CN110687583B - Position energy time testing system and device based on CZT detector - Google Patents
Position energy time testing system and device based on CZT detector Download PDFInfo
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- CN110687583B CN110687583B CN201911075676.6A CN201911075676A CN110687583B CN 110687583 B CN110687583 B CN 110687583B CN 201911075676 A CN201911075676 A CN 201911075676A CN 110687583 B CN110687583 B CN 110687583B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/24—Measuring radiation intensity with semiconductor detectors
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
- G01T1/202—Measuring radiation intensity with scintillation detectors the detector being a crystal
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
- G01T1/208—Circuits specially adapted for scintillation detectors, e.g. for the photo-multiplier section
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/24—Measuring radiation intensity with semiconductor detectors
- G01T1/247—Detector read-out circuitry
Abstract
The invention relates to a position energy time testing device based on a CZT detector, which at least comprises: the device comprises a scintillation crystal array, one or more pixel detectors and a special readout ASIC, wherein the special readout ASIC is capable of respectively determining ray action detector relative time information corresponding to a plurality of scintillation cases detected by each pixel detector on the level of a multi-pixel energy spectrum detector module by utilizing the determined corresponding relation between an electronic pulse provided by the pixel detector and the luminous intensity of scintillation light generated by the scintillation crystal array under the incidence of radiation particles, gathering the plurality of scintillation cases from a single gamma photon, carrying out time coincidence logic processing to screen out effective scintillation cases scattered from Compton, and outputting scintillation case information which comprises the ray action detector relative time information, the pixel energy spectrum information and position information and is subjected to the time coincidence logic processing.
Description
Technical Field
The invention relates to the technical field of radiation measurement, in particular to a position energy time testing system and device based on a CZT detector.
Background
The Cadmium Zinc Telluride (CZT) semiconductor is a room-temperature X-ray and gamma-ray detecting material with excellent performance, is a wide-gap II-VI compound semiconductor crystal formed by solid solution of CdTe and ZnTe, and can be used in environmental monitoring, medical diagnosis, industrial nondestructive detection, safety inspection, space science and other fieldsThe domain has wide application prospect. Cadmium Zinc Telluride (CZT) semiconductors have at least the following advantages: 1. cadmium Zinc Telluride (CZT) semiconductor is the only semiconductor capable of working at room temperature and processing millions to tens of millions of photons per square millimeter of area per second, the sensitivity of the semiconductor can reach the limit, even the radiation quantity of the cosmic background rays which is weak to almost none can be captured quickly and accurately, and the discovery thereof has caused the booming of the industry. 2. Cadmium Zinc Telluride (CZT) semiconductor has excellent photoelectric properties, can directly convert X-rays and gamma-rays into electrons at room temperature, and is the most ideal semiconductor material for manufacturing room-temperature X-ray and gamma-ray detectors. Cadmium Zinc Telluride (CZT) semiconductor has a ratio of about 10% ZnTe to 80% CdTe11High crystal resistivity of omega cm, 48-52 atomic number and large forbidden band width. And with the different Zn content, the forbidden bandwidth is continuously changed from 1.4eV to 2.26eV, the melting point is changed from 1092 to 1295 ℃, the manufactured detector has small leakage current, good energy resolution to X-rays and gamma-rays at room temperature, and electrodeless phenomenon with the energy detection range of 10keV to 6 Mev.
The traditional SPECT nuclear medicine equipment detector adopts the design of sodium iodide crystal (NaI) + Photomultiplier (PMT) all the time, the radiopharmaceutical injected into a human body emits gamma photons, the gamma photons are positioned and projected onto the NaI crystal through a collimator and converted into visible light, and then the visible light is photoelectrically converted into electric signals through the PMT photomultiplier and amplified, and the electric signals are transmitted to an electronic circuit and a workstation for reconstruction and imaging. The indirect imaging technology of multiple conversion can cause a large amount of photons to be lost, and the efficiency of converting visible light into an electric signal by the PMT is only about 20-25%, so that the traditional SPECT nuclear medical equipment is greatly limited in counting rate and resolution. However, the working principle of the novel CZT crystal detector is as follows: the gamma rays are projected to the CZT crystal to generate electron and hole pairs, thin metal electrodes are arranged on the surface of the CZT crystal, electric fields are generated in the crystal by the electrodes under the action of bias voltage, negatively charged electrons and positively charged holes move towards different electrodes, and finally formed charge pulse signals are amplified and processed through a subsequent electronic circuit to be imaged. The novel CZT crystal detector does not need a photomultiplier and a photoelectric conversion process, the detection efficiency is greatly improved, the energy resolution ratio is improved by more than 3 times compared with that of the traditional NaI scintillation crystal, the mode of switching from indirect imaging to direct imaging can directly convert X rays and gamma rays into electrons at room temperature, and the CZT crystal is the most ideal semiconductor material for manufacturing room temperature X rays and gamma ray detectors so far.
Further, the operating principle of the CZT crystal detector is as follows: the semiconductor detector has two electrodes to which a certain bias voltage is applied. When an incident particle enters the sensitive region of a semiconductor detector, electron-hole pairs are generated. Upon application of a voltage to the electrodes, the charge carriers drift towards the electrodes and charges are induced on the collecting electrodes, forming signal pulses in an external circuit. However, in semiconductor detectors, the average energy consumed by an incident particle to generate an electron-hole pair is about one tenth of the energy consumed by a gas ionization chamber to generate an ion pair, and thus the semiconductor detectors have much better energy resolution than scintillation counters and gas ionization detectors. The sensitive region of the semiconductor detector should be close to the ideal semiconductor material, and in fact, the general semiconductor material has higher impurity concentration, and the impurity must be compensated or the purity of the semiconductor single crystal must be improved.
Although Cadmium Zinc Telluride (CZT) semiconductors do not have the resolution of high purity germanium, the resolution is fully satisfactory for isotope detection applications. Cadmium Zinc Telluride (CZT) semiconductor can be detected at room temperature without liquid nitrogen or mechanical cryogenic cooling, so that the Cadmium Zinc Telluride (CZT) semiconductor detector has a small appearance and can be used for mobile application; because no energy is required to power the mechanical refrigeration chiller, it has a longer battery life and is available for field work. If the cost can be reduced, the Cadmium Zinc Telluride (CZT) based semiconductor detector system not only replaces the current high-purity germanium, but also can expand the application range of the high-performance isotope detector and even extend to the application field of the current sodium iodide detector, which cannot be reached by the high-purity germanium. The work principle of the Cadmium Zinc Telluride (CZT) semiconductor detector system is as follows: when rays act with a Cadmium Zinc Telluride (CZT) crystal, electron and hole pairs are generated in the crystal, under the action of an electric field, negatively charged electrons and positively charged holes respectively move to different electrodes, induced current is generated on the electrodes, and formed current pulses are changed into voltage pulses through a charge sensitive preamplifier and converted into Gaussian pulses through a shaping amplifier. The room-temperature semiconductor nuclear radiation detector (cadmium zinc telluride CZT detector) with excellent performance has higher energy resolution, quantum efficiency and detection efficiency, and can be applied to a plurality of fields such as industrial nondestructive testing, safety inspection, environmental monitoring, nuclear medicine imaging and the like.
The detector generally has a planar structure, a trapping electrode structure, a coplanar grid structure, a capacitive Frichi grid structure, a hemispherical structure, a pixel structure and the like, the actual dosage used for site monitoring is the surrounding dosage equivalent according to the definition, and instruments used for measuring the surrounding dosage equivalent rate in site monitoring generally require that the angular response is approximately isotropic. The dose equivalence ratio around the field is for the alignment-extended field of the radiation field, requiring a uniform angular response of the detector instrument at the time of actual measurement. The angular response is an important indicator of the rate of dose equivalents around with the detector. In the prior art, for example, royal fluorescence, bear, handsome, llain, et, multifunctional dose rate meter applicability research based on a hemispherical tellurium-zinc-cadmium detector [ J ] atomic energy science, 2014,48(S1):618-622.
For example, patent document CN106501836A discloses a dose rate meter based on a dual hemisphere cadmium zinc telluride detector and a dual preamplifier. The dose rate meter comprises a detector system, a signal processing system and a control circuit system; the detector system comprises two hemispherical CZT crystals, a preamplifier and a circuit board; the control circuit system comprises a high-voltage power supply module, a low-voltage power supply module, a portable module power supply and a battery management chip; the signal processing system comprises a double-channel digital multichannel, signal processing software, a liquid crystal touch screen and a computer. The detector system comprises two hemispherical CZT crystals, a preamplifier and a circuit board, wherein the two hemispherical CZT crystals are completely the same in shape, structure and size and are both cuboid; one surface of each hemispherical CZT crystal with the largest area is connected with positive high voltage and serves as an anode, and the other 5 surfaces are grounded and serve as cathodes; the two crystals are arranged on the circuit board in a left-right placing mode, a preamplifier is arranged below the circuit board corresponding to each CZT crystal, and signals generated by X rays and gamma rays on the CZT crystals are transmitted to the preamplifiers; the cathode surfaces with the largest crystal areas are left and right adjacent surfaces which are tightly jointed; the two crystals, the circuit board and the preamplifier are positioned in a cylindrical shell, the middle positions of the two crystals are positioned on the radial central line of the cylinder, the anode faces the cylinder wall, and the detector shell is sealed.
The detector disclosed in the above patent still avoids the problem that the deviation of the modulation curve obtained by the system is caused by the inconsistency of the field angles of the detectors due to different installation orientations of the detectors, and the trouble that the modulation curve needs to be corrected off-line, which affects the detection efficiency and the energy resolution of the system.
Furthermore, on the one hand, due to the differences in understanding to the person skilled in the art; on the other hand, since the inventor has studied a lot of documents and patents when making the present invention, but the space is not limited to the details and contents listed in the above, however, the present invention is by no means free of the features of the prior art, but the present invention has been provided with all the features of the prior art, and the applicant reserves the right to increase the related prior art in the background.
Disclosure of Invention
Aiming at the defects of the prior art, the invention provides a position energy time testing device based on a CZT detector, which at least comprises: a scintillation crystal array comprising one or several scintillation crystals having a plurality of scintillation crystal pixels, wherein each scintillation crystal pixel has one or several light exit faces; one or several pixel detectors associated with at least one of the light exit faces of each scintillation crystal pixel and for detecting scintillation instances in a respective section of the scintillation crystal array and for providing an electronic pulse; a dedicated readout ASIC comprising a complete set of processing electronics or electronics and which is used to process the electronic pulses provided by the pixel detector; the special readout ASIC can respectively determine the relative time information of the ray action detector corresponding to a plurality of scintillation cases detected by each pixel detector on the level of a multi-pixel spectral detector module by utilizing the determined corresponding relation between the electronic pulse provided by the pixel detector and the luminous intensity of scintillation light generated by the scintillation crystal array under the incidence of radiation particles, and gather the plurality of scintillation cases from a single gamma photon, and carry out time coincidence logic processing to screen out effective scintillation cases scattered from Compton, and output scintillation case information which comprises the relative time information of the ray action detector, the pixel spectral information and the position information and is subjected to the time coincidence logic processing.
According to a preferred embodiment, the test apparatus comprises at least a plurality of pixel detectors, which are sequentially and adjacently spliced outside the scintillation crystal array in the circumferential direction thereof so as to collectively form a detection surface with reference to the central axis of the scintillation crystal array, wherein when a radiation particle enters the scintillation crystal array, the radiation particle generates a fluorescence effect in the scintillation crystal array and is converted into scintillation light, and during the transmission of the scintillation light photon, a scintillation case having a luminous intensity distribution centered on the incidence position of the radiation particle on the scintillation crystal array is formed, and the radiation exposure detector relative time information is determined based on the time information at the occurrence of each scintillation case.
According to a preferred embodiment, the testing device further comprises a multi-serial port time correction module provided with a plurality of independent and freely configurable serial communication ports, the multi-serial port time correction module corrects the absolute time of the incident radiation particles through the external GPS antenna interface and/or the pulse-coincident access interface which are configured, based on the time testing function of the GPS second pulse and/or the pulse-coincident time coincidence distinguishing function, wherein, when the testing device is in a working state, a pulse width modulation signal for controlling the width of the pulse signal to be acquired is provided by the coincidence pulse, when the pulse signal input by at least one input end is high level, the multi-serial port time correction module is used for normal collection, meanwhile, the relative time of the occurrence of the received GPS pulse per second recording case is compared, and the correction alignment of the relative time information of the ray action detector is realized.
According to a preferred embodiment, the dedicated readout ASIC comprises at least a preamplifier coupled to at least one of the pixel detectors for processing a pulse signal to an amplitude that can be discriminated by the pulse shaper and a pulse shaper coupled to the preamplifier, wherein the preamplifier is configured to receive a series of discretized pulse signals output by the pixel detectors and to amplify the pulse signals for output.
According to a preferred embodiment, the pulse shaper is configured to filter out a background noise signal that may be present in the pulse signal and that includes at least ambient noise and electronic noise in the preamplifier, and the pulse shaper is configured to filter out the background noise signal of lower amplitude by its preset threshold voltage, while shaping the pulse signal into an encoded signal of TTL level, CMOS level or RS232 level by a pulse shaping circuit by means of an amplified pulse signal of higher amplitude.
According to a preferred embodiment, the dedicated readout ASIC comprises at least a level comparator coupled to at least one of the pulse shapers, said level comparator being adapted to discriminate and compare signals it receives, wherein the level comparator is configured to compare the amplitude of the pulse signal input by the pulse shaper with a corresponding adjustable preset amplitude threshold, the output state is 1 when the amplitude of the pulse signal from the pixel detector exceeds the adjustable preset amplitude threshold value corresponding to the amplitude, when the amplitude of the pulse signal from the pixel detector does not exceed the corresponding adjustable preset amplitude threshold value, the output state is 0, and the output state is input to a trigger through a trigger channel for storage, the trigger generates a trigger signal to control the encoder to output an analog signal proportional to photon energy and an address corresponding to the trigger channel.
According to a preferred embodiment, the test apparatus further comprises a back-end circuit portion coupled to the dedicated readout ASIC, which at least comprises one or more of an analog signal processing circuit, a digital signal processing circuit and a high-voltage circuit, wherein the analog signal processing circuitry is configured to receive and process analog signals output by the dedicated readout ASIC into digital signals, dividing the energy information of the digital signal into 8192 channels by an analog-to-digital converter, processing the scintillation case information which comprises the relative time information of the ray action detector, the pixel energy spectrum information and the position information and is processed by time coincidence logic, packaging and sending the scintillation case information to the mobile terminal, the high-voltage circuit is used for providing negative 500V working high voltage for the pixel detector, and the high-voltage circuit can be controlled to be opened and closed through a high-voltage switch coupled with the high-voltage circuit.
According to a preferred embodiment, the testing device at least comprises a shell, the inside of the shell is divided into a detection area and an external area which are mutually independent and are in circuit connection, the scintillation crystal array, one or more pixel detectors, a special readout ASIC and the high-voltage circuit are all assembled in the detection area, the high-voltage circuit is connected to all the pixel detectors through leads so as to provide working high voltage for the pixel detectors, and the analog signal processing circuit and the digital signal processing circuit are respectively assembled on two end faces of the external area of the shell, wherein the two end faces are opposite to each other.
According to a preferred embodiment, the mobile terminal processes the received flicker case information and generates an ASIC ID, a Channel, a signal Channel address, a current GPS second pulse count when the signal is generated, and a number of clocks of an 80MHz clock that the signal is generated temporarily from a rising edge of the current GPS second pulse signal, which correspond to the flicker case information, wherein the ASIC ID is used to indicate a certain ASIC corresponding to a certain detector module, the Channel is used to indicate a number of channels of the ASIC, the signal Channel address is used to indicate detector coordinates corresponding to the ASIC and the Channel, and the current GPS second pulse count when the signal is generated indicates a count at the signal Channel address.
A position energy time testing system based on a CZT detector, the testing system comprising at least: a scintillation crystal array comprising one or several scintillation crystals having a plurality of scintillation crystal pixels, wherein each scintillation crystal pixel has one or several light exit faces; one or several pixel detectors associated with at least one of the light exit faces of each scintillation crystal pixel and for detecting scintillation instances in a respective section of the scintillation crystal array and for providing an electronic pulse; a dedicated readout ASIC comprising a complete set of processing electronics or electronics and which is used to process the electronic pulses provided by the pixel detector; the testing system is configured to determine corresponding ray action detector relative time information of a plurality of scintillation instances detected by each pixel detector respectively by utilizing the determined corresponding relation between the electronic pulse provided by the pixel detector and the luminous intensity of scintillation light generated by the scintillation crystal array under the incidence of radiation particles, gather the plurality of scintillation instances from a single gamma photon, perform time-coincidence logic processing to discriminate effective scintillation instances from Compton scattering, and output scintillation instance information which comprises the ray action detector relative time information, the pixel energy spectrum information and the position information and is subjected to the time-coincidence logic processing.
The position energy time testing system and device based on the CZT detector provided by the invention at least have the following beneficial technical effects:
position based on CZT detector provided by the inventionAccording to the energy time testing system, the CZT detector with high sensitivity response is formed by the plurality of pixel detectors which are arranged in an annular or rectangular array and in a modular design and the scintillation crystal array positioned in the center of the array, so that the sensitivity response of the CZT detector-based position energy time testing system is increased, the upper limit of the sensitivity of the testing system is expanded, and the energy time testing system has the characteristics of high sensitivity and short time response in a pulse radiation field measurement test. The adjustable range of the sensitivity can reach 10-15～10-16C·cm2the/MeV order of magnitude, and the time response can reach the nanosecond order of magnitude. When the annular layout detector provided by the invention is used for measuring the equivalent rate of peripheral dose, the angular response of the annular layout detector is more approximate to isotropy than that of other types of detectors, and the annular layout detector has higher detection efficiency, charge collection efficiency and energy spectrum resolution capability, so that the measurement result is more accurate.
Drawings
FIG. 1 is a simplified perspective view of a modular CZT detector provided by the present invention;
FIG. 2 is a simplified top view schematic diagram of a modular CZT detector provided by the present invention;
FIG. 3 is a simplified top view schematic diagram of another preferred embodiment modular CZT detector provided by the present invention;
FIG. 4 is a simplified top view schematic diagram of a position energy time testing apparatus provided in the present invention;
FIG. 5 is a simplified cross-sectional structural schematic diagram of a position energy time testing apparatus provided by the present invention;
FIG. 6 is a simplified rear view schematic diagram of a position energy time testing device provided by the present invention;
FIG. 7 is a simplified internal schematic diagram of a position energy time testing apparatus provided in the present invention;
FIG. 8 is a simplified overall structure diagram of the device for measuring the position energy time of the polarized rays provided by the present invention;
figure 9 is a simplified schematic diagram of a common prior art detector type. And
FIG. 10 is a simplified circuit connection diagram of a dedicated readout ASIC provided by the present invention.
List of reference numerals
100: a housing, 110: scintillation crystal array, 120: pixel detector, 130: dedicated readout ASIC, 140: high-voltage circuit, 150: analog signal processing circuit, 300: digital signal processing circuit, 310: external GPS antenna interface, 320: pulse access interface compliant, 330: preamplifier, 340: pulse shaper, 350: level comparator, 400: wireless communication interface, 410: wired communication interface, 420: power adapter socket, 430: high-voltage switch, 440: power switch, 450: mobile terminal, 500: rotor, 510: scatterer, 520: unpolarized radiation source, 530: inner ring, 540: outer ring
Detailed Description
The present invention will be described in detail with reference to the accompanying drawings.
As shown in fig. 1 and 2, a position energy time testing apparatus based on a CZT detector includes at least a scintillation crystal array 110. The scintillation crystal array 110 includes one or more scintillation crystals having a plurality of scintillation crystal pixels. Each scintillation crystal pixel has one or several light exit faces. As shown in fig. 1, the test apparatus includes at least one or several pixel detectors 120. Each pixel detector 120 is associated with at least one of the light exit faces of each scintillation crystal pixel. The pixel detectors 120 are used to detect scintillation instances in respective segments of the scintillation crystal array 110 and to provide electrical pulses. As shown in fig. 5, the test apparatus includes at least a dedicated readout ASIC 130. The dedicated readout ASIC130 includes a complete set of processing electronics or electronics. A dedicated readout ASIC130 is used to process the electrical pulses provided by the pixel detector 120. Preferably, the dedicated readout ASIC130 is capable of determining radiation exposure detector relative time information for each of the plurality of scintillation instances detected by each pixel detector 120, respectively, at the multi-pixel spectral detector module level, by utilizing the determined correspondence between the electrical pulse provided by the pixel detector 120 and the luminescence intensity of the scintillation light produced by the scintillation crystal array 110 upon incidence of the radiation particle. The dedicated readout ASIC130 aggregates multiple scintillation instances from a single gamma photon, performing time-aligned logic processing to screen out valid scintillation instances from compton scattering. The dedicated readout ASIC130 outputs scintillation case information that includes radiation exposure detector relative time information, pixel energy spectrum information, and position information and that is processed by time coincidence logic.
According to the position energy time testing system based on the CZT detector, the plurality of pixel detectors 120 which are arranged in the annular or rectangular array and are in the modularized design are adopted, and the plurality of pixel detectors and the scintillation crystal array 110 which is positioned in the center of the array jointly form the CZT detector with high sensitivity response, so that the sensitivity response of the position energy time testing system based on the CZT detector is increased, the upper limit of the sensitivity of the testing system is expanded, and the position energy time testing system has the characteristics of high sensitivity and short time response in the pulse radiation field measurement test. The adjustable range of the sensitivity can reach 10-15～10-16C·cm2the/MeV order of magnitude, and the time response can reach the nanosecond order of magnitude.
Preferably, the pixel detector 120 is composed of a conversion material capable of converting radiation particles into electronic pulses. The conversion material for X-rays may comprise an alloy of the Cd-Zn-Te alloy system. The individual pixel detector 120 has dimensions of 25.6mm by 5mm, with each pixel having dimensions of 1.6mm by 1.6 mm. Preferably, the binning pixels of a single pixel detector 120 are 16 × 16 pixels, each pixel having a size of 2mm × 2mm and a thickness of 5 mm. The high-end of photon energy can be detected at 50 keV-300 keV with high efficiency. Each pixel detector 120 substantially comprises electrodes, dielectric isolation, etc., such that the pixel detector 120 operates as an independent radiation detection element. According to the CZT crystal array detector, the relatively thick CZT crystal array and the small-size pixel surface element electrode are adopted, and meanwhile, excellent energy resolution and high spatial resolution of a testing system are guaranteed. As shown in fig. 1 and 7, the pixel detectors 120 are respectively disposed on respective corresponding bases, which provide mechanical support for the pixel detectors 120 and may further be disposed with conductive wires or other testing elements. Preferably, an optical modulator is disposed between the scintillation crystal array 110 and the pixel detector 120, and the optical modulator is configured to modulate the transmission of scintillation light between the scintillation crystal array 110 and the pixel detector 120. The optical modulator includes at least one optical modulator pixel having a floor area sized. The footprint of each optical modulator pixel is larger or smaller than the footprint of each pixel detector 120. A single pixel detector 120 or multiple pixel detectors 120 may be optically enabled or disabled by controlling the optical modulator. The detectors in the prior art generally have structural types such as a planar type, a trap electrode type, a coplanar gate type, a capacitance-Frichi gate type, a hemispherical type and a pixel type, as shown in FIG. 9, compared with the structural types of the detectors in the prior art, when the annular layout detector provided by the invention is used for measuring the equivalent rate of the peripheral dose, the angular response is more approximate to isotropy than that of other types of detectors, and the annular layout detector has higher detection efficiency, charge collection efficiency and energy spectrum resolution capability, so that the measurement result is more accurate.
Preferably, as shown in fig. 5, the dedicated readout ASIC130 is substantially planar and includes a front surface facing the pixel detector 120 and a back surface facing away from the pixel detector 120. The front surface of the dedicated readout ASIC130 may be connected to the pixel detector 120 by a flip-chip bond comprising a plurality of bond bumps, which provides a connection relationship for the pixel detector 120 and the dedicated readout ASIC130, enabling the electronic pulses generated by the pixel detector 120 to be transferred to the dedicated readout ASIC 130. The dedicated readout ASIC130 and the pixel detector 120 may have the same footprint.
Preferably, scintillating substances refer to substances which emit light radiation in a scintillating manner under the action of ionizing radiation. The scintillation crystal array 110 is a plastic scintillator PS, with dimensions of a cylinder 16mm in diameter and 25.6mm in length. Scintillators refer to elements sensitive to ionizing radiation composed of a certain amount of a scintillation substance in some suitable form, and are divided into two main categories, organic and inorganic, in the form of solids, liquids and gases, preferably sodium iodide thallium scintillator composed of a thallium activated sodium iodide scintillation substance.
According to a preferred embodiment, the test apparatus comprises at least a plurality of pixel detectors 120. As shown in fig. 1 and 3, the pixel detectors 120 are sequentially and adjacently spliced to the outside of the scintillator crystal array 110 along the circumferential direction thereof in a manner of collectively forming a detection surface with reference to the central axis of the scintillator crystal array 110. When radiation particles are incident on the scintillation crystal array 110, the radiation particles fluoresce in the scintillation crystal array 110 and are converted into scintillation light. During the transmission of the scintillation light photons, scintillation instances are formed having a luminescence intensity distribution centered at the incident position of the radiation particles on the scintillation crystal array 110. The ray exposure detector relative time information is determined based on the time information at which each scintillation event occurred. The invention adopts a mode that a plurality of pixel detectors 120 form a ring array to replace a conventional single detector, increases the effective area of a sensitive region of the detector, improves the counting rate of a test system, and solves the problems of low detection efficiency, reduced counting rate and low energy resolution when the test system in the prior art adopts a conventional setting mode of the single pixel detector 120 to measure X-rays, particularly high-energy X-rays.
According to a preferred embodiment, the test device further comprises a multi-serial time correction module configured with a plurality of independent and freely configurable serial communication ports. The multi-serial port time correction module corrects the absolute time of the incident radiation particles through the external GPS antenna interface 310 and/or the coincidence pulse access interface 320 which are configured, based on the time test function of the GPS second pulse and/or the coincidence pulse time coincidence resolution function. When the test device is in a working state, a pulse width modulation signal for controlling the width of the pulse signal to be acquired is provided by the coincidence pulse. When the pulse signal input by at least one input end is high level, the multi-serial port time correction module is used for normally collecting the pulse signal. Meanwhile, the relative time of the occurrence of the received GPS pulse per second recording case is compared, and the correction alignment of the relative time information of the ray action detector is realized.
According to a preferred embodiment, as shown in FIG. 10, the dedicated readout ASIC130 includes at least a preamplifier 330 coupled to at least one of the pixel detectors 120. The dedicated readout ASIC130 includes at least a pulse shaper 340 coupled to the preamplifier 330. The preamplifier 330 is used to process the pulse signal to an amplitude that can be identified by the pulse shaper 340. The preamplifier 330 is configured to receive a series of discretized pulse signals output by the pixel detector 120, and amplify and output the pulse signals.
The dedicated readout ASIC130 is divided into two parts, each containing 128 low noise preamplifiers 330130 oenc, each followed by a pulse shaper 340 adjustable peak time from 0.35 μ s to 1 μ s and a level comparator 350 for trigger and address coding. The dedicated readout ASIC130 can be used for single photon spectra of X-rays and gamma-rays with energies from 20keV to 700keV, and the rate per chip can be as high as 92 kHz. When the charge from the pixel detector 120 exceeds one of the adjustable thresholds, the module generates a trigger signal and transmits an analog signal proportional to the photon energy and an address corresponding to the trigger channel. The total power consumption of the dedicated readout ASIC130 is 180mW maximum.
According to a preferred embodiment, the pulse shaper 340 is used to filter out background noise signals that may be present in the pulse signal. The background noise signal includes at least ambient noise and electronic noise in the preamplifier 330. The pulse shaper 340 is configured to filter out the lower amplitude of the background noise signal by its preset threshold voltage. The pulse shaper 340 shapes the pulse signal into an encoded signal of TTL level, CMOS level, or RS232 level by using a pulse shaping circuit through the amplified pulse signal of higher amplitude.
According to a preferred embodiment, the dedicated readout ASIC130 includes at least a level comparator 350 coupled to at least one of the pulse shapers 340. The level comparator 350 is used to discriminate and compare the signals it receives. The level comparator 350 is configured to compare the amplitude of the pulse signal input by the pulse shaper 340 with a corresponding adjustable preset amplitude threshold. The output state is 1 when the amplitude of the pulse signal from the pixel detector 120 exceeds the adjustable preset amplitude threshold corresponding thereto. The output state is 0 when the amplitude of the pulse signal from the pixel detector 120 does not exceed the adjustable preset amplitude threshold corresponding thereto. The level comparator 350 is configured to input the output state to the flip-flop through the trigger channel for storage. The trigger generates a trigger signal to control the encoder to output an analog signal proportional to photon energy and an address corresponding to the trigger channel.
According to a preferred embodiment, the test apparatus further includes a back-end circuit portion coupled to the dedicated readout ASIC 130. The back-end circuit portion includes at least one or more of an analog signal processing circuit 150, a digital signal processing circuit 300, and a high-voltage circuit 140. The analog signal processing circuit 150 is configured to receive and process the analog signal output by the dedicated readout ASIC130 into a digital signal. The analog signal processing circuit 150 divides the energy information of the digital signal into 8192 channels by an analog-to-digital converter. The digital signal processing circuit 300 is configured to process and package scintillation case information which comprises ray action detector relative time information, pixel energy spectrum information and position information and is subjected to time coincidence logic processing, and then send the scintillation case information to the mobile terminal 450. The high voltage circuit 140 is used to provide the negative 500V operating high voltage for the pixel detector 120. The high voltage circuit 140 can be controlled to turn on or off by a high voltage switch 430 coupled thereto.
According to a preferred embodiment, the test device comprises at least a housing 100. The inside of the housing 100 is divided into a detection region and a circumscribed region which are independent of each other and electrically connected to each other. The scintillation crystal array 110, one or several pixel detectors 120, a dedicated readout ASIC130, and the high voltage circuit 140 are all mounted within the detection region. The high voltage circuit 140 is connected to all the pixel detectors 120 via wires to provide the pixel detectors 120 with high operating voltage. The analog signal processing circuit 150 and the digital signal processing circuit 300 are respectively mounted on two end faces of the external region of the housing 100, which are opposite to each other. Preferably, as shown in fig. 6, the housing 100 includes two switches and indicator lights, namely, a low voltage "POWER" and a high voltage "HV", wherein the low voltage is turned on and then on when the device is in use, and the high voltage is turned off and then off when the device is not in use. The three interfaces are respectively a wireless communication interface 400 'WAN', a wired communication interface 410 'USB' and a power adapter socket 420. The test system can be powered by a 12V/5A power adapter. The test system is provided with a high-voltage power supply, can work only by being connected with a DC power supply system outside, and can test through a local area network or a single machine off line by adopting a standard 10/100M Ethernet interface externally. Preferably, as shown in fig. 4, the side panel contains two BNC heads, a GPS antenna interface and a coincidence pulse interface, respectively, for correcting the absolute time of the incident gamma ray.
According to a preferred embodiment, the mobile terminal 450 processes the received blink instance information and generates an ASIC ID, a Channel, a signal Channel address, a current GPS second pulse count at the time of signal generation, and a number of clocks of an 80MHz clock that temporarily elapsed since a rising edge of the current GPS second pulse signal corresponding to the blink instance information. Wherein the ASIC ID is used to indicate a particular ASIC corresponding to a particular detector module. The Channel is used to indicate the number of channels of the ASIC. The signal addresses are used to represent detector coordinates corresponding to the ASIC and the Channel. The current GPS pulse-per-second count at the time the signal is generated represents the count at the signal track address.
A position energy time test system based on a CZT detector, the test system comprising at least: a scintillation crystal array 110 comprising one or several scintillation crystals having a plurality of scintillation crystal pixels, wherein each scintillation crystal pixel has one or several light exit faces; one or several pixel detectors 120 associated with at least one of the light exit faces of each scintillation crystal pixel and for detecting scintillation instances in a respective section of the scintillation crystal array 110 and for providing an electronic pulse; a dedicated readout ASIC130, which includes a complete set of processing electronics or electronics, and which is used to process the electronic pulses provided by the pixel detector 120; wherein the test system is configured to determine, at a multi-pixel spectral detector module level, a corresponding relationship between the determined electron pulse provided by the pixel detector 120 and the emission intensity of the scintillation light generated by the scintillation crystal array 110 upon incidence of the radiation particle, the dedicated readout ASIC130 is capable of determining, for each of a plurality of scintillation instances detected by the pixel detector 120, a corresponding ray exposure detector relative time information, aggregating the plurality of scintillation instances from a single gamma photon, performing temporal coincidence logic processing to discriminate valid scintillation instances from compton scattering, and outputting scintillation instance information that includes the ray exposure detector relative time information, the pixel spectral information, and the location information and that has been subjected to the temporal coincidence logic processing.
According to a preferred embodiment, the radiation source for emitting radiation particles employs a conventional radiation source, such as Am241、Co57、Na22、Cs137. By adopting radioactive source with radioactive activity/decay number of atomic nucleus in unit time of 200 milliCurie, the polarized light output intensity is ensured to be more than 10s/cm2. The radioactive sources can be classified into alpha radioactive sources, beta radioactive sources, gamma radioactive sources, low-energy photon sources, neutron sources, etc. according to the type of radiation they emit. The radioactive source can be divided into a radioactive substance with a sealed source and a radioactive substance without a sealed source, wherein the radioactive substance is sealed in a shell meeting certain requirements, and the non-sealed source has no shell according to the packaging mode of the radioactive source.
Preferably, the radioactive source shielding body and the collimator tube are used for shielding protection and collimation treatment of the radioactive source. Radioactivity is the microscopic flux of particles released during the transformation of nuclei from one structure or energy state to another; radioactivity can cause ionization or excitation of a substance, and is therefore referred to as ionizing radiation; ionizing radiation is divided into direct ionizing radiation and indirect ionizing radiation; direct ionizing radiation includes charged particles such as protons.
Preferably, the radioactive source shield for the radioactive source is a cube made of lead, which is a shielding material, to shield the radioactive source rays. Preferably, the length, width, height and thickness of the radioactive source shield made of lead as a shielding material are not less than 12cm, so that the shielding material with sufficient thickness can effectively absorb the rays. Preferably, the front panel of the radioactive source shield is provided with a radioactive source exit port, the diameter of the radioactive source exit port is 1cm, the field angle is approximately equal to 4.8 degrees, and the radioactive source is ensured to have higher output intensity while the collimation degree of the radioactive source is improved. Preferably, to prevent lead softening of the shielding material and affecting the exit opening due to long term retention, at least one steel tube is arranged in a mosaic manner inside the radioactive source shield. The wall thickness of the steel tube is 0.1cm, the inner diameter of the steel tube is 1cm, the outer diameter of the steel tube is 1.2cm, the length of the steel tube corresponds to the size of the radioactive source shielding body, and the Pb is prevented from changing the size of the collimation hole due to deformation of an external force.
Preferably, the first stage collimator, which is provided for the radiation source, is configured to pass radiation incident in a direction perpendicular to a plane in which the region of interest is located, so that only radiation incident perpendicularly to the region of interest can hit scattering material in the region of interest, so that the radiation is collimated as much as possible to minimize radiation incident on non-region of interest and to minimize the generation of scattering. Preferably, the first-stage collimator is mounted on the shielding box, a through hole is formed in a front panel of the shielding box, slide rails which are parallel to each other are fixedly connected to two opposite sides of the through hole, a movable plate which is matched with the slide rails is arranged at the end of the collimator, and the collimator is movably connected to the shielding box in a manner that the movable plate is embedded into the slide rails in the vertical direction, so that the collimator can move in the vertical direction and the height of the collimator is adjusted.
According to a preferred embodiment, the invention provides a position energy time testing system of a polarized ray based on a CZT detector, or a position energy time testing device of a polarized ray based on a CZT detector. As shown in fig. 8, the apparatus may include: at least one of the rotor 500, the scatterer 510, and the non-polarized radiation source 520. Rotor 500 may include an inner race 530 and/or an outer race 540 that are rotatable relative to each other about a central rotational axis. Incident unpolarized rays may compton scatter at diffuser 510 to form polarized rays. Unpolarized radiation may be generated within unpolarized radiation source 520 by decay of radiation source 310. Unpolarized radiation source 520 may collimate unpolarized radiation for incidence on diffuser 510. During testing operations, a CZT detector-based testing device to be tested may be fixed relative to outer ring 540. For example, an operator may fix or stably place a CZT detector-based testing device to be tested on outer ring 540. The non-polarized radiation source 520 may be fixed relative to the inner circle 530. For example, an operator may fasten the unpolarized radiation source 520 to the inner ring 530 by bolts. The unpolarized radiation source 520 may be rotated with the inner circle 530 to vary the angle of incidence of unpolarized radiation generated by the unpolarized radiation source 520 onto the scatterer 510. Thereby, polarized rays having mutually different degrees of polarization for testing the CZT detector based testing device to be tested can be formed according to mutually different angles of incidence at a fixed position where the CZT detector based testing device to be tested is located. When the first spatial radiation detector 400 is fixed relative to the outer ring 540, the unpolarized radiation source 520 disposed on the inner ring 530 may rotate, so that an incident angle of the unpolarized radiation source 520 incident on the scatterer 510 changes, which causes a scattering angle to change along with the incident angle, and thus a polarization degree of a polarized radiation formed in the CZT detector-based test apparatus changes, so as to provide a variable polarization degree environment for multiple tests, and the operation is very simple. According to the test requirement, the non-polarized ray source 520 can be rotated to quickly adjust the polarization degree of the rays formed at the fixed position where the CZT detector-based test device to be tested is located, a plurality of calibration environments with different polarization degrees are quickly formed to be used for the CZT detector-based test device to be tested to measure, and the test efficiency and accuracy are improved.
It should be noted that the above-mentioned embodiments are exemplary, and that those skilled in the art, having benefit of the present disclosure, may devise various arrangements that are within the scope of the present disclosure and that fall within the scope of the invention. It should be understood by those skilled in the art that the present specification and figures are illustrative only and are not limiting upon the claims. The scope of the invention is defined by the claims and their equivalents.
Claims (8)
1. A position energy time testing device based on a CZT detector is characterized by at least comprising:
a scintillation crystal array (110) comprising one or several scintillation crystals having a plurality of scintillation crystal pixels, wherein each scintillation crystal pixel has one or several light exit faces;
one or several pixel detectors (120), at least one or several of the pixel detectors (120) are spliced outside the scintillation crystal array (110) in a surrounding manner in the circumferential direction of the scintillation crystal array (110) in a manner of jointly forming a detection surface with the central axis of the scintillation crystal array (110) as a reference, wherein when radiation particles enter the scintillation crystal array (110), the radiation particles generate fluorescence effect in the scintillation crystal array (110) and are converted into scintillation light, during the transmission of the scintillation light photons, scintillation instances with luminous intensity distribution centered on the incidence position of the radiation particles on the scintillation crystal array (110) are formed, and ray action detector relative time information is determined based on time information when each scintillation instance occurs and is associated with at least one of the light emergent surfaces of each scintillation crystal pixel, for detecting scintillation instances in respective sections of the scintillation crystal array (110) and providing an electronic pulse;
a dedicated readout ASIC (130) comprising a complete set of processing electronics or electronics and which is used to process the electronic pulses provided by the pixel detector (120);
wherein, at a multi-pixel spectral detector module level, the dedicated readout ASIC (130) is capable of determining, for each of a plurality of scintillation instances detected by the pixel detectors (120), radiation exposure detector relative time information corresponding thereto, aggregating the plurality of scintillation instances from a single gamma photon, performing temporal coincidence logic processing to discriminate valid scintillation instances from compton scattering, and outputting scintillation instance information including radiation exposure detector relative time information, pixel energy spectrum information, and position information and processed by the temporal coincidence logic processing, by using the determined correspondence between the electronic pulse provided by the pixel detectors (120) and the luminescence intensity of scintillation light generated by the scintillation crystal array (110) upon incidence of radiation particles,
the test device also comprises a multi-serial port time correction module which is provided with a plurality of independent and freely configurable serial communication ports, the multi-serial port time correction module corrects the absolute time of the incident radiation particles through an external GPS antenna interface (310) and/or a coincidence pulse access interface (320) which are configured, based on the time test function of the GPS second pulse and/or the coincidence pulse coincidence resolution function, wherein, when the testing device is in a working state, a pulse width modulation signal for controlling the width of the pulse signal to be acquired is provided by the coincidence pulse, when the pulse signal input by at least one input end is high level, the multi-serial port time correction module is used for normal collection, meanwhile, the relative time of the occurrence of the received GPS pulse per second recording case is compared, and the correction alignment of the relative time information of the ray action detector is realized.
2. The testing apparatus of claim 1, wherein the dedicated readout ASIC (130) comprises at least a preamplifier (330) coupled to at least one of the pixel detectors (120) and a pulse shaper (340) coupled to the preamplifier (330), the preamplifier (330) being configured to process a pulse signal to an amplitude that can be discriminated by the pulse shaper (340), wherein the preamplifier (330) is configured to receive a series of discretized pulse signals output by the pixel detectors (120) and to amplify the pulse signals for output.
3. The test apparatus according to claim 2, wherein the pulse shaper (340) is configured to filter out background noise signals, which may be present in the pulse signal, including at least ambient noise and electronic noise in the preamplifier (330), the pulse shaper (340) being configured to filter out the background noise signals of lower amplitude by its preset threshold voltage, while shaping the pulse signal into an encoded signal of TTL level, CMOS level or RS232 level by a pulse shaping circuit with the amplified pulse signal of higher amplitude.
4. The test apparatus of claim 2, wherein the dedicated readout ASIC (130) comprises at least a level comparator (350) coupled to at least one of the pulse shapers (340), the level comparator (350) for discriminating and comparing signals it receives, wherein,
the level comparator (350) is configured to compare the amplitude of the pulse signal input by the pulse shaper (340) with a corresponding adjustable preset amplitude threshold, output a state of 1 when the amplitude of the pulse signal from the pixel detector (120) exceeds the adjustable preset amplitude threshold corresponding thereto, output a state of 0 when the amplitude of the pulse signal from the pixel detector (120) does not exceed the adjustable preset amplitude threshold corresponding thereto, and input the output state to a trigger for the trigger to generate a trigger signal to control an encoder to output an analog signal proportional to photon energy and an address corresponding to the trigger channel.
5. The test apparatus of claim 4, further comprising a back-end circuit portion coupled to the dedicated readout ASIC (130) that includes at least one or more of an analog signal processing circuit (150), a digital signal processing circuit (300), a high voltage circuit (140), wherein,
the analog signal processing circuit (150) is configured to receive and process the analog signal output by the dedicated readout ASIC (130) into a digital signal, split the energy information of the digital signal into 8192 traces by an analog-to-digital converter,
the digital signal processing circuit (300) is configured to process and package scintillation case information which comprises ray action detector relative time information, pixel energy spectrum information and position information and is processed by time coincidence logic, and then send the scintillation case information to the mobile terminal (450),
the high-voltage circuit (140) is used for providing negative 500V working high voltage for the pixel detector (120), and the high-voltage circuit (140) can be controlled to be opened and closed through a high-voltage switch (430) coupled with the high-voltage circuit.
6. The test device according to claim 5, characterized in that the test device comprises at least a housing (100), the interior of the housing (100) is divided into a detection area and an external area which are independent of each other and are electrically connected with each other, the scintillation crystal array (110), one or several pixel detectors (120), a dedicated readout ASIC (130) and the high voltage circuit (140) are all mounted in the detection area, the high voltage circuit (140) is connected to all the pixel detectors (120) through a lead wire to provide the pixel detectors (120) with working high voltage, and the analog signal processing circuit (150) and the digital signal processing circuit (300) are respectively mounted on two end faces of the external area of the housing (100) which are opposite to each other.
7. The test apparatus according to claim 5, wherein the mobile terminal (450) processes the received flicker case information and generates an ASIC ID, a Channel, a signal Channel address, a current GPS second pulse count at the time of the signal generation, a clock count of an 80MHz clock that the signal generation time temporarily passes from a rising edge of the current GPS second pulse signal, corresponding to the flicker case information,
wherein the ASIC ID is used to indicate a particular ASIC corresponding to a particular detector module, the Channel is used to indicate the Channel number of the ASIC, the signal Channel address is used to indicate the detector coordinates corresponding to the ASIC and the Channel, and the current GPS pulse-per-second count at the time of signal generation is indicative of the count at the signal Channel address.
8. A position energy time test system based on a CZT detector, the test system comprising at least:
a scintillation crystal array (110) comprising one or several scintillation crystals having a plurality of scintillation crystal pixels, wherein each scintillation crystal pixel has one or several light exit faces;
one or several pixel detectors (120), at least one or several of the pixel detectors (120) are spliced outside the scintillation crystal array (110) in a surrounding manner in the circumferential direction of the scintillation crystal array (110) in a manner of jointly forming a detection surface with the central axis of the scintillation crystal array (110) as a reference, wherein when radiation particles enter the scintillation crystal array (110), the radiation particles generate fluorescence effect in the scintillation crystal array (110) and are converted into scintillation light, during the transmission of the scintillation light photons, scintillation instances with luminous intensity distribution centered on the incidence position of the radiation particles on the scintillation crystal array (110) are formed, and ray action detector relative time information is determined based on time information when each scintillation instance occurs and is associated with at least one of the light emergent surfaces of each scintillation crystal pixel, for detecting scintillation instances in respective sections of the scintillation crystal array (110) and providing an electronic pulse;
a dedicated readout ASIC (130) comprising a complete set of processing electronics or electronics and which is used to process the electronic pulses provided by the pixel detector (120);
wherein the test system is configured to determine, at a multi-pixel spectral detector module level, respective ray-effect detector relative time information for a plurality of scintillation instances detected by each pixel detector (120) by using the determined correspondence between the electronic pulse provided by the pixel detector (120) and the luminescence intensity of scintillation light produced by the scintillation crystal array (110) upon incidence of a radiation particle, and to aggregate the plurality of scintillation instances from a single gamma photon, perform temporal coincidence logic processing to discriminate valid scintillation instances from compton scattering, and output scintillation instance information that includes the ray-effect detector relative time information, pixel energy spectrum information, and location information and that is temporally coincident with the logic processing;
the test device also comprises a multi-serial port time correction module which is provided with a plurality of independent and freely configurable serial communication ports, the multi-serial port time correction module corrects the absolute time of the incident radiation particles through an external GPS antenna interface (310) and/or a coincidence pulse access interface (320) which are configured, based on the time test function of the GPS second pulse and/or the coincidence pulse coincidence resolution function, wherein, when the testing device is in a working state, a pulse width modulation signal for controlling the width of the pulse signal to be acquired is provided by the coincidence pulse, when the pulse signal input by at least one input end is high level, the multi-serial port time correction module is used for normal collection, meanwhile, the relative time of the occurrence of the received GPS pulse per second recording case is compared, and the correction alignment of the relative time information of the ray action detector is realized.
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| CN114720755B (en) * | 2022-03-29 | 2023-05-16 | 中国科学院近代物理研究所 | Front end readout electronic circuit for particle detector |
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