CN110531244A - A kind of digital circuit single-particle soft error evolutionary process test method - Google Patents
A kind of digital circuit single-particle soft error evolutionary process test method Download PDFInfo
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Abstract
In order to obtain propagation Evolution of the single-particle soft error in digital circuit, the invention proposes a kind of digital circuit single-particle soft error evolutionary process test methods, the present invention passes through three test macro Functional Design, the control of radiation effect experiment process and test data analyzer method aspects, the propagation Evolution of single-particle soft error in circuit is obtained, suitable for middle and small scale digital circuit or the single particle effect analysis of experiments of key figure circuit module and verifying.
Description
Technical field
The invention belongs to integrated circuit radiation effect fields, are related to a kind of digital circuit single-particle soft error evolutionary process survey
Method for testing.
Background technique
Single high energy particle in radiation environment is produced after passing through electronic device and circuit sensitive region by ionization
Raw a large amount of electron-hole pairs are collected by device and circuit internal electric field, lead to device radiation injury, and single-particle effect is referred to as
It answers.
Single particle effect type mainly has single-particle inversion (SEU), single-ion transient state (SET) and single event function interrupt
(SEFI) etc..Single-particle inversion is the phenomenon that causing device logic state to overturn after high energy particle is incident；Single-ion transient state is high
It can lead to the phenomenon that generating abnormal pulsers signal after particle incidence；Single event function interrupt is due to single-particle inversion and single-particle
The phenomenon that transient state is propagated in circuit, causes logic circuit that cannot complete defined logic function.
The analysis of circuit-level single particle effect Path-sensitive is the main of modern digital circuits anti-single particle effect reinforcement technique
Research contents.The propagation evolutionary process of single particle effect in circuit, can reflect large scale integrated circuit simple grain with analysing clearly
The Path-sensitive information of sub- effect points the direction to carry out targetedly reinforcement design scheme and strategy, is conducive to lesser
The anti-single particle effect capability of circuit is realized under cost.
Propagate the logical simulation method of evolutionary process in logic circuits relative to existing single-particle soft error, experiment is surveyed
Amount method can play in terms of Evolution cognition, correction logic emulation mode and Key Circuit are reinforced
Important function.
Summary of the invention
In order to obtain propagation Evolution of the single-particle soft error in digital circuit, the invention proposes a kind of number electricity
Road single-particle soft error evolutionary process test method is based on this method, can try in heavy ion or laser microbeam single particle effect
The propagation evolutionary process of middle acquisition soft error in circuit is tested, the single-particle soft error sensitivity that analysis obtains objective circuit propagates road
Diameter.
The technical solution of the invention is as follows:
A kind of digital circuit single-particle soft error evolutionary process test method is suitable for heavy ion radiation or laser microbeam spoke
Under the conditions of penetrating, it is characterized in that
Step 1: test system building
1.1] monitoring signals of circuit-under-test are drawn:
1.1.1] by way of increasing physics and drawing port, by the internal node signal of circuit-under-test DUT, externally output
Signal and/or user confirmation can characterization circuit working condition signal of interest physics draw, obtain monitoring signals vector T p；
Tp={ Sig0,Sig1...,Sign,...,SigN-1} n∈[0,N-1]
Wherein: N is monitoring signals sum, N >=1；SignIt is monitoring signals name；
1.1.2 it] is directed to circuit-under-test DUT, establishes the corresponding relationship list R drawn between port and monitoring signalsTp, this is right
Answer relation list RTpContent includes monitoring signals bit address, monitoring signals name, the driving unit name of monitoring signals；
Above-mentioned corresponding relationship list RTpIn, the relationship of each one monitoring signals of behavior, first with being classified as monitoring signals position
Location, second is classified as monitoring signals name, and third is classified as the driving unit name of monitoring signals；
1.2] choose two through step 1.1] draw monitoring signals after circuit-under-test DUT be used as DUT-A and DUT-B, general
Circuit-under-test DUT-A is as test object, using circuit-under-test DUT-B as benchmark, and in no irradiation, is tested
