CN110488082A - A kind of measure voltage & current chip of integrated numeral output - Google Patents
A kind of measure voltage & current chip of integrated numeral output Download PDFInfo
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- CN110488082A CN110488082A CN201910629883.5A CN201910629883A CN110488082A CN 110488082 A CN110488082 A CN 110488082A CN 201910629883 A CN201910629883 A CN 201910629883A CN 110488082 A CN110488082 A CN 110488082A
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- Prior art keywords
- voltage
- current
- circuit
- amplifier
- chip
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
- G01R15/14—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
- G01R15/20—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using galvano-magnetic devices, e.g. Hall-effect devices, i.e. measuring a magnetic field via the interaction between a current and a magnetic field, e.g. magneto resistive or Hall effect devices
- G01R15/202—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using galvano-magnetic devices, e.g. Hall-effect devices, i.e. measuring a magnetic field via the interaction between a current and a magnetic field, e.g. magneto resistive or Hall effect devices using Hall-effect devices
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/25—Arrangements for measuring currents or voltages or for indicating presence or sign thereof using digital measurement techniques
Abstract
A kind of measure voltage & current chip of integrated numeral output, including current signal acquisition process circuit, voltage signal acquisition processing circuit, memory, data processing module, signal output interface circuit, and integrate on one chip；Current value is sent to memory storage by current signal acquisition process circuit, voltage value is sent to memory storage by voltage signal acquisition processing circuit, then corresponding power consumption is calculated by data processing module, output interface circuit exports corresponding voltage value or current value, power consumption according to related protocol.The present invention can not only measure electric current and voltage, calculate power consumption size, and can be with Digital output.Control is programmed by the range that programming Control circuit can measure size of current to chip simultaneously, to cope with the measurement demand of different size electric current.And hall measurement electric current and voltage isolated amplifier collection voltages are integrated on the same chip, have certain isolation features, reduce the cost of product, improve reliability.
Description
Technical field
The present invention relates to a kind of measure voltage & current chips.
Background technique
In general existing sensor can only detect size of current or voltage swing, and be mostly using separator
Part is realized.Sampling resistor mostly used to the method for current detecting, and the introducing of sampling resistor, it will increase the power consumption of circuit.It is existing
It needs to detect electric current and voltage swing in circuit respectively in some practical applications, using two sensors and additional voltage
Isolation circuit, so that it is at high cost, and area occupied is big, and a chips can not detect the size of voltage and current simultaneously.Simultaneously
The calculating of power consumption needs additional single-chip microcontroller or MCU to measuring voltage value and current value is handled, higher cost.
Existing measure voltage & current chip is substantially simulation output, poor anti jamming capability, most measure voltage & current chip
Do not have the work of voltage isolation, is mostly to increase optocoupler or the realization voltage isolation of other isolation circuits by periphery.
Summary of the invention
A kind of integrated number is provided the technical problem to be solved by the present invention is to overcome the above-mentioned insufficient of the prior art
The measure voltage & current chip of output can detect the calculating of the parameters such as size and the power consumption of voltage and current simultaneously,
And analog to digital conversion circuit is integrated in chip interior, realize the numeral output of sensor chip.
The present invention solves the above problems used technical solution are as follows: a kind of measure voltage & current of integrated numeral output
Chip, it is characterised in that: including current signal acquisition process circuit, voltage signal acquisition processing circuit, memory, data processing
Module, signal output interface circuit, and integrate on one chip；Current signal acquisition process circuit is by the size of current value
It is sent to memory storage, the size of voltage value is sent to memory and stored by voltage signal acquisition processing circuit, then passes through data
Processing module calculates corresponding power consumption, and output interface circuit exports corresponding voltage value or current value, power consumption according to related protocol
Size；
The current signal acquisition process circuit includes plain conductor, Hall array, temperature-compensation circuit, dynamic imbalance elimination electricity
Road, the first amplifier, programming programming control circuit, the first ADC, the foreign current signal flow through plain conductor, the Hall
Array detection electric current generate magnetic field size, export Hall voltage, by the first amplifier amplify voltage, by the first ADC into
Conversion of the row analog signal to digital signal；The temperature-compensation circuit provides temperature-compensating for Hall array and carries out to chip
Temperature-compensating；Dynamic offset cancellation circuit one end is connected with Hall array, and the other end is connected with the first amplifier, eliminates suddenly
The imbalance of your voltage；The programming programming control circuit is connected with the first amplifier, controls the first amplifier magnification ratio；
The voltage signal acquisition processing circuit includes the second amplifier and the 2nd ADC, and the voltage input at sampling resistor both ends is extremely
Two pins of the second amplifier, the second amplifier amplify, and the 2nd ADC carries out analog-to-digital conversion to amplified signal.
