CN110732353A

CN110732353A - High-low temperature test chamber, high-low temperature test device and control method thereof

Info

Publication number: CN110732353A
Application number: CN201910982020.6A
Authority: CN
Inventors: 邓献奇; 涂平; 徐循阔
Original assignee: SHENZHEN DOUWIN TECHNOLOGY Co Ltd
Current assignee: SHENZHEN DOUWIN TECHNOLOGY Co Ltd
Priority date: 2019-10-16
Filing date: 2019-10-16
Publication date: 2020-01-31

Abstract

The high-low temperature test chamber adopts a multi-chamber structure and comprises a high-temperature chamber, an th cooling chamber, a second cooling chamber, a low-temperature chamber, a th heating chamber and a second heating chamber, a test object circularly moves in different chambers in the high-low temperature test chamber and can provide high-low temperature alternating environment for the test object, the heat capacity does not generate extra energy consumption due to the stable temperature of the high-temperature chamber and the low-temperature chamber, a cooling process is divided into two sections of the th cooling chamber and the second cooling chamber, a heating process is divided into two sections of the th heating chamber and the second heating chamber, and the temperature change of the heat capacity of the cooling chamber and the heating chamber is reduced, so that the extra energy consumption caused by the heat capacity is reduced, and the equipment operation cost is reduced.

Description

High-low temperature test chamber, high-low temperature test device and control method thereof

Technical Field

The application belongs to the technical field of environmental test devices, and particularly relates to a high-low temperature test chamber, a high-low temperature test device and a control method thereof.

Background

The high-low temperature test device is a necessary test device in the development process of many products, generally, high temperature and low temperature need to be maintained for a long time during testing, the time of a cooling section from high temperature to low temperature or a heating section from low temperature to high temperature is short, many test objects only require to generate heat in the high temperature section and the low temperature section, and some require to generate heat in the whole test period. In the conventional high-low temperature test device, the heat capacity of the device generates extra energy consumption, so that the running cost of the device is high.

Disclosure of Invention

The embodiment of the application aims to provide high-low temperature test chambers, high-low temperature test devices and control methods thereof, so as to solve the technical problem that the heat capacity of the existing high-low temperature test devices can generate extra energy consumption.

The embodiment of this application provides kinds of high cold test casees, includes:

the high-temperature chamber is used for accommodating a test object and heating or cooling the test object, and comprises a high-temperature chamber box body and a high-temperature chamber arranged on the high-temperature chamber box body;

an th cooling chamber for receiving and cooling test objects from the high temperature chamber;

a second temperature reduction chamber for receiving and cooling the test objects from the th temperature reduction chamber, the second temperature reduction chamber being disposed adjacent to the th temperature reduction chamber;

a low-temperature chamber for accommodating the test object from the second temperature reduction chamber and heating or cooling the test object, wherein the low-temperature chamber comprises a low-temperature chamber box body and a low-temperature chamber arranged on the low-temperature chamber box body;

an th heating chamber for receiving and heating the test object from the low temperature chamber;

a second warming chamber for accommodating and heating the test object from the th warming chamber, the second warming chamber being disposed adjacent to the th warming chamber, and

and a control device for controlling the temperature of the high-temperature chamber, the th cooling chamber, the second cooling chamber, the low-temperature chamber, the th heating chamber and the second heating chamber to change according to a set change curve.

Optionally, the high-temperature chamber further comprises a high-temperature chamber fan for providing air flow to the inside of the high-temperature chamber box body, a high-temperature chamber electric heater arranged in the high-temperature chamber box body, and a high-temperature chamber temperature sensor for detecting the temperature of the high-temperature chamber box body;

and/or the th cooling chamber comprises a th cooling chamber box body, a th cooling chamber fan for providing air flow to the interior of the th cooling chamber box body, and a th cooling chamber temperature sensor for detecting the temperature of the th cooling chamber box body;

and/or the second cooling chamber comprises a second cooling chamber box body, a second cooling chamber fan used for providing air flow for the interior of the second cooling chamber box body, and a second cooling chamber temperature sensor used for detecting the temperature of the second cooling chamber box body;

and/or the low-temperature chamber also comprises a low-temperature chamber fan for providing airflow inside the low-temperature chamber box body, a low-temperature chamber electric heater arranged in the low-temperature chamber box body, and a low-temperature chamber temperature sensor for detecting the temperature of the low-temperature chamber box body;

and/or the th warming chamber comprises a th warming chamber box, a th warming chamber fan for providing air flow to the interior of the th warming chamber box, and a th warming chamber temperature sensor for detecting the temperature of the th warming chamber box;

and/or the second warming chamber comprises a second warming chamber box body, a second warming chamber fan used for providing air flow for the interior of the second warming chamber box body, a second warming chamber electric heater arranged in the second warming chamber box body, and a second warming chamber temperature sensor used for detecting the temperature of the second warming chamber box body.

Optionally, the opening of the high temperature chamber faces the inlet of the th temperature reduction chamber, the outlet of the th temperature reduction chamber is communicated with the inlet of the second temperature reduction chamber, and the outlet of the second temperature reduction chamber faces the opening of the low temperature chamber;

and/or the opening of the low-temperature chamber faces the inlet of the th heating chamber, the outlet of the th heating chamber is communicated with the inlet of the second heating chamber, and the outlet of the second heating chamber faces the opening of the high-temperature chamber.

Optionally, at least auxiliary cooling chambers are arranged between the second cooling chamber and the low-temperature chamber, and the control device is further used for controlling the temperature of the auxiliary cooling chambers to change according to a set change curve;

and/or at least auxiliary temperature raising chambers are arranged between the second temperature raising chamber and the high temperature chamber, and the control device is also used for controlling the temperature of the auxiliary temperature raising chambers to change according to a set change curve.

Optionally, the high-low temperature test chamber further comprises a driving mechanism for driving the test object to stay in the high-temperature chamber, the th cooling chamber, the second cooling chamber, the low-temperature chamber, the th heating chamber and the second heating chamber for respective set time in sequence and then return to the high-temperature chamber for circulating movement.

The embodiment of the application provides high-low temperature test devices, which comprise a refrigerating device with a subcooler, a cold accumulation and release loop with an ice storage water tank and the high-low temperature test box, wherein the refrigerating device is used for supplying cold to the low-temperature chamber, the second cooling chamber and the ice storage water tank, and the cold accumulation and release loop is used for storing cold and supplying cold to the subcooler, the cooling chamber and the high-temperature chamber.

