CN110868154A

CN110868154A - Photovoltaic module's withstand voltage testing arrangement

Info

Publication number: CN110868154A
Application number: CN201810990360.9A
Authority: CN
Inventors: 何健; 叶伟中
Original assignee: Guangdong Hanergy Thin Film Solar Co Ltd
Current assignee: Dongjun New Energy Co Ltd
Priority date: 2018-08-28
Filing date: 2018-08-28
Publication date: 2020-03-06

Abstract

The utility model provides a photovoltaic module's withstand voltage testing arrangement, it includes: a plurality of clamps adapted to and electrically connected to edges of the photovoltaic module, the plurality of clamps for securing the photovoltaic module; and the test part is electrically connected with the clamps, the plurality of clamps comprise at least one convex clamp, the photovoltaic module comprises a chip-free area, and the convex clamp is used for crossing the chip-free area of the photovoltaic module and is matched and abutted with the edge of the photovoltaic module chip.

Description

Photovoltaic module's withstand voltage testing arrangement

Technical Field

The utility model belongs to the technical field of solar cell, it relates to a photovoltaic module's withstand voltage testing arrangement.

Background

Energy conservation is currently the focus of the world's greatest concern. In order to save energy, all countries in the world develop photovoltaic products vigorously and are increasingly diversified. In particular, solar photovoltaic modules (such as solar thin film power generation tiles) are increasingly widely used. After the solar power generation module is manufactured, it needs to be subjected to an insulation withstand voltage test.

Generally, whether the photovoltaic module is electrically leaked and the sealing is good is detected by controlling a jig for testing to abut against the photovoltaic module to be tested and electrically connecting the photovoltaic module to a testing part of a testing apparatus. However, the existing testing technologies are only suitable for testing the photovoltaic module with the chip region at each edge, and no technology for performing the insulation withstand voltage test on the photovoltaic module with the chip-free region at least one edge has appeared.

Disclosure of Invention

The present disclosure has been made to at least partially solve the above-mentioned technical problems occurring in the prior art, and the present disclosure provides a withstand voltage testing apparatus of a photovoltaic module, which performs a withstand voltage test of the photovoltaic module by projecting a jig across a chip-free region into contact with a contact surface of a frontmost chip.

According to an aspect of the present disclosure, there is provided an insulation withstand voltage test apparatus of a photovoltaic module, including: a plurality of clamps adapted to and electrically connected to edges of the photovoltaic module, the plurality of clamps for securing the photovoltaic module; and a testing part for testing the position of the test part,

the test part is electrically connected with the clamp; the plurality of clamps comprise at least one convex clamp, the photovoltaic module comprises a chip-free area, and the convex clamp is used for spanning the chip-free area of the photovoltaic module and is matched and abutted with the edge of the photovoltaic module chip.

Optionally, the insulation and voltage withstand testing device of the photovoltaic module further comprises a driving part, wherein an output end of the driving part is connected with the plurality of clamps and used for driving the clamps to clamp or loosen the photovoltaic module.

Optionally, the convex fixture includes a connecting portion and a protruding portion, a first end of the connecting portion is connected to a first end of the protruding portion, a second end of the connecting portion is connected to the driving portion, the connecting portion spans across the non-chip region of the photovoltaic module and clamps the photovoltaic module, and a second end of the protruding portion is adapted to abut against an edge of the chip of the photovoltaic module.

Optionally, the connecting portion includes a first connecting member and a second connecting member, a first end of the first connecting member is connected to a first end of the second connecting member, a second end of the first connecting member is connected to a first end of the protruding portion, a second end of the second connecting member is connected to the driving portion, the first connecting member spans across a chip-free region of the photovoltaic module, and the second connecting portion is used for clamping the photovoltaic module.

Optionally, the jig includes an insulating plate and a conductive layer disposed on the insulating plate and electrically connected to an edge of the photovoltaic module, and the insulating plate is connected to the driving part.

Optionally, the clamp further includes an insulating elastic layer disposed between the insulating plate and the conductive layer.

Optionally, the photovoltaic module is a curved photovoltaic module, and the second end of the protruding portion is adapted to the curved surface of the curved photovoltaic module.

