CN110869812B - 直接转换辐射探测 - Google Patents

直接转换辐射探测 Download PDF

Info

Publication number
CN110869812B
CN110869812B CN201880043457.7A CN201880043457A CN110869812B CN 110869812 B CN110869812 B CN 110869812B CN 201880043457 A CN201880043457 A CN 201880043457A CN 110869812 B CN110869812 B CN 110869812B
Authority
CN
China
Prior art keywords
cathode
radiation
direct conversion
light
conversion material
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
CN201880043457.7A
Other languages
English (en)
Chinese (zh)
Other versions
CN110869812A (zh
Inventor
R·斯特德曼布克
C·赫尔曼
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Koninklijke Philips NV
Original Assignee
Koninklijke Philips NV
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Koninklijke Philips NV filed Critical Koninklijke Philips NV
Publication of CN110869812A publication Critical patent/CN110869812A/zh
Application granted granted Critical
Publication of CN110869812B publication Critical patent/CN110869812B/zh
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/24—Measuring radiation intensity with semiconductor detectors

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Measurement Of Radiation (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
  • Light Receiving Elements (AREA)
CN201880043457.7A 2017-06-28 2018-06-21 直接转换辐射探测 Active CN110869812B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP17178401.0 2017-06-28
EP17178401.0A EP3422051A1 (en) 2017-06-28 2017-06-28 Direct conversion radiation detection
PCT/EP2018/066671 WO2019002103A1 (en) 2017-06-28 2018-06-21 DETECTION OF RADIATION BY DIRECT CONVERSION

Publications (2)

Publication Number Publication Date
CN110869812A CN110869812A (zh) 2020-03-06
CN110869812B true CN110869812B (zh) 2024-01-02

Family

ID=59253383

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201880043457.7A Active CN110869812B (zh) 2017-06-28 2018-06-21 直接转换辐射探测

Country Status (5)

Country Link
US (1) US11131780B2 (https=)
EP (2) EP3422051A1 (https=)
JP (1) JP7198782B2 (https=)
CN (1) CN110869812B (https=)
WO (1) WO2019002103A1 (https=)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN118837935B (zh) * 2024-09-20 2025-02-14 陕西迪泰克新材料有限公司 一种α粒子探测器

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1394567A2 (en) * 2002-08-30 2004-03-03 Shimadzu Corporation Radiation detector
JP2007278792A (ja) * 2006-04-05 2007-10-25 Canon Inc 放射線検出装置及び放射線検出システム
CN103548073A (zh) * 2011-05-25 2014-01-29 皇家飞利浦有限公司 用于表面的识别系统
CN104024889A (zh) * 2011-12-13 2014-09-03 皇家飞利浦有限公司 辐射探测器
CN105026958A (zh) * 2013-03-01 2015-11-04 皇家飞利浦有限公司 半导体辐射探测器

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7223981B1 (en) 2002-12-04 2007-05-29 Aguila Technologies Inc. Gamma ray detector modules
US7196334B2 (en) 2003-04-24 2007-03-27 Koninklijke Philips Electronics N.V. X-ray detector element
US20080016441A1 (en) 2006-01-06 2008-01-17 Tabin Joshua Z Method and Apparatus to Facilitate Altering a Presentation Order for Search Results
US7652258B2 (en) * 2007-01-08 2010-01-26 Orbotech Medical Solutions Ltd. Method, apparatus, and system of reducing polarization in radiation detectors
CN105717532B (zh) * 2007-04-12 2019-07-26 皇家飞利浦电子股份有限公司 闪烁体的空间增益分布的确定
JP2014519026A (ja) * 2011-05-11 2014-08-07 コーニンクレッカ フィリップス エヌ ヴェ 電離放射線の検出
US8824635B2 (en) 2011-10-27 2014-09-02 General Electric Company Detector modules for imaging systems and methods of manufacturing
DE102012213409B3 (de) * 2012-07-31 2014-11-13 Siemens Aktiengesellschaft Röntgenstrahlungsdetektor, CT-System und Verfahren hierzu
DE102012213411B4 (de) * 2012-07-31 2018-11-29 Siemens Healthcare Gmbh Verfahren zur Detektion von Röntgenstrahlung
CN104781695B (zh) 2012-11-09 2019-06-28 皇家飞利浦有限公司 用于探测器晶体的子带红外辐照
DE102014217904B4 (de) 2014-09-08 2016-03-31 Siemens Aktiengesellschaft Röntgenstrahlungsdetektor

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1394567A2 (en) * 2002-08-30 2004-03-03 Shimadzu Corporation Radiation detector
JP2007278792A (ja) * 2006-04-05 2007-10-25 Canon Inc 放射線検出装置及び放射線検出システム
CN103548073A (zh) * 2011-05-25 2014-01-29 皇家飞利浦有限公司 用于表面的识别系统
CN104024889A (zh) * 2011-12-13 2014-09-03 皇家飞利浦有限公司 辐射探测器
CN105026958A (zh) * 2013-03-01 2015-11-04 皇家飞利浦有限公司 半导体辐射探测器
JP2016510111A (ja) * 2013-03-01 2016-04-04 コーニンクレッカ フィリップス エヌ ヴェＫｏｎｉｎｋｌｉｊｋｅ Ｐｈｉｌｉｐｓ Ｎ．Ｖ． 検出器

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
半导体量子点集成有机发光二极管的光光转换器进展;杨宇等;《红外技术》(第10期);599-606 *

Also Published As

Publication number Publication date
EP3646063A1 (en) 2020-05-06
US11131780B2 (en) 2021-09-28
CN110869812A (zh) 2020-03-06
JP7198782B2 (ja) 2023-01-04
US20200183023A1 (en) 2020-06-11
EP3422051A1 (en) 2019-01-02
JP2020525768A (ja) 2020-08-27
WO2019002103A1 (en) 2019-01-03
EP3646063B1 (en) 2024-08-21

Similar Documents

Publication Publication Date Title
US7956332B2 (en) Multi-layer radiation detector assembly
EP2751596B1 (en) Photon counting detector
CN103562746B (zh) 电离辐射探测
JP5697982B2 (ja) 複数の変換層を持つ放射線検出器、ｘ線検出器および画像形成システム
CN102401906B (zh) 辐射探测器及其成像装置、电极结构和获取图像的方法
NL2008201C2 (en) Detector systems with anode incidence face and methods of fabricating the same.
US11147522B2 (en) Photon counting detector and x-ray computed tomography apparatus
US7816651B2 (en) High detective quantum efficiency X-ray detectors
JP2010513908A (ja) エネルギー分解検出システム及び撮像システム
US20160206255A1 (en) Hybrid passive/active multi-layer energy discriminating photon-counting detector
US20160116612A1 (en) Radiation detection apparatus and method of driving the same
RU2567436C2 (ru) Детектор излучения с направляющими электродами
CN110869812B (zh) 直接转换辐射探测
US20190049601A1 (en) Nano-material imaging detector with an integral pixel border
US12588878B2 (en) X-ray detector and radiographic X-ray apparatus
US20160245932A1 (en) Radiation detector and detection method having reduced polarization
EP2757389A2 (en) High resolution x-ray imaging with thin, flexible digital sensors
US12588879B2 (en) Radiation detection apparatus, sensor module, and CT apparatus
US20240142644A1 (en) Radiation detection apparatus, method for manufacturing same, sensor module, and ct apparatus
JP2020525768A5 (https=)

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
GR01 Patent grant
GR01 Patent grant