CN110557092A - Irradiance compensation method for photoelectric performance test of solar cell - Google Patents
Irradiance compensation method for photoelectric performance test of solar cell Download PDFInfo
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- CN110557092A CN110557092A CN201910843722.6A CN201910843722A CN110557092A CN 110557092 A CN110557092 A CN 110557092A CN 201910843722 A CN201910843722 A CN 201910843722A CN 110557092 A CN110557092 A CN 110557092A
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- 238000011056 performance test Methods 0.000 title claims abstract description 31
- 239000000523 sample Substances 0.000 claims abstract description 73
- 238000012360 testing method Methods 0.000 claims description 24
- 238000005259 measurement Methods 0.000 description 17
- 239000004020 conductor Substances 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
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- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02S—GENERATION OF ELECTRIC POWER BY CONVERSION OF INFRARED RADIATION, VISIBLE LIGHT OR ULTRAVIOLET LIGHT, e.g. USING PHOTOVOLTAIC [PV] MODULES
- H02S50/00—Monitoring or testing of PV systems, e.g. load balancing or fault identification
- H02S50/10—Testing of PV devices, e.g. of PV modules or single PV cells
- H02S50/15—Testing of PV devices, e.g. of PV modules or single PV cells using optical means, e.g. using electroluminescence
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
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Abstract
The invention relates to the field of photoelectric performance test of solar cells, and provides an irradiance compensation method for photoelectric performance test of a solar cell, which comprises the following steps: arranging the probe row on a main grid line of the solar cell, and determining a first output short-circuit current value of the solar cell at the moment; sequentially removing and then resetting each probe bank and determining a current contribution value when each probe bank is removed; adjusting the irradiance of the solar cell until the second output short-circuit current value of the solar cell is the sum of the first output short-circuit current value and all current influence values; a value of irradiance is determined from the first output short circuit current value and the second output short circuit current value. The embodiment of the invention at least can realize the compensation of the shielding of the probe row on the irradiance of the light source.
Description
Technical Field
the invention relates to the field of photoelectric performance test of solar cells, in particular to an irradiance compensation method for the photoelectric performance test of the solar cells.
Background
the photoelectric performance test of the solar cell generally adopts a solar simulator as a light source, a probe station as a signal acquisition clamp, an electronic load box as a signal acquisition device and an industrial personal computer as a data storage unit. Because the thickness of the probe row of the fixture table is generally larger than the main grid line width of the solar cell, and the collimation of the light source of the solar simulator is generally poor, the probe row can shield the light beam of the solar simulator in the testing process of the solar cell, and the photoelectric performance testing result of the solar cell is inaccurate.
Disclosure of Invention
In order to overcome the defects in the prior art, the embodiment of the invention provides an irradiance compensation method for a solar cell photoelectric performance test, so as to at least compensate the shielding of a probe row on the irradiance of a light source.
according to an embodiment of the invention, an irradiance compensation method for a solar cell photoelectric performance test is provided, which includes: arranging the probe row on a main grid line of the solar cell, and determining a first output short-circuit current value of the solar cell at the moment; sequentially removing and then resetting each probe bank and determining a current contribution value when each probe bank is removed; adjusting the irradiance of the solar cell until the second output short-circuit current value of the solar cell is the sum of the first output short-circuit current value and all current influence values; a value of irradiance is determined from the first output short circuit current value and the second output short circuit current value.
according to the embodiment of the invention, the irradiance compensation method for the solar cell photoelectric performance test comprises the following steps: after determining the first output short-circuit current value, removing one of the probe rows and determining a current influence value at the time; repositioning the removed probe rows on the corresponding main grid lines; removing another probe row and determining another current contribution at that time; the above operations are repeated until all the probe banks are removed and then relocated.
According to the embodiment of the invention, the irradiance compensation method for the solar cell photoelectric performance test comprises the following steps of determining the numerical value of irradiance according to the following formula:
Wherein I sc is the second output short-circuit current value, and I sc0 is the first output short-circuit current value.
According to the embodiment of the invention, the irradiance compensation method for the solar cell photoelectric performance test comprises the following steps of determining a current influence value according to the following formula:
ΔIscn＝Iscn-Isc0；
Where Δ I scn is a current influence value, I scn is an output short-circuit current value of the solar cell determined after removal of one of the probe banks, I sc0 is a first output short-circuit current value, and n is a positive integer equal to or greater than 1.
According to the embodiment of the invention, the irradiance compensation method for the solar cell photoelectric performance test comprises the steps of starting a light source, adjusting the output power of the light source to enable the irradiance irradiated by the light source to be 1000W/m 2, adjusting the temperature of a solar cell to enable the temperature to be maintained at 25 ℃, and reading the first output short-circuit current value by using an electronic load box.
According to the embodiment of the invention, the irradiance compensation method for the solar cell photoelectric performance test comprises the following steps: after the value of the irradiance is determined, the light source is turned on and the output power of the light source is adjusted so that the irradiance irradiated by the light source is the determined value of the irradiance.
According to the embodiment of the invention, in the irradiance compensation method for the solar cell photoelectric performance test, the light source comprises a solar simulator.
according to the embodiment of the invention, the irradiance compensation method for the solar cell photoelectric performance test comprises the following steps: and placing the solar cell on a temperature control table to adjust the temperature of the solar cell through the temperature control table.
According to the embodiment of the invention, in the irradiance compensation method for the solar cell photoelectric performance test, the number of the main grid lines is at least two, and the number and the positions of the probe rows correspond to the main grid lines in a one-to-one mode.
According to the embodiment of the invention, in the irradiance compensation method for the solar cell photoelectric performance test, the number of the main grid lines is three or five.
The invention has the beneficial effects that:
in the irradiance compensation method for the solar cell photoelectric performance test, each probe bank is removed in turn and then reset, and when each probe bank is removed, a corresponding current influence value can be determined respectively. From the determined total current influence values and the previously determined first output short-circuit current value, a second output short-circuit current value may be determined by adjusting the irradiance. Furthermore, the specific numerical value of the irradiance can be determined according to the first output short-circuit current value and the second output short-circuit current value, and the shielding of the probe row on the irradiance of the light source can be compensated by applying the irradiance numerical value to the solar cell, so that the accurate measurement of the photoelectric performance of the follow-up solar cell is realized.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below, and it is obvious that the drawings in the following description are some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to these drawings without creative efforts.
Fig. 1 is a schematic structural diagram of an apparatus for performing the method of the present invention according to one embodiment of the present invention.
Fig. 2 is a schematic flow chart of an irradiance compensation method for solar cell photovoltaic performance testing according to one embodiment of the present invention.
Reference numerals:
10: a device; 12: a temperature control table; 14: a solar cell; 16: an electronic load box; 18: a computer; 20: a first probe bank; 22: a second probe bank; 24: a third probe bank; 26: a voltage measurement wire; 28: a current measuring wire; 30: a light source; 100: a method; 102. 104, 106, 108: and (4) carrying out various steps.
Detailed Description
In order to make the objects, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are some, but not all, embodiments of the present invention. All other embodiments, which can be obtained by a person skilled in the art without any inventive step based on the embodiments of the present invention, are within the scope of the present invention.
in the description of the present invention, it should be noted that, unless otherwise explicitly specified or limited, the terms "mounted," "connected," and "connected" are to be construed broadly, e.g., as meaning either a fixed connection, a removable connection, or an integral connection; can be mechanically or electrically connected; they may be connected directly or indirectly through intervening media, or they may be interconnected between two elements. The specific meanings of the above terms in the present invention can be understood in specific cases to those skilled in the art.
in addition, in the description of the present invention, unless otherwise specified, "plurality", "plural groups" means two or more, and "several", "several groups" means one or more.
Referring now to fig. 1 and 2, an irradiance compensation method for a solar cell photovoltaic performance test of the present invention will be described. It is to be understood that all steps, sequences, etc. described below are schematic, i.e. may be suitably modified or exchanged without departing from the inventive concept of the present invention.
As shown in fig. 1, a schematic structural diagram of an apparatus for performing the irradiance compensation method for the photovoltaic performance test of the solar cell according to an embodiment of the present invention is shown. The apparatus 10 may include a temperature controlled stage 12 on which a solar cell 14 to be tested is placed on the temperature controlled stage 12. The apparatus 10 may further include an electronic load box 16, the electronic load box 16 being used to perform measurements of various compensation values, which will be described below, and subsequent photovoltaic performance testing of the solar cells 14. Further, the apparatus 10 includes a computer 18 for receiving, displaying and operating the various measurements taken by the electronic load box 16.
In the embodiment shown in fig. 1, the solar cell 14 under test includes three bus bars. Accordingly, the apparatus 10 includes three probe lines, namely, a first probe line 20, a second probe line 22, and a third probe line 24. It should be understood herein that although the embodiment shown in fig. 1 is described with respect to a solar cell 14 including three bus bars, solar cells including any suitable number of bus bars may be compensated and tested using the methods described herein. That is, the embodiment shown in fig. 1 is only illustrative, and does not constitute any particular limitation to the present invention. For example, in an alternative embodiment, the number of bus bars may be at least two, and the number and positions of the probe rows may correspond one-to-one to the bus bars. In further alternative embodiments, the number of bus bars may be three or five. It will of course be appreciated that a greater number of bus bars is possible, as the case may be, and the invention is not limited thereto.
with continued reference to fig. 1, the apparatus 10 may also include a voltage measurement lead 26 and a current measurement lead 28. Wherein voltage measurement leads 26 and current measurement leads 28 are connected between the respective probe bank and the electronic load box 16 for voltage and current measurements. Specifically, the current measuring wire 28 may be used to perform the determination of the respective output short-circuit current values and current influence values as will be described below; the voltage measurement leads 26 may be used to perform subsequent photovoltaic performance testing of the solar cells 14. In the embodiment shown in FIG. 1, the voltage measurement conductors 26 are connected by V +, V-, and the current measurement conductors 28 are connected by I +, I-.
Additionally, in the embodiment shown in FIG. 1, the apparatus 10 is also shown to include a light source 30. In one embodiment of the invention, the light source 30 may be, for example, a solar simulator.
During photovoltaic performance testing of solar cells 14 using apparatus 10, the output power of light source 30 needs to be adjusted so that the irradiance within the test plane of solar cells 14 is the standard test irradiance, i.e., 1000W/m 2. additionally, solar cells 14 need to be placed on thermal block 12 and the temperature of thermal block 12 adjusted so that the temperature of solar cells 14 is maintained at the standard test temperature, i.e., 25 ℃.
That is, although the irradiance of the light source 30 is adjusted to 1000W/m 2, the occlusion of the probe bank when the light source 30 is illuminating results in the irradiance actually reaching the test surface being below the values described above.
based on the above, the irradiance compensation method for the photoelectric performance test of the solar cell provided by the invention can effectively solve the problems, realize the compensation of the shielding of the probe row on the irradiance of the light source, and further realize the accurate measurement of the photoelectric performance of the subsequent solar cell. And as will be seen from the following description, the compensation method of the present invention can be implemented on the above-mentioned device together with the subsequent photoelectric performance testing method, so that the method of the present invention does not increase the testing cost, and the device can have multiple functions.
referring now to fig. 1 in conjunction with fig. 2, in one embodiment of the present invention, a method 100 for irradiance compensation for solar cell photovoltaic performance testing is provided, the method 100 may include the steps of:
at step 102, a row of probes is placed on the busbar of the solar cell 14 and a first output short circuit current value for the solar cell 14 at that time is determined.
Next, at step 104, each probe rank is removed and then reset in turn, and the current contribution is determined separately as each probe rank is removed. According to one embodiment, during a specific application, after determining the first output short-circuit current value, one of the probe rows may first be removed and the current contribution value at that time determined. Then, the removed probe rows are relocated on the bus bars corresponding thereto. Next, another probe row is removed and another current influence value at this time is determined. The above operation is then repeated until all of the probe banks have been removed and subsequently relocated.
in other words, in the embodiment according to the above, only one of the probe lines is removed at each removal, and then the determination process of the current influence value is performed. After the determination is completed, the removed row of probes is replaced on the main gate line, and then another row of probes is removed and the above operation is repeated. That is, the simultaneous removal of two or more probe lines does not occur in the above-described process, and the probe line subjected to the removing operation is not repeatedly removed and reset.
Continuing next as shown in fig. 2, at step 106, the irradiance of the solar cell is adjusted until the second output short circuit current value of the solar cell is equal to the sum of the first output short circuit current value and all current contribution values.
Then, at step 108, a value of irradiance is determined from the first output short circuit current value and the second output short circuit current value. That is, the numerical value of irradiance obtained at this time means: and under the condition that the shielding condition of the probe row is considered and the irradiance actually reaching the test surface is ensured to be the standard test irradiance, the irradiance actually sent by the light source is required. In other words, the irradiance that the light source should actually emit is greater than the standard test irradiance, so that it can be ensured that the irradiance that actually reaches the test surface is the standard test irradiance. In this way, the effect of irradiance compensation of the present invention is achieved.
Next, in one embodiment of the invention, after determining the value of irradiance, the light source may be turned on and the output power of the light source may be adjusted so that the light source irradiates the irradiance at the determined value of irradiance (i.e., the irradiance that should actually be delivered) as described above. Then, when subsequent photoelectric performance tests are carried out, the test inaccuracy caused by the shielding of the probe row can be ensured not to occur.
In particular embodiments, the value of the irradiance described above may be determined according to the following equation:
Wherein I sc is the second output short-circuit current value, and I sc0 is the first output short-circuit current value.
And according to an embodiment of the invention, the current impact value may be further determined according to the following formula:
ΔIscn＝Iscn-Isc0；
Where Δ I scn is a current influence value, I scn is an output short-circuit current value of the solar cell determined after removal of one of the probe banks, I sc0 is a first output short-circuit current value, and n is a positive integer equal to or greater than 1.
The formula described above and the corresponding measuring method will be described in more detail below with reference to examples.
Further, in one embodiment of the present invention, in determining the first output short circuit current value, the light source may be turned on and the output power of the light source adjusted such that the irradiance of the light source is 1000W/m 2 (at which point the irradiance actually reaching the test surface is less than the standard test irradiance). then the temperature of the solar cell is adjusted such that the temperature is maintained at 25 deg.C.
Referring again to fig. 1, the compensation method of the present invention will be schematically described below by way of example in which the solar cell 14 includes three busbar lines and the apparatus 10 includes three banks of probes (i.e., a first bank of probes 20, a second bank of probes 22, and a third bank of probes 24). It should be understood that the method steps described below may be applied to embodiments with different numbers of bus bars and probe rows, i.e., the following description is only an example and does not constitute any limitation to the invention.
Firstly, a user turns on a solar simulator serving as a light source 30, adjusts the output power of the solar simulator so that the irradiance is 1000W/m 2, then places the solar cell 14 on the temperature control table 12, adjusts the temperature of the temperature control table 12 so that the temperature of the solar cell 14 is maintained at 25 ℃, next, places the first probe bank 20, the second probe bank 22 and the third probe bank 24 on three main grid lines of the solar cell 14 respectively, and measures the output short-circuit current value I sc0 of the solar cell 14 at the moment by using the electronic load box 16 as a first output short-circuit current value.
Then, the first probe bank 20 is removed, and the output short-circuit current value I sc1 of the solar cell 14 at this time is measured by the electronic load box 16, so that the influence value Δ I sc1 of the solar cell short-circuit current measurement due to the shielding of the light source irradiance by the first probe bank 20 is I sc1 -I sc0.
Next, the first probe bank 20 is replaced on the primary grid of the solar cell 14 and the second probe bank 22 is removed, and the output short-circuit current value I sc2 of the solar cell 14 at that time is measured by the electronic load box 16, so as to obtain the influence value Δ I sc2 — I sc2 -I sc0 of the measurement of the solar cell short-circuit current due to the shielding of the light source irradiance by the second probe bank 22.
At this time, the second probe bank 22 is replaced on the original main grid of the solar cell 14, the third probe bank 24 is removed, the output short-circuit current value I sc3 of the solar cell 14 at this time is measured by using the electronic load box 16, and the influence value Δ I sc3 of the solar cell short-circuit current measurement caused by the shielding of the light source irradiance by the third probe bank 24 is obtained as I sc3 -I sc0.
then, the third probe bank 24 is replaced on the original main grid of the solar cell 14, and the irradiance of the solar simulator is adjusted until the short-circuit current output value of the solar cell 14 is I sc ═ I sc0 + Δ I sc1 + Δ I sc2 + Δ I sc3, at which time the short-circuit current output value I sc is used as the second output short-circuit current value, so that the value of the irradiance which the light source should actually emit is determined according to the above first output short-circuit current value I sc0 and the second output short-circuit current value I sc as follows:
Therefore, the shielding of the probe row to the irradiance of the light source can be compensated according to the actual irradiance value, and the accurate measurement of the photoelectric performance of the follow-up solar cell can be further realized.
The above-described embodiments of the apparatus are merely illustrative, and the units described as separate parts may or may not be physically separate, and parts displayed as units may or may not be physical units, may be located in one place, or may be distributed on a plurality of network units. Some or all of the modules may be selected according to actual needs to achieve the purpose of the solution of the present embodiment. One of ordinary skill in the art can understand and implement it without inventive effort.
finally, it should be noted that: the above examples are only intended to illustrate the technical solution of the present invention, but not to limit it; although the present invention has been described in detail with reference to the foregoing embodiments, it will be understood by those of ordinary skill in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some technical features may be equivalently replaced; and such modifications or substitutions do not depart from the spirit and scope of the corresponding technical solutions of the embodiments of the present invention.
Claims (10)
1. An irradiance compensation method for a solar cell photoelectric performance test is characterized by comprising the following steps:
Arranging a probe row on a main grid line of a solar cell, and determining a first output short-circuit current value of the solar cell at the moment;
Sequentially removing and then resetting each of the probe banks and determining a current contribution value when each of the probe banks is removed;
Adjusting irradiance of the solar cell until a second output short-circuit current value of the solar cell is the sum of the first output short-circuit current value and all the current influence values;
and determining the numerical value of the irradiance according to the first output short-circuit current value and the second output short-circuit current value.
2. The irradiance compensation method for the solar cell photoelectric performance test is characterized by comprising the following steps:
After determining the first output short circuit current value, removing one of the probe banks and determining a current influence value at that time;
Repositioning the removed probe rows on the corresponding main gate lines;
Removing another probe row and determining another current contribution at that time;
The above operations are repeated until all of the probe banks have been removed and then relocated.
3. The irradiance compensation method for the solar cell photoelectric performance test is characterized by comprising the following steps:
Determining a value of the irradiance according to the following formula:
wherein I sc is the second output short-circuit current value, and I sc0 is the first output short-circuit current value.
4. The irradiance compensation method for the solar cell photoelectric performance test is characterized by comprising the following steps:
Determining the current impact value according to the following formula:
ΔIscn＝Iscn-Isc0；
Wherein Δ I scn is the current influence value, I scn is the output short-circuit current value of the solar cell determined after removal of one of the probe banks, I sc0 is the first output short-circuit current value, and n is a positive integer equal to or greater than 1.
5. The irradiance compensation method for solar cell photovoltaic performance testing as recited in claim 1, wherein determining the first output short-circuit current value comprises:
Turning on a light source and adjusting the output power of the light source so that the irradiance irradiated by the light source is 1000W/m 2;
adjusting the temperature of the solar cell to maintain the temperature at 25 ℃;
And reading the first output short-circuit current value by utilizing an electronic load box.
6. The irradiance compensation method for the solar cell photoelectric performance test is characterized by comprising the following steps:
After the value of the irradiance is determined, turning on a light source and adjusting the output power of the light source so that the irradiance irradiated by the light source is the determined value of the irradiance.
7. The irradiance compensation method for solar cell photovoltaic performance testing as recited in claim 5 or 6, wherein the light source comprises a solar simulator.
8. The irradiance compensation method for the solar cell photoelectric performance test is characterized by comprising the following steps:
and placing the solar cell on a temperature control table so as to adjust the temperature of the solar cell through the temperature control table.
9. The irradiance compensation method for the solar cell photoelectric performance test, according to claim 1, wherein the number of the main grid lines is at least two, and the number and the positions of the probe rows correspond to the main grid lines in a one-to-one manner.
10. the irradiance compensation method for the solar cell photoelectric performance test, according to claim 9, wherein the number of the main grid lines is three or five.
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