CN110554350A - Calibration method of measuring device - Google Patents
Calibration method of measuring device Download PDFInfo
- Publication number
- CN110554350A CN110554350A CN201910881135.6A CN201910881135A CN110554350A CN 110554350 A CN110554350 A CN 110554350A CN 201910881135 A CN201910881135 A CN 201910881135A CN 110554350 A CN110554350 A CN 110554350A
- Authority
- CN
- China
- Prior art keywords
- calibrated
- measuring device
- measurement
- output
- actual
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
- G01R35/02—Testing or calibrating of apparatus covered by the other groups of this subclass of auxiliary devices, e.g. of instrument transformers according to prescribed transformation ratio, phase angle, or wattage rating
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Or Calibration Of Command Recording Devices (AREA)
Abstract
The invention discloses a calibration method of a measuring device. The calibration method of the measuring device comprises the following steps: adjusting a measuring device to be calibrated to a preset state, sequentially adjusting the output value of the measuring device to be calibrated to n different output values, measuring by using a digital multimeter to obtain an actual output value of the measuring device to be calibrated after each output value is adjusted, and measuring by using a measuring end of the measuring device to be calibrated to obtain an actual measurement value of the measuring device to be calibrated; acquiring output calibration parameters of the measuring device to be calibrated according to the n output values and the n actual output values; acquiring measurement calibration parameters of the measurement device to be calibrated according to the n actual output values and the n actual measurement values; and calibrating the preset state of the measuring device to be calibrated according to the output calibration parameters and the measurement calibration parameters. The technical scheme provided by the embodiment of the invention realizes the high-efficiency, high-precision and low-cost calibration of the measuring device.
Description
Technical Field
The embodiment of the invention relates to a calibration technology of a measuring device, in particular to a calibration method of the measuring device.
Background
To ensure a high accuracy of the measurement result of the measuring device, the measuring device usually needs to be calibrated before its actual use.
The calibration of the measuring device is usually performed in two ways as follows: 1. increasing a fixed offset; 2. the output mode and the measurement mode are calibrated separately. In the above mode 1, the standard voltage is calibrated after being sampled and measured, but the resistance value of the standard resistor is related to the voltage value of the output voltage, so that after calibration under the standard voltage, the accuracy under other working voltages in actual use is still not high. In the above mode 2, a standard current voltage source output device, a standard digital measuring instrument and other different instruments and meters are required, so that the number of components is large, the cost is high, and the efficiency is low.
Disclosure of Invention
the invention provides a calibration method of a measuring device, which is used for calibrating the measuring device with high efficiency, high precision and low cost.
The embodiment of the invention provides a calibration method of a measuring device, which comprises the following steps:
Adjusting a measuring device to be calibrated to a preset state, wherein the output type of the measuring device to be calibrated in the preset state is a preset output type, and the output range is a preset output range;
adjusting the output value of the measuring device to be calibrated to n different output values in sequence, measuring to obtain an actual output value of the measuring device to be calibrated by adopting a digital multimeter after each output value is adjusted to one output value, and measuring to obtain an actual measurement value of the measuring device to be calibrated by adopting a measuring end of the measuring device to be calibrated;
acquiring output calibration parameters of the measuring device to be calibrated in the preset state according to the n output values and the n actual output values obtained by the digital multimeter;
Acquiring measurement calibration parameters of the measuring device to be calibrated in the preset state according to the n actual output values obtained by the digital multimeter and the n actual measurement values obtained by the measuring end of the measuring device to be calibrated;
Calibrating the preset state of the measuring device to be calibrated according to the output calibration parameter and the measurement calibration parameter;
Wherein n is a positive integer.
the technical scheme provided by the embodiment of the invention comprises the steps of adjusting a measuring device to be calibrated to a preset state, respectively adopting a digital multimeter and a measuring end of the measuring device to be calibrated to measure an actual output value of the measuring device to be calibrated under n different output values to obtain n actual output values and n actual measured values, obtaining an output calibration parameter and a measurement calibration parameter of the measuring device to be calibrated under the preset state based on the n output values, the n actual output values and the n actual measured values, calibrating the preset state of the measuring device to be calibrated according to the output calibration parameter and the measurement calibration parameter, realizing simultaneous calibration of an output mode and a measurement mode of the measuring device to be calibrated, realizing higher efficiency, realizing the whole measuring process only by adopting a conventional digital multimeter, having simple measuring structure and low cost, and obtaining the output calibration parameter and the measurement calibration parameter independent of resistance, the problem of measurement accuracy change caused by resistance value change of the resistor under different voltages can be solved, and the measurement accuracy is higher.