Preferably, above-mentioned plain conductor resistance is in m Ω rank, when such foreign current flows through plain conductor, plain conductor
The power consumption of consumption is smaller, and the fever of itself will not influence the variation of chip interior temperature, avoids making chip other parts circuit
At influence.And with silicon wafer integrative packaging, facilitate current detecting.
Preferably, above-mentioned Hall array forms Hall battle array in silicon chip surface with symmetrical array format using semiconductor technology
Column, can effectively promote the signal-to-noise ratio of useful signal, reduce the influence of ambient stray field.
The temperature-compensation circuit provides temperature-compensating for Hall array and carries out temperature-compensating to chip, guarantees work temperature
Spend the consistency of chip performance in range；
Preferably, the programming programming control circuit, on the one hand by the amplification factor of the first amplifier of control, to adjust Hall
On the other hand the level of sensitivity of array carries out the specific amplification factor of programming by external circuit, dispatch from the factory for later period chip
When, calibration control is carried out to the size of current of chip measurement, realizes the calibration and control of current measuring range size.
Preferably, above-mentioned first amplifier is amplified, so using low offset chopping amplifier after modulating signals into high frequency
Signal demodulation tremendously low frequency output afterwards, can eliminate a part of 1/f noise in this way.
Preferably, above-mentioned first ADC realizes that high-precision modulus turns by over-sampling using 2 rank sigma-delta ADC structures
It changes, while not needing to consume too many power consumption.
Preferably, above-mentioned dynamic offset cancellation circuit drives Hall array using rotatory current technical controlling, passes through clock
The exchange of driving current Periodic Rotating is controlled, the Hall voltage of output is periodically inverted, but the offset voltage Vos of its own
It remains unchanged, by correctly adjusting, failure voltage Vos can be eliminated.
Preferably, above-mentioned data processing module includes multiplier and phase compensating circuit, is carried out to voltage and current signals
The calculating of processing and power consumption.
Preferably, above-mentioned second amplifier, using isolated amplifier, internal structure will be acquired using modulation circuit
To voltage signal, it is modulated to high frequency, coupling isolation transmitting is carried out by capacitor, then demodulated circuit, signal is restored, so
After amplify.
Preferably, above-mentioned 2nd ADC uses 2 rank sigma-delta ADC structures, realizes high-precision analog-to-digital conversion by sampling, together
When do not need to consume too many power consumption.
Compared with the prior art, the advantages of the present invention are as follows: the present invention detects electric current using Hall effect, using amplifier
Acquisition measurement voltage, can not only measure electric current and voltage, calculate power consumption size, and can be with Digital output, for user
MCU directly read the size of voltage and electric current, power consumption.Size of current can measure to chip by programming Control circuit simultaneously
Range is programmed control, to cope with the measurement demand of different size electric current.And hall measurement electric current and voltage isolation are amplified
Device collection voltages are integrated on the same chip, have certain isolation features, reduce the cost of product, improve reliability.
Detailed description of the invention
Fig. 1 is the structural schematic diagram of the measure voltage & current chip of the integrated numeral output of the embodiment of the present invention.
Fig. 2 is current signal of embodiment of the present invention acquisition process circuit diagram.
Fig. 3 is voltage signal acquisition of embodiment of the present invention processing circuit schematic diagram.
Specific embodiment
With reference to the accompanying drawing, the present invention is further described for embodiment.
As shown in Figure 1, a kind of measure voltage & current chip of integrated numeral output includes current signal acquisition process electricity
Road, voltage signal acquisition processing circuit, memory circuit, data processing module and output interface circuit, at current signal acquisition
The size of current value is sent to memory storage by reason circuit, and the size of voltage value is sent to storage by voltage signal acquisition processing circuit
Device storage, then calculates corresponding power consumption by data processing module, and output interface circuit is corresponding according to related protocol output
Voltage value or current value, power consumption size.
