CN110489842A - A kind of aided design system and analysis method of analog cell circuit - Google Patents
A kind of aided design system and analysis method of analog cell circuit Download PDFInfo
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Abstract
A kind of aided design system of analog cell circuit disclosed by the invention, including circuit structure reads in module, design objective reads in module, example generation module and analysis module；The circuit structure reads in module and analog cell circuit structure is input to example generation module；The design objective reads in module and the corresponding design objective of analog cell circuit is input to example generation module, and the example generation module generates example set, and example set is input to analysis module and carries out simulation analysis；To obtain the correlation information in analog cell circuit between each device parameters and analog cell circuit performance.The aided design system and analysis method of a kind of analog cell circuit provided by the invention, good initial setting up can be provided for the design of analog cell circuit, help improves the speed of analog cell circuit design iteration, especially can provide useful instructive information for the insufficient designer of experience.
Description
Technical field
The present invention relates to analog cell circuit analysis fields, and in particular to a kind of aided design system of analog cell circuit
And analysis method.
Background technique
When carrying out the design of analog cell circuit, systems organization is carried out in advance, determines the design of analog cell circuit
Index, i.e. analog cell circuit performance to be achieved, engineer needs to debug device parameters repeatedly later, with reality
Existing above-mentioned design objective.Wherein, it in debugging process repeatedly, generally requires to carry out multiple permutation and combination to each device parameters,
And obtain a result to each combined running, then the result of multiple permutation and combination is subjected to analysis comparison, entire debugging process needs
Waste a large amount of time.Especially when designer's experience deficiency, it is generally difficult to obtain a preferable initial setting up (mould
The initial value of quasi-simple member circuit structure and device parameters), it needs to take more time to the device parameters in larger range
It is debugged, is unfavorable for the Iterative Design of speeding-up simulation element circuit.
In the design process of analog cell circuit, it will usually have multiple analog cell circuits while be debugged, be needed
Performance preferable one is selected after debugging, the debugging when designer's experience deficiency, for single analog cell circuit
With regard to needing to take a significant amount of time, when facing multiple analog cell circuits, need respectively to be adjusted each analog cell circuit
Examination, and according to the performance of the more each analog cell circuit of debugging result, it is difficult to performance preferably mould is selected within a short period of time
Quasi- element circuit.
Summary of the invention
The object of the present invention is to provide a kind of aided design system of analog cell circuit and analysis methods, can be simulation
The design of element circuit provides good initial setting up, helps the speed for improving analog cell circuit design iteration, especially may be used
To provide useful instructive information for the insufficient designer of experience.
To achieve the goals above, the present invention adopts the following technical scheme: a kind of Computer Aided Design system of analog cell circuit
System, including circuit structure reads in module, design objective reads in module, example generation module and analysis module；The circuit structure
It reads in module and design objective reads in module and connects example generation module, the output port connection of the example generation module simultaneously
The analysis module；
The circuit structure reads in module and analog cell circuit structure is input to example generation module；The design objective
It reads in module and the corresponding design objective of analog cell circuit is input to example generation module, the example generation module is according to mould
Quasi-simple member circuit structure and design objective generate example set, and example set is input to analysis module and carries out simulation analysis；To
Obtain the correlation information in analog cell circuit between each device parameters and analog cell circuit performance.
Further, the correlation information includes contribution degree of each device parameters to analog cell circuit performance.
Further, the example generation module generates each device of the analog cell circuit based on Monte carlo algorithm
Part parameter, and obtain the example set formed by each device parameters.
Further, the example set includes multiple examples of different components parameter combination.
Further, the analysis module emulates the example set using integrated circuit simulating tool, and to mould
Each device parameters are analyzed with simulation result in quasi- element circuit, obtain each device parameters and mould in analog cell circuit
Correlation information between quasi-simple member circuit performance.
Further, the analysis module return to device parameters each in analog cell circuit and simulation result and divide
Analysis.
Further, the circuit structure reads in module and A analog cell circuit structure is input to example generation module；
The design objective reads in module and the corresponding design objective of A analog cell circuit is input to example generation module, and described point
Analysis module obtains the correlation information of A analog cell circuit respectively；A is the integer greater than 0.
