CN110907723A - Switch impact testing device and system - Google Patents
Switch impact testing device and system Download PDFInfo
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- CN110907723A CN110907723A CN201911101256.0A CN201911101256A CN110907723A CN 110907723 A CN110907723 A CN 110907723A CN 201911101256 A CN201911101256 A CN 201911101256A CN 110907723 A CN110907723 A CN 110907723A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
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Abstract
The invention discloses a switch impact testing device and a system, wherein the switch impact testing device is connected with equipment to be tested and an upper computer and comprises a control module, a switch module, a signal output module, a parameter adjusting module and a recording module; after the power is on, the parameter adjusting module sets working parameters according to the control instruction, the control module outputs corresponding control signals according to the working parameters to control the on-off state of the switch module, and outputs a plurality of corresponding test signals to the signal output module; the signal output module amplifies the test signal and outputs the amplified test signal to the equipment to be tested; the recording module records the working state information of the equipment to be tested when the equipment to be tested works abnormally under the on-off state and outputs the working state information to the control module; the control module feeds back the working parameters and the working state information to the upper computer; the invention can realize automatic power-on and power-off impact test, provide various control signals for the equipment to be tested and record the state information of the equipment to be tested when the equipment to be tested is abnormal in real time.
Description
Technical Field
The invention relates to the technical field of testing, in particular to a switch sprint testing device and a system.
Background
In the research and development process of electronic products, need carry out the on-off capability test to electronic products before the product leaves the factory, current on-off impact test instrument is used for the on-off capability test, equipment itself is heavier and the function singleness, no intelligent automatic control, need manual monitoring, and can have the restriction of time and subjective judgement and the incomprehensive problem of record information during manual monitoring, and can not provide multiple test signal, can not satisfy the test demand of the equipment under test who needs external control signal.
Thus, the prior art has yet to be improved and enhanced.
Disclosure of Invention
In view of the above disadvantages of the prior art, an object of the present invention is to provide an apparatus and a system for testing power on/off impact, which can perform automatic power on/off impact testing, provide various control signals for a device to be tested, and can record status information of the device to be tested when the device to be tested is abnormal in real time, thereby improving testing efficiency.
In order to achieve the purpose, the invention adopts the following technical scheme:
a switch impact testing device is connected with equipment to be tested and an upper computer and comprises a control module, a switch module, a signal output module, a parameter adjusting module and a recording module; after the power is on, the parameter adjusting module sets working parameters according to control instructions, and the control module outputs corresponding control signals according to the working parameters to control the on-off state of the switch module and outputs a plurality of corresponding test signals to the signal output module; the signal output module amplifies the test signal and outputs the amplified test signal to the device to be tested; the recording module records the working state information of the equipment to be tested when the equipment to be tested works abnormally in the on-off state and outputs the working state information to the control module; and the control module feeds back the working parameters and the working state information to the upper computer.
The switch impact testing device further comprises a display module, and the control module further outputs the working parameters and the working state information to the display module, so that the display module displays the working parameters and the working state information.
In the switch impact testing device, the switch module comprises a driving unit and a switch unit; the driving unit outputs a driving signal to the switch unit according to the control signal, and the switch unit is switched on or off according to the driving signal.
In the switch impact testing device, the driving unit comprises a first triode, a second triode, a first resistor, a second resistor, a third resistor, a fourth resistor, a first capacitor and a second capacitor; a base electrode of the second triode is connected with one end of the second resistor, one end of the third resistor and one end of the first capacitor, and a collector electrode of the second triode, the other end of the third resistor and the other end of the first capacitor are connected with electricity; the other end of the second resistor is connected with the collector of the first triode, the collector of the second triode is connected with electricity, the base of the first triode is connected with one end of the first resistor, one end of the second capacitor and one end of the fourth resistor, the other end of the fourth resistor is connected with a K1 signal end, and the other end of the second capacitor, the other end of the first resistor and the emitter of the first triode are all grounded.