As shown in Figure 1, 2, the current signal acquisition process circuit includes plain conductor, Hall array, temperature-compensating electricity
Road, dynamic offset cancellation circuit, amplifier 1, programming programming control circuit, ADC1, foreign current signal flow through IP+ and IP- it
Between plain conductor, faint magnetic field, the magnetic that the Hall array is generated according to Hall effect detection electric current are generated around conducting wire
Field size, exports the Hall voltage Vhall of corresponding size, amplifies Vhall voltage by amplifier 1, is simulated by ADC1
To the conversion of digital signal, the data after conversion are output in memory to be stored signal, waits output interface circuit big to electric current
Small data are read out；One end of dynamic offset cancellation circuit is connected with Hall array, and the other end is connected with amplifier 1,
Eliminate the imbalance of Hall voltage；Programming Control circuit is connected with amplifier 1, controls the amplification factor of amplifier 1.
The temperature-compensation circuit, is connected with Hall array, provides temperature-compensating for Hall array, it is ensured that it is in full temperature
Spend the consistency of the performance in range.
The dynamic offset cancellation circuit drives Hall array using rotatory current technical controlling, is driven by clock control
The exchange of streaming current Periodic Rotating, the Hall voltage Vhall of output is periodically inverted, but the offset voltage Vos of its own
It remains unchanged, by correctly adjusting, failure voltage Vos can be eliminated.
The amplifier 1 uses low offset chopping amplifier, amplifies after modulating signals into high frequency, then signal is demodulated to
Low frequency output, can eliminate a part of 1/f noise in this way.
The programming programming control circuit, on the one hand by the amplification factor of control amplifier 1, to adjust Hall array
On the other hand level of sensitivity carries out the specific amplification factor of programming by external circuit, when for the factory of later period chip, to core
The size of current of piece measurement carries out calibration control.
The ADC1 uses 2 rank sigma-delta ADC structures, realizes high-precision analog-to-digital conversion by over-sampling, does not need simultaneously
Consume too many power consumption.
As shown in Fig. 1,3 dotted line frames, the voltage acquisition processing circuit comprising amplifier 2 and ADC2.Amplifier
2 output end is connected with ADC2, and amplifier 2 carries out coupling isolation amplification to sampled signal, and ADC2 carries out its output signal
Analog-to-digital conversion, the data after conversion, which are output in memory, to be stored, and output interface circuit is waited to carry out the data of voltage swing
It reads.
To two pins of vinp and vinn of amplifier 2, amplifier 2 amplifies the voltage input at the both ends sampling resistor R,
ADC2 carries out analog-to-digital conversion to amplified signal.
The amplifier 2 will be collected voltage signal, be modulated to high frequency, coupled by capacitor using modulation circuit
Isolation transmitting, then demodulated circuit, signal is restored, and is then amplified.
The ADC2 is realized high-precision analog-to-digital conversion by over-sampling, is not required to simultaneously using 2 rank sigma-delta ADC structures
Consume too many power consumption.
The data processing module comprising multiplier and phase compensating circuit, at voltage and current data
Reason, calculates corresponding power consumption.
Claims (9)
1. a kind of measure voltage & current chip of integrated numeral output, it is characterised in that: including current signal acquisition process electricity
Road, voltage signal acquisition processing circuit, memory, data processing module, signal output interface circuit, and it is integrated in a label
On piece；The size of current value is sent to memory storage by current signal acquisition process circuit, and voltage signal acquisition processing circuit will
The size of voltage value is sent to memory storage, then calculates corresponding power consumption by data processing module, output interface circuit according to
Corresponding voltage value or current value, power consumption size are exported according to related protocol；
The current signal acquisition process circuit includes plain conductor, Hall array, temperature-compensation circuit, dynamic imbalance elimination electricity
Road, the first amplifier, programming programming control circuit, the first ADC, the foreign current signal flow through plain conductor, the Hall
Array detection electric current generate magnetic field size, export Hall voltage, by the first amplifier amplify voltage, by the first ADC into
Conversion of the row analog signal to digital signal；The temperature-compensation circuit provides temperature-compensating for Hall array and carries out to chip
Temperature-compensating；Dynamic offset cancellation circuit one end is connected with Hall array, and the other end is connected with the first amplifier, eliminates suddenly
The imbalance of your voltage；The programming programming control circuit is connected with the first amplifier, controls the first amplifier magnification ratio；
The voltage signal acquisition processing circuit includes the second amplifier and the 2nd ADC, and the voltage input at sampling resistor both ends is extremely
Two pins of the second amplifier, the second amplifier amplify, and the 2nd ADC carries out analog-to-digital conversion to amplified signal.