Optionally, one end of the curved photovoltaic module is provided with a non-chip region, and the plurality of clamps further include a planar clamp, and the planar clamp is adapted to and electrically connected with the other end edge of the photovoltaic module.

Optionally, the plane fixture comprises a first plane fixture, a second plane fixture and a third plane fixture, the second plane fixture is arranged opposite to the convex fixture, the first plane fixture and the third plane fixture are arranged opposite to each other, and the first plane fixture, the second plane fixture, the third plane fixture and the convex fixture enclose a rectangle.

Optionally, the insulation and voltage resistance testing device of the photovoltaic module further comprises a test bench, wherein the test bench is used for placing the photovoltaic module; the test bench is provided with a rolling piece, and the rolling piece is used for driving the photovoltaic module to flexibly slide on the test bench.

In the insulation and voltage resistance testing device for the photovoltaic module, a plurality of clamps for fixing the photovoltaic module are matched with and electrically connected with the edge of the photovoltaic module, the clamps comprise at least one convex clamp, the convex clamp is used for crossing a non-chip area of the photovoltaic module and is abutted to the edge of a chip of the photovoltaic module, and then whether the solar photovoltaic module leaks electricity and is sealed well or not is detected through a testing part (for example, a tester), so that the insulation and voltage resistance testing of the photovoltaic module is realized.

Drawings

Fig. 1A shows a schematic representation of a solar photovoltaic module.

Fig. 1B shows a cross-sectional view taken along line a-a in fig. 1A.

Fig. 2 is a schematic structural diagram showing an insulation and voltage resistance test apparatus of a photovoltaic module according to example 1 of the present invention.

Fig. 3 shows a schematic perspective view of a male jig according to embodiment 1 of the invention.

Fig. 4 shows a cross-sectional view taken along line B-B in fig. 3.

Fig. 5 shows a flowchart of a test method for performing a withstand voltage test on a solar photovoltaic module according to embodiment 2 of the present invention.

Fig. 6 shows a flow chart of a testing method for performing a withstand voltage test on a solar photovoltaic module according to a specific embodiment.

Fig. 7 shows a schematic view of a male jig clamping a photovoltaic module.

Fig. 8 shows a schematic view when four clamps are in a state of clamping the photovoltaic module.

In the figure: 100-a test device; 101-a test bench; 102-test wiring portion; 103-a test section; 104-a drive section; 105 a-male clamp; 105b,105 c-plane jig; 200-a photovoltaic module; 201-component wiring portion; 202-chip free area; 1051-a boss; 1052-an insulating plate; 1053-a conductive layer; 1054-insulating elastic layer; 1055-a linker; 1055 a-first connector; 1055 b-second connector.

Detailed Description

The technical solution of the present invention will be described clearly and completely with reference to the accompanying drawings, and it should be understood that the described embodiments are a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be obtained by a person skilled in the art without any inventive step based on the embodiments of the present invention, are within the scope of the present invention.

Fig. 1A shows a schematic representation of a solar photovoltaic module. As shown in fig. 1A, a region N on one side (upper side in the drawing) of the photovoltaic module near the edge is free from a chip (hereinafter referred to as a chip-free region). In the insulation and voltage resistance test of the photovoltaic module, the clamp in the prior art cannot abut against the chip region, so that the test result is inaccurate.

To the problem among the prior art, this disclosure provides a photovoltaic module's withstand voltage testing arrangement, it includes: a plurality of clamps adapted to and electrically connected to edges of the photovoltaic module, the plurality of clamps for securing the photovoltaic module; and a test portion electrically connected to the clamp; the plurality of clamps comprise at least one convex clamp, the photovoltaic module comprises a chip-free area, and the convex clamp is used for spanning the chip-free area of the photovoltaic module and is matched and abutted with the edge of the photovoltaic module chip.

The insulation and voltage resistance testing device of the photovoltaic module provided by the disclosure can execute accurate insulation and voltage resistance testing on the photovoltaic module with the non-chip area.