Circuit DUT-A and DUT-B is adjusted, under same reset signal in same clock, same input signal, can synchronize independence
Operation；
1.3] the Difference test function and data record of circuit-under-test DUT-A and DUT-B monitoring signals are realized:
1.3.1] step-by-step exclusive or unit is set with monitoring signals the vector T p-A and Tp- to circuit-under-test DUT-A and DUT-B
B carries out step-by-step XOR operation, to obtain monitoring signals difference vector Vp:
1.3.2 memory] is set in the output end of step-by-step exclusive or unit, when monitoring signals difference vector Vp is not all " 0 "
When, the memory is used to record monitoring signals difference vector Vp by timeticks, obtains monitoring signals discrepancy data
VPPackage；The timeticks are counted by single-particle soft error counter；
VPPackage={ Vp0,Vp1...,Vpm,...,VpM-1} m∈[0,M-1]；
Wherein, M is record time span, according to the complexity of circuit-under-test, periodicity, test macro data transmission performance
It is determined Deng comprehensive；
Step 2: carry out radiation test:
2.1] by single-particle soft error counter O reset；
2.2] heavy ion or laser irradiation only are carried out to circuit-under-test DUT-A, and ensures heavy ion or laser-light transparent extremely
The sensitizing range of device, the real-time detection monitoring signals difference vector Vp during irradiation, when if it is complete " 0 ", chronic exposure；
If be not complete " 0 ", 2.3 are entered step]；
2.3] stop irradiation circuit-under-test DUT-A, persistently record and store monitoring signals difference vector Vp, obtain first
Monitoring signals discrepancy data VP corresponding to single-particle soft error eventPackage, then single-particle soft error counter is added
1；
2.4] state recovery is carried out to circuit-under-test DUT-A and DUT-B, after reentering synchronous regime, judges single-particle
When whether soft error counter reaches setting value, if reaching setting value, test is exited, step 2.2 is otherwise gone to], to obtain
Take monitoring signals discrepancy data corresponding to next single-particle soft error event；
Step 3: the analysis of radiation test data
3.1] monitoring signals discrepancy data corresponding to first single-particle soft error event is set as current data packet
VPPackage；
Present analysis moment m=0 3.2] is set；
3.3] the monitoring signals difference vector Vp at m=0 moment is taken out0, according to monitoring signals corresponding relationship list RTp, obtain
Vector Vp0In be the corresponding monitoring signals bit address of " 1 " data bit, monitoring signals name and driving unit name, to position m=0
The circuit physical information of soft error occurs for moment circuit-under-test DUT-A, forms m=0 moment soft error signal list SigImage0
Unit list DriverImage is generated with current time soft error0；
Wherein, SigImage0And DriverImage0Length be monitoring signals difference vector Vp0In be " 1 " number, i
It is the monitoring signals for 1 in monitoring signals difference vector Vp with j0In data bit；
3.4] the monitoring signals difference vector Vp at m=1 moment is taken out1, according to monitoring signals corresponding relationship list RTp, obtain
Vector Vp1In be the corresponding monitoring signals bit address of " 1 " data bit, monitoring signals name and driving unit name, to position m=1
The circuit physical information of soft error occurs for moment circuit-under-test DUT-A, forms m=1 moment soft error signal list SigImage1
Unit list DriverImage is generated with current time soft error1；
Wherein, SigImage1And DriverImage1Length be monitoring signals difference vector Vp1In be " 1 " number, k
It is monitoring signals in monitoring signals difference vector Vp with s1In data bit；
And so on；
3.5] the monitoring signals difference vector Vp at m=h moment is taken outh, according to monitoring signals corresponding relationship list RTp, obtain
Vector VphIn be the corresponding monitoring signals bit address of " 1 " data bit, monitoring signals name and driving unit name, to position m=h
The circuit physical information of soft error occurs for moment circuit-under-test DUT-A, forms m=h moment soft error signal list SigImageh
Unit list DriverImage is generated with current time soft errorh；
Wherein, SigImagehAnd DriverImagehLength be monitoring signals difference vector VphIn be " 1 " number, f
It is monitoring signals in monitoring signals difference vector Vp with ghIn data bit；H is the last one timeticks, h=M-1；
3.6] evolutionary process of current single-particle soft error event is constructed:
By 3.3] -3.5] obtained different moments occur the circuit physical information of soft error and combine in chronological order, formed
The evolutionary process of current single-particle soft error event:
SigImage={ SigImage0,SigImage1,...,SigImageh}
DriverImage={ DriImage0,DriImage1,...,DriImageh}
3.7] monitoring signals discrepancy data corresponding to next single-particle soft error event is taken out, and goes to step
3.2], until completing the analysis of all single-particle soft error events.
Further, step 1.3.2] in, record time span M is no less than 200 clock cycle.
Further, step 2.2] in, in predose, encapsulation operation is removed to circuit-under-test DUT-A.
Beneficial effects of the present invention:
1. the present invention passes through test macro Functional Design, the control of radiation effect experiment process and test data analyzer method three
A aspect obtains the propagation Evolution of single-particle soft error in circuit, is suitable for middle and small scale digital circuit or crucial number
The single particle effect analysis of experiments and verifying of word circuit module.
2. being directed to specific objective circuit, using the evolutionary process for the single-particle soft error that the present invention obtains, help to discriminate
Logic flaw and single particle effect Path-sensitive in other combinatory logic circuit design are conducive to formulate targeted target electricity
Road anti-single particle effect reinforces strategy.
3. using method of the invention, objective circuit single particle effect can be formed and reinforce validation verification analysis platform.
Detailed description of the invention
Fig. 1 is circuit-under-test netlist figure.
Fig. 2 is the netlist figure after drawing circuit-under-test monitoring signals.
Fig. 3 is the corresponding relationship list drawn between port and monitoring signals that the present invention establishes.
Fig. 4 is the hardware realization block diagram of test method of the present invention.
Fig. 5 is the flow chart of present invention radiation test method.
Fig. 6 is the monitoring signals discrepancy data example that radiation effect test obtains.
Specific embodiment
Below in conjunction with the drawings and specific embodiments, the invention will be further described.
The present embodiment be with for a combinational logic circuit module in Digital Logical Circuits netlist as shown in Figure 1 into
For row analysis, the sensibility that its unit Single event upset effecf of assay is propagated, detailed process is as follows:
Step 1: realizing test macro function
1.1] monitoring signals of circuit-under-test are drawn:
The present embodiment increases N=16 monitoring signals output, respectively circuit-under-test to circuit-under-test DUT shown in Fig. 1
Each unit output signal inside DUT, as shown in Fig. 2, so as to obtain monitoring signals vector T p:
Tp={ Sig0,Sig1...,Sign,...,SigN-1} n∈[0,15]
Then, it is arranged for the circuit-under-test DUT building corresponding relationship drawn between port and monitoring signals as shown in Figure 3
Table RTp, the driving unit of monitoring signals name and monitoring signals is of the same name in this example；Wherein, corresponding relationship list RTpIn first be classified as
The position of monitoring signals bit address namely monitoring signals in monitoring signals vector T p, the vector that secondary series is constituted are tested electricity
The monitoring signals vector T p of road DUT, third are classified as the driving unit name of detection signal；
1.2] two are chosen through step 1.1] draw monitoring signals after circuit-under-test it is (tested electric as DUT-A and DUT-B
The topological structure of road DUT-A and DUT-B is identical with signal node is drawn, as shown in Figure 2), using circuit-under-test DUT-A as survey
Object is tried, using circuit-under-test DUT-B as benchmark, and in no irradiation, circuit-under-test DUT-A and DUT-B exist
Same clock, same input signal are adjusted, under same reset signal, can synchronize independent operating, as shown in Figure 4；
1.3] the Difference test function and data record of circuit-under-test DUT-A and DUT-B monitoring signals are realized:
1.3.1] as shown in figure 4, monitoring signals vector T p-A and the Tp-B step-by-step by circuit-under-test DUT-A and DUT-B is different
Or, to obtain monitoring signals difference vector Vp:
1.3.2 monitoring signals difference vector Vp] is pressed into circuit-under-test timeticks deposit memory, it is poor to obtain monitoring signals
Different data packet VPPackage；In view of circuit-under-test DUT-A only has 2 grades of triggers, therefore monitoring signals variance data in this example
Wrap VPPackageRecord time span M=3；The timeticks are counted by single-particle soft error counter；
Step 2: carry out radiation test, complete test flow is as shown in Figure 5:
2.1] by single-particle soft error counter zero setting, i.e. SERCounter=0 prepares irradiation；
2.2] only circuit-under-test DUT-A is irradiated and (is irradiated again after can also first removing encapsulation), it is real during irradiation
When detection monitoring signals difference vector Vp whether be complete " 0 ", if it is, continuing to irradiate circuit-under-test DUT-A；Otherwise step is gone to
Rapid 2.3]；
2.3] stop irradiation circuit-under-test DUT-A, persistently record the monitoring signals difference vector of 3 timeticks, obtain
To first monitoring signals discrepancy data VPPackage, as shown in Figure 6；It should be noted that in other embodiments, if root
It is greater than 1 according to the maximum count value of SERCounter for needing to set, then needs to add in single-particle soft error counter 1, i.e.,
2.4 are entered step after SERCounter=SERCounter+1]；
2.4] reset (reset) signal is sent to circuit-under-test DUT-A and DUT-B, makes circuit-under-test DUT-A and DUT-B
It resets simultaneously, after reentering synchronous regime, judges whether single-particle soft error counter SERCounter reaches setting value (this
Example is set as recording 1 SER, i.e. SERCountermax=1), if it is, exiting test；Otherwise 2.2 are gone to] continue to survey
Examination, to obtain monitoring signals discrepancy data corresponding to next single-particle soft error event；
Step 3: the analysis of radiation test data
3.1] first monitoring signals discrepancy data is taken out, i.e., currently packet VPPackage=Package0；
Present analysis moment m=0 3.2] is set；
3.3] the monitoring signals difference vector Vp at m=0 moment is taken out0, analyze all data bit in vector for " 1 ":
VP0={ 0,0,0,0,1,0,0,1,0,0,0,0,0,0,0,0 }, wherein the data bit for 1 is:
Position 4, the entitled stato_FSM_FFd1-In1 of signal, the entitled stato_FSM_FFd1-In1 of driving unit；
Position 7, the entitled stato_FSM_FFd1 of signal, the entitled stato_FSM_FFd1 of driving unit.
Then m=0 moment:
Soft error signal list SigImage0={ stato_FSM_FFd1-In1, stato_FSM_FFd1 }
Soft error generates unit list DriverImage0={ stato_FSM_FFd1-In1, stato_FSM_FFd1 }；
3.4] since current m=0 is not the last one timeticks, m=1 moment, m=2 moment are successively taken out
Monitoring signals difference vector Vp1 and Vp2, and analyze the list of soft error signal and the current time soft error generation list of different moments
First list, obtains:
VP1={ 0,0,0,0,0,0,0,0,0,0,1,0,1,0,1,0 }, wherein the data bit for 1 is:
Position 10, the entitled Mmux_stato of signal [2], the entitled Mmux_stato of driving unit [2]；
Position 12, the entitled outp of signal, the entitled outp of driving unit.
Position 14, the entitled outp_OBUF of signal, the entitled outp_OBUF of driving unit.
Then m=1 moment:
Soft error signal list SigImage1={ Mmux_stato [2], outp, outp_OBUF }
Soft error generates unit list DriverImage1={ Mmux_stato [2], outp, outp_OBUF }；
VP2={ 0,0,0,0,0,0,0,0,0,0,0,0,0,0,0,0 }, wherein being free of promising 1 data bit.
Then m=2 moment:
Soft error signal list SigImage2={ }=Null (sky)
Soft error generates unit list DriverImage2={ }=Null (sky)；
3.5] evolutionary process of current single-particle soft error event is constructed
By step 3.3-] 3.4] the circuit physical information of soft error occurs for obtained different moments (m=0,1,2) temporally
Sequence combines, and forms the evolutionary process of current single-particle soft error event:
It is soft can to can be obtained the single-particle by circuit-under-test netlist shown in above-mentioned evolutionary process message reflection to Fig. 1
The more intuitive evolutionary process of mistake.
It is processed to finish since this example only includes a single-particle soft error event, complete analytic process.
Claims (3)
1. a kind of digital circuit single-particle soft error evolutionary process test method, is suitable for heavy ion radiation or laser microbeam radiates
Under the conditions of, it is characterised in that:
Step 1: test system building
1.1] monitoring signals of circuit-under-test are drawn:
1.1.1] by way of increasing physics and drawing port, by the internal node signal of circuit-under-test DUT, external output signal
And/or user confirmation can characterization circuit working condition signal of interest physics draw, obtain monitoring signals vector T p；
Tp={ Sig0,Sig1...,Sign,...,SigN-1}n∈[0,N-1]
Wherein: N is monitoring signals sum, N >=1；SignIt is monitoring signals name；
1.1.2 it] is directed to circuit-under-test DUT, establishes the corresponding relationship list R drawn between port and monitoring signalsTp, correspondence pass
Series of tables RTpContent includes monitoring signals bit address, monitoring signals name, the driving unit name of monitoring signals；
Above-mentioned corresponding relationship list RTpIn, the relationship of each one monitoring signals of behavior, first is classified as monitoring signals bit address, the
Two are classified as monitoring signals name, and third is classified as the driving unit name of monitoring signals；
1.2] choose two through step 1.1] draw monitoring signals after circuit-under-test DUT as DUT-A and DUT-B, will be tested
Circuit DUT-A is as test object, using circuit-under-test DUT-B as benchmark, and in no irradiation, circuit-under-test
DUT-A and DUT-B is adjusted, under same reset signal in same clock, same input signal, can synchronize independent fortune
Row；
1.3] the Difference test function and data record of circuit-under-test DUT-A and DUT-B monitoring signals are realized:
1.3.1] setting step-by-step exclusive or unit with the monitoring signals vector T p-A and Tp-B to circuit-under-test DUT-A and DUT-B into
Row step-by-step XOR operation, to obtain monitoring signals difference vector Vp:
1.3.2 memory, when monitoring signals difference vector Vp is not all " 0 ", institute] are set in the output end of step-by-step exclusive or unit
Memory is stated for recording monitoring signals difference vector Vp by timeticks, obtains monitoring signals discrepancy data VPPackage；Institute
Timeticks are stated to be counted by single-particle soft error counter；
VPPackage={ Vp0,Vp1...,Vpm,...,VpM-1}m∈[0,M-1]；
Wherein, M is record time span, comprehensive according to the complexity of circuit-under-test, periodicity, test macro data transmission performance etc.
It closes and determines；
Step 2: carry out radiation test:
2.1] by single-particle soft error counter O reset；
2.2] heavy ion or laser irradiation only are carried out to circuit-under-test DUT-A, and ensures heavy ion or laser-light transparent to device
Sensitizing range, the real-time detection monitoring signals difference vector Vp during irradiation, when if it is complete " 0 ", chronic exposure；If
When not being complete " 0 ", 2.3 are entered step]；
2.3] stop irradiation circuit-under-test DUT-A, persistently record and store monitoring signals difference vector Vp, obtain first simple grain
Monitoring signals discrepancy data VP corresponding to sub- soft error eventPackage, single-particle soft error counter is then added 1；
2.4] state recovery is carried out to circuit-under-test DUT-A and DUT-B, after reentering synchronous regime, judges single-particle soft error
When whether miscount device reaches setting value, if reaching setting value, test is exited, step 2.2 is otherwise gone to], under obtaining
Monitoring signals discrepancy data corresponding to one single-particle soft error event；
Step 3: the analysis of radiation test data
3.1] monitoring signals discrepancy data corresponding to first single-particle soft error event is set as current data packet
VPPackage；
Present analysis moment m=0 3.2] is set；
3.3] the monitoring signals difference vector Vp at m=0 moment is taken out0, according to monitoring signals corresponding relationship list RTp, obtain vector
Vp0In be the corresponding monitoring signals bit address of " 1 " data bit, monitoring signals name and driving unit name, to position the m=0 moment
The circuit physical information of soft error occurs for circuit-under-test DUT-A, forms m=0 moment soft error signal list SigImage0With work as
Preceding moment soft error generates unit list DriverImage0；
Wherein, SigImage0And DriverImage0Length be monitoring signals difference vector Vp0In be " 1 " number, i and j
It is the monitoring signals for 1 in monitoring signals difference vector Vp0In data bit；
3.4] the monitoring signals difference vector Vp at m=1 moment is taken out1, according to monitoring signals corresponding relationship list RTp, obtain vector
Vp1In be the corresponding monitoring signals bit address of " 1 " data bit, monitoring signals name and driving unit name, to position the m=1 moment
The circuit physical information of soft error occurs for circuit-under-test DUT-A, forms m=1 moment soft error signal list SigImage1With work as
Preceding moment soft error generates unit list DriverImage1；
Wherein, SigImage1And DriverImage1Length be monitoring signals difference vector Vp1In be " 1 " number, k and s
It is monitoring signals in monitoring signals difference vector Vp1In data bit；
And so on；
3.5] the monitoring signals difference vector Vp at m=h moment is taken outh, according to monitoring signals corresponding relationship list RTp, obtain vector
VphIn be the corresponding monitoring signals bit address of " 1 " data bit, monitoring signals name and driving unit name, to position the m=h moment
The circuit physical information of soft error occurs for circuit-under-test DUT-A, forms m=h moment soft error signal list SigImagehWith work as
Preceding moment soft error generates unit list DriverImageh；
Wherein, SigImagehAnd DriverImagehLength be monitoring signals difference vector VphIn be " 1 " number, f and g
It is monitoring signals in monitoring signals difference vector VphIn data bit；H is the last one timeticks, h=M-1；
3.6] evolutionary process of current single-particle soft error event is constructed:
By 3.3] -3.5] obtained different moments occur the circuit physical information of soft error and combine in chronological order, formed current
The evolutionary process of single-particle soft error event:
SigImage={ SigImage0,SigImage1,...,SigImageh}
DriverImage={ DriImage0,DriImage1,...,DriImageh}
3.7] monitoring signals discrepancy data corresponding to next single-particle soft error event is taken out, and goes to step 3.2],
Until completing the analysis of all single-particle soft error events.
2. digital circuit single-particle soft error evolutionary process test method according to claim 1, it is characterised in that: step
1.3.2 in], record time span M is no less than 200 clock cycle.
3. digital circuit single-particle soft error evolutionary process test method according to claim 1 or 2, it is characterised in that:
Step 2.2] in, in predose, encapsulation operation is removed to circuit-under-test DUT-A.
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| RONGMEI CHEN ET AL.: "Improved on-chip self-triggered single-event transient measurement circuit design and applications", 《MICROELECTRONICS RELIABILITY》 * |
| WEI CHEN ET AL.: "Single-Event Upsets in SRAMs With Scaling Technology Nodes Induced by Terrestrial,Nuclear Reactor, and Monoenergetic Neutrons", 《IEEE TRANSACTIONS ON NUCLEAR SCIENCE》 * |
| 金夺: "通用单粒子测试系统的软件平台开发", 《中国优秀硕士学位论文全文数据库 工程科技Ⅱ辑》 * |
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