CN105181676A - Method for measuring depth and quality of plating of galvanized plate through glow discharge spectrometer - Google Patents
Method for measuring depth and quality of plating of galvanized plate through glow discharge spectrometer Download PDFInfo
- Publication number
- CN105181676A CN105181676A CN201510634168.2A CN201510634168A CN105181676A CN 105181676 A CN105181676 A CN 105181676A CN 201510634168 A CN201510634168 A CN 201510634168A CN 105181676 A CN105181676 A CN 105181676A
- Authority
- CN
- China
- Prior art keywords
- sample
- quality
- depth
- instrument
- coating
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Abstract
The invention discloses a method for measuring depth and quality of plating of a galvanized plate through a glow discharge spectrometer and aims to provide a method for rapidly, accurately and efficiently measuring the depth and the quality of the plating of the galvanized plate. The method comprises steps as follows: an instrument is debugged, center positioning and curve calibration are performed, accordingly, the instrument is in the optimum state, a sample is cut into sample blocks with appropriate sizes, the surfaces of the taken sample blocks are flat and don't have defects, the sample is arranged in a spectrometer sample chamber after surface dirt is wiped and removed, intensity of spectral lines is measured, a changing curve of the intensity of each element with time is obtained, the curve is subjected to analysis and calculation, and the depth and the quality of the plating of the galvanized plate are obtained.
Description
Technical field
The present invention relates to surface analysis technique field, be specifically related to a kind of method adopting glow spectrometer to measure the zinc plated plate plated layer degree of depth and quality of coating.
Background technology
In recent years, scientist finds in many cases, and material surface composition and the character of structure to material have special effect, and therefore the importance of surface analysis and zone-by-zone analysis is day by day by analyst is paid close attention to.The means being generally used for surface analysis have Auger electron spectroscopy (AES), x-ray photoelectron power spectrum (XPS), secondary ion mass spectrum (SIMS) and grow discharge optical emission spectrometry (GD-OES) etc.Due to differences such as equipment price, accuracy of analysis and precision, the application in routine analysis is also not necessarily identical.Grow discharge optical emission spectrometry analytical technology, had been widely used in the research and development of new material and the quality control of product in recent years.
The spectral analysis technique that glow discharge optical emission spectrometry (GlowDischarge-OpticalEmissionSpectrometry, GD-OES) is a kind of principle of discharging at low pressure according to inert gas and grows up.Grow discharge optical emission spectrometry instrument primarily of glow discharge source, beam splitting system, detection system and computer control system 4 part composition.
The method of current measurement galvanized layer thickness mainly contains method of magnetic, cross-sectional microscopy method, sonde method, and dissolve coulometry, chemical method weight difference subtracts calculating etc.Method of magnetic needs often to use known thickness standard specimen to calibrate, owing to easily changing by magnetic interference, survey the data precision and also can produce certain influence.Adopt cross-sectional microscopy method to need to carry out complicated processing procedure to sample, sample preparation requires strict, and method is not easy to grasp.Sonde method needs first to carry out part solution-off to sample, gets multiple point and tests, require that microscope has higher precision after dry process.Chemical method weight difference subtracts calculating needs Measurement accuracy Area of Sample, and operation is comparatively complicated.
Summary of the invention
The present invention, in order to solve existing chemical gauging zinc plated plate plated layer quality and deep operations complexity, calculates loaded down with trivial details, uses more chemicals, the problem of long flow path.The invention provides a kind of more fast, measure the method for the zinc plated plate plated layer degree of depth and quality of coating accurately and efficiently.
For reaching above-mentioned purpose, a kind of glow spectrometer of the present invention measures the method for the zinc plated plate plated layer degree of depth and quality of coating, comprises the following steps:
Adjusting instrument, carrying out centralized positioning and calibration curve makes instrument arrive optimum condition, sample cuts into sizeable sample block, sample block surface should smooth zero defect, through wiping removing surface smut, by sampling device in optical spectrometer sample room, measure line strength, obtain each element-intensities curve over time, analytical calculation is carried out to curve and obtains the zinc plated plate plated layer degree of depth and quality of coating.
