CN110619408A - Information acquisition method, equipment and computer storage medium - Google Patents

Information acquisition method, equipment and computer storage medium Download PDF

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Publication number
CN110619408A
CN110619408A CN201810631659.5A CN201810631659A CN110619408A CN 110619408 A CN110619408 A CN 110619408A CN 201810631659 A CN201810631659 A CN 201810631659A CN 110619408 A CN110619408 A CN 110619408A
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data
service life
equipment
working parameters
parameters
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CN110619408B (en
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黄源甲
杜放
肖文渊
龙永文
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Foshan Shunde Midea Electrical Heating Appliances Manufacturing Co Ltd
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Foshan Shunde Midea Electrical Heating Appliances Manufacturing Co Ltd
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    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F18/00Pattern recognition
    • G06F18/20Analysing
    • G06F18/22Matching criteria, e.g. proximity measures
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06QINFORMATION AND COMMUNICATION TECHNOLOGY [ICT] SPECIALLY ADAPTED FOR ADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL OR SUPERVISORY PURPOSES; SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL OR SUPERVISORY PURPOSES, NOT OTHERWISE PROVIDED FOR
    • G06Q10/00Administration; Management
    • G06Q10/04Forecasting or optimisation specially adapted for administrative or management purposes, e.g. linear programming or "cutting stock problem"

Abstract

The embodiment of the invention discloses an information acquisition method, which comprises the following steps: obtaining working parameters of each period in historical operation of at least one reference device to obtain first data, and obtaining reference remaining service life corresponding to the first data; wherein the first data is used to characterize a device technology capability of the at least one reference device; the first data includes a plurality of sets of operating parameters; acquiring a group of working parameters of the equipment to be tested at the current running time to obtain second data; the second data are used for representing the technical performance of the equipment to be tested; the equipment model of the equipment to be tested is the same as that of the reference equipment; calculating the matching degree of a group of working parameters in the second data and each group of working parameters in the first data; and determining the residual service life of the equipment to be tested according to the matching degree and the reference residual service life. The embodiment of the invention also discloses information acquisition equipment and a computer storage medium.

Description

Information acquisition method, equipment and computer storage medium
Technical Field
The present invention relates to the field of computer technologies, and in particular, to an information acquisition method, an information acquisition device, and a computer storage medium.
Background
With the increasing development of scientific technology, diversified equipment provides great convenience for the life of people; although the quality of the equipment is improved through the optimization of the design and the manufacturing process; however, the device is gradually aged during a long period of operation, and the remaining service life of the device is gradually reduced.
In the prior art, the user can only manually predict the remaining service life of the device by experience, for example, the user uses the estimated total service life of the device provided by the manufacturer to subtract the used time of the device to predict the remaining service life of the device.
However, the artificial prediction method has low prediction accuracy, and cannot predict the real residual life of the equipment.
Disclosure of Invention
In view of this, embodiments of the present invention are expected to provide an information obtaining method, an information obtaining apparatus, and a computer storage medium, so as to solve the problems that, in the prior art, a manual prediction method has a low prediction accuracy and cannot predict the true remaining life of an apparatus, and improve the accuracy of predicting the remaining life of the apparatus.
In order to achieve the purpose, the technical scheme of the invention is realized as follows:
the embodiment of the invention provides an information acquisition method, which comprises the following steps:
obtaining working parameters of each period in historical operation of at least one reference device to obtain first data, and obtaining reference remaining service life corresponding to the first data; wherein the first data is used to characterize device technology performance of the at least one reference device; the first data comprises a plurality of sets of operating parameters;
acquiring a group of working parameters of the equipment to be tested at the current running time to obtain second data; the second data are used for representing the technical performance of the equipment to be tested; the equipment model of the equipment to be tested is the same as that of the reference equipment;
calculating the matching degree of a group of working parameters in the second data and each group of working parameters in the first data;
and determining the residual service life of the equipment to be tested according to the matching degree and the reference residual service life.
Optionally, the calculating the matching degree between a group of working parameters in the second data and each group of working parameters in the first data includes:
screening the working parameters of which the correlation coefficient with the reference remaining service life is greater than a preset threshold value from each group of working parameters of the first data to obtain third data;
screening working parameters with the same type as the parameters included in the third data from the second data to obtain fourth data;
and calculating the matching degree of the working parameters in the fourth data and each group of working parameters in the third data to obtain the matching degree of a group of working parameters in the second data and each group of working parameters in the first data.
Optionally, the determining, by using one reference device, the remaining service life of the device to be tested according to the matching degree and the reference remaining service life includes:
acquiring a group of working parameters in the third data corresponding to the maximum matching degree in the matching degrees to obtain target working parameters;
and acquiring the reference remaining service life corresponding to the target working parameter, and determining the reference remaining service life corresponding to the target working parameter as the remaining service life of the equipment to be tested.