A method of simulation analysis is carried out using the aided design system of analog cell circuit, is included the following steps:
S01: circuit structure reads in module and analog cell circuit structure is input to example generation module；Design objective is read in
The corresponding design objective of analog cell circuit is input to example generation module by module；
S02: example generation module generates the first example set according to analog cell circuit structure and design objective, and is passed
Transport to analysis module；Wherein, each device parameters sparse value in value range in the first example set；
S03: analysis module carries out simulation analysis to the first example set, obtains each device parameters and analog cell circuit
The first correlation information between energy；When the initial relevance between device parameters and analog cell circuit performance is greater than threshold value
When, determine that the device parameters are to careful analysis parameter；
S04: example generation module generates the second example set, and transmits it to analysis module, wherein in the second example set
It is each to careful analysis parameter in value range fine and closely woven value；
S05: analysis module carries out simulation analysis to the second example set, obtains each device parameters and analog cell circuit
The second correlation information between energy.
Further, step S03-S05 can also be repeated after the step S05, obtains each device parameters and simulation
P correlation information between element circuit performance, P are the positive integer greater than 2.
Further, circuit structure reads in module and A analog cell circuit structure is input to example in the step S01
Generation module；The design objective reads in module and the corresponding design objective of A analog cell circuit is input to example generation mould
Block, A are the integer greater than 0.
Further, the example generation module is generated each in the analog cell circuit based on Monte carlo algorithm
Device parameters, to obtain the first example set and the second example set.
The invention has the benefit that aided design system of the present invention can provide very well for the design of analog cell circuit
Initial setting up, then designer carry out on this basis analog cell circuit total system grade design, help improve mould
The speed of quasi-simple member circuit design iteration, especially can provide useful instructive information for the insufficient designer of experience.
Also, for the analog cell circuit of some function, usually there are many analog cell circuit structure is available, using the present invention
Aided design system and analysis method, the performance information of the analog cell circuit of different structure can be obtained simultaneously, to be
The structure choice of some functional unit circuit provides information, promotes the speed of research and development.
Detailed description of the invention
Attached drawing 1 is a kind of aided design system schematic diagram of analog cell circuit of the present invention；
Attached drawing 2 is the method flow diagram that aided design system carries out simulation analysis in the present invention.
Specific embodiment
To make the object, technical solutions and advantages of the present invention clearer, with reference to the accompanying drawing to specific reality of the invention
The mode of applying is described in further detail.
As shown in Figure 1, a kind of aided design system of analog cell circuit provided by the invention, including circuit structure are read in
Module, design objective read in module, example generation module and analysis module；Circuit structure reads in module and design objective reads in mould
Block connects example generation module, the output port linking parsing module of example generation module simultaneously.
Circuit structure reads in the structure that module is used to read in analog cell circuit, and design objective reads in module for reading in mould
The quasi- corresponding design objective of element circuit, wherein design objective refers to analog cell circuit performance to be achieved, is to be
It has been had determined when system planning, the debugging process of analog cell circuit is exactly that optimal analogue unit is obtained according to design objective
Circuit structure and its corresponding device parameters, and analog cell circuit is usually predetermined one or more based on experience value
Structure.
When carrying out assistant analysis using aided design system of the present invention, circuit structure reads in module for analog cell circuit
Structure is input to example generation module；Design objective reads in module and the corresponding design objective of analog cell circuit is input to example
Generation module, example generation module are generated respectively according to analog cell circuit structure and design objective, and based on Monte carlo algorithm
A device parameters value (resistance, capacitor, metal-oxide-semiconductor value etc. in the analog cell circuit of structure determination), then by analog cell circuit
In each device parameters carry out the design such as permutation and combination, form design example set, also referred to as example set.Wherein, example set includes
Multiple examples of different components parameter combination, and when example generation module generation example set, it needs to be determined according to design performance
The substantially value range of each device parameters in analog cell circuit, then multiple device parameters values are chosen in the value range
(being generated based on Monte carlo algorithm), and the device parameters value of various combination is combined to form multiple examples, i.e. example set.
Example set is input to analysis module and carries out simulation analysis by example generation module；To obtain each device in analog cell circuit
Correlation information between parameter and analog cell circuit performance, wherein analysis module is using integrated circuit simulating tool to reality
Example collection is emulated, and is analyzed with simulation result each device parameters, specifically, can tie to device parameters and emulation
Fruit carries out regression analysis, obtains the correlation information between device parameters and analog cell circuit performance.Specific correlation letter
Breath includes contribution degree of each device parameters to analog cell circuit performance, wherein analog cell circuit performance may include this
Each performance indicator of analog cell circuit, such as: node (node) voltage, Node Current, circuit power consumption, rising time,
Failing edge time, shift time etc..The regression analysis referred in the present invention is a kind of analysis method in the prior art, is one
For kind to device parameters and (example that device parameters are formed) method that simulation result is analyzed, its purpose is to find out device
Rule between part parameter x and analog cell circuit performance y is used for subsequent prediction, by regression analysis it can be concluded that device is joined
How number x influences the rule of analog cell circuit performance y, i.e. (y1, y2 ... yn)=f (x1, x2 ... xm), n and m are positive whole
Number, n indicate the performance indicator number for the analog cell circuit selected by designer, each device ginseng in m indication circuit structure
Several numbers.
Aided design system can carry out assistant analysis to single analog cell circuit in the present invention, can also be to multiple
Analog cell circuit carries out assistant analysis simultaneously.When carrying out assistant analysis to single analog cell circuit, by single simulation
Element circuit structure and design objective read in module by circuit structure reading module and design objective and are input to example generation mould
In block；Final analysis module obtains to be in the analog cell circuit between each device parameters and analog cell circuit performance
Correlation information.When carrying out assistant analysis to multiple analog cell circuits, multiple analog cell circuit structures and design are referred to
Mark reads in module by circuit structure and design objective reads in module and is input in example generation module simultaneously；Final analysis module
Obtain to be correlation information in multiple analog cell circuits between each device parameters and analog cell circuit performance, and each
The correlation information of a analog cell circuit is independent of one another, i.e., aided design system is in the analysis to multiple analog cell circuits
Journey is independent；Designer is compared by the correlation information of each analog cell circuit, can have specific function with quick obtaining
The analog cell circuit structure of energy.For example, circuit structure, which reads in module, is input to example generation for A analog cell circuit structure
Module；Design objective reads in module and the corresponding design objective of A analog cell circuit is input to example generation module, and final point
Analysis module show that the correlation information of A analog cell circuit, A are the integer greater than 1 respectively.
In view of the quantity of device parameters in analog cell circuit may be very huge, so if disposable generate is contained
The example set of multiple permutation and combination, is on the one hand unable to fully the correlation using between device parameters and circuit performance index, and two
It is the finiteness due to hardware resources such as servers, the design example of only limited quantity can be emulated simultaneously.In order to
Example generation module, which generates example set, more has purpose and directive property, and the present invention will be asked according to possessed hardware resource
Referring to Fig.2, carrying out simulation analysis to analog cell circuit using following steps:
S01: circuit structure reads in module and analog cell circuit structure is input to example generation module；Design objective is read in
The corresponding design objective of analog cell circuit is input to example generation module by module；
S02: example generation module generates the first example set according to analog cell circuit structure and design objective, and is passed
Transport to analysis module；Wherein, each device parameters sparse value in value range in the first example set.
Since hardware resource limits, example generation module joins each device when generating the first example set in this step
Several values is more sparse, such as 3 values are only taken within the scope of 10-20nm for metal-oxide-semiconductor width in analog cell circuit, passes through
Permutation and combination between more sparse device parameters, the example negligible amounts in the first example set, can be improved operation efficiency.
S03: analysis module carries out simulation analysis to the first example set, obtains each device parameters and analog cell circuit
The first correlation information between energy；When the initial relevance between device parameters and analog cell circuit performance is greater than threshold value
When, determine that the device parameters are to careful analysis parameter.
Wherein, the first correlation information includes each device parameters to the contribution degree of analog cell circuit performance and each
(analysis module passes through to device parameters x and simulation result progress rule between device parameters x and analog cell circuit performance y
Regression analysis obtains), according to the first correlation information obtained, when contribution degree of some device parameters to analog cell circuit is big
When given threshold, determine that the device parameters are to careful analysis parameter.By above-mentioned analysis divide to careful analysis parameter
The device parameters being as affected to analog cell circuit performance, non-device parameter are to influence on analog cell circuit performance
Lesser device parameters.
S04: example generation module generates the second example set according to analog cell circuit structure and design objective, and is passed
Transport to analysis module, wherein in the second example set it is each to careful analysis parameter in value range fine and closely woven value.
Wherein, when example generation module generates the second example set, the value for treating careful analysis parameter is more fine and closely woven, such as
9 values are taken within the scope of 10-20nm for metal-oxide-semiconductor width in analog cell circuit (to careful analysis parameter), by fine and closely woven
Permutation and combination between device parameters, still can be sparse for the non-value to careful analysis parameter；In second example set
Example focuses in the device parameters being affected to analog cell circuit performance.It is worth noting that the second example set is
It is obtained based on value fine and closely woven in value range, wherein value range here can contract compared to the value range in S02
It is small or remain unchanged.Such as by taking resistance value a certain in circuit structure as an example, if the resistance takes when forming the first example set
Being worth range is (0.0001 Ω, 0.1 Ω), then 0.0001 Ω, 0.001 Ω, 0.01 Ω and 0.01 Ω can be taken when sparse value,
If circuit performance changes greatly when discovery is between value 0.001 Ω and 0.01 Ω when analyzing through step S03, formed
When the second example set, value range be (0.001 Ω, 0.01 Ω) fine and closely woven value can be 0.002 Ω, 0.003 Ω, 0.004 Ω,
0.005Ω,0.006Ω,0.007Ω,0.008Ω,0.009Ω；Remaining device parameters and so on.
S05: analysis module carries out simulation analysis to the second example set, obtains each device parameters and analog cell circuit
The second correlation information between energy.The correlation information obtained at this time is obtained after treating careful analysis parameter selective analysis
Out, the correlation information between device parameters and analog cell circuit is better reflected.
In time allowed band, step S03-S05 can also be repeated, on the basis of the second correlation information obtained
On, third example set, the 4th example set, the 5th example set are regenerated, until P example set；And simulation analysis is carried out respectively,
From which further follow that third correlation information between each device parameters and analog cell circuit performance, the 4th correlation information,
5th correlation information, until P correlation information, P is the positive integer greater than 2.Wherein, each circulating repetition reality generated
The example set that example collection obtains after being the value finer and closely woven after the progress of careful analysis parameter obtained to last circulating repetition, warp
After simulation analysis, more accurate correlation information can be all obtained, to preferably be the design of later analog cell circuit
Tutorial message is provided.Meanwhile the correlation information that obtains is recycled every time more last can recycle the correlation information obtained more
For refinement, such as when analyzing influence of the metal-oxide-semiconductor width to node voltage, third correlation information includes three parameter (metal-oxide-semiconductors
Width) influence to node voltage, the 4th correlation information includes influence of five parameters (metal-oxide-semiconductor width) to node voltage.
It can cycle-index or fine and closely woven value degree determines according to actual conditions in the present invention, wherein in cyclic process, recycle each time
Value range can be limited with further progress, and value can also further it is fine and closely woven；For example, in circuit structure on certain resistance
Value range is (0.001 Ω, 0.01 Ω) when one cycle, and value is respectively 0.002 Ω, 0.003 Ω, 0.004 Ω, 0.005
Ω, 0.006 Ω, 0.007 Ω, 0.008 Ω, 0.009 Ω, if found between value 0.005 Ω and 0.01 Ω through analysis
Circuit performance changes greatly, then next time recycle when value range be (0.005 Ω, 0.01 Ω), value be respectively 0.0055 Ω,
0.006Ω、0.0065Ω、0.007Ω、0.0075Ω、0.008Ω、0.0085Ω、0.009Ω。
Above-mentioned analysis method can carry out assistant analysis to single analog cell circuit, can also be to multiple analogue units
Circuit carries out assistant analysis simultaneously.When carrying out assistant analysis to single analog cell circuit, by single analog cell circuit
Structure and design objective read in module by circuit structure reading module and design objective and are input in example generation module；Finally
Analysis module obtain be in the analog cell circuit between each device parameters and analog cell circuit performance correlation letter
Breath.When carrying out assistant analysis to multiple analog cell circuits, multiple analog cell circuit structures and design objective are passed through into electricity
Line structure reads in module and design objective reads in module and is input in example generation module simultaneously；Final analysis module, which obtains, is
Correlation information in multiple analog cell circuits between each device parameters and analog cell circuit performance, and each simulation is single
The correlation information of first circuit is independent of one another, and designer is compared by the correlation information of each analog cell circuit, can be fast
Speed obtains the analog cell circuit structure with specific function, so that the structure choice for the analog cell circuit of some function mentions
For information, the speed of research and development is promoted.
The above description is only a preferred embodiment of the present invention, and the embodiment is not intended to limit patent protection of the invention
Range, thus it is all with the variation of equivalent structure made by specification and accompanying drawing content of the invention, it similarly should be included in this
In the protection scope of invention appended claims.
Claims (10)
1. a kind of aided design system of analog cell circuit, which is characterized in that read in module, design objective including circuit structure
Read in module, example generation module and analysis module；The circuit structure reads in module and design objective reads in module and connects simultaneously
Example generation module is connect, the output port of the example generation module connects the analysis module；
The circuit structure reads in module and analog cell circuit structure is input to example generation module；The design objective is read in
The corresponding design objective of analog cell circuit is input to example generation module by module, and the example generation module is single according to simulation
First circuit structure and design objective generate example set, and example set is input to analysis module and carries out simulation analysis；To obtain
Correlation information in analog cell circuit between each device parameters and analog cell circuit performance.
2. a kind of aided design system of analog cell circuit according to claim 1, which is characterized in that the correlation
Information includes contribution degree of each device parameters to analog cell circuit performance.
3. a kind of aided design system of analog cell circuit according to claim 1, which is characterized in that the example is raw
Each device parameters of the analog cell circuit are generated based on Monte carlo algorithm at module, and are obtained by each device parameters
The example set of formation.
4. a kind of aided design system of analog cell circuit according to claim 1, which is characterized in that the example set
Multiple examples including different components parameter combination.
5. a kind of aided design system of analog cell circuit according to claim 1, which is characterized in that the analysis mould
Block emulates the example set using integrated circuit simulating tool, and to device parameters each in analog cell circuit and imitates
True result is analyzed, and the correlation letter in analog cell circuit between each device parameters and analog cell circuit performance is obtained
Breath.
6. a kind of aided design system of analog cell circuit according to claim 5, which is characterized in that the analysis mould
Block carries out regression analysis to device parameters each in analog cell circuit and simulation result.
7. a kind of aided design system of analog cell circuit according to claim 1, which is characterized in that the circuit knot
Structure reads in module and A analog cell circuit structure is input to example generation module；The design objective reads in module for A mould
The quasi- corresponding design objective of element circuit is input to example generation module, and the analysis module obtains A analogue unit electricity respectively
The correlation information on road；A is the integer greater than 0.
8. a kind of method that the aided design system using analog cell circuit carries out simulation analysis, which is characterized in that including such as
Lower step:
S01: circuit structure reads in module and analog cell circuit structure is input to example generation module；Design objective reads in module
The corresponding design objective of analog cell circuit is input to example generation module；
S02: example generation module generates the first example set according to analog cell circuit structure and design objective, and transmits it to
Analysis module；Wherein, each device parameters sparse value in value range in the first example set；
S03: analysis module carries out simulation analysis to the first example set, obtain each device parameters and analog cell circuit performance it
Between the first correlation information；When the initial relevance between device parameters and analog cell circuit performance is greater than threshold value, really
The fixed device parameters are to careful analysis parameter；
S04: example generation module generates the second example set, and transmits it to analysis module, wherein each in the second example set
To careful analysis parameter in value range fine and closely woven value；
S05: analysis module carries out simulation analysis to the second example set, obtain each device parameters and analog cell circuit performance it
Between the second correlation information.
9. analysis method according to claim 7, which is characterized in that step can also be repeated after the step S05
S03-S05 show that the P correlation information between each device parameters and analog cell circuit performance, P are just whole greater than 2
Number.
10. analysis method according to claim 7, which is characterized in that circuit structure reading module will in the step S01
A analog cell circuit structure is input to example generation module；The design objective reads in module for A analog cell circuit pair
The design objective answered is input to example generation module, and A is the integer greater than 0.
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN115421429A (en) * | 2022-09-26 | 2022-12-02 | 深圳安森德半导体有限公司 | Analog chip circuit design system and method |
| CN117150990A (en) * | 2023-09-06 | 2023-12-01 | 江苏芯海技术开发有限公司 | Enhanced visual integrated circuit design platform |
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