Wherein said sample plate shearing machine is cut into the square sample block that the length of side is 2.5cm, the greasy dirt of specimen surface, dust, water mark is cleaned up, then fully dry with alcohol.
Wherein said glow spectrometer working temperature is 10 DEG C, and adjusting instrument carries out centralized positioning and calibration curve, and each parameter of instrument is as shown in the table:
The sample excitation time is set as 2.5min.
The invention difference from existing technology is that the present invention achieves following technique effect:
1) fast, efficient: to substantially reduce operating process compared to chemical gauging, saved medicine, decrease manpower expenditure, improve production efficiency.Testing result is quick, accurate, reliable, makees a sample and only needs a few minutes, direct-detection solid sample, saves complicated molten sample step, entirely composes covering, Simultaneously test multiple element;
2) accurate, detection limit is low: instrument detectable concentration scope is wide, and detection limit is low.Sample surfaces is successively detected, from a few nanometer to 200 microns, has high depth resolution;
3) energy-conserving and environment-protective: direct-detection solid sample, do not need to dilute sample, the process such as dissolving, decrease the use of chemical reagent.
Embodiment
Below in conjunction with embodiment, to above-mentioned being described in more detail with other technical characteristic and advantage of the present invention.
1. method summary:
Adjusting instrument, carrying out centralized positioning and calibration curve makes instrument arrive optimum condition, sample need cut into sizeable sample block, sample block surface should smooth zero defect, through simple wiping removing surface smut, by sampling device in optical spectrometer sample room, measure line strength, obtain each element-intensities curve over time, analytical calculation is carried out to curve and obtains the zinc plated plate plated layer degree of depth and quality of coating.
2. key instrument equipment:
2.1 plate shearing machines, can cut out the steel plate sample block of district's different size
2.2GDProfiler2 glow spectrometer
3. electrode specification
R＝4mm
4. analytical procedure
Sample plate shearing machine is cut into the square sample block that the length of side is about 2.5cm, with alcohol, the greasy dirt of specimen surface, dust, water mark etc. is cleaned up, then fully dry.
Ensure light room nitrogen environment, and guarantee that instrument working temperature is at about 10 DEG C with circulating water cooling system, adjusting instrument, carries out centralized positioning and calibration curve, and each parameter of instrument is as shown in the table:
Device sample, and test is excited to sample.The sample excitation time is set as 2.5min.Mensuration line strength, obtains the change curve of each elemental signals intensity time and integrating meter calculates zinc coating quality and the coating degree of depth.
5. analysis result
As can be seen from the above table, the data result compared with traditional chemical method data measured adopting glow discharge optical emission spectrometry mensuration zinc plated plate plated layer quality and the coating degree of depth to obtain is accurate.And simple to operate, flow process is shorter, and method is easily grasped, fast, efficiently.
8. conclusion
By this method, zinc plated plate plated layer quality and the coating degree of depth can be determined accurately.Decrease the use of chemicals compared to chemical method, testing process environmental pollution is little, substantially reduces the running time, has saved cost of drugs, has reduced energy consumption.Without the need to carrying out complicated molten sample processing procedure, be applicable to being applied to the mensuration of producing upper large Lot sample.
Above-described embodiment is only be described the preferred embodiment of the present invention; not scope of the present invention is limited; under not departing from the present invention and designing the prerequisite of spirit; the various distortion that those of ordinary skill in the art make technical scheme of the present invention and improvement, all should fall in protection domain that claims of the present invention determines.
Claims (3)
1. glow spectrometer measures a method for the zinc plated plate plated layer degree of depth and quality of coating, it is characterized in that comprising the following steps:
Adjusting instrument, carrying out centralized positioning and calibration curve makes instrument arrive optimum condition, sample cuts into sizeable sample block, sample block surface should smooth zero defect, through wiping removing surface smut, by sampling device in optical spectrometer sample room, measure line strength, obtain each element-intensities curve over time, analytical calculation is carried out to curve and obtains the zinc plated plate plated layer degree of depth and quality of coating.
2. glow spectrometer according to claim 1 measures the method for the zinc plated plate plated layer degree of depth and quality of coating, it is characterized in that: described sample plate shearing machine is cut into the square sample block that the length of side is 2.5cm, with alcohol, the greasy dirt of specimen surface, dust, water mark are cleaned up, then fully dry.
