CN110823861A - Method for positioning analysis in glow analysis - Google Patents
Method for positioning analysis in glow analysis Download PDFInfo
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- CN110823861A CN110823861A CN201910996775.1A CN201910996775A CN110823861A CN 110823861 A CN110823861 A CN 110823861A CN 201910996775 A CN201910996775 A CN 201910996775A CN 110823861 A CN110823861 A CN 110823861A
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- 238000004458 analytical method Methods 0.000 title claims abstract description 23
- 238000000034 method Methods 0.000 title claims abstract description 9
- 238000001514 detection method Methods 0.000 claims abstract description 33
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 claims abstract description 8
- 229910052742 iron Inorganic materials 0.000 claims abstract description 4
- 239000003550 marker Substances 0.000 claims description 5
- 238000004611 spectroscopical analysis Methods 0.000 claims description 3
- 238000006748 scratching Methods 0.000 claims description 2
- 230000002393 scratching effect Effects 0.000 claims description 2
- 238000007689 inspection Methods 0.000 claims 3
- 239000003292 glue Substances 0.000 claims 1
- 238000010183 spectrum analysis Methods 0.000 abstract description 6
- 238000010586 diagram Methods 0.000 description 3
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 2
- 230000002159 abnormal effect Effects 0.000 description 2
- CSDREXVUYHZDNP-UHFFFAOYSA-N alumanylidynesilicon Chemical compound [Al].[Si] CSDREXVUYHZDNP-UHFFFAOYSA-N 0.000 description 2
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 2
- 229910052782 aluminium Inorganic materials 0.000 description 2
- 238000007789 sealing Methods 0.000 description 2
- -1 zinc-aluminum-magnesium Chemical compound 0.000 description 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- FYYHWMGAXLPEAU-UHFFFAOYSA-N Magnesium Chemical compound [Mg] FYYHWMGAXLPEAU-UHFFFAOYSA-N 0.000 description 1
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- HCHKCACWOHOZIP-UHFFFAOYSA-N Zinc Chemical compound [Zn] HCHKCACWOHOZIP-UHFFFAOYSA-N 0.000 description 1
- 229910052786 argon Inorganic materials 0.000 description 1
- 239000011248 coating agent Substances 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- 239000003086 colorant Substances 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 239000010949 copper Substances 0.000 description 1
- 230000007613 environmental effect Effects 0.000 description 1
- 239000007789 gas Substances 0.000 description 1
- 230000004807 localization Effects 0.000 description 1
- 229910052749 magnesium Inorganic materials 0.000 description 1
- 239000011777 magnesium Substances 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000002161 passivation Methods 0.000 description 1
- 238000012827 research and development Methods 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 230000003595 spectral effect Effects 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 229910052725 zinc Inorganic materials 0.000 description 1
- 239000011701 zinc Substances 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/66—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence
- G01N21/67—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence using electric arcs or discharges
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- General Health & Medical Sciences (AREA)
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- Pathology (AREA)
- Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
Abstract
一种用于辉光分析中进行定位分析的方法,属于辉光光谱分析技术领域。具体步骤及参数为:首先用一根铁丝自制定位工具;用这个自制定位工具卡住样品,一端对准指定检测区域,另一端正对着指定检测区域背面并做标记;将样品吸附于阳极口时,用直径为4mm的塑料管插入阳极绞刀,另一端对着样品,移动吸附于阳极口的样品调整其位置,使标记与塑料管重合;塑料管与阳极绞刀直连,确保指定检测区域正对着阳极口,并与标记位置重合,完成对指定检测区域进行辉光光谱分析。优点在于,操作简便,利用自制定位工具确定检测区域,实现样品表面指定检测区域辉光分析。
A method for positioning analysis in glow analysis belongs to the technical field of glow spectrum analysis. The specific steps and parameters are: first, use a self-made positioning tool with an iron wire; use this self-made positioning tool to clamp the sample, one end is aligned with the designated detection area, and the other end is facing the back of the designated detection area and marked; the sample is adsorbed on the anode port Insert the anode reamer with a plastic tube with a diameter of 4mm, with the other end facing the sample, move the sample adsorbed on the anode port to adjust its position so that the mark coincides with the plastic tube; the plastic tube is directly connected to the anode reamer to ensure the specified detection The area is directly opposite to the anode port and coincides with the marked position to complete the glow spectrum analysis of the designated detection area. The advantage is that the operation is simple, the detection area is determined by using a self-made positioning tool, and the glow analysis of the designated detection area on the sample surface is realized.
Description
技术领域technical field
本发明属于辉光光谱分析技术领域,特别涉及一种用于辉光分析中进行定位分析的方法。The invention belongs to the technical field of glow spectrum analysis, and particularly relates to a method for positioning analysis in glow analysis.