In the switch impact testing device, the switch unit comprises a first relay, a second relay, a fifth resistor, a sixth resistor, a first diode and a second diode; the 1 st pin of the first relay is connected with the N _ IN signal end, the 2 nd pin of the first relay and one end of the fifth resistor are grounded, the other end of the fifth resistor is connected with the anode of the first diode, the cathode of the first diode is connected with the 3 rd pin of the first relay IN an electric connection mode, and the 4 th pin of the first relay is connected with the N _ OUT signal end; the 1 st pin of the second relay is connected with an L _ IN signal end, the 2 nd pin of the second relay and one end of the sixth resistor are all grounded, the other end of the sixth resistor is connected with the anode of the second diode, the cathode of the second diode and the 3 rd pin of the second relay are connected with the power supply, and the 4 th pin of the second relay is connected with an L _ OUT signal end.
In the switch impact testing device, the signal output module comprises a third triode, a fourth triode, a fifth triode, a sixth triode, a seventh triode, an eighth triode, a seventh resistor, an eighth resistor, a ninth resistor, a tenth resistor, an eleventh resistor and a twelfth resistor; one end of the seventh resistor is connected with a STB0 signal end, the other end of the seventh resistor is connected with the base electrode of the third triode and the base electrode of the fourth triode, one end of the eighth resistor is connected with the power supply, the other end of the eighth resistor is connected with the collector electrode of the fourth triode, the emitter electrode of the fourth triode and the emitter electrode of the third triode are both connected with the STB signal end, and the collector electrode of the third triode is grounded; one end of the ninth resistor is connected with an ENA0 signal end, the other end of the ninth resistor is connected with the base electrode of the fifth triode and the base electrode of the sixth triode, one end of the tenth resistor is connected with electricity, the other end of the tenth resistor is connected with the collector electrode of the sixth triode, the emitter electrode of the sixth triode and the emitter electrode of the fifth triode are both connected with the ENA signal end, and the collector electrode of the fifth triode is grounded; one end of the eleventh resistor is connected with an ADJ0 signal end, the other end of the eleventh resistor is connected with the base electrode of the seventh triode and the base electrode of the eighth triode, one end of the twelfth resistor is connected with the power supply, the other end of the twelfth resistor is connected with the collector electrode of the eighth triode, the emitter electrode of the eighth triode and the emitter electrode of the seventh triode are both connected with an ENA signal end, and the collector electrode of the seventh triode is grounded.
The switch impact testing device further comprises a power supply module, and the power supply module supplies electric energy to the control module, the switch module, the signal output module, the parameter adjusting module and the recording module.
In the switch impact testing device, the power supply module comprises a first power supply unit and a second power supply unit, and the first power supply unit provides a first power supply voltage for the switch module and the recording module and provides a second power supply voltage for the display module; the second power supply unit provides a third power supply voltage for the control module and the recording module.
In the switch impact testing device, the working parameters include the on time of the switch module, the off time of the switch module, the interval time of each test signal output and the time period length before and after the abnormal occurrence of the equipment to be tested.
The switch impact testing system comprises an upper computer and further comprises the switch impact testing device, wherein the switch impact testing device feeds working parameters and working state information back to the upper computer through a control module.
Compared with the prior art, the invention discloses a switch impact testing device and a system, wherein the switch impact testing device is connected with equipment to be tested and an upper computer and comprises a control module, a switch module, a signal output module, a parameter adjusting module and a recording module; after the power is on, the parameter adjusting module sets working parameters according to control instructions, and the control module outputs corresponding control signals according to the working parameters to control the on-off state of the switch module and outputs a plurality of corresponding test signals to the signal output module; the signal output module amplifies the test signal and outputs the amplified test signal to the device to be tested; the recording module records the working state information of the equipment to be tested when the equipment to be tested works abnormally in the on-off state and outputs the working state information to the control module; the control module feeds back the working parameters and the working state information to the upper computer; the invention can realize automatic power-on and power-off impact test, provide various control signals for the equipment to be tested and improve the test efficiency.
Drawings
FIG. 1 is a block diagram of a switch impact test system according to the present invention;
FIG. 2 is a schematic circuit diagram of a driving unit in the switch impact testing apparatus according to the present invention;
fig. 3 and 4 are schematic circuit diagrams of a switching unit in the switching surge testing apparatus provided in the present invention;
FIG. 5 is a schematic circuit diagram of a control module in the switch impact testing apparatus according to the present invention;
fig. 6, 7 and 8 are schematic circuit diagrams of a signal output module in the switch impact testing apparatus according to the present invention;
fig. 9 is a schematic circuit diagram of a first power supply unit in the switching surge testing apparatus provided in the present invention;
fig. 10 is a schematic circuit diagram of a second power supply unit in the switching surge testing apparatus provided in the present invention;
fig. 11 is a schematic diagram of a working process of the switching impact testing system provided by the present invention.
