CN110912615A - Laser wavelength drift rapid screening method for optical module product - Google Patents
Laser wavelength drift rapid screening method for optical module product Download PDFInfo
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- CN110912615A CN110912615A CN201911205268.8A CN201911205268A CN110912615A CN 110912615 A CN110912615 A CN 110912615A CN 201911205268 A CN201911205268 A CN 201911205268A CN 110912615 A CN110912615 A CN 110912615A
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04B—TRANSMISSION
- H04B10/00—Transmission systems employing electromagnetic waves other than radio-waves, e.g. infrared, visible or ultraviolet light, or employing corpuscular radiation, e.g. quantum communication
- H04B10/50—Transmitters
- H04B10/572—Wavelength control
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04B—TRANSMISSION
- H04B10/00—Transmission systems employing electromagnetic waves other than radio-waves, e.g. infrared, visible or ultraviolet light, or employing corpuscular radiation, e.g. quantum communication
- H04B10/50—Transmitters
- H04B10/501—Structural aspects
- H04B10/503—Laser transmitters
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Abstract
The invention discloses a method for rapidly screening laser wavelength drift for optical module products, which comprises the following steps: s1: providing initial long luminescence and recording the initial light power at the moment; s2: on the basis of step S1, debugging the optical power value of the long light emission, and determining and recording the optical power value at that time; s3: on the basis of step S2, when the optical power value is halved or reduced by more than 30dBm during the debugging process, the abnormal condition of the optical power value is recorded, and it is determined that the center wavelength of the laser at this time shifts out of the preset range. The invention can effectively intercept the laser with the wavelength offset out of the required range under the condition of not increasing any production line process steps and working hours, and can automatically identify the wavelength offset equipment and record and feed back the wavelength offset equipment.
Description
Technical Field
The invention belongs to the technical field of photoelectricity, and particularly relates to a method for rapidly screening wavelength drift of a laser for an optical module product.
Background
The light-transmitting material can achieve the effect of preventing certain specific wavelength light from transmitting after being coated by a special process, and the material after special treatment is generally called a filter or a filter, and can be combined according to different light-transmitting and light-blocking functions to be made into devices such as a wavelength division multiplexer and the like which are more widely applied. The wavelength range that can be passed is called "pass band", and vice versa is called "stop band".
Distributed feedback laser Diodes (DFBs) are widely used in fiber optic communication systems due to their high side-mode suppression ratio and ultra-narrow spectral width. The DFB laser is used in the upstream of the PON network terminal product ONU, and has the defects that the central wavelength can deviate along with the change of temperature, and if the central wavelength deviates out of the specified range, a series of compatibility problems can be caused to later use; therefore, a fast method for screening laser wavelength shift for optical module products is needed to screen out lasers with center wavelengths shifted out of a specified range and to issue an alarm.
Disclosure of Invention
The invention aims to provide a method for rapidly screening laser wavelength drift of an optical module product, which is used for solving the problems in the prior art, such as: the DFB laser is used in the upstream of a PON network terminal product ONU, and has the defects that the central wavelength can deviate along with the change of temperature, and if the central wavelength deviates out of a specified range, a series of compatibility problems can be caused to later use.
In order to achieve the purpose, the technical scheme adopted by the invention is as follows:
a method for rapidly screening laser wavelength drift for optical module products comprises the following steps:
s1: providing initial long luminescence and recording the initial light power at the moment;
s2: on the basis of step S1, debugging the optical power value of the long light emission, and determining and recording the optical power value at that time;
s3: on the basis of step S2, when the optical power value is halved or reduced by more than 30dBm during the debugging process, the abnormal condition of the optical power value is recorded, and it is determined that the center wavelength of the laser at this time shifts out of the preset range.
