CN110708538B - Test method and test device for MHL port - Google Patents
Test method and test device for MHL port Download PDFInfo
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- CN110708538B CN110708538B CN201910956629.6A CN201910956629A CN110708538B CN 110708538 B CN110708538 B CN 110708538B CN 201910956629 A CN201910956629 A CN 201910956629A CN 110708538 B CN110708538 B CN 110708538B
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N17/00—Diagnosis, testing or measuring for television systems or their details
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N17/00—Diagnosis, testing or measuring for television systems or their details
- H04N17/04—Diagnosis, testing or measuring for television systems or their details for receivers
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Abstract
The invention discloses a test method and a test device of an MHL port, wherein the method comprises the following steps: establishing connection with an MHL port of a television to be tested; and acquiring the voltage of each pin of the MHL port of the television to be tested, and testing the MHL port according to the voltage of each pin and EDID acquisition operation executed on the television to be tested. The invention solves the technical problems of high test cost and low test efficiency of the existing method for testing the MHL function of the television.
Description
Technical Field
The invention relates to the field of televisions, in particular to a test method and a test device of an MHL port.
Background
Before the television is assembled into a complete set, the function of a Mobile High-Definition Link (MHL) port of a television needs to be tested. The television mainboard acquires a mobile phone picture through a television MHL port and outputs the mobile phone picture to the external image collector in a signal form for collection and display.
The above is only for the purpose of assisting understanding of the technical aspects of the present invention, and does not represent an admission that the above is prior art.
Disclosure of Invention
The invention mainly aims to provide a test method and a test device for an MHL port, and aims to solve the technical problems of high test cost and low test efficiency of the conventional method.
In order to achieve the above object, the present application provides a method for testing an MHL port, including the steps of:
establishing connection with an MHL port of a television to be tested;
and acquiring the voltage of each pin of the MHL port of the television to be tested, and testing the MHL port according to the voltage of each pin and the EDID acquisition operation executed on the television to be tested.
Optionally, the step of testing the MHL port according to the voltage of each pin and the EDID obtaining operation executed on the television to be tested includes:
executing EDID obtaining operation on the television to be tested, and judging whether the voltage of each pin is in a corresponding preset range or not and whether the EDID is obtained through the EDID obtaining operation or not;
and when the voltage of each pin is in the corresponding preset range and the EDID is obtained through the EDID obtaining operation, determining that the MHL port of the television to be tested is normal.
Optionally, each of the pins includes: VBUS pin, TMDS + pin, TMDS-pin, eCBUS _ D-pin and eCBUS _ D + pin;
the step of judging whether the voltage of each pin is in the corresponding preset range comprises the following steps:
judging whether the output voltage of a VBUS pin of the MHL port is in a preset range or not;
when the current test mode is a short circuit test mode, judging whether voltages corresponding to an eCBUS _ D + pin and a TMDS + pin of an MHL port are both high levels;
and when the current test mode is an open circuit test mode, judging whether the voltages corresponding to an eDBUS _ D + pin, an eDBUS _ D-pin, a TMDS + pin and a TMDS-pin of the MHL port are all high levels.
Optionally, before the step of determining whether the voltages corresponding to the eCBUS _ D + pin and the TMDS + pin of the MHL port are both at a high level when the current test mode is the short circuit test mode, the method further includes:
controlling an eCBUS-pin and a TMDS-pin of the MHL port to be grounded so as to set the current test mode to be a short circuit test mode;
before the step of determining whether the voltages corresponding to the eCBUS _ D + pin, the eCBUS _ D-pin, the TMDS + pin, and the TMDS-pin of the MHL port are all high levels when the current test mode is the open circuit test mode, the method further includes:
an eCBUS-pin and a TMDS-pin of the MHL port are controlled not to be grounded so as to set the current test mode to an open circuit test mode.
Optionally, after the step of determining whether the voltage of each pin is in the corresponding preset range and whether the EDID is obtained through the EDID obtaining operation, the method further includes:
and when the voltage of any pin is not in the corresponding preset range or the EDID is not obtained through the EDID obtaining operation, determining that the MHL port of the television to be tested is abnormal.
Optionally, the step of establishing a connection with an MHL port is followed by:
outputting an MHL switching instruction to the television to be tested, and executing the following steps after confirming that the television to be tested is switched to an MHL working mode according to the MHL switching instruction: the method comprises the steps of obtaining the voltage of each pin of an MHL port of a television to be tested, and testing the MHL port according to the voltage of each pin and extended display identification data EDID (extended display identification data) operation executed on the television to be tested.
