CN110683327B

CN110683327B - Sample rack scheduling mechanism and method

Info

Publication number: CN110683327B
Application number: CN201810726168.9A
Authority: CN
Inventors: 何崇东; 李二圣; 王俊
Original assignee: Shenzhen Mindray Bio Medical Electronics Co Ltd; Shenzhen Mindray Scientific Co Ltd
Current assignee: Shenzhen Mindray Bio Medical Electronics Co Ltd; Shenzhen Mindray Scientific Co Ltd
Priority date: 2018-07-04
Filing date: 2018-07-04
Publication date: 2022-08-05
Anticipated expiration: 2038-07-04
Also published as: CN110683327A

Abstract

A sample rack dispatching mechanism and method introduces a first set of sample rack channels and a second set of sample rack channels; the first group of sample rack channels are used for users to take and place sample racks, and the second group of sample rack channels are used for assisting in scheduling of the sample racks stored in the first group of sample rack channels; the sample racks applying for testing in the first set of sample rack lanes may be dispatched in sequence to the second set of sample rack lanes until all lanes in the second set of sample rack lanes are occupied or until all sample racks applying for testing in the first set of sample rack lanes are dispatched to the second set of sample rack lanes, so that a user may place a sample rack in the first set of sample rack lanes again; and each sample rack dispatched from the first group of sample rack channels to the second group of sample rack channels is sequentially subjected to subsequent operations of scanning and sucking the sample.

Description

Sample rack scheduling mechanism and method

Technical Field

The invention relates to a sample rack dispatching mechanism and a sample rack dispatching method.

Background

At present, automatic analyzers such as biochemical analyzers and immunoassay analyzers have common sample transmission modes such as a sample tray sample feeding mode and a sample rack track sample feeding mode.

The sample injection method of the sample tray is to use the sample tray as a part for sample injection. Because the sample tray has simple structure and low cost, the sample tray and the sample feeding mode thereof are widely applied to middle and low-end models. But also because of the structural characteristics of the sample tray, the sample feeding mode of the sample tray is inconvenient for users to add and unload the tested samples at any time after the test is started.

The sample injection mode of the sample rack track adopts the structure of the sample rack track to perform sample injection. The sample rack rail is matched with the corresponding sample carrying trolley, so that samples can be dispatched to finish sample introduction operation. The sample rack rail sample introduction mode generally relates to a complex structure, occupies large space and has higher cost; nevertheless, the sample rack rail sample injection mode can support loading and taking samples on machine at any time due to the structural characteristics of the sample rack rail sample injection mode, and continuous and efficient testing under a large sample volume application mode is guaranteed, so that the sample rack rail sample injection mode is generally used for medium-high-end analysis devices.

The sample rack rail sample introduction mode is characterized in that the sample racks are generally conveyed according to the sample rack placing sequence, the sample racks placed firstly are conveyed firstly, then the sample racks placed are conveyed later, and the sample racks are excluded from entering the scanning position and the sample sucking position in sequence according to the placing sequence. On the one hand, the response speed of the samples for emergency treatment and automatic retesting is affected, and on the other hand, because the maximum number of the test samples moving on the instrument is fixed in design, it is difficult to subsequently expand the number of the sample racks supported by the instrument, and the expansion cost is high.

Certainly, some sample rack rails are used for sample injection, the sample racks are not transported according to the sample rack storage sequence, for example, the sample racks are taken away from any position of the sample rack storage area through a manipulator, the sample racks are placed at 90 degrees, then the sample racks are sequentially moved to a scanning position and a sample sucking position to complete scanning and sample sucking operations, and then the sample racks are placed back to the sample rack storage area. Although the scheme has quick response to emergency treatment and automatic retesting samples, the occupied space is large due to the structural characteristics, the complexity of the mechanism is increased due to the fact that the sample racks need to be translated and rotated in the sample rack transportation process, and in addition, the problems that the number of the supported sample racks is difficult to expand and the expansion cost is high exist in the scheme.

Disclosure of Invention

In view of the above, the present application provides a sample rack scheduling mechanism and method.

According to a first aspect, there is provided in one embodiment a method of sample rack scheduling, comprising:

providing a first set of sample rack channels and a second set of sample rack channels; the first group of sample rack channels are used for users to take and place sample racks, and the second group of sample rack channels are used for assisting in scheduling of the sample racks stored in the first group of sample rack channels;

after the test is started, sequentially dispatching the sample racks applying for the test in the first group of sample rack channels to the second group of sample rack channels until all the channels in the second group of sample rack channels are occupied or all the sample racks applying for the test in the first group of sample rack channels are dispatched to the second group of sample rack channels, so that a user can put the sample racks in the first group of sample rack channels again; and then, carrying out subsequent sample sucking operation on each sample rack dispatched from the first group of sample rack channels to the second group of sample rack channels in sequence.

In one embodiment, the method for dispatching the sample rack further comprises, after the test is started, for any sample rack stored in the first set of sample rack lanes for which the test is applied:

dispatching the sample rack from the first group of sample rack channels to the second group of sample rack channels, and dispatching the sample rack from the second group of sample rack channels to a sample sucking position to suck a sample; wherein the rack is scanned during rescheduling from the first set of rack channels to the draw position via the second set of rack channels;

after the sample of the sample rack is sucked, detecting whether the first group of sample rack channels can be used for dispatching the sample rack which has sucked the sample back to the first group of sample rack channels;

if the first group of sample rack channels is detected to be available for the sample rack to be dispatched to the first group of sample rack channels, dispatching the sample rack which has absorbed the sample to the first sample rack group channel for the user to take away;

if the first group of sample rack channels cannot be used for the sample rack to be dispatched to the first group of sample rack channels and the first group of sample rack channels store sample racks applying for testing, dispatching the sample racks applying for testing stored in the first group of sample rack channels to the second group of sample rack channels for storage, and dispatching the sample racks which absorb the samples to the first group of sample rack channels for the user to take; or if the first group of sample rack channels cannot be used for the sample rack to be dispatched to the first group of sample rack channels and the first group of sample rack channels store sample racks which do not apply for testing or have been tested, the sample rack which has absorbed the samples is dispatched to the second group of sample rack channels, and the user is prompted to take the sample racks which do not apply for testing or have been tested and are stored in the first group of sample rack channels.

In one embodiment, in the sample rack scheduling method:

after the sample of this sample frame is sucked to the completion, it is detected whether this sample frame of first group sample frame passageway can be supplied this sample frame to be dispatched back to first group sample frame passageway, include: detecting whether a channel originally storing the sample rack in the first group of sample rack channels is occupied;

if it is detected that the first group of sample rack channels can be used for dispatching the sample rack back to the first group of sample rack channels, dispatching the sample rack which has absorbed the sample back to the first group of sample rack channels for the user to take away, the method comprises the following steps: if the situation that the sample rack is not stored in the channel for storing the sample rack in the first group of sample rack channels is detected, the sample rack which finishes the sample suction is dispatched to the channel for storing the sample rack in the first group of sample rack channels for the user to take away;

if it is detected that the first group of sample rack channels cannot be used for the sample rack to be dispatched to the first group of sample rack channels and the first group of sample rack channels store sample racks applying for testing, the sample rack applying for testing stored in the first group of sample rack channels is dispatched to the second group of sample rack channels for storage, and then the sample rack which has absorbed the sample is dispatched to the first group of sample rack channels for the user to take, the method comprises the following steps: if the sample rack applying for testing is detected to be stored in the channel for storing the sample rack in the first group of sample rack channels, the sample rack applying for testing is dispatched to the channel for storing the sample rack which absorbs the samples in the second group of sample rack channels for storing, and then the sample rack which absorbs the samples is dispatched to the channel for storing the sample rack in the first group of sample rack channels for the user to take;

if it is detected that the first group of sample rack channels cannot be used for the sample rack to be dispatched to the first group of sample rack channels and the first group of sample rack channels store sample racks which do not apply for testing or have completed testing, the sample rack which has absorbed the samples is dispatched to the second group of sample rack channels and the user is prompted to take away the sample racks which do not apply for testing or have completed testing and are stored in the first group of sample rack channels, the method comprises the following steps: and if the situation that the channel for storing the sample rack in the first group of sample rack channels stores the sample rack which does not apply for testing or has already been tested is detected, the sample rack which absorbs the samples is dispatched to the channel in the second group of sample rack channels, and the user is prompted to take away the sample rack which does not apply for testing or has already been tested and stored in the channel for storing the sample rack which absorbs the samples in the first group of sample rack channels.