Example 1:

fig. 2 shows a schematic structural diagram of an insulation withstand voltage test apparatus (hereinafter simply referred to as "test apparatus") 100 of a photovoltaic module according to the present embodiment.

As shown in fig. 2, the test apparatus 100 includes a plurality of

male jigs

105a, 105b, and 105c (hereinafter, they may be collectively referred to as jigs 105 when not distinguished) for contacting the photovoltaic module under test during the test, which are fitted to and electrically connected to the edge of the photovoltaic module. A plurality of clamps 105 are used to secure the photovoltaic module 200. The testing apparatus 100 further includes a testing portion electrically connected to each of the clamps 105, for performing an insulation withstand voltage test on the photovoltaic module 200. The fixture 105 and the photovoltaic module 200 under test may be placed on the test rig 101. Among the clips 105, one side (the right side in fig. 2) of the male clip 105a has a shape corresponding to the wave shape of the photovoltaic module 200, and thus it is also referred to as the male clip 105a herein. Photovoltaic assembly 200 may include a chipless area. The male clip 105a fits against the edge of the chip of the photovoltaic assembly 200 across the no-chip region of the photovoltaic assembly 200. Each side of the

clamps

105b and 105c is generally planar and therefore is also referred to herein as a

planar clamp

105b and 105 c. The

planar fixtures

105b and 105c fit and electrically connect to the other end edges of the photovoltaic module 200 except for the edge corresponding to the chipless area.

The testing apparatus 100 may further include a driving part 104 for driving the clamps, and an output end of the driving part 104 is connected to the plurality of clamps 105 for driving the clamps 105 to clamp or unclamp the photovoltaic module 200. In the present embodiment, the plane jig 105c is provided to be fixed, and the male jig 105a and the two plane jigs 105b are provided to be movable by the driving of the driving section 104.

Fig. 3 shows a schematic perspective view of the male jig 105a according to the present embodiment. As shown in fig. 3, the male clamp 105a includes a boss 1051 and a connecting portion 1055. A first end of the connecting portion 1055 is connected to a first end of the protruding portion 1051, and a second end of the connecting portion is connected to the driving portion 104. In performing the test, the connection 1055 spans the chipless area 202 of the photovoltaic module 200 and clamps the photovoltaic module 200. The second end of the protruding portion 1051 is adapted to abut against the edge of the chip of the photovoltaic module 200. In one example, photovoltaic assembly 200 has a wave shape, and the lobes 1051 of male clip 105a have a shape that corresponds to the wave shape of photovoltaic assembly 200. Fig. 7 shows a schematic view when male clip 105a abuts an edge of a chip of photovoltaic assembly 200 in one example.

In the example shown in fig. 3, the connection 1055 includes a first connection 1055a and a second connection 1055 b. The first end of the first connector 1055a is connected to the first end of the second connector 1055 b. The second end of the first connector 1055a is connected to the first end of the boss 1051. The second end of the second link 1055b is connected to the driving portion 104. In performing the test, the first connector 1055a spans the chipless area of the photovoltaic module 200 and the second connector 1055b clamps the photovoltaic module 200. The configuration of the connecting portion 1055 shown in fig. 3 is merely exemplary and should not be construed as limiting the present invention.

Before the test starts, the male jig 105a is placed opposite the outer edge of the chipless area 202 of the photovoltaic module 200 (i.e. the left side of the photovoltaic module 200 in fig. 2), the fixed planar jig 105c is placed on the opposite side of the photovoltaic module 200 from the male jig 105a (the right side of the photovoltaic module in fig. 2), and the other two movable planar jigs 105b are placed on the remaining two sides of the photovoltaic module (the upper and lower sides of the photovoltaic module in fig. 2), respectively. During the test, the test portion 103 sends a driving signal to the driving portion 104, and the driving portion 104 drives the

convex clamps

105a and 105b respectively according to the driving signal, so that the convex clamps respectively abut against the corresponding edges of the photovoltaic module 200. At this time, the driving is stopped, and the photovoltaic module 200 is clamped by the jig 105, so that the test section 103 performs the next insulation and voltage resistance test operation.

