CN110596720A - Distance measuring system - Google Patents
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- CN110596720A CN110596720A CN201910766135.1A CN201910766135A CN110596720A CN 110596720 A CN110596720 A CN 110596720A CN 201910766135 A CN201910766135 A CN 201910766135A CN 110596720 A CN110596720 A CN 110596720A
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- 238000005259 measurement Methods 0.000 claims abstract description 34
- 238000003384 imaging method Methods 0.000 claims abstract description 26
- 238000012545 processing Methods 0.000 claims abstract description 19
- 241000226585 Antennaria plantaginifolia Species 0.000 claims description 15
- 230000000694 effects Effects 0.000 abstract description 9
- 238000010586 diagram Methods 0.000 description 12
- 238000012937 correction Methods 0.000 description 4
- 238000004519 manufacturing process Methods 0.000 description 4
- 238000000034 method Methods 0.000 description 4
- 230000003287 optical effect Effects 0.000 description 4
- 238000004364 calculation method Methods 0.000 description 3
- 238000013461 design Methods 0.000 description 3
- 239000004065 semiconductor Substances 0.000 description 3
- 239000000758 substrate Substances 0.000 description 3
- 238000005286 illumination Methods 0.000 description 2
- 238000004458 analytical method Methods 0.000 description 1
- 238000013459 approach Methods 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000000295 complement effect Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 229910044991 metal oxide Inorganic materials 0.000 description 1
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
- G01S17/00—Systems using the reflection or reradiation of electromagnetic waves other than radio waves, e.g. lidar systems
- G01S17/02—Systems using the reflection of electromagnetic waves other than radio waves
- G01S17/06—Systems determining position data of a target
- G01S17/08—Systems determining position data of a target for measuring distance only
- G01S17/10—Systems determining position data of a target for measuring distance only using transmission of interrupted, pulse-modulated waves
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
- G01S7/00—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
- G01S7/48—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S17/00
- G01S7/481—Constructional features, e.g. arrangements of optical elements
- G01S7/4811—Constructional features, e.g. arrangements of optical elements common to transmitter and receiver
Abstract
The present invention provides a distance measuring system, including: the transmitting module is used for transmitting the spot pattern light beam with the first distortion characteristic; the acquisition module comprises an imaging lens with a second distortion characteristic and an array pixel unit and is used for acquiring the reflected spot pattern light beam; the processing circuit is connected with the emission module and the acquisition module and used for calculating the flight time between the emitted light beam and the reflected light beam; the first distortion characteristic and the second distortion characteristic compensate for each other. The distance measurement system is provided, distortion compensation is realized on hardware, compared with the traditional scheme of realizing distortion compensation through an algorithm, the requirement on the algorithm is reduced, the distortion problem can be solved from the source, and the effect is better.
Description
Technical Field
The invention relates to the technical field of computers, in particular to a distance measuring system.
Background
The Time of flight (TOF) method calculates the distance of an object by measuring the Time of flight of a light beam in space, and is widely applied to the fields of consumer electronics, unmanned driving, AR/VR, and the like due to its advantages of high precision, large measurement range, and the like.
Distance measurement systems based on the time-of-flight principle, such as time-of-flight depth cameras, lidar and other systems, often include a light source emitting end and a receiving end, where the light source emits a light beam to a target space to provide illumination, the receiving end receives the light beam reflected back by the target, and the system calculates the distance to the object by calculating the time required for the light beam to be emitted to be reflected and received. When distance sensing is performed by using a time flight depth camera and a laser radar equal-distance measuring system, ambient light interference affects measurement accuracy, for example, when ambient light intensity is high and even submerges a light beam of a light source, especially for floodlight illumination, the light beam of the light source is difficult to distinguish, so that a large measurement error occurs.
Background light suppression can be performed by adding optical methods such as optical filters and electronic methods such as subtraction circuits (the article CMOS Sensors for Time-Resolved Active Imaging) in the prior art, however, these methods still cannot essentially eliminate or reduce measurement errors caused by ambient light interference. The point scanning approach is advantageous for improving the signal-to-noise ratio, but the measurement resolution is lower compared to flood lighting. In summary, the prior art is difficult to consider signal-to-noise ratio, measurement accuracy and measurement resolution.
Disclosure of Invention
The invention provides a distance measuring system for solving the existing problems.
In order to solve the above problems, the technical solution adopted by the present invention is as follows:
a distance measurement system comprising: the transmitting module is used for transmitting the spot pattern light beam with the first distortion characteristic; the acquisition module comprises an imaging lens with a second distortion characteristic and an array pixel unit and is used for acquiring the reflected spot pattern light beam; the processing circuit is connected with the emission module and the acquisition module and used for calculating the flight time between the emitted light beam and the reflected light beam; the first distortion characteristic and the second distortion characteristic compensate for each other.
In one embodiment of the invention, the first distortion feature is a barrel distortion feature or a pincushion distortion feature and the second distortion feature is a pincushion distortion feature or a barrel distortion feature.
In another embodiment of the present invention, the emission module comprises an array light source, a projection lens and a spatial light modulator. The arrangement of the sub light sources on the array light source is a two-dimensional arrangement pattern with a first distortion characteristic; or, the projection lens has a first distortion characteristic; or, the diffraction pattern of the spatial light modulator has a first distortion characteristic; or at least two of the sub light source arrangement on the array light source, the projection lens and the diffraction pattern of the spatial light modulator are comprehensively designed to enable the emission module to have a first distortion characteristic.
In yet another embodiment of the present invention, the emission module includes an array light source and a projection lens. The arrangement of the sub light sources on the array light source is a two-dimensional arrangement pattern with a first distortion characteristic; or, the projection lens has a first distortion characteristic; or, the arrangement of the sub-light sources on the array light source and the projection lens are comprehensively designed so that the emission module has a first distortion characteristic.
The present invention also provides a distance measuring system comprising: the emission module comprises an array light source and a projection lens and is used for emitting a spot pattern light beam; the collecting module comprises an imaging lens and an array pixel unit and is used for collecting the reflected spot pattern light beam; the processing circuit is connected with the emission module and the acquisition module and used for calculating the flight time between the emitted light beam and the reflected light beam; the sub light source arrangement on the array light source is a two-dimensional arrangement pattern with a first distortion characteristic, the projection lens is provided with a second distortion characteristic, and the first distortion characteristic and the second distortion characteristic are mutually compensated. The first distortion characteristic is a barrel distortion characteristic or a pincushion distortion characteristic, and the second distortion characteristic is a pincushion distortion characteristic or a barrel distortion characteristic.
The present invention also provides a distance measuring system including: the emission module comprises an array light source, a projection lens and a spatial light modulator and is used for emitting a spot pattern light beam; the collecting module comprises an imaging lens and an array pixel unit and is used for collecting the reflected spot pattern light beam; the processing circuit is connected with the emission module and the acquisition module and used for calculating the flight time between the emitted light beam and the reflected light beam; the arrangement of the sub light sources on the array light source and/or the diffraction pattern of the spatial light modulator is a two-dimensional arrangement pattern with a first distortion characteristic; the projection lens has a second distortion characteristic, and the first distortion characteristic and the second distortion characteristic compensate each other. The first distortion characteristic is a barrel distortion characteristic or a pincushion distortion characteristic, and the second distortion characteristic is a pincushion distortion characteristic or a barrel distortion characteristic.
The invention has the beneficial effects that: the distance measurement system is provided, distortion compensation is realized on hardware, compared with the traditional scheme of realizing distortion compensation through an algorithm, the requirement on the algorithm is reduced, the distortion problem can be solved from the source, and the effect is better.
Drawings
FIG. 1 is a schematic diagram of an array light source distance measuring system according to one embodiment of the invention.
Fig. 2 is a schematic diagram of a transmit module according to an embodiment of the invention.
Fig. 3 is a schematic diagram of a transmit module according to another embodiment of the invention.
Fig. 4 is a schematic diagram of parallax effect on imaging according to one embodiment of the present invention.
FIG. 5 is a schematic diagram of an array light source according to one embodiment of the invention.
Fig. 6 is a schematic diagram of the distortion correction principle according to an embodiment of the present invention.
Wherein 10-distance measurement system, 11-emission module, 12-collection module, 13-processing circuit, 20-object, 30-emission beam, 40-reflection beam, 111-array light source, 112-spatial light modulator, 121-array pixel unit, 122-imaging lens unit, 201-array light source, 202-projection lens, 203-diffractive optical element, 204-beam, 205-beam, 206-beam, 301-array light source, 302-projection lens, 303-beam, 304-beam, 305-beam, 121-array pixel unit, 401-imaging position, 402-imaging position, 403-pixel, 51-array light source, 511-VCSEL sub-light source, 512-VCSEL sub-light source, 61-first distortion, 62-second distortion, 63-compensated effect.
Detailed Description
In order to make the technical problems, technical solutions and advantageous effects to be solved by the embodiments of the present invention more clearly apparent, the present invention is further described in detail below with reference to the accompanying drawings and the embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the invention and are not intended to limit the invention.
It will be understood that when an element is referred to as being "secured to" or "disposed on" another element, it can be directly on the other element or be indirectly on the other element. When an element is referred to as being "connected to" another element, it can be directly connected to the other element or be indirectly connected to the other element. The connection may be for fixation or for circuit connection.
It is to be understood that the terms "length," "width," "upper," "lower," "front," "rear," "left," "right," "vertical," "horizontal," "top," "bottom," "inner," "outer," and the like are used in an orientation or positional relationship indicated in the drawings for convenience in describing the embodiments of the present invention and to simplify the description, and are not intended to indicate or imply that the referenced device or element must have a particular orientation, be constructed in a particular orientation, and be in any way limiting of the present invention.
Furthermore, the terms "first", "second" and "first" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of that feature. In the description of the embodiments of the present invention, "a plurality" means two or more unless specifically limited otherwise.
The invention provides a distance measuring system which has stronger ambient light resistance and higher resolution.
FIG. 1 is a schematic diagram of an array light source distance measuring system according to one embodiment of the invention. The distance measuring system 10 includes an emission module 11, an acquisition module 12 and a processing circuit 13, wherein the emission module 11 provides an emission beam 30 to an object 20 in a target space to illuminate the space, at least a part of the emission beam 30 is reflected by the object 20 to form a reflection beam 40, at least a part of the reflection beam 40 is acquired by the acquisition module 12, the processing circuit 13 is respectively connected with the emission module 11 and the acquisition module 12, the trigger signals of the emission module 11 and the acquisition module 12 are synchronized to calculate the time required for the emission beam to be emitted by the emission module 11 and to be received by the acquisition module 12, i.e. the flight time t between the emission beam 30 and the reflection beam 40, further, the distance D of a corresponding point on the object can be calculated by the following formula:
D＝c·t/2 (1)
where c is the speed of light.
The emitting module 11 includes an array light source 111 and a spatial light modulator 112. The array light source 111 may be an array of light sources such as Light Emitting Diodes (LEDs), Edge Emitting Lasers (EELs), Vertical Cavity Surface Emitting Lasers (VCSELs), and preferably, the array light source 111 is a VCSEL array light source chip formed by generating a plurality of VCSEL light sources on a single semiconductor substrate, and the light beam emitted by the array light source 111 may be visible light, infrared light, ultraviolet light, and the like. The array light source 111 emits a light beam outwards under the control of the processing circuit 13, for example, in an embodiment, the array light source 111 emits a pulse light beam at a certain frequency under the control of the processing circuit 13, which can be used in Direct time of flight (Direct TOF) measurement, where the frequency is set according to a measurement distance, for example, the frequency can be set to 1 MHz-100 MHz, and the measurement distance is several meters to several hundred meters; in one embodiment, the light source 111 emits a light beam whose amplitude is modulated under the control of the processing circuitry 13 to emit a continuous wave light beam, such as a square wave light beam, a sine wave light beam, or the like, which can be used in Indirect time of flight (infrared TOF) measurements. It will be appreciated that the light source 111 may be controlled to emit the associated light beam, either as part of the processing circuitry 13 or independently of sub-circuits present in the processing circuitry 13, such as a pulse signal generator.
The spatial light modulator 112 receives the carrier beam from the light source 111 and spatially modulates the carrier beam, i.e., modulates the distribution of the carrier beam in space to form a non-flood carrier beam with a non-uniform intensity distribution for emission. Compared with the traditional floodlight beam, the non-floodlight beam has uneven intensity distribution, so that the area with higher intensity distribution has higher anti-interference performance on the ambient light under the condition of the same light source power; in addition, in the case of the same projection field angle, the floodlighting needs higher power consumption due to the non-uniformity of the intensity distribution, that is, to achieve the same ambient light anti-interference performance. In some embodiments, the spatial light modulator 112 is further configured to expand the received carrier beam to expand the field of view.
The processing circuit 13 may be a stand-alone dedicated circuit, such as a dedicated SOC chip, an FPGA chip, an ASIC chip, etc., or may comprise a general-purpose processor, such as when the depth camera is integrated into a smart terminal, such as a mobile phone, a television, a computer, etc., where the processor in the terminal may be at least a part of the processing circuit 13.
The collecting module 12 comprises an array pixel unit 121 and an imaging lens unit 122, wherein the imaging lens unit 122 receives and guides at least part of the non-floodlight carrier beam reflected by the object to at least part of the array pixel unit 121. In one embodiment, the array pixel unit 121 may be a Charge Coupled Device (CCD), a Complementary Metal Oxide Semiconductor (CMOS), an Avalanche Diode (AD), a Single Photon Avalanche Diode (SPAD), etc., and the array size of the array pixel unit 121 represents the resolution of the depth camera, such as 320 × 240, etc. Generally, a readout circuit (not shown) including one or more of a signal amplifier, a time-to-digital converter (TDC), an analog-to-digital converter (ADC), and the like is further included in connection with the array pixel unit 121.
In some embodiments, the distance measurement system 10 may further include a color camera, an infrared camera, an IMU, etc., and a combination thereof may implement more rich functions, such as 3D texture modeling, infrared face recognition, SLAM, etc.
Fig. 2 is a schematic diagram of a transmit module according to an embodiment of the invention. The emission module 11 includes an array light source 201, a projection lens 202, and a Diffractive Optical Element (DOE)203, where the array light source 201 emits a pulse, square wave, or sine wave modulated light beam under power time modulation of the processing circuit 13, the light beam is collimated or focused by the projection lens 202 and then enters the DOE203, and the DOE203 spatially modulates, i.e., diffracts, the incident light beam. In one embodiment, DOE203 splits an incident beam and emits multiple beams 204, 205, and 206, such as tens of thousands of beams, into a target space, each of which forms a spot on the surface of object 20. In one embodiment, the DOE203 will form a pattern of regularly arranged spots (meaning that the angular offsets of the individual spots are evenly distributed, the regular arrangement is incident on the surface of the 3D object, and the arrangement will be reconstructed) by diffraction of the incident beam. In one embodiment, the DOE203 will form a speckle pattern by diffracting the incident light beam, i.e., the arrangement of the spots in the spot pattern has a certain randomness.
In some embodiments, the DOE203 may also be replaced by a mask plate, which includes a two-dimensional pattern for modulating the incident light beam into a non-flood light beam, so that the incident light beam can be spatially modulated by the mask plate to form a two-dimensional code pattern carrier light beam.
Fig. 3 is a schematic diagram of a transmit module according to another embodiment of the invention. The emission module 11 includes an array light source 301 and a projection lens 302, the projection lens 302 can be designed into a single-chip or multi-chip form as required, the array light source 301 emits a light beam to a target space through the projection lens 302 to emit light beams 303, 304, 305, and finally a projection pattern, i.e. a speckle pattern, is formed in accordance with the light source arrangement pattern on the array light source 301. Processing circuitry 13 performs time-sequential power modulation on array light source 301 to emit a pulsed, square wave or sine wave modulated light beam. In one embodiment, the array light source 301 is a VCSEL array light source.
Fig. 4 is a schematic diagram illustrating the influence of parallax on imaging according to another embodiment of the present invention. Fig. 4 only exemplarily shows a part of the array pixel unit 121, including 32 pixels 403 in total of 4 rows (R1, R2, R3, R4) and 8 columns (C1, C2, C3, C4, C5, C6, C7, C8). The light beam reflected by the target is imaged on the array pixel unit 121 through the imaging lens 122, and in this embodiment, assuming that a single light beam is imaged on about 4 pixels 2x2, the 4 pixels 2x2 may be referred to as macro-pixels, and the single macro-pixel corresponds to the light spot formed by the single light beam. It should be understood that "imaging" herein may refer to integrating incident light signals by a CCD or CMOS image sensor using a general photon integration function, and may also refer to counting incident light signals by a SPAD image sensor.
In the present application, as shown in fig. 1, the distance imaging system 10 has the emission module 11 and the collection module 12 disposed off-axis, and there is a certain parallax between them, so when the emission module 11 emits the light beam 30 to the target 20, when the distance of the target 20 changes, the parallax will cause the imaging position of the light beam on the array pixel unit 121 to deviate. Taking any light beam as an example for explanation, if the measurement range of the range imaging system is [ D1, D2], when the target 20 is located at the D1 position, the imaging position corresponding to the light beam is 401; when the target is located at the position D2 and the imaging position of the light beam is 402, the size of the light spot will be slightly changed in consideration of the imaging multiple. Therefore, when actual measurement is performed, it is often necessary to determine the deviation range of the good spot in advance from the measurement range to guide the distance analysis and calculation performed later by the processor.
FIG. 5 is a schematic diagram of an array light source according to one embodiment of the invention. The array light source 51 includes a semiconductor substrate and a plurality of VCSEL sub-light sources 511 and 512 disposed on the substrate. For the emission module 11 shown in fig. 2 or fig. 3, the arrangement density of the sub-light sources in the array light source 51 determines the pattern density of the light beam 30 projected by the final emission module 11, thereby further affecting the resolution of the depth calculation. However, due to factors such as manufacturing process, diameter of single sub-light source, mutual influence of multiple sub-light sources, etc., it is impossible to bring two sub-light sources 511 into infinite proximity, for example, the current spacing between two sub-light sources 511 can reach um level at the minimum.
To further increase the resolution, in the present embodiment, the array light source 51 is configured as a cross-regularly arranged array light source, that is, a first sub light source array composed of a plurality of first sub light sources 511 and a second sub light source array composed of a plurality of second sub light sources 512 are formed by crossing, and the first sub light sources 511 and the second sub light sources 512 are drawn in two different forms for illustration, without any limitation to the actual properties of the two sub light sources. Assuming that the minimum physical interval between the two light sources at the time of manufacturing is D, the distances between the two light sources closest to each other in the transverse direction and the longitudinal direction after crossing each other are x and y, respectively, and x < D, y < D, i.e. the transverse and longitudinal intervals in the cross arrangement are smaller. When the projection light beam formed by the array light source is further used for depth calculation, the resolution of the formed depth image is improved, namely, compared with a regular array light source with the distance D between the horizontal direction and the longitudinal direction, the resolution of the array light source arranged in a cross mode can be improved in the horizontal direction and the longitudinal direction.
In one embodiment, the first sub-light source array and the second sub-light source array can be independently controlled to be independently turned on or turned on all in different applications.
In addition to affecting resolution due to manufacturing physical size limitations, parallax causes imaging effects to also affect resolution to some extent. As shown in fig. 4, after the baseline between the emission module 11 and the collection module 12 and the measurement range of the distance measurement system 10 are determined, the interval of the light spot deviation value caused by the parallax is also determined, and in order to avoid that two adjacent light spots are mistakenly identified, for example, if the interval between two horizontal pixels is smaller than 8 pixels corresponding to the interval on the array pixel unit 121, the misrecognition is caused, that is, at least two light spots exist on the same interval, so that the measurement error is caused. To avoid causing false identifications, there is a minimum limit on the lateral separation of adjacent sub-light sources (determined by parallax, measurement range, etc.). The resolution can be improved in the lateral direction by the crossed light source arrangement shown in fig. 5, and in addition, the longitudinal resolution is improved under the premise of the limit of the manufacturing process due to the staggered arrangement in the lateral direction.
Fig. 6 is a schematic diagram of the distortion correction principle according to an embodiment of the present invention. In the above embodiments, the influence of system distortion is not considered, and in an actual distance measurement system, distortion, such as barrel distortion and pincushion distortion, is brought about by the projection lens and/or the imaging lens. For structured light technologies, distortion can increase the uncorrelation of structured light images and is therefore often allowed, whereas for time-of-flight distance measurements, especially for off-axis systems in this application, larger distortions are not allowed. As shown in fig. 4, if there is a large distortion, the deviation of the light spot due to parallax will not be along the horizontal direction any more, and there will also be a deviation in the vertical direction, and when the vertical deviation is too large, for example, exceeds the line interval corresponding to the macro-pixel, it will cause a large error in the measurement. In order to reduce the distortion, the present embodiment provides a principle of distortion compensation, that is, two opposite distortion characteristics are designed to achieve the compensation purpose in the distance measuring system, namely, a first (positive) distortion 61 and a second (negative) distortion 62, and the compensated effect is shown as 63, i.e., the pincushion distortion is the negative distortion if the barrel distortion is called the positive distortion.
In one embodiment, the array light source and/or the DOE and the projection lens in the emission module 11 are designed to have positive and negative distortion respectively to reduce the distortion of the projection pattern. For example, for the embodiment shown in fig. 2 and 3, if the projection lens 202 has a barrel (pillow) shape distortion, one way may be to design the arrangement of the sub-light sources on the array light source 201 as a two-dimensional arrangement pattern of the barrel (pillow) shape distortion, and the other way may be to design the diffraction pattern of the DOE203 as a two-dimensional diffraction pattern of the barrel (pillow) shape distortion. It is of course also possible to compensate for the distortion effect caused by the projection lens by simultaneously designing the arrangement of the sub-light sources on the array light source 201 and the diffraction pattern of the DOE 203. It is understood that the light source modem is a DOE here, and may be other devices having the same or similar functions, and the like in the following embodiments.
In one embodiment, the emission module 11 and the collection module 12 are respectively designed to have positive and negative distortion characteristics to reduce the distortion of the projected pattern. If the imaging lens 122 in the collection module 12 is a barrel (pillow) shaped distortion, the speckle pattern emitted by the emission module 11 is designed to be a speckle pattern with the characteristic of the barrel (pillow) shaped distortion, and the design of the barrel (pillow) shaped distortion speckle pattern can also be realized in various ways. For the transmit module embodiment shown in fig. 2: firstly, directly arranging and designing the sub-light sources on the array light source 201 into a two-dimensional arrangement pattern with pillow (barrel) shaped distortion characteristics; secondly, designing the projection lens into a pillow (barrel) shaped distortion lens; thirdly, designing the diffraction pattern of the DOE into a pillow (barrel) shaped distorted two-dimensional diffraction pattern (for the case that the emission module has the DOE); and fourthly, comprehensively designing at least two of the array light source arrangement pattern, the projection lens and the DOE diffraction pattern to project a pincushion (barrel) distorted spot pattern. For the transmit module embodiment shown in fig. 3: firstly, directly arranging and designing the sub-light sources on the array light source 301 into a two-dimensional arrangement pattern with pillow (barrel) shaped distortion characteristics; secondly, designing the projection lens into a pillow (barrel) shaped distortion lens; thirdly, array light source arrangement patterns and projection lenses are comprehensively designed to project pillow (barrel) shaped distorted spot patterns.
The distortion correction scheme shown in fig. 6 realizes distortion compensation on hardware, and compared with the traditional scheme for realizing distortion compensation through an algorithm, the distortion correction scheme not only reduces the requirement on the algorithm, but also can solve the distortion problem from the source, and has better effect.
It is understood that when the distance measuring system of the present invention is embedded in a device or hardware, corresponding structural or component changes may be made to adapt it to the needs, the nature of which still employs the distance measuring system of the present invention and therefore should be considered as the scope of the present invention.
The foregoing is a more detailed description of the invention in connection with specific preferred embodiments and it is not intended that the invention be limited to these specific details. For those skilled in the art to which the invention pertains, several equivalent substitutions or obvious modifications can be made without departing from the spirit of the invention, and all the properties or uses are considered to be within the scope of the invention.
Claims (10)
1. A distance measuring system, comprising:
the transmitting module is used for transmitting the spot pattern light beam with the first distortion characteristic;
the acquisition module comprises an imaging lens with a second distortion characteristic and an array pixel unit and is used for acquiring the reflected spot pattern light beam;
the processing circuit is connected with the emission module and the acquisition module and used for calculating the flight time between the emitted light beam and the reflected light beam;
the first distortion characteristic and the second distortion characteristic compensate for each other.
2. The distance measurement system of claim 1 wherein the first distortion characteristic is a barrel distortion characteristic or a pincushion distortion characteristic and the second distortion characteristic is a pincushion distortion characteristic or a barrel distortion characteristic.
3. The distance measurement system of claim 1 wherein said transmit module comprises an array light source, a projection lens, and a spatial light modulator.
4. The distance measurement system of claim 3 wherein the arrangement of sub-light sources on the array light source is a two-dimensional arrangement pattern having a first distortion characteristic;
or, the projection lens has a first distortion characteristic;
or, the diffraction pattern of the spatial light modulator has a first distortion characteristic;
or at least two of the sub light source arrangement on the array light source, the projection lens and the diffraction pattern of the spatial light modulator are comprehensively designed to enable the emission module to have a first distortion characteristic.
5. The distance measurement system of claim 1 wherein said transmit module comprises an array light source and a projection lens.
6. The distance measurement system of claim 5 wherein the arrangement of sub-light sources on the array light source is a two-dimensional arrangement pattern having a first distortion characteristic;
or, the projection lens has a first distortion characteristic;
or, the arrangement of the sub-light sources on the array light source and the projection lens are comprehensively designed so that the emission module has a first distortion characteristic.
7. A distance measuring system, comprising:
the emission module comprises an array light source and a projection lens and is used for emitting a spot pattern light beam;
the collecting module comprises an imaging lens and an array pixel unit and is used for collecting the reflected spot pattern light beam;
the processing circuit is connected with the emission module and the acquisition module and used for calculating the flight time between the emitted light beam and the reflected light beam;
the sub light source arrangement on the array light source is a two-dimensional arrangement pattern with a first distortion characteristic, the projection lens is provided with a second distortion characteristic, and the first distortion characteristic and the second distortion characteristic are mutually compensated.
8. The distance measurement system of claim 7 wherein the first distortion characteristic is a barrel distortion characteristic or a pincushion distortion characteristic and the second distortion characteristic is a pincushion distortion characteristic or a barrel distortion characteristic.
9. A distance measuring system, comprising:
the emission module comprises an array light source, a projection lens and a spatial light modulator and is used for emitting a spot pattern light beam;
the collecting module comprises an imaging lens and an array pixel unit and is used for collecting the reflected spot pattern light beam;
the processing circuit is connected with the emission module and the acquisition module and used for calculating the flight time between the emitted light beam and the reflected light beam;
the arrangement of the sub light sources on the array light source and/or the diffraction pattern of the spatial light modulator is a two-dimensional arrangement pattern with a first distortion characteristic; the projection lens has a second distortion characteristic, and the first distortion characteristic and the second distortion characteristic compensate each other.
10. The distance measurement system of claim 9 wherein the first distortion characteristic is a barrel distortion characteristic or a pincushion distortion characteristic and the second distortion characteristic is a pincushion distortion characteristic or a barrel distortion characteristic.
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111796295A (en) * | 2020-06-04 | 2020-10-20 | 深圳奥锐达科技有限公司 | Collector, manufacturing method of collector and distance measuring system |
| CN113009494A (en) * | 2021-02-22 | 2021-06-22 | 曜芯科技有限公司 | Depth detection device and electronic equipment |
| WO2022267836A1 (en) * | 2021-06-22 | 2022-12-29 | 嘉兴驭光光电科技有限公司 | Method for designing diffractive optical element and partitioned uniform light illumination system |
| WO2024008454A1 (en) * | 2022-07-04 | 2024-01-11 | Ams-Osram Ag | Time-of-flight camera system and distortion compensation method for a time-of-flight camera system |
Citations (22)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20020139920A1 (en) * | 1999-06-08 | 2002-10-03 | University Of Washington | Image acquisition with depth enhancement |
| US20030035100A1 (en) * | 2001-08-02 | 2003-02-20 | Jerry Dimsdale | Automated lens calibration |
| US6563101B1 (en) * | 2000-01-19 | 2003-05-13 | Barclay J. Tullis | Non-rectilinear sensor arrays for tracking an image |
| US20050063032A1 (en) * | 2001-10-25 | 2005-03-24 | Hamamatsu Photonics K.K. | Phase modulation apparatus and phase modulation method |
| US20110211044A1 (en) * | 2010-03-01 | 2011-09-01 | Primesense Ltd. | Non-Uniform Spatial Resource Allocation for Depth Mapping |
| CN102901459A (en) * | 2012-10-08 | 2013-01-30 | 中国人民解放军国防科学技术大学 | Device and method for measuring angular-second three-dimensional deformation based on collimation light path |
| KR20130101622A (en) * | 2012-02-14 | 2013-09-16 | 구대근 | Apparatus and system for 3 dimensional design using augmented reality and method for design evaluation |
| US20140016113A1 (en) * | 2012-07-13 | 2014-01-16 | Microsoft Corporation | Distance sensor using structured light |
| CN103716600A (en) * | 2012-09-28 | 2014-04-09 | 索尼公司 | Image output device, image output method, and program |
| US20150077596A1 (en) * | 2013-09-13 | 2015-03-19 | Samsung Electronics Co., Ltd. | Depth information based optical distortion correction circuit and method |
| US20160140713A1 (en) * | 2013-07-02 | 2016-05-19 | Guy Martin | System and method for imaging device modelling and calibration |
| CN105974427A (en) * | 2016-06-24 | 2016-09-28 | 上海图漾信息科技有限公司 | Structural light distance measurement device and method |
| CN106525004A (en) * | 2016-11-09 | 2017-03-22 | 人加智能机器人技术（北京）有限公司 | Binocular stereo vision system and depth measuring method |
| US20170089690A1 (en) * | 2015-09-25 | 2017-03-30 | Intel Corporation | Projector distortion compensation in structured light depth reconstruction |
| CN107850662A (en) * | 2015-12-23 | 2018-03-27 | 华为技术有限公司 | Antenna system and method for transmitting signals |
| US20180101938A1 (en) * | 2016-10-11 | 2018-04-12 | Samsung Electronics Co., Ltd. | Method, device, and recording medium for processing image |
| CN108492515A (en) * | 2004-11-12 | 2018-09-04 | 爱克斯崔里斯科技有限公司 | Particle detector, System and method for |
| CN108803006A (en) * | 2017-09-18 | 2018-11-13 | 成都理想境界科技有限公司 | Optical fiber scanning imaging system, equipment and its Distortion Detect and correction system |
| CN208351151U (en) * | 2018-06-13 | 2019-01-08 | 深圳奥比中光科技有限公司 | Projective module group, depth camera and electronic equipment |
| CN109343070A (en) * | 2018-11-21 | 2019-02-15 | 深圳奥比中光科技有限公司 | Time flight depth camera |
| US20190079192A1 (en) * | 2017-09-08 | 2019-03-14 | Microsoft Technology Licensing, Llc | Time-of-flight augmented structured light range-sensor |
| CN109862275A (en) * | 2019-03-28 | 2019-06-07 | Oppo广东移动通信有限公司 | Electronic equipment and mobile platform |
-
2019
- 2019-08-19 CN CN201910766135.1A patent/CN110596720A/en active Pending
Patent Citations (22)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20020139920A1 (en) * | 1999-06-08 | 2002-10-03 | University Of Washington | Image acquisition with depth enhancement |
| US6563101B1 (en) * | 2000-01-19 | 2003-05-13 | Barclay J. Tullis | Non-rectilinear sensor arrays for tracking an image |
| US20030035100A1 (en) * | 2001-08-02 | 2003-02-20 | Jerry Dimsdale | Automated lens calibration |
| US20050063032A1 (en) * | 2001-10-25 | 2005-03-24 | Hamamatsu Photonics K.K. | Phase modulation apparatus and phase modulation method |
| CN108492515A (en) * | 2004-11-12 | 2018-09-04 | 爱克斯崔里斯科技有限公司 | Particle detector, System and method for |
| US20110211044A1 (en) * | 2010-03-01 | 2011-09-01 | Primesense Ltd. | Non-Uniform Spatial Resource Allocation for Depth Mapping |
| KR20130101622A (en) * | 2012-02-14 | 2013-09-16 | 구대근 | Apparatus and system for 3 dimensional design using augmented reality and method for design evaluation |
| US20140016113A1 (en) * | 2012-07-13 | 2014-01-16 | Microsoft Corporation | Distance sensor using structured light |
| CN103716600A (en) * | 2012-09-28 | 2014-04-09 | 索尼公司 | Image output device, image output method, and program |
| CN102901459A (en) * | 2012-10-08 | 2013-01-30 | 中国人民解放军国防科学技术大学 | Device and method for measuring angular-second three-dimensional deformation based on collimation light path |
| US20160140713A1 (en) * | 2013-07-02 | 2016-05-19 | Guy Martin | System and method for imaging device modelling and calibration |
| US20150077596A1 (en) * | 2013-09-13 | 2015-03-19 | Samsung Electronics Co., Ltd. | Depth information based optical distortion correction circuit and method |
| US20170089690A1 (en) * | 2015-09-25 | 2017-03-30 | Intel Corporation | Projector distortion compensation in structured light depth reconstruction |
| CN107850662A (en) * | 2015-12-23 | 2018-03-27 | 华为技术有限公司 | Antenna system and method for transmitting signals |
| CN105974427A (en) * | 2016-06-24 | 2016-09-28 | 上海图漾信息科技有限公司 | Structural light distance measurement device and method |
| US20180101938A1 (en) * | 2016-10-11 | 2018-04-12 | Samsung Electronics Co., Ltd. | Method, device, and recording medium for processing image |
| CN106525004A (en) * | 2016-11-09 | 2017-03-22 | 人加智能机器人技术（北京）有限公司 | Binocular stereo vision system and depth measuring method |
| US20190079192A1 (en) * | 2017-09-08 | 2019-03-14 | Microsoft Technology Licensing, Llc | Time-of-flight augmented structured light range-sensor |
| CN108803006A (en) * | 2017-09-18 | 2018-11-13 | 成都理想境界科技有限公司 | Optical fiber scanning imaging system, equipment and its Distortion Detect and correction system |
| CN208351151U (en) * | 2018-06-13 | 2019-01-08 | 深圳奥比中光科技有限公司 | Projective module group, depth camera and electronic equipment |
| CN109343070A (en) * | 2018-11-21 | 2019-02-15 | 深圳奥比中光科技有限公司 | Time flight depth camera |
| CN109862275A (en) * | 2019-03-28 | 2019-06-07 | Oppo广东移动通信有限公司 | Electronic equipment and mobile platform |
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111796295A (en) * | 2020-06-04 | 2020-10-20 | 深圳奥锐达科技有限公司 | Collector, manufacturing method of collector and distance measuring system |
| CN111796295B (en) * | 2020-06-04 | 2023-12-12 | 深圳奥锐达科技有限公司 | Collector, manufacturing method of collector and distance measuring system |
| CN113009494A (en) * | 2021-02-22 | 2021-06-22 | 曜芯科技有限公司 | Depth detection device and electronic equipment |
| EP4047386A1 (en) * | 2021-02-22 | 2022-08-24 | Dixtech Innovation Pte. Ltd. | Depth detection apparatus and electronic device |
| WO2022267836A1 (en) * | 2021-06-22 | 2022-12-29 | 嘉兴驭光光电科技有限公司 | Method for designing diffractive optical element and partitioned uniform light illumination system |
| WO2024008454A1 (en) * | 2022-07-04 | 2024-01-11 | Ams-Osram Ag | Time-of-flight camera system and distortion compensation method for a time-of-flight camera system |
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