In one embodiment, in the sample rack scheduling method:

after the sample of this sample frame is sucked to the completion, it is detected whether this sample frame of first group sample frame passageway can be supplied this sample frame to be dispatched back to first group sample frame passageway, include: detecting whether a channel which does not store the sample rack exists in the first group of sample rack channels;

if it is detected that the first group of sample rack channels can be used for dispatching the sample rack back to the first group of sample rack channels, dispatching the sample rack which has absorbed the sample back to the first group of sample rack channels for the user to take away, the method comprises the following steps: if a channel which does not store the sample rack is detected in the first group of sample rack channels, dispatching the sample rack which finishes the sample suction to the channel which does not store the sample rack in the first group of sample rack channels for the user to take away;

if it is detected that the first group of sample rack channels cannot be used for the sample rack to be dispatched back to the first group of sample rack channels and the first group of sample rack channels store sample racks applying for testing, the rack body applying for testing stored in the first group of sample rack channels is dispatched to the second group of sample rack channels for storage, and then the sample rack which has absorbed the sample is dispatched back to the first group of sample rack channels for the user to take away, the method comprises the following steps: if it is detected that no channel which is not stored with the sample rack exists in the first group of sample rack channels and the sample rack which applies for the test is stored in the first group of sample rack channels, the sample rack which applies for the test and is stored in the first group of sample rack channels is dispatched to the second group of sample rack channels for storage, and then the sample rack which absorbs the sample is dispatched to the first group of sample rack channels for the user to take;

if it is detected that the first group of sample rack channels cannot be used for the sample rack to be dispatched to the first group of sample rack channels and the first group of sample rack channels store sample racks which do not apply for testing or have completed testing, the sample rack which has absorbed the samples is dispatched to the second group of sample rack channels and the user is prompted to take away the sample racks which do not apply for testing or have completed testing and are stored in the first group of sample rack channels, the method comprises the following steps: if it is detected that the first group of sample rack channels have no channels in which the sample racks are not stored and the first group of sample rack channels store sample racks which are not applied for testing or are tested, the sample racks which absorb the samples are dispatched to the original channels in the second group of sample rack channels for storage, and a user is prompted to take the sample racks which are stored in the first group of sample rack channels and are not applied for testing or are tested.

In one embodiment, when it is detected that the first group of sample rack passages can be used for the sample rack which has sucked the sample to be dispatched to the first group of sample rack passages, the sample rack dispatching method automatically dispatches the sample rack to the first group of sample rack passages for the user to take; and/or when a rack taking signal is received, if the first group of sample rack channels can be used for dispatching the sample rack which has absorbed the sample back to the first group of sample rack channels, dispatching the sample rack back to the first group of sample rack channels for the user to take.

In one embodiment, the sample rack scheduling method further includes:

providing at least one emergency channel;

when the emergency channel is detected to store the sample rack applied for testing, the sample rack is preferentially dispatched to the sample sucking position to suck the sample, and after the sample of the sample rack is sucked, the sample rack is dispatched to the emergency channel originally storing the sample rack for the user to take.

In one embodiment, the emergency channel is a channel in the first set of sample rack channels; the sample rack scheduling method further comprises providing a setup interface for a user to set one or more channels of the first set of sample rack channels as emergency channels.

In one embodiment, the sample rack scheduling method further includes:

providing at least one temporary storage channel;

the sample rack that will deposit the application test in first group sample rack passageway is dispatched to second group sample rack passageway and is deposited, will absorb the sample rack scheduling that finishes the sample and return first group sample rack passageway again for the user takes away, includes: and dispatching the sample rack which absorbs the sample to a temporary storage channel, and then dispatching the sample rack back to the first group of sample rack channels.

In one embodiment, the temporary storage channel is a scanning channel for scanning or a newly added scheduling channel not belonging to the first group of sample rack channels and the second group of sample rack channels.

In one embodiment, the first and second sets of sample rack channels are oppositely disposed; and/or the first and second sets of sample rack lanes have the same number of lanes.

According to a second aspect, there is provided in an embodiment a sample rack scheduling mechanism comprising:

the first group of sample rack channels are used for a user to take and place a sample rack;

a second set of sample rack lanes to assist in the scheduling of sample racks stored in the first set of sample rack lanes;

a sample rack scheduling unit for scheduling sample racks;

the controller is used for controlling the sample rack dispatching component to dispatch the sample racks applying for testing in the first group of sample rack channels to the second group of sample rack channels in sequence after the testing is started until all the channels in the second group of sample rack channels are occupied or until all the sample racks applying for testing in the first group of sample rack channels are dispatched to the second group of sample rack channels, so that a user can put the sample racks in the first group of sample rack channels again; and then controlling the sample racks dispatched from the first group of sample rack channels to the second group of sample rack channels to sequentially perform subsequent sample sucking operation.

In one embodiment, the controller is further configured to, after initiating the test, for any sample rack stored in the first set of sample rack lanes for which a test is to be applied:

controlling a sample rack dispatching component to dispatch the sample rack from the first group of sample rack channels to the second group of sample rack channels, and then dispatching the sample rack from the second group of sample rack channels to a sample sucking position so as to suck a sample; wherein the rack is scanned during rescheduling from the first set of rack channels to the draw position via the second set of rack channels;

after the sample of the sample rack is completely sucked, detecting whether the first group of sample rack channels can be used for dispatching the sample rack with the sucked sample back to the first group of sample rack channels;

if the first group of sample rack channels is detected to be available for the sample rack to be dispatched to the first group of sample rack channels, controlling the sample rack dispatching component to dispatch the sample rack which absorbs the sample to the first sample rack group channels for the user to take;

if the first group of sample rack channels cannot be used for the sample rack to be dispatched back to the first group of sample rack channels and the first group of sample rack channels store sample racks applying for testing, the sample rack dispatching component is controlled to dispatch the sample racks applying for testing stored in the first group of sample rack channels to the second group of sample rack channels for storage, and then the sample racks which have absorbed the samples are dispatched back to the first group of sample rack channels for the user to take; or if the first group of sample rack channels cannot be used for the sample rack to be dispatched to the first group of sample rack channels and the first group of sample rack channels store sample racks which do not apply for testing or have been tested, the sample rack dispatching component is controlled to dispatch the sample rack which has absorbed the samples to the second group of sample rack channels, and the user is prompted to take away the sample racks which do not apply for testing or have been tested and stored in the first group of sample rack channels.

In one embodiment, the controller detects whether the first set of rack lanes is available for the sample rack to be dispatched back to the first set of rack lanes after the sample rack has been completely aspirated, including: the controller detects whether a channel in which the sample rack is originally stored in the first group of sample rack channels is occupied;

if the controller detects that the first group of sample rack channels can be used for dispatching the sample rack back to the first group of sample rack channels, the controller controls the sample rack dispatching component to dispatch the sample rack which has absorbed the sample back to the first sample rack group channels for the user to take away, and the method comprises the following steps: if the controller detects that no sample rack is stored in the channel for storing the sample rack in the first group of sample rack channels, the controller controls the sample rack dispatching component to dispatch the sample rack which finishes the sample suction back to the channel for storing the sample rack in the first group of sample rack channels for the user to take;

if the controller detects that the first group of sample rack channels cannot be used for the sample rack to be dispatched to the first group of sample rack channels and the first group of sample rack channels store sample racks applying for testing, the controller controls the sample rack dispatching component to dispatch the sample racks applying for testing stored in the first group of sample rack channels to the second group of sample rack channels for storage and then dispatch the sample racks which have absorbed the samples back to the first group of sample rack channels for the user to take, and the method comprises the following steps: if the controller detects that the channel for storing the sample rack in the first group of sample rack channels originally stores the sample rack to be tested, the controller controls the sample rack scheduling component to schedule the sample rack to be tested to the channel for storing the sample rack which absorbs the samples in the second group of sample rack channels originally, and then the sample rack which absorbs the samples is scheduled back to the channel for storing the sample rack in the first group of sample rack channels originally for being taken by a user;

if the controller detects that the first group of sample rack channels cannot be used for the sample rack to be dispatched to the first group of sample rack channels and the first group of sample rack channels store sample racks which do not apply for testing or have been tested, the controller controls the sample rack dispatching component to dispatch the sample rack which has absorbed the samples to the second group of sample rack channels and prompts a user to take the sample racks which do not apply for testing or have been tested and stored in the first group of sample rack channels, and the method comprises the following steps: and if the controller detects that the channel for storing the sample rack in the first group of sample rack channels stores sample racks which do not apply for testing or have been tested, the controller controls the sample rack dispatching component to dispatch the sample rack which absorbs the samples back to the channel in the second group of sample rack channels, and prompts a user to take the sample racks which do not apply for testing or have been tested and stored in the channel for storing the sample rack which absorbs the samples in the first group of sample rack channels.

In one embodiment, the controller detects whether the first set of rack lanes is available for the sample rack to be dispatched back to the first set of rack lanes after the sample rack has been completely aspirated, including: the controller detects whether a channel which is not stored with the sample rack exists in the first group of sample rack channels;

if the controller detects that the first group of sample rack channels can be used for dispatching the sample rack back to the first group of sample rack channels, the controller controls the sample rack dispatching component to dispatch the sample rack which has absorbed the sample back to the first sample rack group channels for the user to take away, and the method comprises the following steps: if the controller detects that a channel which is not used for storing the sample rack exists in the first group of sample rack channels, the controller controls the sample rack dispatching component to dispatch the sample rack which finishes the sample suction to the channel which is not used for storing the sample rack in the first group of sample rack channels for the user to take away;

if the controller detects that the first group of sample rack channels cannot be used for the sample rack to be dispatched to the first group of sample rack channels and the first group of sample rack channels store sample racks applying for testing, the controller controls the sample rack dispatching component to dispatch the sample racks applying for testing stored in the first group of sample rack channels to the second group of sample rack channels for storage and then dispatch the sample racks which have absorbed the samples back to the first group of sample rack channels for the user to take, and the method comprises the following steps: if the controller detects that no channel which is not stored with the sample rack exists in the first group of sample rack channels and the sample rack which applies for testing is stored in the first group of sample rack channels, the controller controls the sample rack dispatching component to dispatch the sample rack which applies for testing and is stored in the first group of sample rack channels to the second group of sample rack channels for storage, and then dispatches the sample rack which absorbs the sample back to the first group of sample rack channels for the user to take;

if the controller detects that the first group of sample rack channels cannot be used for the sample rack to be dispatched to the first group of sample rack channels and the first group of sample rack channels store sample racks which do not apply for testing or have been tested, the controller controls the sample rack dispatching component to dispatch the sample rack which has absorbed the samples to the second group of sample rack channels and prompts a user to take the sample racks which do not apply for testing or have been tested and stored in the first group of sample rack channels, and the method comprises the following steps: and if the controller detects that no channel which is not stored with the sample rack exists in the first group of sample rack channels and a sample rack which is not applied for testing or is tested is stored in the first group of sample rack channels, the controller controls the sample rack scheduling component to schedule the sample rack which absorbs the sample back to the original channel in the second group of sample rack channels for storage and prompts a user to take the sample rack which is stored in the first group of sample rack channels and is not applied for testing or is tested.

In one embodiment, the sample rack dispatching mechanism further comprises at least one emergency channel; when the controller detects that the emergency channel stores the sample rack for applying for testing, the controller controls the sample rack scheduling component to schedule the sample rack to the sample sucking position preferentially to suck the sample, and after the sample of the sample rack is sucked, the sample rack is scheduled back to the emergency channel for storing the sample rack originally for the user to take.

In one embodiment, the emergency channel is a channel in the first set of sample rack channels.

In one embodiment, the sample rack dispatching mechanism further comprises a temporary storage channel; the controller controls the sample rack dispatching component to dispatch the sample rack which is stored in the first group of sample rack channels and applies for testing to the second group of sample rack channels for storage, and then dispatches the sample rack which has absorbed the sample back to the first group of sample rack channels for the user to take away, and the method comprises the following steps: the controller controls the sample rack dispatching component to dispatch the sample rack which absorbs the sample to the temporary storage channel, and then dispatches the sample rack to the first group of sample rack channels.

In one embodiment, the temporary storage channel is a scanning channel for scanning; or the sample rack dispatching mechanism further comprises a newly added dispatching channel which does not belong to the first group of sample rack channels and the second group of sample rack channels, and the temporary storage channel is the dispatching channel.

According to a third aspect, there is provided in an embodiment a sample rack scheduling mechanism comprising:

a first set of sample rack channels comprising a plurality of first channels for a user to pick and place a sample rack;

the second group of sample rack channels comprise a plurality of second channels, and the first group of sample rack channels and the second group of sample rack channels are correspondingly arranged and used for assisting the dispatching of the sample racks stored in the first group of sample rack channels;

and the sample rack scheduling component is used for scheduling the sample rack applying for testing in the at least one first channel to the corresponding second channel.

In one embodiment, there is at least one lane in the first set of rack lanes, and the rack dispatching component may move a rack stored in the lane in one direction to dispatch the rack into the second set of rack lanes.

In one embodiment, there is one corresponding lane in the second set of sample rack lanes for each lane in the first set of sample rack lanes; for each lane of the first set of lane, the rack scheduling component may move a rack stored in that lane in one direction to schedule that rack into a lane of the lane corresponding to the lane of the second set of lanes.

In one embodiment, the first and second sets of sample rack lanes have the same number of lanes.

In one embodiment, the first channels are numbered 1-N in sequence, the second channels are numbered (N +1) -2N in sequence, the first channel X of the first group of sample rack channels corresponds to the second channel X + N of the second group of sample rack channels, N and X are integers, N is greater than or equal to 3, and X is greater than or equal to 1 and less than or equal to N.

In one embodiment, the sample rack dispatching mechanism further comprises at least one emergency channel, when a sample rack requiring for testing is stored in the emergency channel, the sample rack is preferably dispatched to the scanning channel or the scanning position for scanning, and then dispatched to the sample sucking position for sucking the sample, and after the sample of the sample rack is completely sucked, the sample rack is dispatched to the emergency channel where the sample rack is originally stored for the user to take.

In one embodiment, the sample racks that apply for testing in the first set of sample rack lanes are dispatched to the second set of sample rack lanes in sequence until all lanes in the second set of sample rack lanes are occupied or until all sample racks that apply for testing in the first set of sample rack lanes are dispatched to the second set of sample rack lanes, such that a user may place a sample rack in the first set of sample rack lanes again; and each sample rack dispatched from the first group of sample rack channels to the second group of sample rack channels is sequentially subjected to subsequent sample sucking operation.

In one embodiment, the sample rack dispatching mechanism further comprises a controller, and the controller is configured to, after the test is started, for any sample rack stored in the first set of sample rack lanes for which a test is applied:

after the sample of the sample rack is completely sucked, detecting whether the first group of sample rack channels can be used for dispatching the sample rack back to the first group of sample rack channels;

According to the sample rack dispatching mechanism and method of the above embodiments, a first group of sample rack channels and a second group of sample rack channels are introduced; the first group of sample rack passages are used for users to take and place sample racks, the second group of sample rack passages are used for assisting in scheduling of the sample racks stored in the first group of sample rack passages, and the purpose of expanding the sample rack passages can be substantially achieved through control over sample rack scheduling.

Drawings

FIG. 1 is a schematic diagram of a prior art sample rack dispatching mechanism;

FIG. 2 is a schematic structural diagram of a sample rack dispatching mechanism according to an embodiment;

FIG. 3 is a schematic structural diagram of a sample rack dispatching mechanism according to another embodiment;

FIG. 4 is a diagram of a position schedule for the sample rack scheduling mechanism when it schedules a sample rack;

FIG. 5 is a diagram of another position schedule for the sample rack scheduling mechanism when it schedules a sample rack;

FIG. 6 is a flow diagram of a method of sample rack scheduling of an embodiment;

fig. 7 is a flowchart of a sample rack scheduling method according to another embodiment.

Detailed Description

The present invention will be described in further detail with reference to the following detailed description and accompanying drawings. Wherein like elements in different embodiments are numbered with like associated elements. In the following description, numerous details are set forth in order to provide a better understanding of the present application. However, those skilled in the art will readily recognize that some of the features may be omitted or replaced with other elements, materials, methods in different instances. In some instances, certain operations related to the present application have not been shown or described in detail in order to avoid obscuring the core of the present application from excessive description, and it is not necessary for those skilled in the art to describe these operations in detail, so that they may be fully understood from the description in the specification and the general knowledge in the art.

Furthermore, the features, operations, or characteristics described in the specification may be combined in any suitable manner to form various embodiments. Also, the various steps or actions in the method descriptions may be transposed or transposed in order, as will be apparent to one of ordinary skill in the art. Thus, the various sequences in the specification and drawings are for the purpose of describing certain embodiments only and are not intended to imply a required sequence unless otherwise indicated where such sequence must be followed.

The numbering of the components as such, e.g., "first", "second", etc., is used herein only to distinguish the objects as described, and does not have any sequential or technical meaning. The term "connected" and "coupled" when used in this application, unless otherwise indicated, includes both direct and indirect connections (couplings).

For a better understanding of the present invention, a description of the prior art is provided.

Fig. 1 is a schematic diagram illustrating an example of a sample rack dispatching mechanism in the prior art. The sample rack dispatching mechanism comprises a group of sample rack channels, a scanning channel, a sample sucking position and a movement dispatching trolley, which are specifically explained below.

The set of sample rack lanes described above, such as lanes 1-N in the figures, are used for a user to place a rack sample rack to be tested. The scanning channel is used for scanning information of the sample rack and the sample thereof when the sample rack is dispatched to the scanning channel. The sample sucking position is used for carrying out sample sucking operation on the sample rack when the sample rack is dispatched to the sample sucking position.

And the movement scheduling trolley schedules the sample rack among the positions. For example, the motion scheduling cart may perform two-dimensional or three-dimensional motion, and as shown in the figure, the motion scheduling cart may schedule the sample rack from the sample rack channel to the scanning channel by moving in the negative Y direction, then moving in the negative X direction, and then moving in the positive Y direction, so that the sample rack and the sample thereof are scanned in the scanning channel for information; the motion scheduling trolley moves towards the negative Y direction, so that the sample rack can be scheduled to the sample sucking position from the scanning channel, and the sample rack can suck samples at the sample sucking position; the movement dispatching trolley moves towards the positive X direction and then moves towards the positive Y direction, so that the sample rack can be dispatched from the sample sucking position to the original sample rack channel, and a user can take the sample rack which is tested away from the sample rack channel.

The above is the basic structure and scheduling process of the sample rack scheduling mechanism in the prior art. Of course, the sample rack dispatching mechanism may also include other components, for example, an indicator light may be further disposed below each sample rack aisle to indicate whether the sample test of the sample rack aisle is completed, that is, whether the sample rack placed in the sample rack aisle is completed and dispatched back to the sample rack aisle; for example, a user operation interface may be further provided for a user to apply for a sample test, and the like, which is not described herein again.

It can be seen that when the equipment leaves the factory and is put into use, the number of channels of the sample rack which can be used by a user is fixed and is very difficult to expand; and after a user applies for a sample test on a certain sample rack channel, the sample rack channel can take the sample rack with the test completed from the sample rack channel only when the sample rack originally put in the channel is scheduled to return after the test is finished.

Referring to fig. 2, the present invention provides a sample rack dispatching mechanism, which includes a first group of sample rack lanes 100, a second group of sample rack lanes 200 and a sample rack dispatching component 300, and referring to fig. 3, in an embodiment, the present invention may further include a controller 400, which is described in detail below.