Since the convex jig 105a is adapted to abut against the edge of the photovoltaic module chip, when it is moved toward the no-chip region 202 of the photovoltaic module 200 by the driving of the driving part 104, the convex portion 1051 can cross the no-chip region 202 of the photovoltaic module 200 by the movement of the convex jig 105a and be brought into close contact with the chip region by fitting its shape corresponding to the wave shape of the photovoltaic module. At this time, the driving is stopped so that the convex jig 105 is held in a position abutting against the chip region. Likewise, the driving of the remaining

planar jigs

105b and 105c is also stopped while they abut against the respective edges of the photovoltaic module 200, so that they are maintained at the current position. Fig. 8 is a schematic view showing a state in which each of the male clips 105a to 105c abuts a corresponding edge of the photovoltaic module 200 in one example. As shown in fig. 8, the flat jig 105c is disposed opposite to the male jig 105a, and two flat jigs 105b are disposed opposite to each other, and the male jig 105a, the flat jig 105c, and the other two flat jigs 105b enclose a rectangle. After that, the test section 103 stops driving, and the insulation withstand voltage test signal is applied to the photovoltaic module 200 through the test wiring section 102 (see fig. 2) electrically connected to the module wiring section 201 (see fig. 2) of the photovoltaic module 200.

The respective sizes of the convex portions 1051 of the male jig 105a can be appropriately set as needed, so that various photovoltaic modules different in the size of the no-chip region (i.e., the distance by which the chip region is recessed inward from the outer edge) can be measured.

The drive portion 104 may be any suitable drive component capable of actuating the clamp in accordance with a drive signal. In one particular embodiment, the drive portion 104 is a cylinder drive assembly. One cylinder driving assembly may be provided for each of the male jig 105a and the two movable flat jigs 105 b. Those skilled in the art will appreciate that the cylinder drive assembly can be connected to the corresponding clamp in any suitable manner known in the art.

In one example, the clip 105 includes an insulating plate 1052 and an electrically conductive layer 1053 disposed on the insulating plate 1052 and electrically connected to an edge of the photovoltaic assembly 200. The insulating plate 1052 is connected to the driving part 104. The clip 105 may also include an insulating resilient layer 1054 disposed between the insulating plate 1052 and the conductive layer 1053. Taking the male jig 105a as an example, fig. 4 shows a cross-sectional view of the male jig 105a of the present embodiment taken along the line B-B in fig. 3. As shown in fig. 4, male jig 105a includes an insulating plate 1052, a conductive layer 1053, and an insulating elastic layer 1054 sandwiched therebetween. In this example, the photovoltaic module is a curved photovoltaic module having a wave shape, and thus the cross section of the convex jig 105a shown in fig. 4 includes a wave-shaped profile corresponding to the curved photovoltaic module; in other words, the second end of the boss 1051 of the male clip 105a conforms to the curved surface of the curved photovoltaic module. During testing, conductive layer 1053 of male clip 105a faces photovoltaic module 200, and male clip 105a is held against photovoltaic module 200 by conductive layer 1053. In one embodiment, the conductive layer 1053 can be a copper mesh layer and the insulating resilient layer 1054 can be made of a flexible resilient material, such as foam.

Likewise, other

planar fixtures

105b,105c may also include an insulating plate 1052, a conductive layer 1053, and an insulating resilient layer 1054 sandwiched therebetween. Unlike the male jig 105a, their insulating plate, conductive layer and insulating elastic layer are formed to be planar. Since the insulating elastic layer 1054 is made of a flexible elastic material, the jig 105 can better grip the photovoltaic module 200 without a gap.

In one embodiment, rolling members may be further disposed on the testing platform 101, and the rolling members are used for driving the photovoltaic module 200 to flexibly slide on the testing platform 101. Those skilled in the art will appreciate that any suitable means known in the art may be used to provide the rolling elements on the test stand 101. In one example, the rolling member may comprise a rolling bead.

The testing device according to the embodiment can be used for carrying out insulation and voltage resistance testing on the solar photovoltaic module. The photovoltaic module to be tested can be a curved photovoltaic module, such as a three-curved pantile; more specifically, such as glass trilinear wave tiles. The photovoltaic module to be tested can also be other types of photovoltaic modules.

