CN110632412B

CN110632412B - Test method of series compensation protection device

Info

Publication number: CN110632412B
Application number: CN201910785617.1A
Authority: CN
Inventors: 苏晓; 李黄河
Original assignee: Nanning Bureau of Extra High Voltage Power Transmission Co
Current assignee: Nanning Bureau of Extra High Voltage Power Transmission Co
Priority date: 2019-08-23
Filing date: 2019-08-23
Publication date: 2022-08-02
Anticipated expiration: 2039-08-23
Also published as: CN110632412A

Abstract

The invention discloses a test method of a series compensation protection device, wherein the series compensation protection device comprises a capacitor bank C, a normally open contact GS1, a normally open contact DS1, a normally open contact GS2, a normally open contact DS2, a normally open contact MBS, a rheostat MOV1, a rheostat MOV2, a damping loop, a spark GAP GAP, a bypass switch BPS and an insulation platform; the capacitor bank C comprises a capacitor C1, a capacitor C2, a capacitor C3 and a capacitor C4, wherein a capacitor C1 is connected with a capacitor C2 in series, a capacitor C2 is connected with a capacitor C3 in series, a capacitor C3 is connected with a capacitor C4 in series, and a capacitor C4 is connected with a capacitor C1 in series; the damping loop comprises a resistor R1, a rheostat R2 and an inductor L, wherein the resistor R1 is connected with a rheostat R2 in series, the rheostat R2 is connected with the inductor L in series, and the inductor L is connected with a resistor R1 in series. The series compensation protection device ensures the triggering reliability of the spark gap, ensures the triggering continuity of the spark gap, ensures the correctness of the action behavior of the spark gap, and has high triggering reliability, high voltage withstanding grade and low failure rate.

Description

Test method of series compensation protection device

Technical Field

The invention relates to the technical field of series compensation protection, in particular to a test method of a series compensation protection device.

Background

The series capacitor compensation technology is to connect the capacitor in series to the line to improve the transmission capacity of the line, when the high voltage line is in fault, the metal oxide arrester (MOV) connected in parallel with the capacitor will act immediately and limit the voltage change at both ends of the capacitor, but when the accumulated energy of the MOV can not be dissipated quickly, it will explode and be damaged, therefore a spark gap is connected in parallel at both ends of the MOV, when the fault is found, the spark gap is triggered to act, finally the control system controls the bypass breaker to bypass quickly to protect the capacitor and the MOV. It follows that the trigger means of the spark gap is very important and if not triggered reliably and quickly, increases the failure rate of the MOV and capacitor. The series compensation device generally comprises a high-voltage platform and a series compensation chamber, wherein a series capacitor, a metal oxide arrester MOV, a spark Gap, a bypass breaker and a Gap Triggering device (Gap Triggering Electronic-GTE) are arranged on the high-voltage platform, and a control protection device is arranged in the series compensation chamber, wherein the spark Gap is a backup protection for the MOV and the series capacitor, so that high requirements are made on the working reliability and the continuity of the series compensation device.

Series compensation is also called a series compensation device, namely a capacitor bank is connected into a power transmission line in series. The series compensation technology and the high-voltage direct-current transmission technology belong to one of the FACT (flexible power transmission technology), and are increasingly adopted in China due to the characteristics of small investment, quick response, high performance and convenience in maintenance, particularly in large-scale power grids with large span and wide area.

The series capacitance compensation device is applied to a high-voltage transmission network, and is used for compensating the inductive reactance of an ultrahigh-voltage long-distance transmission line and improving the transmission efficiency. At present, the series capacitance compensation device is widely applied to most of 500kV ultrahigh voltage transmission lines and 1000kV ultrahigh voltage transmission line projects in China. The series capacitance compensation device is composed of a series compensation capacitor, an MOV (Metal Oxide Varistor), a discharge gap, a series compensation platform and the like. The series capacitance compensation device is used as primary equipment independent of a power transmission line and is provided with a special series compensation protection device so as to realize real-time monitoring and protection of a series compensation capacitor, an MOV, a discharge gap, a series compensation platform and the like. The series compensation protection device is different from other primary equipment protection devices and has the following characteristics: 1) the principle of the series compensation protection device is greatly different from that of other primary equipment protection devices. 2) The analog quantity acquisition loop is many, and the protect function is many. 3) The action result similarity of the series compensation protection device is high.

The existing test method of the series compensation protection device has high failure rate of spark gaps and is often unreliable in triggering.

Disclosure of Invention

In view of the above, in order to solve the above problems in the prior art, the present invention provides a method for testing a series compensation protection device.

The invention solves the problems through the following technical means:

a test method of a series compensation protection device comprises a capacitor bank C, a normally open contact GS1, a normally open contact DS1, a normally open contact GS2, a normally open contact DS2, a normally open contact MBS, a varistor MOV1, a varistor MOV2, a damping loop, a spark GAP GAP, a bypass switch BPS and an insulation platform;

the capacitor bank C comprises a capacitor C1, a capacitor C2, a capacitor C3 and a capacitor C4, wherein a capacitor C1 is connected with a capacitor C2 in series, a capacitor C2 is connected with a capacitor C3 in series, a capacitor C3 is connected with a capacitor C4 in series, and a capacitor C4 is connected with a capacitor C1 in series;

the damping loop comprises a resistor R1, a rheostat R2 and an inductor L, wherein the resistor R1 is connected with a rheostat R2 in series, the rheostat R2 is connected with the inductor L in series, and the inductor L is connected with a resistor R1 in series;

the end points of the series connection of the capacitor C4 and the capacitor C1 are respectively connected with one end of a normally open contact GS2, one end of a normally open contact DS2, one end of a varistor MOV1, one end of a varistor MOV2, one end of a spark GAP GAP, one end of a bypass switch BPS and one end of an insulating platform, the other end of the normally open contact GS2 is grounded, the other end of the normally open contact DS2 is connected with one end of a normally open contact MBS, the other end of the normally open contact MBS is connected with one end of the normally open contact DS1, the other end of the normally open contact DS1 is respectively connected with one end of a normally open contact GS1, the end point of the series connection of the capacitor C2 and the capacitor C3, the other end of the varistor MOV1, the other end of the varistor MOV2, the end of the series connection of the varistor R2 and the normally open inductor L, and the other end of the normally open contact GS1 is grounded; the end of the inductor L connected in series with the resistor R1 is connected with the other end of the spark GAP GAP and the other end of the bypass switch BPS respectively;

wherein, G1-G6 are output optical ports mapped to hardware in a software interface, and each path of current is expressed as follows: line current Iline, capacitor bank branch current Icap, capacitor bank unbalance current Inb, MOV branch 1 current Imov1, MOV branch 2 current Imov2, gap branch current Igap, bypass switch branch current Ibyp and platform flashover branch current Isplat;

the test method of the series compensation protection device comprises the following steps:

1) capacitor unbalance protection alarm

Firstly, setting: Ifnb/Ifnb 'and Icap/Icap' in G1/G2, G3/G4 and G5/G6 are adjusted to 0.95 of the setting value as a normal state; then setting: Ifnb/Ifnb 'and Icap/Icap' in G1/G2, G3/G4 and G5/G6 are adjusted to 1.05 of the setting value to be used as fault states; adding the two states into a test item, and starting testing after selecting a trigger condition; when a trigger condition is reached, switching a test state; in the last test state, the switching value is shifted or the output time is reached, the test is finished, the output is stopped, and a test conclusion is given;

2) unbalanced low-constant protection of capacitors

Firstly, setting: Ifnb/Ifnb 'and Icap/Icap' in G1/G2, G3/G4 and G5/G6 are adjusted to 0.95 of the setting value as a normal state; then setting: Ifnb/Ifnb 'and Icap/Icap' in G1/G2, G3/G4 and G5/G6 are set to be 1.05 of a setting value as fault states; setting: ibyp > a certain value or Icap/Icap' < a certain value in G1/G2, G3/G4, G5/G6, and 3 channel open amount shifts as a post-failure state; in order to prevent failure of protection switching-on judgment, the required fault state is switched to a post-fault state and needs to be completed within 200 ms; adding the three states into a test item, starting testing and monitoring a trigger condition, switching the test states when a set output time is reached or switching value change information exists, and stopping outputting after the last test state is finished;

the test device needs to receive and analyze 61850 network information sent by protection, and the information is synchronously displayed in a test conclusion after being received;

the protection action information contains a 'permanent locking' signal, so that after the item test is finished, a tester needs to manually reset the protection device, and the next item test can be continued;

3) high constant value bypass with unbalanced capacitance

Firstly, setting: Ifnb/Ifnb 'and Icap/Icap' in G1/G2, G3/G4 and G5/G6 are adjusted to 0.95 of the setting value as a normal state; then setting: Ifnb/Ifnb 'and Icap/Icap' in G1/G2, G3/G4 and G5/G6 are adjusted to 1.05 of the setting value to be used as fault states; setting: ibyp > a certain value or Icap/Icap' < a certain value in G1/G2, G3/G4, G5/G6, and 3 channel switching amounts are shifted as post-failure states; in order to prevent failure of protection switching-on judgment, the required fault state is switched to a post-fault state and needs to be completed within 200 ms; adding the three states into a test item, starting testing and monitoring a trigger condition, switching the test states when the set output time or switching value is reached and corresponding state change information exists, and stopping outputting after the last test state is finished;

the 61850 information sent by the protection has a permanent locking signal, so that after the project test is finished and a tester needs to manually reset the protection device, the next test project can be continued;

4) capacitor overload alarm

Firstly, setting: the normal state is that the Icap/Icap' in G1/G2, G3/G4 and G5/G6 is equal to 0.95 of the setting value; then setting: Icap/Icap' in G1/G2, G3/G4 and G5/G6 is set to be 1.05 of a setting value to be used as a fault state; adding the two states to a test item, starting testing and monitoring a trigger condition, and switching the test state when the set output time is reached; in the last test state, after the set time is reached, the test is finished, the output is stopped, and a test conclusion is given;

5) capacitor overload three-phase bypass

Firstly, setting: the normal state is that the Icap/Icap' of one phase, two phases or three phases in G1/G2, G3/G4 or G5/G6 is 0.95 of the setting value; then setting: the Icap/Icap' of one phase, two phases or three phases in G1/G2, G3/G4 or G5/G6 is set to 1.05 of a setting value to be used as a fault state; setting: the after-failure state is set to 3-way open amount displacement, i byp > or Icap/Icap' < a certain value in G1/G2, G3/G4, and G5/G6. Adding the three states into a test item, starting testing and monitoring a trigger condition, switching the test states when the set trigger condition is reached, and stopping outputting after the last test state is finished;

it is proposed that this protection be put to final testing because after overload bypass the protection logic will still continue, after temporary lockout a re-throw allow command or a permanent bypass command is issued, but since there is no corresponding status output to the protection device, eventually the decision will be taken that the separating gate is malfunctioning, affecting subsequent item testing. If the test is still carried out at the position, the protection device is manually reset by a tester after the test of the item is finished, so that the next test item can be continued;

6) MOV imbalance protection

Firstly, setting: G1/G2, G3/G4 or G5/G6, wherein the setting value (| K1a | [ Ia _ mov1] -K2a | [ Ia _ mov2] |) of one phase, two phases or three phases of Imov1/Imov1 ', Imov2/Imov 2' is 0.95 as a normal state, Ia _ mov1 is a phase Imov1, Ia _ mov2 is a phase Imov2, and K1a and K2a are protection device setting parameters; then setting: taking Icap/Icap ', Imov1/Imov1 ', Imov2/Imov2 ' of one phase, two phases or three phases in G1/G2, G3/G4 or G5/G6 as a fault state, and maintaining the fault state at least for 500 mu s, wherein the setting value (| K1a [ [ Ia _ mov1] -K2a | ] [ Ia _ mov2] |); and determining whether the setting is zero according to the value set in the previous step, and if the voltage at two ends of the capacitor is greater than a fixed value and the instantaneous value of the MOV current is greater than 100A, setting: the Igap/Igap' of one phase, two phases or three phases in G1/G2, G3/G4 or G5/G6 is used as a triggered state and should be switched to the triggered state in 5-10 ms; setting: ibyp in G1/G2, G3/G4 and G5/G6 is greater than a certain value or Imov1/Imov1 'and Imov2/Imov 2' are less than a certain value, and the 3-way opening amount is used as a state after the fault, and the required switching of the fault state to the state after the fault needs to be completed within 200ms in order to prevent the failure of protection judgment and closing; adding the three states into a test item, starting testing and monitoring a trigger condition, switching the test states when the trigger condition is set, and stopping outputting after the last test state is finished;

the test device needs to receive and analyze 61850 network information sent by protection, the information is synchronously displayed in a test conclusion after being received, and the test is finished;

7) MOV overload protection

7.1), MOV high current protection and re-throw

Firstly, setting: setting 0.95 of setting values (instantaneous values, namely Imov1/Imov1 ', Imov2/Imov 2' of one phase of G1/G2, G3/G4 or G5/G6) to 0.95 of setting values (Imov 1_ abs/Imov1_ abs ', Imov2_ abs/Imov2_ abs' and Imov _ abs), setting Imov1_ abs to represent an momv 1 branch current instantaneous value, setting values of Imov2_ abs to represent an momv 2 branch current instantaneous value and setting values of MOV _ abs to represent a total current instantaneous value; then setting: keeping three sampling points by taking 1.05 of Imov1/Imov1 ', Imov2/Imov 2' in one phase of G1/G2, G3/G4 or G5/G6 to setting values (all are instantaneous values, and Imov1_ abs/Imov1_ abs ', Imov2_ abs/Imov2_ abs' and Imov _ abs) as fault states; setting: ibyp in G1/G2, G3/G4 or G5/G6 is greater than a certain value or Imov1/Imov1 'and Imov2/Imov 2' are both less than a certain value, and the 1-channel opening amount is changed to be used as a post-fault state, wherein the post-fault state is maintained for a certain time > a re-throwing delay time and simultaneously > a bypass closing failure delay time; setting: 3, the channel switching-out quantity is shifted to be used as a re-switching state, in order to avoid the failure of protection judgment and switching-off, the switching from the state after the fault to the re-switching state is completed within 200ms, four states are added to a test item, the test is started, the switching-out quantity action information is monitored, when the set output time is reached or the switching-out quantity has corresponding state change information, the test state is switched, and the output is stopped after the last test state is completed;

7.2), MOV Low energy protection and high energy protection

7.2.1), MOV Low energy protection and Re-dose

Firstly, setting: imov1/Imov1 'and Imov2/Imov 2' of one phase of G1/G2, G3/G4 or G5/G6 output a certain time t1 as a normal state; then setting: one of the phases of G1/G2, G3/G4 or G5/G6 is Imov1/Imov1 ', Imov2/Imov 2' to output another time t2(t2> t1) as a fault state, wherein the total MOV current is higher than 100A, and the device starts energy calculation only when the total MOV current is higher than 100A); setting: ibyp > a certain value or Imov1/Imov1 ', Imov2/Imov 2' of one phase in G1/G2, G3/G4 or G5/G6 are all < a certain value, and as a state after failure, the 1-way opening amount is changed and maintained for at least more than 500 ms; setting: 1, taking the opening amount of the 1-path as a re-throwing state, finishing switching from a state after a fault to the re-throwing state within 200ms in order to avoid the failure of protection judgment and switching, adding four states into a test item, starting testing and monitoring the action information of the switching amount, and switching the test state when the set output time is reached or the switching amount has corresponding state change information;

7.2.2), MOV high energy protection

Firstly, setting: imov1/Imov1 'and Imov2/Imov 2' of one phase of G1/G2, G3/G4 or G5/G6 output a certain time t1 as a normal state; then setting: one of the phases of G1/G2, G3/G4 or G5/G6 is Imov1/Imov1 ', Imov2/Imov 2' to output another time t3(t3> t2> t1) as a fault state, and the total MOV current is higher than 100A at the moment, because the energy calculation is started by the device when the total MOV current is higher than 100A; setting: the 3-way opening amount is shifted as the post-failure state, i.e., the Ibyp > certain value in G1/G2, G3/G4, G5/G6, or each of Imov1/Imov1 ', Imov2/Imov 2' < certain value; adding the three states into a test item, starting testing and monitoring switching value action information, and switching the test state when the set output time is reached or the switching value has corresponding state change information;

the 61850 network information sent by the protection is required to be received and analyzed by the testing device, is synchronously displayed in a testing conclusion after being received, and is tested at the same time;

7.3), MOV high temperature protection

MOV high temperature protection

Firstly, setting: imov1/Imov1 'and Imov2/Imov 2' of one phase of G1/G2, G3/G4 or G5/G6 output a certain time t1 as a normal state; then setting: Icap/Icap ', Imov1/Imov1 ', Imov2/Imov2 ' of one phase in G1/G2 or G3/G4 or G5/G6 outputs another time t2(t2> t1) as a fault state; and determining whether the setting is zero or not according to the value set in the previous step, and setting: when the Igap/Igap' of one phase in G1/G2, G3/G4 or G5/G6 reaches a certain value, as a triggered state, the state is switched to in 5-10 ms; setting: ibyp in G1/G2, G3/G4 and G5/G6 is greater than a certain value or Imov1/Imov1 'and Imov2/Imov 2' are less than a certain value, the 3-way open-out quantity is shifted to be used as a state after the fault, and in order to avoid the failure of protection judgment and closing, the switching from the fault state to the re-throwing state is completed within 200 ms; adding several states into a test project, starting testing and monitoring output quantity action information, and switching the test state when the set output time or the switching value has corresponding state change information;

8) platform flashover protection

8.1), platform flashover low fixed value bypass

Firstly, setting: Ipltf/Ipltf' in G1/G2, G3/G4 and G5/G6 is set to be 0.95 of a setting value as a normal state; then setting: one phase, two phases or three phases of Ipltf/Ipltf' in G1/G2, G3/G4 and G5/G6 are set to be 1.05 of a setting value to be taken as a fault state, and the maintenance time is more than 100 ms; setting: ibyp > certain value or Icap/Icap' of G1/G2, G3/G4, G5/G6, 3 channel opening amount, as a state after failure, switching should be completed within 200 ms; adding the three states into a test item, starting testing and monitoring switching value action information, switching the test states when the set output time is reached or the switching value has corresponding state change information, and stopping outputting after the last test state is finished;

8.2), platform flashover high-definite value bypass

Firstly, setting: Ipltf/Ipltf 'in G1/G2, G3/G4, G5/G6 is set to 0.95 of a setting value (all instantaneous values, | Ipltf _ peak |/| Ipltf _ peak' |); then setting: Ipltf/Ipltf 'of one phase, two phases or three phases in G1/G2, G3/G4 and G5/G6 is set to 1.05 of a setting value (all instantaneous values, | Ipltf _ peak |/| Ipltf _ peak' |) as a fault state, and Ipltf _ peak represents an Ipltf peak value; setting: the 3-channel switching value shifts for any of Ibyp > or Icap/Icap' < a certain value in G1/G2, G3/G4, and G5/G6, and the switching should be completed within 200ms as the post-failure state; adding the three states into a test item, starting testing and starting monitoring switching value action information sent by protection, and switching the test state when the set output time is reached or the switching value has corresponding state change information;

9) bypass switch three-phase inconsistent protection

Setting: the 3 pairs of contacts in the open contacts are 0/1, 0/1 and 0/1 respectively, and are output to the corresponding A closed/separated position, B closed/separated position and C closed/separated position as a normal state; setting: opening 3 pairs of contacts, namely 0/1, 0/1 and 0/1, and outputting the contacts to a corresponding A closed position/open position, B open position/closed position and C closed position/open position as a fault state which lasts for more than 1200 ms; ibyp > a certain value or Icap/Icap' < a certain value in G1/G2, G3/G4 and G5/G6 are set, and the 3-way open amount is shifted as the post-failure state. And adding the three states to a test item, starting testing, starting monitoring switching value action information, and switching the test state according to related information.

after the protection action, a permanent locking signal is sent out, and the test personnel needs to manually reset;

10) bypass switch failure protection

10.1), testing switch closing failure protection by using' capacitor overload three-phase bypass

Bypass switch closing failure protection

Firstly, setting: the normal state is that the Icap/Icap' in G1/G2, G3/G4 and G5/G6 is equal to 0.95 of the setting value; then setting: Icap/Icap' in G1/G2, G3/G4 and G5/G6 is set to be 1.05 of a setting value to be used as a fault state; setting: ibyp < a certain value or Icap/Icap' > a certain value in G1/G2, G3/G4, G5/G6 is maintained for >200ms as a post-failure state. Adding the three states into a test item, starting to test and monitoring the switching value action information, and switching the test state when the output time is up or the switching value has displacement information;

the protection can send out 'permanent locking' information to prompt a tester to manually reset, and after resetting, the tester can continue to test the next item;

10.2), testing switch opening failure protection by using MOV high current protection

Bypass switch open failure protection

Firstly, setting: setting the Imov1/Imov1 ', Imov2/Imov 2' of one phase of G1/G2, G3/G4 or G5/G6 to 0.95 of a setting value (both are instantaneous values, Imov1_ abs/Imov1_ abs ', Imov2_ abs/Imov2_ abs', and Imov _ abs) as a normal state; then setting: keeping three sampling points by taking 1.05 of Imov1/Imov1 ', Imov2/Imov 2' in one phase of G1/G2, G3/G4 or G5/G6 to setting values (all are instantaneous values, and Imov1_ abs/Imov1_ abs ', Imov2_ abs/Imov2_ abs' and Imov _ abs) as fault states; setting: ibyp in G1/G2, G3/G4 or G5/G6 is greater than a certain value or Imov1/Imov1 'and Imov2/Imov 2' are both less than a certain value, and the 1-channel opening amount is changed to be used as a state after fault, wherein the state after fault is maintained for a certain time > the re-throwing delay time and simultaneously > the bypass closing failure delay time; adding several states into a test project, starting testing and monitoring switching value action information, switching the test states when the set output time is reached or the switching value has corresponding state change information, and stopping outputting after the last test state is finished;

11) sub-synchronous resonance protection

Setting 1-way open contact as fault state; ibyp > or Icap/Icap' in G1/G2, G3/G4, G5/G6 are all set to < a certain value, and 3-way open amount is set as the post-failure state. Adding the two states into a testing device, starting testing, starting monitoring switching value action information, and switching the testing state according to related information;