Preferably, step S1 includes the following sub-steps:
s101: the laser provides an initial optical signal, and the optical signals output by the laser are combined into one beam by the wavelength division multiplexer and transmitted along a single optical fiber;
s102: on the basis of step S102, the optical signal output by the wavelength division multiplexer is separated into different optical signals according to different wavelengths;
s103: on the basis of step S103, the wavelength and frequency of the optical signal are recorded by an oscilloscope, and the optical power value of the optical signal is recorded by an optical power meter.
Preferably, the method for adjusting the optical power value of the laser in step S2 includes: the wavelength of the optical signal output by the wavelength division multiplexer is adjusted by an attenuator.
A laser wavelength drift rapid screening device for optical module products comprises a light source generating device, an optical power debugging device, an optical power recording device and an optical power judging device;
the light source generating device is used for providing long luminescence;
the optical power adjusting device is used for adjusting the optical power value of the long-emitting light provided by the light source generating device;
the optical power recording device is used for testing and recording the optical power value of the long-time light emission at each moment after being adjusted by the optical power adjusting device;
the optical power judging device is used for judging whether the optical power value of each moment of the long light emission is halved or reduced by more than 30dBm or not when the optical power recording device tests and records the optical power value of each moment of the long light emission.
Preferably, the light source generating device comprises a laser, a wavelength division multiplexer and a splitter;
the laser is used for providing an initial optical signal;
the wavelength division multiplexer is used for synthesizing the initial optical signals into one beam and transmitting the beam along a single optical fiber;
the splitter is used for splitting the optical signals output by the wavelength division multiplexer into different optical signals according to different wavelengths.
Preferably, the optical power adjusting device is an attenuator;
the attenuator is used for adjusting the wavelength of the optical signal output by the wavelength division multiplexer, so that the optical power value of the optical signal output by the wavelength division multiplexer is adjusted.
Preferably, the optical power recording device comprises an oscilloscope and an optical power meter;
the oscilloscope is used for recording and displaying the wavelength and the frequency of the optical signal;
the optical power meter is used for recording and displaying the optical power value of the optical signal.
Preferably, the optical power determination device is an intelligent PC terminal.
Preferably, the intelligent PC terminal is connected with an error code meter, and the error code meter is used for detecting the working performance of the attenuator.
The beneficial technical effects of the invention are as follows: the invention can effectively intercept the laser with the wavelength offset out of the required range under the condition of not increasing any production line process steps and working hours, and can automatically identify the wavelength offset equipment and record and feed back the wavelength offset equipment.
Drawings
FIG. 1 is a flow chart showing steps of embodiment 1 of the present invention.
Fig. 2 is a flowchart illustrating a specific step of S1 according to embodiment 1 of the present invention.
Fig. 3 shows a schematic diagram of a pass/cut wavelength distribution of a special customized wavelength division multiplexer according to embodiment 1 of the present invention.
Fig. 4 is a schematic structural diagram of embodiment 2 of the present invention.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to fig. 1 to 4 of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
Example 1:
as shown in fig. 1, a method for rapidly screening wavelength drift of a laser used in an optical module product includes the following steps:
s1: providing initial long luminescence and recording the initial light power at the moment;
s2: on the basis of step S1, debugging the optical power value of the long light emission, and determining and recording the optical power value at that time;
s3: on the basis of step S2, when the optical power value is halved or reduced by more than 30dBm during the debugging process, the abnormal condition of the optical power value is recorded, and it is determined that the center wavelength of the laser at this time shifts out of the preset range.
As shown in fig. 2, preferably, step S1 includes the following sub-steps:
s101: the laser provides an initial optical signal, and the optical signals output by the laser are combined into one beam by the wavelength division multiplexer and transmitted along a single optical fiber;
s102: on the basis of step S102, the optical signal output by the wavelength division multiplexer is separated into different optical signals according to different wavelengths;
s103: on the basis of step S103, the wavelength and frequency of the optical signal are recorded by an oscilloscope, and the optical power value of the optical signal is recorded by an optical power meter.
Preferably, the method for adjusting the optical power value of the laser in step S2 includes: the wavelength of the optical signal output by the wavelength division multiplexer is adjusted by an attenuator.