The first set of sample rack lanes 100 are used for a user to access the sample racks, for example, the first set of sample rack lanes 100 includes a plurality of first lanes, each of which can receive one sample rack. The second set of rack lanes 200 may include a plurality of second lanes, and the first set of rack lanes 100 and the second set of rack lanes 200 may be correspondingly configured to facilitate the scheduling of the sample racks stored in the first set of rack lanes 100. The corresponding arrangement of the first set of sample rack lanes 100 and the second set of sample rack lanes 200 may refer to the arrangement of the first lanes corresponding to the second lanes, e.g. at least one first lane in the first set of sample rack lanes 100 and one corresponding second lane in the second set of sample rack lanes 200.

In one embodiment, the first set of rack lanes 100 and the second set of rack lanes 200 have the same number of lanes — for example, as shown in fig. 2 and 3, the first set of rack lanes 100 includes lanes 1 to N, and the second set of rack lanes 200 includes lanes N +1 to 2N, where N may be an integer greater than or equal to 1; thus, each first channel corresponds to one second channel, each second channel also corresponds to one first channel, and the first channels and the second channels are in one-to-one correspondence. For example, in one embodiment, the first set of sample rack lanes 100 includes N first lanes numbered sequentially from 1 to N, and the second set of sample rack lanes 200 also includes N second lanes numbered sequentially from (N +1) to 2N, such that the lane numbered X in the first lane corresponds to the lane numbered X + N in the second lane, where N and X are integers, N ≧ 3, and 1 ≦ X ≦ N.

Of course in other embodiments, there may be more channels in the first set of sample rack channels 100 than in the second set of sample rack channels 200, such that there is one first channel for each second channel; the first set of sample rack lanes 100 may have fewer lanes than the second set of sample rack lanes 200, such that there is one second lane for each first lane.

The sample rack scheduling part 300 is used to schedule the sample racks. For example, the sample rack dispatching component 300 is configured to dispatch a sample for testing in at least one first lane to a corresponding second lane. The sample rack scheduling component 300 may schedule the sample racks between the respective lanes, the scan lanes, and the draw sites in the first and second sets of

sample rack lanes

100 and 200. For example, the sample rack scheduling component 300 is a scheduling cart capable of two-dimensional or three-dimensional movement, and reference is made to the foregoing for the movement of the scheduling cart, which is not described herein again.

In one embodiment, there is at least one lane in the first set of rack lanes 100 and the rack dispatching component 300 may move a rack stored in that lane in one direction to dispatch that rack into the second set of rack lanes 200. For example, taking the example where the first group of sample rack lanes 100 has lanes 1-N, there is lane 1 where a sample rack stored in lane 1 may be scheduled by the sample rack scheduling component 300 in one direction (e.g., the negative Y direction in the figure) to lane N +1 in the second group of sample rack lanes 200.

Further, each lane in the first set of sample rack lanes 100 has a corresponding lane in the second set of sample rack lanes 200; for each lane in the first set of rack lanes 100, the rack dispatching component 300 may move the rack stored in that lane in one direction to dispatch the rack to the lane in the second set of rack lanes 200. For example, it is not limited to the case where the first set of rack lanes 100 has lanes 1 to N, the second set of rack lanes 200 has at least lanes N +1 to 2N, and the lanes 1 to N of the first set of rack lanes 100 correspond to the lanes N +1 to 2N of the second set of rack lanes 200, such as lane 1 corresponding to lane N +1, lane 2 corresponding to lane N +2, lane 3 corresponding to lane N +3, … …, and lane N corresponding to lane 2N. For each pair of corresponding lanes, lane 1 and lane N +1 are not taken as examples, and a sample rack stored in lane 1 may be scheduled by the sample rack scheduling component 300 to lane N +1 in the second set of sample rack lanes 200 in one direction (e.g., the negative Y direction in the figure). In order to address testing of sample racks for urgent or temporary prioritized processing, the sample rack scheduling mechanism of an embodiment may further include at least one emergency channel, which is one of: when a sample rack applied for testing is stored, the sample rack is preferentially dispatched to a scanning channel or a scanning position for scanning and then dispatched to a sample sucking position for sucking a sample, and after the sample of the sample rack is sucked, the sample rack is dispatched to an emergency channel where the sample rack is originally stored for being taken by a user. In one particular embodiment, the emergency channel may be implemented as follows: when detecting that the emergency channel stores the sample rack to be tested, the controller 400 controls the sample rack scheduling component 300 to preferentially schedule the sample rack to the scanning channel or the scanning position for scanning, then schedule the sample rack from the scanning channel to the sample sucking position for sucking the sample, and after the sample of the sample rack is sucked, schedule the sample rack back to the emergency channel where the sample rack is originally stored for the user to take. In one embodiment, the emergency channel is a channel in the first set of sample rack channels 100. For example, one or more channels in the first group of sample rack channels 100 may be fixedly set as emergency channels, and related components may also be provided for a user to flexibly set one or more channels in the first group of sample rack channels 100 as emergency channels, for example, a setting interface may be provided for a user to set one or more channels in the first group of sample rack channels 100 as emergency channels, and in particular, when the controller 400 receives an emergency channel setting instruction, the one or more channels in the first group of sample rack channels 100 are set as emergency channels according to the received emergency channel setting instruction; when the emergency channels are not needed, the user can restore the emergency channels to the original common channels without the priority authority by setting the interface.

In a particular testing and scheduling process, the sample racks in the first set of sample rack lanes 100 that apply for testing may be sequentially scheduled to the second set of sample rack lanes until all lanes in the second set of sample rack lanes 200 are occupied or until all sample racks in the first set of sample rack lanes 100 that apply for testing are scheduled to the second set of sample rack lanes 200, so that a user may place sample racks in the first set of sample rack lanes 100 again; each sample rack dispatched from the first set of sample rack lanes 100 to the second set of sample rack lanes 200 is then sequentially subjected to subsequent operations of aspirating samples. It will be appreciated by those skilled in the art that the sample rack needs to be scanned from the initial first set of sample rack lanes 100 to the operation of finally being scheduled to a suction position for sucking the sample, and that this scanning operation is not mentioned herein by the applicant as it is known by those skilled in the art that the sample rack needs to be scanned first after the sample is sucked.

The above-described testing and scheduling processes, when implemented in detail, may be implemented by the controller 400 described above.

The following examples are given.

Taking the example that the number of the channels of the first group of sample rack channels 100 is less than or equal to the number of the channels of the second group of sample rack channels 200, it is not necessary to provide that the first group of sample rack channels 100 have channels 1-N, and the second group of sample rack channels 200 have at least channels N + 1-2N; when a user puts N sample racks into channels 1 to N of the first group of sample rack channels 100, respectively, and starts a test, the sample rack scheduling component 300 sequentially schedules the sample racks in the channels 1 to N of the first group of sample rack channels 100 to channels N +1 to 2N of the second group of sample rack channels 200, for example, the sample rack in the channel 1 is scheduled to the channel N +1, the sample rack in the channel 2 is scheduled to the channel N +2, the sample rack in the channel 3 is scheduled to the channels N +3, … …, and the sample rack in the channel N is scheduled to the channel 2N; then, the sample racks dispatched into the channels N + 1-2N of the second group of sample rack channels 200 are sequentially dispatched to a sample sucking position and the like so as to perform subsequent sample sucking operation; at this time, the sample racks in the channels 1 to N of the first group of sample rack channels 100 are all scheduled away, so that the user can continue to place the sample rack to be tested into the first group of sample rack channels 100, thereby substantially achieving the purpose of expanding the sample rack channels. The sample rack scanning operation may be performed in a process in which the sample rack is scheduled from the second group of sample rack lanes 200 to the sample aspirating position, for example, the sample rack is scheduled from the lanes of the second group of sample rack lanes 200 to the scanning lanes or scanning positions for scanning, and then scheduled from the scanning lanes to the sample aspirating position; it is of course also possible to place the scanning operation between the dispatching of the sample racks from the first group of sample rack aisles 100 to the second group of sample rack aisles 200, for example, the sample racks are dispatched from the aisles of the first group of sample rack aisles 100 to the scanning aisles or scanning sites for scanning and then from the scanning aisles to the second group of sample rack aisles 200. While the sample rack scanning operation may be performed while the sample racks are being dispatched from the second set of sample rack lanes 200 to the draw position, this has the advantage that all sample racks in the first set of sample rack lanes 100 may be quickly dispatched to the second set of sample rack lanes 200, thereby quickly freeing the first set of sample rack lanes 100 for the user to re-place the sample racks in the first set of sample rack lanes 100. The following description will be made in relation to the scanning operation, but the scanning operation of the sample rack is performed in a process in which the sample rack is placed in the sample rack and is dispatched from the second group of sample rack lanes 200 to the sample aspirating position.

Taking the example that the number of the channels of the first group of sample rack channels 100 is greater than that of the second group of sample rack channels 200, it is not necessary to provide that the first group of sample rack channels 100 have channels 1-N, and the second group of sample rack channels 200 have channels N + 1-2N-1, that is, the number of the second group of sample rack channels 200 is 1 less than that of the first group of sample rack channels 100; when a user puts N sample racks into channels 1-N of a first group of sample rack channels 100 respectively and starts a test, a sample rack scheduling component 300 sequentially schedules the sample racks in the channels 1-N-1 of the first group of sample rack channels 100 to channels N + 1-2N-1 of a second group of sample rack channels 200 respectively, for example, the sample rack in the channel 1 is scheduled to the channel N +1, the sample rack in the channel 2 is scheduled to the channel N +2, the sample rack in the channel 3 is scheduled to the channels N +3, … …, the sample rack in the channel N-1 is scheduled to the channel 2N-1, and all the channels in the second group of sample rack channels 200 are occupied; then, the sample racks in the channels N + 1-2N dispatched to the second group of sample rack channels 200 are sequentially dispatched to a scanning channel, a sample sucking position and the like so as to perform subsequent operations of scanning and sucking samples; because the sample racks in the channels 1-N-1 of the first set of sample rack channels 100 have all been scheduled away at this time, the user can continue to place the sample racks to be tested into the channels 1-N-1 of the first set of sample rack channels 100, thereby substantially achieving the purpose of expanding the sample rack channels.

In order to further explain the present invention, the whole scheduling and testing process is described below by taking a sample rack which is stored in the first group of sample rack lanes 100 and applied for testing as an example.

In one embodiment of the sample rack dispatching mechanism, as described above, the sample rack dispatching mechanism may further comprise a controller 400, and the controller 400 is configured to, after the test is started, perform the following control for any sample rack stored in the first set of sample rack lanes 100 that requests for testing:

the controller 400 controls the sample rack dispatching component 300 to dispatch the sample rack from the first set of sample rack lanes 100 to the second set of sample rack lanes 200, and then to dispatch the sample rack from the second set of sample rack lanes 200 to the sample sucking position for sucking the sample; in the process of dispatching the sample rack from the second group of sample rack channels 200 to the sample sucking positions, the sample rack may be dispatched from the second group of sample rack channels 200 to the scanning channels or scanning positions for scanning, and then dispatched from the scanning channels to the sample sucking positions;

after the sample of the sample rack is completely sucked, detecting whether the first group of sample rack channels 100 can be used for dispatching the sample rack with the sucked sample back to the first group of sample rack channels 100;

if it is detected that the first group of sample rack passages 100 is available for the sample rack to be dispatched back to the first group of sample rack passages 100, controlling the sample rack dispatching component to dispatch the sample rack which has absorbed the sample back to the first group of sample rack passages 100 for the user to take;

if it is detected that the first set of sample rack lanes is not available for the sample rack to be dispatched back to the first set of sample rack lanes 100, then two scenarios are possible:

in one case, the first group of sample rack lanes 100 store sample racks for testing, the controller 400 controls the sample rack dispatching component 300 to dispatch the sample racks for testing stored in the first group of sample rack lanes 100 to the second group of sample rack lanes 200 for storage, and then to dispatch the sample racks with samples drawn back to the first group of sample rack lanes 100 for removal by the user. In an embodiment, the controller 400 may control the rack dispatching component 300 to dispatch the sample rack requiring test stored in the first group of sample rack lanes 100 to the second group of sample rack lanes 200 for storage, and then directly dispatch the sample rack having absorbed the sample back to the first group of sample rack lanes 100 for the user to take. In another embodiment, a buffer lane may be further introduced, and the controller 400 may control the rack dispatching unit 300 to dispatch the sample rack requiring test stored in the first group of the rack lanes 100 to the second group of the rack lanes 200 for storage, and control the rack dispatching unit 300 to dispatch the sample rack having sucked the sample to the buffer lane before dispatching the sample rack back to the first group of the rack lanes. The buffer lane may be the scan lane described above, or a newly added dispatch lane that does not belong to the first group of rack lanes 100 and the second group of rack lanes 200.

In another case, if the first group of sample rack passageways 100 store sample racks that have not been applied for testing or have been tested, the sample rack dispatching component 300 is controlled to dispatch the sample racks that have been sucked back to the second group of sample rack passageways 200, and prompt the user to take the sample racks that have not been applied for testing or have been tested and stored in the first group of sample rack passageways 100. Moreover, when the user takes the sample rack which is stored in the first group of sample rack channels 100 and has not applied for testing or has been tested, the controller 400 may control the sample rack dispatching component 300 to dispatch the sample rack which has been sucked from the second group of sample rack channels 200 back to the channel which is left in the first group of sample rack channels and is vacant after the sample rack which has not applied for testing or has been tested is taken by the user, so as to be taken by the user.

For example, taking the sample rack a stored in the first set of sample rack lanes 100 for testing as an example, the controller 400 controls the sample rack dispatching component 300 to dispatch the sample rack a to the second set of sample rack lanes 200, dispatch the sample rack a from the second set of sample rack lanes 200 to the scan lane or scan position for scanning, and dispatch the sample rack a from the scan lane to the sample sucking position for sucking the sample. When the sample aspiration for the sample rack a is complete, the controller 400 retrieves whether the first set of sample rack lanes 100 is available for the sample rack a to be dispatched back to the first set of sample rack lanes 100. If the controller 400 detects that the first group of sample rack lanes 100 is available for the sample rack a to be dispatched back to the first group of sample rack lanes 100, it controls the sample rack dispatching component 300 to dispatch the sample rack a back to the first group of sample rack lanes 100 for removal by the user. If the controller 400 detects that the first set of sample rack lanes is not available for the sample rack a to be dispatched back to the first set of sample rack lanes 100: if it is because the first group of sample rack lanes 100 now stores the sample rack to be tested, such as sample rack B1, the controller 400 controls the sample rack dispatching component 300 to dispatch sample rack B1 to the second group of sample rack lanes 200 for storage and to dispatch sample rack a back to the first group of sample rack lanes 100 for removal by the user; if it is because the first group of sample rack lanes 100 now store sample racks that have not been applied for testing or have been tested, such as sample rack B2, the sample rack scheduling component 300 is controlled to schedule sample rack a back to the second group of sample rack lanes 200 and prompt the user to remove the sample rack B2 stored in the first group of sample rack lanes 100. When the user removes the sample rack B2, the controller 400 may then dispatch the sample rack a from the second set of sample rack aisles 200 back to the aisle in the first set of sample rack aisles 100 that was freed after the sample rack B2 was removed for removal by the user.

While the above is an overall strategy for the controller 400 to control the scheduling of the sample racks, in particular embodiments, two specific strategies may be selected by the controller 400.

(1) The first specific strategy is:

after the test is started, the controller 400 is configured to control the sample rack scheduling component 300 to schedule the sample rack to the second group of sample rack lanes 200 for any sample rack stored in the first group of sample rack lanes 100 to be tested, then schedule the sample rack from the second group of sample rack lanes 200 to the scan lane or scan position for scanning, and then schedule the sample rack from the scan lane to the sample sucking position for sucking the sample. When the sample is completely aspirated from the sample rack, the controller 400 detects whether the lane that originally stored the sample rack in the first set of sample rack lanes 100 is occupied. If the controller 400 detects that no sample rack is stored in the channel in which the sample rack is stored in the first group of sample rack channels 100, the sample rack scheduling component 300 is controlled to schedule the sample rack that has completed the sample suction back to the channel in which the sample rack is stored in the first group of sample rack channels 100 for the user to take. If the controller 400 detects that the channel for storing the sample rack in the first group of sample rack channels 100 originally stores the sample rack to be tested, the controller 300 is controlled to dispatch the sample rack to be tested to the channel for storing the sample rack with the sucked sample in the second group of sample rack channels 200, and then dispatch the sample rack with the sucked sample back to the channel for storing the sample rack in the first group of sample rack channels 100 for the user to take. If the controller 400 detects that the channel for storing the sample rack in the first set of sample rack channels 100 originally stores a sample rack which does not apply for testing or has already been tested, the controller 300 is controlled to control the sample rack dispatching component 300 to dispatch the sample rack which has absorbed the sample back to the channel for storing the sample rack which has absorbed the sample in the second set of sample rack channels 200, and prompt the user to take away the sample rack which has not apply for testing or has already been tested and stored in the channel for storing the sample rack which has absorbed the sample in the first set of sample rack channels 100. When the user takes the sample rack which is not applied for testing or has been tested in the first group of sample rack passages 100, the controller 400 may control the sample rack dispatching component 300 to dispatch the sample rack which has been taken out from the second group of sample rack passages 200 back to the passage which is vacant in the first group of sample rack passages 100 for the user to take.

Referring to fig. 4, a sample rack a stored in a lane 1 of the first set of sample rack lanes 100 is taken as an example, and the sample rack a is a sample rack to be tested. The controller 400 controls the rack scheduling unit 300 to schedule the sample rack a to the second group of sample rack lanes 200, for example, lane N +1 of the second group of sample rack lanes 200, to schedule the sample rack a from lane N +1 of the second group of sample rack lanes 200 to the scan lane or scan bit for scanning, and to schedule the sample rack a from the scan lane to the sample sucking bit for sucking the sample.

When the suction of the sample rack a is completed, the controller 400 detects whether the lane 1 that originally stored the sample rack a in the first group of sample rack lanes 100 is occupied.

If the controller 400 detects that the lane 1 does not store a sample rack, it controls the sample rack scheduling unit 300 to schedule the sample rack a back to the lane 1 for the user to take.

If the controller 400 detects that the lane 1 stores a sample rack to be tested, for example, the sample rack B1, the controller 300 controls the sample rack scheduling unit 300 to schedule the sample rack B1 to the lane N +1 where the sample rack a was stored in the second group of sample rack lanes 200 for storage, and then to schedule the sample rack a back to the lane 1 for the user to take.

If the controller 400 detects that the lane 1 stores a sample rack that has not been tested or has been tested, for example, the sample rack B2, it controls the sample rack dispatching unit 300 to dispatch the sample rack a back to the lane N +1 where the sample rack a was stored in the second group of sample rack lanes 200, and prompts the user to take the sample rack B2 stored in the lane 1 where the sample rack a was stored in the first group of sample rack lanes 100. When the user has taken the sample rack B2, the controller 400 may control the sample rack scheduling component 300 to schedule the sample rack a from lane N +1 of the second set of sample rack lanes 200 back to lane 1 of the first set of sample rack lanes 100 that is free for removal by the user.

(2) Second specific strategy

After the test is started, the controller 400 is configured to control the sample rack scheduling component 300 to schedule the sample rack to the second group of sample rack lanes 200 for any sample rack stored in the first group of sample rack lanes 100 to be tested, then schedule the sample rack from the second group of sample rack lanes 200 to the scan lane or scan position for scanning, and then schedule the sample rack from the scan lane to the sample sucking position for sucking the sample. When the sample is completely sucked from the sample rack, the controller 400 detects whether there is a passage in the first group of sample rack passages 100 where no sample rack is stored. If the controller 400 detects that there is a passage without a sample rack in the first group of sample rack passages 100, the sample rack dispatching component 300 is controlled to dispatch the sample rack with the sample suction completed to the passage without a sample rack in the first group of sample rack passages 100 for the user to take. If the controller 400 detects that there is no channel in the first group of sample rack channels 100 in which a sample rack is not stored and a sample rack applying for testing is stored in the first group of sample rack channels 100, the controller controls the sample rack dispatching component 300 to dispatch the sample rack applying for testing stored in the first group of sample rack channels 100 to the second group of sample rack channels 200 for storage, and then dispatches the sample rack which has absorbed the sample back to the first group of sample rack channels 100 for being taken by the user; or, if the controller detects that there is no channel in which a sample rack is not stored in the first group of sample rack channels 100 and a sample rack that does not apply for testing or has been tested is stored in the first group of sample rack channels 100, the controller controls the sample rack scheduling component 300 to schedule the sample rack that has absorbed the sample back to the channel in which the sample rack that has absorbed the sample is originally stored in the second group of sample rack channels 200 for storage, and prompts the user to take away the sample rack that does not apply for testing or has been tested stored in the first group of sample rack channels 100, and when the user takes away the sample rack that does not apply for testing or has been tested in the first group of sample rack channels 100, the controller 400 may control the sample rack scheduling component 300 to schedule the sample rack that has absorbed the sample back from the second group of sample rack channels 200 to the channel that is vacant in the first group of sample rack channels 100 for the user to take away.

Referring to fig. 5, a sample rack a stored in a lane 1 of the first set of sample rack lanes 100 is taken as an example, and the sample rack a is a sample rack to be tested. The controller 400 controls the rack scheduling unit 300 to schedule the sample rack a to the second group of sample rack lanes 200, for example, lane N +1 of the second group of sample rack lanes 200, to schedule the sample rack a from lane N +1 of the second group of sample rack lanes 200 to the scan lane or scan bit for scanning, and to schedule the sample rack a from the scan lane to the sample sucking bit for sucking the sample.

When the sample is completely sucked from the sample rack a, the controller 400 detects whether there is a passage in the first group of sample rack passages 100 in which no sample rack is stored.

If the controller 400 detects that there is a passage without a sample rack in the first group of sample rack passages 100, for example, the passage 3, the controller controls the sample rack dispatching component 300 to dispatch the sample rack a to the passage 3 without a sample rack in the first group of sample rack passages 100 for the user to take; of course, if it is detected that there are a plurality of lanes not storing sample racks in the first group of sample rack lanes 100, for example, lanes 3, 4, and 5, the controller 400 may control the sample rack dispatching component 300 to dispatch the sample rack a to any lane not storing a sample rack in the first group of sample rack lanes 100, that is, to dispatch the sample rack a to any lane in lanes 3, 4, and 5 for the user to take.

If the controller 400 detects that there is no channel in the first group of sample rack channels 100 in which no sample rack is stored, and a sample rack requiring testing, such as sample rack B1, is stored in the first group of sample rack channels 100, the controller 300 controls the sample rack scheduling component 300 to schedule the sample rack B1 stored in the first group of sample rack channels 100 to the second group of sample rack channels 200 for storage, and then to schedule the sample rack a back to the channel in the first group of sample rack channels 100 in which the sample rack B1 is scheduled to go and then be taken out for the user. Alternatively, if the controller 400 detects that there is no channel in the first group of rack lanes 100 in which no sample rack is stored, and there is a sample rack in the first group of rack lanes 100 that has not been applied for testing or has been tested, such as sample rack B2, then the controller 400 controls the sample rack scheduling component 300 to schedule the sample rack a back to lane N +1 in which the sample rack a was stored in the second group of rack lanes 200 for storage, and prompts the user to take away the first group of rack lanes 100 to store sample rack B2, and when the user takes away sample rack B2, the controller 400 may control the sample rack scheduling component 300 to schedule the sample rack a from the second group of rack lanes 200 back to the lane left out in the first group of rack lanes 100 for the user to take away. Of course, if the controller 400 detects that there are no channels in the first set of sample rack channels 100 that have no sample racks stored therein, and the first set of rack lanes 100 contains sample racks that require testing, such as sample rack B1, and also contains sample racks that have not required testing or have been tested, such as sample rack B2, the controller 400 may then choose to control the rack dispatching component 300 to dispatch the rack B1 stored in the first group of rack aisles 100 to the second group of rack aisles 200 for storage, and dispatch the rack a back to the aisle of the first group of rack aisles 100 where the rack B1 was dispatched to be free, for the user to take away, or alternatively, the sample rack dispatching component 300 may be controlled to dispatch the sample rack a back to the lane N +1 where the sample rack a was originally stored in the second group of sample rack lanes 200 for storage, and the user may be prompted to take away the first group of sample rack lanes 100 for storage of the sample rack B2.

The above description is given by taking any sample rack that is stored in the first set of sample rack lanes 100 and applies for testing as an example, and the scheduling process of the sample rack scheduling mechanism is described. It can be seen that for any sample rack, such as sample rack a, stored in the first set of sample rack lanes 100 for applying a test, it is first dispatched to the second set of sample rack lanes 200 to free up the lanes of the first set of sample rack lanes 100 for the user to continue to place a new sample rack for applying a test; and after the sample rack A finishes the sample suction or the test, under the conditions that a newly-placed sample rack applying the test exists or does not exist in the first group of sample rack channels 100 and the like, how to dispatch the sample rack A back to the first group of sample racks for the user to take out is provided.

The above description is about the specimen rack dispatching mechanism of the present invention. The invention also discloses a sample rack dispatching method, which can be based on the sample rack dispatching mechanism disclosed above, for example, in an embodiment of the sample rack dispatching method, a first group of sample rack channels 100 and a second group of sample rack channels 200 are provided, the first group of sample rack channels 100 are used for a user to take and place a sample rack, and the second group of sample rack channels 200 are used for assisting in dispatching a sample rack stored in the first group of sample rack channels 100; the first set of sample rack lanes 100 and the second set of sample rack lanes 200 may be oppositely disposed; the number of lanes of the first set of sample rack lanes 100 and the second set of sample rack lanes 200 may also be the same.

In one embodiment of the sample rack scheduling method, the method may include: after the test is started, the sample racks applying for the test in the first group of sample rack channels 100 are sequentially dispatched to the second group of sample rack channels 200 until all the channels in the second group of sample rack channels 200 are occupied or until all the sample racks applying for the test in the first group of sample rack channels 100 are dispatched to the second group of sample rack channels 200, so that a user can put the sample racks in the first group of sample rack channels 100; and then the subsequent sample sucking operation is sequentially performed on each sample rack dispatched from the first group of sample rack passage 100 to the second group of sample rack passage 200.

It should be noted that the scanning operation of the sample rack may be performed during the process that the sample rack is scheduled from the second group of sample rack lanes 200 to the sample sucking position, for example, the sample rack is scheduled from the lanes of the second group of sample rack lanes 200 to the scanning lanes or scanning positions for scanning, and then scheduled from the scanning lanes to the sample sucking positions; it is of course also possible to place the scanning operation between the dispatching of the sample racks from the first group of sample rack aisles 100 to the second group of sample rack aisles 200, for example, the sample racks are dispatched from the aisles of the first group of sample rack aisles 100 to the scanning aisles or scanning sites for scanning and then from the scanning aisles to the second group of sample rack aisles 200. While the sample rack scanning operation may be performed while the sample racks are being dispatched from the second set of sample rack lanes 200 to the draw position, this has the advantage that all sample racks in the first set of sample rack lanes 100 may be quickly dispatched to the second set of sample rack lanes 200, thereby quickly freeing the first set of sample rack lanes 100 for the user to re-place the sample racks in the first set of sample rack lanes 100.

In the above, a batch of sample racks to be tested is taken as an example, how the sample racks are scheduled is described from the whole, and in the following, scheduling of the sample rack scheduling method in the whole test flow process is described by taking a single sample rack as a view point.

Referring to fig. 6, in an embodiment of the method for dispatching sample racks, after the test is started, the method includes steps 1000 to 1014 for any sample rack, such as sample rack a, stored in the first group of sample rack lanes, which will be described in detail below.

Step 1000: the sample rack a is dispatched from the first set of sample rack lanes 100 to the second set of sample rack lanes 200.

Step 1002: the pipetting schedule operation, for example, then schedules the sample rack from the second set of sample rack 200 lanes to pipette samples.

Wherein the rack is scanned as it is rescheduled from the first set of rack lanes 100 through the second set of rack lanes 200 to a draw position. For example, the sample rack a is dispatched from the second set of sample rack lanes 200 to a scan lane or scan location for scanning and then the sample rack a is dispatched from the scan lane to a sample aspirating location.

Step 1004: after the sample suction for the sample rack a is completed, it is detected whether the first set of sample rack channels 100 is available for the sample rack a with the sucked sample to be dispatched back to the first set of sample rack channels 100.

The results of the test can be broadly divided into two types, one is that the first set of rack lanes 100 is detected for the sample rack a to be dispatched back to the first set of rack lanes 100; the other is to detect that the first set of sample rack lanes is not available for the sample rack a to be dispatched back to the first set of sample rack lanes 100.

Step 1006: if it is detected that the first group of rack lanes 100 is available for the rack to be dispatched back to the first group of rack lanes 100, the rack a that has aspirated the sample is dispatched back to the first rack lane for the user to take. In one embodiment, when it is detected that the first set of rack lanes 100 is available for the sample rack a with the aspirated sample to be dispatched back to the first set of rack lanes 100, the sample rack a is automatically dispatched back to the first set of rack lanes 100 for removal by the user. Alternatively, in one embodiment, when the rack taking signal is received, if it is detected that the first group of sample rack lanes 100 is available for the sample rack a that has drawn the sample to be dispatched back to the first group of sample rack lanes 100, the sample rack a is dispatched back to the first group of sample rack lanes 100 for the user to take.

Step 1008: if it is detected that the first group of rack lanes 100 is not available for the sample rack a to be dispatched back to the first group of rack lanes 100 and the first group of rack lanes 100 stores a sample rack for testing, such as sample rack B1, the sample rack B1 for testing stored in the first group of rack lanes 100 is dispatched to the second group of rack lanes 200 for storage, and the sample rack a with the sample drawn is dispatched back to the first group of rack lanes 100 for removal by the user.

Step 1010: if it is detected that the first group of rack lanes 100 is not available for the sample rack a to be dispatched to the first group of rack lanes 100 and the first group of rack lanes 100 stores sample racks that have not been applied for testing or have been tested, such as sample rack B2, the sample rack a that has drawn the sample is dispatched to the second group of rack lanes 200 and the user is prompted to take the sample rack B2 that has been stored in the first group of rack lanes 100 and that has not been applied for testing or has been tested.

It should be noted that if it is detected that the first group of sample rack lanes 100 is not available for the sample rack a to be dispatched back to the first group of sample rack lanes 100, and the first group of sample rack lanes 100 stores both the sample rack to which a test is applied, such as the sample rack B1 described above, and the sample rack that has not been applied for a test or has been tested, such as the sample rack B2 described above, then either of steps 1010 and 1012 may be selected.

Referring to fig. 7, the sample rack scheduling method in an embodiment may further include step 1012: when the user removes sample rack B2, sample rack a may also be dispatched back to the vacant lane of the first set of sample rack lanes for sample rack B2 to be removed by the user.

Of the above steps, steps 1004-1010 relate to the process of dispatching the blotted or tested sample rack A back to the first set of sample rack lanes 100 for removal by the user. Two specific examples are described below.

The first example is as follows:

step 1004 may be: it is checked whether the lane in which the sample rack a was originally stored in the first group of sample rack lanes 100 (without providing that the sample rack a was originally stored in lane 1 in the first group of sample rack lanes 100) is occupied.

Step 1006 may be: if it is detected that no sample rack is stored in the lane 1 that originally stores the sample rack a in the first group of sample rack lanes 100, the sample rack a that has completed the sample suction is dispatched back to the lane 1 that originally stores the sample rack a in the first group of sample rack lanes 100 for the user to take.

Step 1008 may be: if it is detected that the lane 1 that originally stored the sample rack a in the first group of sample rack lanes 100 stores a sample rack to be tested, for example, the sample rack B1, the sample rack B1 that originally stored the sample rack a that absorbed the sample in the second group of sample rack lanes 200 (the sample rack a that originally stored in the first group of sample rack lanes 100 in the lane N +1 is not set up) is scheduled for storage, and the sample rack a that absorbed the sample is scheduled back to the lane 1 that originally stored the sample rack a in the first group of sample rack lanes 100 for the user to take. In one embodiment, the sample rack for testing stored in the first set of sample rack passage 100 is dispatched to the second set of sample rack passage 200 for storage, and then the sample rack with the sample sucked up is directly dispatched back to the first set of sample rack passage 100 for the user to take. In one embodiment, a buffer lane may be introduced such that the sample rack a with the sample may be dispatched to the buffer lane before being dispatched to the first group of sample rack lanes 100 when the sample rack a with the sample may be dispatched to the buffer lane. The buffer channel may be the scan channel described above, or a newly added scheduling channel that does not belong to the first group of rack channels 100 and the second group of rack channels 200.

Step 1010 may be: if it is detected that the lane 1, which originally stored the sample rack a in the first group of sample rack lanes 100, stores an unapplied or tested sample rack, such as sample rack B2, the sample rack a that has sucked the sample is dispatched back to the lane N +1, which originally stored in the second group of sample rack lanes 200, and the user is prompted to take away the unapplied or tested sample rack B2 stored in the lane 1 in the first group of sample rack lanes 100.

The second example is as follows:

step 1004 may be: it is checked whether there is a lane in the first set of rack lanes 100 where no rack is stored.

Step 1006 may be: if a passage without a sample rack is detected in the first group of sample rack passages 100, the sample rack A which finishes the sample suction is dispatched to the passage without the sample rack in the first group of sample rack passages 100 for the user to take.

Step 1008 may be: if it is detected that there is no empty rack in the first set of rack lanes 100 and a rack requiring test, such as rack B1, is stored in the first set of rack lanes 100, the rack schedule B1 for testing stored in the first set of rack lanes 100 is stored in the second set of rack lanes 200, and the rack a with the sample drawn is scheduled back to the first set of rack lanes 100 for the user to take.

Step 1010 may be: if it is detected that there is no channel in the first group of sample rack channels 100 in which no sample rack is stored and no sample rack application or a sample rack already tested, such as sample rack B2, is stored in the first group of sample rack channels 100, the sample rack a with the sample sucked up is dispatched to the channel in the second group of sample rack channels 200 for storage, and the user is prompted to take away the sample rack B2 stored in the first group of sample rack channels 100 which has no sample rack application or has already been tested.

In order to deal with the test of the urgent treatment or the temporary preferential treatment sample rack, the sample rack scheduling method of an embodiment may further include at least one emergency channel, and the emergency channel is one of: when a sample rack applied for testing is stored, the sample rack is preferentially dispatched to a scanning channel or a scanning position for scanning and then dispatched to a sample sucking position for sucking a sample, and after the sample of the sample rack is sucked, the sample rack is dispatched to an emergency channel where the sample rack is originally stored for being taken by a user. In a specific embodiment, the function of the emergency channel can be implemented as follows: when the emergency treatment channel is detected to store a sample rack applying for testing, the sample rack is preferentially dispatched to the scanning channel or the scanning position for scanning, then the sample rack is dispatched to the sample sucking position from the scanning channel to suck the sample, and after the sample of the sample rack is sucked, the sample rack is dispatched back to the emergency treatment channel originally storing the sample rack for the user to take. In one embodiment, the emergency channels may be channels in the first set of sample rack channels 100. For example, one or more of the first set of sample rack channels 100 may be fixedly configured as an emergency treatment channel, although related components may also be provided for a user to flexibly configure one or more of the first set of sample rack channels 100 as an emergency treatment channel, for example, a configuration interface may be provided for a user to configure one or more of the first set of sample rack channels as an emergency treatment channel.

The present invention has been described in terms of specific examples, which are provided to aid understanding of the invention and are not intended to be limiting. For a person skilled in the art to which the invention pertains, several simple deductions, modifications or substitutions may be made according to the idea of the invention.

Claims

1. A method for scheduling a sample rack, comprising:

after the test is started, the sample racks applying for the test in the first group of sample rack channels are sequentially dispatched to the second group of sample rack channels until all the channels in the second group of sample rack channels are occupied or until all the sample racks applying for the test in the first group of sample rack channels are dispatched to the second group of sample rack channels, so that a user can put the sample racks in the first group of sample rack channels again; then, each sample rack dispatched from the first group of sample rack channels to the second group of sample rack channels is sequentially subjected to subsequent sample sucking operation;

after the test is started, for any sample rack stored in the first group of sample rack channels for applying the test:

if the first group of sample rack channels cannot be used for dispatching the sample rack back to the first group of sample rack channels and the first group of sample rack channels store sample racks applying for testing, dispatching the sample racks applying for testing stored in the first group of sample rack channels to the second group of sample rack channels for storage, and dispatching the sample racks which absorb the samples back to the first group of sample rack channels for the user to take; or if the first group of sample rack channels cannot be used for the sample rack to be dispatched to the first group of sample rack channels and the first group of sample rack channels store sample racks which do not apply for testing or have been tested, the sample rack which has absorbed the samples is dispatched to the second group of sample rack channels, and the user is prompted to take the sample racks which do not apply for testing or have been tested and are stored in the first group of sample rack channels.

2. The method according to claim 1, wherein after the test is initiated, for any sample rack stored in the first set of sample rack lanes for which a test is applied:

dispatching the sample rack from the first group of sample rack channels to the second group of sample rack channels, and dispatching the sample rack from the second group of sample rack channels to a sample sucking position to suck a sample; wherein the rack is scanned during rescheduling from the first set of rack lanes to the draw position through the second set of rack lanes.

3. The sample rack scheduling method of claim 1, wherein:

after the sample is completely sucked by the sample rack, detecting whether the first group of sample rack channels can be used for dispatching the sample rack back to the first group of sample rack channels comprises: detecting whether a channel originally storing the sample rack in the first group of sample rack channels is occupied;

4. The sample rack scheduling method of claim 1, wherein:

after the sample of the sample frame is sucked, detecting whether the first group of sample frame channels can be used for the sample frame to be dispatched to the first group of sample frame channels or not comprises: detecting whether a channel which does not store the sample rack exists in the first group of sample rack channels;

5. The sample rack scheduling method according to any one of claims 2 to 4, wherein: when the first group of sample rack channels are detected to allow the sample rack which has sucked the sample to be dispatched to the first group of sample rack channels, automatically dispatching the sample rack to the first group of sample rack channels for the user to take away; and/or when a rack taking signal is received, if the first group of sample rack channels are detected to be available for the sample rack which absorbs the sample to be dispatched to the first group of sample rack channels, dispatching the sample rack to the first group of sample rack channels for the user to take.

6. The sample rack scheduling method of any one of claims 1 to 4, further comprising:

providing at least one emergency channel;

when the emergency channel is detected to store the sample rack applying for testing, the sample rack is preferentially dispatched to the sample sucking position to suck the sample, and after the sample sucking of the sample rack is completed, the sample rack is dispatched to the emergency channel where the sample rack is originally stored for the user to take away.

7. The sample rack scheduling method of claim 6, wherein the emergency channel is a channel in a first set of sample rack channels; the sample rack scheduling method further comprises providing a setup interface for a user to set one or more channels of the first set of sample rack channels as emergency channels.

8. The sample rack scheduling method of any one of claims 2 to 4, further comprising:

providing at least one temporary storage channel;

the sample rack that will deposit the application test in first group sample rack passageway is dispatched to second group sample rack passageway and is deposited, will absorb the sample rack scheduling that finishes the sample and return first group sample rack passageway again for the user takes away, includes: and dispatching the sample rack which absorbs the sample to a temporary storage channel, and dispatching the sample rack back to the first group of sample rack channels.

9. The method according to claim 8, wherein the buffer lane is a scan lane for scanning or a newly added scheduling lane that does not belong to the first and second groups of sample rack lanes.

10. The sample rack scheduling method of any of claims 1 to 4, wherein the first and second sets of sample rack lanes are oppositely disposed; and/or the first and second sets of sample rack lanes have the same number of lanes.

11. A sample rack dispatching mechanism, comprising:

the first group of sample rack channels are used for a user to take and place the sample rack;

a second set of sample rack lanes to facilitate scheduling of sample racks stored in the first set of sample rack lanes;

a sample rack scheduling unit for scheduling sample racks;

the controller is used for controlling the sample rack dispatching component to dispatch the sample racks applying for testing in the first group of sample rack channels to the second group of sample rack channels in sequence until all the channels in the second group of sample rack channels are occupied or until all the sample racks applying for testing in the first group of sample rack channels are dispatched to the second group of sample rack channels after the testing is started, so that a user can put the sample racks in the first group of sample rack channels again; then, controlling each sample rack dispatched from the first group of sample rack channels to the second group of sample rack channels to sequentially perform subsequent sample sucking operation;

the controller is further configured to, after initiating testing, for any sample rack stored in the first set of sample rack lanes for which testing is to be applied:

after the samples of the sample racks are completely sucked, detecting whether the first group of sample rack channels can be used for dispatching the sample racks with the sucked samples back to the first group of sample rack channels;

12. The specimen rack dispatching mechanism of claim 11, wherein the controller, upon initiating testing, for any specimen rack stored in the first set of specimen rack lanes for which testing is to be applied:

controlling a sample rack dispatching component to dispatch the sample rack from the first group of sample rack channels to the second group of sample rack channels, and then dispatching the sample rack from the second group of sample rack channels to a sample sucking position so as to suck a sample; wherein the rack is scanned during rescheduling from the first set of rack lanes to the draw position through the second set of rack lanes.

13. The sample rack scheduling mechanism of claim 11, wherein:

the controller detects whether the first set of rack channels is available for the sample rack to be dispatched back to the first set of rack channels after the sample rack sample is completely aspirated, comprising: the controller detects whether a channel in which the sample rack is originally stored in the first group of sample rack channels is occupied;

14. The sample rack scheduling mechanism of claim 11, wherein:

the controller detects whether the first set of rack channels is available for the sample rack to be dispatched back to the first set of rack channels after the sample rack sample is completely aspirated, comprising: the controller detects whether a channel which is not stored with a sample rack exists in the first group of sample rack channels;

if the controller detects that the first group of sample rack channels can be used for dispatching the sample rack back to the first group of sample rack channels, the controller controls the sample rack dispatching component to dispatch the sample rack which has absorbed the sample back to the first sample rack group channels for the user to take away, and the method comprises the following steps: if the controller detects that a channel which does not store the sample rack exists in the first group of sample rack channels, the controller controls the sample rack dispatching component to dispatch the sample rack which finishes the sample suction to the channel which does not store the sample rack in the first group of sample rack channels for the user to take away;

15. The sample rack scheduling mechanism of any of claims 12 to 14, further comprising at least one emergency channel; when the controller detects that the emergency channel stores the sample rack for applying for testing, the controller controls the sample rack scheduling component to schedule the sample rack to the sample sucking position preferentially to suck the sample, and after the sample of the sample rack is sucked, the sample rack is scheduled back to the emergency channel for storing the sample rack originally for the user to take.

16. The sample rack scheduling mechanism of claim 15, wherein the emergency channel is a channel in the first set of sample rack channels.

17. The sample rack scheduling mechanism of claim 15 wherein the controller, upon receiving an emergency channel setup instruction, sets one or more channels of the first set of sample rack channels to emergency channels according to the emergency channel setup instruction.

18. The sample rack scheduling mechanism of any one of claims 12 to 14 further comprising a staging channel; the controller controls the sample rack dispatching component to dispatch the sample rack which is stored in the first group of sample rack channels and applies for testing to the second group of sample rack channels for storage, and then dispatches the sample rack which has absorbed the sample back to the first group of sample rack channels for the user to take away, and the method comprises the following steps: the controller controls the sample rack dispatching component to dispatch the sample rack which absorbs the sample to the temporary storage channel, and then dispatches the sample rack to the first group of sample rack channels.

19. The specimen rack dispatching mechanism of claim 18, wherein the staging channel is a scanning channel for scanning; or the sample rack dispatching mechanism further comprises a newly added dispatching channel which does not belong to the first group of sample rack channels and the second group of sample rack channels, and the temporary storage channel is the dispatching channel.

20. The sample rack scheduling mechanism of any of claims 11 to 14 wherein the first and second sets of sample rack lanes are oppositely disposed; and/or the first and second sets of sample rack lanes have the same number of lanes.

21. A sample rack dispatching mechanism, comprising:

the sample rack dispatching component is used for dispatching the sample rack applying for testing in at least one first channel to a corresponding second channel;

a controller, the controller is used for testing any sample rack stored in the first group of sample rack channels and applying for testing after starting:

after the samples of the sample rack are sucked, detecting whether the first group of sample rack channels can be used for dispatching the sample rack back to the first group of sample rack channels;

22. The sample rack scheduling mechanism of claim 21, wherein each lane in the first set of sample rack lanes has a corresponding lane in the second set of sample rack lanes; for each lane of the first set of rack lanes, the rack scheduling component is configured to move a rack stored in that lane to schedule that rack to a lane of that lane corresponding to the lane of the second set of rack lanes.

23. The sample rack scheduling mechanism of claim 22 wherein the first and second sets of sample rack lanes have the same number of lanes.

24. The sample rack scheduling mechanism of claim 22 wherein the first plurality of lanes are numbered sequentially from 1 to N, the second plurality of lanes are numbered sequentially from (N +1) to 2N, and the first lane X of the first set of sample rack lanes corresponds to the second lane X + N of the second set of sample rack lanes, wherein N and X are integers, N ≧ 3, and 1 ≦ X ≦ N.

25. The sample rack dispatching mechanism as claimed in any one of claims 21 to 24, further comprising at least one emergency channel, wherein when a sample rack requiring test is stored in the emergency channel, the sample rack is dispatched to the scan channel or scan position for scanning, then dispatched to the sample sucking position for sucking the sample, and when the sample in the sample rack is sucked, the sample rack is dispatched to the emergency channel in which the sample rack was stored for being taken by the user.

26. The sample rack scheduling mechanism of claim 25, wherein the emergency channel is a channel in the first set of sample rack channels.

27. The sample rack dispatching mechanism of claim 21, wherein the sample racks in the first set of sample rack lanes that are to be tested are dispatched in turn to the second set of sample rack lanes until all of the lanes in the second set of sample rack lanes are occupied or until all of the sample racks in the first set of sample rack lanes that are to be tested are dispatched to the second set of sample rack lanes, such that a user may re-place a sample rack in the first set of sample rack lanes; and each sample rack dispatched from the first group of sample rack channels to the second group of sample rack channels is sequentially subjected to subsequent sample sucking operation.

28. The specimen rack dispatching mechanism of claim 21, wherein the controller is configured to, upon initiation of a test, for any specimen rack stored in the first set of specimen rack lanes for which a test is to be applied: