CN110530516A - 一种用于电感耦合等离子体发射光谱仪的分光色散装置 - Google Patents

一种用于电感耦合等离子体发射光谱仪的分光色散装置 Download PDF

Info

Publication number
CN110530516A
CN110530516A CN201910862705.7A CN201910862705A CN110530516A CN 110530516 A CN110530516 A CN 110530516A CN 201910862705 A CN201910862705 A CN 201910862705A CN 110530516 A CN110530516 A CN 110530516A
Authority
CN
China
Prior art keywords
light
grating
light splitting
dispersion means
dispersion
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN201910862705.7A
Other languages
English (en)
Inventor
张勇
赵珍阳
王世功
许玉兴
田中朝
张春梅
张丽玫
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
SHANDONG DONGYI PHOTOELECTRIC INSTRUMENTS Co.,Ltd.
Yantai Dongyi Optoelectronic Industrial Technology Research Institute Co.,Ltd.
Original Assignee
YANTAI DONGFANG ANALYTICAL INSTRUMENT CO Ltd
SHANDONG DONGYI PHOTOELECTRIC INSTRUMENT CO Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by YANTAI DONGFANG ANALYTICAL INSTRUMENT CO Ltd, SHANDONG DONGYI PHOTOELECTRIC INSTRUMENT CO Ltd filed Critical YANTAI DONGFANG ANALYTICAL INSTRUMENT CO Ltd
Priority to CN201910862705.7A priority Critical patent/CN110530516A/zh
Publication of CN110530516A publication Critical patent/CN110530516A/zh
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02Details
    • G01J3/0205Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
    • G01J3/0208Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using focussing or collimating elements, e.g. lenses or mirrors; performing aberration correction
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/12Generating the spectrum; Monochromators
    • G01J3/18Generating the spectrum; Monochromators using diffraction elements, e.g. grating
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/12Generating the spectrum; Monochromators
    • G01J3/18Generating the spectrum; Monochromators using diffraction elements, e.g. grating
    • G01J3/1804Plane gratings
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28Investigating the spectrum
    • G01J3/2803Investigating the spectrum using photoelectric array detector
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28Investigating the spectrum
    • G01J3/2823Imaging spectrometer
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28Investigating the spectrum
    • G01J3/443Emission spectrometry
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/71Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
    • G01N21/73Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited using plasma burners or torches

Abstract

本发明公开一种用于电感耦合等离子体发射光谱仪的分光色散装置,按光路传播方向包括汇聚透镜、分光镜和光栅;所述分光镜为半反半透棱镜。所述光栅为两个,分别为平场光栅和平面光栅。光源发出的光信号经汇聚透镜聚焦后,通过半反半透棱镜将光分成两束,分别为透射光和反射光,其中透射光经过平场光栅色散分光,反射光经过平面光栅色散分光。

Description

一种用于电感耦合等离子体发射光谱仪的分光色散装置
技术领域
本发明涉及一种用于电感耦合等离子体发射光谱仪的分光色散装置。
背景技术
目前电感耦合等离子体发射光谱仪采用分光系统有Paschen-Runge光路,Czerny-Turner光路及中阶梯光栅光路,Paschen-Runge光路通常采用光电倍增管为检测器,其缺点在于灵活性较差,不方便添加元素的通道,所测定的元素个数受限。Czerny-Turner光路的缺点在于由电机带动光栅旋转从而实现波长扫描分析,涉及传动机构,故稳定性较差,此外,波长覆盖较窄。中阶梯光栅光路的缺点在于光路复杂,谱图解析困难,分光系统需要使用中阶梯光栅及面阵CCD,故仪器制造成本非常高。
发明内容
为解决背景技术中的技术问题,本发明提供一种分光色散装置,通过半反半透棱镜形成两种不同类型的光路,波长覆盖范围宽,分辨率高,光路简单,易于安装调试,不涉及传动机构,仪器稳定可靠。
本发明的技术方案如下:
一种用于电感耦合等离子体发射光谱仪的分光色散装置,按光路传播方向包括汇聚透镜、分光镜和光栅;所述分光镜为半反半透棱镜。
优选的,所述光栅为两个,分别为平场光栅和平面光栅。光源发出的光信号经汇聚透镜聚焦后,通过半反半透棱镜将光分成两束,分别为透射光与反射光;透射光经过平场光栅色散分光,反射光经过平面光栅色散分光。
进一步优选,所述透射光与平场光栅之间设置狭缝及光阑组件,所述反射光与平面光栅之间设置狭缝及光阑组件。
进一步优选,所述透射光与反射光经光栅分光后分别通过CCD检测器检测光信号。所述透射光经光栅分色散光后通过7块线阵CCD检测器A检测光信号,所述反射光经光栅分光后通过1块线阵CCD检测器B检测光信号。
再进一步,所述线阵CCD检测器A的波长覆盖范围为170-450nm,所述线阵CCD检测器B的波长覆盖范围为440-900nm。
再进一步,所述反射光的光路经平面狭缝及光阑组件后,经准直凹面反射镜反射,然后经平面光栅色散分光后到达成像凹面准直镜成像,最后成像通过线阵CCD检测器B检测光信号。
平场及平面光栅同时分光后,光信号同时到达线阵CCD检测器,同时给出170-450nm及440-900nm谱线信息。170-450nm及440-900nm谱线重叠的部分可以通过一定的数学模型算法(440-450nm谱线重叠,取中间波长445nm为界,低于445nm的波长取凹面光栅的分光范围170-445nm,高于445nm波长取平面光栅的分光范围445-900nm),使之形成覆盖170-900nm的全谱图,直观对谱图进行元素的定性解析。
与现有技术相比,本发明具有如下技术效果:
本发明的分光色散装置装置波长覆盖范围宽,分辨率高,光路简单,易于安装调试,不涉及传动机构,仪器稳定可靠,不仅可以用于电感耦合等离子体发射光谱仪对液体溶液的定量分析,且也可用于激光烧蚀进样系统实现对固体样品的直接定量分析。
附图说明
图1为本发明分光色散装置的光路图;
图2为平场狭缝及光阑组件3及平面狭缝及光阑组件6的结构图;
其中:1、会聚透镜;2、半反半透棱镜;3、平场狭缝及光阑组件;4、平场光栅;5、线阵CCD检测器A;6、平面狭缝及光阑组件;7、准直凹面反射镜;8、平面光栅;9成像凹面准直镜;10、线阵CCD检测器B;11、光阑;12、固定板A;13、固定板B;14、狭缝底板;15、缝片;16、狭缝。
具体实施方式
以下结合附图对本发明的原理和特征进行描述,所举实例只用于解释本发明,并非用于限定本发明的范围。
如图1所示,电感耦合等离子体光源发出的光信号经会聚透镜1聚焦后,射向半反半透棱镜2同时分成两束光路,分别为透射光路与反射光路;透射光路经平场狭缝及光阑组件3后到达平场光栅4,然后经平场光栅色散后到达线阵CCD检测器A 5检测光信号,线阵CCD检测器A 5为7块,波长覆盖范围170-450nm。反射光路经平面狭缝及光阑组件6,经准直凹面反射镜7反射,然后经平面光栅8色散分光后到达成像凹面准直镜9成像,最后成像在线阵CCD检测器B10上,波长覆盖范围为440-900nm。
平场光栅4与平面光栅8分光后,光信号同时到达线阵CCD检测器A 5和线阵CCD检测器B10,同时给出170-450nm及440-900nm谱线信息。170-450nm及440-900nm谱线重叠的部分可以通过一定的数学模型算法,使之形成覆盖170-900nm的全谱图,直观对谱图进行元素的定性解析。
如图2所示,本发明的狭缝及光阑组件沿光路方向包括光阑11、固定板A 12、狭缝底板14和两个缝片15,两个缝片中设置狭缝16,固定板A12与狭缝底板支撑于固定板B13之上。
本发明通过半反半透棱镜形成两种不同类型的光路,波长覆盖范围宽,分辨率高,光路简单,易于安装调试,不涉及传动机构,仪器稳定可靠。
以上所述仅为本发明的较佳实施例,并不用以限制本发明,凡在本发明的精神和原则之内,所作的任何修改、等同替换、改进等,均应包含在本发明的保护范围之内。

Claims (8)

1.一种用于电感耦合等离子体发射光谱仪的分光色散装置,其特征在于:按光路传播方向包括汇聚透镜、分光镜和光栅;所述分光镜为半反半透棱镜。
2.根据权利要求1所述的分光色散装置,其特征在于:所述光栅为两个,分别为平场光栅和平面光栅。
3.根据权利要求2所述的分光色散装置,其特征在于:光源发出的光信号经汇聚透镜聚焦后,通过半反半透棱镜将光分成两束,分别为透射光与反射光;其中透射光经过平场光栅色散分光,反射光经过平面光栅色散分光。
4.根据权利要求3所述的分光色散装置,其特征在于:所述透射光与平场光栅之间设置狭缝及光阑组件,所述反射光与平面光栅之间设置狭缝及光阑组件。
5.根据权利要求3或4所述的分光色散装置,其特征在于:所述透射光与反射光经光栅分光后分别通过CCD检测器检测光信号。
6.根据权利要求5所述的分光色散装置,其特征在于:所述透射光经光栅分光色散后通过7块线阵CCD检测器A检测光信号,所述反射光经光栅分光后通过1块线阵CCD检测器B检测光信号。
7.根据权利要求6所述的分光色散装置,其特征在于:所述线阵CCD检测器A的波长覆盖范围为170-450nm,所述线阵CCD检测器B的波长覆盖范围为440-900nm。
8.根据权利要求6所述的分光色散装置,其特征在于:所述反射光的光路经狭缝及光阑组件后,经准直凹面反射镜反射,然后经平面光栅色散分光后到达成像凹面准直镜成像,最后成像通过CCD检测器检测光信号。
CN201910862705.7A 2019-09-12 2019-09-12 一种用于电感耦合等离子体发射光谱仪的分光色散装置 Pending CN110530516A (zh)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201910862705.7A CN110530516A (zh) 2019-09-12 2019-09-12 一种用于电感耦合等离子体发射光谱仪的分光色散装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201910862705.7A CN110530516A (zh) 2019-09-12 2019-09-12 一种用于电感耦合等离子体发射光谱仪的分光色散装置

Publications (1)

Publication Number Publication Date
CN110530516A true CN110530516A (zh) 2019-12-03

Family

ID=68668362

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201910862705.7A Pending CN110530516A (zh) 2019-09-12 2019-09-12 一种用于电感耦合等离子体发射光谱仪的分光色散装置

Country Status (1)

Country Link
CN (1) CN110530516A (zh)

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5394237A (en) * 1992-11-10 1995-02-28 Geophysical & Enviromental Research Corp. Portable multiband imaging spectrometer
CN1338623A (zh) * 2001-10-12 2002-03-06 周向前 微型双光谱检测生化分析仪
CN1771429A (zh) * 2003-02-27 2006-05-10 美国瓦里安澳大利亚有限公司 分光光度计
CN101963529A (zh) * 2010-09-03 2011-02-02 北京理工大学 极远紫外扫描成像光谱仪
CN105928688A (zh) * 2016-04-19 2016-09-07 中国科学院上海光学精密机械研究所 基于单次曝光模式的光栅衍射效率光谱的测量装置和方法
US10247611B1 (en) * 2014-12-18 2019-04-02 J.A. Wooliam Co., Inc. Enhanced detector operation made possible by application of a functional plurality of gratings and combination dichroic beam splitter-prisms

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5394237A (en) * 1992-11-10 1995-02-28 Geophysical & Enviromental Research Corp. Portable multiband imaging spectrometer
CN1338623A (zh) * 2001-10-12 2002-03-06 周向前 微型双光谱检测生化分析仪
CN1771429A (zh) * 2003-02-27 2006-05-10 美国瓦里安澳大利亚有限公司 分光光度计
CN101963529A (zh) * 2010-09-03 2011-02-02 北京理工大学 极远紫外扫描成像光谱仪
US10247611B1 (en) * 2014-12-18 2019-04-02 J.A. Wooliam Co., Inc. Enhanced detector operation made possible by application of a functional plurality of gratings and combination dichroic beam splitter-prisms
CN105928688A (zh) * 2016-04-19 2016-09-07 中国科学院上海光学精密机械研究所 基于单次曝光模式的光栅衍射效率光谱的测量装置和方法

Similar Documents

Publication Publication Date Title
EP1144965B1 (en) Spectrometer
US7157711B1 (en) Microspectrometer gas analyzer
TW201205114A (en) Linear chromatic confocal microscope system
JP2009544015A (ja) コンパクトな反射屈折分光計
CN206656801U (zh) 紧凑型ccd阵列光谱仪以及拉曼光谱检测系统
JP4581118B2 (ja) 顕微鏡の照射光路における物体光の波長または波長領域を調整して集束化するための光学配置を有する顕微鏡
US20210199504A1 (en) Apparatus and method for reducing interference in an optical spectroscopy probe having a collimated sample beam
CN111879239A (zh) 光谱共焦测量装置及测量方法
CN107037437B (zh) 厚度测量装置及厚度测量方法
EP3400428B1 (en) High resolution broadband monolithic spectrometer and method
EP1560039A1 (en) Small sized wide wave-range spectroscope
CN108037111A (zh) 手持式libs光学系统
US20100014076A1 (en) Spectrometric apparatus for measuring shifted spectral distributions
CN111208072A (zh) 一种痕量气体浓度检测的光谱系统
CN110501074B (zh) 高通量宽谱段高分辨率的相干色散光谱成像方法及装置
JP5356804B2 (ja) ラマン散乱光測定装置
CN110530516A (zh) 一种用于电感耦合等离子体发射光谱仪的分光色散装置
CN207730671U (zh) 手持式libs光学系统
CN111982280A (zh) 光谱仪装置
CN108713135B (zh) 一种光谱分析系统
JP2006300661A (ja) 干渉計,フーリエ分光装置
JP5363976B2 (ja) 反射率測定による特性評価の測定装置と方法
CN113916151B (zh) 一种光谱黑洞共焦测量面型或厚度的装置及方法
CN211877753U (zh) 一种痕量气体浓度检测的光谱系统
KR20220112030A (ko) 대면적 시료 측정용 다중 광섬유 분광 분석 장치

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
TA01 Transfer of patent application right
TA01 Transfer of patent application right

Effective date of registration: 20210609

Address after: 264670 No.28, Chuangxin Road, hi tech Zone, Yantai City, Shandong Province

Applicant after: SHANDONG DONGYI PHOTOELECTRIC INSTRUMENTS Co.,Ltd.

Applicant after: Yantai Dongyi Optoelectronic Industrial Technology Research Institute Co.,Ltd.

Address before: No.28, Chuangxin Road, hi tech Zone, Yantai City, Shandong Province

Applicant before: SHANDONG DONGYI PHOTOELECTRIC INSTRUMENTS Co.,Ltd.

Applicant before: YANTAI DONGFANG ANALYTICAL INSTRUMENTS Co.,Ltd.

RJ01 Rejection of invention patent application after publication
RJ01 Rejection of invention patent application after publication

Application publication date: 20191203