CN110535466A - A kind of over-sampling SAR ADC read based on noise shaping techniques and surplus - Google Patents

A kind of over-sampling SAR ADC read based on noise shaping techniques and surplus Download PDF

Info

Publication number
CN110535466A
CN110535466A CN201910790646.7A CN201910790646A CN110535466A CN 110535466 A CN110535466 A CN 110535466A CN 201910790646 A CN201910790646 A CN 201910790646A CN 110535466 A CN110535466 A CN 110535466A
Authority
CN
China
Prior art keywords
analog converter
msb
digital
type digital
signal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN201910790646.7A
Other languages
Chinese (zh)
Inventor
高静
赵彤
聂凯明
徐江涛
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tianjin University
Original Assignee
Tianjin University
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tianjin University filed Critical Tianjin University
Priority to CN201910790646.7A priority Critical patent/CN110535466A/en
Publication of CN110535466A publication Critical patent/CN110535466A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03MCODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00Analogue/digital conversion; Digital/analogue conversion
    • H03M1/002Provisions or arrangements for saving power, e.g. by allowing a sleep mode, using lower supply voltage for downstream stages, using multiple clock domains or by selectively turning on stages when needed
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03MCODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00Analogue/digital conversion; Digital/analogue conversion
    • H03M1/06Continuously compensating for, or preventing, undesired influence of physical parameters
    • H03M1/08Continuously compensating for, or preventing, undesired influence of physical parameters of noise
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03MCODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12Analogue/digital converters
    • H03M1/124Sampling or signal conditioning arrangements specially adapted for A/D converters
    • H03M1/1245Details of sampling arrangements or methods
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03MCODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12Analogue/digital converters
    • H03M1/34Analogue value compared with reference values
    • H03M1/38Analogue value compared with reference values sequentially only, e.g. successive approximation type

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Analogue/Digital Conversion (AREA)

Abstract

本发明公开一种基于噪声整形技术和余量读出的过采样SAR ADC,包括FIR滤波器,对像素所采样的信号Vpix,由高有效位MSB型数模转换器、低有效位LSB型数模转换器输出的模拟/数字A/D的转换结果信号VDAC做差得到量化误差VR,然后VPIX、VR与VDAC接入比较器比较,之后接入数字逻辑电路,完成余量读出过程并转换为数字代码;数字逻辑电路与寄存器连接,接入寄存器中复制的MSB代码DMSB和读出余量信号,多次采样后,最后将多次采样的结果传至平均数逻辑电路,得到最终输出。本发明实现了信噪比的提高,使得SAR ADC提高了有效分辨率,降低了功耗。

The invention discloses an over-sampling SAR ADC based on noise shaping technology and margin readout, which includes an FIR filter, and the signal V pix sampled by a pixel is composed of a high-significant bit MSB type digital-to-analog converter and a low-significant bit LSB type digital-to-analog converter. The analog/digital A/D conversion result signal V DAC output by the digital-to-analog converter is differenced to obtain the quantization error V R , and then V PIX , VR and V DAC are connected to a comparator for comparison, and then connected to a digital logic circuit to complete the remainder Quantity readout process and converted into digital code; the digital logic circuit is connected to the register, and the MSB code D MSB copied in the register is connected to the read margin signal. After multiple sampling, the result of multiple sampling is finally transmitted to the average value logic circuit to get the final output. The invention improves the signal-to-noise ratio, improves the effective resolution of the SAR ADC, and reduces power consumption.

Description

一种基于噪声整形技术和余量读出的过采样SAR ADCAn Oversampling SAR ADC Based on Noise Shaping Technique and Margin Readout

技术领域technical field

本发明涉及图像传感器技术领域,特别是涉及一种基于噪声整形技术和余量读出的过采样SAR ADC。The invention relates to the technical field of image sensors, in particular to an oversampling SAR ADC based on noise shaping technology and margin readout.

背景技术Background technique

随着对智能手机、平板电脑等各类个性化信息技术设备需求的稳步增长,通过社交网络发布和分享个人图片变得十分流行;CMOS图像传感器(CMOS Image Sensor,CIS)已成为信息技术设备的重要组成部分。由于人们对图像质量的要求越来越高,各种低噪声、速度高模数转换器(Analog-Digital Converter,ADC)结构被用于CIS读出。With the steady growth of demand for various personalized information technology equipment such as smartphones and tablet computers, it has become very popular to publish and share personal pictures through social networks; CMOS Image Sensor (CMOS Image Sensor, CIS) has become An important part of. Due to people's higher and higher requirements on image quality, various low-noise, high-speed Analog-Digital Converter (Analog-Digital Converter, ADC) structures are used for CIS readout.

为了实现ADC性能的提高,近年来有许多技术应用在ADC上,如使用可编程增益放大器、并行运行多个ADC等,但这些方案存在着设计复杂、尺寸过大、功耗过高等问题。过采样技术已经在ADC的噪声抑制上有所应用。过采样是Σ-Δ型ADC固有的属性,其噪声形成特性使之表现出较好的低噪声性能,但1位的量化器抑制量化噪声所需的高过采样比,这限制了转换速度;另一方面,可利用过采样技术提高奈奎斯特ADC(如逐次逼近寄存器ADC和流水线ADC)的动态范围、信噪比等性能,利用这些ADC高速的特性也可实现过采样,但其噪声整形能力缺乏,不能满足高信噪比Signal to Noise Ratio,SNR的需求。In order to improve the performance of ADCs, many technologies have been applied to ADCs in recent years, such as using programmable gain amplifiers and running multiple ADCs in parallel. However, these solutions have problems such as complex design, large size, and high power consumption. Oversampling technology has been applied in the noise suppression of ADC. Oversampling is an inherent attribute of Σ-Δ ADC, and its noise formation characteristics make it exhibit better low-noise performance, but the high oversampling ratio required by a 1-bit quantizer to suppress quantization noise limits the conversion speed; On the other hand, oversampling technology can be used to improve the dynamic range and signal-to-noise ratio of Nyquist ADCs (such as successive approximation register ADCs and pipeline ADCs). The lack of shaping capability cannot meet the requirements of high signal-to-noise ratio Signal to Noise Ratio, SNR.

发明内容Contents of the invention

本发明的目的是针对现有技术中存在的技术缺陷,而提供一种基于噪声整形技术和余量读出的过采样SAR ADC。The purpose of the present invention is to provide an over-sampling SAR ADC based on noise shaping technology and margin readout, aiming at the technical defects existing in the prior art.

为实现本发明的目的所采用的技术方案是:The technical scheme adopted for realizing the purpose of the present invention is:

一种基于噪声整形技术和余量读出的过采样SAR ADC,包括具有噪声整形功能的FIR滤波器、与FIR滤波器连接的比较器、高有效位MSB型数模转换器、低有效位LSB型数模转换器、数字逻辑电路、与数字逻辑电路连接的寄存器、与寄存器连接的平均数逻辑电路,数字逻辑电路与高有效位MSB型数模转换器、低有效位LSB型数模转换器;An oversampling SAR ADC based on noise shaping technology and margin readout, including an FIR filter with noise shaping function, a comparator connected with the FIR filter, a high significant bit MSB type digital-to-analog converter, a low significant bit LSB digital-to-analog converter, digital logic circuit, register connected to digital logic circuit, average number logic circuit connected to register, digital logic circuit and high significant bit MSB type digital-to-analog converter, low significant bit LSB type digital-to-analog converter ;

FIR滤波器,对像素所采样的信号Vpix,以及由高有效位MSB型数模转换器、低有效位LSB型数模转换器输出的模拟/数字A/D的转换结果信号VDAC做差得到量化误差VR,然后VPIX、VR与VDAC接入比较器比较,之后接入数字逻辑电路,完成余量读出过程并转换为数字代码;数字逻辑电路与寄存器连接,接入寄存器中复制的MSB代码DMSB和读出余量信号,多次采样后,最后将多次采样的结果传至平均数逻辑电路,得到最终输出。The FIR filter is used to make a difference between the signal Vpix sampled by the pixel and the analog/digital A/D conversion result signal V DAC output by the high-significant bit MSB type digital-to-analog converter and the low-significant bit LSB type digital-to-analog converter. Get the quantization error V R , then V PIX , VR and V DAC are connected to the comparator for comparison, and then connected to the digital logic circuit to complete the margin reading process and convert it into digital code; the digital logic circuit is connected to the register and connected to the register The MSB code D MSB copied in and the readout margin signal are sampled multiple times, and finally the result of multiple sampling is transmitted to the average number logic circuit to obtain the final output.

其中,高有效位MSB型数模转换器、低有效位LSB型数模转换器分别连接控制信号,以控制高有效位MSB型数模转换器、低有效位LSB型数模转换器的A/D转化器工作在MSB模式或LSB模式。Among them, the high significant bit MSB type digital-analog converter and the low significant bit LSB type digital-analog converter are respectively connected with control signals to control the A/C of the high significant bit MSB type digital-analog converter and the low significant bit LSB type digital-analog converter. D converter works in MSB mode or LSB mode.

其中,FIR滤波器为双级FIR滤波器。Wherein, the FIR filter is a two-stage FIR filter.

本发明基于噪声整形技术和余量读出的过采样SAR ADC,采用具有噪声整形能力的逐次逼近型ADC架构,与传统逐次逼近型ADC相比,实现了信噪比的提高。本发明是具有噪声整形和余量读出逐次逼近型ADC的节能低噪声CIS,采用无源有限脉冲响应(FiniteImpulse Response,FIR)滤波器进行噪声整形,使得SAR ADC提高了有效分辨率;采用余量读出方案,降低了功耗。与传统的SAR ADC相比,本发明提出的结构能够有效降低噪声。The present invention is based on the oversampling SAR ADC of the noise shaping technology and margin readout, adopts the successive approximation ADC architecture with noise shaping ability, and realizes the improvement of the signal-to-noise ratio compared with the traditional successive approximation ADC. The present invention is an energy-saving and low-noise CIS with noise shaping and margin readout successive approximation ADC, adopts passive finite impulse response (Finite Impulse Response, FIR) filter to carry out noise shaping, makes SAR ADC improve effective resolution; Quantity readout scheme reduces power consumption. Compared with the traditional SAR ADC, the structure proposed by the invention can effectively reduce the noise.

附图说明Description of drawings

图1为本发明的基于噪声整形技术和余量读出的过采样SAR ADC结构图;Fig. 1 is the oversampling SAR ADC structural diagram based on noise shaping technology and margin readout of the present invention;

图2为将噪声整形和余量读出相结合的SAR ADC的工作原理图。Figure 2 is a schematic diagram of the operation of a SAR ADC that combines noise shaping and margin readout.

图3是本发明提出的ADC中双级FIR滤波器的结构。Fig. 3 is the structure of the dual-stage FIR filter in the ADC proposed by the present invention.

具体实施方式Detailed ways

以下结合附图和具体实施例对本发明作进一步详细说明。应当理解,此处所描述的具体实施例仅仅用以解释本发明,并不用于限定本发明。The present invention will be described in further detail below in conjunction with the accompanying drawings and specific embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.

如图1所示,本发明基于噪声整形技术和余量读出的过采样SAR ADC,包括:FIR滤波器103、比较器104、高有效位MSB型数模转换器107、低有效位LSB型数模转换器108、数字逻辑电路105、寄存器106、平均数逻辑电路111,101是像素所采样的信号Vpix,102是模拟/数字A/D的转换结果VDAC,在高有效位MSB型数模转换器107、低有效位LSB型数模转换器108中生成,信号经过FIR滤波器103做差得到量化误差VR,该模块同时可实现噪声整形功能。VPIX、VR与VDAC都接入比较器104进行比较,接入逐次逼近数字逻辑电路105,信号在此完成余量读出的过程,并转换为数字代码,与寄存器106相连,复制MSB代码DMSB,在噪声耦合时可跳过MSB决策过程;数字逻辑电路105与高有效位MSB型数模转换器107、低有效位LSB型数模转换器108连接,将寄存器106中复制的DMSB和读出余量信号接入,109、110为控制信号,控制高有效位MSB型数模转换器107、低有效位LSB型数模转换器108的A/D转化器工作在MSB模式或LSB模式。采样频率为奈奎斯特频率的OSR倍,以上的采样过程也重复OSR次,最后将多次采样的结果传至平均数逻辑电路111,得到最终输出。As shown in Figure 1, the oversampling SAR ADC based on noise shaping technology and margin readout of the present invention includes: FIR filter 103, comparator 104, high significant bit MSB type digital-to-analog converter 107, low significant bit LSB type Digital-to-analog converter 108, digital logic circuit 105, register 106, average number logic circuit 111, 101 is the signal Vpix sampled by the pixel, 102 is the conversion result V DAC of analog/digital A/ D , in the high significant bit MSB type The digital-to-analog converter 107 and the low-significant-bit LSB type digital-to-analog converter 108 are generated, and the signal is differenced by the FIR filter 103 to obtain the quantization error V R , and this module can also realize the noise shaping function. V PIX , VR and V DAC are all connected to the comparator 104 for comparison, and connected to the successive approximation digital logic circuit 105, where the signal completes the process of reading the margin, and converts it into a digital code, which is connected to the register 106 to copy the MSB The code D MSB can skip the MSB decision-making process during noise coupling; the digital logic circuit 105 is connected with the high-significant bit MSB-type digital-to-analog converter 107 and the low-significant bit LSB-type digital-to-analog converter 108, and copies D in the register 106 MSB and readout margin signal access, 109, 110 are control signals, control the A/D converter of high significant bit MSB type digital-to-analog converter 107, low significant bit LSB type digital-to-analog converter 108 to work in MSB mode or LSB mode. The sampling frequency is OSR times the Nyquist frequency, and the above sampling process is also repeated OSR times, and finally the multiple sampling results are transmitted to the average logic circuit 111 to obtain the final output.

图2说明了将噪声整形和余量读出相结合的SAR ADC的工作原理。VPIX[i,j]和VPIX[i,j+1]分别为总像素阵列第i行第j列和(j+1)列的像素信号。过采样期间,进行A/D转换的输入像素值为固定的VPIX[i,j],这一过程会对信号进行量化噪声耦合,以实现噪声整形,提高SNR;恒定输入VPIX[i,j]的全部数字代码可以由低位的LSB转换实现。过采样完成,读数移动到一个新像素VPIX[i,j+1],复制余量读出方案的DMSBs[i,j],可跳过MSB的决策,得到完整的代码。Figure 2 illustrates the operation of a SAR ADC combining noise shaping and margin readout. V PIX[i,j] and V PIX[i,j+1] are the pixel signals of row i, column j and column (j+1) of the total pixel array, respectively. During oversampling, the input pixel value for A/D conversion is fixed V PIX[i,j] , this process will perform quantization noise coupling on the signal to achieve noise shaping and improve SNR; constant input V PIX[i, j] All digital codes can be realized by low-order LSB conversion. After oversampling is done, the readout moves to a new pixel V PIX[i,j+1] , copying the D MSBs[i,j] of the margin readout scheme, skipping the MSB decision, and getting the complete code.

采用双级FIR滤波器,可以降低SAR ADC的低频量化噪声和比较器噪声。图3给出了所提出的双级FIR滤波器的原理图,301,302为滤波器电容CFIR1、CFIR2;303~312均为开关。The low-frequency quantization noise and comparator noise of the SAR ADC can be reduced by using a dual-stage FIR filter. Fig. 3 shows the schematic diagram of the proposed two-stage FIR filter, 301, 302 are filter capacitors C FIR1 , C FIR2 ; 303-312 are all switches.

如果对低通滤波器采用双抽头FIR滤波器,NTF可以计算为If a two-tap FIR filter is used for the low-pass filter, NTF can be calculated as

Q(z)是A/D转换的量化误差。α1和α2是FIR滤波器量化误差采样过程中产生的衰减因子。第m次采样用Conv[m]表示,双级FIR滤波器的噪声耦合工作如下:Conv[m-1]时,其他开关开启,305、307闭合,重置CFIR1,然后开启305、306,闭合303、304,余差VR[m-1]在CFIR1上采样。Conv[m]时,其他开关开启,311、312闭合,VR[m-1]和Conv[m-2]时CFIR2采样到的余差VR[m-2]连接至比较器输入端,余差电压被耦合至当前像素电压上,得到VPIX+VR[m-1]+VR[m-2]。Conv[m]后,306、308闭合,重置CFIR2,开启其他开关,闭合309、310,新的余差VR[m]在CFIR2上采样,此过程中CFIR1上保持之前的余差VR[m-1],以进行下一次耦合。Q(z) is the quantization error of A/D conversion. α 1 and α 2 are the attenuation factors produced during the sampling process of the quantization error of the FIR filter. The m-th sampling is denoted by Conv[m], and the noise coupling of the two-stage FIR filter works as follows: when Conv[m-1], other switches are opened, 305, 307 are closed, C FIR1 is reset, and then 305, 306 are opened, Closing 303, 304, the residual V R[m-1] is sampled on C FIR1 . When Conv[m], other switches are turned on, 311 and 312 are closed, and when VR [m-1] and Conv[m-2], the residual difference VR [m-2] sampled by C FIR2 is connected to the input terminal of the comparator , the residual voltage is coupled to the current pixel voltage to obtain V PIX +V R[m-1] +V R[m-2] . After Conv[m], 306 and 308 are closed, C FIR2 is reset, other switches are turned on, 309 and 310 are closed, the new residual V R[m] is sampled on CFIR2, and the previous residual is maintained on C FIR1 during this process V R[m-1] for the next coupling.

本发明采用远远高于奈奎斯特频率的速率对SAR ADC的输入信号进行过采样,可提高SNR和分辨率,同时还能降低抗混叠滤波器的要求,简化ADC结构;采用FIR滤波器,对输入的信号进行噪声整形,可抑制量化误差的低频分量,提高信噪比;过采样过程中,恒定输入的模数转换只需要几位LSB转换就可以实现,因此可节省MSB开关电源。采样完成后,需要将完整的代码读出,此时应用余量读出方案,复制MSB代码,仍然有很大概率跳过MSB的决策;此时,设计周期大大降低,读出速度得以加快。The present invention uses a rate much higher than the Nyquist frequency to oversample the input signal of the SAR ADC, which can improve the SNR and resolution, and at the same time reduce the requirements of the anti-aliasing filter and simplify the ADC structure; FIR filtering is adopted In the process of oversampling, the analog-to-digital conversion of constant input can be realized with only a few LSB conversions, so the MSB switching power supply can be saved . After the sampling is completed, the complete code needs to be read out. At this time, the margin readout scheme is applied to copy the MSB code, and there is still a high probability of skipping the MSB decision. At this time, the design cycle is greatly reduced and the readout speed is accelerated.

以上所述仅是本发明的优选实施方式,应当指出的是,对于本技术领域的普通技术人员来说,在不脱离本发明原理的前提下,还可以做出若干改进和润饰,这些改进和润饰也应视为本发明的保护范围。The above is only a preferred embodiment of the present invention, it should be pointed out that, for those of ordinary skill in the art, without departing from the principle of the present invention, some improvements and modifications can also be made, these improvements and Retouching should also be regarded as the protection scope of the present invention.

Claims (3)

1. a kind of over-sampling SAR ADC read based on noise shaping techniques and surplus, which is characterized in that including whole with noise The FIR filter of shape function, the comparator being connect with FIR filter, high significance bit MSB type digital analog converter, low order LSB Type digital analog converter, Digital Logical Circuits, the register being connect with Digital Logical Circuits, the average logic being connect with register Circuit, Digital Logical Circuits and high significance bit MSB type digital analog converter, low order LSB type digital analog converter;
FIR filter, the signal V that pixel is sampledPix,And by high significance bit MSB type digital analog converter, low order LSB The transformation result signal V of the analog/digital A/D of type digital analog converter outputDACIt makes the difference to obtain quantization error VR,Then VPIX、VRWith VDACAccess comparator compares, and accesses Digital Logical Circuits later, completes surplus readout and is converted to digital code;Number Logic circuit is connect with register, accesses the MSB code D replicated in registerMSBWith read residual signal, after multiple repairing weld, most The result of multiple repairing weld is reached into average logic circuit afterwards, obtains final output.
2. the over-sampling SAR ADC read according to claim 1 based on noise shaping techniques and surplus, which is characterized in that High significance bit MSB type digital analog converter, low order LSB type digital analog converter are separately connected control signal, high effectively with control The A/D converter work of position MSB type digital analog converter, low order LSB type digital analog converter is in MSB mode or LSB mode.
3. the over-sampling SAR ADC read according to claim 1 based on noise shaping techniques and surplus, which is characterized in that FIR filter is twin-stage FIR filter.
CN201910790646.7A 2019-08-26 2019-08-26 A kind of over-sampling SAR ADC read based on noise shaping techniques and surplus Pending CN110535466A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201910790646.7A CN110535466A (en) 2019-08-26 2019-08-26 A kind of over-sampling SAR ADC read based on noise shaping techniques and surplus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201910790646.7A CN110535466A (en) 2019-08-26 2019-08-26 A kind of over-sampling SAR ADC read based on noise shaping techniques and surplus

Publications (1)

Publication Number Publication Date
CN110535466A true CN110535466A (en) 2019-12-03

Family

ID=68664220

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201910790646.7A Pending CN110535466A (en) 2019-08-26 2019-08-26 A kind of over-sampling SAR ADC read based on noise shaping techniques and surplus

Country Status (1)

Country Link
CN (1) CN110535466A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111900988A (en) * 2020-07-28 2020-11-06 电子科技大学 A Composite Third-Order Noise Shaping Successive Approximation Analog-to-Digital Converter
CN112713898A (en) * 2020-12-21 2021-04-27 湖南国科微电子股份有限公司 Noise shaping SAR ADC and SOC
CN115866428A (en) * 2022-11-30 2023-03-28 天津大学 Correlated multiple sampling readout circuit similar to sigma-delta
CN116707743A (en) * 2023-05-17 2023-09-05 苏州大学 Clock recovery method and device for noise shaping signal with low oversampling rate

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20140091960A1 (en) * 2012-09-29 2014-04-03 Nicholas P. Cowley Methods and arrangements for high-speed analog-to-digital conversion
US20140210653A1 (en) * 2013-01-25 2014-07-31 Technische Universiteit Eindhoven Data-driven noise reduction technique for Analog to Digital Converters
CN109412597A (en) * 2018-10-29 2019-03-01 清华大学深圳研究生院 A kind of gradual approaching A/D converter and D conversion method of second-order noise shaping
CN109889199A (en) * 2019-02-20 2019-06-14 哈尔滨工程大学 A Chopper Stabilized ΣΔ and SAR Hybrid ADC

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20140091960A1 (en) * 2012-09-29 2014-04-03 Nicholas P. Cowley Methods and arrangements for high-speed analog-to-digital conversion
US20140210653A1 (en) * 2013-01-25 2014-07-31 Technische Universiteit Eindhoven Data-driven noise reduction technique for Analog to Digital Converters
CN109412597A (en) * 2018-10-29 2019-03-01 清华大学深圳研究生院 A kind of gradual approaching A/D converter and D conversion method of second-order noise shaping
CN109889199A (en) * 2019-02-20 2019-06-14 哈尔滨工程大学 A Chopper Stabilized ΣΔ and SAR Hybrid ADC

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111900988A (en) * 2020-07-28 2020-11-06 电子科技大学 A Composite Third-Order Noise Shaping Successive Approximation Analog-to-Digital Converter
CN112713898A (en) * 2020-12-21 2021-04-27 湖南国科微电子股份有限公司 Noise shaping SAR ADC and SOC
CN112713898B (en) * 2020-12-21 2022-12-09 湖南国科微电子股份有限公司 Noise shaping SAR ADC and SOC
CN115866428A (en) * 2022-11-30 2023-03-28 天津大学 Correlated multiple sampling readout circuit similar to sigma-delta
CN115866428B (en) * 2022-11-30 2024-05-03 天津大学 Correlated multiple sampling readout circuit similar to sigma-delta
CN116707743A (en) * 2023-05-17 2023-09-05 苏州大学 Clock recovery method and device for noise shaping signal with low oversampling rate

Similar Documents

Publication Publication Date Title
CN110535466A (en) A kind of over-sampling SAR ADC read based on noise shaping techniques and surplus
CN107395206B (en) Successive Approximation Digital-to-Analog Converter with Feedback Advance Setting and Corresponding Delta-SigmaADC Architecture
CN111211783B (en) Dual feedback loop noise shaping oversampling successive approximation analog-to-digital converter and method
USRE42878E1 (en) Analog-to-digital converting system
US5406283A (en) Multi-bit oversampled DAC with dynamic element matching
US5977899A (en) Digital-to-analog converter using noise-shaped segmentation
CN101427471B (en) Delta sigma modulator analog-to-digital converters with quantizer output prediction and comparator reduction
CN105007079B (en) The fully differential increment method of sampling of gradual approaching A/D converter
CN111654285B (en) Digital background calibration method for capacitor mismatch and gain error of pipeline SAR ADC
US20090261998A1 (en) Apparatus and method for sigma-delta analog to digital conversion
CN103152049A (en) Successive approximation register type ADC (analog-digital converter)
CN107465411A (en) Quantizer
TWI806648B (en) Image sensor and image readout method
US11271585B2 (en) Sigma delta modulator, integrated circuit and method therefor
CN111556266A (en) High dynamic range reading circuit based on back-illuminated image sensor
CN111464186A (en) A high-speed Pipeline-SAR analog-to-digital conversion circuit
Hwang et al. A 2.7-M pixels 64-mW CMOS image sensor with multicolumn-parallel noise-shaping SAR ADCs
CN107769784A (en) Oversampling type Pipeline SAR-ADC system
CN107682014A (en) A kind of mixed type ADC system and its method for improving resolution ratio and speed
CN104682958B (en) A kind of parallel gradually-appoximant analog-digital converter with noise shaping
CN103427841A (en) System and method for increasing column-parallel single-slope ADC (analog to digital converter) conversion rate
CN101207384A (en) Analog/digital conversion system
CN104363019B (en) A kind of production line analog-digital converter and its capacitor mismatch error calibration method
CN106130559A (en) High-precision column-level analog-to-digital converter and analog-to-digital conversion method thereof
CN113225085B (en) A High-speed Multi-bit Sequential Approximation-Pipeline Hybrid Analog-to-Digital Converter

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
AD01 Patent right deemed abandoned

Effective date of abandoning: 20230818

AD01 Patent right deemed abandoned