Detailed Description
The invention provides a startup and shutdown impact test device and system, which can perform automatic startup and shutdown impact test, provide various control signals for equipment to be tested, and record state information of the equipment to be tested when the equipment to be tested is abnormal in real time so as to facilitate subsequent abnormal problem analysis.
In order to make the objects, technical solutions and effects of the present invention clearer and clearer, the present invention is further described in detail below with reference to the accompanying drawings and examples. It should be understood that the specific embodiments described herein are merely illustrative of the invention and are not intended to limit the invention.
The on-off impact test device and the on-off impact test system provided by the invention are suitable for power switch impact tests of equipment such as televisions, display screens and the like, and can also be applied to power switch impact test automatic test items of electronic products such as computers, lighting products and electric cookers.
Referring to fig. 1, the switch impact test system provided by the present invention includes an upper computer 10 and a switch impact test device 20, wherein the switch impact test device 20 is connected to a device to be tested and the upper computer 10, and includes a control module 100, a switch module 200, a signal output module 300, a parameter adjusting module 400 and a recording module 500; the switch module 200, the signal output module 300, the parameter adjusting module 400, and the recording module 500 are all connected to the control module 100, and it should be noted that in this embodiment, the device to be tested is a television.
After the switch impact test system is powered on, the control module 100 performs initialization setting, and performs a switch impact test on the television according to a preset program; in the testing process, a user can input a control instruction through the parameter adjusting module 400, the parameter adjusting module 400 sets the working parameter according to the control instruction, and the control module 100 outputs a corresponding control signal according to the working parameter to control the on-off state of the switch module 200 and outputs a corresponding test signal to the signal output module 300; the switching on and off of the switching module 200 is equivalent to controlling the turning on and off of the television, the switching on and off of the switching module 200 is controlled by the control module 100, the control on the turning on and off of the television is realized, the continuous turning on and off of the television can be completed, and then the switching impact test of the television is realized by observing whether the television can normally work in the continuous turning on and off process.
Meanwhile, the signal output module 300 amplifies the test signal and outputs the amplified test signal to the device to be tested; the signal output module 300 is used to enhance the strength of the test signal, provide a control signal required by the test for the device to be tested, and improve the test efficiency and the reliability of the switch impact testing apparatus 20, in this embodiment, the test signal may be an STB signal, an ENA signal, and an ADJ signal; the recording module 500 records the working state information of the device under test when the device under test is abnormal in operation in the power on/off state, and outputs the working state information to the control module 100, where the working state information in this embodiment is the display information of the display screen in the television, and when the television is abnormal in operation in the continuous power on/off state, the image display information of the display screen of the television will be abnormal, and the control module 100 will correspondingly control and drive the recording module 500 to record the image display information and obtain the image display information; the control module 100 feeds back the working parameters and the working state information to the upper computer 10 so as to facilitate the analysis of subsequent abnormal problems.
Further, please continue to refer to fig. 1, the switch impact testing apparatus 20 further includes a display module 600, and the display module 600 is connected to the control module 100; control module 100 still will operating parameter with operating condition information output extremely display module 600 makes display module 600 shows operating parameter with operating condition information, control module 100 acquires operating parameter with after the operating condition information of TV set, can export it to display module 600 and correspond the demonstration to it is current to be convenient for audio-visual understanding switch module 200 with the operating condition of TV set is convenient for real-time supervision test status.
Further, referring to fig. 2, fig. 3 and fig. 4, the switch module 200 includes a driving unit 210 and a switch unit 220, the driving unit 210 is connected to the control module 100, and the switch unit 220 is connected to the driving unit 210; the driving unit 210 outputs a driving signal to the switch unit 220 according to the control signal, the switch unit 220 is turned on or off according to the driving signal, the turning on and off of the switch unit 220 controls the turning on and off of the television, and the control module 100 controls the driving unit 210 to drive the turning on and off of the switch unit 220 according to a preset program, so that the switching impact test of the television is realized.
Further, referring to fig. 5, the control module 100 includes a control chip U1, the control chip U1 communicates with the switch module 200 and the recording module 500 through a GPIO interface, communicates with the upper computer 10 through an RS485 interface, meanwhile, the GPIO interface in the control chip U1 is used for detecting whether the work of the device to be tested is abnormal or not, when the device to be tested works abnormally, namely the television is tested to be abnormal, the GPIO interface is in a low level state, the control chip U1 will control the switch module 200 to turn off according to the low level, stop the switch impact test, at the same time, the recording module 500 is controlled to record the current picture display information of the display screen in the television, the image display information is acquired and output to the display module 600 through the RS485 interface for display, so that the test state and the analysis of subsequent abnormal problems can be conveniently and visually connected; when the television works normally, the GPIO interface is in a high level state, and the control chip U1 controls the switch module 200 to be switched on to enter normal test work; in this embodiment, the model of the control chip U1 is STM32F103VET6, and in other embodiments, a control chip U1 having the same function may also be selected, which is not limited in this embodiment, a storage unit integrated in the control chip U1 communicates through an I2C protocol, so that power-down protection for setting working parameters by a user can be realized, the control chip U1 realizes reading and writing of an SD memory integrated therein through an SPI communication protocol, and working state information recorded by the recording module 500 is stored in an SD card, so that problem analysis is performed subsequently according to the stored working state information.
Further, the parameter adjusting module 400 includes an adjusting button and three switch buttons, which are respectively K1, K2 and K3, in this embodiment, the operating parameters include the on-time of the switch module 200, the off-time of the switch module 200, and the interval time of each test signal output, clockwise and counter-clockwise rotation of the adjustment button effects an increase and a decrease respectively of the operating parameter, the switch key K1 realizes the selection of settable parameters, the switch key K2 controls the switch impact test system to run and stop running, the switch key K3 is used for setting the display content of the display module 600 to turn pages, therefore, a user can adjust the working parameters by controlling the adjusting button and the switch key, the intellectualization of system testing is realized, the testing efficiency is improved, and the product performance is optimized.
Further, the recording module 500 includes a camera, a motor and a motor driving chip, the camera is connected to the control chip U1 and the motor, the motor is connected to the motor driving chip, the motor driving chip is further connected to the control chip U1, after the system is powered on, the control chip U1 correspondingly controls the motor driving chip to drive the motor to rotate, so as to control the camera to rotate, so that the camera is located at an optimal shooting position, when the television is abnormal, abnormal picture display information is shot, and then the camera outputs the picture display information to the control chip U1, and feeds back the picture display information to the upper computer 10 and the display module 600, so as to perform subsequent abnormal problem analysis; meanwhile, the accuracy of obtaining abnormal information is ensured, and the practicability of the product and the efficiency of testing are improved; in this embodiment, the model of the motor driving chip is L298, but in other embodiments, a motor driving chip with the same function may be selected, which is not limited in the present invention.
Further, with reference to fig. 2, the driving unit 210 includes a first transistor Q1, a second transistor Q2, a first resistor R1, a second resistor R2, a third resistor R3, a fourth resistor R4, a first capacitor C1, and a second capacitor C2; a base electrode of the second triode Q2 is connected with one end of the second resistor R2, one end of the third resistor R3 and one end of the first capacitor C1, and a collector electrode of the second triode Q2, the other end of the third resistor R3 and the other end of the first capacitor C1 are electrically connected; the other end of the second resistor R2 is connected with the collector of the first triode Q1, the collector of the second triode Q2 is connected with electricity, the base of the first triode Q1 is connected with one end of the first resistor R1, one end of the second capacitor C2 and one end of the fourth resistor R4, the other end of the fourth resistor R4 is connected with the signal end of the K1, the other end of the second capacitor C2, the other end of the first resistor R1 and the emitter of the first triode Q1 are all grounded, the control chip U1 controls the driving unit 210 to drive the switching unit 220 to be switched on or switched off according to the working parameters set by the user, and further the switch impact test of the television is realized.