Through the scheme, the wavelength division multiplexer is customized according to a preset accessible wavelength range, if the central wavelength of the laser does not shift, all light rays are transmitted completely, the wavelength division multiplexer is transparent to a system, and the optical power is not lost basically; when the wavelength of the laser is shifted and the center wavelength is shifted out of the passband range preset by the wavelength division multiplexer, half or more than 30% of the optical power is lost due to most of the light being cut off, as shown in fig. 3, a diagram of the pass/cut wavelength profile of a specific customized filter, wherein the horizontal axis represents the wavelength and the vertical axis represents the optical power.
Example 2:
as shown in fig. 4, a device for rapidly screening laser wavelength drift for an optical module product includes a light source generating device, an optical power debugging device, an optical power recording device, and an optical power determining device;
the light source generating device is used for providing long luminescence;
the optical power adjusting device is used for adjusting the optical power value of the long-emitting light provided by the light source generating device;
the optical power recording device is used for testing and recording the optical power value of the long-time light emission at each moment after being adjusted by the optical power adjusting device;
the optical power judging device is used for judging whether the optical power value of each moment of the long light emission is halved or reduced by more than 30dBm or not when the optical power recording device tests and records, the optical power judging device can give a warning at the moment, and the optical power debugging device can stop debugging.
Preferably, the light source generating device comprises a laser, a wavelength division multiplexer and a splitter;
the laser is used for providing an initial optical signal;
the wavelength division multiplexer is used for synthesizing the initial optical signals into one beam and transmitting the beam along a single optical fiber;
the splitter is used for splitting the optical signals output by the wavelength division multiplexer into different optical signals according to different wavelengths.
Preferably, the optical power adjusting device is an attenuator;
the attenuator is used for adjusting the wavelength of the optical signal output by the wavelength division multiplexer, so that the optical power value of the optical signal output by the wavelength division multiplexer is adjusted.
Preferably, the optical power recording device comprises an oscilloscope and an optical power meter;
the oscilloscope is used for recording and displaying the wavelength and the frequency of the optical signal;
the optical power meter is used for recording and displaying the optical power value of the optical signal.
Preferably, the optical power determination device is an intelligent PC terminal.
Preferably, the intelligent PC terminal is connected with an error code meter, and the error code meter is used for detecting the working performance of the attenuator.
In the description of the present invention, it is to be understood that the terms "counterclockwise", "clockwise", "longitudinal", "lateral", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", etc., indicate orientations or positional relationships based on those shown in the drawings, and are used for convenience of description only, and do not indicate or imply that the referenced devices or elements must have a particular orientation, be constructed and operated in a particular orientation, and thus, are not to be considered as limiting.
Claims (9)
1. A method for rapidly screening laser wavelength drift for optical module products is characterized by comprising the following steps:
s1: providing initial long luminescence and recording the initial light power at the moment;
s2: on the basis of step S1, debugging the optical power value of the long light emission, and determining and recording the optical power value at that time;
s3: on the basis of step S2, when the optical power value is halved or reduced by more than 30dBm during the debugging process, the abnormal condition of the optical power value is recorded, and it is determined that the center wavelength of the laser at this time shifts out of the preset range.
2. The method as claimed in claim 1, wherein the step S1 includes the following steps:
s101: the laser provides an initial optical signal, and the optical signals output by the laser are combined into one beam by the wavelength division multiplexer and transmitted along a single optical fiber;
s102: on the basis of step S102, the optical signal output by the wavelength division multiplexer is separated into different optical signals according to different wavelengths;
s103: on the basis of step S103, the wavelength and frequency of the optical signal are recorded by an oscilloscope, and the optical power value of the optical signal is recorded by an optical power meter.
3. The method for rapidly screening the wavelength drift of the laser used for the optical module product according to claim 2, wherein the method for adjusting the optical power value of the laser in step S2 comprises: the wavelength of the optical signal output by the wavelength division multiplexer is adjusted by an attenuator.