12) gap protection

12.1), gap self-triggering protection and re-projection

Firstly, setting: the value of Igap/Igap' in G1/G2 is 0.95 of the setting value as a normal state; then setting: the time from Igap/Igap' in G1/G2 to 1.05 of a setting value is taken as a fault state, and the output is maintained for more than 25 ms; setting: ibyp > certain value of G1/G2, G3/G4 and G5/G6 or Igap/Igap' < certain value of G1/G2, the 3-way open amount is displaced, and the state is maintained for more than 1200ms as the state after the failure, and the switching time is within 200 ms; setting: the opening amount of the 3-way is changed, and the switching time is within 200 ms; adding several states to a test item, starting testing, starting monitoring switching value action information, and switching the test state according to protection related information and set time;

12.2), gap continuous conduction protection

Firstly, setting: the value of Igap/Igap' in G1/G2 is 0.95 of the setting value as a normal state; then setting: from Igap/Igap' in G1/G2 to 1.05 of a setting value, the current output is taken as a fault state, the time of SG _ T1 is maintained, SG _ T1 is more than 200ms, and SG _ T1 represents the setting parameter in the protection device and represents delay time; setting: ibyp > certain value in G1/G2, G3/G4, G5/G6 or Igap/Igap' < certain value in G1/G2, 3-way open amount as post-failure state; adding the three states into a test item, starting testing, starting monitoring switching value action information, and switching the test states according to protection related information and set time;

the protection sends out 'permanent locking' information, and after manual reset by a tester, the tester can continue to test the next item;

12.3), gap delay trigger and trigger rejection protection

Gap delay trigger and trigger rejection protection by using MOV high-temperature protection

MOV high temperature protection

Firstly, setting: imov1/Imov1 'and Imov2/Imov 2' of one phase of G1/G2, G3/G4 or G5/G6 output a certain time t1 as a normal state; then setting: one phase of Icap/Icap ', Imov1/Imov1 ', Imov2/Imov2 ' in G1/G2, G3/G4 or G5/G6 outputs another time t2(t2> t1) as a fault state; and determining whether the setting is zero or not according to the value set in the previous step, and setting: the Igap/Igap' of one phase in G1/G2, G3/G4 or G5/G6 reaches a certain value, and as a state after triggering, the state should be switched to after 10ms or after 40 ms; setting: ibyp or Igap/Igap' in G1/G2, G3/G4 and G5/G6 are all less than a certain value, the 3-way open-out displacement is used as a fault state, and in order to avoid the failure of protection judgment and switching-in, the switching from a triggered state to a reset state is completed within 200 ms; adding several states into a test project, starting testing and monitoring output quantity action information, and switching the test state when the set output time or the switching value has corresponding state change information;

the protection sends out 'permanent locking' information, and a tester can continue to perform the next test item after manually resetting;

13) series compensation protection for circuit connection jump

13.1), single-phase line fault combined-tripping series compensation bypass and re-throw

Firstly, under the condition that a ' single-phase bypass allows a soft pressure plate ' to be put into, an outgoing contact is arranged to be connected with an ' A-phase line trip open ' or a ' B-phase line trip open ' or a ' C-phase line trip open ', only one phase can be opened, but starting and protection are required at the same time, if clearance triggering is considered, the Icap/Icap ' value of one phase in G1/G2 or G3/G4 or G5/G6 is set at the same time, the capacitor voltage is ensured to reach the clearance triggering requirement, and the total current (> 100A) of Imov1/Imov1 ', Imov2/Imov2 ' is taken as a fault state; if gap triggering is considered, setting: outputting the Igap/Igap' of one phase in G1/G2, G3/G4 or G5/G6, wherein the switching time is within 5-10 ms and is used as a gap trigger state; setting: the Ibyp of one phase of G1/G2, G3/G4 and G5/G6 is greater than a certain value, or if the gap is triggered to be Igap/Igap '< a certain value of one phase of G1/G2, G3/G4 and G5/G6, or if the gap does not trigger one phase of Iap/Iap' < a certain value of G1/G2, G3/G4 and G5/G6, the 1-channel open amount is used as a post-fault state, the switching time is within 200ms after the bypass open amount is received; setting: 3, the channel output is used as the state after the re-throwing, and the switching time is within 200ms after the re-throwing input is received; adding the test state to the test item, and starting the test; meanwhile, the tester starts to monitor the switching value action information, and the test state is switched after the tester receives the displacement information;

13.1.1), regardless of gap trigger:

in a fault state, protecting to send single-phase bypass information, switching a test state to a post-fault state, then switching the test state to the post-reset state, stopping outputting after the time of the post-reset state is up, and giving a test conclusion;

13.1.2), if gap triggering is considered:

under a fault state, protecting to send out 'gap trigger' and 'single-phase bypass' information, switching a testing device to a trigger gap state, switching to a state after the fault after the time is up, then receiving the re-throwing information by the testing device, switching the testing state to a state after the re-throwing, stopping outputting after the time of the re-throwing state is up, and giving a test conclusion;

13.2), multi-phase line fault combined-hop series compensation bypass and locking reset

Firstly, setting a tester open contact to 2 or 3 of ' A-phase line tripping open ' or ' B-phase line tripping open ' or ' C-phase line tripping open ', or setting the tester open contact to ' three-phase line tripping open ', if gap triggering is considered, simultaneously setting Icap/Icap ' of one phase in G1/G2 or G3/G4 or G5/G6 to ensure that the capacitor voltage reaches the gap triggering requirement, and setting the total current of Imov1/Imov1 ', Imov2/Imov2 ' to be more than 100A as a fault state; if gap trigger settings are considered: outputting Igap/Igap' of 2 or 3 phases in three phases in G1/G2, G3/G4 or G5/G6 as a gap trigger state, wherein the switching time is within 5-10 ms; setting: ibyp > certain value in G1/G2, G3/G4, G5/G6, or Igap/Igap '< certain value in G1/G2, G3/G4, G5/G6 if the gap is triggered, or Iap/Iap' < certain value in G1/G2, G3/G4, G5/G6 if the gap is not triggered, 3-channel open amount is changed, and as a state after the fault, the switching time is within 200ms after the bypass open amount is received; adding the test state to the test item, and starting the test; meanwhile, the tester starts to monitor the switching value action information, and the test state is switched after the tester receives the displacement information;

if gap triggering is not considered:

in a fault state, the test device receives a three-phase bypass command sent by protection, switches the test state to a post-fault state, and then stops outputting to give a test conclusion;

if gap triggering is considered:

in a fault state, the testing device receives a 'gap trigger' command and a 'three-phase bypass' command sent by protection, switches the testing state to the gap trigger state, switches the testing state to the post-fault state after the time of the gap trigger state is up, stops outputting after the time is up, and gives a test conclusion;

the protection sends out 'permanent locking' information, and after the manual reset of a tester is needed, the tester can continue to perform the next test item.

Compared with the prior art, the invention has the beneficial effects that at least:

the testing method of the series compensation protection device ensures the triggering reliability of the spark gap, ensures the triggering continuity of the spark gap, ensures the correctness of the action behavior of the spark gap, and has high triggering reliability, high voltage withstanding grade and low failure rate.

Drawings

In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the drawings needed to be used in the description of the embodiments will be briefly introduced below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and it is obvious for those skilled in the art to obtain other drawings based on these drawings without creative efforts.

Fig. 1 is a schematic circuit diagram of a series compensation protection device of the present invention.

Detailed Description

In order to make the aforementioned objects, features and advantages of the present invention comprehensible, embodiments accompanied with figures are described in detail below. It should be noted that the described embodiments are only a part of the embodiments of the present invention, and not all embodiments, and all other embodiments obtained by those skilled in the art without any inventive work based on the embodiments of the present invention belong to the protection scope of the present invention.

Example 1

The invention provides a test method of a series compensation protection device, as shown in figure 1, the series compensation protection device comprises a capacitor bank C, a normally open contact GS1, a normally open contact DS1, a normally open contact GS2, a normally open contact DS2, a normally open contact MBS, a varistor MOV1, a varistor MOV2, a damping loop, a spark GAP GAP, a bypass switch BPS and an insulation platform;

the end points of the series connection of the capacitor C4 and the capacitor C1 are respectively connected with one end of a normally open contact GS2, one end of a normally open contact DS2, one end of a varistor MOV1, one end of a varistor MOV2, one end of a spark GAP GAP, one end of a bypass switch BPS and one end of an insulating platform, the other end of the normally open contact GS2 is grounded, the other end of the normally open contact DS2 is connected with one end of a normally open contact MBS, the other end of the normally open contact MBS is connected with one end of the normally open contact DS1, the other end of the normally open contact DS1 is respectively connected with one end of a normally open contact GS1, the end point of the series connection of the capacitor C2 and the capacitor C3, the other end of the varistor MOV1, the other end of the varistor MOV2, the end of the series connection of the varistor R2 and the inductor L, and the other end of the contact GS1 is grounded; the end of the inductor L connected in series with the resistor R1 is connected with the other end of the spark GAP GAP and the other end of the bypass switch BPS respectively; wherein

Description of the arrangement of numerical quantities

Six optical port channels, each channel needs to be configured with the amount of current shown in the figure:

line current Iline

Capacitor bank branch current Icap

Unbalanced current Iinb of capacitor bank

MOV Branch 1 Current Imov1

MOV branch 2 current Imov2

Gap branch current Igap

Bypass switch branch current Ibyp

Platform flashover branch current Ipltf

Second, software requirement of test method of series compensation protection device

All protection test procedure descriptions

During all protection tests, corresponding current parameters and switching value parameters in G1-G6 (configured to corresponding 6 optical ports) are required to be set firstly, the current parameters are generally set to be 0.95 and 1.05 of a protection constant value, and the switching value is set to be on or off and respectively used as a normal state, a fault state, a state after triggering, a state after fault or a state after restarting; adding the set parameters to the test items (each test item can set a plurality of test states); after the test is started, the software controls signal output according to the set parameters, simultaneously monitors the trigger conditions (such as set time or switching value action information sent by protection), and controls state switching according to the trigger conditions under each test item; and in the last test state, stopping outputting after the time is over, and giving a test conclusion.

In addition, the test device needs to receive and analyze 61850 network information sent by protection, and the information is synchronously displayed in a test conclusion after the reception is finished, so that the test is finished.

The test conclusion of each state is to be qualified according to whether the trigger condition of the next state reaches the display qualification or not, and if the trigger condition of the next state reaches the trigger condition, the test of the state is qualified; and if the next state is not triggered (except the last state), the test of the state is not qualified.

Note: (series compensation protection each phase requires two paths of signals as protection criterion: starting and action, so G1-G6 are generally set into two groups consistent in pairs; the input quantity should be configured with name and prompt test result according to name and displacement)

Protection typing test procedure description

1. Capacitor imbalance protection alarm

Firstly, setting: Ifnb/Ifnb 'and Icap/Icap' in G1/G2, G3/G4 and G5/G6 are adjusted to 0.95 of the setting value as a normal state (the output time can be set); then setting: Ifnb/Ifnb 'and Icap/Icap' in G1/G2, G3/G4 and G5/G6 are set to 1.05 of the setting value as fault states. Two states are added to the test item and after a trigger condition is selected, the test is started (output signal to the protection device). When a trigger condition (reaching a set output time or a shift of the switching value) is reached, the test state is switched. In the last test state, the switching value is shifted or the output time is reached, the test is completed, the output is stopped, and a test conclusion is given (according to 61850 and the switching value).

2. Capacitor unbalance low constant protection

Firstly, setting: Ifnb/Ifnb 'and Icap/Icap' in G1/G2, G3/G4 and G5/G6 are adjusted to 0.95 of the setting value as a normal state (the output time can be set); then setting: Ifnb/Ifnb 'and Icap/Icap' in G1/G2, G3/G4 and G5/G6 are adjusted to 1.05 of the setting value to be used as fault states (the output time can be set); setting: the Ibyp > certain value or Icap/Icap' < certain value in G1/G2, G3/G4, and G5/G6, and the 3 channel open amounts are shifted as the post-failure state (the output time can be set) (in order to prevent the failure of the protection judgment switch, it is required to complete the switching from the failure state to the post-failure state within 200ms, the same applies hereinafter). Adding the three states into a test item, starting testing (outputting a signal to a protection device) and monitoring a trigger condition (such as switching value action information sent to a tester by protection), switching the test state when set output time (switching from a normal state to a fault state) or switching value change information (switching from the fault state to a state after the fault) is reached, and stopping outputting after the last test state is finished. For example, in a fault state, the protection sends out bypass information, and the test is switched to a state after the fault (namely, the current Ibyp or Icap for avoiding the failure of protection judgment is output); meanwhile, the testing device outputs the opening amount (the closing information of the analog switch) to the opening of the protection device (the closing), then the test is finished, the output is stopped, and a test conclusion (according to the test result and the opening amount information of each test state) is given.

In addition, the test device needs to receive and analyze 61850 network information sent by protection, and the information is synchronously displayed in a test conclusion after being received.

Remarking: the protection action information contains a 'permanent locking' signal, so that after the item test is finished, a tester needs to manually reset the protection device, and the next item test can be continued.

3. Capacitance imbalance high-fixed-value bypass

Firstly, setting: Ifnb/Ifnb 'and Icap/Icap' in G1/G2, G3/G4 and G5/G6 are adjusted to 0.95 of the setting value as a normal state (the output time can be set); then setting: Ifnb/Ifnb ', Icap/Icap' in G1/G2, G3/G4 and G5/G6 to 1.05 of the setting value as a fault state (the output time can be set); setting: in G1/G2, G3/G4, and G5/G6, Ibyp > or Icap/Icap' < a certain value, 3 channel switching amounts are shifted as post-failure states (output time is settable) (in order to prevent a protection judgment closing failure, it is required to complete switching from a failure state to a post-failure state within 200ms, the same applies hereinafter). Adding the three states into a test item, starting a test (outputting a signal to a protection device) and monitoring a trigger condition (such as output quantity action information sent by protection), switching the test states when the set output time or the switching value is reached and corresponding state change information exists, and stopping output after the last test state is finished. For example, in a fault state, the protection sends out bypass information, the protection is switched to a post-fault state (namely, the current Ibyp or Icap for avoiding the failure of protection judgment is output), meanwhile, the testing device outputs an opening amount (simulating switch closing position information) to the opening of the protection device, then the test is completed, the output is stopped, and a test conclusion is given (according to the test result and the switching value action information of each test state).

Remarking: the 61850 information sent by the protection has a permanent locking signal, so that after the project test is completed, a tester needs to manually reset the protection device, and then the next test project can be continued.

4. Capacitor overload warning

Firstly, setting: the normal state is that the Icap/Icap' in G1/G2, G3/G4 and G5/G6 is equal to 0.95 of the setting value; then setting: the Icap/Icap' in G1/G2, G3/G4 and G5/G6 is set to 1.05 of the setting value as a fault state. Adding two states to the test item, starting the test (outputting a signal to the protection device) and starting to monitor the trigger condition (such as the switch action information sent by the protection), and when the set output time is reached, switching the test state. In the last test state, after the set time is reached, the test is completed, the output is stopped, and a test conclusion (according to 61850 and the switching value) is given.

5. Capacitor overload three-phase bypass (to be put to final test)

Firstly, setting: the (one-phase, two-phase or three-phase) Icap/Icap' in G1/G2 or G3/G4 or G5/G6 is set to 0.95 of a setting value as a normal state; then setting: the Icap/Icap' of G1/G2 or G3/G4 or G5/G6 (one phase, two phases or three phases) is set to 1.05 of the setting value as a fault state; setting: in G1/G2, G3/G4, and G5/G6, the (three-phase) Ibyp > or Icap/Icap' < a certain value, and the 3-way open amount is shifted as the post-failure state. Adding the three states into a test item, starting a test (outputting a signal to a protection device) and monitoring a trigger condition (such as switching value action information sent by protection), switching the test states when the set trigger condition is reached, and stopping outputting after the last test state is finished.

For example, in a fault state, when the test device receives protection action information, the test device is switched to a state after the fault (namely, current Ibyp or Icap <, which avoids the failure of protection judgment, is output), the output is output to the input of the protection device at the same time, and then the test is finished, the output is stopped, and a test conclusion is given (according to the test result and the switching value action information of each test state).

Remarking: it is recommended that this protection be put to final testing because after overload bypass, the protection logic will still continue, after temporary lockout (about 15min), issuing a re-throw allow command or a permanent bypass command, but since there is no corresponding status output to the protection device, eventually the decision to open the gate will fail, affecting subsequent project testing. If the test is still performed here, the protection device should be manually reset by the tester after the test of the item is completed, so that the next test item can be continued.

6. MOV imbalance protection

Firstly, setting: in G1/G2, G3/G4 or G5/G6 (one phase, two phases or three phases), 0.95 of Imov1/Imov1 ', Imov2/Imov 2' to a setting value (| K1a | [ Ia _ mov1] -K2a | [ Ia _ mov2] |) is taken as a normal state, Ia _ mov1 is A-phase Imov1, Ia _ mov2 is A-phase Imov2, and K1a and K2a are protection device setting parameters; then setting: Icap/Icap ', Imov1/Imov1 ', Imov2/Imov2 ' of (one phase, two phases or three phases) in G1/G2 or G3/G4 or G5/G6 to 1.05 of a setting value (| K1a [. Ia _ mov1] -K2a [. Ia _ mov2] |) as a fault state (maintained at least 500 μ s); (see the value of the previous step setting, determine this setting is none, if the capacitor two-end voltage is greater than the fixed value and MOV current instantaneous value is greater than 100A simultaneously satisfied) setting: the Igap/Igap' of (one phase, two phases or three phases) in G1/G2 or G3/G4 or G5/G6 reaches a certain value (400Apeak) as a triggered state (should be switched to this state in 5-10 ms); setting: the (three-phase) Ibyp > certain value in G1/G2, G3/G4, G5/G6 or Imov1/Imov1 ', Imov2/Imov2 ' (if triggered, Igap/Igap ') all < certain value, 3-way open amount, as the post-fault state (in order to prevent the protection judgment closing failure, it is required that the switching of the fault state to the post-fault state is completed within 200 ms). Adding the three states into a test item, starting a test (outputting a signal to a protection device) and monitoring a trigger condition (such as switching value action information sent by protection), switching the test states when the trigger condition is set, and stopping outputting after the last test state is finished.

For example, in a fault state, when the test device receives switching value action information, if a triggered state is set, the test device is switched to the triggered state after receiving a trigger command (within 5-10 ms); after a switch bypass command is received (in a short time), switching to a state after fault (outputting current Ibyp or Igap for avoiding failure of protection judgment); if the state after triggering is not set, the testing device directly switches the fault state to the state after the fault (current Ibyp or Imov < > for preventing the protection judgment failure is output) after receiving the switch bypass command, and after the set time is reached, the test is finished, the output is stopped, and a test conclusion is given.

In addition, the test device needs to receive and analyze 61850 network information sent by protection, and the information is synchronously displayed in a test conclusion after being received, and the test is finished.

7. MOV overload protection

7.1MOV high Current protection and Re-projection

Firstly, setting: setting the Imov1/Imov1 ', Imov2/Imov 2' of (one phase of) G1/G2 or G3/G4 or G5/G6 to 0.95 of a setting value (all instantaneous values are Imov1_ abs/Imov1_ abs ', Imov2_ abs/Imov2_ abs' and Imov _ abs), wherein Imov1_ abs represents the momv 1 branch current instantaneous value, Imov2_ abs represents the momv 2 branch current instantaneous value, and Imov _ abs represents the total MOV current value; then setting: 1.05 of Imov1/Imov1 ', Imov2/Imov 2' in G1/G2 or G3/G4 or G5/G6 (only one phase) to setting values (all are instantaneous values, and Imov1_ abs/Imov1_ abs ', Imov2_ abs/Imov2_ abs' and Imov _ abs) is used as a fault state (three sampling points are maintained); setting: ibyp in G1/G2, G3/G4 or G5/G6 is greater than a certain value or Imov1/Imov1 'and Imov2/Imov 2' corresponding to the certain value, and the 1-channel switching amount is changed (simulating switch on-off position) to serve as a state after the fault (maintaining a certain time > re-throwing delay time (500ms) and simultaneously > bypass closing failure delay time (200 ms)); setting: and 3, the channel switching output is shifted (simulated switching) to serve as a re-switching state (for avoiding the failure of the protection judgment switching gate, the switching from the state after the fault to the re-switching state is completed within 200 ms). Adding the four states into a test item, starting testing (outputting a signal to a protection device) and monitoring (protecting and sending) switching value action information, switching the test states when the set output time is reached or the switching value has corresponding state change information, and stopping outputting after the last test state is finished.

For example, in a fault state, when monitoring that the protection sends out bypass action information, switching to a state after the fault (namely, outputting current Ibyp or Imov <) > for avoiding the failure of protection judgment for more than 500ms), simultaneously outputting an output (single phase) to the input (simulating the switch on position) of the protection device by the test device, then receiving the input again by the test device, switching the test state to a reset state, switching a contact to a corresponding protection separation position input contact by the tester, and then stopping outputting after the test is finished to give a test conclusion.

7.2MOV Low and high energy protection

7.2.1MOV Low energy protection and Re-projection (energy calculation as the integral of current, time)

Firstly, setting: imov1/Imov1 'and Imov2/Imov 2' in G1/G2 or G3/G4 or G5/G6 (namely one phase in three phases) output a certain time t1 as a normal state; then setting: imov1/Imov1 ', Imov2/Imov 2' of G1/G2 or G3/G4 or G5/G6 (of one phase) outputs another time t2(t2> t1) as a fault state (at the moment, the total MOV current is higher than 100A, and the device starts energy calculation only when the total MOV current is higher than 100A); setting: ibyp > a certain value or Imov1/Imov1 ', Imov2/Imov 2' of G1/G2, G3/G4, or G5/G6 (corresponding to one of the three phases) is < a certain value, and as a state after failure, the 1-way opening amount is changed (the simulated switch is closed) (maintained for at least more than 500 ms); setting: and (4) switching the 1-way switching output (simulating switch opening) as a re-switching state (switching from the post-fault state to the re-switching state is completed within 200ms to avoid failure of protection judgment switching). Adding the four states to a test item, starting testing (outputting a signal to a protection device) and monitoring (protecting and sending) switching value action information, and switching the test state when the set output time is reached or the switching value has corresponding state change information.

For example, in a fault state, the test apparatus switches to a post-fault state (i.e., outputs an amount of current Ibyp > or Imov <) for avoiding the failure of protection judgment (which should be maintained for at least 500ms) when monitoring a bypass instruction, switches the test state to a re-throw state when receiving a re-throw start-in, and then stops outputting and gives a test conclusion after the test is completed.

7.2.2MOV high energy protection (energy is calculated as the integral of current, time)

Firstly, setting: imov1/Imov1 ', Imov2/Imov 2' in G1/G2, G3/G4 or G5/G6 (namely one phase in three phases) outputs a certain time t1 as normality; then setting: the Imov1/Imov1 ', Imov2/Imov 2' of (one phase of) G1/G2 or G3/G4 or G5/G6 outputs another time t3(t3> t2> t1) as a fault state (the total MOV current is higher than 100A, and the device starts energy calculation when the total MOV current is higher than 100A); setting: in G1/G2, G3/G4, or G5/G6, (three phases) Ibyp > a certain value, or Imov1/Imov1 ', Imov2/Imov 2' all < a certain value, and as the post-failure state, the 3-way opening amount is shifted (simulated switch on/off position). And adding the three states to a test item, starting testing (outputting a signal to a protection device) and monitoring (protecting and sending) switching value action information, and switching the test state when the set output time is reached or the switching value has corresponding state change information.

For example, in a fault state, the test device monitors a three-phase bypass instruction, switches to a post-fault state (that is, outputs a current amount Ibyp > or Imov <, and outputs 3-way open output at the same time) and then stops outputting, and a test conclusion is given.

7.3MOV high temperature protection

MOV high temperature protection (temperature rise depends on injected energy > dissipated energy, so current and time dependent) is first set: imov1/Imov1 ', Imov2/Imov 2' in G1/G2, G3/G4 or G5/G6 (namely one phase in three phases) outputs a certain time t1 as normality; then setting: Icap/Icap ', Imov1/Imov1 ', Imov2/Imov2 ' of (one phase of) G1/G2 or G3/G4 or G5/G6 outputs another time t2(t2> t1) as a fault state; determining that this setting is absent, depending on the magnitude of the value set at the previous step): the Igap/Igap' of (one phase) in G1/G2 or G3/G4 or G5/G6 reaches a certain value (400Apeak) as a triggered state (should be switched to this state in 5-10 ms); setting: ibyp > certain value in G1/G2, G3/G4, G5/G6 or Imov1/Imov1 ', Imov2/Imov 2' are all < certain value, and 3-way opening/closing amount displacement (simulated switch on/off position) is taken as a state after failure (switching from the failure state to the reset state should be completed within 200ms in order to avoid failure of protection judgment and closing). Adding several states to the test item, starting the test (outputting signal to the protection device) and monitoring (protecting the output quantity action information), when the set output time or the switching value has the corresponding state change information, switching the test state.

For example, in a fault state, if the test device monitors a bypass instruction, the test device switches to a post-trigger state (i.e., the output gap current Igap/Igap' reaches a certain value (400 apek) (the switching time is within 5-10 ms)), then switches to a post-fault state (i.e., the current Ibyp > or Imov <, which avoids the failure of protection judgment, is output), and then stops outputting, so as to give a test conclusion.

8. Platform flashover protection

8.1 platform flashover low fixed value bypass

Firstly, setting: Ipltf/Ipltf' in G1/G2, G3/G4 and G5/G6 is set to be 0.95 of a setting value as a normal state; then setting: Ipslatf/Ipstf' of G1/G2, G3/G4 and G5/G6 (one phase, two phases or three phases) to 1.05 of the setting value as a fault state (maintenance time > 100 ms); setting: the Ibyp > certain value or Icap/Icap' > certain value in G1/G2, G3/G4, G5/G6, 3-channel open amount (simulated switch on position) is regarded as the post-failure state (switching should be completed within 200 ms). Adding the three states into a test item, starting testing (outputting a signal to a protection device) and monitoring (protecting and sending) switching value action information, switching the test states when the set output time is reached or the switching value has corresponding state change information, and stopping outputting after the last test state is finished.

For example, in a fault state, if the test device monitors a bypass instruction, the test device switches to a post-fault state (i.e., outputs a current Ibyp for preventing the protection judgment failure), and outputs an output to an input of the protection device (a switch on contact), and then stops outputting, and a test conclusion is given.

8.2 platform flashover high-definite-value bypass

Firstly, setting: Ipltf/Ipltf 'in G1/G2, G3/G4, G5/G6 is set to 0.95 of a setting value (all instantaneous values, | Ipltf _ peak |/| Ipltf _ peak' |); then setting: the fault state is 1.05 of the Ipltf/Ipltf' to the setting value (all instantaneous values, | Ipltf _ peak |/| Ipltf _ peak |) in G1/G2, G3/G4, G5/G6, and Ipltf _ peak represents the Ipltf peak value; setting: the Ibyp > certain value or Icap/Icap' < certain value in G1/G2, G3/G4, and G5/G6, and the 3-channel switching amount is shifted (simulated switch on position) as the post-failure state (switching should be completed within 200 ms). Adding three states to a test item, starting to test (outputting a signal to a protection device) and starting to monitor switching value action information sent by protection, and switching the test state when the set output time is reached or the switching value has corresponding state change information.

For example, in a fault state, if the test device monitors a bypass instruction, the test device switches to a post-fault state (i.e., outputs a current amount Ibyp > for preventing the protection judgment failure) (which should be maintained for at least 500ms), and outputs an output amount to an input of the protection device ("switch closing position contact"), and then stops outputting, and a test conclusion is given.

9. Bypass switch three-phase inconsistent protection

Setting: the 3 pairs of contacts in the open contacts are 0/1, 0/1 and 0/1 respectively, and are output to the corresponding A closed/separated position, B closed/separated position and C closed/separated position as a normal state; setting: the 3 pairs of contacts among the open contacts are 0/1, 0/1 and 0/1 respectively, and are output to the corresponding A closed/open, B open/closed and C closed/open as fault states (which should last for more than 1200 ms); ibyp > a certain value or Icap/Icap' < a certain value in G1/G2, G3/G4 and G5/G6 are set, and 3-way open amount is shifted (simulated switch on position) as a post-failure state. And adding the three states to a test item, starting testing (outputting a signal to a protection device) and monitoring (protecting and sending) switching value action information, and switching the test state according to related information.

For example, in a fault state, when the test device monitors a three-phase bypass instruction, the test device switches to a post-fault state, and then stops outputting to give a test conclusion.

Remarking: after the protection action, a 'permanent locking' signal is sent out, and the test personnel needs to manually reset.

10. Bypass switch failure protection

10.1 testing switch closing failure protection by using capacitor overload three-phase bypass

Bypass switch closing failure protection

Firstly, setting: the normal state is that the Icap/Icap' in G1/G2, G3/G4 and G5/G6 is equal to 0.95 of the setting value; then setting: Icap/Icap' in G1/G2, G3/G4 and G5/G6 is set to be 1.05 of a setting value to be used as a fault state; setting: ibyp < a certain value or Icap/Icap' > a certain value (maintained for >200ms) in G1/G2, G3/G4, G5/G6 is set as a post-failure state. Adding the three states to a test item, starting testing (outputting a signal to a protection device) and monitoring (protecting and sending) switching value action information, and switching the test state when the output time is up or the switching value has displacement information.

For example, in a fault state, the testing device monitors a capacitor overload three-phase bypass signal, switches to a post-fault state, and then stops outputting to give a testing conclusion.

Remarking: the protection will send out 'permanent locking' information to prompt the tester to manually reset, and after resetting, the tester can continue the next test item.

10.2 testing switch open failure protection by MOV high current protection

Bypass switch open failure protection

Firstly, setting: in G1/G2 or G3/G4 or G5/G6 (namely, one phase), 0.95 of Imov1/Imov1 ', Imov2/Imov 2' to the setting values (both are instantaneous values, Imov1_ abs/Imov1_ abs ', Imov2_ abs/Imov2_ abs' and Imov _ abs) is taken as a normal state; then setting: 1.05 of Imov1/Imov1 ', Imov2/Imov 2' in G1/G2 or G3/G4 or G5/G6 (only one phase) to setting values (all are instantaneous values, and Imov1_ abs/Imov1_ abs ', Imov2_ abs/Imov2_ abs' and Imov _ abs) is used as a fault state (three sampling points are maintained); setting: ibyp in G1/G2, G3/G4 or G5/G6 is greater than a certain value or Imov1/Imov1 'and Imov2/Imov 2' corresponding to the certain value, and the 1-channel switching amount is changed (simulating switch on-off position) to serve as a state after the fault (maintaining a certain time > re-throwing delay time (500ms) and simultaneously > bypass closing failure delay time (200 ms)); . Adding several states to the test item, starting the test (outputting signal to the protection device) and monitoring the switching value action information (sent by the protection), when the set output time is reached or the switching value has corresponding state change information, switching the test state, and stopping outputting after the last test state is finished.

For example, in a fault state, when monitoring that the protection sends out bypass action information, the protection is switched to a post-fault state (namely, current Ibyp or Imov <) (> 500ms) for avoiding the failure of protection judgment is output, meanwhile, the test device outputs an opening amount (single phase) to the opening of the protection device (simulating the closing position of a switch), then the test device receives the re-opening of the protection device again, the test device does nothing, the closing position of the switch is maintained for 200ms, the protection judges that the opening of a brake fails, a three-phase bypass command and a permanent locking command are sent out, then the test is finished, the output can be stopped, and a test conclusion is given.

11. Subsynchronous resonance protection

Setting 1-way open contact as fault state; ibyp > a certain value or Icap/Icap' in G1/G2, G3/G4 and G5/G6 are all set to < a certain value, and 3 channel open amounts (simulated switch on positions) are set as post-failure states. And adding the two states into a testing device, starting testing (outputting a signal to a protection device), monitoring (protecting and sending) switching value action information, and switching the testing state according to related information.

For example, in a fault state, the test device outputs an open contact to a ' subsynchronous resonance open-in ' state, the tester can receive a three-phase bypass command and a ' subsynchronous resonance protection action ' signal sent by protection, at the moment, the test device switches an output state, outputs an open quantity to the open of the protection device (simultaneously, outputs a current Ibyp for avoiding the failure of protection judgment to be greater than a certain value or Icap/Icap ' < a certain value), and stops outputting after the set time is up, so as to give a test conclusion.

12. Clearance protection

12.1 Clearance self-triggering protection and Re-projection

Firstly, setting: the normal state is that Igap/Igap' in G1/G2(G3/G4, G5/G6 are not provided) reaches 0.95 of the setting value; then setting: the time from Igap/Igap' in G1/G2(G3/G4, G5/G6 are not set) to 1.05 of a setting value is taken as a fault state, and the output is maintained for more than 25 ms; setting: ibyp > a certain value in G1/G2, G3/G4 and G5/G6 or Igap/Igap' < a certain value in G1/G2, and a 3-way open amount is shifted (simulating a switch on position) as a state after a failure (maintained for >1200ms, and a switching time is within 200 ms); setting: the 3-way open amount is shifted (analog switch is divided) (the switching time should be within 200 ms). Several states are added to the test item, the test is started (signals are output to the protection device) and the monitoring (protection sending) of the switching value action information is started, and the test state is switched according to the protection related information and the set time.

For example, in a fault state, the test device receives an a-phase gap self-triggering three-phase bypass sent by the protection, and switches to a state after the fault, that is, outputs a current Ibyp or Igap/Igap' <, which avoids the failure of the protection judgment. And in the state after the fault, receiving a protection device re-throwing instruction, and then opening an input terminal to a protected switch sub-position contact by the tester to output an output signal. And at this moment, the test is finished, the output is stopped, and a test conclusion is given.

12.2 gap continuous conduction protection

Firstly, setting: the normal state is that Igap/Igap' in G1/G2(G3/G4, G5/G6 are not provided) reaches 0.95 of the setting value; then setting: the time from Igap/Igap' in G1/G2(G3/G4, G5/G6 are not set) to 1.05 of a setting value is taken as a fault state, the current output should be maintained for SG _ T1(>200ms) time, and SG _ T1 represents a setting parameter in the protection device and represents delay time; setting: the post-failure state is represented by Ibyp > certain value in G1/G2, G3/G4, G5/G6, Igap/Igap' < certain value in G1/G2, and 3-way open amount (simulated switch closed position). Adding the three states to the test item, starting the test (outputting a signal to the protection device) and starting monitoring (protecting the sent) switching value action information, and switching the test state according to the protection related information and the set time.

For example, in a fault state, the test device receives the information that the phase gap A continuously conducts the three-phase bypass, switches the test state to a state after the fault, then stops outputting, and gives a test conclusion.

In addition, the test device needs to receive and analyze 61850 network information sent by the protection, and after the reception is finished, the information is synchronously displayed in a test conclusion, and meanwhile, the test is finished.

Remarking: the protection sends out 'permanent locking' information, and after the manual reset of a tester is needed, the tester can continue to perform the next test item.

12.3 Interval delay trigger and rejection trigger protection

Gap delay trigger and trigger rejection protection using MOV high temperature protection (temperature rise is dependent on implant energy > dissipated energy, and is therefore current and time dependent)

MOV high temperature protection (temperature rise depends on injected energy > dissipated energy, so current and time related)

Firstly, setting: imov1/Imov1 'and Imov2/Imov 2' in G1/G2 or G3/G4 or G5/G6 (namely one phase in three phases) output a certain time t1 as a normal state; then setting: Icap/Icap ', Imov1/Imov1 ', Imov2/Imov2 ' of (one phase of) G1/G2 or G3/G4 or G5/G6 outputs another time t2(t2> t1) as a fault state; (depending on the magnitude of the value set in the previous step, determine this setting none) settings: the Igap/Igap' of (one phase) in G1/G2 or G3/G4 or G5/G6 reaches a certain value (400Apeak) as a state after triggering (it should be switched to this state after 10ms (judged as delayed triggering) or after 40ms (judged as rejected triggering)); setting: ibyp or Igap/Igap' in G1/G2, G3/G4 and G5/G6 are all less than a certain value, and the 3-way opening amount displacement (simulating the switch-on position) is taken as a state after the fault (in order to avoid the failure of the protection judgment switch-on, the switching from the state after the trigger to the state of the re-throw is completed within 200 ms). Adding several states to the test item, starting the test (outputting signal to the protection device) and monitoring (protecting the output quantity action information), when the set output time or the switching value has the corresponding state change information, switching the test state.

For example, in a fault state, if the test device monitors a bypass command, the test device switches to a post-trigger state (i.e., outputs gap current Igap/Igap' to a certain value (400Apeak) (after 10ms or 40 ms), then switches to a post-fault state (i.e., outputs current amount Ibyp > or Igap <, which avoids the failure of protection determination), and then stops outputting, so as to provide a test conclusion.

13 line connection jump series compensation protection

13.1 Single-phase line fault combined-tripping series compensation bypass and re-throw

Firstly, setting (in the case of the ' single-phase bypass soft pressure plate allowing ' input) an open contact to be connected with an ' A-phase line tripping open ' or a ' B-phase line tripping open ' or a ' C-phase line tripping open ' (only one phase can be opened, but starting and protection are needed at the same time), (if clearance triggering is considered), setting Icap/Icap ' in G1/G2 or G3/G4 or G5/G6 (namely, one phase in three phases, corresponding to the line tripping open) at the same time (ensuring that the capacitor voltage reaches the clearance triggering requirement), and setting the total current (more than 100A) of Imov1/Imov1 ', Imov2/Imov2 ' as a fault state; (if gap triggering is considered) settings: the output of Igap/Igap' (400Apeak) in G1/G2 or G3/G4 or G5/G6 (namely one phase in three phases) is taken as a gap trigger state (the switching time is within 5-10 ms); setting: ibyp > a certain value of (one phase of three phases) in G1/G2, G3/G4, G5/G6, Igap/Igap '< a certain value of (one phase of three phases) in G1/G2, G3/G4, G5/G6 (one phase of three phases) or (if the gap is not triggered) Icap/Icap' < a certain value of (one phase of three phases) in G1/G2, G3/G4, G5/G6, 1-channel open amount shift (analog switch closed position) as a post-fault state (receiving "bypass" open amount, the switching time is within 200ms) (maintaining >1200 ms); setting: and 3, the channel output (the analog switch is divided into positions) is used as a state after the re-throwing (the switching time is within 200ms after the re-throwing input is received). The test status is added to the test item and the test is started. Meanwhile, the tester starts to monitor the switching value action information, and after the tester receives the displacement information, the testing state is switched.

13.1.1 regardless of gap triggering:

and in the fault state, the protection sends out single-phase bypass information, the test state is switched to the post-fault state, the test device needs to receive the re-throw information, the test state is switched to the post-re-throw state at the moment, the output is stopped after the re-throw state is reached, and a test conclusion is given.

13.1.2 when considering gap triggering:

under the fault state, the protection sends out 'gap trigger' and 'single-phase bypass' information, the testing device is switched to a trigger gap state, and is switched to a state after the fault after the time is up, then the testing device receives the re-input information, at the moment, the testing state is switched to a state after the re-input, and the output is stopped after the time of the re-input state is up, so that a test conclusion is given.

13.2 Multi-phase line Fault Linked jump series complement bypass and latch reclosing (at least 7 or 8 switching outputs are required)

Firstly, setting tester open contacts to 2 or 3 of ' A-phase line tripping open ' or ' B-phase line tripping open ' or ' C-phase line tripping open ', or setting tester open contacts to ' three-phase line tripping open ', (if gap triggering is considered) simultaneously setting Icap/Icap ' of G1/G2 or G3/G4 or G5/G6 (namely 2 or 3 phases in three phases, corresponding to line tripping open) > a certain value (ensuring that the capacitor voltage reaches the gap triggering requirement), and setting the total current (more than 100A) of Imov1/Imov1 ', Imov2/Imov2 ' as a fault state; (if gap triggering is considered) settings: the Igap/Igap' (400Apeak) in G1/G2, G3/G4 or G5/G6 (namely 2 or 3 phases in three phases) is output as a gap trigger state (the switching time is within 5-10 ms); setting: the (three-phase) Ibyp > certain value in G1/G2, G3/G4, G5/G6, or (three-phase) Igap/Igap '< certain value in G1/G2, G3/G4, G5/G6 (if the gap is not triggered), or (three-phase) Icap/Icap' < certain value in G1/G2, G3/G4, G5/G6, and the 3-channel open amount is shifted (analog switch on position) as the state after failure (the switching time is within 200ms after the "bypass" open amount is received). The test status is added to the test item and the test is started. Meanwhile, the tester starts to monitor the switching value action information, and after the tester receives the displacement information, the testing state is switched.

If gap triggering is not considered:

and in the fault state, the test device receives a three-phase bypass command sent by protection, switches the test state to the post-fault state, and then stops outputting to give a test conclusion.

If gap triggering is considered:

under the fault state, the testing device receives a 'gap trigger' command and a 'three-phase bypass' command sent by protection, switches the testing state to the gap trigger state, switches the testing state to the state after the fault when the time of the gap trigger state is up, stops outputting after the time is up, and gives a test conclusion.

The above-mentioned embodiments only express several embodiments of the present invention, and the description thereof is more specific and detailed, but not construed as limiting the scope of the present invention. It should be noted that, for a person skilled in the art, several variations and modifications can be made without departing from the inventive concept, which falls within the scope of the present invention. Therefore, the protection scope of the present patent shall be subject to the appended claims.

Claims

1. The test method of the series compensation protection device is characterized in that the series compensation protection device comprises a capacitor bank C, a normally open contact GS1, a normally open contact DS1, a normally open contact GS2, a normally open contact DS2, a normally open contact MBS, a varistor MOV1, a varistor MOV2, a damping loop, a spark GAP GAP, a bypass switch BPS and an insulation platform;

wherein, G1-G6 are in software interface, map to the output optical port of the hardware, each way electric current is expressed as follows: line current Iline, capacitor bank C branch current Icap, capacitor bank C unbalanced current Inb, MOV branch 1 current Imov1, MOV branch 2 current Imov2, gap branch current Igap, bypass switch branch current Ibyp and platform flashover branch current Iplate;

s1 unbalance protection alarm of capacitor bank C

s2 unbalanced low constant value protection of capacitor bank C

Firstly, setting: Ifnb/Ifnb 'and Icap/Icap' in G1/G2, G3/G4 and G5/G6 are adjusted to 0.95 of the setting value as a normal state; then setting: Ifnb/Ifnb 'and Icap/Icap' in G1/G2, G3/G4 and G5/G6 are adjusted to 1.05 of the setting value to be used as fault states; setting: ibyp > a certain value or Icap/Icap' < a certain value in G1/G2, G3/G4, G5/G6, and 3 channel open amounts are shifted as post-failure states; in order to prevent the unbalanced low value protection switching-on and switching-off failure of the capacitor bank C, the requirement of switching the fault state to the post-fault state needs to be completed within 200 ms; adding the three states into a test item, starting testing and monitoring a trigger condition, switching the test states when a set output time is reached or switching value change information exists, and stopping outputting after the last test state is finished;

the test device needs to receive and analyze 61850 network information sent by the unbalanced low fixed value protection of the capacitor bank C, and the received information is synchronously displayed in a test conclusion;

the unbalanced low-fixed-value protection action information of the capacitor bank C contains a permanent locking signal, so that after the item test is finished, a tester needs to manually reset the protection device to continue the next item test;

s3 capacitance unbalance high constant value bypass

Firstly, setting: Ifnb/Ifnb 'and Icap/Icap' in G1/G2, G3/G4 and G5/G6 are adjusted to 0.95 of the setting value as a normal state; then setting: Ifnb/Ifnb 'and Icap/Icap' in G1/G2, G3/G4 and G5/G6 are adjusted to 1.05 of the setting value to be used as fault states; setting: the post-failure state is 3-channel switching amount shifts for any of the values Ibyp > or Icap/Icap' < certain values in G1/G2, G3/G4, and G5/G6; in order to prevent the failure of judging and closing of the capacitance unbalance high-fixed-value bypass protection, the switching of the fault state to the post-fault state is required to be completed within 200 ms; adding the three states into a test item, starting testing and monitoring a trigger condition, switching the test states when the set output time or switching value is reached and corresponding state change information exists, and stopping outputting after the last test state is finished;

the test device needs to receive and analyze 61850 network information sent by the high-fixed-value bypass protection of capacitance imbalance, and the information is synchronously displayed in a test conclusion after being received;

the 61850 information sent by the unbalanced high-fixed-value bypass protection of the capacitance contains a permanent locking signal, so that after the item test is finished, a tester needs to manually reset the protection device, and then the next test item can be continued;

s4 overload alarm of capacitor bank C

s5 overload three-phase bypass of capacitor bank C

Firstly, setting: the normal state is that the Icap/Icap' of one phase, two phases or three phases in G1/G2, G3/G4 or G5/G6 is 0.95 of the setting value; then setting: the Icap/Icap' of one phase, two phases or three phases in G1/G2, G3/G4 or G5/G6 is set to 1.05 of a setting value to be used as a fault state; setting: ibyp > a certain value or Icap/Icap' < a certain value in G1/G2, G3/G4, G5/G6, and 3 channel open amounts are shifted as post-failure states; adding the three states into a test item, starting testing and monitoring a trigger condition, switching the test states when the set trigger condition is reached, and stopping outputting after the last test state is finished;

the test device needs to receive and analyze 61850 network information sent by the overload three-phase bypass protection of the capacitor bank C, and the information is synchronously displayed in a test conclusion after being received;

the overload three-phase bypass protection of the capacitor bank C is put to the final test, if the overload three-phase bypass protection is put to the test, after the test of the item is finished, a tester manually resets the protection device, and then the next test item is continued;

s6 MOV unbalance protection

Firstly, setting: G1/G2, G3/G4 or G5/G6, wherein the Imov1/Imov1 ', Imov2/Imov 2' of one phase, two phases or three phases in the G1/G2 or G3/G4 or G5/G6 is used as a normal state, and 0.95 of a setting value | K1a [ [ Ia _ mov1] -K2a [ [ Ia _ mov2] | is used as a normal state, Ia _ mov1 is A-phase Imov1, Ia _ mov2 is A-phase Imov2, and K1a and K2a are protection device setting parameters; then setting: taking 1.05 of Icap/Icap ', Imov1/Imov1 ', Imov2/Imov2 ' of one phase, two phases or three phases in G1/G2, G3/G4 or G5/G6 to a setting value | K1a [. Ia _ mov1] -K2a [. Ia _ mov2] | as a fault state, and maintaining at least 500 mu.s; and determining whether the setting is carried out or not according to the value set in the previous step, and if the voltage at two ends of the capacitor bank C is greater than a fixed value and the instantaneous value of the MOV current is greater than 100A, setting: the state of one phase, two phases or three phases of Igap/Igap' in G1/G2, G3/G4 or G5/G6 is used as a triggered state and should be switched to the triggered state within 5-10 ms; setting: ibyp in G1/G2, G3/G4 and G5/G6 is greater than a certain value or Imov1/Imov1 'and Imov2/Imov 2' are less than a certain value, and 3-way opening amount is used as a state after the fault, and the switching of the fault state to the state after the fault needs to be completed within 200ms in order to prevent MOV imbalance protection judgment and closing failure; adding the three states into a test item, starting testing and monitoring a trigger condition, switching the test states when the trigger condition is set, and stopping outputting after the last test state is finished;

the test device needs to receive and analyze 61850 network information sent by the MOV imbalance protection, the information is synchronously displayed in a test conclusion after the reception is finished, and the test is finished;

s7 MOV overload protection

S71 MOV high current protection and re-projection

Firstly, setting: in one of the phases of G1/G2, G3/G4 or G5/G6, 0.95 of Imov1/Imov1 ', Imov2/Imov 2' to a setting value Imov1_ abs/Imov1_ abs ', Imov2_ abs/Imov2_ abs' and Imov _ abs is taken as a normal state, Imov1_ abs represents an MOV branch 1 current instantaneous value, Imov2_ abs represents an MOV branch 2 current instantaneous value, and Imov _ abs represents an MOV total current instantaneous value; then setting: taking 1.05 of Imov1/Imov1 ', Imov2/Imov 2' in one phase of G1/G2 or G3/G4 or G5/G6 to a setting value of Imov1_ abs/Imov1_ abs ', Imov2_ abs/Imov2_ abs' and Imov _ abs as a fault state, and maintaining three sampling points; setting: ibyp in G1/G2, G3/G4 or G5/G6 is greater than a certain value or Imov1/Imov1 'and Imov2/Imov 2' are both less than a certain value, 1 channel opening amount is changed to be used as a state after fault, and the state after fault is maintained for a certain time > re-throwing delay failure time and simultaneously > bypass closing delay time; setting: the method comprises the following steps that 3 channel switching output variables are shifted to serve as a reclosing state, switching from a state after a fault to the reclosing state is completed within 200ms in order to avoid MOV high-current protection and reclosing protection brake judging failure, four states are added to a test item, testing is started, switching of the testing state is started, switching of switching output information is started when set output time is reached or corresponding state change information of the switching output is obtained, and output is stopped after the last testing state is completed;

the test device needs to receive and analyze 61850 network information sent by MOV high current protection and reclosing protection, the information is synchronously displayed in a test conclusion after the reception is finished, and the test is finished;

s72 MOV Low energy protection and high energy protection

S721MOV low energy protection and re-projection

Firstly, setting: imov1/Imov1 'and Imov2/Imov 2' of one phase of G1/G2, G3/G4 or G5/G6 output a certain time t1 as a normal state; then setting: one of the phases of G1/G2, G3/G4 or G5/G6 is Imov1/Imov1 ', Imov2/Imov 2' outputs another time t2 as a fault state, t2> t1, and the total MOV current is higher than 100A, because the device starts energy calculation when the total MOV current is higher than 100A; setting: ibyp > a certain value or Imov1/Imov1 ', Imov2/Imov 2' of one phase in G1/G2, G3/G4 or G5/G6 are all < a certain value, and as a state after failure, the 1-way opening amount is shifted and maintained for more than 500 ms; setting: 1, switching the output of the 1-path as a re-switching state, wherein in order to avoid MOV low-energy protection and re-switching protection brake judging failure, switching from a state after a fault to the re-switching state is completed within 200ms, adding four states into a test item, starting testing and monitoring switching value action information, and switching the test state when set output time is reached or the switching value has corresponding state change information;

the test device needs to receive and analyze 61850 network information sent by the MOV low-energy protection and the re-throw protection, the information is synchronously displayed in a test conclusion after the reception is finished, and the test is finished;

s722 MOV high energy protection

Firstly, setting: imov1/Imov1 'and Imov2/Imov 2' of one phase of G1/G2, G3/G4 or G5/G6 output a certain time t1 as a normal state; then setting: one of the phases of G1/G2, G3/G4 or G5/G6 is Imov1/Imov1 ', Imov2/Imov 2' outputs another time t3 as a fault state, t3> t2> t1, and the total MOV current is higher than 100A, because the energy calculation is started by the device when the total MOV current is higher than 100A; setting: the 3-way opening amount is shifted as the post-failure state, i.e., the Ibyp > certain value in G1/G2, G3/G4, G5/G6, or each of Imov1/Imov1 ', Imov2/Imov 2' < certain value; adding the three states into a test item, starting testing and monitoring switching value action information, and switching the test state when the set output time is reached or the switching value has corresponding state change information;

the test device needs to receive and analyze 61850 network information sent by MOV high-energy protection, the information is synchronously displayed in a test conclusion after the reception is finished, and the test is finished;

s73 MOV high temperature protection

MOV high temperature protection

Firstly, setting: imov1/Imov1 'and Imov2/Imov 2' of one phase of G1/G2, G3/G4 or G5/G6 output a certain time t1 as a normal state; then setting: Icap/Icap ', Imov1/Imov1 ', Imov2/Imov2 ' of one phase in G1/G2, G3/G4 or G5/G6 outputs another time t2 as a fault state, t2> t 1; and determining whether the setting is zero or not according to the value set in the previous step, and setting: when the Igap/Igap' of one phase in G1/G2, G3/G4 or G5/G6 reaches a certain value, the state is switched to as a triggered state within 5-10 ms; setting: ibyp in G1/G2, G3/G4 and G5/G6 is greater than a certain value or Imov1/Imov1 'and Imov2/Imov 2' are less than a certain value, the 3-way open-out quantity is used as a state after the fault, and the switching from the fault state to the reclosing state is completed within 200ms in order to avoid the MOV high-temperature protection switching failure; adding a normal state, a fault state, a state after triggering and a state after fault into a test item, starting testing and monitoring output quantity action information, and switching a test state when set output time or switching quantity has corresponding state change information;

the test device needs to receive and analyze 61850 network information sent by MOV high-temperature protection, the information is synchronously displayed in a test conclusion after the reception is finished, and the test is finished;

s8 platform flashover protection

S81 platform flashover low constant value bypass

Firstly, setting: Ipltf/Ipltf' in G1/G2, G3/G4 and G5/G6 is set to be 0.95 of a setting value as a normal state; then setting: one phase, two phases or three phases of Ipltf/Ipltf' in G1/G2, G3/G4 and G5/G6 are set to be 1.05 of a setting value to be taken as a fault state, and the maintenance time is more than 100 ms; setting: the Ibyp > certain value or the Icap/Icap' of G1/G2, G3/G4 and G5/G6, 3 channel opening amounts, as the state after the fault, should be switched within 200 ms; adding the three states into a test item, starting testing and monitoring switching value action information, switching the test states when the set output time is reached or the switching value has corresponding state change information, and stopping outputting after the last test state is finished;

the test device needs to receive and analyze 61850 network information sent by the platform flashover low-fixed-value bypass protection, the received information is synchronously displayed in a test conclusion, and meanwhile, the test is finished;

s82 platform flashover high-fixed-value bypass

Firstly, setting: Ipltf/Ipltf 'in G1/G2, G3/G4, G5/G6 to 0.95 of setting value | Ipltf _ peak |/| Ipltf _ peak' | as a normal state; then setting: Ipltf/Ipltf 'of one phase, two phases or three phases of G1/G2, G3/G4 and G5/G6 to 1.05 of a setting value | Ipltf _ peak |/| Ipltf _ peak' |, as a fault state, the Ipltf _ peak represents the peak value of Ipltf; setting: in G1/G2, G3/G4, and G5/G6, if Ibyp > or Icap/Icap' < a certain value, 3 channel switching amounts are shifted, and as a state after failure, switching should be completed within 200 ms; adding the three states into a test project, starting testing and monitoring switching value action information sent by the platform flashover high-fixed-value bypass protection, and switching the test state when the set output time is reached or the switching value has corresponding state change information;

the test device needs to receive and analyze 61850 network information sent by the platform flashover high-fixed-value bypass protection, the received information is synchronously displayed in a test conclusion, and meanwhile, the test is finished;

s9 bypass switch three-phase inconsistent protection

Setting: the 3 pairs of contacts in the open contacts are 0/1, 0/1 and 0/1 respectively, and are output to the corresponding A closed/separated position, B closed/separated position and C closed/separated position as a normal state; setting: the 3 pairs of contacts among the open contacts are 0/1, 0/1 and 0/1 respectively, and are output to corresponding A closed position/separated position, B separated position/closed position and C closed position/separated position as fault states which last for more than 1200 ms; setting Ibyp > a certain value or Icap/Icap' < a certain value in G1/G2, G3/G4 and G5/G6, and shifting 3 channel opening amounts as a post-failure state; adding the three states into a test project, starting to test, starting to monitor switching value action information, and switching the test state according to related information;

the test device needs to receive and analyze 61850 network information sent by the bypass switch three-phase inconsistency protection, the information is synchronously displayed in a test conclusion after the reception is finished, and the test is finished;

the bypass switch can send out a permanent locking signal after three-phase inconsistent protection action, and needs manual resetting by a tester;

s10 failure protection of bypass switch

S101, testing switch closing failure protection by using' capacitor bank C overload three-phase bypass

Bypass switch closing failure protection

Firstly, setting: the normal state is that the Icap/Icap' in G1/G2, G3/G4 and G5/G6 is equal to 0.95 of the setting value; then setting: Icap/Icap' in G1/G2, G3/G4 and G5/G6 is set to be 1.05 of a setting value to be used as a fault state; setting: ibyp < a certain value or Icap/Icap' > a certain value in G1/G2, G3/G4, G5/G6, and is maintained for >200ms as a post-failure state; adding the three states into a test item, starting to test and monitoring the switching value action information, and switching the test state when the output time is up or the switching value has displacement information;

the test device needs to receive and analyze 61850 network information sent by the bypass switch closing failure protection, the information is synchronously displayed in a test conclusion after the reception is finished, and the test is finished;

the bypass switch closing failure protection can send out 'permanent locking' information to prompt a tester to manually reset, and after resetting, the tester can continue to test the next item;

s102, testing switch opening failure protection by using MOV high current protection

Bypass switch open failure protection

Firstly, setting: taking 0.95 of the setting values Imov1/Imov1 ', Imov2/Imov 2' of one phase of G1/G2 or G3/G4 or G5/G6 to Imov1_ abs/Imov1_ abs ', Imov2_ abs/Imov2_ abs' and Imov _ abs as a normal state; then setting: taking 1.05 of Imov1/Imov1 ', Imov2/Imov 2' in one phase of G1/G2 or G3/G4 or G5/G6 to a setting value of Imov1_ abs/Imov1_ abs ', Imov2_ abs/Imov2_ abs' and Imov _ abs as a fault state, and maintaining three sampling points; setting: ibyp in G1/G2, G3/G4 or G5/G6 is greater than a certain value or Imov1/Imov1 'and Imov2/Imov 2' are both less than a certain value, 1 channel opening amount is changed to be used as a state after fault, and the state after fault is maintained for a certain time > re-throwing delay failure time and simultaneously > bypass closing delay time; adding a normal state, a fault state and a state after fault into a test project, starting to test and monitoring switching value action information, switching the test state when the set output time is reached or the switching value has corresponding state change information, and stopping outputting after the last test state is finished;

the test device needs to receive and analyze 61850 network information sent by the bypass switch opening failure protection, the information is synchronously displayed in a test conclusion after the reception is finished, and the test is finished;

the bypass switch brake-separating failure protection can send out 'permanent locking' information to prompt a tester to manually reset, and after resetting, the tester can continue to test the next item;

s11 subsynchronous resonance protection

Setting 1-way open contact as fault state; setting Ibyp or Icap/Icap' in G1/G2, G3/G4 and G5/G6 to be less than a certain value, and taking 3 channel opening amounts as a state after fault; adding the two states into a testing device, starting testing, starting monitoring switching value action information, and switching the testing state according to related information;

the test device needs to receive and analyze 61850 network information sent by the sub-synchronous resonance protection, the received information is synchronously displayed in a test conclusion, and meanwhile, the test is finished;

s12, gap protection

S121, gap self-triggering protection and re-projection

Firstly, setting: the value of Igap/Igap' in G1/G2 is 0.95 of the setting value as a normal state; then setting: the time from Igap/Igap' in G1/G2 to 1.05 of a setting value is taken as a fault state, and the output is maintained for more than 25 ms; setting: ibyp > certain value of G1/G2, G3/G4 and G5/G6 or Igap/Igap' < certain value of G1/G2, the 3-way open amount is displaced, and the state is maintained for more than 1200ms as the state after the failure, and the switching time is within 200 ms; setting: the opening amount of the 3-way is changed, and the switching time is within 200 ms; adding a normal state, a fault state and a post-fault state into a test item, starting testing, starting monitoring switching value action information, and switching a test state according to gap self-triggering protection and re-switching protection related information and set time;

the test device needs to receive and analyze 61850 network information sent by the gap self-triggering protection and the reclosing protection, the information is synchronously displayed in a test conclusion after the reception is finished, and the test is finished;

s122, gap continuous conduction protection

Firstly, setting: the value of Igap/Igap' in G1/G2 is 0.95 of the setting value as a normal state; then setting: from Igap/Igap' in G1/G2 to 1.05 of a setting value, the current output is taken as a fault state, the time of SG _ T1 is maintained, SG _ T1 is more than 200ms, and SG _ T1 represents the setting parameter in the protection device and represents delay time; setting: ibyp > certain value in G1/G2, G3/G4, G5/G6 or Igap/Igap' < certain value in G1/G2, 3 channel open amounts as a post-failure state; adding the three states into a test item, starting to test and monitoring switching value action information, and switching the test state according to the gap continuous conduction protection related information and the set time;

the test device needs to receive and analyze 61850 network information sent by the gap continuous conduction protection, the information is synchronously displayed in a test conclusion after the reception is finished, and the test is finished;

the gap continuous conduction protection sends out permanent locking information, and a tester can continue to perform the next test item after manually resetting;

s123, gap delay triggering and trigger rejection protection

Firstly, setting: imov1/Imov1 'and Imov2/Imov 2' of one phase of G1/G2, G3/G4 or G5/G6 output a certain time t1 as a normal state; then setting: Icap/Icap ', Imov1/Imov1 ', Imov2/Imov2 ' of one phase in G1/G2 or G3/G4 or G5/G6 outputs another time t2 as a fault state, t2> t 1; and determining whether the setting is zero or not according to the value set in the previous step, and setting: the Igap/Igap' of one phase in G1/G2, G3/G4 or G5/G6 reaches a certain value, and as a state after triggering, the state should be switched to after 10ms or after 40 ms; setting: ibyp or Igap/Igap' in G1/G2, G3/G4 and G5/G6 are all less than a certain value, the 3-way open-out displacement is used as a fault state, and in order to avoid the fault failure of gap delay triggering and rejection triggering protection switching judgment and closing by utilizing MOV high-temperature protection, the switching from the triggered state to the reset state is completed within 200 ms; adding a normal state, a fault state, a state after triggering and a state after fault into a test item, starting testing and monitoring output quantity action information, and switching a test state when set output time or switching quantity has corresponding state change information;

the test device needs to receive and analyze 61850 network information which is sent by MOV high-temperature protection to realize gap delay triggering and trigger rejection protection, the received information is synchronously displayed in a test conclusion, and the test is finished;

the MOV high-temperature protection is utilized to realize that the gap delay triggering and the trigger rejection protection send out permanent latching information, and after manual resetting of a tester is needed, the next test item can be continued;

s13 line connection jump series compensation protection

S131, single-phase line fault joint-tripping series compensation bypass and reclosing

Firstly, under the condition that a ' single-phase bypass allows a soft pressure plate ' to be put into, an outgoing contact is arranged to be connected with an ' A-phase line trip open ' or a ' B-phase line trip open ' or a ' C-phase line trip open ', only one phase can be opened, but starting and protection are required to be simultaneously carried out, if gap triggering is considered, the Icap/Icap ' value of one phase in G1/G2, G3/G4 or G5/G6 is simultaneously set, the C voltage of a capacitor bank is ensured to meet the gap triggering requirement, and the total current of Imov1/Imov1 ', Imov2/Imov2 ' is more than 100A to serve as a fault state; if gap triggering is considered, setting: outputting the Igap/Igap' of one phase in G1/G2, G3/G4 or G5/G6, wherein the switching time is within 5-10 ms and is used as a gap trigger state; setting: if the gap is triggered to be larger than a certain value, or if the gap is triggered to be larger than a certain value, the gap of one of the phases Ibyp > of G1/G2, G3/G4 and G5/G6, or if the gap is not triggered to be larger than a certain value, the gap of one of the phases Icap/Icap 'of G1/G2, G3/G4 and G5/G6, or if the gap of one of the phases Icap/Icap' < a certain value, and 1 channel opening amount is shifted, wherein the switching time is within 200ms after the 'bypass' opening amount is received as the state after the fault; setting: 3 channel input quantities are used as the state after the re-input, and the switching time is within 200ms after the re-input quantity is received; adding the test state to the test item, and starting the test; meanwhile, the testing device starts to monitor the switching value action information, and switches the testing state after receiving the displacement information;

s1311, when clearance triggering is not considered:

in a fault state, single-phase line fault combined-tripping series compensation bypass and re-throw protection sends out single-phase bypass information, a test state is switched to a post-fault state, then a test device receives the re-throw information, the test state is switched to a post-re-throw state at the moment, after the post-re-throw state is reached, output is stopped, and a test conclusion is given;

s1312, if considering the gap triggering:

in a fault state, a single-phase line fault combined-tripping series compensation bypass and a re-throw protection send out 'gap trigger' and 'single-phase bypass' information, a testing device is switched to a trigger gap state and switched to a post-fault state after the time is up, then the testing device receives the re-throw information, the testing state is switched to a post-re-throw state at the moment, the output is stopped after the post-re-throw state time is up, and a test conclusion is given;

the test device needs to receive and analyze 61850 network information sent by the single-phase line fault combined-hop serial compensation bypass and the reclosing protection, and after the receiving is finished, the 61850 network information is synchronously displayed in a test conclusion and the test is finished;

s132, multi-phase line fault joint-jump series compensation bypass and locking reset

Firstly, setting a test device open contact to 2 or 3 of ' A-phase line trip open ' or ' B-phase line trip open ' or ' C-phase line trip open ', or setting the test device open contact to ' three-phase line trip open ', if considering gap triggering, simultaneously setting Icap/Icap ' of one phase in G1/G2 or G3/G4 or G5/G6 to ensure that the C voltage of a capacitor bank meets the gap triggering requirement, and setting the total current of Imov1/Imov1 ', Imov2/Imov2 ' to be more than 100A as a fault state; if gap trigger settings are considered: outputting Igap/Igap' of 2 or 3 phases in three phases in G1/G2, G3/G4 or G5/G6 as a gap trigger state, wherein the switching time is within 5-10 ms; setting: ibyp > certain value in G1/G2, G3/G4, G5/G6, or Igap/Igap '< certain value in G1/G2, G3/G4, G5/G6 if the gap is triggered, or Icap/Icap' < certain value in G1/G2, G3/G4, G5/G6 if the gap is not triggered, 3 channel open amounts are shifted, and as a post-failure state, the switching time is within 200ms from the receipt of the "bypass" open amount; adding the test state to the test item, and starting the test; meanwhile, the testing device starts to monitor the switching value action information, and switches the testing state after receiving the displacement information;

if gap triggering is not considered:

in a fault state, the test device receives a three-phase bypass command sent by a multi-phase line fault combined-tripping series compensation bypass and locking re-throw protection, switches the test state to a post-fault state, then stops outputting, and gives a test conclusion;

if gap triggering is considered:

in a fault state, the testing device receives a 'gap triggering' command and a 'three-phase bypass' command which are sent by a multi-phase line fault serial compensation bypass and a locking reset protection, switches a testing state to a gap triggering state, switches the testing state to a post-fault state after the time of the gap triggering state is up, stops outputting after the time is up, and gives a test conclusion;

the test device needs to receive and analyze 61850 network information sent by the multi-phase line fault serial compensation bypass and the locking reclosing protection, the information is synchronously displayed in a test conclusion after the reception is finished, and the test is finished;

the multi-phase line fault combined-jump series compensation bypass and locking reclosing protection sends out 'permanent locking' information, and a tester can continue to a next test item after manually resetting.