Optionally, the ice storage water tank is provided with an ice storage pipeline and a cold release pipeline which exchange heat with each other, two ends of the ice storage pipeline are respectively an ice storage inlet and an ice storage outlet, and two ends of the cold release pipeline are respectively a cold release inlet and a cold release outlet;

the refrigerating device comprises a compressor, a condenser, a low-temperature chamber evaporator and a second cooling chamber evaporator, wherein the compressor and the condenser are sequentially connected, the low-temperature chamber evaporator is arranged in the low-temperature chamber box, and the second cooling chamber evaporator is used for supplying cold to the second cooling chamber;

a electromagnetic valve and a thermal expansion valve are arranged on the th refrigeration pipeline, the tail end of the th refrigeration pipeline is connected to the input end of the low-temperature chamber evaporator, and the output end of the low-temperature chamber evaporator is connected to the input end of the compressor;

a second electromagnetic valve and a second thermal expansion valve are arranged on the second refrigeration pipeline, the tail end of the second refrigeration pipeline is connected to the input end of the second temperature reduction chamber evaporator, and the output end of the second temperature reduction chamber evaporator is connected to the input end of the compressor;

and a third electromagnetic valve and a third thermal expansion valve are arranged on the third refrigeration pipeline, the tail end of the third refrigeration pipeline is connected to an ice storage inlet of the ice storage water tank, and an ice storage outlet of the ice storage water tank is connected to the input end of the compressor.

Optionally, the subcooler is provided with an th heat exchange pipeline and a subcooling pipeline which exchange heat with each other, and two ends of the subcooling pipeline are respectively a subcooling inlet and a subcooling outlet;

the cold accumulation and release loop comprises a release water pump connected with a release outlet of the ice storage water tank, a cooling room cold release device used for cooling the cooling room, and a high temperature room cold release device used for cooling the high temperature room, wherein the output end of the release water pump is connected with a cold release pipeline, a second cold release pipeline and a third cold release pipeline;

a fourth electromagnetic valve and a flow regulating valve are arranged on the th cold releasing pipeline, the tail end of the th cold releasing pipeline is connected to a supercooling inlet of the subcooler, and a supercooling outlet of the subcooler is connected to a cold releasing inlet of the ice storage water tank;

a fifth electromagnetic valve and a second flow regulating valve are arranged on the second cold release pipeline, the tail end of the second cold release pipeline is connected to the input end of the th cooling chamber cold release device, and the output end of the th cooling chamber cold release device is connected to the cold release inlet of the ice storage water tank;

a sixth electromagnetic valve and a third flow regulating valve are arranged on the third cold releasing pipeline, the tail end of the third cold releasing pipeline is connected to the input end of the high-temperature chamber cold releasing device, and the output end of the high-temperature chamber cold releasing device is connected to the cold releasing inlet of the ice storage water tank.

The high-low temperature test device also comprises a heat recovery loop which is used for recovering the exhaust heat of the compressor and supplying heat to the th heating chamber;

the heat recovery device is provided with a second heat exchange pipeline and a heat recovery pipeline which exchange heat with each other, and two ends of the heat recovery pipeline are respectively a heat recovery inlet and a heat recovery outlet;

the heat recovery loop comprises a hot water tank, a heat release water pump, a seventh electromagnetic valve, a fourth flow regulating valve and a heat release device which are sequentially connected, the heat release device is used for supplying heat to the th heating chamber, the output end of the heat release device is connected to the heat recovery inlet of the heat recoverer, and the heat recovery outlet of the heat recoverer is connected to the input end of the hot water tank.

The embodiment of the application provides a control method of high and low temperature test devices, which comprises the following steps:

when the test object is in the high-temperature chamber, closing the high-temperature chamber and the low-temperature chamber , and controlling the temperature of the high-temperature chamber to change according to a set high-temperature chamber temperature change curve within a set high-temperature chamber residence time;

after the residence time of the test object in the high-temperature chamber reaches a set value, the high-temperature chamber is opened, the test object is moved into the cooling chamber, the high-temperature chamber is closed, and the temperature of the cooling chamber is controlled to change according to a set temperature change curve within the set residence time of the cooling chamber;

after the residence time of the test object in the th cooling chamber reaches a set value, moving the test object into the second cooling chamber, and controlling the temperature of the second cooling chamber to change according to a set temperature change curve within the set residence time of the second cooling chamber;

after the residence time of the test object in the second cooling chamber reaches a set value, the low-temperature chamber is opened, the test object is moved into the low-temperature chamber, the low-temperature chamber is closed, and the temperature of the low-temperature chamber is controlled to change according to a set low-temperature chamber temperature change curve within the set residence time of the low-temperature chamber;

after the residence time of the test object in the low-temperature chamber reaches a set value, the low-temperature chamber is opened, the test object is moved into the th heating chamber, the low-temperature chamber is closed, and the temperature of the th heating chamber is controlled to change according to a set temperature change curve within the set residence time of the th heating chamber;

after the residence time of the test object in the th heating chamber is closed to reach a set value, the test object is moved into the second heating chamber, and the second heating chamber is controlled to change according to a set temperature change curve within the residence time of the set second heating chamber;

after the residence time of the test object in the second temperature rising chamber reaches a set value, the high temperature chamber is opened, the test object is moved into the high temperature chamber, and the high temperature chamber is closed.

The or more technical schemes provided by the embodiment of the application at least have the following technical effects that the high-low temperature test box adopts a multi-chamber structure and comprises a high-temperature chamber, a th cooling chamber, a second cooling chamber, a low-temperature chamber, a th heating chamber and a second heating chamber, a test object circularly moves in different chambers in the high-low temperature test box, and high-low temperature alternating environments can be provided for the test object.

In the high-low temperature test device and the control method thereof, the extra energy consumption caused by the heat capacity of the high-low temperature test box can be reduced due to the adoption of the high-low temperature test box. In addition, the refrigerating device is matched with the cold accumulation and release loop for use, so that the energy efficiency is improved, and the operation cost of the equipment is reduced.

Drawings

In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings needed to be used in the embodiments or the prior art descriptions will be briefly described below, and it is obvious that the drawings in the following description are only embodiments of the present application, and it is obvious for those skilled in the art to obtain other drawings according to these drawings without any creative effort.

FIG. 1 is a schematic diagram of the main components of a high and low temperature test apparatus provided in the embodiments of the present application;

FIG. 2 is a schematic flow chart of a high and low temperature testing apparatus provided in an embodiment of the present application;

FIG. 3 is a schematic diagram of a high temperature chamber of a high and low temperature test apparatus provided in an embodiment of the present application;

FIG. 4 is a schematic view of an th cooling chamber of a high and low temperature test device provided by an embodiment of the present application;

FIG. 5 is a schematic view of a second temperature reduction chamber of the high and low temperature test device provided in the embodiment of the present application;

FIG. 6 is a schematic diagram of a low temperature chamber of a high and low temperature test apparatus provided in an embodiment of the present application;

FIG. 7 is a schematic view of th heating chamber of the high and low temperature testing apparatus provided in the embodiments of the present application;

FIG. 8 is a schematic view of a second temperature-elevating chamber of the high-low temperature testing apparatus provided in the embodiment of the present application;

FIG. 9 is a schematic diagram of a high and low temperature test chamber provided in another embodiment of the present application;

FIG. 10 is a schematic view of an auxiliary cooling chamber used in the high and low temperature test chamber of FIG. 9;

fig. 11 is a schematic view of an auxiliary warming chamber applied in the high and low temperature test chamber of fig. 9.