Drawings
Other features, objects and advantages of the invention will become more apparent upon reading of the detailed description of non-limiting embodiments made with reference to the following drawings:
Fig. 1 is a schematic flowchart of a calibration method for a measurement apparatus according to an embodiment of the present invention;
FIG. 2 is a flowchart illustrating a method for obtaining output calibration parameters according to an embodiment of the present invention;
fig. 3 is a flowchart illustrating a method for obtaining measurement calibration parameters according to an embodiment of the present invention.
Detailed Description
To further illustrate the technical means and effects of the present invention adopted to achieve the predetermined objects, the following detailed description will be given of specific embodiments, structures, features and effects of a calibration method of a measuring device according to the present invention with reference to the accompanying drawings and preferred embodiments.
the embodiment of the invention provides a calibration method of a measuring device, which comprises the following steps:
adjusting a measuring device to be calibrated to a preset state, wherein the output type of the measuring device to be calibrated in the preset state is a preset output type, and the output range is a preset output range;
Adjusting the output value of the measuring device to be calibrated to n different output values in sequence, measuring to obtain an actual output value of the measuring device to be calibrated by adopting a digital multimeter after each output value is adjusted to one output value, and measuring to obtain an actual measurement value of the measuring device to be calibrated by adopting a measuring end of the measuring device to be calibrated;
Acquiring output calibration parameters of the measuring device to be calibrated in the preset state according to the n output values and the n actual output values obtained by the digital multimeter;
Acquiring measurement calibration parameters of the measuring device to be calibrated in the preset state according to the n actual output values obtained by the digital multimeter and the n actual measurement values obtained by the measuring end of the measuring device to be calibrated;
Calibrating the preset state of the measuring device to be calibrated according to the output calibration parameter and the measurement calibration parameter;
wherein n is a positive integer.
The technical scheme provided by the embodiment of the invention comprises the steps of adjusting a measuring device to be calibrated to a preset state, respectively adopting a digital multimeter and a measuring end of the measuring device to be calibrated to measure an actual output value of the measuring device to be calibrated under n different output values to obtain n actual output values and n actual measured values, obtaining an output calibration parameter and a measurement calibration parameter of the measuring device to be calibrated under the preset state based on the n output values, the n actual output values and the n actual measured values, calibrating the preset state of the measuring device to be calibrated according to the output calibration parameter and the measurement calibration parameter, realizing simultaneous calibration of an output mode and a measurement mode of the measuring device to be calibrated, realizing higher efficiency, realizing the whole measuring process only by adopting a conventional digital multimeter, having simple measuring structure and low cost, and obtaining the output calibration parameter and the measurement calibration parameter independent of resistance, the problem of measurement accuracy change caused by resistance value change of the resistor under different voltages can be solved, and the measurement accuracy is higher.
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments obtained by a person of ordinary skill in the art based on the embodiments of the present invention without any creative work belong to the protection scope of the present invention.
In the following description, numerous specific details are set forth in order to provide a thorough understanding of the present invention, but the present invention may be practiced in other embodiments that depart from the specific details disclosed herein, and it will be recognized by those skilled in the art that the present invention may be practiced without these specific details.
next, the present invention is described in detail with reference to the schematic drawings, and in the detailed description of the embodiments of the present invention, the schematic drawings showing the structure of the device are not partially enlarged in general scale for convenience of description, and the schematic drawings are only examples, which should not limit the scope of the present invention. In addition, the three-dimensional dimensions of length, width and height should be included in the actual fabrication.
Fig. 1 is a schematic flowchart of a calibration method of a measurement apparatus according to an embodiment of the present invention. The calibration method of the measuring device can be suitable for calibration before the measuring device leaves a factory. As shown in fig. 1, the calibration method of the measurement apparatus may specifically include the following steps:
And 11, adjusting the measuring device to be calibrated to be in a preset state, wherein the output type of the measuring device to be calibrated in the preset state is a preset output type, and the output range is a preset output range.
Optionally, the preset output type may include a voltage or a current.
The preset output type and the preset output range are set by the operator according to actual needs, and are not specifically limited herein.
and step 12, adjusting the output value of the measuring device to be calibrated to n different output values in sequence, measuring by using a digital multimeter to obtain an actual output value of the measuring device to be calibrated after each output value is adjusted, and measuring by using a measuring end of the measuring device to be calibrated to obtain an actual measurement value of the measuring device to be calibrated, wherein n is a positive integer.
And step 13, acquiring output calibration parameters of the measuring device to be calibrated in a preset state according to the n output values and the n actual output values obtained by adopting the digital multimeter.
And step 14, acquiring measurement calibration parameters of the measurement device to be calibrated in a preset state according to the n actual output values obtained by the digital multimeter and the n actual measurement values obtained by the measurement end of the measurement device to be calibrated.
and step 15, calibrating the preset state of the measuring device to be calibrated according to the output calibration parameters and the measurement calibration parameters.
It can be understood that, in order to enable the measurement device to be calibrated to calibrate the preset state of the measurement device to be calibrated using the output calibration parameters and the measurement calibration parameters, after obtaining the output calibration parameters and the measurement calibration parameters, there is a step of inputting the output calibration parameters and the measurement calibration parameters into the measurement device to be calibrated.
according to the technical scheme provided by the embodiment, the measuring device to be calibrated is adjusted to a preset state, the actual output value of the measuring device to be calibrated is measured by respectively adopting a digital multimeter and the measuring end of the measuring device to be calibrated under n different output values to obtain n actual output values and n actual measured values, the output calibration parameter and the measurement calibration parameter of the measuring device to be calibrated under the preset state are obtained based on the n output values, the n actual output values and the n actual measured values, the preset state of the measuring device to be calibrated is calibrated according to the output calibration parameter and the measurement calibration parameter, the simultaneous calibration of the output mode and the measurement mode of the measuring device to be calibrated is realized, the efficiency is higher, the whole measuring process can be realized only by adopting a conventional digital multimeter, the measuring structure is simple, the cost is low, in addition, the acquisition of the output calibration parameter and the measurement calibration parameter is irrelevant to the resistance, the problem of measurement accuracy change caused by resistance value change of the resistor under different voltages can be solved, and the measurement accuracy is higher.
Optionally, when the device to be calibrated outputs the output value Vm, the digital multimeter measures to obtain the actual output value Sm, and the measurement end of the device to be calibrated measures to obtain the actual measurement value Mm, and fig. 2 is a schematic flow chart of the method for obtaining the output calibration parameter according to the embodiment of the present invention. As shown in fig. 2, obtaining the output calibration parameters of the measurement device to be calibrated in the preset state according to the n output values and the n actual output values obtained by using the digital multimeter may specifically include the following steps:
And step 21, removing noise points in the n alternative points (Vm, Sm).
And step 22, fitting the remaining alternative points (Vm, Sm) to obtain a target straight line y which is Kx + B, and taking K and B as output calibration parameters of the measuring device to be calibrated in a preset state.
when the value of n is large, the number of points (Vm, Sm) is large, and the plurality of points (Vm, Sm) include a majority of points distributed in the vicinity of the target straight line and a minority of points distant from the target straight line, and the minority of points distant from the target straight line is noise points. And the noise points are removed, so that the accuracy of subsequent fitting is improved.
illustratively, removing noise points from the n candidate points (Vm, Sm) includes: and removing noise points in the n alternative points (Vm, Sm) by adopting a Randac algorithm.
It should be noted that the ranac algorithm is simple and easy to implement, and the accuracy and efficiency of removing noise points are high, which is a better way to remove noise points.
optionally, fitting the remaining candidate points (Vm, Sm) to obtain the target straight line y ═ Kx + B includes: and fitting the rest alternative points (Vm, Sm) by using a least square method to obtain the target straight line y which is Kx + B.
It should be noted that the least square method is convenient, fast and easy to implement, and is a better straight line fitting mode.
fig. 3 is a flowchart illustrating a method for obtaining measurement calibration parameters according to an embodiment of the present invention. As shown in fig. 3, obtaining measurement calibration parameters of the measurement device to be calibrated in a preset state according to n actual output values obtained by using the digital multimeter and n actual measurement values obtained by using the measurement end of the measurement device to be calibrated may include the following:
And 31, removing noise points in the n alternative points (Sm, Mm).
And 32, fitting the rest alternative points (Sm, Mm) to obtain a target straight line y which is Lx + P, and taking L and P as measurement calibration parameters of the measurement device to be calibrated in a preset state.
illustratively, removing noise points from the n candidate points (Sm, Mm) includes: and removing noise points in the n alternative points (Sm, Mm) by adopting a Randac algorithm.
Optionally, fitting the remaining candidate points (Sm, Mm) to obtain the target straight line y ═ Lx + P includes: and fitting the rest alternative points (Sm, Mm) by using a least square method to obtain the target straight line y which is Lx + P.
Further, calibrating the preset state of the measurement device to be calibrated according to the output calibration parameter and the measurement calibration parameter may include: when the set output value of the measurement device to be calibrated in the preset state is X, the actual output value X 'of the measurement device to be calibrated is (X-B)/K, when the measurement device to be calibrated in the preset state measures an unknown input value, the measured direct value obtained by measurement is Y, and the actual measurement value Y' of the measurement device to be calibrated is LY + P.
it is to be noted that the foregoing is only illustrative of the preferred embodiments of the present invention and the technical principles employed. It will be understood by those skilled in the art that the present invention is not limited to the particular embodiments described herein, but is capable of various obvious modifications, rearrangements, combinations and substitutions as will now become apparent to those skilled in the art without departing from the scope of the invention. Therefore, although the present invention has been described in greater detail by the above embodiments, the present invention is not limited to the above embodiments, and may include other equivalent embodiments without departing from the spirit of the present invention, and the scope of the present invention is determined by the scope of the appended claims.
Claims (9)
1. A method of calibrating a measurement device, comprising:
adjusting a measuring device to be calibrated to a preset state, wherein the output type of the measuring device to be calibrated in the preset state is a preset output type, and the output range is a preset output range;
Adjusting the output value of the measuring device to be calibrated to n different output values in sequence, measuring to obtain an actual output value of the measuring device to be calibrated by adopting a digital multimeter after each output value is adjusted to one output value, and measuring to obtain an actual measurement value of the measuring device to be calibrated by adopting a measuring end of the measuring device to be calibrated;
Acquiring output calibration parameters of the measuring device to be calibrated in the preset state according to the n output values and the n actual output values obtained by the digital multimeter;
Acquiring measurement calibration parameters of the measuring device to be calibrated in the preset state according to the n actual output values obtained by the digital multimeter and the n actual measurement values obtained by the measuring end of the measuring device to be calibrated;
Calibrating the preset state of the measuring device to be calibrated according to the output calibration parameter and the measurement calibration parameter;
Wherein n is a positive integer.
2. the calibration method according to claim 1, wherein when the device to be calibrated outputs the output value Vm, the digital multimeter measures to obtain the actual output value Sm, and the measurement end of the device to be calibrated measures to obtain the actual measurement value Mm;
the acquiring, according to the n output values and the n actual output values obtained by using the digital multimeter, the output calibration parameters of the measurement device to be calibrated in the preset state includes:
removing noise points from the n candidate points (Vm, Sm);
And fitting the rest alternative points (Vm, Sm) to obtain a target straight line y which is Kx + B, and taking K and B as output calibration parameters of the measuring device to be calibrated in the preset state.
3. Calibration method according to claim 2, characterized in that said removing noise points of the n alternative points (Vm, Sm) comprises:
And removing noise points in the n alternative points (Vm, Sm) by adopting a Randac algorithm.
4. the calibration method according to claim 2, wherein said fitting the remaining candidate points (Vm, Sm) to obtain the target straight line y ═ Kx + B comprises:
And fitting the rest alternative points (Vm, Sm) by using a least square method to obtain a target straight line y which is Kx + B.
5. the calibration method according to claim 2, wherein the obtaining of the measurement calibration parameters of the measurement device to be calibrated in the preset state according to the n actual output values obtained by using the digital multimeter and the n actual measurement values obtained by using the measurement end of the measurement device to be calibrated comprises:
removing noise points from the n candidate points (Sm, Mm);
and fitting the rest of the alternative points (Sm, Mm) to obtain a target straight line y which is Lx + P, and taking L and P as measurement calibration parameters of the measurement device to be calibrated in the preset state.
6. calibration method according to claim 5, characterized in that said removing noise points of the n alternative points (Sm, Mm) comprises:
And removing noise points in the n alternative points (Sm, Mm) by adopting a Randac algorithm.
7. the calibration method according to claim 5, wherein said fitting the remaining candidate points (Sm, Mm) to obtain the target straight line y ═ Lx + P comprises:
And fitting the rest alternative points (Sm, Mm) by using a least square method to obtain a target straight line y which is Lx + P.
8. The calibration method according to claim 5, wherein the calibrating the preset state of the measurement device to be calibrated according to the output calibration parameter and the measurement calibration parameter comprises:
When the set output value of the measuring device to be calibrated in the preset state is X, the actual output value X' of the measuring device to be calibrated is (X-B)/K;
when the to-be-calibrated measuring device measures an unknown input value in the preset state, a direct measurement value obtained by measurement is Y, and an actual measurement value Y' of the to-be-calibrated measuring device is LY + P.
9. the calibration method of claim 1, wherein the preset output type comprises a voltage or a current.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201910881135.6A CN110554350B (en) | 2019-09-18 | 2019-09-18 | Calibration method of measuring device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201910881135.6A CN110554350B (en) | 2019-09-18 | 2019-09-18 | Calibration method of measuring device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN110554350A true CN110554350A (en) | 2019-12-10 |
| CN110554350B CN110554350B (en) | 2022-06-17 |
Family
ID=68740740
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201910881135.6A Active CN110554350B (en) | 2019-09-18 | 2019-09-18 | Calibration method of measuring device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN110554350B (en) |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN2630863Y (en) * | 2003-06-28 | 2004-08-04 | 浙江浙大中控技术有限公司 | Automatic calibrating device for measuring module |
| DE102004022556B3 (en) * | 2004-05-07 | 2005-10-27 | Siemens Ag | Self-calibrating voltage measuring device and method therefor |
| CN102353918A (en) * | 2011-06-22 | 2012-02-15 | 德讯科技股份有限公司 | Automatic calibration system for current-voltage analog quantity collector |
| CN202676897U (en) * | 2012-04-20 | 2013-01-16 | 上海尊瑞电子有限公司 | Current-sampling automatic calibration device |
| CN105824000A (en) * | 2015-01-04 | 2016-08-03 | 上海恩艾仪器有限公司 | Method for calibrating output board card |
| CN110244252A (en) * | 2018-03-08 | 2019-09-17 | 上海原动力通信科技有限公司 | A kind of electric signal measurement result calibration system and method |
-
2019
- 2019-09-18 CN CN201910881135.6A patent/CN110554350B/en active Active
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN2630863Y (en) * | 2003-06-28 | 2004-08-04 | 浙江浙大中控技术有限公司 | Automatic calibrating device for measuring module |
| DE102004022556B3 (en) * | 2004-05-07 | 2005-10-27 | Siemens Ag | Self-calibrating voltage measuring device and method therefor |
| CN102353918A (en) * | 2011-06-22 | 2012-02-15 | 德讯科技股份有限公司 | Automatic calibration system for current-voltage analog quantity collector |
| CN202676897U (en) * | 2012-04-20 | 2013-01-16 | 上海尊瑞电子有限公司 | Current-sampling automatic calibration device |
| CN105824000A (en) * | 2015-01-04 | 2016-08-03 | 上海恩艾仪器有限公司 | Method for calibrating output board card |
| CN110244252A (en) * | 2018-03-08 | 2019-09-17 | 上海原动力通信科技有限公司 | A kind of electric signal measurement result calibration system and method |
Also Published As
| Publication number | Publication date |
|---|---|
| CN110554350B (en) | 2022-06-17 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN108089141B (en) | Error correction method and device of current measuring device based on current divider | |
| CN106374923B (en) | High-precision ADC reference voltage calibration system and calibration method | |
| CN112946560B (en) | Electric energy meter calibration method and device, electric energy meter and electric energy meter system | |
| CN104698276A (en) | Resistor verifying system | |
| CN108445292A (en) | Resistance measurement method based on error correction and device | |
| CN103475369B (en) | The high-precision ADC test of identification is disposably calibrated based on signal source error | |
| KR101446669B1 (en) | Method for calibrating the measurement output distortion using continuous full-scale voltage/current sampling about circuit | |
| CN112557732B (en) | Magnitude tracing method and system of impulse current measuring device based on induction coil | |
| CN110554350B (en) | Calibration method of measuring device | |
| CN113484603B (en) | Electric energy metering system and method | |
| CN104698283A (en) | Resistor test method | |
| WO2020155068A1 (en) | Current measuring device, method, and apparatus | |
| CN106291034A (en) | Can self-calibrating resistance potentiometer | |
| CN105699772B (en) | A kind of verification method and its device of orthogonal reference phase | |
| CN109375127B (en) | Automatic calibration device and method for integrated circuit test system based on analog-to-digital converter | |
| CN107706121B (en) | Precision consistency correction method and system for batch test of multiple test devices | |
| CN108572273B (en) | Low current measuring circuit and measuring method thereof | |
| KR20200051182A (en) | Apparatus and Method for Testing Oxide Semiconductor Thin Film | |
| CN105021865A (en) | A voltage measurement method allowing compensation | |
| CN111141406B (en) | PT100 temperature measurement system and temperature measurement method | |
| CN212646965U (en) | Single-point calibration circuit structure realized by built-in resistance network of digital multimeter | |
| CN106100492B (en) | A kind of the rotor electrical time constant preparation method and system of asynchronous machine | |
| CN107991640B (en) | Pulse current calibration device and method for semiconductor discrete device test system | |
| CN104820135A (en) | Reactor testing method and testing device | |
| CN109001538B (en) | Method for achieving high-precision resistance measurement by using non-precision device |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |