CN110489287A - Method, system and the storage medium of hot plug are tested by Ipmitool - Google Patents
Method, system and the storage medium of hot plug are tested by Ipmitool Download PDFInfo
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- CN110489287A CN110489287A CN201910630879.0A CN201910630879A CN110489287A CN 110489287 A CN110489287 A CN 110489287A CN 201910630879 A CN201910630879 A CN 201910630879A CN 110489287 A CN110489287 A CN 110489287A
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- pcie
- pcie device
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Classifications
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
- G06F11/221—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test buses, lines or interfaces, e.g. stuck-at or open line faults
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2268—Logging of test results
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2273—Test methods
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F13/00—Interconnection of, or transfer of information or other signals between, memories, input/output devices or central processing units
- G06F13/38—Information transfer, e.g. on bus
- G06F13/40—Bus structure
- G06F13/4004—Coupling between buses
- G06F13/4022—Coupling between buses using switching circuits, e.g. switching matrix, connection or expansion network
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F13/00—Interconnection of, or transfer of information or other signals between, memories, input/output devices or central processing units
- G06F13/38—Information transfer, e.g. on bus
- G06F13/40—Bus structure
- G06F13/4063—Device-to-bus coupling
- G06F13/4068—Electrical coupling
- G06F13/4081—Live connection to bus, e.g. hot-plugging
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F2213/00—Indexing scheme relating to interconnection of, or transfer of information or other signals between, memories, input/output devices or central processing units
- G06F2213/0026—PCI express
Abstract
The present invention relates to a kind of method, system and storage mediums that hot plug is tested by Ipmitool, comprising the following steps: S1: pre-treatment step: S2:PCIE slot power down, simulation PCIE device remove slot；S3: the information in place of PCIE device is obtained；S4: the outer plug-in card data information of PCIE slot is obtained；S5: check the log information of tested board system with the presence or absence of exception fail error log；S6:PCIE slot powers on, and simulation PCIE device is inserted into slot；S7: the information in place of PCIE device is obtained；S8: the outer plug-in card data information of PCIE slot is obtained；S9: check the log information of tested board system with the presence or absence of exception fail error log.
Description
Technical field
The invention belongs to hot plug the field of test technology, and in particular to a kind of side that hot plug is tested by Ipmitool
Method, system and storage medium.
Background technique
Traditional hot plug technology be reserved on mainboard key perhaps dial-up when needing replacing PCIE board or board goes out
, will be by key pressing when existing failure, PCIE power off slot, replaces PCIE outer plug-in card at this time, and the method is surveyed in the development phase
Occupancy resource is compared in examination.This is the deficiencies in the prior art.
In view of this, the present invention provides and a kind of tests the method for hot plug, system and storage medium by Ipmitool
Technical solution；With solve the problems, such as defect existing in the prior art and.
Summary of the invention
For existing in the prior art when needing replacing PCIE board or board and breaking down, will by key pressing,
PCIE power off slot at this time replaces PCIE outer plug-in card, and the method is the problem of development phase test and comparison occupies resource；
The present invention provides a kind of method, system and storage medium that hot plug is tested by Ipmitool, to solve the above technical problems.
To achieve the above object, the present invention provides following technical scheme:
In a first aspect, the present invention provides a kind of method for testing hot plug by Ipmitool, comprising the following steps:
S1: pre-treatment step:
Obtain the outer plug-in card data information of PCIE slot and the log information of tested board system；
S2:PCIE slot power down, simulation PCIE device remove slot；
S3: obtaining the information in place of PCIE device, if still detecting that PCIE device is in state in place, test result
For the failure of mainboard warm connection function, test method is directly exited；If detecting that PCIE device is in state not in place, continue
It performs the next step；
S4: the outer plug-in card data information of PCIE slot is obtained, and the PCIE obtained in the data information and step S1 is inserted
The outer plug-in card data information of slot compares, and the two is compared, if the PCIE device data information of state not in place is correct, after
Continuous next step；Otherwise test result is the failure of mainboard warm connection function, directly exits test method；
S5: checking that the log information of tested board system whether there is exception fail error log, if it does,
Then test result is the failure of mainboard warm connection function, directly exits test method；If it does not exist, then continuing in next step；
S6:PCIE slot powers on, and simulation PCIE device is inserted into slot；
S7: obtaining the information in place of PCIE device, if detecting that PCIE device is in state not in place, test result
For the failure of mainboard warm connection function, test method is directly exited；If detecting that PCIE device is in state in place, continue to hold
Row is in next step；
S8: the outer plug-in card data information of PCIE slot is obtained, and the PCIE obtained in the data information and step S1 is inserted
The outer plug-in card data information of slot compares；If data information is consistent, continue to execute in next step, otherwise based on test result
The failure of plate warm connection function, directly exits test method；
S9: checking that the log information of tested board system whether there is exception fail error log, if it does,
Then test result is the failure of mainboard warm connection function, directly exits test method；It is recycled if it does not exist, then going to step S2
Test.
Preferably, obtaining the extrapolation card information on tested PCIE slot in the step S1 by lspci and saving extremely
In first file；Outer plug-in card information includes: PCIE device device number to be measured, PCIE device DeviceID information to be measured, to be measured
PCEI equipment UEsta information, PCIE device CEsta information to be measured, Speed the and Width information for obtaining PCIE device to be measured；
The log information of tested board system includes Dmesg, Messages, Mcelog log information.
Above-mentioned data information is obtained, removes and be inserted into the data comparison of front and back, obtained test result as subsequent simulation
It is more accurate, it reduces and tests inaccurate rate.
Preferably, steps are as follows for the realization of the step S2:
It is sent after remove information receives remove information to CPLD, CPLD by ipmitool and passes to CPU, CPU hair
Signal drags down Pltform_RST out, and PCIE link disconnects, and RST drags down rear CPU for information back to CPLD, and VR is electrically disconnected,
PCIE slot power down, simulation PCIE device remove.
PCIE slot power down can fast and accurately be controlled using the step；Effectively ensure that PCIE slot is in power down shape
State；It is more accurate to simulate PCIE device removal.
Preferably, the step S4 is implemented as follows:
The extrapolation card information on tested PCIE slot is obtained by lspci instruction and is saved into the second file；The step
The information of acquisition includes the device number of PCIE device to be measured and the DeviceID information of PCIE device to be measured；In step S1
The data of acquisition compare, if the PCIE device number of state not in place and DeviceID are correct, continue to execute next
Step, otherwise test result is the failure of mainboard warm connection function, directly exits test method.
After capable of quickly being removed to PCIE device simulation by the step, the comparison of the outer plug-in card data of PCIE slot, and
Make accurate judgement.
Preferably, the step S6 is implemented as follows:
It is sent after insert information receives insert information to CPLD, CPLD by ipmitool and passes to CPU, CPU hair
Signal draws high Pltform_RST out, and PCIE link closure, RST draws high rear CPU for information back to CPLD, VR is conducted,
PCIE slot powers on, simulation PCIE insertion.
PCIE slot can be fast and accurately controlled using the step to power on；Effectively ensure that PCIE slot is in and powers on shape
State；It is more accurate to simulate PCIE device insertion.
Preferably, the step S8 is implemented as follows:
The extrapolation card information on tested PCIE slot is obtained by lspci instruction and is saved into third file,
Third file and the first file storage data information are compared；If PCIE device device number to be measured, to be measured
PCIE device DeviceID information, PCIE device CEsta information to be measured, obtains PCIE to be measured at PCEI equipment UEsta information to be measured
Speed the and Width information of equipment is corresponding consistent, then continues to execute and operate in next step, and otherwise test result is mainboard heat
Disabler is plugged, test method is directly exited.
After capable of being quickly inserted into PCIE device simulation by the step, the comparison of the outer plug-in card data of PCIE slot, and
Make accurate judgement.
Second aspect, the present invention provide a kind of system for testing hot plug by Ipmitool, comprising:
Preprocessing module: the outer plug-in card data information of PCIE slot and the log information of tested board system are obtained；It is logical
Lspci is crossed to obtain the extrapolation card information on tested PCIE slot and save into the first file；
Simulation PCIE device remove module: remove information is sent by ipmitool and receives remove to CPLD, CPLD
CPU is passed to after information, CPU issues signal and drags down Pltform_RST, and PCIE link disconnects, and RST drags down rear CPU for information
CPLD is returned to, VR is electrically disconnected, PCIE slot power down, simulation PCIE device removes；
Data comparison module after simulation removes: the extrapolation card information on tested PCIE slot is obtained simultaneously by lspci instruction
It saves into the second file；The step obtain information include PCIE device to be measured device number and PCIE device to be measured
DeviceID information；It is compared with the data obtained in preprocessing module；
Simulation PCIE device is inserted into module: sending insert information by ipmitool and receives insert to CPLD, CPLD
CPU is passed to after information, CPU issues signal and draws high Pltform_RST, and PCIE link closure, RST draws high rear CPU for information
CPLD is returned to, VR is conducted, PCIE slot powers on, simulation PCIE insertion；
Data comparison module after simulation insertion: the extrapolation card information on tested PCIE slot is obtained simultaneously by lspci instruction
It saves to third file, third file and the first file storage data information is compared.
Preferably, obtaining the extrapolation card information on tested PCIE slot in the preprocessing module by lspci and protecting
It deposits into the first file；Outer plug-in card information include: PCIE device device number to be measured, PCIE device DeviceID information to be measured, to
Survey PCEI equipment UEsta information, PCIE device CEsta information to be measured, Speed and the Width letter for obtaining PCIE device to be measured
Breath；
The log information of tested board system includes Dmesg, Messages, Mcelog log information.
Above-mentioned data information is obtained, removes and be inserted into the data comparison of front and back, obtained test result as subsequent simulation
It is more accurate, it reduces and tests inaccurate rate.
The third aspect, the present invention provide a kind of computer storage medium, instruction are stored in the computer storage medium,
When run on a computer, so that computer executes the above method.
Fourth aspect provides a kind of terminal, comprising:
Processor, memory, wherein the memory is used to store computer program,
The processor from memory for calling and running the computer program, so that terminal executes the above method.
The beneficial effects of the present invention are cooperate CPLD to carry out power-off and upper electrical measurement to hot plug slot by Ipmitool
Examination, and examine warm connection function whether abnormal by the PCIE device information inspection on slot, realize PCIE hot plug
Automatic test saves the testing time, improves product quality and testing efficiency.
In addition, design principle of the present invention is reliable, structure is simple, has very extensive application prospect.
Detailed description of the invention
In order to more clearly explain the embodiment of the invention or the technical proposal in the existing technology, to embodiment or will show below
There is attached drawing needed in technical description to be briefly described, it should be apparent that, for those of ordinary skill in the art
Speech, without creative efforts, is also possible to obtain other drawings based on these drawings.
Fig. 1 is a kind of flow chart for method that hot plug is tested by Ipmitool that the embodiment of the present invention 1 provides.
Fig. 2 is a kind of functional block diagram for system that hot plug is tested by Ipmitool that the embodiment of the present invention 2 provides.
Wherein, 1- preprocessing module, 2- simulate PCIE device remove module, data comparison module after 3- simulation removes, 4-
It simulates PCIE device and is inserted into module, data comparison module after 5- simulation insertion.
Specific embodiment
Technical solution in order to enable those skilled in the art to better understand the present invention, below in conjunction with of the invention real
The attached drawing in example is applied, technical scheme in the embodiment of the invention is clearly and completely described, it is clear that described implementation
Example is only a part of the embodiment of the present invention, instead of all the embodiments.Based on the embodiments of the present invention, this field is common
Technical staff's every other embodiment obtained without making creative work, all should belong to protection of the present invention
Range.
Embodiment 1:
As shown in Figure 1, the present embodiment provides a kind of methods for testing hot plug by Ipmitool, comprising the following steps:
S1: pre-treatment step:
Obtain the outer plug-in card data information of PCIE slot and the log information of tested board system；
The extrapolation card information on tested PCIE slot is obtained by lspci and saves info_present.txt；Outer plug-in card
Information include: PCIE device device number to be measured, PCIE device DeviceID information to be measured, PCEI equipment UEsta information to be measured, to
Speed the and Width information surveyed PCIE device CEsta information, obtain PCIE device to be measured；
The log information of tested board system includes Dmesg, Messages, Mcelog log information.
Above-mentioned data information is obtained, removes and be inserted into the data comparison of front and back, obtained test result as subsequent simulation
It is more accurate, it reduces and tests inaccurate rate.
S2:PCIE slot power down, simulation PCIE device remove slot；
It is sent after remove information receives remove information to CPLD, CPLD by ipmitool and passes to CPU, CPU hair
Signal drags down Pltform_RST out, and PCIE link disconnects, and RST drags down rear CPU for information back to CPLD, and VR is electrically disconnected,
PCIE slot power down, simulation PCIE device remove.
PCIE slot power down can fast and accurately be controlled using the step；Effectively ensure that PCIE slot is in power down shape
State；It is more accurate to simulate PCIE device removal.
S3: obtaining the information in place of PCIE device, if still detecting that PCIE device is in state in place, test result
For the failure of mainboard warm connection function, test method is directly exited；If detecting that PCIE device is in state not in place, continue
It performs the next step；
S4: the outer plug-in card data information of PCIE slot is obtained, and the PCIE obtained in the data information and step S1 is inserted
The outer plug-in card data information of slot compares, and the two is compared, if the PCIE device data information of state not in place is correct, after
Continuous next step；Otherwise test result is the failure of mainboard warm connection function, directly exits test method；
The extrapolation card information on tested PCIE slot is obtained by lspci instruction and saves info_remove.txt file
In；The information that the step obtains includes the device number of PCIE device to be measured and the DeviceID information of PCIE device to be measured；With
The data obtained in step S1 compare, if the PCIE device number of state not in place and DeviceID are correct, continue
It performs the next step, otherwise test result is the failure of mainboard warm connection function, directly exits test method.
After capable of quickly being removed to PCIE device simulation by the step, the comparison of the outer plug-in card data of PCIE slot, and
Make accurate judgement.
S5: checking that the log information of tested board system whether there is exception fail error log, if it does,
Then test result is the failure of mainboard warm connection function, directly exits test method；If it does not exist, then continuing in next step；
S6:PCIE slot powers on, and simulation PCIE device is inserted into slot；
It is sent after insert information receives insert information to CPLD, CPLD by ipmitool and passes to CPU, CPU hair
Signal draws high Pltform_RST out, and PCIE link closure, RST draws high rear CPU for information back to CPLD, VR is conducted,
PCIE slot powers on, simulation PCIE insertion.
PCIE slot can be fast and accurately controlled using the step to power on；Effectively ensure that PCIE slot is in and powers on shape
State；It is more accurate to simulate PCIE device insertion.
S7: obtaining the information in place of PCIE device, if detecting that PCIE device is in state not in place, test result
For the failure of mainboard warm connection function, test method is directly exited；If detecting that PCIE device is in state in place, continue to hold
Row is in next step；
S8: the outer plug-in card data information of PCIE slot is obtained, and the PCIE obtained in the data information and step S1 is inserted
The outer plug-in card data information of slot compares；If data information is consistent, continue to execute in next step, otherwise based on test result
The failure of plate warm connection function, directly exits test method；
The extrapolation card information on tested PCIE slot is obtained by lspci instruction and saves info_present_
After.txt file,
Info_present_after.txt file and info_present.txt file are compared；If to be measured
PCIE device device number, PCIE device DeviceID information to be measured, PCEI equipment UEsta information to be measured, PCIE device to be measured
CEsta information, Speed the and Width information for obtaining PCIE device to be measured are corresponding consistent, then continue to execute and grasp in next step
Make, otherwise test result is the failure of mainboard warm connection function, directly exits test method.
After capable of being quickly inserted into PCIE device simulation by the step, the comparison of the outer plug-in card data of PCIE slot, and
Make accurate judgement.
S9: checking that the log information of tested board system whether there is exception fail error log, if it does,
Then test result is the failure of mainboard warm connection function, directly exits test method；It is recycled if it does not exist, then going to step S2
Test.
Embodiment 2:
The present embodiment provides a kind of systems for testing hot plug by Ipmitool, comprising:
Preprocessing module: the outer plug-in card data information of PCIE slot and the log information of tested board system are obtained；It is logical
Lspci is crossed to obtain the extrapolation card information on tested PCIE slot and save info_present.txt；Outer plug-in card information include: to
Survey PCIE device device number, PCIE device DeviceID information to be measured, PCEI equipment UEsta information to be measured, PCIE device to be measured
CEsta information, Speed the and Width information for obtaining PCIE device to be measured；
The log information of tested board system includes Dmesg, Messages, Mcelog log information.
Above-mentioned data information is obtained, removes and be inserted into the data comparison of front and back, obtained test result as subsequent simulation
It is more accurate, it reduces and tests inaccurate rate.
Simulation PCIE device remove module: remove information is sent by ipmitool and receives remove to CPLD, CPLD
CPU is passed to after information, CPU issues signal and drags down Pltform_RST, and PCIE link disconnects, and RST drags down rear CPU for information
CPLD is returned to, VR is electrically disconnected, PCIE slot power down, simulation PCIE device removes；
Data comparison module after simulation removes: the extrapolation card information on tested PCIE slot is obtained simultaneously by lspci instruction
It saves in info_remove.txt file；The information that the step obtains includes the device number of PCIE device to be measured and to be measured
The DeviceID information of PCIE device；It is compared with the data obtained in preprocessing module；
Simulation PCIE device is inserted into module: sending insert information by ipmitool and receives insert to CPLD, CPLD
CPU is passed to after information, CPU issues signal and draws high Pltform_RST, and PCIE link closure, RST draws high rear CPU for information
CPLD is returned to, VR is conducted, PCIE slot powers on, simulation PCIE insertion；
Data comparison module after simulation insertion: the extrapolation card information on tested PCIE slot is obtained simultaneously by lspci instruction
Info_present_after.txt file is saved, by info_present_after.txt file and info_present.txt
File compares.
Embodiment 3:
The present embodiment provides a kind of computer storage medium, instruction is stored in the computer storage medium, when its
When being run on computer, so that computer executes the above method.
Embodiment 4:
The present embodiment provides a kind of terminals, comprising:
Processor, memory, wherein the memory is used to store computer program,
The processor from memory for calling and running the computer program, so that terminal executes the above method.
Although by reference to attached drawing and combining the mode of preferred embodiment to the present invention have been described in detail, the present invention
It is not limited to this.Without departing from the spirit and substance of the premise in the present invention, those of ordinary skill in the art can be to the present invention
Embodiment carry out various equivalent modifications or substitutions, and these modifications or substitutions all should in covering scope of the invention/appoint
What those familiar with the art in the technical scope disclosed by the present invention, can easily think of the change or the replacement, answer
It is included within the scope of the present invention.Therefore, protection scope of the present invention is answered described is with scope of protection of the claims
It is quasi-.
Claims (9)
1. a kind of method for testing hot plug by Ipmitool, which comprises the following steps:
S1: pre-treatment step:
Obtain the outer plug-in card data information of PCIE slot and the log information of tested board system；
S2:PCIE slot power down, simulation PCIE device remove slot；
S3: obtaining the information in place of PCIE device, if still detecting that PCIE device is in state in place, based on test result
The failure of plate warm connection function, directly exits test method；If detecting that PCIE device is in state not in place, continue to execute
In next step；
S4: obtaining the outer plug-in card data information of PCIE slot, and by the PCIE slot obtained in the data information and step S1
Outer plug-in card data information compares, and the two is compared, if the PCIE device data information of state not in place is correct, under continuing
One step；Otherwise test result is the failure of mainboard warm connection function, directly exits test method；
S5: the log information of tested board system is checked with the presence or absence of exception fail error log, if it is present surveying
Test result is the failure of mainboard warm connection function, directly exits test method；If it does not exist, then continuing in next step；
S6:PCIE slot powers on, and simulation PCIE device is inserted into slot；
S7: obtaining the information in place of PCIE device, if detecting that PCIE device is in state not in place, based on test result
The failure of plate warm connection function, directly exits test method；If detecting that PCIE device is in state in place, continue to execute down
One step；
S8: obtaining the outer plug-in card data information of PCIE slot, and by the PCIE slot obtained in the data information and step S1
Outer plug-in card data information compares；If data information is consistent, continue to execute in next step, otherwise test result is mainboard heat
Disabler is plugged, test method is directly exited；
S9: the log information of tested board system is checked with the presence or absence of exception fail error log, if it is present surveying
Test result is the failure of mainboard warm connection function, directly exits test method；It is surveyed if it does not exist, then going to step S2 and making circulation
Examination.
2. a kind of method for testing hot plug by Ipmitool according to claim 1, which is characterized in that the step
In S1, the extrapolation card information on tested PCIE slot is obtained by lspci and saves the first file；Outer plug-in card information include: to
Survey PCIE device device number, PCIE device DeviceID information to be measured, PCEI equipment UEsta information to be measured, PCIE device to be measured
CEsta information, Speed the and Width information for obtaining PCIE device to be measured；
The log information of tested board system includes Dmesg, Messages, Mcelog log information.
3. a kind of method for testing hot plug by Ipmitool according to claim 2, which is characterized in that the step
Steps are as follows for the realization of S2:
It is sent after remove information receives remove information to CPLD, CPLD by ipmitool and passes to CPU, CPU issues letter
Number Pltform_RST is dragged down, PCIE link disconnects, and RST drags down rear CPU for information back to CPLD, VR is electrically disconnected, PCIE
Slot power down, simulation PCIE device remove.
4. a kind of method for testing hot plug by Ipmitool according to claim 3, which is characterized in that the step
S4 is implemented as follows:
The extrapolation card information on tested PCIE slot is obtained by lspci instruction and is saved into the second file；The step obtains
Information include the device number of PCIE device to be measured and the DeviceID information of PCIE device to be measured；It is obtained with step S1
Data compare, if the PCIE device number of state not in place and DeviceID are correct, continue to execute in next step, it is no
Then test result is the failure of mainboard warm connection function, directly exits test method.
5. a kind of method for testing hot plug by Ipmitool according to claim 4, which is characterized in that the step
S6 is implemented as follows:
It is sent after insert information receives insert information to CPLD, CPLD by ipmitool and passes to CPU, CPU issues letter
Number Pltform_RST is drawn high, PCIE link closure, RST draws high rear CPU for information back to CPLD, VR conducted, PCIE
Slot powers on, simulation PCIE insertion.
6. a kind of method for testing hot plug by Ipmitool according to claim 5, which is characterized in that the step
S8 is implemented as follows:
The extrapolation card information on tested PCIE slot is obtained by lspci instruction and is saved to third file,
Third file and the first file storage data information are compared；If PCIE device device number to be measured, PCIE to be measured
Equipment DeviceID information, PCIE device CEsta information to be measured, obtains PCIE device to be measured at PCEI equipment UEsta information to be measured
Speed and Width information it is corresponding consistent, then continue to execute and operate in next step, otherwise test result is mainboard hot plug
Test method is directly exited in disabler.
7. a kind of system for testing hot plug by Ipmitool characterized by comprising
Preprocessing module: the outer plug-in card data information of PCIE slot and the log information of tested board system are obtained；Pass through
Lspci obtains the extrapolation card information on tested PCIE slot and saves into the first file；
Simulation PCIE device remove module: remove information is sent by ipmitool and receives remove information to CPLD, CPLD
After pass to CPU, CPU issues signal and drags down Pltform_RST, and PCIE link disconnects, and RST drags down rear CPU for information back
To CPLD, VR is electrically disconnected, PCIE slot power down, simulation PCIE device removes；
Data comparison module after simulation removes: the extrapolation card information on tested PCIE slot is obtained by lspci instruction and is saved
Into the second file；The step obtain information include PCIE device to be measured device number and PCIE device to be measured
DeviceID information；It is compared with the data obtained in preprocessing module；
Simulation PCIE device is inserted into module: sending insert information by ipmitool and receives insert information to CPLD, CPLD
After pass to CPU, CPU issues signal and draws high Pltform_RST, and PCIE link closure, RST draws high rear CPU for information back
To CPLD, VR is conducted, PCIE slot powers on, simulation PCIE insertion；
Data comparison module after simulation insertion: the extrapolation card information on tested PCIE slot is obtained by lspci instruction and is saved
Into third file, third file and the first file storage data information are compared.
8. a kind of system for testing hot plug by Ipmitool according to claim 7, which is characterized in that the pre- place
It manages in module, outer plug-in card information includes: PCIE device device number to be measured, PCIE device DeviceID information to be measured, PCEI to be measured
Equipment UEsta information, PCIE device CEsta information to be measured, Speed the and Width information for obtaining PCIE device to be measured；
The log information of tested board system includes Dmesg, Messages, Mcelog log information.
9. a kind of computer storage medium, which is characterized in that instruction is stored in the computer storage medium, when it is being calculated
When being run on machine, so that computer executes each method described in the claims 1-6.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201910630879.0A CN110489287B (en) | 2019-07-12 | 2019-07-12 | Method, system and storage medium for testing hot plug through Ipomitool |
Applications Claiming Priority (1)
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111025178A (en) * | 2019-12-29 | 2020-04-17 | 苏州浪潮智能科技有限公司 | Stability test method for main-standby switching of power supply module and related components |
| CN111274071A (en) * | 2020-01-19 | 2020-06-12 | 浪潮电子信息产业股份有限公司 | USB device plug detection method and device and related device |
| CN113656224A (en) * | 2021-07-22 | 2021-11-16 | 浪潮商用机器有限公司 | NVMe SSD hot plug test method, system, device and readable storage medium |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103257912A (en) * | 2012-02-16 | 2013-08-21 | 鸿富锦精密工业（深圳）有限公司 | Testing device and method thereof for testing peripheral component interface express (PCIE) slot |
| CN104391780A (en) * | 2014-10-23 | 2015-03-04 | 浪潮电子信息产业股份有限公司 | Method for automatically testing stability of redundancy function of power supply of server |
| CN109117406A (en) * | 2018-08-23 | 2019-01-01 | 郑州云海信息技术有限公司 | A kind of hot-swappable test method of PCIE, device, terminal and storage medium |
| CN109918244A (en) * | 2019-02-27 | 2019-06-21 | 苏州浪潮智能科技有限公司 | A kind of system and method for the hot-swappable test of automatic imitation PCIE SSD |
-
2019
- 2019-07-12 CN CN201910630879.0A patent/CN110489287B/en active Active
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103257912A (en) * | 2012-02-16 | 2013-08-21 | 鸿富锦精密工业（深圳）有限公司 | Testing device and method thereof for testing peripheral component interface express (PCIE) slot |
| CN104391780A (en) * | 2014-10-23 | 2015-03-04 | 浪潮电子信息产业股份有限公司 | Method for automatically testing stability of redundancy function of power supply of server |
| CN109117406A (en) * | 2018-08-23 | 2019-01-01 | 郑州云海信息技术有限公司 | A kind of hot-swappable test method of PCIE, device, terminal and storage medium |
| CN109918244A (en) * | 2019-02-27 | 2019-06-21 | 苏州浪潮智能科技有限公司 | A kind of system and method for the hot-swappable test of automatic imitation PCIE SSD |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111025178A (en) * | 2019-12-29 | 2020-04-17 | 苏州浪潮智能科技有限公司 | Stability test method for main-standby switching of power supply module and related components |
| CN111274071A (en) * | 2020-01-19 | 2020-06-12 | 浪潮电子信息产业股份有限公司 | USB device plug detection method and device and related device |
| CN113656224A (en) * | 2021-07-22 | 2021-11-16 | 浪潮商用机器有限公司 | NVMe SSD hot plug test method, system, device and readable storage medium |
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