3. glow spectrometer according to claim 1 measures the method for the zinc plated plate plated layer degree of depth and quality of coating, it is characterized in that: described glow spectrometer working temperature is 10 DEG C, adjusting instrument, carries out centralized positioning and calibration curve, and each parameter of instrument is as shown in the table:
The sample excitation time is set as 2.5min.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510634168.2A CN105181676A (en) | 2015-09-29 | 2015-09-29 | Method for measuring depth and quality of plating of galvanized plate through glow discharge spectrometer |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510634168.2A CN105181676A (en) | 2015-09-29 | 2015-09-29 | Method for measuring depth and quality of plating of galvanized plate through glow discharge spectrometer |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN105181676A true CN105181676A (en) | 2015-12-23 |
Family
ID=54903906
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201510634168.2A Pending CN105181676A (en) | 2015-09-29 | 2015-09-29 | Method for measuring depth and quality of plating of galvanized plate through glow discharge spectrometer |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN105181676A (en) |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105627937A (en) * | 2015-12-25 | 2016-06-01 | 东风商用车有限公司 | Method for measuring monolayer film thickness of paint film of white paint board by using glow discharge spectrum method |
| CN106645095A (en) * | 2017-02-13 | 2017-05-10 | 首钢总公司 | Method for measuring contents of silicon and aluminum in aluminum silicon plate plating |
| CN111426642A (en) * | 2020-03-31 | 2020-07-17 | 本钢板材股份有限公司 | Method for determining galvanized sheet coating distribution and element quality by direct current glow discharge atomic emission spectrometry |
| CN114166129A (en) * | 2021-10-22 | 2022-03-11 | 本钢板材股份有限公司 | Method for measuring interface width of hot-dip galvanized steel plate coating |
| CN114324298A (en) * | 2021-12-16 | 2022-04-12 | 东风汽车集团股份有限公司 | Method for measuring sputtering rate |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4824249A (en) * | 1986-04-16 | 1989-04-25 | Chamber Ridge Pty. Ltd. | Systems for the direct analysis of solid samples by atomic emission spectroscopy |
| US5920400A (en) * | 1995-02-15 | 1999-07-06 | Patent-Treuhand-Gesellschaft Fur Elektrische Gluhlampen Mbh | Method and device for determining the purity and/or pressure of gases for electric lamps |
| CN101349546A (en) * | 2008-09-11 | 2009-01-21 | 首钢总公司 | Method for detecting hot dip galvanizing plate iron aluminum central layer thickness |
| CN102175754A (en) * | 2010-12-27 | 2011-09-07 | 中国科学院上海硅酸盐研究所 | New method for analyzing non-conductor material by utilizing glow discharge mass spectrum |
| CN103884772A (en) * | 2012-12-21 | 2014-06-25 | 北京有色金属研究总院 | Determination of trace impurity elements in high purity indium through glow discharge mass spectrometry method |
| CN103983201A (en) * | 2014-05-14 | 2014-08-13 | 首钢总公司 | Method for detecting thickness of phosphating film of cold-rolled sheet |
-
2015
- 2015-09-29 CN CN201510634168.2A patent/CN105181676A/en active Pending
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4824249A (en) * | 1986-04-16 | 1989-04-25 | Chamber Ridge Pty. Ltd. | Systems for the direct analysis of solid samples by atomic emission spectroscopy |
| US5920400A (en) * | 1995-02-15 | 1999-07-06 | Patent-Treuhand-Gesellschaft Fur Elektrische Gluhlampen Mbh | Method and device for determining the purity and/or pressure of gases for electric lamps |
| CN101349546A (en) * | 2008-09-11 | 2009-01-21 | 首钢总公司 | Method for detecting hot dip galvanizing plate iron aluminum central layer thickness |
| CN102175754A (en) * | 2010-12-27 | 2011-09-07 | 中国科学院上海硅酸盐研究所 | New method for analyzing non-conductor material by utilizing glow discharge mass spectrum |
| CN103884772A (en) * | 2012-12-21 | 2014-06-25 | 北京有色金属研究总院 | Determination of trace impurity elements in high purity indium through glow discharge mass spectrometry method |
| CN103983201A (en) * | 2014-05-14 | 2014-08-13 | 首钢总公司 | Method for detecting thickness of phosphating film of cold-rolled sheet |
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105627937A (en) * | 2015-12-25 | 2016-06-01 | 东风商用车有限公司 | Method for measuring monolayer film thickness of paint film of white paint board by using glow discharge spectrum method |
| CN105627937B (en) * | 2015-12-25 | 2018-08-03 | 东风商用车有限公司 | A kind of method that Sheets By Glow Discharge Aes measure white paint plate paint film single layer film thickness |
| CN106645095A (en) * | 2017-02-13 | 2017-05-10 | 首钢总公司 | Method for measuring contents of silicon and aluminum in aluminum silicon plate plating |
| CN111426642A (en) * | 2020-03-31 | 2020-07-17 | 本钢板材股份有限公司 | Method for determining galvanized sheet coating distribution and element quality by direct current glow discharge atomic emission spectrometry |
| CN114166129A (en) * | 2021-10-22 | 2022-03-11 | 本钢板材股份有限公司 | Method for measuring interface width of hot-dip galvanized steel plate coating |
| CN114324298A (en) * | 2021-12-16 | 2022-04-12 | 东风汽车集团股份有限公司 | Method for measuring sputtering rate |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN105181676A (en) | Method for measuring depth and quality of plating of galvanized plate through glow discharge spectrometer | |
| Xu et al. | Hf isotopic compositions of the standard zircons for U-Pb dating | |
| CN107966430A (en) | A kind of method for being used to quickly detect fertilizer nutrient content | |
| CN102359953A (en) | Ordinary brass full-elemental analysis apparatus based on laser-induced breakdown spectroscopy, and method thereof | |
| CN104048902B (en) | A kind of measure in steel the distribution of globular oxide inclusion size and the method for content | |
| CN103728282B (en) | The instrument analytical method of inclusion content in a kind of Fast Measurement material | |
| CN112362638A (en) | Method for measuring MC6 chromium content by photoelectric direct-reading spectrometer | |
| CN105136775A (en) | Method for determining content of all elements in galvanized sheet substrate by glow discharge spectrometer | |
| CN104212804A (en) | Aptamer sequence for quantitatively and rapidly detecting lead ions and method for detecting lead ions by utilizing same | |
| CN103075972B (en) | The measuring method of the dry coating thickness of substrate surface coating | |
| CN103398988B (en) | A kind of LIBS metallic element quantivative approach based on not same element polyion state contrast correction | |
| CN106442474B (en) | A kind of cement slurry three ratio measurement method based on Partial Least Squares | |
| CN106643587B (en) | A kind of thickness of metal film measurement method based on microwave transmission method | |
| CN109086547A (en) | A kind of ageing of metal level measurement method | |
| CN111426642A (en) | Method for determining galvanized sheet coating distribution and element quality by direct current glow discharge atomic emission spectrometry | |
| CN108562560A (en) | A kind of method of aluminium content in measurement titanium alloy | |
| CN102253067B (en) | Method for measuring chemical compositions of deposited metal | |
| Wilsch et al. | Laser Induced Breakdown Spectroscopy (LIBS)-alternative to wet chemistry and micro-XRF | |
| CN109856106A (en) | A method of identification garnet kind | |
| CN103363930A (en) | Method for measuring thickness of galvanized layer on steel plate | |
| CN109668862B (en) | Aluminum electrolyte molecular ratio detection method based on laser-induced breakdown spectroscopy | |
| CN103616075A (en) | Method for automatically recognizing element spectral line in LIBS component analysis | |
| CN110426408A (en) | The method that Xray fluorescence spectrometer detects arsenic in the pig iron, tin element content | |
| CN104807846A (en) | Method of characterizing degree and process of surface hydrolysis, deliquescence and weathering of phosphate laser glass with X-ray photoelectron spectroscopy | |
| CN104502277A (en) | Spectral analysis method |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| RJ01 | Rejection of invention patent application after publication | ||
| RJ01 | Rejection of invention patent application after publication |
Application publication date: 20151223 |