4. A laser wavelength drift rapid screening device for optical module products is characterized by comprising a light source generating device, an optical power debugging device, an optical power recording device and an optical power judging device;
the light source generating device is used for providing long luminescence;
the optical power adjusting device is used for adjusting the optical power value of the long-emitting light provided by the light source generating device;
the optical power recording device is used for testing and recording the optical power value of the long-time light emission at each moment after being adjusted by the optical power adjusting device;
the optical power judging device is used for judging whether the optical power value of each moment of the long light emission is halved or reduced by more than 30dBm or not when the optical power recording device tests and records the optical power value of each moment of the long light emission.
5. The device for rapidly screening the wavelength drift of the laser used for the optical module product according to claim 4, wherein the light source generating device comprises a laser, a wavelength division multiplexer and a splitter;
the laser is used for providing an initial optical signal;
the wavelength division multiplexer is used for synthesizing the initial optical signals into one beam and transmitting the beam along a single optical fiber;
the splitter is used for splitting the optical signals output by the wavelength division multiplexer into different optical signals according to different wavelengths.
6. The device for rapidly screening the wavelength drift of the laser used for the optical module product according to claim 4, wherein the optical power debugging device is an attenuator;
the attenuator is used for adjusting the wavelength of the optical signal output by the wavelength division multiplexer, so that the optical power value of the optical signal output by the wavelength division multiplexer is adjusted.
7. The device for rapidly screening the wavelength drift of the laser used for the optical module product according to claim 4, wherein the optical power recording device comprises an oscilloscope and an optical power meter;
the oscilloscope is used for recording and displaying the wavelength and the frequency of the optical signal;
the optical power meter is used for recording and displaying the optical power value of the optical signal.
8. The device according to claim 6, wherein the optical power determination device is an intelligent PC terminal.
9. The device of claim 8, wherein the intelligent PC terminal is connected to an error detector, and the error detector is configured to detect the performance of the attenuator.
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Cited By (2)
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CN111431593A (en) * | 2020-03-26 | 2020-07-17 | 武汉光迅科技股份有限公司 | Wavelength drift measuring method and wavelength drift measuring system |
CN112350774A (en) * | 2020-11-05 | 2021-02-09 | 四川天邑康和通信股份有限公司 | Laser center wavelength overrun judgment method for PON/optical module |
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CN104426610A (en) * | 2013-09-03 | 2015-03-18 | 上海贝尔股份有限公司 | Optical line terminal and optical network unit |
CN105763282A (en) * | 2014-12-17 | 2016-07-13 | 上海贝尔股份有限公司 | Wavelength control method and device thereof for adjusting ONU in PON system |
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2019
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Patent Citations (5)
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US20100239246A1 (en) * | 2009-03-23 | 2010-09-23 | Infinera Corporation | Wavelength and power monitor for wdm systems |
CN103634066A (en) * | 2012-08-28 | 2014-03-12 | 上海贝尔股份有限公司 | Optical line terminal and optical network unit |
CN203278834U (en) * | 2013-05-31 | 2013-11-06 | 福州高意通讯有限公司 | Light channel performance monitoring module capable of measuring channel central wavelength |
CN104426610A (en) * | 2013-09-03 | 2015-03-18 | 上海贝尔股份有限公司 | Optical line terminal and optical network unit |
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Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
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CN111431593A (en) * | 2020-03-26 | 2020-07-17 | 武汉光迅科技股份有限公司 | Wavelength drift measuring method and wavelength drift measuring system |
CN111431593B (en) * | 2020-03-26 | 2021-04-06 | 武汉光迅科技股份有限公司 | Wavelength drift measuring method and wavelength drift measuring system |
CN112350774A (en) * | 2020-11-05 | 2021-02-09 | 四川天邑康和通信股份有限公司 | Laser center wavelength overrun judgment method for PON/optical module |
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Application publication date: 20200324 |