In addition, in order to achieve the above object, the present invention further provides a testing apparatus for MHL port, the apparatus comprising an MCU and a wiring port;
the MCU is connected with the MHL port of the TV to be tested through the wiring port and is used for acquiring the voltage of each pin of the MHL port of the TV to be tested and testing the MHL port according to the voltage of each pin and the EDID acquisition operation executed on the TV to be tested.
Optionally, the testing apparatus further comprises: the voltage acquisition module and the open-short circuit test switching module are connected with the MCU;
the voltage acquisition module is connected with a VBUS pin of the MHL port through the wiring port, and is used for sampling the voltage of the VBUS pin and outputting the sampled voltage to the MCU;
the open-short circuit test switching module is connected with an eCBUS _ D-pin and a TMDS-pin of the MHL port through the wiring port, and is used for controlling the eCBUS _ D-pin and the TMDS-pin to be grounded when receiving a short circuit test instruction sent by the MCU, and controlling the eCBUS _ D-pin and the TMDS-pin to be ungrounded when receiving an open circuit test instruction sent by the MCU;
the MCU is connected with an eDBUS _ D + pin, a TMDS + pin and a CBUS pin of the MHL port through the wiring port, and is further used for acquiring and judging whether voltages corresponding to the eDBUS _ D + pin and the TMDS + pin are high levels or not when the eDBUS _ D-pin and the TMDS-pin are grounded;
the MCU is also used for acquiring and judging whether the voltages corresponding to the eDBUS _ D + pin, the eDBUS _ D-pin, the TMDS + pin and the TMDS-pin are all high levels when the eDBUS _ D-pin and the TMDS-pin are not grounded;
the MCU is also used for executing EDID acquisition operation to the television to be tested and judging whether the EDID is acquired through the EDID acquisition operation.
Optionally, the voltage acquisition module comprises a first resistor and a second resistor; the first end of the first resistor is grounded, the second end of the first resistor is connected with the first end of the second resistor and the MCU, and the second end of the second resistor is connected with the VBUS pin through the wiring port.
Optionally, the MCU is further connected to a CD _ Sense pin of the MHL port through the wiring port, and is configured to send an MHL switching instruction to the to-be-tested television through the CD _ Sense pin, so as to obtain voltages of pins of the MHL port of the to-be-tested television after it is confirmed that the to-be-tested television is switched to an MHL operating mode according to the MHL switching instruction, and test the MHL port according to the voltages of the pins and an EDID obtaining operation executed by the to-be-tested television.
The test method and the test device for the MHL port provided by the embodiment of the invention establish connection with the MHL port of the television to be tested; and acquiring the voltage of each pin of the MHL port of the television to be tested, and testing the MHL port according to the voltage of each pin and the EDID acquisition operation executed on the television to be tested. Therefore, a special mobile phone and an external image collector are not needed, the cost of testing the MHL function is reduced, a mobile phone picture does not need to be obtained, the obtained picture does not need to be converted into an image signal and is output to the image collector for displaying, the function of the MHL port of the television can be directly tested only by testing the voltage of each pin of the MHL port and reading the EDID of the television in the testing process, the testing process is simple and quick, and the testing efficiency is greatly improved.
Drawings
FIG. 1 is a flow chart of a first embodiment of a test method of an MHL port according to the present invention;
FIG. 2 is a detailed flowchart of step S20 of the second embodiment of the testing method for MHL ports according to the present invention;
FIG. 3 is a flow chart of a fourth embodiment of the testing method of the MHL port of the present invention;
fig. 4 is a block diagram of an embodiment of a testing apparatus for MHL ports according to the present invention.
The implementation, functional features and advantages of the objects of the present invention will be further explained with reference to the accompanying drawings.
Detailed Description
It should be understood that the specific embodiments described herein are merely illustrative of the invention and are not intended to limit the invention.
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be obtained by a person skilled in the art without inventive step based on the embodiments of the present invention, are within the scope of protection of the present invention.
It should be noted that all the directional indicators (such as up, down, left, right, front, and rear … …) in the embodiment of the present invention are only used to explain the relative position relationship between the components, the movement situation, etc. in a specific posture (as shown in the drawing), and if the specific posture is changed, the directional indicator is changed accordingly.
In addition, the descriptions relating to "first", "second", etc. in the present invention are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include at least one such feature. In addition, technical solutions between various embodiments may be combined with each other, but must be realized by a person skilled in the art, and when the technical solutions are contradictory or cannot be realized, such a combination should not be considered to exist, and is not within the protection scope of the present invention.
Referring to fig. 1, in a first embodiment of a method for testing an MHL port (Mobile High-Definition Link, High Definition standard port for Mobile terminals) according to the present invention, the method for testing an MHL port includes the steps of:
step S10, establishing connection with the MHL port of the television to be tested;
in the scheme, the testing device of the MHL port is connected with the MHL port of the television main board to be tested through a data line supporting the MHL communication protocol, and the data line may be an MHL data line, a micro USB data line supporting the MHL communication protocol, or an HDMI (High Definition Multimedia Interface) data line supporting the MHL communication protocol.
And step S20, acquiring the voltage of each pin of the MHL port of the television to be tested, and testing the MHL port according to the voltage of each pin and the EDID acquisition operation executed on the television to be tested.
After the testing device is connected with the MHL port of the main board of the television to be tested, the voltage of each pin in the MHL port of the television to be tested can be acquired, and the operation of acquiring the EDID (Extended Display Identification Data) of the television to be tested is executed through the CBUS pin of the MHL port, wherein the EDID comprises the supplier information, the maximum image size, the color setting, the manufacturer presetting, the limitation of the frequency range, the character string of the name and the serial number of the Display and the like of the television. And the testing device tests the MHL port according to the obtained voltage value of each pin and the result of the EDID obtaining operation executed on the television to be tested.
The embodiment establishes connection with an MHL port of a television to be tested; and acquiring the voltage of each pin of the MHL port of the television to be tested, and testing the MHL port according to the voltage of each pin and the EDID acquisition operation executed on the television to be tested. Therefore, a special mobile phone and an external image collector are not needed, the cost of testing the MHL function is reduced, a mobile phone picture does not need to be obtained, the obtained picture does not need to be converted into an image signal and is output to the image collector for displaying, the function of the MHL port of the television can be directly tested only by testing the voltage of each pin of the MHL port and reading the EDID of the television in the testing process, the testing process is simple and quick, and the testing efficiency is greatly improved.
Further, referring to fig. 2, a second embodiment of the testing method of the MHL port of the present application is proposed according to the first embodiment of the testing method of the MHL port of the present application, and in this embodiment, the step S20 includes:
step S21, performing EDID obtaining operation on the television to be tested, and judging whether the voltage of each pin is in a corresponding preset range or not and whether EDID is obtained through the EDID obtaining operation or not;
and step S22, when the voltage of each pin is in the corresponding preset range and EDID is obtained through the EDID obtaining operation, determining that the MHL port of the television to be tested is normal.
In the scheme, after the testing device is connected with the MHL port of the main board of the television to be tested, the voltage of each pin in the MHL port of the television to be tested can be collected, and the EDID operation of the television to be tested is acquired through the CBUS pin of the MHL port. And then judging whether the voltage of each pin is in a corresponding preset range or not and whether the EDID executed by the television to be tested can be obtained or not, and when the voltage of each pin is in the corresponding preset range and the EDID is obtained through the EDID obtaining operation, determining that the MHL port of the television to be tested is normal. And when the voltage of any pin is not in the corresponding preset range or the EDID is not obtained through the EDID obtaining operation, determining that the MHL port of the television to be tested is abnormal.
This embodiment is through whether each pin voltage of acquireing and simple judgement port is in predetermineeing the within range to and obtain EDID's result, just can normally measure the MHL port of the TV that awaits measuring, do not need special image collector and cell-phone, measurement cost is low, and test procedure is simple, and efficiency of software testing is high.
Further, a third embodiment of the testing method for the MHL port of the present application is proposed according to the first embodiment of the testing method for the MHL port of the present application, and in the present embodiment, each pin includes: VBUS pin, TMDS + pin, TMDS-pin, eCBUS _ D-pin, and eCBUS _ D + pin, the step S21 may include the following steps performed simultaneously or randomly:
step S211, judging whether the output voltage of the VBUS pin of the MHL port is in a preset range;
step S212, EDID obtaining operation is executed on the television to be tested, and whether EDID is obtained through the EDID obtaining operation is judged;
step S213, when the current test mode is the short circuit test mode, judging whether the voltages corresponding to the eDBUS _ D + pin and the TMDS + pin of the MHL port are both high levels;
step S214, when the current test mode is the open circuit test mode, judging whether the voltages corresponding to the eDBUS _ D + pin, the eDBUS _ D-pin, the TMDS + pin and the TMDS-pin of the MHL port are all high levels.
In the scheme, the testing device can detect the output voltage of the VBUS pin of the MHL port, judge whether the output voltage is in a preset range, determine that the VBSU pin of the MHL port is normal when the output voltage is in the preset range, and determine that the VBUS pin of the MHL port is abnormal if the output voltage is not in the preset range. For example, when the theoretical output voltage of the television MHL port is 5V, and the testing device detects that the actual output voltage of the VBUS pin of the television MHL port is within the range of 4.9-5.1V, it is determined that the VBUS pin of the MHL port is normal, otherwise, when the actual output voltage of the VBUS pin is not within the range of 4.9-5.1V, it is determined that the VBUS pin of the MHL port is abnormal.
The EDID acquisition request is sent to the mainboard of the television to be tested through the connected CBUS pin of the MHL port of the television to be tested, if the CBUS pin of the MHL port of the television to be tested is normal, the mainboard of the television to be tested can receive the EDID acquisition request through the MHL port, and after the EDID acquisition request is received, the EDID of the television to be tested is sent to the testing device through the CBUS pin. If the CBUS of the MHL port of the television to be tested is abnormal, the mainboard of the television to be tested cannot receive the EDID acquisition request through the MHL port, so that the mainboard of the television to be tested cannot send the EDID of the television to be tested to the testing device.
The testing device is grounded by controlling an eDBUS-pin and a TMDS-pin of the MHL port to set the current testing mode as a short-circuit testing mode, and under the short-circuit testing mode, after voltages corresponding to an eDBUS _ D + pin and a TMDS + pin of the MHL port are obtained, whether the voltages corresponding to the eDBUS _ D + pin and the TMDS + pin of the MHL port are both high levels is judged, if the voltages corresponding to the eDBUS _ D + pin and the TMDS + pin are both high levels, it is determined that the MHL port is not short-circuited, and if the voltage corresponding to any pin of the eDBUS _ D + pin and the TMDS + pin is not high levels, it is determined that the MHL port is short-circuited.
Further, the test device may set the current test mode to an open circuit test mode by controlling the eCBUS-pin and the TMDS-pin of the MHL port to be ungrounded, and in the open circuit test mode, after obtaining voltages corresponding to the eCBUS _ D + pin, the eCBUS _ D-pin, the TMDS + pin, and the TMDS-pin of the MHL port, determine whether the voltages corresponding to the eCBUS _ D + pin, the eCBUS _ D-pin, the TMDS + pin, and the TMDS-pin of the MHL port are all high levels, if the voltages corresponding to the TMDS + pin, the TMDS-pin, the eCBUS _ D + pin, and the eCBUS _ D-pin are all high levels, determine that there is no open circuit between the pins of the MHL port, and if the voltage of any one of the TMDS + pin, the s-pin, the eCBUS _ D + pin, and the eCBUS _ D-pin is low level, determine that the MHL port has an open circuit.
It should be noted that the MHL port may be tested according to the sequence of the voltages corresponding to the VBUS pin voltage, the eCBUS _ D + pin, the eCBUS _ D-pin, the TMDS + pin, and the TMDS-pin of the MHL port determined in the open circuit test mode, whether EDID can be obtained is determined, and then the voltages corresponding to the eCBUS _ D + pin and the TMDS + pin are determined in the short circuit mode. The order of executing the above determination steps may be other orders, and the present embodiment does not limit the order of executing the determination steps.
This embodiment is through being connected testing arrangement and the TV MHL port that awaits measuring, only need the voltage parameter of each pin of simple measurement TV MHL port and carry out EDID to the TV that awaits measuring through the MHL port and obtain the operation, whether the MHL function of testing the MHL port is normal, the shared space of EDID of the TV that awaits measuring is less than the shared space of cell-phone picture data far away, so measuring voltage and the time of reading EDID are less than prior art far away and read the cell-phone picture and throw the time on the display, measurement of efficiency is high, and need not extra image collector and cell-phone, the test cost is lower.
Further, referring to fig. 3, a fourth embodiment of the testing method for the MHL port of the present application is proposed according to the first embodiment of the testing method for the MHL port of the present application, and in this embodiment, after the step S10, the method further includes:
step S30, outputting an MHL switching instruction to the television to be tested to confirm whether the television to be tested is switched to an MHL working mode according to the MHL switching instruction; if yes, go to step S20.
In this embodiment, when the HMDI (High Definition Multimedia Interface ) port of the tv to be tested and the MHL port share one port, the testing device is connected to the HMDI of the tv to be tested through the HDMI data line supporting the MHL communication protocol, and first sends an MHL switching instruction to the tv to be tested through the CD _ Sense pin of the MHL port of the tv to be tested, and the tv to be tested switches to the MHL operating mode according to the MHL switching instruction, and then subsequently obtains the pin voltages of the MHL port and executes the EDID obtaining operation on the tv to be tested.