Further, with continuing reference to fig. 3 and 4, the switch unit 220 includes the switch unit 220 including a first relay M1, a second relay M2, a fifth resistor R5, a sixth resistor R6, a first diode D1 and a second diode D2; the 1 st pin of the first relay M1 is connected with the N _ IN signal terminal, the 2 nd pin of the first relay M1 and one end of the fifth resistor R5 are grounded, the other end of the fifth resistor R5 is connected with the anode of the first diode D1, the cathode of the first diode D1 and the 3 rd pin of the first relay M1 are connected with power, and the 4 th pin of the first relay M1 is connected with an N _ OUT signal terminal; l _ IN signal end is connected to second relay M2's 1 st foot, second relay M2's 2 nd foot with the one end of sixth resistance R6 is all ground connection, the other end of sixth resistance R6 is connected the positive pole of second diode D2, the negative pole of second diode D2 with second relay M2's 3 rd foot connects the electricity, L _ OUT signal end is connected to second relay M2's 4 th foot, switch unit 220 is two relays, and the switching on and closing through control relay realize the start and the shutdown control of TV set have improved test system's test efficiency.
Further, referring to fig. 6, 7 and 8, the signal output module 300 includes a third transistor Q3, a fourth transistor Q4, a fifth transistor Q5, a sixth transistor Q6, a seventh transistor Q7, an eighth transistor Q8, a seventh resistor R7, an eighth resistor R8, a ninth resistor R9, a tenth resistor R10, an eleventh resistor R11 and a twelfth resistor R12; one end of the seventh resistor R7 is connected to a STB0 signal end, the other end of the seventh resistor R7 is connected to the base of the third transistor Q3 and the base of the fourth transistor Q4, one end of the eighth resistor R8 is connected to power, the other end of the eighth resistor R8 is connected to the collector of the fourth transistor Q4, the emitter of the fourth transistor Q4 and the emitter of the third transistor Q3 are both connected to an STB signal end, and the collector of the third transistor Q3 is grounded; one end of the ninth resistor R9 is connected to an ENA0 signal end, the other end of the ninth resistor R9 is connected to the base of the fifth triode Q5 and the base of the sixth triode Q6, one end of the tenth resistor R10 is electrically connected, the other end of the tenth resistor R10 is connected to the collector of the sixth triode Q6, the emitter of the sixth triode Q6 and the emitter of the fifth triode Q5 are both connected to the ENA signal end, and the collector of the fifth triode Q5 is grounded; one end of the eleventh resistor R11 is connected with the signal end of the ADJ0, the other end of the eleventh resistor R11 is connected with the base electrode of the seventh triode Q7 and the base electrode of the eighth triode Q8, one end of the twelfth resistor R12 is connected with power, the other end of the twelfth resistor R12 is connected with the collector of the eighth triode Q8, an emitter of the eighth transistor Q8 and an emitter of the seventh transistor Q7 are both connected to an ENA signal terminal, the collector of the seventh triode Q7 is grounded, after the power is turned on, the control chip U1 outputs various test signals, the test signals in this embodiment are STB signals, ENA signals and ADJ signals, and each test signal is output through a totem pole circuit formed by the triodes in the signal output module 300, so that the strength of each test signal is enhanced, and the test requirements of the external control signal to-be-tested device can be met.
Further, please continue to refer to fig. 1, the switch impact testing apparatus 20 further includes a power supply module 700, the power supply module 700 is respectively connected to the switch module 200, the control module 100, the signal output module 300, the parameter adjusting module 400 and the recording module 500, and the power supply module 700 provides electric energy for the control module 100, the switch module 200, the signal output module 300, the parameter adjusting module 400 and the recording module 500, so as to ensure normal operation of each module after power-on.
Further, referring to fig. 9 and 10, the power supply module 700 includes a first power supply unit 710 and a second power supply unit 720, wherein the first power supply unit 710 provides a first power supply voltage for the first relay M1, the second relay M2 and the motor, and provides a second power supply voltage for the display module 600; the second power supply unit 720 provides a third power supply voltage for the control chip U1 and the camera, in this embodiment, the first voltage is 12V, the second voltage is 5V, the third voltage is 3.3V, different voltages are provided according to different modules, and the stability of the operation of each module is ensured.
Further, with reference to fig. 9, the first power supply unit 710 includes a third capacitor C3, a fourth capacitor C4, a fifth capacitor C5, a sixth capacitor C6, a seventh capacitor C7, a third diode D3, a fourth diode D4, a fifth diode D5, a transformer T1, a photocoupler U2, a reference voltage source U11, a thirteenth resistor R13, a fourteenth resistor R14, a fifteenth resistor R15, a sixteenth resistor R16, a seventeenth resistor R17, an eighteenth resistor R18, a MOS transistor Q9, a rectifier bridge and a flyback power control chip, wherein one end of the third capacitor C3 and the 1 st pin of the transformer T1 are connected to the 1 st pin of the rectifier bridge, the other end of the third capacitor C3 and the 4 th pin of the rectifier bridge are grounded, the 2 nd pin of the rectifier bridge is connected to L, the 4 th pin of the zero line bridge is connected to the N, and the positive pole of the transformer T1 is connected to the positive diode 3, the negative electrode of the third diode D3 and one end of the fourth capacitor C4 are both connected to a VCC signal terminal and the flyback power control chip, the other end of the fourth capacitor C4 is grounded, the 3 rd pin of the transformer T1 is connected to the drain of the MOS transistor Q9, the source of the MOS transistor Q9 is connected to a CS signal terminal and the flyback power control chip and is grounded through the eighteenth resistor R18, the Gate of the MOS transistor Q9 is connected to a Gate signal terminal and the flyback power control chip, the 10 th pin of the transformer T1 is connected to the positive electrode of the fourth diode D4, the negative electrode of the fourth diode D4 and one end of the fifth capacitor C5 are connected to power, the other end of the fifth capacitor C5 is connected to the 9 th pin of the transformer T1, the 7 th pin of the transformer T1 is connected to the positive electrode of the sixth diode D6, the negative electrode of the sixth diode D6 and one end of the sixth capacitor C6 are connected to the positive electrode of the sixth capacitor C7, the other end of the sixth capacitor C6 is grounded; a pin 1 of the photocoupler U2 is connected to the flyback power control chip, a pin 4 of the photocoupler U2 is connected to one end of the fifteenth resistor R15 and one end of the sixteenth resistor R16, the other end of the sixteenth resistor R16 and one end of the fourteenth resistor R14 are electrically connected, the other end of the fifteenth resistor R15 is connected to a pin 3 of the photocoupler U2, one end of the seventh capacitor C7 and a cathode of the reference voltage source U11, the other end of the seventh capacitor C7 is connected to one end of the seventeenth resistor R17, the other end of the seventeenth resistor R17 is connected to the other end of the fourteenth resistor R14, one end of the thirteenth resistor R13 and a control end of the reference voltage source U11, an anode of the reference voltage source U11 and the other end of the thirteenth resistor R13 are grounded, the first power supply unit 710 outputs a 12V and 5V supply voltages after the commercial power is converted, the first relay M1, the second relay M2, the motor and the display module 600 are respectively supplied with power, ensuring stable operation of the respective parts.
Further, please refer to fig. 10, the second power supply unit 720 includes a voltage regulator U3, an eighth capacitor C8 and a ninth capacitor C9, the 1 st pin of the voltage regulator U3 and one end of the eighth capacitor C8 are grounded, the 3 rd pin of the voltage regulator U3 and the other end of the eighth capacitor C8 are grounded, the 4 th pin of the voltage regulator U3 and one end of the ninth capacitor C9 are grounded, the other end of the ninth capacitor C9 is grounded, and the second power supply unit 720 outputs a 3.3V power supply voltage to supply power to the camera and the control chip U1, so as to ensure stable operation of the camera and the control chip U1. In this embodiment, the model of the voltage regulator U3 is AS1117L, but in other embodiments, the voltage regulator U3 having the same function may be selected, which is not limited in the present invention.
For better understanding of the working principle of the switch impact testing system provided by the present invention, please refer to fig. 11, and the working process of the switch impact testing system provided by the present invention will be described in detail according to the application embodiment:
after the switch impact test system is powered on, the control chip U1 enters a working state after being powered on and initialized, and the control chip U1 correspondingly controls the conducting state of the switch unit 220 and the output of test signals according to the working states of an adjusting button and switch keys K1, K2 and K3 in the parameter adjusting module 400; when the switch key K1 is pressed for 1 time, the system is switched to the 1 st parameter setting page; when the switch key K1 is pressed for 2 times, the system is switched to the 2 nd parameter setting page; incrementing to N by times until the nth parameter setting page; when the switch key K1 is pressed for N +1 times, returning to the 1 st parameter setting page; when the K3 is pressed 1 time, the display module 600 of the system displays the 1 st parameter display page; when the switch key K3 is pressed for 2 times, the display module 600 of the system switches to the 2 nd parameter display page; incrementing to N by times until the Nth parameter displays the page; when K3 is pressed N +1 times, the page returns to the 1 st parameter display page, and the switch key K2 alternately presses the corresponding system to run and stop.
When the system enters an on-time T1 setting item, the control chip U1 judges whether the adjusting button rotates clockwise, if so, the on-time T1 is increased, namely the control chip U1 controls the on-time of the switch unit 220 during switch impact test to be increased, otherwise, the control chip U1 continuously judges whether the adjusting button rotates anticlockwise, if so, the on-time T1 is decreased, otherwise, whether the adjusting button is pressed is continuously judged, if the adjusting button is not pressed, the updating of the next parameter is not shown, and if the adjusting button is pressed, the adjusting button is switched to a next parameter setting page, namely a setting page of the off-time T2 of the switch unit 220; then, the control chip U1 determines whether the adjustment button rotates clockwise, if so, the off time T2 increases, that is, the control chip U1 controls the off time of the switch unit 220 during the switch impact test to increase, otherwise, it continues to determine whether the adjustment button rotates counterclockwise, if so, the off time T2 decreases, otherwise, it continues to determine whether the adjustment button is pressed, if not, it does not indicate that there is no next parameter update, and if so, it switches to the next parameter setting page, that is, the setting page of the interval time T3 of the test signal output; similarly, the control chip U1 then determines whether the adjustment button rotates clockwise, if so, the interval time T3 increases, that is, the interval time of each test signal output increases, otherwise, it continues to determine whether the adjustment button rotates counterclockwise, if so, the interval time T3 decreases, otherwise, it continues to determine whether the adjustment button is pressed, if the adjustment button is not pressed, it does not indicate that there is no next parameter update, if the adjustment button is pressed, it switches to the next parameter setting page, the parameter after the interval time T3 in this embodiment is the time period length T4 before and after the device under test is abnormal, that is, after the interval time T3 is adjusted, it continues to adjust the time period length T4 before and after the abnormal occurs, and also, the control chip U1 determines whether the adjustment button rotates clockwise, if so, increasing the time period length T4 before and after the abnormality occurs, otherwise, continuously judging whether the adjusting button rotates anticlockwise, if so, reducing the time period length T4 before and after the abnormality occurs, and if not, operating the system by default operating parameters.
The invention also provides a switch impact testing device, which is not described in detail herein because the switch impact testing device is described in detail above.
In summary, the invention provided by the invention discloses a switch impact testing device and a system, wherein the switch impact testing device is connected with a device to be tested and an upper computer, and comprises a control module, a switch module, a signal output module, a parameter adjusting module and a recording module; after the power is on, the parameter adjusting module sets working parameters according to control instructions, and the control module outputs corresponding control signals according to the working parameters to control the on-off state of the switch module and outputs a plurality of corresponding test signals to the signal output module; the signal output module amplifies the test signal and outputs the amplified test signal to the device to be tested; the recording module records the working state information of the equipment to be tested when the equipment to be tested works abnormally in the on-off state and outputs the working state information to the control module; the control module feeds back the working parameters and the working state information to the upper computer; the invention can realize automatic power-on and power-off impact test, provide various control signals for the equipment to be tested and improve the test efficiency.
It should be understood that equivalents and modifications of the technical solution and inventive concept thereof may occur to those skilled in the art, and all such modifications and alterations should fall within the scope of the appended claims.
Claims (10)
1. A switch impact testing device is connected with equipment to be tested and an upper computer and is characterized by comprising a control module, a switch module, a signal output module, a parameter adjusting module and a recording module; after the power is on, the parameter adjusting module sets working parameters according to control instructions, and the control module outputs corresponding control signals according to the working parameters to control the on-off state of the switch module and outputs a plurality of corresponding test signals to the signal output module; the signal output module amplifies the test signal and outputs the amplified test signal to the device to be tested; the recording module records the working state information of the equipment to be tested when the equipment to be tested works abnormally in the on-off state and outputs the working state information to the control module; and the control module feeds back the working parameters and the working state information to the upper computer.
2. The switch impact test device of claim 1, further comprising a display module, wherein the control module further outputs the operating parameters and the operating state information to the display module such that the display module displays the operating parameters and the operating state information.
3. The switching surge testing device of claim 1, wherein the switching module comprises a drive unit and a switching unit; the driving unit outputs a driving signal to the switch unit according to the control signal, and the switch unit is switched on or off according to the driving signal.
4. The switching surge testing device of claim 3, wherein the driving unit comprises a first transistor, a second transistor, a first resistor, a second resistor, a third resistor, a fourth resistor, a first capacitor and a second capacitor; a base electrode of the second triode is connected with one end of the second resistor, one end of the third resistor and one end of the first capacitor, and a collector electrode of the second triode, the other end of the third resistor and the other end of the first capacitor are connected with electricity; the other end of the second resistor is connected with the collector of the first triode, the collector of the second triode is connected with electricity, the base of the first triode is connected with one end of the first resistor, one end of the second capacitor and one end of the fourth resistor, the other end of the fourth resistor is connected with a K1 signal end, and the other end of the second capacitor, the other end of the first resistor and the emitter of the first triode are all grounded.
5. The switching surge testing device of claim 4, wherein the switching unit comprises a first relay, a second relay, a fifth resistor, a sixth resistor, a first diode, and a second diode; a pin 1 of the first relay is connected with an N _ IN signal end, a pin 2 of the first relay and one end of a fifth resistor are grounded, the other end of the fifth resistor is connected with the anode of a first diode, the cathode of the first diode is connected with a pin 3 of the first relay IN an electric connection mode, and a pin 4 of the first relay is connected with an N _ OUT signal end; the 1 st pin of the second relay is connected with an L _ IN signal end, the 2 nd pin of the second relay and one end of the sixth resistor are all grounded, the other end of the sixth resistor is connected with the anode of the second diode, the cathode of the second diode and the 3 rd pin of the second relay are connected with the power supply, and the 4 th pin of the second relay is connected with an L _ OUT signal end.
6. The switching surge testing device of claim 1, wherein the signal output module comprises a third transistor, a fourth transistor, a fifth transistor, a sixth transistor, a seventh transistor, an eighth transistor, a seventh resistor, an eighth resistor, a ninth resistor, a tenth resistor, an eleventh resistor, and a twelfth resistor; one end of the seventh resistor is connected with a STB0 signal end, the other end of the seventh resistor is connected with the base electrode of the third triode and the base electrode of the fourth triode, one end of the eighth resistor is connected with the power supply, the other end of the eighth resistor is connected with the collector electrode of the fourth triode, the emitter electrode of the fourth triode and the emitter electrode of the third triode are both connected with the STB signal end, and the collector electrode of the third triode is grounded; one end of the ninth resistor is connected with an ENA0 signal end, the other end of the ninth resistor is connected with the base electrode of the fifth triode and the base electrode of the sixth triode, one end of the tenth resistor is connected with electricity, the other end of the tenth resistor is connected with the collector electrode of the sixth triode, the emitter electrode of the sixth triode and the emitter electrode of the fifth triode are both connected with the ENA signal end, and the collector electrode of the fifth triode is grounded; one end of the eleventh resistor is connected with an ADJ0 signal end, the other end of the eleventh resistor is connected with the base electrode of the seventh triode and the base electrode of the eighth triode, one end of the twelfth resistor is connected with the power supply, the other end of the twelfth resistor is connected with the collector electrode of the eighth triode, the emitter electrode of the eighth triode and the emitter electrode of the seventh triode are both connected with an ENA signal end, and the collector electrode of the seventh triode is grounded.
7. The switch impact test device of claim 2, further comprising a power supply module that provides power to the control module, the switch module, the signal output module, the parameter adjustment module, and the recording module.
8. The switch surge testing device of claim 7, wherein the power supply module comprises a first power supply unit and a second power supply unit, the first power supply unit providing a first power supply voltage for the switch module and the recording module and a second power supply voltage for the display module; the second power supply unit provides a third power supply voltage for the control module and the recording module.
9. The switching surge testing device according to claim 1, wherein the operating parameters include an on time of the switching module, an off time of the switching module, an interval time of each of the test signal outputs, and a time period length before and after an abnormality occurs in the device under test.
10. A switch impact test system comprises an upper computer and is characterized by further comprising the switch impact test device according to any one of claims 1 to 9, wherein the switch impact test device feeds back the working parameters and the working state information to the upper computer through the control module.
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| CN201911101256.0A CN110907723A (en) | 2019-11-12 | 2019-11-12 | Switch impact testing device and system |
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| CN201911101256.0A CN110907723A (en) | 2019-11-12 | 2019-11-12 | Switch impact testing device and system |
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Application publication date: 20200324 |