Optionally, the number of the reference devices is at least two, and the obtaining of the operating parameter of each period in the historical operation of at least one reference device to obtain the first data includes:
obtaining the working parameters of each period in the historical operation of each reference device to obtain the first data;
correspondingly, the determining the remaining service life of the device to be tested according to the matching degree and the reference remaining service life includes:
respectively obtaining the maximum matching degree in the matching degrees of a group of working parameters in the second data and each group of working parameters of each reference device in the first data to obtain a target matching degree;
determining a working parameter corresponding to each matching degree in the target matching degrees to obtain a target working parameter;
determining a reference remaining service life corresponding to the target operating parameter;
and determining the residual service life of the equipment to be tested according to the target matching degree and the reference residual service life corresponding to the target working parameters.
Optionally, the determining the remaining service life of the device to be tested according to the target matching degree and the reference remaining service life corresponding to the target operating parameter includes:
setting the weight of the reference remaining service life corresponding to the target working parameter according to the target matching degree;
and determining the residual service life of the equipment to be tested according to the weight of the reference residual service life corresponding to the target working parameter and the reference residual service life corresponding to the target working parameter.
Optionally, the setting the weight of the reference remaining service life corresponding to the target operating parameter according to the target matching degree includes:
and setting the weight of the reference residual service life corresponding to the target working parameter according to the target matching degree, wherein the weight of the reference residual service life corresponding to the target working parameter is in positive correlation with each matching degree in the target matching degree.
Optionally, after determining the remaining service life of the device under test according to the matching degree and the reference remaining service life, the method further includes:
and generating and outputting prompt information for prompting the remaining service life of the equipment to be tested.
An embodiment of the present invention provides an information acquisition apparatus, including: a processor, a memory, and a communication bus;
the communication bus is used for realizing communication connection between the processor and the memory;
the processor is used for executing the program of the information acquisition method in the memory to realize the following steps:
obtaining working parameters of each period in historical operation of at least one reference device to obtain first data, and obtaining reference remaining service life corresponding to the first data; wherein the first data is used to characterize device technology performance of the at least one reference device; the first data comprises a plurality of sets of operating parameters;
acquiring a group of working parameters of the equipment to be tested at the current running time to obtain second data; the second data are used for representing the technical performance of the equipment to be tested; the equipment model of the equipment to be tested is the same as that of the reference equipment;
calculating the matching degree of a group of working parameters in the second data and each group of working parameters in the first data;
and determining the residual service life of the equipment to be tested according to the matching degree and the reference residual service life.
Optionally, when the step of calculating the matching degree between a group of working parameters in the second data and each group of working parameters in the first data is performed, the processor is further configured to execute the program of the information obtaining method, so as to implement the following steps:
screening the working parameters of which the correlation coefficient with the reference remaining service life is greater than a preset threshold value from each group of working parameters of the first data to obtain third data;
screening working parameters with the same type as the parameters included in the third data from the second data to obtain fourth data;
and calculating the matching degree of the working parameters in the fourth data and each group of working parameters in the third data to obtain the matching degree of a group of working parameters in the second data and each group of working parameters in the first data.
An embodiment of the present invention provides a computer storage medium, which stores one or more programs, where the one or more programs are executable by one or more processors to implement the steps of the information acquisition method according to the first aspect.
According to the information acquisition method, the information acquisition equipment and the computer storage medium, the working parameters of each period in the historical operation of at least one reference device are acquired to obtain first data, and the reference remaining service life corresponding to the first data is acquired; wherein the first data is used to characterize a device technology capability of the at least one reference device; the first data includes a plurality of sets of operating parameters; acquiring a group of working parameters of the equipment to be tested at the current running time to obtain second data; the second data are used for representing the technical performance of the equipment to be tested; the equipment model of the equipment to be tested is the same as that of the reference equipment; calculating the matching degree of a group of working parameters in the second data and each group of working parameters in the first data; determining the residual service life of the equipment to be tested according to the matching degree and the reference residual service life; that is to say, in the embodiment of the present invention, the working parameters of the reference device in multiple time periods are matched with the working parameters of the device to be measured in the current time period, and the remaining service life of the device to be measured is intelligently predicted according to the matching result and the reference remaining service life corresponding to the working parameters of the reference device, so that the problems that the prediction accuracy is low and the true remaining service life of the device cannot be predicted by a manual prediction method in the prior art are solved, and the accuracy of predicting the remaining service life of the device is improved.
Drawings
Fig. 1 is a schematic flowchart of an information obtaining method according to an embodiment of the present invention;
fig. 2 is a schematic flowchart of another information acquisition method according to an embodiment of the present invention;
fig. 3 is a schematic flowchart of another information obtaining method according to an embodiment of the present invention;
fig. 4 is a schematic structural diagram of an information acquisition apparatus according to an embodiment of the present invention.
Detailed Description
The technical solution in the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention.
It should be appreciated that reference throughout this specification to "an embodiment of the present invention" or "an embodiment described previously" means that a particular feature, structure or characteristic described in connection with the embodiment is included in at least one embodiment of the present invention. Thus, the appearances of the phrase "in an embodiment of the present invention" or "in the foregoing embodiments" in various places throughout the specification are not necessarily all referring to the same embodiment. Furthermore, the particular features, structures, or characteristics may be combined in any suitable manner in one or more embodiments. In various embodiments of the present invention, the sequence numbers of the above-mentioned processes do not mean the execution sequence, and the execution sequence of each process should be determined by its function and inherent logic, and should not constitute any limitation on the implementation process of the embodiments of the present invention. The above-mentioned serial numbers of the embodiments of the present invention are merely for description and do not represent the merits of the embodiments.