Example 2:

fig. 5 shows a flowchart of a test method for performing a withstand voltage test on a solar photovoltaic module according to the present embodiment.

The test method of the present embodiment may be implemented by a test apparatus as described in embodiment 1 of the present disclosure. As shown in fig. 5, the test method includes the following steps S501 to S505.

S501: the convex fixture is placed to correspond to the outer edge of the no-chip region of the photovoltaic module to be tested.

S502: and placing three plane clamps to respectively correspond to the other three outer edges of the photovoltaic component to be tested except the outer edge of the area without the chip.

As shown in fig. 2, the male jig 105a is placed to correspond to the outer edge of the no-chip region 202 of the photovoltaic module 200, i.e., to the left side of the photovoltaic module 200 in the drawing. Three

planar fixtures

105b and 105c are placed on the upper, lower and right sides of the photovoltaic module 200 in the drawing, respectively.

S503: the planar jig of the three planar jigs placed opposite to the male jig is fixed.

As shown in fig. 2, the flat jig 105c placed on the right side of the photovoltaic module 200 is fixed.

S504: and driving the convex clamp and two plane clamps except the fixed plane clamp in the three plane clamps to move so that the photovoltaic module to be tested is clamped by the clamps.

The test section 103 sends a drive signal to the drive section 104, and the drive section 104 drives the male jig 105a and the flat jig 105b, respectively, in accordance with the drive signal. Specifically, the driving section 104 drives the male jig 105a to the right and stops driving thereof to hold it at the current position while it abuts against the chip region across the no-chip region 202. Also, the driving part 104 drives the upper and lower plane jigs 105b to move toward the edges of the photovoltaic modules corresponding thereto, respectively, so as to abut against the photovoltaic modules 200, and then stops driving to hold them at the current position, thereby facilitating the next step of the withstand voltage test operation of the test part 103.

S505: and applying a test signal for testing the insulation and voltage resistance to the photovoltaic module to be tested.

After the photovoltaic module 200 is clamped by the clamp 105 through step S504, the test part 103 sends out a test signal for testing the insulation and voltage resistance to the module wiring part 201 of the photovoltaic module 200 through the test wiring part 102, and the photovoltaic module 200 is tested for the insulation and voltage resistance.

In one embodiment, in the driving step of S504, the convex jig 105a and the two movable flat jigs 105b may be driven to move by the air cylinder driving assembly in an air cylinder driving manner, so that the photovoltaic module 200 is clamped by the jigs 105.

When the photovoltaic module 200 has been clamped by the clamps 105, the driving is stopped, and each clamp 105 is positioned at the current position. In this way, it is ensured that the photovoltaic module 200 is not displaced during the test.

In one embodiment, as shown in fig. 6, before the step S504 of driving, a step S601 is further included: the module wire part 201 of the photovoltaic module 200 is electrically connected to the test wire part 102 so as to receive the test signal transmitted from the test part 103 through the test wire part 102.

In a specific embodiment, as shown in fig. 6, after the step S505 of applying the test signal, a step S602 is further included: the positioning of each clip 105 is released so that it no longer abuts against the photovoltaic module 200. After the dielectric withstand voltage test is completed, a signal for releasing the positioning can be sent to the driving part 104 through the testing part 103, and the operation of the driving part 104 on the clamps 105 makes them loose and no longer clamp the photovoltaic module 200. For example, each clamp 105 is moved a distance away from the edge of the photovoltaic module. Subsequently, the connection of the component wiring section 201 to the test wiring section 102 may be disconnected, so that the tested photovoltaic component 200 may be removed from the test bench 101.

Although some embodiments of the present invention have been described in detail above, it will be understood by those skilled in the art that the above embodiments are only intended to illustrate the present invention and not to limit the present invention. Any suitable modifications can be made within the spirit and scope of the disclosure. For example, the male clip need not have the particular configuration shown in fig. 3, so long as some portion thereof is formed into a shape that closely conforms to the wave shape of the photovoltaic module. For example, the driving method for each clamp is not limited to the air cylinder, and any other suitable driving method, such as motor driving, may be adopted. For example, each jig need not be constituted by only an insulating plate, a conductive layer, and an insulating elastic layer sandwiched therebetween, but may also be constituted by other suitable layers. In addition, the order between the respective steps in embodiment 2 is not necessarily exactly the same as described herein, and the order of the steps may be adjusted as long as there is no logical contradiction. For example, the clamps may be placed on the test stand after the module wiring portions of the photovoltaic module are electrically connected to the test wiring portions. Alternatively, one jig may be permanently fixed to the test table, followed by placing the other jigs, and when the withstand voltage test of a certain photovoltaic module is to be performed, the photovoltaic module is placed on the table and the module wiring portions thereof are electrically connected to the test wiring portions.

It is to be understood that the above embodiments are merely exemplary embodiments that are employed to illustrate the principles of the present disclosure, and that the present disclosure is not limited thereto. It will be apparent to those skilled in the art that various changes and modifications can be made therein without departing from the spirit and scope of the disclosure, and these are to be considered as the scope of the disclosure.

Claims

1. The utility model provides a photovoltaic module's withstand voltage testing arrangement which characterized in that includes:

a plurality of clamps adapted to and electrically connected to edges of the photovoltaic module, the plurality of clamps for securing the photovoltaic module; and

a test portion electrically connected to the clamp;

the plurality of clamps comprise at least one convex clamp, the photovoltaic module comprises a chip-free area, and the convex clamp is used for spanning the chip-free area of the photovoltaic module and is matched and abutted with the edge of the photovoltaic module chip.

2. The apparatus for testing voltage insulation and withstand voltage of a photovoltaic module according to claim 1, further comprising a driving portion, wherein an output end of the driving portion is connected to the plurality of clamps for driving the clamps to clamp or unclamp the photovoltaic module.

3. The apparatus according to claim 3, wherein the convex fixture comprises a connecting portion and a protruding portion, a first end of the connecting portion is connected to a first end of the protruding portion, a second end of the connecting portion is connected to the driving portion, the connecting portion spans over the no-chip region of the photovoltaic module and clamps the photovoltaic module, and a second end of the protruding portion is adapted to abut against an edge of the chip of the photovoltaic module.

4. The apparatus of claim 3, wherein the connecting portion comprises a first connecting member and a second connecting member, a first end of the first connecting member is connected to a first end of the second connecting member, a second end of the first connecting member is connected to a first end of the protrusion, a second end of the second connecting member is connected to the driving portion, the first connecting member spans over a non-chip region of the photovoltaic module, and the second connecting portion is configured to clamp the photovoltaic module.

5. The apparatus of claim 1, wherein the jig comprises an insulating plate and a conductive layer disposed on the insulating plate and electrically connected to the edge of the photovoltaic module, the insulating plate being connected to the driving part.

6. The apparatus for testing withstand voltage of a photovoltaic module according to claim 5, wherein the jig further comprises an insulating elastic layer disposed between the insulating plate and the conductive layer.

7. The apparatus of any one of claims 2-6, wherein the photovoltaic module is a curved photovoltaic module, and the second end of the protrusion is adapted to the curved surface of the curved photovoltaic module.

8. The apparatus of claim 7, wherein the curved photovoltaic module is provided with a chipless area at one end, and the plurality of clamps further comprises a planar clamp adapted to and electrically connected to the other end edge of the photovoltaic module.

9. The apparatus of claim 8, wherein the planar fixture comprises a first planar fixture, a second planar fixture and a third planar fixture, the second planar fixture is disposed opposite to the convex fixture, the first planar fixture and the third planar fixture are disposed opposite to each other, and the first planar fixture, the second planar fixture, the third planar fixture and the convex fixture enclose a rectangle.

10. The apparatus for testing voltage and insulation of a photovoltaic module according to claim 1, further comprising a test station for placing the photovoltaic module;

the test bench is provided with a rolling piece, and the rolling piece is used for driving the photovoltaic module to flexibly slide on the test bench.