-15 | 2019-07-10 | 株式会社島津製作所 | Durability tester |
| CN206835060U (en) * | 2017-06-15 | 2018-01-02 | 北京中法瑞克核仪器有限公司 | A kind of motor-driven valve simulator |
| CN209486991U (en) * | 2018-04-09 | 2019-10-11 | 辽宁科技大学 | A kind of Practical teaching device based on PLC logic control system |
| CN209296303U (en) * | 2019-03-08 | 2019-08-23 | 杭叉集团股份有限公司 | A kind of door lock durability degree test device |
-
2019
- 2019-11-18 CN CN201911127455.9A patent/CN110955224B/en active Active
Also Published As
| Publication number | Publication date |
|---|---|
| CN110955224A (en) | 2020-04-03 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN110164230B (en) | Urban electric control system overhauling and debugging practical training assessment equipment | |
| CN109397260B (en) | Demonstrator hot plug device, industrial robot and demonstrator hot plug method thereof | |
| CN104199445B (en) | Car body controller test system and method | |
| CN101395685B (en) | Automated control module for electrical cut-off apparatus and electrical cut-off apparatus equipped with such a control module | |
| CN102005194B (en) | Monochrome liquid crystal module universal driver | |
| EP2509908A1 (en) | Lifting device and method for testing and monitoring such a lifting device | |
| CN105892445A (en) | Mainboard function test system and method | |
| CN110955224B (en) | Testing device and testing method for mechanism lock control component | |
| CN104977881A (en) | Actuator controller based on communication bus and control method | |
| JPH10253723A (en) | Method, apparatus and system for inspecting battery of electric automobile | |
| CN104375034B (en) | On-board equipment on-off output channel online self-checking system of subway signal system | |
| CN110928268B (en) | Mechanism lock simulation circuit, mechanism lock control part self-testing device and testing method | |
| CN112735878A (en) | Circuit breaker opening and closing control system and method | |
| CN107728593A (en) | A kind of servo-control system for folded antenna | |
| CN101393080A (en) | Feedback system for automobile remote control central control lock system life test console | |
| CN206532723U (en) | A kind of drawer type automatic change-over | |
| CN109119978A (en) | A kind of control device of circuit breaker and its detection method with data-transformation facility | |
| CN214310801U (en) | Dual power transfer switch PLC direct current motor braking test circuit | |
| CN102129227B (en) | Driving loop for automatic device and starting loop thereof | |
| JP3821398B2 (en) | Storage group locking / unlocking control device | |
| CN108054058B (en) | Control monitoring circuit for breaker spring energy storage | |
| CN108415407B (en) | Leveling fault detection controller, paver leveling control device and paver leveling control method | |
| DE112020001869T5 (en) | INTERMITTING ACTUATORS, POWERED BY A TWISTED WIRE CONNECTION | |
| CN109132813B (en) | Elevator door circuit and short circuit detection method thereof | |
| WO2006000267A1 (en) | Voltage supply device of a control device |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |