CN110646648A

CN110646648A - Waveform test probe device

Info

Publication number: CN110646648A
Application number: CN201910850639.1A
Authority: CN
Inventors: 胡凤鸣; 黄向阳; 王海红; 梁海伟
Original assignee: Suzhou Minghuo Intelligent Equipment Co Ltd
Current assignee: Suzhou Minghuo Intelligent Equipment Co Ltd
Priority date: 2019-09-10
Filing date: 2019-09-10
Publication date: 2020-01-03

Abstract

The invention discloses a waveform test probe device, which comprises a bracket, a driving unit, a test unit and a platform unit, wherein the driving unit is arranged on the bracket; the driving unit comprises a test driving source and a lifting block which are arranged on the bracket, and the lifting block is connected with the free end of the test driving source; the testing unit comprises a testing support arranged on the lifting block, a vertical plate is arranged on the testing support, two insulating plates are arranged on the vertical plate in a sliding mode and are arranged side by side, an elastic piece is arranged between each insulating plate and the corresponding testing support, and a probe is arranged at the top end of each insulating plate; the platform unit comprises a platform support arranged on the support, an insulation test platform is arranged on the platform support, test holes are formed in the insulation test platform, and the two probes are respectively inserted into one test hole. The device can be used for testing components from the bottom, the testing efficiency is high, the testing data is stable, and the reliability is strong.

Description

Waveform test probe device

Technical Field

The invention relates to a probe device, in particular to a waveform testing probe device.

Background

During or after the production of the device, the device is usually subjected to electrical waveform testing. The components are typically small and are produced in large quantities each day. When testing the components, the components are generally arranged on a platform, and then the probes are sequentially moved across each component and each component is tested. In the process, the probe and a large number of attached mechanisms need to be moved quickly, so that the testing speed is greatly restricted, and the efficiency is low.

Disclosure of Invention

The invention aims to provide a waveform test probe device which can test components from the bottom, and has the advantages of high test efficiency, stable test data and strong reliability.

In order to solve the above technical problems, the present invention provides a waveform test probe apparatus, including a support, a driving unit, a test unit and a platform unit; the driving unit comprises a test driving source and a lifting block which are arranged on the bracket, and the lifting block is connected with the free end of the test driving source; the testing unit comprises a testing support arranged on the lifting block, a vertical plate is arranged on the testing support, two insulating plates are arranged on the vertical plate in a sliding mode and are arranged side by side, an elastic piece is arranged between each insulating plate and the corresponding testing support, and a probe is arranged at the top end of each insulating plate; the platform unit comprises a platform support arranged on the support, an insulation test platform is arranged on the platform support, test holes are formed in the insulation test platform, and the two probes are respectively inserted into one test hole.

Preferably, the insulation board is provided with a limit groove, the test support is provided with a limit hook, the limit hook is hooked in the limit groove, and the width of the limit groove is larger than that of the limit hook.

As preferred, seted up the fine setting sliding chamber in the elevator, it is provided with the pivot to rotate on the elevator, and passes the fine setting sliding chamber, be provided with the eccentric wheel parallel but not coincident rather than the central axis in the pivot, the slip is provided with the fine setting slider of being connected with the free end of test driving source in the fine setting sliding chamber, set up the eccentric groove in the fine setting slider, the eccentric wheel is located the eccentric groove.

Preferably, an inner hexagonal fine tuning head is arranged at the end part of the rotating shaft.

Preferably, a driving source support is arranged on the support, a bearing plate is arranged on the driving source support in a sliding mode, a coarse adjustment fixing block is fixedly arranged on the support, the testing driving source is arranged on the bearing plate, and a coarse adjustment bolt penetrates between the bearing plate and the coarse adjustment fixing block.

Preferably, the bottom of the driving source support is provided with a coarse adjustment sliding cavity, and the bearing plate is slidably arranged in the coarse adjustment sliding cavity.

Preferably, the support is provided with a polished rod, and the lifting block is arranged on the polished rod.

Preferably, a counting sensor adjacent to the lifting block is arranged on the bracket.

Preferably, the vertical plate is provided with two test slide rails side by side, and the two insulation plates are respectively arranged on one test slide rail.

Preferably, the insulation test platform and the insulation board are both ceramic boards.

Compared with the prior art, the invention has the beneficial effects that:

1. the invention can automatically and rapidly test the discrete components from the bottom, only the components need to be replaced during the test, the probe and the whole device do not need to be moved, the test efficiency is high, and the energy consumption is low.

2. According to the invention, through arranging the elastic piece, the hard contact between the probe and the component is changed into the soft contact, the continuous and stable needle pressure is ensured, the testing accuracy is improved, and the probe and the component are not easy to damage.

3. The invention makes the components and the probes completely insulated from other parts of the device when testing by arranging the insulation testing platform and the insulation board, thereby avoiding electric leakage damage.

Drawings

In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the drawings needed to be used in the description of the embodiments of the present invention will be briefly introduced below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and it is obvious for those skilled in the art to be able to obtain other drawings based on these drawings without creative efforts.

FIG. 1 is a first schematic structural diagram of a probe apparatus;

FIG. 2 is an enlarged view of part A;

FIG. 3 is a second schematic structural view of the probe apparatus;

fig. 4 is a schematic cross-sectional view of the probe apparatus.

The device comprises a 300-support, a 310-drive source support, a 311-supporting plate, a 312-testing drive source, a 313-polished rod, a 314-lifting block, a 315-counting sensor, a 320-fine adjustment sliding cavity, a 321-rotating shaft, a 322-eccentric wheel, a 323-fine adjustment sliding block, a 324-eccentric groove, a 325-fine adjustment head, a 330-coarse adjustment sliding cavity, a 331-coarse adjustment fixed block, a 332-coarse adjustment bolt, a 340-testing support, a 341-vertical plate, a 342-testing sliding rail, a 343-insulating plate, a 344-testing plate, a 345-probe, a 346-elastic piece, a 350-limiting groove, a 351-limiting hook, a 360-platform support, a 361-insulating testing platform and a 362-testing hole.

Detailed Description

The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without any inventive step, are within the scope of the present invention.

Examples

Referring to fig. 1 to 4, the present invention discloses a waveform testing probe apparatus, which includes a support 300, a driving unit, a fine tuning unit, a coarse tuning unit, a testing unit, a limiting unit, and a platform unit.

A drive unit:

the driving unit includes a driving source bracket 310, a support plate 311, a test driving source 312, a polish rod 313, and a lifting block 314.

The driving source bracket 310 is provided on the bracket 300. A support plate 311 is provided at the bottom of the drive source bracket 310. The test drive source 312 is fixed to the support plate 311. The polish rod 313 is disposed on the driving source bracket 310. The lifting block 314 is slidably disposed on the polished rod 313. The elevator 314 is connected to the free end of the test drive source 312. The test driving source 312 can drive the lifting block 314 to lift so that the probe 345 can perform a lifting test.

As a further improvement of the present invention, the driving source bracket 310 is provided with a counting sensor 315 adjacent to the elevating block 314. The counting sensor 315 can detect the number of times the lifting block 314 is lifted.

A coarse adjustment unit:

the coarse adjustment unit includes a coarse adjustment slide chamber 330, a coarse adjustment fixing block 331 and a coarse adjustment bolt 332.

The coarse slide chamber 330 is opened at the bottom of the support 300. The support plate 311 is slidably disposed within the coarse slide chamber 330. The coarse adjustment fixing block 331 is fixed to the bracket 300. The coarse adjustment bolt 332 is inserted into the supporting plate 311 and the coarse adjustment fixing block 331. By screwing the coarse adjustment bolt 332, the height of the support plate 311 can be adjusted, and thus the initial height of the probe 345 can be adjusted coarsely.

A fine adjustment unit:

the fine adjustment unit includes a fine adjustment sliding chamber 320, a rotation shaft 321, an eccentric 322, a fine adjustment slider 323, and an eccentric groove 324.

The fine slide chamber 320 is formed in the elevator block 314. The shaft 321 is rotatably disposed on the lifting block 314 and passes through the fine tuning sliding cavity 320. The eccentric 322 is disposed on the rotating shaft 321. The central axes of the eccentric 322 and the rotating shaft 321 are parallel but not coincident. The fine slide 323 is slidably disposed within the fine slide chamber 320 and is coupled to the free end of the test drive source 312. An eccentric groove 324 is opened on the vernier slider 323. The eccentric 322 is located within the eccentric slot 324. By rotating the rotating shaft 321, the initial position of the lifting block 314 can be finely adjusted, so as to achieve fine adjustment of the probe 345.

As a further improvement of the present invention, a fine adjustment head 325 having an inner hexagonal shape is provided at an end of the rotation shaft 321. The fine adjustment head 325 can facilitate insertion and fine adjustment of the tool.

A test unit:

the test unit includes a test support 340, a vertical plate 341, a test rail 342, an insulating plate 343, a test board 344, a probe 345, and an elastic member 346.

The test support 340 is disposed on the elevator block 314. The riser 341 is disposed on the test stand 340. Two test slide rails 342 are arranged on the vertical plate 341 side by side along the direction of the polish rod 313. The two insulating plates 343 are respectively disposed on one test slide 342. The elastic member 346 is disposed between the insulating plate 343 and the test fixture 340. The test board 344 is disposed on top of the insulating board 343. The probes 345 are disposed on top of the test plate 344. The probe 345 can be driven by the lifting block 314 to be lifted quickly to realize testing; the elastic member 346 can ensure that the probe 345 has a buffer when contacting the component to control the needle pressure and ensure the test accuracy.

A limiting unit:

the above-mentioned spacing unit includes spacing groove 350 and spacing hook 351.

The limiting groove 350 is formed on the insulating plate 343. Spacing hook 351 sets up on the test support. The limit hook 351 is hooked in the limit groove 350. The width of the spacing groove 350 is greater than the width of the spacing hook 351. The initial position and the maximum moving position of the insulating plate 343 can be determined, so that the insulating plate 343 is more controllable in motion, and the testing accuracy is further improved.

A platform unit:

the platform unit includes a platform holder 360, an insulation test platform 361, and a test hole 362.

The platform bracket 360 is disposed on the bracket 300. The insulation test platform 361 is clamped on the platform support 360. The test holes 362 have two, which are opened on the insulation test platform 361. Two probes 345 are located in one of the test holes 362. When the device is temporarily stopped on the insulation test platform 361, the probe 345 can quickly contact the pole piece of the device to complete the test. When the insulation test platform 361 can be prevented from being electrified, the probe 345 and the component are conducted with the device, and damage is avoided.

As a further improvement of the present invention, the insulating test platform 361 and the insulating plate 343 are ceramic plates.

The working principle is as follows:

the test driving source 312 drives the lifting block 314 to reciprocate; when the probe 345 rises, the test hole 362 is exposed and contacts with the component, and the test is completed; when the probe 345 descends, the probe is collected into the testing hole 362, and at the moment, the components on the insulation testing platform 361 are replaced; according to the above cycle.

The previous description of the disclosed embodiments is provided to enable any person skilled in the art to make or use the present invention. Various modifications to these embodiments will be readily apparent to those skilled in the art, and the generic principles defined herein may be applied to other embodiments without departing from the spirit or scope of the invention. Thus, the present invention is not intended to be limited to the embodiments shown herein but is to be accorded the widest scope consistent with the principles and novel features disclosed herein.

Claims

1. A waveform test probe device is characterized by comprising a bracket, a driving unit, a test unit and a platform unit;

the driving unit comprises a test driving source and a lifting block which are arranged on the bracket, and the lifting block is connected with the free end of the test driving source;

the testing unit comprises a testing support arranged on the lifting block, a vertical plate is arranged on the testing support, two insulating plates are arranged on the vertical plate in a sliding mode and are arranged side by side, an elastic piece is arranged between each insulating plate and the corresponding testing support, and a probe is arranged at the top end of each insulating plate;

the platform unit comprises a platform support arranged on the support, an insulation test platform is arranged on the platform support, test holes are formed in the insulation test platform, and the two probes are respectively inserted into one test hole.

2. The waveform test probe apparatus of claim 1, wherein the insulating plate has a limiting groove formed thereon, the test support has a limiting hook formed thereon, the limiting hook is hooked in the limiting groove, and the width of the limiting groove is greater than the width of the limiting hook.

3. The waveform test probe apparatus according to claim 1, wherein a fine adjustment sliding cavity is formed in the elevator, a rotating shaft is rotatably disposed on the elevator and penetrates through the fine adjustment sliding cavity, an eccentric wheel parallel to the central axis of the rotating shaft but not coincident with the central axis of the rotating shaft is disposed on the rotating shaft, a fine adjustment slider connected to a free end of the test driving source is slidably disposed in the fine adjustment sliding cavity, an eccentric slot is formed in the fine adjustment slider, and the eccentric wheel is located in the eccentric slot.

4. The waveform test probe apparatus of claim 3 wherein the end of the shaft is provided with a fine tuning head having an internal hex shape.

5. The waveform test probe apparatus of claim 1, wherein the frame is provided with a driving source frame, the driving source frame is slidably provided with a supporting plate, the frame is fixedly provided with a coarse adjustment fixing block, the test driving source is provided on the supporting plate, and a coarse adjustment bolt is inserted between the supporting plate and the coarse adjustment fixing block.

6. The waveform test probe apparatus of claim 5, wherein the drive source support has a rough adjustment slide chamber formed at a bottom thereof, and the support plate is slidably disposed within the rough adjustment slide chamber.

7. The waveform test probe apparatus of claim 1 wherein the carrier has a polished rod disposed thereon and the elevator block is disposed on the polished rod.

8. The waveform test probe device of claim 1 wherein the carriage has a count sensor disposed thereon adjacent the elevator block.

9. The waveform test probe apparatus according to claim 1, wherein two test rails are disposed side by side on the vertical plate, and two of the insulation plates are disposed on one of the test rails, respectively.

10. The wave form test probe device of any one of claims 1 to 9, wherein the insulating test platform and the insulating plate are ceramic plates.