背景技术Background technique
首钢薄板产品种类越来越齐全,产量也越来越高,如锌铝镁、铝硅等新产品也均已实现量产供货。Shougang's sheet products are becoming more and more complete, and the output is also increasing. New products such as zinc, aluminum, magnesium, aluminum and silicon have also been mass-produced and supplied.
辉光放电光谱分析应用于锌铝镁、铝硅、镀锌板、镀锡板等各类薄板样品表面镀层厚度及重量、钝化层厚度及重量、化学成分等项目的检测,为科研开发提供了大量有效的数据。Glow discharge spectroscopic analysis is used in the detection of surface coating thickness and weight, passivation layer thickness and weight, chemical composition and other items of various types of thin plate samples such as zinc-aluminum-magnesium, aluminum-silicon, galvanized sheet, tin-plated sheet, etc., providing scientific research and development. A lot of valid data.
辉光放电光谱法的基本原理是以试样作为阴极,在铜质阳极内利用高压使氩气电离,氩离子流冲击作为阴极的样品表面,样品表面元素原子被逐层剥离,被剥离出的元素原子在阳极内被激发发光,将光束引入光室,经分光系统分解后,通过检测特征谱线的强度,从而可以得到样品由表及里的元素组成分布。The basic principle of glow discharge spectroscopy is that the sample is used as the cathode, and the argon gas is ionized by high pressure in the copper anode. The element atoms are excited in the anode to emit light, and the light beam is introduced into the light chamber. After being decomposed by the spectroscopic system, the intensity of the characteristic spectral line can be detected, so that the element composition distribution of the sample from the surface to the inside can be obtained.
利用辉光放电光谱仪——美国力可公司GDS850A型进行样品分析时,需要将待测面吸附于阳极口,阳极口直径4毫米,阳极口所对应的样品表面直径4毫米区域为分析区域,阳极口外沿密封圈直径12毫米,样品直径一般为30~50毫米。另外,样品分析仓空间狭窄,当样品吸附于阳极口的时候,不能将分析位置准确地定位到样品表面某个确定的位置。但是锌铝镁、铝硅、镀锌板等样品经常会由于生产工艺、环境条件等影响在样品表面形成不同颜色或纹路的异常区域,科研人员经常需要指定某个确定区域进行辉光光谱分析,用以观察异常区域与正常区域的表面元素成分差别。When using the glow discharge spectrometer, the GDS850A of the United States, the surface to be measured needs to be adsorbed on the anode port. The diameter of the anode port is 4 mm. The area of the sample surface corresponding to the anode port with a diameter of 4 mm is the analysis area. The diameter of the sealing ring at the outer edge of the mouth is 12 mm, and the diameter of the sample is generally 30 to 50 mm. In addition, the space of the sample analysis chamber is narrow, and when the sample is adsorbed on the anode port, the analysis position cannot be accurately positioned to a certain position on the sample surface. However, samples such as zinc-aluminum-magnesium, aluminum-silicon, and galvanized sheets often form abnormal areas with different colors or lines on the surface of the samples due to the influence of production processes and environmental conditions. Researchers often need to designate a certain area for glow spectrum analysis. It is used to observe the difference of surface element composition between abnormal area and normal area.
因此,需要确定一种用于辉光分析中进行定位分析的方法。Therefore, there is a need to define a method for localization analysis in glow analysis.
发明内容SUMMARY OF THE INVENTION
本发明的目的在于提供一种用于辉光分析中进行定位分析的方法,解决了在辉光分析中无法不能准确定位的问题。利用自制定位工具确定指定检测区域背面位置,达到指定检测区域与阳极口的对中,从而实现样品表面指定检测区域的辉光分析。The purpose of the present invention is to provide a method for positioning analysis in glow analysis, which solves the problem that accurate positioning cannot be performed in glow analysis. Use the self-made positioning tool to determine the position of the back of the designated detection area to achieve the alignment of the designated detection area and the anode port, so as to realize the glow analysis of the designated detection area on the sample surface.
一种用于辉光分析中进行定位分析的方法,具体步骤及参数如下:A method for positioning analysis in glow analysis, the specific steps and parameters are as follows:
1、制作一个定位工具8,准备一根直径1~3mm,长10~20cm的铁丝,将其头尾相连,使其变形为方形,保持其头尾相对,在头尾两端粘上胶带防止划伤样品1表面。用这个自制定位工具8卡住样品1,一端对准指定检测区域6,另一端正对着指定检测区域背面7;1. Make a
2、在指定检测区域背面7用记号笔做上标记,顺着对准指定检测区域背面7的自制定位工具8端用记号笔画一个圆圈;2. Mark the
3、将样品1吸附于阳极口2时,用一根直径为4mm的塑料管5插入阳极绞刀4,塑料管5的另一端对着样品1,这时候移动吸附于阳极口2的样品1,调整其位置,使之前做好的标记与塑料管5重合;由于阳极绞刀4与阳极口2是严格对中的,塑料管5与阳极绞刀4直连,在该位置可以确保指定检测区域6正对着阳极口2,并与标记位置重合,完成对指定检测区域6进行辉光光谱分析。3. When the
本发明的优点在于操作简便,利用自制定位工具确定样品指定检测区域的背面位置,达到样品指定检测区域与阳极口的对中,从而实现样品表面指定检测区域的辉光分析。The invention has the advantages of simple operation, using a self-made positioning tool to determine the back position of the designated detection area of the sample to achieve the centering of the designated detection area of the sample and the anode port, thereby realizing the glow analysis of the designated detection area on the surface of the sample.
附图说明Description of drawings
图1为自制定位工具示意图。其中,自制定位工具8。Figure 1 is a schematic diagram of a self-made positioning tool. Among them, the self-made
图2为利用自制定位工具标记指定检测区域背面示意图。其中,样品1、指定检测区域6、指定检测区域背面7、自制定位工具8。Figure 2 is a schematic diagram of the back of the designated detection area marked with a self-made positioning tool. Among them, the
图3为实现样品指定检测区域与阳极口的对中示意图。其中,样品1、阳极口2、密封圈3、阳极绞刀4、塑料管5。Figure 3 is a schematic diagram of the centering of the sample designated detection area and the anode port. Among them,
具体实施方式Detailed ways
下面结合附图说明本发明的具体实施方式。Specific embodiments of the present invention will be described below with reference to the accompanying drawings.
一种用于辉光分析中进行定位分析的方法,具体步骤及参数如下:A method for positioning analysis in glow analysis, the specific steps and parameters are as follows:
1、制作一个定位工具8,准备一根直径2mm,长15cm的铁丝,将其头尾相连,使其变形为方形,保持其头尾相对,在头尾两端粘上胶带防止划伤样品1表面。用这个自制定位工具8卡住样品1,一端对准指定检测区域6,另一端正对着指定检测区域背面7;1. Make a
2、在指定检测区域背面7用记号笔做上标记,顺着对准指定检测区域背面7的自制定位工具8端用记号笔画一个圆圈;2. Mark the
3、将样品1吸附于阳极口2时,用一根直径为4mm的塑料管插入阳极绞刀4,塑料管5的另一端对着样品1,这时候缓慢移动吸附于阳极口2的样品1,调整其位置,使之前做好的标记与塑料管5重合;由于阳极绞刀4与阳极口2是严格对中的,塑料管5与阳极绞刀4直连,在该位置可以确保指定检测区域6正对着阳极口2,并与标记位置重合,完成对指定检测区域6进行辉光光谱分析。3. When the
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Publication number | Priority date | Publication date | Assignee | Title |
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CN114216895A (en) * | 2021-11-04 | 2022-03-22 | 钢研纳克检测技术股份有限公司 | Sample box for glow discharge analysis and characterization and use method |
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CN103983201A (en) * | 2014-05-14 | 2014-08-13 | 首钢总公司 | Method for detecting thickness of phosphating film of cold-rolled sheet |
CN106645095A (en) * | 2017-02-13 | 2017-05-10 | 首钢总公司 | Method for measuring contents of silicon and aluminum in aluminum silicon plate plating |
CN208140258U (en) * | 2018-04-11 | 2018-11-23 | 河南广瑞汽车部件股份有限公司 | A kind of spectrometer analysis sample accurate positioning apparatus |
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CN201177603Y (en) * | 2008-03-27 | 2009-01-07 | 武汉钢铁(集团)公司 | Spectrometer analyzed test sample accurate positioning apparatus |
CN101509894A (en) * | 2009-03-23 | 2009-08-19 | 首钢总公司 | Method for measuring scale element distribution in thickness direction |
CN103983201A (en) * | 2014-05-14 | 2014-08-13 | 首钢总公司 | Method for detecting thickness of phosphating film of cold-rolled sheet |
CN106645095A (en) * | 2017-02-13 | 2017-05-10 | 首钢总公司 | Method for measuring contents of silicon and aluminum in aluminum silicon plate plating |
CN208140258U (en) * | 2018-04-11 | 2018-11-23 | 河南广瑞汽车部件股份有限公司 | A kind of spectrometer analysis sample accurate positioning apparatus |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
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CN114216895A (en) * | 2021-11-04 | 2022-03-22 | 钢研纳克检测技术股份有限公司 | Sample box for glow discharge analysis and characterization and use method |
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