The embodiment provides a strategy for controlling the television to be switched to the MHL working mode and then testing the function of the MHL port of the television to be tested by sending a switching instruction through the testing device under the condition that the HMDI port and the MHL port of the television to be tested are shared, so that errors in the testing process caused by different working modes of the television to be tested are avoided, and further the final testing result of the MHL port is influenced.
Referring to fig. 4, in an embodiment of the testing apparatus for MHL port of the present invention, the testing apparatus for MHL port includes: MCU10 and wiring port 20;
the MCU10 is connected with the MHL port of the TV to be tested through the wiring port 20, and the MCU10 is used for acquiring the voltage of each pin of the MHL port of the TV to be tested and testing the MHL port according to the voltage of each pin and EDID acquisition operation executed on the TV to be tested.
In this embodiment, the testing device of the MHL port includes the MCU10 and the wiring port 20, and the testing device is connected to the MHL port of the tv motherboard to be tested through a data line supporting the MHL communication protocol, where the data line may be an MHL data line, a micro USB data line supporting the MHL communication protocol, or an HDMI data line supporting the MHL communication protocol.
After the MCU10 in the testing apparatus is connected to the MHL port of the main board of the tv to be tested through the wiring port 20, the voltage of each pin in the MHL port of the tv to be tested is collected, and the CBUS pin of the MHL port is used to execute the operation of obtaining the EDID (Extended Display Identification Data) of the tv to be tested, where the EDID includes the supplier information of the tv, the size of the maximum image, the color setting, the manufacturer presetting, the limitation of the frequency range, and the character string of the Display name and the serial number. The MCU10 in the testing apparatus can test the MHL port according to the obtained voltage value of each pin and the result of the EDID obtaining operation performed on the television to be tested. Therefore, a special mobile phone and an external image collector are not needed, the cost of testing the MHL function is reduced, a mobile phone picture does not need to be obtained, the obtained picture does not need to be converted into an image signal and is output to the image collector for displaying, the function of the MHL port of the television can be directly tested only by testing the voltage of each pin of the MHL port and reading the EDID of the television in the testing process, the testing process is simple and quick, and the testing efficiency is greatly improved.
Optionally, with continued reference to fig. 4, the testing device further comprises: the voltage acquisition module 30 and the open-short circuit test switching module 40 are connected with the MCU 10;
the voltage collecting module 30 is connected with the VBUS pin of the MHL port through the wiring port 20, and the voltage collecting module 30 is configured to sample a voltage of the VBUS pin and output the sampled voltage to the MCU 10;
the open-short circuit test switching module 40 is connected to the eCBUS _ D-pin and the TMDS-pin of the MHL port through the connection port 20, and is configured to control the eCBUS _ D-pin and the TMDS-pin to be grounded when receiving the short circuit test instruction sent by the MCU10, and control the eCBUS _ D-pin and the TMDS-pin to be ungrounded when receiving the open circuit test instruction sent by the MCU 10;
the MCU10 is connected to the eCBUS _ D + pin, the TMDS + pin, and the CBUS pin of the MHL port through the connection port 20, and the MCU10 is further configured to obtain and determine whether voltages corresponding to the eCBUS _ D + pin and the TMDS + pin are both high levels when the eCBUS _ D-pin and the TMDS-pin are grounded;
the MCU10 is also used for acquiring and judging whether the voltages corresponding to the eDBUS _ D + pin, the eDBUS _ D-pin, the TMDS + pin and the TMDS-pin are all high levels when the eDBUS _ D-pin and the TMDS-pin are not grounded;
the MCU10 is further configured to execute an EDID acquisition operation on the television to be tested, and determine whether the EDID is acquired by the EDID acquisition operation.
The testing device also comprises a voltage acquisition module 30 and an open-short circuit test switching module 40 which are connected with the MCU 10. The testing device samples the output voltage of the television to be tested passing through the VBUS pin through the voltage acquisition module 30, outputs the sampled voltage to the MCU10, judges whether the sampled voltage is within a preset range or not by the MCU10, determines that the VBSU pin of the MHL port is normal when the sampled voltage is within the preset range, and determines that the VBUS pin of the MHL port is abnormal if the sampled voltage is not within the preset range.
The MCU10 of the test apparatus is also connected to the CBUS pin, the eCBUS _ D + pin, and the TMDS + pin of the MHL port through the connection port 20.
The MCU10 sends a short circuit test instruction to the open short circuit test switching module 40, when the open short circuit test switching module 40 receives the short circuit test instruction, the open short circuit test switching module controls the ground of the eCBUS _ D-pin and the TMDS-pin, after confirming that the eCBUS _ D-pin and the TMDS-pin are grounded, the MCU10 obtains voltages corresponding to the eCBUS _ D + pin and the TMDS + pin of the MHL port, and determines whether the voltages corresponding to the eCBUS _ D + pin and the TMDS + pin of the MHL port are both high levels, if the voltages corresponding to the eCBUS _ D + pin and the TMDS + pin of the MHL port of the tv to be tested are both high levels, it determines that the MHL port is not short-circuited, and if the voltage corresponding to any one of the eCBUS _ D + pin and the TMDS + pin of the MHL port is not high level, it determines that the MHL port is short circuit.
The MCU10 in the testing apparatus may also send an open circuit test command to the open/short circuit test switching module 40, and when the open/short circuit test switching module 40 receives the open circuit test command, the open/short circuit test switching module controls the eCBUS pin and the TMDS pin of the MHL port to be not grounded, so as to set the current test mode to the open circuit test mode. The MCU10 acquires voltages corresponding to an eDBUS _ D + pin, an eDBUS _ D-pin, a TMDS + pin and a TMDS-pin of the MHL port after confirming that the eDBUS _ D-pin and the TMDS-pin are not grounded, judges whether the voltages corresponding to the eDBUS _ D + pin, the eDBUS _ D-pin, the TMDS + pin and the TMDS-pin of the MHL port are all high levels, determines that an open circuit does not exist among the pins of the MHL port if the voltages corresponding to the TMDS + pin, the TMDS-pin, the eDBUS _ D + pin and the eDBUS _ D-pin are all high levels, and determines that an open circuit exists in the MHL port if the voltages of any one of the TMDS + pin, the TMDS-pin, the BUS _ D + pin and the eDBUS _ D-pin are low levels.
MCU10 in the testing arrangement still connects through the CBUS foot of the MHL port of the TV that awaits measuring and sends the mainboard that acquires the EDID request to the TV that awaits measuring, if the CBUS foot of the MHL port of the TV that awaits measuring is normal, the mainboard of the TV that awaits measuring can obtain after the request through MHL port receipt EDID to can send the EDID of the TV that awaits measuring to testing arrangement through the CBUS foot. If the CBUS of the MHL port of the television to be tested is abnormal, the mainboard of the television to be tested cannot receive the EDID acquisition request through the MHL port, so that the mainboard of the television to be tested cannot send the EDID of the television to be tested to the testing device.
The testing device is connected with the MHL port of the television to be tested, only voltage parameters of pins of the MHL port of the television need to be simply measured, EDID (extended display identification data) of the television to be tested is obtained through the MHL port, whether the MHL function of the MHL port is normal or not is tested, the process is simple, the measuring efficiency is high, an additional image collector and a mobile phone are not needed, and the testing cost is low.
Optionally, with continued reference to fig. 4, the voltage acquisition module 30 includes a first resistor 31 and a second resistor 32; the first end of the first resistor 31 is grounded, the second end of the first resistor 31 is connected with the first end of the second resistor 32 and the MCU10, and the second end of the second resistor 32 is connected with the VBUS pin through the connection port 20.
The theoretical output voltage of the MHL port of the television to be detected is 5V, and the maximum upper limit voltage which can be detected by the MCU10 is generally within 3.3V. The voltage acquisition module comprises a first resistor and a second resistor with the resistance values of 5 ohms, the first end of the first resistor 31 is grounded, the second end of the first resistor 31 is connected with the first end of the second resistor 32 and the MCU10, the second end of the second resistor 32 is connected with the VBUS pin through the wiring port 20 and then is connected in series through the first resistor 31 and the second resistor 32 to divide the output voltage of the MHL port of the television to be tested, so that the voltage value of the second end of the first resistor 31 is half of the voltage value output by the MHL port, after the MCU10 measures the voltage value of the second end of the first resistor 31, whether the measured voltage value is in the range of 2.45-2.55V or not can be directly judged, or whether the measured voltage value is in the range of 4.9-5.1V or not after the measured voltage value is multiplied by 2 can be judged, and the MCU10 in the testing device determines that the measured voltage value is in the range of 2.45-2.55V or when the measured voltage value is in the range of 4.9-5.1V after the measured value is multiplied by 2, and determining that the VBUS foot of the MHL port is normal, otherwise determining that the VBUS foot of the MHL port is abnormal. The voltage output by the MHL port can be divided by connecting two resistors in series in the voltage acquisition module, so that the voltage value of the detection point is prevented from being higher than the voltage detection upper limit of the MCU 10.
Optionally, with reference to fig. 4, the MCU10 is further connected to the CD _ Sense pin of the MHL port through the connection port 20, and is configured to send an MHL switch instruction to the to-be-tested television through the CD _ Sense pin, so as to obtain voltages of pins of the MHL port of the to-be-tested television after it is confirmed that the to-be-tested television is switched to the MHL operating mode according to the MHL switch instruction, and test the MHL port according to the voltages of the pins and an EDID obtaining operation performed on the to-be-tested television.
When the HMDI (High Definition Multimedia Interface) port of the tv to be tested and the MHL port share one port, the MCU10 in the testing apparatus is also connected to the CD _ Sense pin of the MHL port through the connection port 20. The MCU10 firstly sends an MHL switching instruction to the TV to be tested through a CD _ Sense pin of an MHL port of the TV to be tested, the TV to be tested can be switched to an MHL working mode according to the MHL switching instruction, and then subsequent acquisition of the voltage of each pin of the MHL port and EDID acquisition operation of the TV to be tested are carried out. Therefore, when the HMDI port and the MHL port of the television to be tested are shared, errors in the testing process caused by different working modes of the television to be tested are avoided in the process of testing the MHL port, and further the final testing result of the MHL port is influenced.
It should be noted that the present invention also provides a computer readable storage medium, on which a computer program is stored. The computer-readable storage medium may be a Memory in the MCU10 of fig. 4, or at least one of a ROM (Read-Only Memory)/RAM (Random Access Memory), a magnetic disk, and an optical disk, and includes several pieces of information for enabling the MCU to execute the methods according to the embodiments of the present invention.
In this document, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or system that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or system. Without further limitation, an element defined by the phrase "comprising an … …" does not exclude the presence of other like elements in a process, method, article, or system that comprises the element.
The above-mentioned serial numbers of the embodiments of the present invention are merely for description and do not represent the merits of the embodiments.
Through the above description of the embodiments, those skilled in the art will clearly understand that the method of the above embodiments can be implemented by software plus a necessary general hardware platform, and certainly can also be implemented by hardware, but in many cases, the former is a better implementation manner.
The above description is only a preferred embodiment of the present invention, and is not intended to limit the scope of the present invention, and all equivalent structures or equivalent processes performed by the present invention or directly or indirectly applied to other related technical fields are also included in the scope of the present invention.
Claims (6)
1. A method for testing an MHL port, the method comprising:
establishing connection with an MHL port of a television to be tested;
acquiring the voltage of each pin of the MHL port of the television to be tested, and testing the MHL port according to the voltage of each pin and EDID (extended display identification data) acquisition operation executed on the television to be tested;
the step of testing the MHL port according to the voltage of each pin and the EDID obtaining operation executed to the television to be tested comprises the following steps:
executing EDID obtaining operation on the television to be tested, and judging whether the voltage of each pin is in a corresponding preset range or not and whether the EDID is obtained through the EDID obtaining operation or not;
when the voltage of each pin is in a corresponding preset range and EDID is obtained through the EDID obtaining operation, determining that the MHL port of the television to be tested is normal;
each of the pins includes: VBUS pin, TMDS + pin, TMDS-pin, eCBUS _ D-pin and eCBUS _ D + pin;
the step of judging whether the voltage of each pin is in the corresponding preset range comprises the following steps:
judging whether the output voltage of a VBUS pin of the MHL port is in a preset range or not;
when the current test mode is a short circuit test mode, judging whether voltages corresponding to an eCBUS _ D + pin and a TMDS + pin of an MHL port are both high levels;
when the current test mode is an open circuit test mode, judging whether voltages corresponding to an eDBUS _ D + pin, an eDBUS _ D-pin, a TMDS + pin and a TMDS-pin of the MHL port are all high levels;
before the step of determining whether the voltages corresponding to the eCBUS _ D + pin and the TMDS + pin of the MHL port are both high levels when the current test mode is the short circuit test mode, the method further includes:
controlling an eCBUS-pin and a TMDS-pin of the MHL port to be grounded so as to set the current test mode to be a short circuit test mode;
before the step of determining whether the voltages corresponding to the eCBUS _ D + pin, the eCBUS _ D-pin, the TMDS + pin, and the TMDS-pin of the MHL port are all high levels when the current test mode is the open circuit test mode, the method further includes:
the eCBUS-pin and the TMDS-pin of the MHL port are controlled not to be grounded so as to set the current test mode to be the open circuit test mode.
2. The method for testing the MHL port according to claim 1, wherein the step of determining whether the voltage of each pin is within the corresponding preset range and whether the EDID is obtained through the EDID obtaining operation further comprises:
and when the voltage of any pin is not in the corresponding preset range or the EDID is not obtained through the EDID obtaining operation, determining that the MHL port of the television to be tested is abnormal.
3. The method for testing the MHL port of claim 1, wherein the step of establishing a connection with the MHL port is followed by:
outputting an MHL switching instruction to the television to be tested, and executing the following steps after confirming that the television to be tested is switched to an MHL working mode according to the MHL switching instruction: and acquiring the voltage of each pin of the MHL port of the television to be tested, and testing the MHL port according to the voltage of each pin and the EDID (extended display identification data) acquisition operation executed on the television to be tested.
4. The testing device of the MHL port is characterized by comprising an MCU and a wiring port;
the MCU is connected with the MHL port of the television to be tested through the wiring port, and is used for acquiring the voltage of each pin of the MHL port of the television to be tested and testing the MHL port according to the voltage of each pin and EDID acquisition operation executed on the television to be tested;
the test device further comprises: the voltage acquisition module and the open-short circuit test switching module are connected with the MCU;
the voltage acquisition module is connected with a VBUS pin of the MHL port through the wiring port, and is used for sampling the voltage of the VBUS pin and outputting the sampled voltage to the MCU;
the open-short circuit test switching module is connected with an eCBUS _ D-pin and a TMDS-pin of the MHL port through the wiring port, and is used for controlling the eCBUS _ D-pin and the TMDS-pin to be grounded when receiving a short circuit test instruction sent by the MCU, and controlling the eCBUS _ D-pin and the TMDS-pin to be ungrounded when receiving an open circuit test instruction sent by the MCU;
the MCU is connected with an eDBUS _ D + pin, a TMDS + pin and a CBUS pin of the MHL port through the wiring port, and is further used for acquiring and judging whether voltages corresponding to the eDBUS _ D + pin and the TMDS + pin are high levels or not when the eDBUS _ D-pin and the TMDS-pin are grounded;
the MCU is also used for acquiring and judging whether the voltages corresponding to the eDBUS _ D + pin, the eDBUS _ D-pin, the TMDS + pin and the TMDS-pin are all high levels when the eDBUS _ D-pin and the TMDS-pin are not grounded;
the MCU is also used for executing EDID acquisition operation to the television to be tested and judging whether the EDID is acquired through the EDID acquisition operation.
5. The MHL port testing apparatus of claim 4, wherein the voltage acquisition module comprises a first resistor and a second resistor; the first end of the first resistor is grounded, the second end of the first resistor is connected with the first end of the second resistor and the MCU, and the second end of the second resistor is connected with the VBUS pin through the wiring port.
6. The device for testing the MHL port of any one of claims 4 to 5, wherein the MCU is further connected with a CD _ Sense pin of the MHL port through the connection port, and is configured to send an MHL switching instruction to the TV to be tested through the CD _ Sense pin, so as to obtain a voltage of each pin of the MHL port of the TV to be tested after it is confirmed that the TV to be tested is switched to an MHL operating mode according to the MHL switching instruction, and test the MHL port according to the voltage of each pin and an EDID obtaining operation performed on the TV to be tested.
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| CN102169154A (en) * | 2011-01-13 | 2011-08-31 | 深圳创维－Rgb电子有限公司 | A method and a device for testing an HDMI |
| CN104717489A (en) * | 2013-12-13 | 2015-06-17 | 致茂电子股份有限公司 | Detecting device for detecting video device and control method thereof |
| CN109379585A (en) * | 2018-11-30 | 2019-02-22 | 深圳创维数字技术有限公司 | HDMI device for testing compatibility and method |
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| US8683087B2 (en) * | 2011-04-11 | 2014-03-25 | Fairchild Semiconductor Corporation | Mobile device auto detection apparatus and method |
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|---|---|---|---|---|
| CN102169154A (en) * | 2011-01-13 | 2011-08-31 | 深圳创维－Rgb电子有限公司 | A method and a device for testing an HDMI |
| CN104717489A (en) * | 2013-12-13 | 2015-06-17 | 致茂电子股份有限公司 | Detecting device for detecting video device and control method thereof |
| CN109379585A (en) * | 2018-11-30 | 2019-02-22 | 深圳创维数字技术有限公司 | HDMI device for testing compatibility and method |
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