The present invention will be described in further detail with reference to the accompanying drawings and examples.
The embodiment of the invention provides an information acquisition method, which is applied to information acquisition equipment. Referring to fig. 1, the method includes the steps of:
step 101, obtaining working parameters of each period in historical operation of at least one reference device to obtain first data, and obtaining reference remaining service life corresponding to the first data.
Wherein the first data is used to characterize a device technology capability of the at least one reference device; the first data includes a plurality of sets of operating parameters. Here, each period may be set according to an operating frequency of a reference device, for example, the reference device may be an oven, and a user uses the oven once a day, so that the information obtaining device may analyze the historical operating parameters after obtaining the historical operating parameters of the oven, that is, the operating parameters, and obtain the daily operating parameters of the oven based on the historical operating parameters. Of course, the setting manner of each period in the embodiment of the present invention is not specifically limited, so as to implement the information obtaining method provided by the present invention.
The device technical performance of the reference device includes one or more of an operational parameter of the reference device, a structural characteristic of the reference device, a technical specification of the reference device, and a level of accuracy of the reference device. Wherein the operating parameters of the reference device may include parameters during historical operation of the reference device. When the number of reference devices is one, the first data includes a plurality of sets of operating parameters of this reference device. When the number of reference devices is plural, the first data includes plural sets of operating parameters of each of the reference devices. Each set of operating parameters may include a plurality of different parameters, for example, each set of operating parameters may include an operating mode, an operating voltage, an operating temperature, and an operating humidity of the device during historical operation of the reference device.
And 102, acquiring a group of working parameters of the equipment to be tested at the current running time to obtain second data.
The second data are used for representing the technical performance of the equipment to be tested; the equipment model of the equipment to be tested is the same as that of the reference equipment. The equipment technical performance of the equipment to be tested comprises one or more of operation parameters of the equipment to be tested, structural characteristics of the equipment to be tested, technical specifications of the equipment to be tested and precision grade of the equipment to be tested. The operating parameters of the device under test may include a set of operating parameters for the current operating time of the device under test. The set of operating parameters may be the same as the parameters included in each set of operating parameters of the reference device. For example, the set of operating parameters includes an operating mode, an operating voltage, an operating temperature, and an operating humidity of the device at the current operating time of the device under test.
Of course, in the embodiment of the present invention, the types of parameters included in each of the sets of operating parameters of the reference device and the set of operating parameters of the device under test are not specifically limited. It should be noted that each group of operating parameters in the multiple groups of operating parameters of the reference device and a group of operating parameters of the device under test both obey the same rule and distribution under the same operating environment.
In the embodiment of the invention, the information acquisition device can acquire the working parameters of each period in the historical operation of at least one reference device in a first period; the information acquisition device may acquire a set of working parameters of the current operating time of the device to be tested in a second time period, where the time length of the second time period is the same as that of the first time period, the service time period of the device to be tested corresponding to the second time period may be the same as that of the reference device corresponding to the first time period, and the service time period of the device to be tested corresponding to the second time period may be different from that of the reference device corresponding to the first time period.
For example, after acquiring the historical operating parameters of the reference device, the information acquisition device may analyze the historical operating parameters to determine that the device to be tested has been used for 5 months. Further, if the information acquisition device determines that the curve fitting degree of a first curve corresponding to month 1 to month 5 in the historical operation parameters of the reference device and a second curve corresponding to the historical operation parameters of month 5 of the device to be tested meets a preset condition, the information acquisition device may set the first time period as a time period corresponding to month 5 in the service process of the reference device, and set the second time period as a time period corresponding to month 5 of the device to be tested, and then, the information acquisition device sets each cycle, such as each day, according to the working frequency of the reference device, so that the information acquisition device may extract the working parameters of each day based on the historical operation parameters of month 5 in the service process of the reference device, obtain 31 sets of working data, and determine the 31 sets of working data as the first data; and extracting the 31 th day working parameters based on the 5 th month historical operating parameters in the service process of the equipment to be tested to obtain 1 group of working data and determine the group of working data as second data. If the information acquisition equipment judges that the reference equipment hardly runs in the 1 st to 5 th months in the historical operation parameters and the curve fitting degree of a third curve corresponding to the 5 th to 10 th months and a second curve corresponding to the 5 th month historical operation parameters of the equipment to be detected meets the preset conditions, the information acquisition equipment can set a first time period as a time period corresponding to the 10 th month in the service process of the reference equipment and set a second time period as a time period corresponding to the 5 th month of the equipment to be detected, and then the information acquisition equipment sets each period as each day according to the working frequency of the reference equipment, so that the information acquisition equipment can extract the working parameters of each day based on the 10 th month historical operation parameters in the service process of the reference equipment, obtain 31 groups of working data and determine the 31 groups of working data as the first data; and extracting the 31 th day working parameters based on the 5 th month historical operating parameters in the service process of the equipment to be tested to obtain 1 group of working data and determine the group of working data as second data.
In the embodiment of the invention, the information acquisition equipment can flexibly set the first time interval and each period based on the use frequency of the reference equipment so as to ensure that the acquired working parameters in the historical operation of the reference equipment have a larger coverage range and a higher reference value, thereby improving the information acquisition accuracy of the information acquisition equipment.
And 103, calculating the matching degree of a group of working parameters in the second data and each group of working parameters in the first data.
Here, the degree of matching between a set of operating parameters in the second data and each set of operating parameters in the first data is calculated, that is, the degree of similarity between a set of operating parameters in the second data and each set of operating parameters in the first data is calculated.
The information acquisition device may calculate the degree of similarity between a group of operating parameters in the second data and each group of operating parameters in the first data using a distance function, and the commonly used distance function may be an euclidean distance function, a variance weighted distance function, a chebyshev distance function, or the like. Preferably, in the embodiment of the present invention, a euclidean distance function may be used to calculate the similarity between a set of operating parameters in the second data and each set of operating parameters in the first data.
And step 104, determining the residual service life of the equipment to be tested according to the matching degree and the reference residual service life.
After the information acquisition device calculates the matching degree of a group of working parameters in the second data and each group of working parameters in the first data, the information acquisition device can determine the remaining service life of the device to be tested according to the matching degree and the reference remaining service life.
In the embodiment of the present invention, no matter the number of the reference devices is one or more, if the information obtaining device can select one maximum matching degree from the calculated matching degrees, the information obtaining device may determine a group of working parameters in the third data corresponding to the maximum matching degree to obtain the target working parameters, and determine the reference remaining service life corresponding to the target working parameters as the remaining service life of the device to be measured.
According to the information acquisition method provided by the embodiment of the invention, the working parameters of each period in the historical operation of at least one reference device are acquired to obtain first data, and the reference remaining service life corresponding to the first data is acquired; wherein the first data is used to characterize a device technology capability of the at least one reference device; the first data includes a plurality of sets of operating parameters; acquiring a group of working parameters of the equipment to be tested at the current running time to obtain second data; the second data are used for representing the technical performance of the equipment to be tested; the equipment model of the equipment to be tested is the same as that of the reference equipment; calculating the matching degree of a group of working parameters in the second data and each group of working parameters in the first data; determining the residual service life of the equipment to be tested according to the matching degree and the reference residual service life; that is to say, in the embodiment of the present invention, the working parameters of the reference device in multiple time periods are matched with the working parameters of the device to be measured in the current time period, and the remaining service life of the device to be measured is intelligently predicted according to the matching result and the reference remaining service life corresponding to the working parameters of the reference device, so that the problems that the prediction accuracy is low and the true remaining service life of the device cannot be predicted by a manual prediction method in the prior art are solved, and the accuracy of predicting the remaining service life of the device is improved.
Based on the foregoing embodiments, an embodiment of the present invention provides an information obtaining method, which is applied to information obtaining devices, where in the embodiment of the present invention, the number of reference devices is one, and as shown in fig. 2, the method includes the following steps:
step 201, obtaining a working parameter of each period in historical operation of a reference device to obtain first data, and obtaining a reference remaining service life corresponding to the first data.
Wherein the first data is used to characterize a device technology capability of the at least one reference device; the first data includes a plurality of sets of operating parameters.
Step 202, obtaining a group of working parameters of the equipment to be tested at the current running time to obtain second data.
The second data are used for representing the technical performance of the equipment to be tested; the equipment model of the equipment to be tested is the same as that of the reference equipment.
Step 203, screening the working parameters of which the correlation coefficient with the reference remaining service life is greater than a preset threshold value from each group of working parameters of the first data to obtain third data, and screening the working parameters of which the types are the same as those of the parameters included in the third data from the second data to obtain fourth data.
Here, after the information obtaining device obtains the first data including a plurality of sets of operating parameters from the operating parameters of each period in the historical operation of the reference device, the information obtaining device may calculate correlation coefficients between the plurality of parameters included in each set of operating parameters and the reference remaining service life, and if the correlation coefficients are greater than a preset threshold, the information obtaining device may screen the operating parameters whose correlation coefficients with the reference remaining service life are greater than the preset threshold from each set of operating parameters of the first data to obtain the third data.
For example, the reference device may be an electric cooker, and each set of operating parameters in the first data of the electric cooker may include the following parameters: temperature, humidity, scented rice, instant rice, and no pot failure. The information acquisition device calculates the correlation coefficients between the temperature, the humidity, the aromatic rice, the fast rice, and the no-pot fault and the reference remaining service life, respectively, and can obtain a correlation coefficient corresponding to the temperature of 0.815, a correlation coefficient corresponding to the humidity of 0.823, a correlation coefficient corresponding to the aromatic rice of 0.794, a correlation coefficient corresponding to the fast rice of 0.802, and a correlation coefficient corresponding to the no-pot fault of 0.912. If the preset threshold is 0.8, the information acquisition device screens temperature, humidity, fast rice and no-pot faults from each group of working parameters of the first data in the first working parameters according to the condition that the correlation coefficient is greater than the preset threshold, and obtains third data. Then, the information obtaining device filters the working parameters with the same type as the parameters included in the third data from the second data to obtain fourth data, that is, the fourth data also includes: temperature, humidity, fast meals, and no pot failure.
And 204, calculating the matching degree of the working parameters in the fourth data and each group of working parameters in the third data to obtain the matching degree of a group of working parameters in the second data and each group of working parameters in the first data.
Here, it is assumed that the third data extracted by the information acquisition apparatus includes 5 sets of operating parameters, and euclidean distances, i.e., matching degrees, between the operating parameters in the fourth data and each set of operating parameters in the third data are calculated as P1, P2, P3, P4, and P5, respectively, and P1 < P2 < P3 < P4 < P5.
And step 205, acquiring a group of working parameters in the third data corresponding to the maximum matching degree in the matching degrees to obtain target working parameters.
Here, the information acquiring apparatus determines that the maximum matching degree among P1, P2, P3, P4, and P5 is P5, and acquires a set of operating parameters in the third data corresponding to P5 to obtain target operating parameters.
And step 206, acquiring the reference remaining service life corresponding to the target working parameter, and determining the reference remaining service life corresponding to the target working parameter as the remaining service life of the device to be tested.
Here, the information acquiring apparatus acquires a set of operating parameters in the third data corresponding to P5, acquires a reference remaining service life corresponding to the target operating parameter, for example, 5 years after obtaining the target operating parameter, and then the information acquiring apparatus determines that the remaining service life of the device under test is 5 years.
And step 207, generating and outputting prompt information for prompting the remaining service life of the equipment to be tested.
The information acquisition equipment generates prompt information for prompting the remaining service life of the equipment to be tested and outputs the prompt information in a voice mode or a voice plus display mode so as to remind a user to make a decision in advance according to the remaining service life of the equipment to be tested, thereby reducing shutdown loss and ensuring the use stability of the equipment.
It should be noted that, for the descriptions of the same steps and the same contents in this embodiment as those in other embodiments, reference may be made to the descriptions in other embodiments, which are not described herein again.
Based on the foregoing embodiments, an embodiment of the present invention provides an information obtaining method, which is applied to information obtaining devices, where in the embodiment of the present invention, the number of reference devices is at least two, and as shown in fig. 3, the method includes the following steps:
step 301, obtaining a working parameter of each period in the historical operation of each reference device to obtain first data.
Wherein the first data is used to characterize a device technology capability of the at least one reference device.
Step 302, a group of working parameters of the equipment to be tested at the current operation time is obtained, and second data is obtained.
The second data are used for representing the technical performance of the equipment to be tested; the equipment model of the equipment to be tested is the same as that of the reference equipment.
Step 303, screening the working parameters of which the correlation coefficient with the reference remaining service life is greater than a preset threshold value from each group of working parameters of the first data to obtain third data, and screening the working parameters of which the types are the same as those of the working parameters included in the third data from the second data to obtain fourth data.
Here, for each reference device, the information acquisition device extracts at least two sets of target first operating parameters from the first operating parameters associated with each parameter device at preset time intervals.
And step 304, calculating the matching degree of the working parameters in the fourth data and each group of working parameters in the third data to obtain the matching degree of a group of working parameters in the second data and each group of working parameters in the first data.
And 305, respectively obtaining the maximum matching degree in the matching degrees of a group of working parameters in the second data and each group of working parameters of each reference device in the first data to obtain a target matching degree.
Here, it is assumed that the number of reference devices is 3, and the maximum matching degrees corresponding to the first reference device are P10The maximum matching degrees corresponding to the second reference equipment are respectively P20And the maximum matching degrees corresponding to the third reference devices are respectively P30
And step 306, determining the working parameters corresponding to each matching degree in the target matching degrees to obtain the target working parameters.
Here, the maximum matching degree such as P corresponding to each reference device is obtained at the information acquisition device10、P20And P30In the case of (3), determining the sum P in the third data10Corresponding to a set of operating parameters C1 and P20The corresponding target set of operating parameters is C2 and P30The corresponding set of operating parameters is C3, resulting in target operating parameters consisting of C1, C2, and C3.
And 307, determining the reference remaining service life corresponding to the target working parameter.
Here, the information acquisition apparatus determines that the reference remaining lifetime corresponding to C1 is L10The reference remaining service life corresponding to C2 is L20And a reference remaining useful life of L corresponding to C330
And 308, determining the residual service life of the equipment to be tested according to the target matching degree and the reference residual service life corresponding to the target working parameters.
Here, the information acquisition apparatus may be according to P10、L10、P20、L20、P30And L30And determining the residual service life of the equipment to be tested. For example, the information acquisition device may be from P10、P20And P30To determine the maximum degree of match, e.g. P30And is combined with P30Corresponding L30As the remaining useful life of the device under test.
In the embodiment of the invention, the information acquisition equipment can also acquire the information according to the P10、P20And P30And when the difference between every two matching degrees of the three is determined to be smaller than a preset threshold value, calculating L10、L20And L30And taking the average value as the remaining service life of the equipment to be tested.
Of course, in the embodiment of the present invention, a specific implementation manner of determining the remaining service life of the device to be tested according to the target matching degree and the reference remaining service life corresponding to the target working parameter by the information acquisition device is not specifically limited, so as to implement the information acquisition method according to the embodiment of the present invention.
In the embodiment of the present invention, preferably, step 308 may be implemented by the following steps:
and B1, setting the weight of the reference remaining service life corresponding to the target working parameters according to the target matching degree.
Here, the information acquisition device may set reference remaining service lives corresponding to the working parameters associated with different matching degrees in the matching degrees to completely different weights; the same weight can also be set for the reference remaining service life corresponding to the working parameter associated with the same matching degree in the matching degree.
Preferably, B1 can be implemented by: and setting the weight of the reference residual service life corresponding to the target working parameter according to the target matching degree, wherein the positive correlation relationship is formed between each matching degree in the target matching degrees and the weight of the reference residual service life corresponding to the target working parameter.
Here, let P be10<P20<P30Then, the information acquisition apparatus sets L10Has a weight of W1, L20Are W2 and L30W3; furthermore, W1 < W2 < W3.
And B2, determining the residual service life of the equipment to be tested according to the weight of the reference residual service life corresponding to the target working parameter and the reference residual service life corresponding to the target working parameter.
In the embodiment of the present invention, preferably, B2 may be implemented by the following steps: the information acquisition equipment calculates a weighted average value of the reference remaining service life corresponding to the target working parameter, and determines the weighted average value as the remaining service life of the equipment to be tested.
Here, the information acquisition device calculates a weighted average value L of the reference remaining service life corresponding to the target operating parameter using the following formula0
L0=W1×L10+W2×L20+W3×L30And mixing L0Remaining service life as a device under test
And 309, generating and outputting prompt information for prompting the remaining service life of the equipment to be tested.
The information acquisition equipment generates prompt information for prompting the remaining service life of the equipment to be tested and outputs the prompt information in a voice mode or a voice plus display mode so as to remind a user to make a decision in advance according to the remaining service life of the equipment to be tested, thereby reducing shutdown loss and ensuring the use stability of the equipment.
It should be noted that, for the descriptions of the same steps and the same contents in this embodiment as those in other embodiments, reference may be made to the descriptions in other embodiments, which are not described herein again.
Based on the foregoing embodiments, an embodiment of the present invention provides an information acquiring apparatus 40, which may be applied to an information acquiring method provided in the embodiments corresponding to fig. 1 to 3, and as shown in fig. 4, the information acquiring apparatus includes: a processor 41, a memory 42, and a communication bus 43, wherein:
the communication bus 43 is used for realizing communication connection between the processor 41 and the memory 42;
the processor 41 is adapted to execute the program of the information obtaining method in the memory 42 to implement the following steps:
obtaining working parameters of each period in historical operation of at least one reference device to obtain first data, and obtaining reference remaining service life corresponding to the first data; wherein the first data is used to characterize a device technology capability of the at least one reference device; the first data includes a plurality of sets of operating parameters;
acquiring a group of working parameters of the equipment to be tested at the current running time to obtain second data; the second data are used for representing the technical performance of the equipment to be tested; the equipment model of the equipment to be tested is the same as that of the reference equipment;
calculating the matching degree of a group of working parameters in the second data and each group of working parameters in the first data;
and determining the residual service life of the equipment to be tested according to the matching degree and the reference residual service life.
In other embodiments of the present invention, when the processor 41 is configured to execute the step of calculating the matching degree between the set of operating parameters in the second data and each set of operating parameters in the first data in the memory 42, the following steps may be further implemented:
screening the working parameters of which the correlation coefficient with the reference remaining service life is greater than a preset threshold value from each group of working parameters of the first data to obtain third data;
screening working parameters with the same type as the parameters included in the third data from the second data to obtain fourth data;
and calculating the matching degree of the working parameters in the fourth data and each group of working parameters in the third data to obtain the matching degree of a group of working parameters in the second data and each group of working parameters in the first data.
In other embodiments of the present invention, the number of reference devices is one; the processor 41 is configured to, when determining the remaining service life of the device under test according to the matching degree and the reference remaining service life in the memory 42, further implement the following steps:
acquiring a group of working parameters in the third data corresponding to the maximum matching degree in the matching degrees to obtain target working parameters;
and acquiring the reference remaining service life corresponding to the target working parameter, and determining the reference remaining service life corresponding to the target working parameter as the remaining service life of the equipment to be tested.
In other embodiments of the present invention, the number of reference devices is at least two; when the processor 41 is configured to execute the step of obtaining the first data by referring to the operating parameter of each cycle in the historical operation of the device in the memory 42, the following steps may be further implemented:
obtaining working parameters of each period in historical operation of at least one reference device to obtain first data;
correspondingly, determining the remaining service life of the device to be tested according to the matching degree and the reference remaining service life, comprising:
respectively obtaining the maximum matching degree in the matching degrees of a group of working parameters in the second data and each group of working parameters of each reference device in the first data to obtain a target matching degree;
determining a working parameter corresponding to each matching degree in the target matching degrees to obtain a target working parameter;
determining a reference remaining service life corresponding to the target working parameter;
and determining the residual service life of the equipment to be tested according to the target matching degree and the reference residual service life corresponding to the target working parameters.
In other embodiments of the present invention, when the processor 41 is configured to execute the step of determining the remaining service life of the device under test according to the target matching degree and the reference remaining service life corresponding to the target operating parameter in the memory 42, the following steps may be further implemented:
setting the weight of the reference remaining service life corresponding to the target working parameters according to the target matching degree;
and determining the residual service life of the equipment to be tested according to the weight of the reference residual service life corresponding to the target working parameter and the reference residual service life corresponding to the target working parameter.
In other embodiments of the present invention, when the processor 41 is configured to execute the step of setting the weight of the reference remaining service life corresponding to the target operating parameter according to the target matching degree in the memory 42, the following steps may be further implemented:
and setting the weight of the reference residual service life corresponding to the target working parameter according to the target matching degree, wherein the positive correlation relationship is formed between each matching degree in the target matching degrees and the weight of the reference residual service life corresponding to the target working parameter.
In other embodiments of the present invention, after the processor 41 is configured to execute the following steps after determining the remaining service life of the device under test according to the matching degree and the reference remaining service life in the memory 42:
and generating and outputting prompt information for prompting the residual service life of the equipment to be tested.
It should be noted that, for a specific implementation process of the steps executed by the processor in this embodiment, reference may be made to an implementation process in the information acquisition method provided in the embodiments corresponding to fig. 1 to 3, and details are not described here again.
Based on the foregoing embodiments, embodiments of the present application also provide a computer storage medium storing one or more programs, the one or more programs being executable by one or more processors to implement the steps of:
obtaining working parameters of each period in historical operation of at least one reference device to obtain first data, and obtaining reference remaining service life corresponding to the first data; wherein the first data is used to characterize a device technology capability of the at least one reference device; the first data includes a plurality of sets of operating parameters;
acquiring a group of working parameters of the equipment to be tested at the current running time to obtain second data; the second data are used for representing the technical performance of the equipment to be tested; the equipment model of the equipment to be tested is the same as that of the reference equipment;
calculating the matching degree of a group of working parameters in the second data and each group of working parameters in the first data;
and determining the residual service life of the equipment to be tested according to the matching degree and the reference residual service life.
It should be noted that, for a specific implementation process of the steps executed by the processor in this embodiment, reference may be made to an implementation process in the information acquisition method provided in the embodiments corresponding to fig. 1 to 3, and details are not described here again.
The computer storage medium may be a Memory such as a Read Only Memory (ROM), a Programmable Read Only Memory (PROM), an Erasable Programmable Read Only Memory (EPROM), an Electrically Erasable Programmable Read Only Memory (EEPROM), a magnetic Random Access Memory (FRAM), a Flash Memory (Flash Memory), a magnetic surface Memory, an optical Disc, or a Compact Disc Read-Only Memory (CD-ROM); and may be various electronic devices such as mobile phones, computers, tablet devices, personal digital assistants, etc., including one or any combination of the above-mentioned memories.
It should be noted that, in this document, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising an … …" does not exclude the presence of other like elements in a process, method, article, or apparatus that comprises the element.
The above-mentioned serial numbers of the embodiments of the present invention are merely for description and do not represent the merits of the embodiments.
Through the above description of the embodiments, those skilled in the art will clearly understand that the method of the above embodiments can be implemented by software plus a necessary general hardware platform, and certainly can also be implemented by hardware, but in many cases, the former is a better implementation manner. Based on such understanding, the technical solutions of the present invention may be embodied in the form of a software product, which is stored in a storage medium (such as ROM/RAM, magnetic disk, optical disk) and includes instructions for enabling a terminal device (such as a mobile phone, a computer, a server, an air conditioner, or a network device) to execute the method described in the embodiments of the present invention.
The present invention is described with reference to flowchart illustrations and/or block diagrams of methods, apparatus (systems), and computer program products according to embodiments of the invention. It will be understood that each flow and/or block of the flow diagrams and/or block diagrams, and combinations of flows and/or blocks in the flow diagrams and/or block diagrams, can be implemented by computer program instructions. These computer program instructions may be provided to a processor of a general purpose computer, special purpose computer, embedded processor, or other programmable data processing apparatus to produce a machine, such that the instructions, which execute via the processor of the computer or other programmable data processing apparatus, create means for implementing the functions specified in the flowchart flow or flows and/or block diagram block or blocks.
These computer program instructions may also be stored in a computer-readable memory that can direct a computer or other programmable data processing apparatus to function in a particular manner, such that the instructions stored in the computer-readable memory produce an article of manufacture including instruction means which implement the function specified in the flowchart flow or flows and/or block diagram block or blocks.
These computer program instructions may also be loaded onto a computer or other programmable data processing apparatus to cause a series of operational steps to be performed on the computer or other programmable apparatus to produce a computer implemented process such that the instructions which execute on the computer or other programmable apparatus provide steps for implementing the functions specified in the flowchart flow or flows and/or block diagram block or blocks.
The above description is only a preferred embodiment of the present invention, and not intended to limit the scope of the present invention, and all modifications of equivalent structures and equivalent processes, which are made by using the contents of the present specification and the accompanying drawings, or directly or indirectly applied to other related technical fields, are included in the scope of the present invention.

Claims (10)

1. An information acquisition method, characterized in that the method comprises:
obtaining working parameters of each period in historical operation of at least one reference device to obtain first data, and obtaining reference remaining service life corresponding to the first data; wherein the first data is used to characterize device technology performance of the at least one reference device; the first data comprises a plurality of sets of operating parameters;
acquiring a group of working parameters of the equipment to be tested at the current running time to obtain second data; the second data are used for representing the technical performance of the equipment to be tested; the equipment model of the equipment to be tested is the same as that of the reference equipment;
calculating the matching degree of a group of working parameters in the second data and each group of working parameters in the first data;
and determining the residual service life of the equipment to be tested according to the matching degree and the reference residual service life.
2. The method of claim 1, wherein said calculating a degree of match between a set of operating parameters in said second data and each set of operating parameters in said first data comprises:
screening the working parameters of which the correlation coefficient with the reference remaining service life is greater than a preset threshold value from each group of working parameters of the first data to obtain third data;
screening working parameters with the same type as the parameters included in the third data from the second data to obtain fourth data;
and calculating the matching degree of the working parameters in the fourth data and each group of working parameters in the third data to obtain the matching degree of a group of working parameters in the second data and each group of working parameters in the first data.
3. The method according to claim 2, wherein the number of the reference devices is one, and the determining the remaining service life of the device under test according to the matching degree and the reference remaining service life comprises:
acquiring a group of working parameters in the third data corresponding to the maximum matching degree in the matching degrees to obtain target working parameters;
and acquiring the reference remaining service life corresponding to the target working parameter, and determining the reference remaining service life corresponding to the target working parameter as the remaining service life of the equipment to be tested.
4. The method of claim 2, wherein the number of the reference devices is at least two, and the obtaining the operating parameters of each period of the historical operation of at least one reference device to obtain the first data comprises:
obtaining the working parameters of each period in the historical operation of each reference device to obtain the first data; each reference device corresponds to a plurality of groups of working parameters;
correspondingly, the determining the remaining service life of the device to be tested according to the matching degree and the reference remaining service life includes:
respectively obtaining the maximum matching degree in the matching degrees of a group of working parameters in the second data and each group of working parameters of each reference device in the first data to obtain a target matching degree;
determining a working parameter corresponding to each matching degree in the target matching degrees to obtain a target working parameter;
determining a reference remaining service life corresponding to the target operating parameter;
and determining the residual service life of the equipment to be tested according to the target matching degree and the reference residual service life corresponding to the target working parameters.
5. The method according to claim 4, wherein the determining the remaining service life of the device under test according to the target matching degree and the reference remaining service life corresponding to the target operating parameter comprises:
setting the weight of the reference remaining service life corresponding to the target working parameter according to the target matching degree;
and determining the residual service life of the equipment to be tested according to the weight of the reference residual service life corresponding to the target working parameter and the reference residual service life corresponding to the target working parameter.
6. The method of claim 5, wherein the setting the weight of the reference remaining service life corresponding to the target operating parameter according to the target matching degree comprises:
and setting the weight of the reference residual service life corresponding to the target working parameter according to the target matching degree, wherein the weight of the reference residual service life corresponding to the target working parameter is in positive correlation with each matching degree in the target matching degree.
7. The method according to claim 1, wherein after determining the remaining service life of the device under test according to the matching degree and the reference remaining service life, the method further comprises:
and generating and outputting prompt information for prompting the remaining service life of the equipment to be tested.
8. An information acquisition apparatus characterized by comprising: a processor, a memory, and a communication bus;
the communication bus is used for realizing communication connection between the processor and the memory;
the processor is used for executing the program of the information acquisition method in the memory to realize the following steps:
obtaining working parameters of each period in historical operation of at least one reference device to obtain first data, and obtaining reference remaining service life corresponding to the first data; wherein the first data is used to characterize device technology performance of the at least one reference device; the first data comprises a plurality of sets of operating parameters;
acquiring a group of working parameters of the equipment to be tested at the current running time to obtain second data; the second data are used for representing the technical performance of the equipment to be tested; the equipment model of the equipment to be tested is the same as that of the reference equipment;
calculating the matching degree of a group of working parameters in the second data and each group of working parameters in the first data;
and determining the residual service life of the equipment to be tested according to the matching degree and the reference residual service life.
9. The information acquisition apparatus according to claim 8, wherein the processor, when executing the step of calculating the degree of matching between a set of operating parameters in the second data and each set of operating parameters in the first data, implements the steps of:
screening the working parameters of which the correlation coefficient with the reference remaining service life is greater than a preset threshold value from each group of working parameters of the first data to obtain third data;
screening working parameters with the same type as the parameters included in the third data from the second data to obtain fourth data;
and calculating the matching degree of the working parameters in the fourth data and each group of working parameters in the third data to obtain the matching degree of a group of working parameters in the second data and each group of working parameters in the first data.
10. A computer storage medium having stored therein computer-executable instructions configured to perform the information acquisition method provided in any one of claims 1 to 7.
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