CN110726925A - Multi-channel jitter injection calibration device and method - Google Patents
Multi-channel jitter injection calibration device and method Download PDFInfo
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- CN110726925A CN110726925A CN201910930224.5A CN201910930224A CN110726925A CN 110726925 A CN110726925 A CN 110726925A CN 201910930224 A CN201910930224 A CN 201910930224A CN 110726925 A CN110726925 A CN 110726925A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2853—Electrical testing of internal connections or -isolation, e.g. latch-up or chip-to-lead connections
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2884—Testing of integrated circuits [IC] using dedicated test connectors, test elements or test circuits on the IC under test
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2893—Handling, conveying or loading, e.g. belts, boats, vacuum fingers
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Abstract
The invention relates to the technical field of integrated circuit testing, in particular to a multi-channel jitter injection calibration device; the high-speed channel switching system is used for appointing any channel to establish channel connection; the calibration interface board sends the continuous square wave signal with the duty ratio of 50% output by the integrated circuit testing system to the signal source analyzer through the channel; the signal source analyzer analyzes and calculates square wave signals to finish the calibration of the channel jitter injection parameters; the upper computer is used for respectively sending corresponding control instructions to the high-speed channel switching system, the signal source analyzer and the integrated circuit testing system and sequentially calibrating jitter injection parameters of all channels; the embodiment of the invention controls the high-speed channel switching system to sequentially designate different channels through the upper computer, simultaneously sends an instruction to the integrated circuit testing system to output a square wave signal through the designated channel, and simultaneously controls the signal source analyzer to measure the jitter injection on the designated channel, thereby realizing the quantitative measurement of the multi-channel jitter injection.
Description
Technical Field
The invention relates to the technical field of integrated circuit testing, in particular to a multi-channel jitter injection calibration device and method.
Background
Calibration of integrated circuit test systems is an important component of microelectronics metrology, and only calibrated integrated circuit test systems ensure that their reproduced quantities are related to reference quantities by a chain of sources of known uncertainty.
Jitter injection is a redundancy test for measuring a high-speed digital signal, and is to artificially insert a fixed periodic jitter into an ideal high-speed digital signal and is used for measuring the tolerance of the ideal high-speed digital signal to a bad signal; the integrated circuit test system has 16 high-speed digital channels and dozens of hundreds of high-speed digital channels, and the jitter injection of each channel needs to be measured to finish the calibration of all the channels.
The defects of the prior art are as follows:
1. the measurement work is greatly challenged by utilizing the instrument to calibrate each channel one by one; the switching of the channels can increase the calibration time, and the ultra-large scale digital integrated circuit test system is generally high in cost and heavy in task, and a large amount of time is not practical for calibration work;
2. at present, a reliable magnitude tracing method is lacked in jitter injection, so that a certain risk exists in high-speed I/O test by using an integrated circuit test system.
Disclosure of Invention
In order to overcome the defects in the prior art, the embodiment of the invention provides a multi-channel jitter injection calibration device and a method; the method breaks through the limitation of qualitative verification of the traditional method and realizes the quantitative measurement of multi-channel jitter injection of the test system of the integrated circuit test system.
In one aspect, an embodiment of the present invention provides a multi-channel jitter injection calibration apparatus, including:
the high-speed channel switching system is used for appointing any channel to establish channel connection;
the calibration interface board sends the continuous square wave signal with the duty ratio of 50% output by the integrated circuit testing system to the signal source analyzer through the channel;
the signal source analyzer analyzes and calculates the square wave signal to finish the calibration of the channel jitter injection parameters;
and the upper computer is used for respectively sending corresponding control instructions to the high-speed channel switching system, the signal source analyzer and the integrated circuit testing system and sequentially calibrating jitter injection parameters of all channels.
In another aspect, an embodiment of the present invention provides a calibration method for multi-channel jitter injection, including the following steps:
s1, appointing any path channel to establish channel connection;
s2, receiving a continuous square wave signal with a duty ratio of 50% through the channel;
s3, analyzing and calculating the square wave signal to finish the calibration of the channel jitter injection parameters;
and S4, repeating the steps from S1 to S3, and calibrating all channel jitter injection parameters.
The embodiment of the invention provides a multichannel jitter injection calibration device and method, wherein an upper computer is used for controlling a high-speed channel switching system to sequentially designate different channels, sending an instruction to an integrated circuit test system to output a square wave signal containing a certain jitter injection and having a duty ratio of 50% through the designated channels, and simultaneously controlling a signal source analyzer to measure the jitter injection on the designated channels, so that the limitation of qualitative verification of the traditional method is broken through, and the quantitative measurement of the multichannel jitter injection of the high-speed test system is realized.
Drawings
In order to more clearly illustrate the technical solution of the present invention, the drawings needed to be used in the technical description of the present invention will be briefly introduced below, and it is apparent that the drawings in the following description are only some embodiments of the present invention, and it is obvious for those skilled in the art that other drawings can be obtained according to the drawings without inventive labor.
FIG. 1 is a schematic structural diagram of a multi-channel jitter injection calibration apparatus according to an embodiment of the present invention;
FIG. 2 is a schematic diagram of a high-speed channel switching system of the multi-channel jitter injection calibration apparatus according to an embodiment of the present invention;
FIG. 3 is a flowchart illustrating a multi-channel jitter injection calibration method according to an embodiment of the present invention;
FIG. 4 is a sub-flow diagram of a multi-channel jitter injection calibration method according to an embodiment of the present invention;
reference numerals:
upper computer-1 high-speed channel switching system-2 calibration interface board-3
Signal source analyzer-4 integrated circuit testing system-5 main control computer-51
High speed digital channel-52 digital control module-21 high speed signal channel-22
Power module-23 signal interface-24.
Detailed Description
In order to make the objects, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are some, but not all, embodiments of the present invention. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
FIG. 1 is a schematic structural diagram of a multi-channel jitter injection calibration apparatus according to an embodiment of the present invention; as shown in fig. 1, includes:
the high-speed channel switching system 2 appoints any channel to establish channel connection;
the calibration interface board 3 sends the continuous square wave signal with the duty ratio of 50% output by the integrated circuit testing system 5 to the signal source analyzer through the channel;
the signal source analyzer 4 analyzes and calculates the square wave signal to finish the calibration of the channel jitter injection parameters;
and the upper computer 1 sends corresponding control instructions to the high-speed channel switching system 2, the signal source analyzer 4 and the integrated circuit testing system 5 respectively, and sequentially calibrates jitter injection parameters of all channels.
Specifically, a high-speed digital channel 52pogo pin of the integrated circuit test system 5 to be calibrated is led out to a group of radio frequency connectors through the calibration interface board 3, the calibration interface board 3 is directly installed above the integrated circuit test system 5, the high-speed digital channel 52 of the integrated circuit test system 5 is directly led out to a group of 2.92mm interfaces on the calibration interface board 3 in an equal-length wiring mode, and 50ohm impedance wiring is adopted on the calibration interface board 3. The calibration cable adopts a group of radio frequency cables with equal length, the bandwidth is more than 25GHz, then the calibration cable is connected to the input end of the high-speed channel switching system 2, and the output end of the high-speed channel switching system 2 is connected with the signal source analyzer 4 through the calibration cable. The upper computer 1 establishes communication connection with a signal source analyzer, a high-speed channel switching system and a main control computer of the integrated circuit testing system 5 through communication buses respectively; the calibration software running on the upper computer 1 controls the high-speed channel switching system 2 to select any one channel, simultaneously sends an instruction to a main control computer 51 calibration auxiliary control program of the integrated circuit testing system 5, controls a high-speed digital channel 52 of the integrated circuit testing system 5 to send a square wave signal containing a certain jitter injection and having a duty ratio of 50%, and measures the jitter injection on a specified channel to the control signal source analyzer 4; thereby completing the calibration of all channel jitter injection in turn.
The embodiment of the invention provides a multi-channel jitter injection calibration device, which controls a high-speed channel switching system to sequentially designate different channels through an upper computer, simultaneously sends an instruction to an integrated circuit test system to output a square wave signal containing a certain jitter injection and having a duty ratio of 50% through the designated channel, and simultaneously controls a signal source analyzer to measure the jitter injection on the designated channel, breaks through the limitation of the traditional method on qualitative verification, and realizes the quantitative measurement of the multi-channel jitter injection of the high-speed test system.
Further, fig. 2 is a schematic structural diagram of a high-speed channel switching system of the multi-channel jitter injection calibration apparatus according to the embodiment of the present invention; as shown in fig. 2, the high-speed channel switching system 2 includes:
a high-speed signal path 22, which is composed of a high-performance radio frequency switch, a high-performance radio frequency cable and a connector and transmits complete high-speed signals;
the digital control module 21 is used for finishing the communication with the upper computer and controlling the high-speed switch; decoding a received channel connection control instruction and converting the channel connection control instruction into a switching control operation of a corresponding channel;
a signal interface 24 comprising at least 16 input channels and 1 output channel;
and the power supply module 23 is used for providing stable working voltage required by digital control and high-speed switching.
Specifically, the seamless switching between the high-speed channel switching system 2 and the signal source analyzer realizes the full-automatic calibration of jitter injection, the topological structure should be larger than 1 × 16, the bandwidth is larger than 25GHz, and the jitter is smaller than 10 ps. The high-speed channel signal switching system 2 consists of a high-speed signal path 22, a digital control module 21, a power supply module 23 and a signal interface 24; the high-speed signal path is a core part of the high-speed signal path and is formed by a high-performance radio frequency switch, a high-performance radio frequency cable and a connector, the high-speed signal path does not need to pass through a PCB single board, and the problem of signal integrity such as extra crosstalk, insertion loss and return loss caused by impedance discontinuity of the signal path passing through the PCB is avoided; the radio frequency switch adopts a Keysight L7204C one-out-of-four high-speed switch, the bandwidth is 26.5GHz, and the bandwidth of the radio frequency cable and the connector is 26.5 GHz. The requirement of high-performance test is met, and a simple topological connection relation is adopted, so that devices such as a power divider with a loss signal or one-to-many connectors are avoided. In order to ensure the stability and undistortion of signals, the total length in each signal path radio frequency cable case does not exceed 1M. The digital control module 21 mainly comprises a PC control interface and a high-speed switch selection control logic circuit. The PC control interface comprises a corresponding control main board and a connection control cable, is used for finishing the communication with the upper computer 1 and the control function of the high-speed switch, and decodes an upper computer channel control instruction received by the RS232 interface and converts the upper computer channel control instruction into a corresponding channel switching control operation; the power supply module mainly provides stable working voltage required by digital control and high-speed switching; the signal interface comprises 16 input channels and 1 output channel, and the input channels and the output channels are introduced by adopting 2.92mm connectors.
Further, the signal source analyzer 4 specifically includes: receiving a measurement control instruction of jitter injection on the channel; collecting the frequency spectrum of the channel output square wave signal, and measuring 0-order Bessel component J of the signal frequency spectrum0And Bessel component J of order 11And calculate J1/J0The ratio of (A) to (B); obtaining the jitter injection measurement value t by looking up a table by using a Bessel function ratio methodjxInjecting the jitter into the measurementValue tjxAnd jitter injection setting tj0A comparison is made. Specifically, the frequency spectrum of the square wave signal on the corresponding channel is calculated and analyzed according to a measurement control instruction sent by the upper computer 1.
Furthermore, the upper computer also comprises a hardware error compensation technology which is adopted to comprehensively evaluate the uncertainty introduced by the test loop and the measuring instrument, and compensation is carried out in the calibration process. Specifically, calibration software operated by the upper computer 1 optimizes the performance of the multi-channel jitter injection calibration device by adopting a hardware error compensation technology; the signal source analyzer 4 measures errors, the calibration interface board 3, the calibration cable, the high-speed channel switching system 2 and the like, which bring certain errors to the jitter injection measurement result, and measures the impedance from the signal source channel to the high-speed digital channel pogo pin of the tested system through the TDR technology, thereby ensuring that the impedance of the whole loop (the calibration cable, the high-speed channel switching system and the interface) is matched with 50ohm impedance in the jitter injection measurement process; therefore, the influence of a loop between a signal source analyzer and a channel of a tested system on the performance of the whole calibration device is eliminated, the uncertainty introduced by the test loop and the measuring instrument is comprehensively evaluated, and compensation is carried out in the calibration process.
The embodiment of the invention provides a multi-channel jitter injection calibration device, which is characterized in that a high-speed channel switching system is controlled by an upper computer to sequentially designate different channels, simultaneously an instruction is sent to an integrated circuit test system, a square wave signal with a certain jitter injection duty ratio of 50% is output through the designated channel, and a signal source analyzer is controlled to measure the jitter injection on the designated channel, so that the limitation of the traditional method qualitative verification is broken through, and the quantitative measurement of the multi-channel jitter injection of the high-speed test system is realized; the high-speed dynamic performance of the test system can be accurately evaluated, and a foundation is laid for the quantity value tracing of the high-speed digital channel of the test system.
FIG. 3 is a flowchart illustrating a multi-channel jitter injection calibration method according to an embodiment of the present invention; as shown in fig. 3, the method comprises the following steps:
s1, appointing any path channel to establish channel connection;
s2, receiving a continuous square wave signal with a duty ratio of 50% through the channel;
s3, analyzing and calculating the square wave signal to finish the calibration of the channel jitter injection parameters;
and S4, repeating the steps from S1 to S3, and calibrating all channel jitter injection parameters.
Specifically, a channel connection of any channel is established, an integrated circuit test system calibration auxiliary control program sets corresponding level, graph and time sequence parameters, then a continuous square wave signal with a duty ratio of 50% is output, and a certain frequency amplitude t is inserted into the output signalj0Sending the sine jitter to a signal source analyzer through the established channel, and analyzing and calculating the frequency spectrum signal of the square wave signal output by the channel by the signal source analyzer to finish the calibration of the channel jitter injection parameters; selecting the next channel through calibration software again, measuring the jitter injection of the next channel and calculating errors to finish the calibration of the jitter injection parameters of the next channel; and similarly, obtaining error values of all jitter injection measurement of the high-speed channel of the integrated circuit test system, thereby realizing full-channel calibration of jitter injection of the integrated circuit test system.
The embodiment of the invention provides a multichannel jitter injection calibration method, which is characterized in that a high-speed channel switching system is controlled by an upper computer to sequentially designate different channels, simultaneously an instruction is sent to an integrated circuit test system to output a square wave signal containing a certain jitter injection and with the duty ratio of 50% through the designated channel, and a signal source analyzer is controlled to measure the jitter injection on the designated channel, so that the limitation of the traditional method qualitative verification is broken through, and the quantitative measurement of the multichannel jitter injection of the high-speed test system is realized.
Further, step S1 further includes a switching control operation of decoding the received channel connection control instruction and converting the decoded channel connection control instruction into a corresponding channel; the complete high-speed signal is transmitted. The high-speed signal path does not need to pass through a PCB single board, and the problem of signal integrity such as extra crosstalk, insertion loss, return loss and the like caused by impedance discontinuity of the signal path passing through the PCB is avoided.
Further, fig. 4 is a schematic view of a sub-flow of a multi-channel jitter injection calibration method according to an embodiment of the present invention; as shown in figure 4 of the drawings,
the step S3 specifically includes:
s31, receiving a measurement control instruction of jitter injection on the channel;
s32, collecting the frequency spectrum of the channel output square wave signal, and measuring the 0 th order Bessel component J of the signal frequency spectrum0And Bessel component J of order 11And calculate J1/J0The ratio of (A) to (B);
s33, obtaining the jitter injection measured value t by using Bessel function ratio method table lookupjxInjecting the jitter into the measured value tjxAnd jitter injection setting tj0A comparison is made.
For example, the 1 st channel is selected and channel connection is established through a measurement control instruction sent by calibration software, and the 1 st channel of the high-speed channel of the integrated circuit test system is connected with a signal source analyzer. The signal source analyzer collects the frequency spectrum signal of the output waveform and measures the 0 th order Bessel component J of the signal frequency spectrum0And Bessel component J of order 11And calculate J1/J1Using Bessel function ratio method to look up table to obtain jitter injection value tjx. Injecting jitter into the measured value tjxAnd jitter injection setting tj0Comparing, and calibrating the 1 st path jitter injection parameters of the high-speed channel of the integrated circuit test system; and selecting the 2 nd channel again through calibration software, measuring jitter injection and calculating errors to finish the calibration of jitter injection parameters of the 2 nd channel.
Further, step S4 includes using a hardware error compensation technique to comprehensively evaluate the uncertainty introduced by the test loop and the measurement instrument, and performing compensation during the calibration process. The signal source analyzer can bring certain errors to the jitter injection measurement result due to measurement errors of the signal source analyzer, a calibration interface board, a calibration cable, a high-speed channel switching system and the like, comprehensively evaluates uncertainty introduced by a test loop and a measurement instrument, and compensates in the calibration process.
The embodiment of the invention provides a multi-channel jitter injection calibration method, which comprises the steps of sequentially appointing different paths by controlling a high-speed channel switching system, simultaneously sending an instruction to an integrated circuit test system to output a square wave signal containing a certain jitter injection and having a duty ratio of 50% through the appointed paths, and simultaneously controlling a signal source analyzer to measure the jitter injection on the appointed channel, thereby breaking through the limitation of the traditional method on qualitative verification and realizing the quantitative measurement of the multi-channel jitter injection of the high-speed test system; the high-speed dynamic performance of the test system can be accurately evaluated, and a foundation is laid for the quantity value tracing of the high-speed digital channel of the test system.
The above-described embodiments of the apparatus are merely illustrative, and the units described as separate parts may or may not be physically separate, and parts displayed as units may or may not be physical units, may be located in one place, or may be distributed on a plurality of network units. Some or all of the modules may be selected according to actual needs to achieve the purpose of the solution of the present embodiment. One of ordinary skill in the art can understand and implement it without inventive effort.
Through the above description of the embodiments, those skilled in the art will clearly understand that each embodiment can be implemented by software plus a necessary general hardware platform, and certainly can also be implemented by hardware. With this understanding in mind, the above-described technical solutions may be embodied in the form of a software product, which can be stored in a computer-readable storage medium such as ROM/RAM, magnetic disk, optical disk, etc., and includes instructions for causing a computer device (which may be a personal computer, a server, or a network device, etc.) to execute the methods described in the embodiments or some parts of the embodiments.
Finally, it should be noted that: the above examples are only intended to illustrate the technical solution of the present invention, but not to limit it; although the present invention has been described in detail with reference to the foregoing embodiments, it will be understood by those of ordinary skill in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some technical features may be equivalently replaced; and such modifications or substitutions do not depart from the spirit and scope of the corresponding technical solutions of the embodiments of the present invention.
Claims (8)
1. A multi-channel dither injection calibration apparatus, comprising:
the high-speed channel switching system (2) appoints any channel to establish channel connection;
the calibration interface board (3) is used for sending the continuous square wave signal with the duty ratio of 50% output by the integrated circuit testing system (5) to the signal source analyzer through the channel;
the signal source analyzer (4) is used for analyzing and calculating the square wave signal to finish the calibration of the channel jitter injection parameters;
and the upper computer (1) is used for respectively sending corresponding control instructions to the high-speed channel switching system (2), the signal source analyzer (4) and the integrated circuit testing system (5) and sequentially calibrating jitter injection parameters of all channels.
2. A multi-channel jitter injection calibration device according to claim 1, wherein the high-speed channel switching system (2) comprises:
the high-speed signal path (22) is composed of a high-performance radio frequency switch, a high-performance radio frequency cable and a connector and transmits complete high-speed signals;
the digital control module (21) is used for finishing the communication with the upper computer and controlling the high-speed switch; decoding a received channel connection control instruction and converting the channel connection control instruction into a switching control operation of a corresponding channel;
a signal interface (24) comprising at least 16 input channels and 1 output channel;
and the power supply module (23) is used for providing stable working voltage required by digital control and high-speed switching.
3. A multi-channel jitter injection calibration device according to claim 1, wherein the signal source analyzer (4) comprises: receiving measurement control instructions for jitter injection on the channel(ii) a Collecting the frequency spectrum of the channel output square wave signal, and measuring 0-order Bessel component J of the signal frequency spectrum0And Bessel component J of order 11And calculate J1/J0The ratio of (A) to (B); obtaining the jitter injection measurement value t by looking up a table by using a Bessel function ratio methodjxInjecting the jitter into the measured value tjxAnd jitter injection setting tj0A comparison is made.
4. The multi-channel jitter injection calibration device according to claim 1, wherein the host computer 1 further comprises a hardware error compensation technique for comprehensively evaluating the uncertainty introduced by the test loop and the measurement instrument, and performing compensation during the calibration process.
5. A multi-channel jitter injection calibration method, comprising the steps of:
s1, appointing any path channel to establish channel connection;
s2, receiving a continuous square wave signal with a duty ratio of 50% through the channel;
s3, analyzing and calculating the square wave signal to finish the calibration of the channel jitter injection parameters;
and S4, repeating the steps from S1 to S3, and calibrating all channel jitter injection parameters.
6. The multi-channel jitter injection calibration method according to claim 5, wherein the step S1 further includes a switching control operation for decoding and converting the received channel connection control command into the corresponding channel; the complete high-speed signal is transmitted.
7. The multi-channel jitter injection calibration method according to claim 5, wherein the step S3 specifically includes:
s31, receiving a measurement control instruction of jitter injection on the channel;
s32, collecting the frequency spectrum of the channel output square wave signal, and measuring 0-order Bessel of the signal frequency spectrumComponent J0And Bessel component J of order 11And calculate J1/J0The ratio of (A) to (B);
s33, obtaining the jitter injection measured value t by using Bessel function ratio method table lookupjxInjecting the jitter into the measured value tjxAnd jitter injection setting tj0A comparison is made.
8. The multi-channel jitter injection calibration method of claim 5, wherein the step S4 further comprises using a hardware error compensation technique to comprehensively evaluate the uncertainties introduced by the test loop and the measurement instrument, and performing compensation during the calibration process.
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| CN112526410A (en) * | 2020-11-06 | 2021-03-19 | 苏州浪潮智能科技有限公司 | Hardware pin jitter test system, method and device |
| CN113259019A (en) * | 2020-01-28 | 2021-08-13 | 罗德施瓦兹两合股份有限公司 | System and method for calibrating a multi-channel radio frequency signal generation system |
| CN116840759A (en) * | 2023-07-04 | 2023-10-03 | 成都泰格微电子研究所有限责任公司 | Rapid calibration system and method suitable for hybrid integrated circuit test system |
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