Detailed Description

In order to make the technical problems, technical solutions and advantages to be solved by the present application more apparent, the present application is described in further with reference to the accompanying drawings and embodiments.

In the description of the embodiments of the present application, it is to be understood that the terms "length," "width," "upper," "lower," "front," "rear," "left," "right," "vertical," "horizontal," "top," "bottom," "inner," "outer," and the like refer to orientations and positional relationships illustrated in the drawings, which are used for convenience in describing the embodiments of the present application and for simplicity in description, and do not indicate or imply that the referenced devices or elements must have a particular orientation, be constructed and operated in a particular orientation, and thus, are not to be construed as limiting the embodiments of the present application.

Thus, a feature defined as "", "second" may explicitly or implicitly include or more of that feature.

In the embodiments of the present application, unless otherwise specifically stated or limited, the terms "mounted," "connected," "fixed," and the like shall be used to mean, for example, that the components may be fixedly connected, detachably connected, or integral, mechanically connected, electrically connected, directly connected, indirectly connected through an intermediate medium, connected internally or in mutual relationship, and those of ordinary skill in the art shall understand the specific meaning of the components in the embodiments of the present application according to their specific situation.

At present, in a conventional high-low temperature test device, a test object is still, and the whole temperature alternating process is realized in the same space, so that in the process of cooling or heating, more extra energy consumption can be generated due to the larger heat capacity of the device, and when the heat productivity of the test object is larger, the heat capacity of the device mainly causes the extra energy consumption of a refrigerator, namely, the heat capacities except the test object are harmful heat capacities to the dynamic process.

Referring to fig. 2, the present embodiment provides high-low temperature test chambers 104 for providing alternating environments of high and low temperatures to the test object, wherein the high and low temperatures are relative, for example, the temperature range may be-60 ℃ to 150 ℃, and the specific range is not limited.

The high-low temperature test box 104 comprises a high-temperature chamber 28, a -temperature-reducing chamber 29, a second-temperature-reducing chamber 30, a low-temperature chamber 31, a -temperature-increasing chamber 32, a second-temperature-reducing chamber 33 and the control device 100, and referring to fig. 3, the high-temperature chamber 28 is used for accommodating the test object 105 and heating or cooling the test object 105, the high-temperature chamber 28 comprises a high-temperature chamber box 301 and a high-temperature chamber 302 arranged in the high-temperature chamber box 301, referring to fig. 2, the -temperature-reducing chamber 29 is used for accommodating the test object 105 from the high-temperature chamber 28 and cooling the test object, the second-temperature-reducing chamber 30 is used for accommodating the test object 105 from the and cooling the test object, the second-temperature-reducing chamber 30 is arranged adjacent to the -temperature-reducing chamber 29, referring to fig. 6, the low-temperature chamber 31 is used for accommodating the test object 105 from the second-temperature-reducing chamber 30 and heating or cooling the test object 105, the low-temperature chamber 31 comprises a low-temperature chamber box 601 and a low-temperature-chamber arranged adjacent to the low-temperature-reducing chamber 31 arranged adjacent to the second-temperature-increasing chamber 31, referring to the second-temperature-increasing chamber 31, the test object 105, the second-heating and cooling curve for accommodating the second-temperature-reducing chamber 31, the test.

Compared with the prior art, the high-low temperature test chamber 104 provided by the application adopts a multi-chamber structure and comprises a high-temperature chamber 28, an th cooling chamber 29, a second cooling chamber 30, a low-temperature chamber 31, an th heating chamber 32 and a second heating chamber 33, a test object 105 circularly moves in different chambers in the high-low temperature test chamber 104 and can provide high-low temperature alternating environment for the test object 105, the heat capacity does not generate additional energy consumption due to the stable temperature of the high-temperature chamber 28 and the low-temperature chamber 31, the temperature reduction process is divided into two sections of the th cooling chamber 29 and the second cooling chamber 30, the temperature increase process is divided into two sections of the th heating chamber 32 and the second heating chamber 33, and the temperature change of the heat capacity of the cooling chamber and the heating chamber is reduced, so that the additional energy consumption caused by the heat capacity is reduced, and the equipment operation cost is reduced.

In another embodiment of the present application, referring to fig. 3, a high temperature chamber 302 is pivotally mounted on the high temperature chamber 301, and a high temperature chamber 302 can control the opening and closing of the opening of the high temperature chamber 301 through a motor (not shown). referring to fig. 6, a low temperature chamber 602 is pivotally mounted on the low temperature chamber 601, and a low temperature chamber 602 can control the opening and closing of the opening of the low temperature chamber 601 through a motor (not shown). the motor is electrically connected to the control device 100, and the control device 100 controls the motor to open and close the body.

Referring to fig. 2 and 3, in another embodiment of the present invention, the high temperature chamber 28 further includes a high temperature chamber blower 303 for providing an air flow to the inside of the high temperature chamber casing 301, a high temperature chamber electric heater 304 disposed in the high temperature chamber casing 301, and a high temperature chamber temperature sensor 305 for detecting the temperature of the high temperature chamber casing 301, a high temperature chamber air cooler 22 is further disposed in the high temperature chamber casing 301 for cooling the high temperature chamber casing 301, when the test object 105 is in the high temperature chamber 28, the control device 100 controls the high temperature chamber 302 and the low temperature chamber 602 to be closed to avoid heat loss and improve energy efficiency, and controls the temperature of the high temperature chamber 28 to change according to a set temperature change curve of the high temperature chamber 28 within a set high temperature chamber staying time by adjusting the air volume of the high temperature chamber blower 303, the power of the high temperature chamber electric heater 304, the flow rate of a cooling water pump 14 described below, and the opening degree of the third flow rate adjusting valve 21, and the control device 100 correspondingly controls the temperature according.

Referring to fig. 2 and 4, in another embodiment of the present application, the th temperature-reducing chamber 29 includes an 0 th temperature-reducing chamber body 401, a 3 th temperature-reducing chamber fan 402 for providing an air flow to the inside of the 2 th temperature-reducing chamber body 401, and a 5 th temperature-reducing chamber sensor 503 for detecting the temperature of the 4 th temperature-reducing chamber body 401. the th temperature-reducing chamber body 401 is further provided with a th temperature-reducing chamber radiator 19 for cooling the th temperature-reducing chamber body 401. when the test object 105 is moved into the th temperature-reducing chamber 29, the high temperature chamber 1302 is closed, and the temperature of the th temperature-reducing chamber 29 is controlled to change according to a set temperature change curve within a set temperature-reducing chamber residence time by adjusting the volume of the th temperature-reducing chamber fan 402 and the opening degree of the second flow rate adjusting valve 18 described below.the control device 100 performs corresponding control according to the data measured by the th temperature-reducing chamber.

Referring to fig. 2 and 5, in another embodiment of the present application, the second temperature-reducing chamber 30 includes a second temperature-reducing chamber box 501, a second temperature-reducing chamber fan 502 for providing an air flow to the inside of the second temperature-reducing chamber box 501, and a second temperature-reducing chamber temperature sensor 503 for detecting the temperature of the second temperature-reducing chamber box 501, a second temperature-reducing chamber evaporator 10 is further disposed inside the second temperature-reducing chamber box 501 for cooling the second temperature-reducing chamber box 501, the test object 105 is moved into the second temperature-reducing chamber 30, the temperature of the second temperature-reducing chamber 30 is controlled to change according to a set temperature change curve within a set residence time of the second temperature-reducing chamber 30 by adjusting the air volume of the second temperature-reducing chamber fan 502 and the opening degree of a second thermal expansion valve 9 described below, and the control device 100 performs corresponding control according to the data measured by the second temperature-reducing chamber temperature sensor 503.

Referring to fig. 2 and 6, in another embodiment of the present invention, low temperature chamber 31 further includes a low temperature chamber blower 603 for providing an air flow to the interior of low temperature chamber housing 601, a low temperature chamber electric heater 604 disposed in low temperature chamber housing 601, and a low temperature chamber temperature sensor 605 for detecting the temperature of low temperature chamber housing 601, a low temperature chamber evaporator 7 for cooling low temperature chamber housing 601 is further disposed in low temperature chamber housing 601, when test object 105 is moved into low temperature chamber 31, low temperature chamber 602 is closed, the temperature of low temperature chamber 31 is controlled to change according to a set low temperature chamber 31 temperature change curve within a set low temperature chamber staying time by adjusting the air volume of low temperature chamber blower 603, the power of low temperature chamber electric heater 604, and the opening degree of a thermal expansion valve 6 described below, and control device 100 performs corresponding control according to the data measured by low temperature chamber temperature sensor 605.

Referring to fig. 2 and 7, in another embodiment of the present application, a th heating chamber 32 includes a 1 th heating chamber housing 701, a 3 th heating chamber fan 702 for providing an air flow to the inside of the 2 th heating chamber housing 701, and an th heating chamber temperature sensor 703 for detecting the temperature of the 4 th heating chamber housing 701, a heat radiator 27 is further disposed inside the th heating chamber 32 for supplying heat to the th heating chamber housing 701, the test object 105 is moved into the th heating chamber 32, the low temperature chamber 0602 is closed, the temperature of the th heating chamber 32 is controlled to change according to a set temperature change curve during the stay time of the th heating chamber by adjusting the air volume of the th heating chamber fan 702, the flow rate of a heat release water pump 24 to be described below, and the opening degree of the fourth flow regulating valve 26, and the control device 100 is correspondingly controlled according to the data measured by the th heating chamber temperature sensor 703.

Referring to fig. 2 and 8, in another embodiment of the present application, the second warming chamber 33 includes a second warming chamber housing 801, a second warming chamber blower 802 for providing an air flow to the inside of the second warming chamber housing 801, a second warming chamber electric heater 803 disposed in the second warming chamber housing 801, and a second warming chamber temperature sensor 804 for detecting the temperature of the second warming chamber housing 801. when the test object 105 is moved into the second warming chamber 33, the control device 100 controls the stay time of the second warming chamber to change according to a set temperature change curve by adjusting the air volume of the second warming chamber blower 802 and the power of the second warming chamber electric heater 803.

Referring to FIG. 2, in another embodiment of the present application, the opening of the high temperature chamber 28 is facing the inlet of the temperature-reducing chamber 29, the outlet of the temperature-reducing chamber 29 is connected to the inlet of the second temperature-reducing chamber 30, and the outlet of the second temperature-reducing chamber 30 is facing the opening of the low temperature chamber 31. with this arrangement, the test objects 105 can be moved quickly from the high temperature chamber 28 to the temperature-reducing chamber 29, from the temperature-reducing chamber 29 to the second temperature-reducing chamber 30, and from the second temperature-reducing chamber 30 to the low temperature chamber 31.

The opening of the low-temperature chamber 31 faces the inlet of the th heating chamber 32, the outlet of the th heating chamber 32 is communicated with the inlet of the second heating chamber 33, and the outlet of the second heating chamber 33 faces the opening of the high-temperature chamber 28. by adopting the scheme, the test object 105 can be conveniently and quickly moved from the low-temperature chamber 31 to the th heating chamber 32, from the th heating chamber 32 to the first heating chamber, and from the second heating chamber 33 to the high-temperature chamber 28.

Referring to fig. 9, in another embodiment of the present application, at least auxiliary temperature-reducing chambers 40 are disposed between the second temperature-reducing chamber 30 and the low-temperature chamber 31, the control device 100 is further configured to control the temperature of the auxiliary temperature-reducing chambers 40 to change according to a set change curve, at least auxiliary temperature-raising chambers 41 are disposed between the second temperature-raising chamber 33 and the high-temperature chamber 28, and the control device 100 is further configured to control the temperature of the auxiliary temperature-raising chambers 41 to change according to the set change curve, by expanding more auxiliary temperature-reducing chambers 40 or auxiliary temperature-raising chambers 41, the test object 105 moves in different chambers of the high-low temperature test box 104 in a circulating manner, and high-low temperature alternating environments of more sections can be provided for the test object 105, thereby meeting higher test requirements.

Specifically, referring to fig. 5 and 10, the auxiliary temperature-reducing chamber 40 is similar to the second temperature-reducing chamber 30, and the auxiliary temperature-reducing chamber 40 includes an auxiliary temperature-reducing chamber box 1001, an auxiliary temperature-reducing chamber fan 1002, an auxiliary temperature-reducing chamber evaporator 1003, and an auxiliary temperature-reducing chamber temperature sensor 1004, and the auxiliary temperature-reducing chamber evaporator 1003 is cooled by the subcooler 4. The control device controls the temperature of the auxiliary cooling chamber 40 to change according to the set temperature change curve within the set residence time of the auxiliary cooling chamber.

Referring to fig. 8 and 11, the auxiliary warming chamber 41 is similar to the second warming chamber 33, the auxiliary warming chamber 41 includes an auxiliary warming chamber case 2001, an auxiliary warming chamber fan 2002, an auxiliary warming chamber electric heater 2003, and an auxiliary warming chamber temperature sensor 2004, and the auxiliary warming chamber heater 2003 supplies heat to the inside of the auxiliary warming chamber case 2001. The control device controls the temperature of the auxiliary temperature raising chamber 41 to change according to a set temperature change curve within the set residence time of the auxiliary temperature raising chamber.

Referring to fig. 2, in another embodiment of the present invention, the high-low temperature test chamber 104 further includes a driving mechanism (not shown) for driving the test objects 105 to stay in the high-temperature chamber 28, the temperature-reducing chamber 29, the second temperature-reducing chamber 30, the low-temperature chamber 31, the temperature-increasing chamber 32, and the second temperature-increasing chamber 33 in sequence for a predetermined time, and then to return to the high-temperature chamber 28 to move in a circulation manner, the driving mechanism may be a plurality of belts driven by a motor, the belt may be disposed inside in the extending direction of the temperature-reducing chamber 29 and the second temperature-reducing chamber 30, the second belt may be disposed inside the extending direction of the temperature-increasing chamber 32 and the second temperature-increasing chamber 33, the third belt may be disposed inside the high-temperature chamber 28 and connected to the front end of the belt and the rear end of the second belt, the fourth belt may be disposed inside the cold-temperature-reducing chamber and connected to the rear end of the belt and the second belt.

Referring to fig. 1 and 2, in another embodiment of the present application, high and low temperature test devices are provided, including a refrigeration device 101 having a subcooler 4, a cold accumulation and release loop 102 having an ice storage water tank 13, and the high and low temperature test box 104, wherein the refrigeration device 101 is used for supplying cold to the low temperature chamber 31, the second temperature reduction chamber 30 and the ice storage water tank 13, and the cold accumulation and release loop 102 is used for storing cold and supplying cold to the subcooler 4, the th temperature reduction chamber 29 and the high temperature chamber 28.

The high-low temperature test chamber 104 is of a multi-chamber structure and comprises a high-temperature chamber 28, an th cooling chamber 29, a second cooling chamber 30, a low-temperature chamber 31, a th heating chamber 32 and a second heating chamber 33, the test object 105 circularly moves in different chambers in the high-low temperature test chamber 104 and can provide high-low temperature alternating environment for the test object 105, no extra energy consumption is generated by the heat capacity due to the stable temperature of the high-temperature chamber 28 and the low-temperature chamber 31, the temperature reduction process is divided into two sections of the th cooling chamber 29 and the second cooling chamber 30, the temperature rise process is divided into two sections of the th heating chamber 32 and the second heating chamber 33, the temperature change of the heat capacities of the cooling chamber and the heating chamber is reduced, so that the extra energy consumption caused by the heat capacity of the cooling chamber and the equipment operation cost are reduced, in the high-low temperature test device, the extra energy consumption caused by the heat capacity of the cooling device 101 is reduced by the adoption of the high-low temperature test chamber 104, and.

Referring to fig. 2, in another embodiment of the present application, an ice storage water tank 13 has an ice storage pipeline and a cold release pipeline which exchange heat with each other, two ends of the ice storage pipeline are respectively an ice storage inlet 13a and an ice storage outlet 13b, and two ends of the cold release pipeline are respectively a cold release inlet 13c and a cold release outlet 13d, a refrigeration device 101 includes a compressor 1 and a condenser 3 which are connected in sequence, a low temperature chamber evaporator 7 arranged in a low temperature chamber tank 601, and a second cooling chamber evaporator 10 for cooling a second cooling chamber 30, an output end of the condenser 3 is connected to an input end 4a of a subcooler 4, and an output end 4b of the subcooler 4 is connected to a refrigeration pipeline, a second refrigeration pipeline and a third refrigeration pipeline;

the th refrigeration pipeline is provided with a th electromagnetic valve 5 and a th thermal expansion valve 6, the tail end of the th refrigeration pipeline is connected to the input end of the low-temperature chamber evaporator 7, the output end of the low-temperature chamber evaporator 7 is connected to the input end of the compressor 1, the th electromagnetic valve 5 is opened, the opening of the th thermal expansion valve 6 is adjusted, and the cold provided by the low-temperature chamber evaporator 7 is controlled.

A second electromagnetic valve 8 and a second thermal expansion valve 9 are arranged on the second refrigeration pipeline, the tail end of the second refrigeration pipeline is connected to the input end of a second temperature reduction chamber evaporator 10, and the output end of the second temperature reduction chamber evaporator 10 is connected to the input end of the compressor 1. And opening the second electromagnetic valve 8, adjusting the opening degree of the second thermal expansion valve 9, and controlling the cooling capacity provided by the second cooling chamber evaporator 10.

A third electromagnetic valve 11 and a third thermal expansion valve 12 are arranged on the third refrigeration pipeline, the tail end of the third refrigeration pipeline is connected to an ice storage inlet 13a of an ice storage water tank 13, and an ice storage outlet 13b of the ice storage water tank 13 is connected to the input end of the compressor 1. And opening the third electromagnetic valve 11, adjusting the opening degree of the third thermal expansion valve 12 and controlling the cold energy supplied to the ice water storage tank 13.

Referring to fig. 2, in another embodiment of the present application, the subcooler 4 has a heat exchange pipeline and a subcooling pipeline for heat exchange with each other, where two ends of the subcooling pipeline are a subcooling inlet 4c and a subcooling outlet 4d, respectively, the cold-storage and cold-releasing loop 102 includes a cold-releasing water pump 14 connected to a cold-releasing outlet 13d of the ice-storage water tank 13, a cold-releasing room cold releaser 19 for cooling the cold-releasing room 29, and a high-temperature room cold releaser 22 for cooling the high-temperature room 28, and an output end of the cold-releasing water pump 14 is connected to a cold-releasing pipeline, a second cold-releasing pipeline, and a third cold-releasing pipeline;

a fourth electromagnetic valve 15 and a flow regulating valve 16 are arranged on the th cold releasing pipeline, the tail end of the th cold releasing pipeline is connected to a supercooling inlet 4c of the subcooler 4, a supercooling outlet 4d of the subcooler 4 is connected to a cold releasing inlet 13c of the ice storage water tank 13, the fourth electromagnetic valve 15 is opened, the opening degree of the th flow regulating valve 16 is regulated, and the flow of the supercooling pipeline entering the subcooler 4 is regulated.

And a fifth electromagnetic valve 17 and a second flow regulating valve 18 are arranged on the second cold release pipeline, and referring to fig. 4, the tail end of the second cold release pipeline is connected to the input end of an th cooling chamber cold release device 19, the output end of a th cooling chamber cold release device 19 is connected to a cold release inlet 13c of the ice storage water tank 13, the fifth electromagnetic valve 17 is opened, the opening degree of the second flow regulating valve 18 is regulated, and the flow entering the th cooling chamber cold release device 19 is regulated.