2. the measure voltage & current chip of integrated numeral output according to claim 1, it is characterised in that: the metal
Conductor resistance m Ω rank and with silicon wafer integrative packaging.
3. the measure voltage & current chip of integrated numeral output according to claim 1, it is characterised in that: the Hall
Array forms Hall array in silicon chip surface with symmetrical array format.
4. the measure voltage & current chip of integrated numeral output according to claim 1, it is characterised in that: described first
Amplifier is amplified after being modulated signals into using low offset chopping amplifier to high frequency, then the output of signal demodulation tremendously low frequency.
5. the measure voltage & current chip of integrated numeral output according to claim 1, it is characterised in that: described first
ADC uses 2 rank sigma-delta ADC structures.
6. the measure voltage & current chip of integrated numeral output according to claim 1, it is characterised in that: the data
Processing module includes multiplier and phase compensating circuit, carries out processing and the calculating of power consumption to voltage and current signals.
7. the measure voltage & current chip of integrated numeral output according to claim 1, it is characterised in that: described second
Amplifier uses modulation circuit, will collect voltage signal modulation to high frequency, carries out coupling isolation transmitting by capacitor, then pass through
Demodulator circuit is crossed, signal is restored, is then amplified.
8. the measure voltage & current chip of integrated numeral output according to claim 1, it is characterised in that: described second
ADC uses 2 rank sigma-delta ADC structures.
9. the measure voltage & current chip of integrated numeral output according to claim 1, it is characterised in that: the programming
On the one hand programming control circuit passes through the amplification factor of the first amplifier of control, to adjust the level of sensitivity of Hall array, separately
On the one hand the specific amplification factor of programming is carried out by external circuit.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
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| CN201910629883.5A CN110488082A (en) | 2019-07-12 | 2019-07-12 | A kind of measure voltage & current chip of integrated numeral output |
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| CN201910629883.5A CN110488082A (en) | 2019-07-12 | 2019-07-12 | A kind of measure voltage & current chip of integrated numeral output |
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Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112650651A (en) * | 2021-01-06 | 2021-04-13 | 上海擎昆信息科技有限公司 | Power consumption detection IP (Internet protocol), management method and system |
| CN112816921A (en) * | 2021-01-06 | 2021-05-18 | 南京能晶电子科技有限公司 | Current output type linear Hall sensor chip |
| CN112834813A (en) * | 2021-01-06 | 2021-05-25 | 南京能晶电子科技有限公司 | Hall current sensor chip for electric automobile |
| CN112834812A (en) * | 2021-01-06 | 2021-05-25 | 南京能晶电子科技有限公司 | Hall current sensor chip with strong anti-interference capability |
| CN113702699A (en) * | 2021-08-31 | 2021-11-26 | 南京微智新科技有限公司 | PCB test board and manufacturing method |
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Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112650651A (en) * | 2021-01-06 | 2021-04-13 | 上海擎昆信息科技有限公司 | Power consumption detection IP (Internet protocol), management method and system |
| CN112816921A (en) * | 2021-01-06 | 2021-05-18 | 南京能晶电子科技有限公司 | Current output type linear Hall sensor chip |
| CN112834813A (en) * | 2021-01-06 | 2021-05-25 | 南京能晶电子科技有限公司 | Hall current sensor chip for electric automobile |
| CN112834812A (en) * | 2021-01-06 | 2021-05-25 | 南京能晶电子科技有限公司 | Hall current sensor chip with strong anti-interference capability |
| CN113702699A (en) * | 2021-08-31 | 2021-11-26 | 南京微智新科技有限公司 | PCB test board and manufacturing method |
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Application publication date: 20191122 |