CN110586206A - Miniature high low temperature test box - Google Patents

Miniature high low temperature test box Download PDF

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Publication number
CN110586206A
CN110586206A CN201810912401.2A CN201810912401A CN110586206A CN 110586206 A CN110586206 A CN 110586206A CN 201810912401 A CN201810912401 A CN 201810912401A CN 110586206 A CN110586206 A CN 110586206A
Authority
CN
China
Prior art keywords
box
low temperature
temperature test
miniature high
box body
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN201810912401.2A
Other languages
Chinese (zh)
Inventor
刘仕技
赖剑勇
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
GUANGZHOU ETOMA ENVIRONMENT INSTRUMENT CO Ltd
Original Assignee
GUANGZHOU ETOMA ENVIRONMENT INSTRUMENT CO Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by GUANGZHOU ETOMA ENVIRONMENT INSTRUMENT CO Ltd filed Critical GUANGZHOU ETOMA ENVIRONMENT INSTRUMENT CO Ltd
Priority to CN201810912401.2A priority Critical patent/CN110586206A/en
Publication of CN110586206A publication Critical patent/CN110586206A/en
Pending legal-status Critical Current

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Classifications

    • BPERFORMING OPERATIONS; TRANSPORTING
    • B01PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
    • B01LCHEMICAL OR PHYSICAL LABORATORY APPARATUS FOR GENERAL USE
    • B01L1/00Enclosures; Chambers
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B01PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
    • B01LCHEMICAL OR PHYSICAL LABORATORY APPARATUS FOR GENERAL USE
    • B01L1/00Enclosures; Chambers
    • B01L1/02Air-pressure chambers; Air-locks therefor
    • B01L1/025Environmental chambers
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B01PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
    • B01LCHEMICAL OR PHYSICAL LABORATORY APPARATUS FOR GENERAL USE
    • B01L7/00Heating or cooling apparatus; Heat insulating devices

Abstract

The invention discloses a miniature high-low temperature test box which comprises a base and a box body, wherein a motor is arranged in the base, the box body is fixed above the base, a connecting rod is arranged at the output end of the motor, the connecting rod penetrates through the box body to be connected with stirring blades, two sides of the bottom in the box body are respectively provided with a refrigerating unit, the inner wall of the periphery of the box body is embedded with a heating unit, a sample rack is arranged in the box body, a box door is arranged above the box body, and a handle is arranged above the box door. The invention adopts the semiconductor refrigeration piece for refrigeration, has the volume of less than 30 liters, small volume, light weight, convenient movement, portability, suitability for vehicle-mounted use, extremely low noise and no pollution.

Description

Miniature high low temperature test box
Technical Field
The invention relates to the technical field of test boxes, in particular to a mini high-low temperature test box.
Background
The high-low temperature test box is a reliability test device suitable for high temperature and low temperature of industrial products. The performance indexes of parts and materials of related products such as electronics, electricians, automobiles, motorcycles, aerospace, ships, weapons, universities, research institutions and the like are tested under the condition of high temperature and low temperature (alternating) cyclic change.
At present, the volume of a high-low temperature test box in the market is over 60 liters generally, and the high-low temperature test box is large in size, heavy in weight and inconvenient to move, carry and carry on a vehicle. In addition, the use of compressors and freon refrigerants tends to produce loud noises and cause environmental pollution.
Disclosure of Invention
The invention aims to overcome the defects of the prior art, and provides a miniature high-low temperature test box which is small in size, light in weight and convenient to move.
Preferably, the refrigeration unit is a semiconductor refrigeration piece.
Preferably, the heating unit is a heating belt.
Preferably, the door has a convex structure, and the lower part and the upper part of the door are large.
Preferably, a circle of sealing rubber strips is arranged below the box door.
Preferably, the motor is a brushless dc motor.
The sealing rubber strip is a hollow rubber strip made of silica gel material
The invention has the beneficial effects that:
1. the invention adopts the semiconductor refrigeration piece for refrigeration, has simple structure, convenient operation, no moving part, safety, reliability, small volume, light weight, convenient movement, portability, suitability for vehicle-mounted use, extremely low noise and no refrigerant pollution.
2. The hollow rubber strip made of the silica gel material enables the box door to have higher mechanical strength, long service life, good thermal stability and high and low temperature resistance, can be used in a wide temperature range (-70 ℃ -300 ℃), has little change with temperature regardless of chemical properties or physical and mechanical properties, and has good sealing performance.
Drawings
The invention will now be described, by way of example, with reference to the accompanying drawings, in which:
FIG. 1 is a schematic view of the overall structure of the present invention;
FIG. 2 is a schematic view of the door of the present invention;
fig. 3 is a schematic structural view of a sample holder according to the present invention.
In the figure: 1. a handle; 2. a box door; 3. a box body; 4. a sample holder; 5. a stirring fan blade; 6. a refrigeration unit; 7. a connecting rod; 8. a motor; 9. a base; 10. a heating unit; 11. and sealing rubber strips.
Detailed Description
Any feature disclosed in this specification may be replaced by alternative features serving equivalent or similar purposes, unless expressly stated otherwise. That is, unless expressly stated otherwise, each feature is only an example of a generic series of equivalent or similar features.
As shown in fig. 1-3, a miniature high-low temperature test chamber comprises a base 9 and a chamber 3, a motor 8 is installed inside the base 9, the motor 8 is a brushless dc motor, the motor has small volume, light weight, large output force, vibration resistance, low noise, small vibration, smooth operation and long service life, the chamber 3 is fixed above the base 9, a connecting rod 7 is installed at the output end of the motor 8, the connecting rod 7 passes through the chamber 3 to be connected with a stirring fan blade 5, the refrigerating units 6 are respectively installed at two sides of the bottom inside the chamber 3, the refrigerating units 6 are semiconductor refrigerating sheets which are special cold sources, do not need any refrigerant, can continuously work, have no pollution source and rotating component, do not generate a rotation effect, do not have sliding component, do not have vibration, noise and long service life when working, are easy to install, and a heating unit 10 is embedded in the peripheral inner wall of the chamber 3, the heating unit 10 is a heating belt, the heating belt mainly comprises an electric heating material, an insulating material and the like, the electric heating material is a nichrome belt, the heating speed is high, the heat efficiency is high, the service life is long, the insulating material is multilayer alkali-free glass fiber and has good temperature resistance and reliable insulating property, a sample rack 4 is arranged inside the box body 3, a box door 2 is arranged above the box body 3, the box door 2 is of a convex structure, the lower part and the upper part of the box door are large, a circle of sealing rubber strip 11 is arranged below the box door 2, and the sealing rubber strip 11 is a hollow rubber strip made of silica gel materials, so that the box door has high mechanical strength, long service life, good thermal stability and high and low temperature resistance, and can be used within a wide temperature range of-70 ℃ to 300 ℃. The sealing rubber strip 11 with good sealing performance is a hollow rubber strip made of silica gel materials, and a handle 1 is arranged above the box door 2.
The working principle of the specific embodiment is as follows: when doing the high temperature test, the power disconnection of refrigerating unit 6, heating unit 10's switch-on, the heating tape generates heat and gives the air heating in the box, and simultaneously, the motor operation, thereby drive stirring fan blade 5 and rotate, stir the mixture to the air in the box, make sample frame 4 on the sample ambient air temperature rise rapidly, until accomplishing the experiment, when doing the low temperature test, refrigerating unit 6's switch-on, heating unit 10's switch-on, semiconductor refrigeration piece refrigerates the air in the box, and simultaneously, the motor operation, thereby drive stirring fan blade 5 and rotate, stir the mixture to the air in the box, make sample frame on the sample ambient air temperature descend rapidly, until accomplishing the experiment.
The invention is not limited to the foregoing embodiments. The invention extends to any novel feature or any novel combination of features disclosed in this specification and any novel method or process steps or any novel combination of features disclosed.

Claims (7)

1. The utility model provides a miniature high low temperature test box, includes base (9) and box (3), its characterized in that: base (9) internally mounted has motor (8), base (9) top is fixed with box (3), connecting rod (7) are installed to the output of motor (8), connecting rod (7) pass box (3) and are connected with stirring fan blade (5), refrigeration unit (6) are installed respectively to the inside bottom both sides of box (3), box (3) inner wall has inlayed heating unit (10) all around, box (3) internally mounted has sample frame (4), box (3) top is provided with chamber door (2), handle (1) is installed to chamber door (2) top.
2. The miniature high and low temperature test chamber of claim 1, wherein: the refrigerating unit (6) is a semiconductor refrigerating sheet.
3. The miniature high and low temperature test chamber of claim 1, wherein: the heating unit (10) is a heating belt.
4. The miniature high and low temperature test chamber of claim 1, wherein: the box door (2) is of a convex structure, and the lower part and the upper part of the box door are large.
5. The miniature high and low temperature test chamber of claim 1, wherein: and a circle of sealing rubber strip (11) is arranged below the box door (2).
6. The miniature high and low temperature test chamber of claim 1, wherein: the motor (8) is a brushless direct current motor.
7. The miniature high and low temperature test chamber of claim 5, wherein: the sealing rubber strip (11) is a hollow rubber strip made of a silica gel material.
CN201810912401.2A 2018-08-11 2018-08-11 Miniature high low temperature test box Pending CN110586206A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201810912401.2A CN110586206A (en) 2018-08-11 2018-08-11 Miniature high low temperature test box

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201810912401.2A CN110586206A (en) 2018-08-11 2018-08-11 Miniature high low temperature test box

Publications (1)

Publication Number Publication Date
CN110586206A true CN110586206A (en) 2019-12-20

Family

ID=68849619

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201810912401.2A Pending CN110586206A (en) 2018-08-11 2018-08-11 Miniature high low temperature test box

Country Status (1)

Country Link
CN (1) CN110586206A (en)

Citations (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07270303A (en) * 1994-04-01 1995-10-20 Katoo:Kk Environment tester
JP2001174381A (en) * 1999-12-15 2001-06-29 Hitachi Ltd Low/high temperature room type thermal shock testing device and its operating method
CN203155236U (en) * 2013-01-21 2013-08-28 中国检验检疫科学研究院 Portable precision incubator
CN103353564A (en) * 2013-07-08 2013-10-16 工业和信息化部电子第五研究所 Intermittent life testing device
CN203745286U (en) * 2014-03-14 2014-07-30 江苏省特种设备安全监督检验研究院 Environmental box device of material testing machine for mechanical property test
CN203759560U (en) * 2014-04-02 2014-08-06 东莞市万洋环境科技有限公司 Quick temperature variation test chamber
CN204074091U (en) * 2014-07-04 2015-01-07 宁波艾德生仪器有限公司 The comprehensive testing chamber for medicine stability of semiconductor refrigerating
CN105562133A (en) * 2014-10-16 2016-05-11 广西师范大学 Constant temperature device of air bath
CN105705890A (en) * 2013-10-17 2016-06-22 德尔塔轨迹股份有限公司 A portable temperature controlled container
CN205550308U (en) * 2016-04-27 2016-09-07 东莞市巨亚检测仪器设备有限公司 High temperature and low temperature alternation proof box
CN206404797U (en) * 2017-01-09 2017-08-15 成都中电科检测技术有限公司 A kind of high low temperature cycles test case for being easy to place sample
CN107092286A (en) * 2017-06-23 2017-08-25 无锡职业技术学院 A kind of intelligent micro semiconductor high low incubator
CN207324848U (en) * 2017-10-10 2018-05-08 中山德盛塑料有限公司 A kind of high low temperature cycles test case
CN207694819U (en) * 2017-12-13 2018-08-07 深圳市瑞智电力股份有限公司 A kind of high and low temperature alternating humidity test chamber

Patent Citations (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07270303A (en) * 1994-04-01 1995-10-20 Katoo:Kk Environment tester
JP2001174381A (en) * 1999-12-15 2001-06-29 Hitachi Ltd Low/high temperature room type thermal shock testing device and its operating method
CN203155236U (en) * 2013-01-21 2013-08-28 中国检验检疫科学研究院 Portable precision incubator
CN103353564A (en) * 2013-07-08 2013-10-16 工业和信息化部电子第五研究所 Intermittent life testing device
CN105705890A (en) * 2013-10-17 2016-06-22 德尔塔轨迹股份有限公司 A portable temperature controlled container
CN203745286U (en) * 2014-03-14 2014-07-30 江苏省特种设备安全监督检验研究院 Environmental box device of material testing machine for mechanical property test
CN203759560U (en) * 2014-04-02 2014-08-06 东莞市万洋环境科技有限公司 Quick temperature variation test chamber
CN204074091U (en) * 2014-07-04 2015-01-07 宁波艾德生仪器有限公司 The comprehensive testing chamber for medicine stability of semiconductor refrigerating
CN105562133A (en) * 2014-10-16 2016-05-11 广西师范大学 Constant temperature device of air bath
CN205550308U (en) * 2016-04-27 2016-09-07 东莞市巨亚检测仪器设备有限公司 High temperature and low temperature alternation proof box
CN206404797U (en) * 2017-01-09 2017-08-15 成都中电科检测技术有限公司 A kind of high low temperature cycles test case for being easy to place sample
CN107092286A (en) * 2017-06-23 2017-08-25 无锡职业技术学院 A kind of intelligent micro semiconductor high low incubator
CN207324848U (en) * 2017-10-10 2018-05-08 中山德盛塑料有限公司 A kind of high low temperature cycles test case
CN207694819U (en) * 2017-12-13 2018-08-07 深圳市瑞智电力股份有限公司 A kind of high and low temperature alternating humidity test chamber

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
冯利等: "基于半导体制冷技术的高低温试验箱设计", 《机械与电子》 *
王太峰等: "一种新型便携式制冷保温容器的试验研究", 《制冷与空调》 *

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Application publication date: 20191220

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