A sixth electromagnetic valve 20 and a third flow regulating valve 21 are arranged on the third cold releasing pipeline, and referring to fig. 3, the end of the third cold releasing pipeline is connected to the input end of a high-temperature room cold releasing device 22, and the output end of the high-temperature room cold releasing device 22 is connected to the cold releasing inlet 13c of the ice storage water tank 13. And opening the sixth electromagnetic valve 20, adjusting the opening degree of the third flow regulating valve 21, and regulating the flow entering the high-temperature chamber cold release device 22.

Referring to fig. 2, in another embodiment of the present application, a heat recovery unit 2 is connected between a compressor 1 and a condenser 3, the high and low temperature test apparatus further includes a heat recovery circuit 103 for recovering heat of exhaust gas from the compressor 1 and supplying heat to a th heating chamber 32, and the heat recovery circuit 103 is provided to recover and utilize heat of exhaust gas from the compressor 1, thereby improving energy efficiency.

Referring to fig. 2 and 7, in another embodiment of the present invention, the heat recovery unit 2 has a second heat exchange pipeline and a heat recovery pipeline, which exchange heat with each other, the two ends of the heat recovery pipeline are respectively a heat recovery inlet 2a and a heat recovery outlet 2b, the heat recovery circuit 103 includes a hot water tank 23, a heat release water pump 24, a seventh electromagnetic valve 25, a fourth flow regulating valve 26 and a heat release 27, which are connected in sequence, the heat release 27 is used for supplying heat to the th heating chamber 32, the output end of the heat release 27 is connected to the heat recovery inlet 2a of the heat recovery unit 2, and the heat recovery outlet 2b of the heat recovery unit 2 is connected to the input end of the hot water tank 23, the seventh electromagnetic valve 25 is opened, the opening of the fourth flow regulating valve 26 is regulated, and the flow entering the heat release 27 in the .

In another embodiment of the present application, when the high and low temperature test apparatus operates normally, the control apparatus 100 controls the electromagnetic valve 5, the second electromagnetic valve 8, the third electromagnetic valve 11, the fourth electromagnetic valve 15, the fifth electromagnetic valve 17, the sixth electromagnetic valve 20, and the seventh electromagnetic valve 25 to be in an open state.

Referring to fig. 2 to 8, in another embodiment of the present application, a method for controlling high and low temperature test apparatuses is provided, comprising the steps of:

when the test object 105 is in the high temperature chamber 28, the high temperature chamber 302 and the low temperature chamber 602 are closed, and the temperature of the high temperature chamber 28 is controlled to change according to the set temperature change curve of the high temperature chamber 28 within the set residence time of the high temperature chamber;

after the residence time of the test object 105 in the high-temperature chamber reaches a set value, the high-temperature chamber 302 is opened, the test object 105 is moved into the cooling chamber 29, the high-temperature chamber 302 is closed, the temperature of the cooling chamber 29 is controlled to change according to a set temperature change curve within the set residence time of the cooling chamber, and specifically, the temperature change of the high-temperature chamber 28 is controlled by adjusting the air volume of the high-temperature chamber fan 303, the power of the high-temperature chamber electric heater 304, the flow rate of the cold release water pump 14 and the opening degree of the third flow regulating valve 21.

After the residence time of the test object 105 in the th temperature reduction chamber reaches the set value, the test object 105 is moved into the second temperature reduction chamber 30, the temperature of the second temperature reduction chamber 30 is controlled to change according to the set temperature change curve in the set residence time of the second temperature reduction chamber 30, and the temperature change of the th temperature reduction chamber 29 is controlled by adjusting the air volume of the th temperature reduction chamber fan 402 and the opening degree of the second flow control valve 18.

After the residence time of the test object 105 in the second temperature reduction chamber 30 reaches the set value, the low temperature chamber 602 is opened, the test object 105 is moved into the low temperature chamber 31, the low temperature chamber 602 is closed, the temperature of the low temperature chamber 31 is controlled to change according to the set temperature change curve of the low temperature chamber 31 within the set residence time of the low temperature chamber, and the temperature change of the second temperature reduction chamber 30 is specifically controlled by adjusting the air volume of the second temperature reduction chamber fan 502 and the opening degree of the second thermal expansion valve 9.

After the residence time of the test object 105 in the low-temperature chamber reaches the set value, the low-temperature chamber 602 is opened, the test object 105 is moved into the th heating chamber 32, the low-temperature chamber 602 is closed, the temperature of the th heating chamber 32 is controlled to change according to the set temperature change curve within the set residence time of the th heating chamber, and the temperature change of the th heating chamber 32 is controlled by specifically adjusting the air volume of the th heating chamber fan 702, the flow of the heat release water pump 24 and the opening of the fourth flow adjusting valve 26.

After the residence time of the test object 105 in the th heating chamber is closed to reach the set value, the test object 105 is moved into the second heating chamber 33, and the second heating chamber 33 is controlled to change according to the set temperature change curve in the set residence time of the second heating chamber, specifically, the temperature change in the second heating chamber 33 is controlled by adjusting the air volume of the second heating chamber fan 802 and the power of the second heating chamber electric heater 803.

After the residence time of the test object 105 in the second temperature-increasing chamber reaches the set value, the high-temperature chamber 302 is opened, the test object 105 is moved into the high-temperature chamber 28, and the high-temperature chamber 302 is closed.

Since the control method of the high and low temperature test apparatus adopts all technical solutions of all the embodiments, all the beneficial effects brought by the technical solutions of the embodiments are also achieved, and are not repeated at .

In another embodiment of the present application, assuming that the test object 105 is used for alternating temperature control of 60 ℃ and-20 ℃, the high temperature constant temperature time and the low temperature constant temperature time are both set to be 2h, the temperature reduction time and the temperature rise time are both 10min, the temperature reduction process and the temperature rise process are both linear changes, the ice storage water tank 13 uses ice as a cold storage agent, water as a secondary refrigerant, and the test object generates heat only in the high temperature constant temperature time and the low temperature constant temperature time.

In the present embodiment, the stay time of the test object 105 in the high temperature chamber 28 is the same as the high temperature constant temperature time, i.e., the high temperature constant temperature process in the high temperature chamber 28, the total stay time and the temperature decrease time in the th temperature decrease chamber 29 and the second temperature decrease chamber 30 are the same, the stay time and the low temperature constant temperature time in the low temperature chamber 31 are the same, i.e., the low temperature constant temperature process in the low temperature chamber 31, and the total stay time and the temperature increase time in the th temperature increase chamber 32 and the second temperature increase chamber 33 are the same.

Assuming that the test object 105 is first placed in the high temperature chamber 28 and the initial zero time is set, the control device 100 controls the stay time of the test object 105 in the high temperature chamber 28 to be 2 hours.

When the time reaches 2h, the high temperature chamber 302 is opened, the test object 105 is moved into the cooling chamber 29, the high temperature chamber 302 is closed, and the test object 105 stays in the cooling chamber 29 for 5 min.

When the time reaches 2h5min, the test object 105 is moved into the second cooling chamber 30 and stays for 5 min.

When the time reaches 2h10min, the low temperature chamber 602 is opened, the test object 105 is moved into the low temperature chamber 31, the low temperature chamber 602 is closed, and the test object 105 stays in the low temperature chamber 31 for 2 h.

When the time reaches 4h10min, the low temperature chamber 602 is opened, the test object 105 is moved into the th warming chamber 32, the low temperature chamber 602 is closed, and the test object 105 stays in the th warming chamber 32 for 5 min.

When the time reaches 4h15min, the test object 105 is moved into the second warming chamber 33 and stays for 5 min.

When the time reaches 4h20min, the high temperature chamber 302 is opened, the test object 105 is moved into the high temperature chamber 28, the high temperature chamber 302 is closed, and test cycles are completed.

The foregoing cycle is repeated until the total test time is reached. The temperature control method is as before.

In the present embodiment, the stay time of the test object 105 in the high temperature chamber 28 is different from the high temperature constant temperature time, that is, the high temperature constant temperature process is not completed in the high temperature chamber 28, the total stay time and the temperature decrease time in the th temperature decrease chamber 29 and the second temperature decrease chamber 30 are different, the stay time and the low temperature constant temperature time in the low temperature chamber 31 are different from the low temperature constant temperature process is not completed in the low temperature chamber 31, and the total stay time and the temperature increase time in the th temperature increase chamber 32 and the second temperature increase chamber 33 are different.

Assuming that the test object 105 is first placed in the high temperature chamber 28 and the initial zero time is set, the control device 100 controls the stay time of the test object 105 in the high temperature chamber 28 to be 2h9min50 s.

When the time reaches 2h9min50s, the high temperature chamber 302 is opened, the test object 105 is moved into the cooling chamber 29, the high temperature chamber 302 is closed, and the test object 105 stays in the cooling chamber 29 for 5 s.

When the time reaches 2h9min55s, the test object 105 is moved into the second temperature reduction chamber 30, staying for 5 s.

When the time reaches 2h10min, the low-temperature chamber 602 is opened, the test object 105 is moved into the low-temperature chamber 31, the low-temperature chamber 602 is closed, and the test object 105 stays in the low-temperature chamber 31 for 2h9min50 s.

When the time reaches 4h19min50s, the low temperature chamber 602 is opened, the test objects 105 are moved into the th warming chamber 32, the low temperature chamber 602 is closed, and the test objects 105 stay in the th warming chamber 32 for 5 s.

When the time reached 4h19min55s, the test object 105 was moved into the second warming chamber 33 and left for 5 s.

In another embodiment of the present application, extreme conditions are provided in which the total residence time in the th temperature-reducing chamber 29 and the second temperature-reducing chamber 30 is much less than the cool-down time and the total residence time in the th temperature-reducing chamber 32 and the second temperature-reducing chamber 33 is much less than the warm-up time, hi this extreme condition, the th temperature-reducing chamber 29, the second temperature-reducing chamber 30, the th temperature-reducing chamber 32, and the second temperature-reducing chamber 33 function as a rapid movement path for the test object 105.

In another embodiment, test objects 105 are extended to two identical test objects 105, with the same test requirements, and at the initial zero time, test objects 105 are placed in the high temperature chamber 28, and test objects 105 are placed in the low temperature chamber 31, and can still be tested using the high and low temperature test chamber 104 of the present application.

The present invention is not intended to be limited to the particular embodiments shown and described, but is to be accorded the widest scope consistent with the principles and novel features herein disclosed.

Claims

The high-low temperature test chamber of kinds, its characterized in that includes:

the high-temperature chamber is used for accommodating a test object and heating or cooling the test object, and comprises a high-temperature chamber box body and a high-temperature chamber arranged on the high-temperature chamber box body;

an th cooling chamber for receiving and cooling test objects from the high temperature chamber;

a second temperature reduction chamber for receiving and cooling the test objects from the th temperature reduction chamber, the second temperature reduction chamber being disposed adjacent to the th temperature reduction chamber;

a low-temperature chamber for accommodating the test object from the second temperature reduction chamber and heating or cooling the test object, wherein the low-temperature chamber comprises a low-temperature chamber box body and a low-temperature chamber arranged on the low-temperature chamber box body;

an th heating chamber for receiving and heating the test object from the low temperature chamber;

a second warming chamber for accommodating and heating the test object from the th warming chamber, the second warming chamber being disposed adjacent to the th warming chamber, and

and a control device for controlling the temperature of the high-temperature chamber, the th cooling chamber, the second cooling chamber, the low-temperature chamber, the th heating chamber and the second heating chamber to change according to a set change curve.
2. The high-low temperature test chamber as claimed in claim 1, wherein the high temperature chamber further comprises a high temperature chamber blower for providing an air flow to the inside of the high temperature chamber housing, a high temperature chamber electric heater provided in the high temperature chamber housing, and a high temperature chamber temperature sensor for detecting the temperature of the high temperature chamber housing;

and/or the th cooling chamber comprises a th cooling chamber box body, a th cooling chamber fan for providing air flow to the interior of the th cooling chamber box body, and a th cooling chamber temperature sensor for detecting the temperature of the th cooling chamber box body;

and/or the second cooling chamber comprises a second cooling chamber box body, a second cooling chamber fan used for providing air flow for the interior of the second cooling chamber box body, and a second cooling chamber temperature sensor used for detecting the temperature of the second cooling chamber box body;

and/or the low-temperature chamber also comprises a low-temperature chamber fan for providing airflow inside the low-temperature chamber box body, a low-temperature chamber electric heater arranged in the low-temperature chamber box body, and a low-temperature chamber temperature sensor for detecting the temperature of the low-temperature chamber box body;

and/or the th warming chamber comprises a th warming chamber box, a th warming chamber fan for providing air flow to the interior of the th warming chamber box, and a th warming chamber temperature sensor for detecting the temperature of the th warming chamber box;

and/or the second warming chamber comprises a second warming chamber box body, a second warming chamber fan used for providing air flow for the interior of the second warming chamber box body, a second warming chamber electric heater arranged in the second warming chamber box body, and a second warming chamber temperature sensor used for detecting the temperature of the second warming chamber box body.
3. A high-low temperature test chamber as claimed in claim 1, wherein the opening of the high temperature chamber faces the inlet of the temperature-reducing chamber, the outlet of the temperature-reducing chamber communicates with the inlet of the second temperature-reducing chamber, and the outlet of the second temperature-reducing chamber faces the opening of the low temperature chamber;

and/or the opening of the low-temperature chamber faces the inlet of the th heating chamber, the outlet of the th heating chamber is communicated with the inlet of the second heating chamber, and the outlet of the second heating chamber faces the opening of the high-temperature chamber.
4. A high-low temperature test chamber as claimed in any , wherein at least auxiliary temperature-reducing chambers are arranged between the second temperature-reducing chamber and the low-temperature chamber, and the control device is further used for controlling the temperature of the auxiliary temperature-reducing chambers to change according to a set change curve;

and/or at least auxiliary temperature raising chambers are arranged between the second temperature raising chamber and the high temperature chamber, and the control device is also used for controlling the temperature of the auxiliary temperature raising chambers to change according to a set change curve.
5. The high-low temperature test chamber as claimed in , wherein the high-low temperature test chamber further comprises a driving mechanism for driving the test object to stay in the high-temperature chamber, the temperature-reducing chamber, the second temperature-reducing chamber, the low-temperature chamber, the temperature-raising chamber and the second temperature-raising chamber for respective set time in sequence and then return to the high-temperature chamber for circulating movement.
6, high and low temperature test device, which is characterized in that the device comprises a refrigerating device with a subcooler, a cold accumulation and release loop with an ice storage water tank and the high and low temperature test box as claimed in any of claims 1 to 5, wherein the refrigerating device is used for supplying cold to the low temperature chamber, the second cooling chamber and the ice storage water tank, and the cold accumulation and release loop is used for storing cold and supplying cold to the subcooler, the th cooling chamber and the high temperature chamber.
7. The high and low temperature test device as claimed in claim 6, wherein the ice storage water tank has an ice storage pipeline and a cold release pipeline which exchange heat with each other, the two ends of the ice storage pipeline are respectively an ice storage inlet and an ice storage outlet, and the two ends of the cold release pipeline are respectively a cold release inlet and a cold release outlet;

the refrigerating device comprises a compressor, a condenser, a low-temperature chamber evaporator and a second cooling chamber evaporator, wherein the compressor and the condenser are sequentially connected, the low-temperature chamber evaporator is arranged in the low-temperature chamber box, and the second cooling chamber evaporator is used for supplying cold to the second cooling chamber;

a electromagnetic valve and a thermal expansion valve are arranged on the th refrigeration pipeline, the tail end of the th refrigeration pipeline is connected to the input end of the low-temperature chamber evaporator, and the output end of the low-temperature chamber evaporator is connected to the input end of the compressor;

a second electromagnetic valve and a second thermal expansion valve are arranged on the second refrigeration pipeline, the tail end of the second refrigeration pipeline is connected to the input end of the second temperature reduction chamber evaporator, and the output end of the second temperature reduction chamber evaporator is connected to the input end of the compressor;

and a third electromagnetic valve and a third thermal expansion valve are arranged on the third refrigeration pipeline, the tail end of the third refrigeration pipeline is connected to an ice storage inlet of the ice storage water tank, and an ice storage outlet of the ice storage water tank is connected to the input end of the compressor.
8. The high and low temperature test device as claimed in claim 7, wherein the subcooler has th heat exchange pipeline and subcooling pipeline which exchange heat with each other, and the two ends of the subcooling pipeline are respectively a subcooling inlet and a subcooling outlet;

the cold accumulation and release loop comprises a release water pump connected with a release outlet of the ice storage water tank, a cooling room cold release device used for cooling the cooling room, and a high temperature room cold release device used for cooling the high temperature room, wherein the output end of the release water pump is connected with a cold release pipeline, a second cold release pipeline and a third cold release pipeline;

a fourth electromagnetic valve and a flow regulating valve are arranged on the th cold releasing pipeline, the tail end of the th cold releasing pipeline is connected to a supercooling inlet of the subcooler, and a supercooling outlet of the subcooler is connected to a cold releasing inlet of the ice storage water tank;

a fifth electromagnetic valve and a second flow regulating valve are arranged on the second cold release pipeline, the tail end of the second cold release pipeline is connected to the input end of the th cooling chamber cold release device, and the output end of the th cooling chamber cold release device is connected to the cold release inlet of the ice storage water tank;

a sixth electromagnetic valve and a third flow regulating valve are arranged on the third cold releasing pipeline, the tail end of the third cold releasing pipeline is connected to the input end of the high-temperature chamber cold releasing device, and the output end of the high-temperature chamber cold releasing device is connected to the cold releasing inlet of the ice storage water tank.
9. The high and low temperature test device as claimed in claim 7, wherein a heat recovery device is connected between the compressor and the condenser, and the high and low temperature test device further comprises a heat recovery loop for recovering the heat of the exhaust gas of the compressor and supplying heat to the th warming chamber;

the heat recovery device is provided with a second heat exchange pipeline and a heat recovery pipeline which exchange heat with each other, and two ends of the heat recovery pipeline are respectively a heat recovery inlet and a heat recovery outlet;

the heat recovery loop comprises a hot water tank, a heat release water pump, a seventh electromagnetic valve, a fourth flow regulating valve and a heat release device which are sequentially connected, the heat release device is used for supplying heat to the th heating chamber, the output end of the heat release device is connected to the heat recovery inlet of the heat recoverer, and the heat recovery outlet of the heat recoverer is connected to the input end of the hot water tank.
10. The method for controlling a high and low temperature test apparatus as claimed in any of claims 6 to 9, comprising the steps of:

when the test object is in the high-temperature chamber, closing the high-temperature chamber and the low-temperature chamber , and controlling the temperature of the high-temperature chamber to change according to a set high-temperature chamber temperature change curve within a set high-temperature chamber residence time;

after the residence time of the test object in the high-temperature chamber reaches a set value, the high-temperature chamber is opened, the test object is moved into the cooling chamber, the high-temperature chamber is closed, and the temperature of the cooling chamber is controlled to change according to a set temperature change curve within the set residence time of the cooling chamber;

after the residence time of the test object in the th cooling chamber reaches a set value, moving the test object into the second cooling chamber, and controlling the temperature of the second cooling chamber to change according to a set temperature change curve within the set residence time of the second cooling chamber;

after the residence time of the test object in the second cooling chamber reaches a set value, the low-temperature chamber is opened, the test object is moved into the low-temperature chamber, the low-temperature chamber is closed, and the temperature of the low-temperature chamber is controlled to change according to a set low-temperature chamber temperature change curve within the set residence time of the low-temperature chamber;

after the residence time of the test object in the low-temperature chamber reaches a set value, the low-temperature chamber is opened, the test object is moved into the th heating chamber, the low-temperature chamber is closed, and the temperature of the th heating chamber is controlled to change according to a set temperature change curve within the set residence time of the th heating chamber;

after the residence time of the test object in the th heating chamber is closed to reach a set value, the test object is moved into the second heating chamber, and the second heating chamber is controlled to change according to a set temperature change curve within the residence time of the set second heating chamber;

after the residence time of the test object in the second temperature rising chamber reaches a set value, the high temperature chamber is opened, the test object is moved into the high temperature chamber, and the high temperature chamber is closed.